• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
CC
= 5V,
o
C to 125oC
CC
OH
CD74HCT4075
High Speed CMOS Logic
Triple 3-Input OR Gate
Description
The Harris CD74HC4075, CD74HCT4075 logic gates utilize
silicon-gate CMOS technology to achieve operating speeds
similar to LSTTL gates with the low power consumption of
standard CMOS integrated circuits. All devices have the
ability to drive 10 LSTTL loads. The 74HCT logic family is
functionally pin compatible with the standard 74LS logic
family.
Ordering Information
PKG.
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC4075E-55 to 12514 Ld PDIPE14.3
CD74HC4075E-55 to 12514 Ld PDIPE14.3
CD74HC4075M-55 to 12514 Ld SOICM14.15
CD74HC4075M-55 to 12514 Ld SOICM14.15
CD54HC4075H-55 to 125Die
CD54HCT4075H-55 to 125Die
CD54HC4075W-55 to 125Wafer
CD54HCT4075W-55 to 125Wafer
NO.
Pinout
NOTE: When ordering, usethe entire partnumber.Add the suffix 96
to obtain the variant in the tape and reel.
CD74HC4075, CD74HCT4075
(PDIP, SOIC)
TOP VIEW
2A
2B
1A
1B
1C
1C
GND
1
2
3
4
5
6
7
V
14
CC
3C
13
3B
12
3A
11
3Y
10
2Y
9
2C
8
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Junction Temperature (Hermetic Pac kage or Die) . . .175oC
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
V
CC
(V)
o
C-40oC TO 85oC -55oCTO125oC
25
UNITSV
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIHor VIL-0.0221.9--1.9-1.9-V
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
-44.53.98--3.84-3.7-V
-5.265.48--5.34-5.2-V
VIHor VIL0.022--0.1-0.1-0.1V
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
44.5--0.26-0.33-0.4V
5.26--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
VCC or
06--2-20-40µA
GND
3
CD74HC4075, CD74HCT4075
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
HCT TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
V
IH
V
IL
V
OH
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
V
OL
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Additional Quiescent
Device Current Per
I
I
I
CC
∆I
CC
Input Pin: 1 Unit Load
(Note)
NOTE: For dual-supply systems theoretical worst case (V
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
--4.5 to
--4.5 to
VIHor VIL-0.024.54.4--4.4-4.4-V
-44.53.98--3.84-3.7-V
VIHor VIL0.024.5--0.1-0.1-0.1V
44.5--0.26-0.33-0.4V
VCCand
05.5-±0.1-±1-±1µA
GND
VCC or
05.5--2-20-40µA
GND
V
CC
-4.5 to
-2.1
o
C-40oC TO 85oC -55oCTO125oC
V
CC
25
(V)
2--2- 2 - V
5.5
--0.8-0.8-0.8V
5.5
-100360-450-490µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
HCT Input Loading Table
INPUTUNIT LOADS
All1.6
NOTE: Unit Load is ∆ICClimit specified in DC Electrical Table, e.g.
360µA max at 25oC.
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay,
Input to Output (Figure 1)
Transition Times (Figure 1)t
Input CapacitanceC
r
t
PLH,tPHL
, t
TLH
THL
IN
, tf = 6ns
TEST
CONDITIONS VCC(V)
CL= 50pF2--100-125-150ns
C
= 15pF5-8-----ns
L
CL= 50pF2--75-95-110ns
----10-10-10pF
-40oC TO
85oC-55oC TO 125oC
25
o
C
UNITSMINTYPMAXMINMAXMINMAX
4.5--20-25-30ns
6--17-21-26ns
4.5--15-19-22ns
6--13-16-19ns
4
CD74HC4075, CD74HCT4075
Switching Specifications Input t
, tf = 6ns (Continued)
r
PARAMETERSYMBOL
Power Dissipation Capacitance
C
PD
(Notes 2, 3)
HCT TYPES
Propagation Delay, Input to
t
PLH
, t
PHL
Output (Figure 2)
Transition Times (Figure 2)t
Input CapacitanceC
Power Dissipation Capacitance
(Notes 2, 3)
TLH
, t
THL
IN
C
PD
NOTES:
2. C
is used to determine the dynamic power consumption, per gate.
PD
3. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
Test Circuits and Waveforms
tr = 6nstf = 6ns
t
PHL
90%
50%
10%
t
PLH
INPUT
t
INVERTING
OUTPUT
THL
-40oC TO
85oC-55oC TO 125oC
TEST
25
o
C
CONDITIONS VCC(V)
-5-26-----pF
CL= 50pF4.5--24-30-36ns
C
= 15pF5-9-----ns
L
CL= 50pF4.5--15-19-22ns
----10-10-10pF
-5-28-----pF
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
90%
50%
10%
t
TLH
V
CC
GND
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
2.7V
1.3V
0.3V
PHL
UNITSMINTYPMAXMINMAXMINMAX
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
FIGURE 2. HCTTRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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safeguards must be provided by the customer to minimize inherent or procedural hazards.
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Copyright 1999, Texas Instruments Incorporated
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