• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High NoiseImmunity: N
= 60 MHz at VCC = 5V, CL = 15pF,
MAX
= 30%, NIH= 30%of VCCat
IL
o
C to 125oC
CD74HCT393
High Speed CMOS Logic
Dual 4 -Stage Binary Counter
V
= 5V
CC
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
Description
The Harris CD74HC393 and CD74HCT393 are 4-stage
ripple-carry binary counters. Al counter stages are masterslave flip-flops. The state of the stage advances one count
on the negative transition of each clock pulse; a high voltage
level on the MR line resets all counters to their zero state. All
inputs and outputs are buffered.
Ordering Information
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC393E-55 to 12514 Ld PDIPE14.3
CD74HCT393E-55 to 12514 Ld PDIPE14.3
≤ 1µA at VOL, V
l
OH
PKG.
NO.
Pinout
CD74HC393, CD74HCT393
(PDIP, SOIC)
TOP VIEW
1CP
1MR
1Q0
1Q1
1Q2
1Q3
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
2CP
2MR
2Q0
2Q1
2Q2
2Q3
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Output Transitiont
Input CapacitanceC
Power Dissipation Capacitance
t
PLH,
t
t
PLH,
t
t
PLH,
t
t
PLH,
t
t
PLH,
t
t
PLH,
t
TLH,tTHLCL
C
CL= 50pF4.5--12-15-18ns
PHL
CL= 50pF4.5--32-40-48ns
PHL
C
CL= 50pF4.5--44-55-66ns
PHL
CL= 50pF4.5--50-63-75ns
PHL
CL= 50pF4.5--62-78-93ns
PHL
CL= 50pF4.5--32-40-48ns
PHL
C
CL=15pF---10-10-10pF
IN
CL=15pF5-21-----pF
PD
=15pF5-13-----ns
L
=15pF5-13-----ns
L
= 50pF4.5--15-19-22ns
(Notes 4, 5)
NOTES:
is used to determine the dynamic power consumption, per stage.
4. C
PD
5. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
UNITSMINTYP MAXMINMAXMINMAX
Test Circuits and Waveforms
tr = 6nstf = 6ns
V
t
CC
GND
TLH
t
PHL
90%
50%
10%
t
PLH
90%
50%
10%
INPUT
t
INVERTING
OUTPUT
THL
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
2.7V
1.3V
0.3V
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
7
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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