Texas Instruments CD 54 HCT 640, CD 74 HC 640, CD 74 HCT 640 INSTALLATION INSTRUCTIONS

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Data sheet acquired from Harris Semiconductor
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SCHS192B
January 1998 - Revised May 2003
CD54HC640, CD74HC640,
CD54HCT640, CD74HCT640
High-Speed CMOS Logic
Octal Three-State Bus Transceiver, Inverting
[ /Title (CD74 HC640 , CD74 HCT64
0) Sub­ect
(High Speed CMOS
Features
• Buffered Inputs
• Three-State Outputs
• Fanout (Over Temperature Range)
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
= 30%, NIH = 30% of V
IL
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
1µA at VOL, V
l
o
C to 125oC
OH
Description
The ’HC640 and ’HCT640 silicon-gate CMOS three-state bidirectional inverting and non-inverting buffers are intended for two-way asynchronous communication between data buses. They have high drive current outputs which enable high-speed operation when driving large bus capacitances. These circuits possess the low power dissipation of CMOS circuits, and have speeds comparable to low power Schottky TTL circuits. They can drive 15 LSTTL loads. The ’HC640 and ’HCT640 are inverting buffers.
The direction of data flow (A to B, B to A) is controlled by the DIR input.
Outputs are enabled by a low on the Output Enable input (
OE); a high OE puts these devices in the high impedance
mode.
Ordering Information
CC
TEMP. RANGE
PART NUMBER
CD54HC640F3A -55 to 125 20 Ld CERDIP CD54HCT640F3A -55 to 125 20 Ld CERDIP CD74HC640E -55 to 125 20 Ld PDIP
(oC) PACKAGE
Pinout
CD54HC640, CD54HCT640
(CERDIP)
CD74HC640, CD74HCT640
(PDIP, SOIC)
TOP VIEW
DIR
A0 A1 A2 A3 A4 A5 A6 A7
GND
1 2 3 4 5 6 7 8 9
10
20 19 18 17 16 15 14 13 12 11
V OE B0 B1 B2 B3 B4 B5 B6 B7
CD74HC640M -55 to 125 20 Ld SOIC CD74HCT640E -55 to 125 20 Ld PDIP CD74HCT640M -55 to 125 20 Ld SOIC
CC
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright
© 2003, Texas Instruments Incorporated
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CD54HC640, CD74HC640, CD54HCT640, CD74HCT640CD54HC640, CD74HC640, CD54HCT640, CD74HCT640
Functional Diagram
A0
A1
THRU
A6
A7
OE
DIR
OUTPUT ENABLE AND
DIRECTION-SELECT LOGIC
TRUTH TABLE
CONTROL INPUTS DATA PORT STATUS OE DIR A
n
B
n
LLOI HHZZ HLZZ
LHIO
B0
B1
THRU
B6
B7
VCC = 20
GND = 10
To prevent excess currents in the High-Z modes all I/O terminals should be terminated with 1k to 1M resistors. H = High Level L = Low Level I = Input O = Output (Inversion of Input Level) Z = High Impedance
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CD54HC640, CD74HC640, CD54HCT640, CD74HCT640CD54HC640, CD74HC640, CD54HCT640, CD74HCT640
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, I
O
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±50mA
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, V
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. The package thermal impedance is calculated in accordance with JESD 51-7.
CC
Thermal Resistance (Typical, Note 1) θJA (oC/W)
E (PDIP) Package . . . . . . . . . . . . . . . . . . . . . . . . . . 69
M (SOIC) Package. . . . . . . . . . . . . . . . . . . . . . . . . . 58
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETER SYMBOL
HC TYPES
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage CMOS Loads
High Level Output Voltage TTL Loads
Low Level Output Voltage CMOS Loads
Low Level Output Voltage TTL Loads
Input Leakage Current
V
IH
V
IL
V
OH
V
OL
I
I
TEST
CONDITIONS
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
V
CC
(V)
o
C -40oC TO 85oC -55oC TO 125oC
25
UNITSV
- - 2 1.5 - - 1.5 - 1.5 - V
4.5 3.15 - - 3.15 - 3.15 - V 6 4.2 - - 4.2 - 4.2 - V
- - 2 - - 0.5 - 0.5 - 0.5 V
4.5 - - 1.35 - 1.35 - 1.35 V 6 - - 1.8 - 1.8 - 1.8 V
VIHor VIL-0.02 2 1.9 - - 1.9 - 1.9 - V
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
-0.02 6 5.9 - - 5.9 - 5.9 - V
- - ---- - - - V
-6 4.5 3.98 - - 3.84 - 3.7 - V
-7.8 6 5.48 - - 5.34 - 5.2 - V
VIHor VIL0.02 2 - - 0.1 - 0.1 - 0.1 V
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
0.02 6 - - 0.1 - 0.1 - 0.1 V
- - ---- - - - V 6 4.5 - - 0.26 - 0.33 - 0.4 V
7.8 6 - - 0.26 - 0.33 - 0.4 V
VCC or
-6--±0.1 - ±1-±1 µA
GND
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CD54HC640, CD74HC640, CD54HCT640, CD74HCT640CD54HC640, CD74HC640, CD54HCT640, CD74HCT640
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETER SYMBOL
Quiescent Device
I
CC
Current Three-State Leakage
I
OZ
Current
HCT TYPES
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
V
IH
V
IL
V
OH
CMOS Loads High Level Output
Voltage TTL Loads
Low Level Output
V
OL
Voltage CMOS Loads
Low Level Output Voltage TTL Loads
Input Leakage Current
Quiescent Device Current
Three-State Leakage
I
I
I
CC
OZ
I
Current
Additional Quiescent Device Current Per
I
CC
(Note 2)
Input Pin: 1 Unit Load
NOTE:
2. For dual-supply systems theoretical worst case (V
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
VCC or
GND
VILor VIHVO =
VCC or
GND
- - 4.5 to
- - 4.5 to
VIHor VIL-0.02 4.5 4.4 - - 4.4 - 4.4 - V
VIHor VIL0.02 4.5 - - 0.1 - 0.1 - 0.1 V
VCCand
GND
VCC or
GND
VILor VIHVO =
VCC or
GND
V
CC
-2.1
o
C -40oC TO 85oC -55oC TO 125oC
V
CC
(V)
25
UNITSV
0 6 - - 8 - 80 - 160 µA
6--±0.5 - ±5-±10 µA
2--2- 2 - V
5.5
- - 0.8 - 0.8 - 0.8 V
5.5
-6 4.5 3.98 - - 3.84 - 3.7 - V
6 4.5 - - 0.26 - 0.33 - 0.4 V
0 5.5 - - ±0.1 - ±1-±1 µA
0 5.5 - - 8 - 80 - 160 µA
5.5 - - ±0.5 - ±5-±10 µA
- 4.5 to
- 100 360 - 450 - 490 µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
HCT Input Loading Table
INPUT UNIT LOADS
DIR 0.9
OE, A 1.5
B 1.5
NOTE: Unit Load is ICClimit specified in DC Electrical Table,e.g., 360µA max at 25oC.
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