SMBus-Controlled Multi-Chemistry Battery Charger With Input
Current Detect Comparator and Charge Enable Pin
1
FEATURES
•NMOS-NMOS Synchronous Buck Converter
with 300-kHz Frequency and >95% Efficiency
•30-ns Minimum Driver Dead-Time and 99.5%
Maximum Effective Duty Cycle
•High-Accuracy Voltage and Current Regulation
– ±0.5% Charge Voltage Accuracy
– ±3% Charge Current Accuracy
– ±3% Adapter Current Accuracy
– ±2% Input Current Sense Amp Accuracy
•Integration
– Input Current Comparator, With Adjustable
Threshold and Hysteresis
– Internal Soft-Start
•Safety
– Dynamic Power Management (DPM)
•Up to 19.2-V Battery Voltage
•7-V–24-V AC/DC-Adapter Operating Range
•Simplified SMBus Control Interface
– Charge Voltage DAC (1.024 V–19.2 V)
– Charge Current DAC (128 mA–8.064 A)
– Adapter Current Limit DPM DAC (256
mA–11.008 A)
•Status and Monitoring Outputs
– AC/DC Adapter Present With Adjustable
Voltage Threshold
– Input Current Comparator With Adjustable
Threshold and Hysteresis
– Current Sense Amplifier for Current Drawn
From Input Source
•Charge Any Battery Chemistry: Li+, NiCd,
NiMH, Lead Acid, Etc.
•Charge Enable Pin
•< 10-μA Battery Current With Adapter
Removed
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
bq24745
SLUS761D –DECEMBER 2007– REVISED OCTOBER 2011
Check for Samples: bq24745
•< 1-mA Input DCIN Current With Adapter
Present and Charge Disabled
•28-Pin, 5-mm × 5-mm QFN Package
APPLICATIONS
•Notebook and Ultra-Mobile Computers
•Portable Data-Capture Terminals
•Portable Printers
•Medical Diagnostics Equipment
•Battery Bay Chargers
•Battery Backup Systems
DESCRIPTION
The bq24745 is a high-efficiency, synchronous
battery charger with an integrated input-current
comparator,offeringlow componentcountfor
space-constrained, multi-chemistry battery-charging
applications. The input-current, charge-current, and
charge-voltage DACs allow very high regulation
accuracies that can be easily programmed by the
system power-management microcontroller using the
SMBus interface. The bq24745 charges two, three, or
four series Li+ cells, and is available in a 28-pin,
5-mm × 5 mm QFN package.
(1) Pullup rail could be either VREF or other system rail.
RAC
0.010
RSR
0.010
Q1 (ACFET)
SI4835BDY
N
PP
CSSN
CSSP
ACIN
VREF
CE
SDA
SCL
SMBus
VICM
HOST
(EC)
UGATE
N
PHASE
BOOT
VDDP
LGATE
PGND
CSOP
CSON
PACK+
PACK-
CHRG_IN
ADAPTER +
ADAPTER -
GND
bq24745
309k
1%
49.9k
1%
R1
R2
1uFC4
C2
0.1u
C3
0.1u
100pFC5
C6
1u
Q3
FDS6680A
Q4
FDS6680A
0.1uF
C7
L1
5.6uH
D1BAT54
C8
1u
C9
0.1uF
C10
0.1uF
C13
2x10u
C15
10uF
VFB
ICOUT
ICREF
Q2 (RBFET)
SI4835BDY
Controlled by
HOST
C14
10uF
C17
0.1uF
R10
10k
R11
10k
EAI
FBO
NC
NC
EAO
27
28
2
12
3
26
7
9
10
8
14
16
4
5
6
1
15
17
18
19
20
25
21
23
24
DCIN
VDDSMB
11
ACOK
10k
R3
13
DISCRETE
LOGIC
RC6
10Ω
Dig I/O
+3.3V_ALWAYS
OR
+5V_ALWAYS
R12
10k
22
100 Ω
R22
C1
2.2u
RC
1
2.2Ω
DISCRETE
LOGIC
R20
20k
R21
200k
R19
7.5k
C21
2000pF
C22
130pF
C23
51pF
bq24745
SLUS761D –DECEMBER 2007– REVISED OCTOBER 2011
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The bq24745 features dynamic power management (DPM) and input power limiting. These features reduce
battery-charge current when the input power limit is reached to avoid overloading the ac adaptor when supplying
the load and the battery charger simultaneously. A highly accurate current-sense amplifier enables precise
measurement of input current from the ac adapter, allowing monitoring the overall system power. If the adapter
current is above the programmed low-power threshold, a signal is sent to host so that the system optimizes its
performance to the power available from the adapter. An integrated comparator monitors the input current
through the current-sense amplifier, and indicates when the input current exceeds a programmable threshold
limit.
TYPICAL APPLICATIONS
VIN= 20 V, V
= 4-cell Li-Ion, I
BAT
CHARGE
= 4.5 A
www.ti.com
Internal Comparator
Product Folder Link(s) :bq24745
Figure 1. Typical System Schematic Using External Input-Current Comparator (Discrete Logic) Instead of
1ICREFInput-current comparator voltage reference input. Connect a resistor divider from VREF to ICREF and from ICREF to
GND to program the reference for the ICOUT comparator. The ICREF pin voltage is compared to the VICM pin
voltage and the logic output is given on the ICOUT open-drain pin. Connecting a positive feedback resistor from the
ICREF pin to the ICOUT pin programs the hysteresis.
2ACINAdapter-detected voltage-set input. Program the adapter-detect threshold by connecting a resistor divider from the
adapter input to ACIN pin to GND. Adapter voltage is detected if the ACIN-pin voltage is greater than 2.4 V. The VICM
current-sense amplifier, ICOUT comparator, and ACOK output are active when the ACIN pin voltage is greater than
0.6 V.
3VREF3.3-V regulated voltage output. Place a 1-μF ceramic capacitor from VREF to the GND pin close to the IC. This
voltage could be used for ratiometric programming of voltage and current regulation and for programming the ICREF
threshold.
4EAOError amplifier output for compensation. Connect the feedback-compensation components from EAO to EAI. Typically,
a capacitor in parallel with a series resistor and capacitor. This node is internally compared to the PWM sawtooth
oscillator signal.
5EAIError amplifier input for compensation. Connect the feedback compensation components from EAI to EAO. Connect
the input compensation from FBO to EAI.
6FBOFeedback output for compensation. Connect the input compensation from FBO to EAI. Typically, a resistor in parallel
with a series resistor and capacitor.
7CECharge enable active-high logic input. HI enables charge. LO disables charge.
8VICMAdapter current-sense-amplifier output. The VICM voltage is 20 times the differential voltage across CSSP-CSSN.
Place a 100-pF (max) or less ceramic decoupling capacitor from VICM to GND.
9SDASMBus data input. Connect to the SMBus data line from the host controller. A 10-kΩ pullup resistor to the host
controller power rail is needed.
10SCLSMBus clock input. Connect to the SMBus clock line from the host controller. A 10-kΩ pullup resistor to the host
controller power rail is needed.
11VDDSMBInput voltage for SMBus logic. Connect a 3.3-V supply rail or 5-V rail to the VDDSMB pin. Connect a 0.1-μF ceramic
capacitor from VDDSMB to GND for decoupling.
12GNDAnalog ground. On PCB layout, connect to the analog ground plane, and only connect to PGND through the thermal
pad underneath the IC.
13ACOKValid adapter active-high detect logic open-drain output. Pulled HI when Input voltage is above the ACIN programmed
threshold. Connect a 10-kΩ pullup resistor from the ACOK pin to pull up the supply rail.
14NCNo connect. Pin floating internally.
15VFBBattery-voltage remote sense. Directly connect a Kelvin sense trace from the battery-pack positive terminal to the VFB
pin to sense the battery pack voltage accurately. Place a 0.1-μF capacitor from VFB to GND close to the IC to filter
high-frequency noise.
16NCNo Connect. Pin floating internally.
17CSONCharge-current sense resistor, negative input. An optional 0.1-μF ceramic capacitor is placed from the CSON pin to
GND for common-mode filtering. A 0.1-μF ceramic capacitor is placed from CSON to CSOP to provide
differential-mode filtering.
18CSOPCharge-current sense resistor, positive input. A 0.1-μF ceramic capacitor is placed from CSOP pin to GND for
common-mode filtering. A 0.1-μF ceramic capacitor is placed from CSON to CSOP to provide differential-mode
filtering.
19PGNDPower ground. On PCB layout, connect directly to the source of the low-side power MOSFET, and to the to ground
connection of the input and output capacitors of the charger. Only connect to GND through the thermal pad
underneath the IC.
20LGATEPWM low-side driver output. Connect to the gate of the low-side power MOSFET with a short trace.
21VDDPPWM low-side driver positive 6-V supply output. Connect a 1-μF ceramic capacitor from VDDP to the PGND pin, close
to the IC. Use for high-side driver bootstrap voltage by connecting a small signal Schottky diode from VDDP to BOOT.
22DCINIC-power positive supply. Connect to the common-source (diode-OR) point: source of high-side P-channel MOSFET
and source of reverse blocking power P-channel MOSFET. Place a 1-μF ceramic capacitor from DCIN to the GND pin
close to the IC. Place a 10-Ω resistor from the adapter input to the DCIN pin to limit inrush current.
23PHASEPWM high-side driver negative supply. Connect to the phase-switching node (junction of the low-side power MOSFET
drain, high-side power MOSFET source, and output inductor). Connect the 0.1-μF bootstrap capacitor from PHASE to
BOOT.
24UGATEPWM high-side driver output. Connect to the gate of the high-side power MOSFET with a short trace.
25BOOTPWM high-side driver positive supply. Connect a 0.1-μF bootstrap ceramic capacitor from BOOT to PHASE. Connect
a small bootstrap Schottky diode from VDDP to BOOT.
26ICOUTInput-current comparator active-high open-drain logic output. Place a 10-kΩ pullup resistor from the ICOUT pin to the
pullup voltage rail. Place a positive-feedback resistor from the ICOUT pin to the ICREF pin for programming
hysteresis. The output is HI when the VICM pin voltage is lower than the ICREF pin voltage. The output is LO when
VICM pin voltage is higher than ICREF pin voltage.
27CSSNAdapter current-sense resistor, negative input. An optional 0.1-μF ceramic capacitor is placed from the CSSN pin to
GND for common-mode filtering. A 0.1-μF ceramic capacitor is placed from CSSN to CSSP to provide
differential-mode filtering.
28CSSPAdapter current-sense resistor, positive input. A 0.1-μF ceramic capacitor is placed from the CSSP pin to GND for
common-mode filtering. A 0.1-μF ceramic capacitor is placed from CSSN to CSSP to provide differential-mode
filtering.
FUNCTION
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
DCIN, CSOP, CSON, CSSP, CSSN, VFB, ACOK–0.3 to 30
PHASE–1 to 30
Voltage rangeV
Maximum difference voltage: CSOP–CSON, CSSP–CSSN–0.5 to 0.5
Junction temperature range–40 to 155°C
Storage temperature range–55 to 155°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to GND if not specified. Currents are positive into, and negative out of the specified terminal. Consult
Packaging Section of the data book for thermal limitations and considerations of packages.
EAI, EAO, FBO, VDDP, LGATE, ACIN, VICM, ICOUT, ICREF, CE–0.3 to 7
VDDSMB, SDA, SCL–0.3 to 6
VREF–0.3 to 3.6
BOOT, UGATE with respect to GND and PGND–0.3 to 36
(1) (2)
SLUS761D –DECEMBER 2007– REVISED OCTOBER 2011
VALUEUNIT
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
≤ 24 V, 0°C < TJ< 125°C, typical values are at TA= 25°C, with respect to AGND (unless otherwise noted)
DCIN
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
= SCL = SDA = 5.5 V, 0°C ≤ TJ≤2027μA
VDDSMB
85°C
ELECTRICAL CHARACTERISTICS
7 Vdc ≤ V
PARAMETERMIN TYP MAXUNIT
[SMB TIMING SPECIFICATION (VDD = 2.7 V to 5.5 V) (see Figures 4 and 5)]
SMBus TIMING CHARACTERISTICS
t
R
t
F
t
W(H)
t
W(L)
t
SU(STA)
t
H(STA)
t
SU(DAT)
t
H(DAT)
t
SU(STOP)
t
(BUF)
F
S(CL)
HOST COMMUNICATION FAILURE
t
timeout
t
WDI
OUTPUT BUFFER CHARACTERISTICS
V
(SDAL)
(1) Devices participating in a transfer time out when any clock low exceeds the 2- ms minimum time-out period. Devices that have detected
a time-out condition must reset the communication no later than the 35-ms maximum timeout period. Both a master and a slave must
adhere to the maximum value specified, as it incorporates the cumulative stretch limit for both a master (10 ms) and a slave (25 ms).
SCLK/SDATA rise time1μs
SCLK/SDATA fall time300ns
SCLK pulse duration high450μs
SCLK pulse duration low4.7μs
Setup time for START condition4.7μs
START condition hold time after which first clock pulse is generated4μs
Data setup time250ns
Data hold time300ns
Setup time for STOP condition4μs
Bus free time between START and STOP condition4.7μs
Clock frequency10100kHz
SMBus bus release timeout222535ms
Watchdog timeout period140170210s