Texas Instruments CY74FCT16240ETPVCT, CY74FCT16240ETPVC, CY74FCT16240ATPVCT, CY74FCT162240ETPVC, CY74FCT162240ETPAC Datasheet

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16-Bit Buffers/Line Drivers
CY74FCT16240T
CY74FCT162240T
Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
SCCS027 - August 1994 - Revised March 2000
Copyright © 2000, Texas Instruments Incorporated
1CY74FCT162240T
• FCT-E speed at 3.2 ns
• Power-off disable outputs permits live insertion
• Edge-rate control circuitry for significantly improved noise characteristics
• Typical output skew < 250 ps
• ESD > 2000V
• TSSOP (19.6-mil pitch) and SSOP (25-mil pitch) packages
• Industrial temperature range of –40˚C to +85˚C
V
CC
= 5V ± 10%
CY74FCT16240T Features:
• 64 mA sink current, 32 mA source current
• Typical V
OLP
(ground bounce)
<1.0V at VCC = 5V, TA = 25˚C
CY74FCT162240T Features:
• Balanced output drivers: 24 mA
• Reduced system switching noise
• Typical V
OLP
(ground bounce)
<0.6V at VCC = 5V, TA= 25˚C
Functional Description
These 16-bit buffer/line drivers are used in memory driver, clock driver, or other bus interface applications, where high speed and low power are required. With flow-through pinout and small shrink packaging, board layout is simplified. The three-state controls are designed to allow 4-, 8-, or 16-bit operation. The outputs are designed with a power-off disable feature to allow for live insertion of boards.
The CY74FCT16240T is ideally suited for driving high-capacitance loads and low-impedance backplanes.
The CY74FCT162240T has 24-mA balanced output drivers with current limiting resistors in the outputs. This reduces the need for external terminating resistors and provides for mini­mal undershoot and reduced ground bounce. The CY74FCT162240T is ideal for driving transmission lines.
GND
Logic Block Diagrams Pin Configuration
1 2 3 4 5 6 7 8 9 10 11 12
33 32 31 30 29
25
26
27
28
36 35
1
OE
34
SSOP/TSSOP
Top View
FCT16240–1
1Y1
1Y2
1Y3
1Y4
13 14 15 16 17 18 19 20 21 22 23 24
45 44 43 42 41
37
38
39
40
48 47 46
1A1
1A2
1A3
1A4
1
OE
FCT16240–2
2Y1
2Y2
2Y3
2Y4
2A1
2A2
2A3
2A4
2
OE
1Y1 1Y2
1Y3 1Y4
1A1 1A2
1A3 1A4
2
OE
GND
GND
V
CC
2Y3 2Y4
2Y1 2Y2
2A1 2A2
2A3 2A4
V
CC
GND
GND
3Y3 3Y4
3Y1 3Y2
3A1 3A2
3A3 3A4
GND
GND
V
CC
4Y3 4Y4
4Y1 4Y2
4A1 4A2
4A3 4A4
V
CC
GND
3
OE
4
OE
FCT16240–3
3Y1
3Y2
3Y3
3Y4
3A1
3A2
3A3
3A4
3
OE
FCT16240–4
4Y1
4Y2
4Y3
4Y4
4A1
4A2
4A3
4A4
4
OE
FCT16240–5
CY74FCT16240T
CY74FCT162240T
2
Maximum Ratings
[2, 3]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ......................Com’l. –55°C to +125°C
Ambient Temperature with
Power Applied..................................Com’l.–55°C to +125°C
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin) ........................–60 to +120 mA
Power Dissipation..........................................................1.0W
Static Discharge Voltage
(per MIL-STD-883, Method 3015) .............................>2001V
Pin Summary
Name Description
OE Three-State Output Enable Inputs (Active LOW) A Data Inputs Y Three-State Outputs
Function Table
[1]
Inputs Outputs
OE A Y
L L H L H L
H X Z
Operating Range
Range Ambient Temperature V
CC
Industrial –40°C to +85°C 5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[4]
Max. Unit
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[5]
100 mV
V
IK
Input Clamp Diode Voltage VCC= Min., IIN= –18 mA –0.7 –1.2 V
I
IH
Input HIGH Current VCC= Max., VI= V
CC
±1 µA
I
IH
Input HIGH Current VCC= Max., VI= V
CC
±1 µA
I
IL
Input LOW Current VCC= Max., VI= GND ±1 µA
I
IL
Input LOW Current VCC= Max., VI= GND ±1 µA
I
OZH
High Impedance Output Current (Three-State Output pins)
VCC= Max., V
OUT
= 2.7V ±1 µA
I
OZL
High Impedance Output Current (Three-State Output pins)
VCC= Max., V
OUT
= 0.5V ±1 µA
I
OS
Short Circuit Current
[6]
VCC= Max., V
OUT
= GND –80 –140 –200 mA
I
O
Output Drive Current
[6]
VCC= Max., V
OUT
= 2.5V –50 –180 mA
I
OFF
Power-Off Disable VCC= 0V, V
OUT
4.5V
[7]
±1 µA
Output Drive Characteristics for CY74FCT16240T
Parameter Description Test Conditions Min. Typ.
[4]
Max. Unit
V
OH
Output HIGH Voltage VCC= Min., IOH= –3 mA 2.5 3.5 V
VCC= Min., IOH= –15 mA 2.4 3.5 V VCC= Min., IOH= –32 mA 2.0 3.0 V
V
OL
Output LOW Voltage VCC= Min., IOL= 64 mA 0.2 0.55 V
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance.
2. Operation beyond the limits set forth may impair the useful life of the device. Unless noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. Typical values are at VCC=5.0V, TA= +25˚C ambient.
5. This parameter is specified but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperaturewell abovenormal and therebycause invalidreadings in otherparametric tests. In any sequenceof parameter tests, IOS tests should be performed last.
7. Tested at +25˚C.
CY74FCT16240T
CY74FCT162240T
3
Output Drive Characteristics for CY74FCT162240T
Parameter Description Test Conditions Min. Typ.
[4]
Max. Unit
I
ODL
Output LOW Current
[6]
VCC= 5V, VIN= VIH or VIL,V
OUT
= 1.5V 60 115 150 mA
I
ODH
Output HIGH Current
[6]
VCC= 5V, VIN= VIH or VIL, V
OUT
= 1.5V –60 –115 –150 mA
V
OH
Output HIGH Voltage VCC= Min., IOH= –24 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC= Min., IOL= 24 mA 0.3 0.55 V
Capacitance
[5]
(TA = +25˚C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.
[4]
Max. Unit
C
IN
Input Capacitance VIN = 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF
Power Supply Characteristics
Parameter Description Test Conditions Typ.
[4]
Max. Unit
I
CC
QuiescentPowerSupply Current VCC=Max. VIN≤0.2V,
V
IN≥VCC
–0.2V
5 500 µA
I
CC
QuiescentPowerSupplyCurrent (TTL inputs HIGH)
VCC=Max. VIN=3.4V
[8]
0.5 1.5 mA
I
CCD
Dynamic Power Supply Current
[9]
VCC=Max., One Input Tog­gling, 50% Duty Cycle, Out­puts Open,
OE=GND
VIN=VCC or V
IN
=GND
60 100 µA/MHz
I
C
Total Power Supply Current
[10]
VCC=Max., f1=10 MHz, 50% Duty Cycle, Outputs Open, One Bit Toggling,
OE=GND
VIN=VCC or V
IN
=GND
0.6 1.5 mA
VIN=3.4V or V
IN
=GND
0.9 2.3 mA
VCC=Max., f1=2.5 MHz, 50% Duty Cycle, Outputs Open, Sixteen Bits Toggling, OE=GND
VIN=VCC or V
IN
=GND
2.4 4.5
[11]
mA
VIN=3.4V or V
IN
=GND
6.4 16.5
[11]
mA
Notes:
8. Per TTL driven input (V
IN
=3.4V); all other inputs at VCC or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. I
C
=I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
IC=ICC+ICCDHNT+I
CCD(f0
/2 + f1N1)
I
CC
= Quiescent Current with CMOS input levels
I
CC
= Power Supply Current for a TTL HIGH input (VIN=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
f
1
= Input signal frequency
N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
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