Getting help and support...............................................................................................................................................................9
Supported oscilloscopes and probes............................................................................................................................ 11
Minimum system requirements..................................................................................................................................... 11
Downloading and installing the software.......................................................................................................................12
Activate the license.......................................................................................................................................................12
View software version and license key details..............................................................................................................13
Setting up the test environment.................................................................................................................................................. 14
About setting up tests.......................................................................................................................................................... 14
Search instruments connected to the application................................................................................................................ 14
Before you click start............................................................................................................................................................16
Starting the application................................................................................................................................................................18
Run the application.......................................................................................................................................................18
Close the application.................................................................................................................................................... 19
Options menu functions....................................................................................................................................................... 21
TekExpress instrument control settings............................................................................................................................... 24
Setup panel: Configure the test setup.........................................................................................................................................25
DUT: Set DUT settings.........................................................................................................................................................26
Embed / De-embed for Mid-bus probing.......................................................................................................................28
Test Selection: Select the tests............................................................................................................................................ 32
Acquisitions: Set waveform acquisition settings.................................................................................................................. 33
Signal validation overview.............................................................................................................................................34
Configuration: Set measurement limits for tests.................................................................................................................. 35
Preferences: Set the test run preferences........................................................................................................................... 39
Status panel: View the test execution status...............................................................................................................................40
View test execution status....................................................................................................................................................40
View test execution logs.......................................................................................................................................................41
Results panel: View summary of test results...............................................................................................................................42
Filter the test results.............................................................................................................................................................42
View a generated report.......................................................................................................................................................46
Saving and recalling test setup................................................................................................................................................... 47
Test setup files overview...................................................................................................................................................... 47
Save the configured test setup............................................................................................................................................ 47
Load a saved test setup.......................................................................................................................................................47
Select a pre-run session from the loaded test setup............................................................................................................47
Save the test setup with a different name............................................................................................................................48
About SCPI command......................................................................................................................................................... 49
Socket configuration for SCPI commands........................................................................................................................... 49
Test Name............................................................................................................................................................................63
Command Parameters with Examples.................................................................................................................................65
File name extensions...........................................................................................................................................................92
The Tektronix TekExpress M-PHY TX Automated Test software for MPHY40 and MPHY50 runs on Tektronix real-time oscilloscopes that
are based on Windows 10 computer operating systems. MPHY50 and MPHY40 Automated solution provides support for 100% of tests as
per Spec 5.0 & CTS 1.0 at revision 0.2 using TekExpress 5.0 framework, a state-of-the-art tool designed for automation. This solution is
designed for engineers doing verification and validation as per the CTS for HS – Gear1, Gear2, Gear3, Gear4, and Gear5 for MPHY50
and HS – Gear1, Gear2, Gear3, and Gear4 for MPHY40. It also supports ‘UFS4.0 Reference Clock’ measurements for both MPHY50 and
MPHY40 products.
Key features of M-PHY Transmitter testing include:
•100% Test Coverage for all modes and data rates for HS – Gear1, Gear2, Gear3, Gear4, and Gear5 for MPHY50 and HS – Gear1,
Gear2, Gear3 and Gear4 for MPHY40.
•Application covers PWM and SYS modes. Supports ‘UFS4.0 Reference Clock’ measurements for both MPHY50 and MPHY40
products.
•M-PHY TX Automated User-defined mode allows modifying every parameter of different HS, UFS4.0 Ref Clock, PWM, and SYS tests,
for comprehensive debug analysis and characterization.
•Automated testing reduces the complexity of executing transmitter tests and enables you to test devices faster.
•Performance improvement in HS measurement execution compared to previous release.
•Selection of different Gears and Sub gears of HS, PWM, and SYS signals, large/small amplitudes, impedance terminated/unterminated.
•Full Contour Extrapolated eye diagram for BER analysis in steps at E-6 to E-12.
•HS Gear 1 Mask Dynamic Movement to provide optimum eye opening as per specification.
•Accumulation of 3 M UIs in a single acquisition reducing test times for analysis.
•Ability to embed/de-embed using filter files to enable mid bus probing.
•Support for tri mode probes for single ended and differential signaling probing using Industry lowest noise probe P76xx series.
•Highly optimized setup performs Power Spectral Density (PSD) tests using oscilloscope-integrated algorithms uniquely and does not
require an external spectral analyzer or extra hardware to perform PSD measurements.
•Single printable report for all tests across different combinations provides pass/fail summary table, along with margin details, optional
waveform captures, and eye diagrams. Available in (.mht and pdf).
Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program
or operate the application, and do other tasks.
Table 1: TekExpress Application documents
To learn aboutUse this document
How to use the application
How to remotely control the instrument
Conventions
This application help uses the following conventions:
TekExpress M-PHY Tx Help
PDF version of this document can be downloaded from www.tek.com/downloads
Compiled HTML (CHM) version is integrated with the application. Press F1 key from the
keyboard to start the help.
Tektronix Part Number: 077-xxxx-xx
•The term "Application," and "Software" refers to the TekExpress M-PHY Tx application.
•The term “DUT” is an abbreviation for Device Under Test.
•The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse
or using the touch screen.
•A Note identifies important information.
Table 2: Icons used in the help
IconDescription
This icon identifies important information
This icon identifies conditions or practices that could result in loss of data.
This icon identifies additional information that will help you use the application more
efficiently.
Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on
your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See Contacting Tektronix at the front of this
document for contact information.
When you contact Tektronix Technical Support, please include the following information (be as specific as possible):
General information
•All instrument model numbers
•Hardware options, if any
•Modules used
•Your name, company, mailing address, phone number, FAX number
•Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.
Application specific information
•Software version number
•Description of the problem such that technical support can duplicate the problem
•If possible, save the setup files for all the instruments used and the application
•If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file
DPO (Digital Phosphor Oscilloscope), or MSO (Mixed Signal Oscilloscope) Oscilloscopes with
Option DJA and Option DJAN (for BER Contours). Option SDLA64 is mandatory for Gear4 and
Gear5 Differential AC Eye measurements.
The following bandwidths are needed:
•6 GHz and above is recommended for HS-Gear1
•12.5 GHz and above is recommended for up to HS-Gear2
•23 GHz and above is recommended for up to HS-Gear3
•25 GHz and above is recommended for up to HS-Gear4
•33 GHz and above is recommended for up to HS-Gear5
Table 4: Recommended probes for TekExpress M-PHY TX
ComponentRequirement
OscilloscopeSupported oscilloscopes and probes
ProcessorSame as the oscilloscope
Operating System
MemorySame as the oscilloscope
Hard DiskSame as the oscilloscope.
Display
FirmwareTekScope v10.12 or later
Software
Same as the oscilloscope:
•Windows 10 64-bit
Same as the oscilloscope
•SDLA v3.0.13.12 or later
•DPOJET v10.4.0 or later
•Microsoft .NET 4.0 Framework
•Microsoft Internet Explorer 7.0 SP1 or later
•Adobe Reader 7.0 or equivalent software for viewing portable document format (PDF)
files
3
Getting started
ProbesSupported oscilloscopes and probes
Software requirements
Downloading and installing the software
Complete the following steps to download and install the latest TekExpress M-PHY Tx application.
1. Go to www.tek.com.
2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as Software and enter the application name in the MODEL ORKEYWORD field and click SEARCH.
3. Select the latest version of software and follow the instructions to download the software. Copy the executable file into the
oscilloscope.
4. Double-click the executable and follow the on-screen instructions.
The software is installed at C:\Program Files\Tektronix\TekExpress\TekExpress MIPI_MPHY_TX.
5. Select Application > TekExpress M-PHY Tx from the Oscilloscope menu, to open the application.
Activate the license
Activate the license using the Option Installation wizard in the TekScope application:
3
If TekExpress is running on an instrument having a video resolution lower than 800x600 (for example, sampling oscilloscope), it is recommended that you connect a
secondary monitor. The secondary monitor must be configured and active before launching the application.
Set up tests using the tabs in the Setup panel. Settings in the DUT tab use a top-down, left-to-right logic flow, so that any parameter that
affects or acts as a filter for other parameters appears either to the top of or to the left of the affected parameters.
Tests are saved when you save a test setup. To avoid overwriting test results, remember to assign a unique name to the test either before
running it or immediately after.
All listed tests are required for compliance testing.
See also
About test setups
Before you click Start
About running tests
Search instruments connected to the application
Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The
application uses TekVISA to discover the connected instruments.
Note: The instruments required for the test setup must be connected and detected by the application, before running the test.
To refresh the list of connected instruments:
1. Select Options > Instrument Control Settings.
2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to
search. Instrument search is based on the VISA layer, but different connections determine the resource type, such as LAN, GPIB, and
USB. For example, if you choose LAN, the search will include all the instruments supported by the TekExpress that are communicating
over the LAN.
3. Click Refresh. The TekExpress application searches for the connected instruments.
Search status of the instruments connected to LAN
4. When the search is complete, a dialog box lists the instrument-related details based on the search criteria. For example, for the Search
Criteria as GPIB, the application displays all the GPIB instruments connected to the application.
The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in
the Last Updated field.
Deskew
If skew is present between positive and negative channels, then the channels need to be deskewed before being used for waveform
measurements. TekExpress M-PHY TX provides support for channel deskew using the following method:
1.Determine what the skew is for each channel.
2.From the TekScope menu, select Vertical > Deskew.
3.In the Deskew/Attenuation window, click the channel (1 – 4) button for the first channel to be deskewed.
4.Click in the Ch(x) Deskew Time entry field and enter the skew. The skew can be +ve or –ve.
5.Click the channel button for the next channel and repeat step 4.
6.After entering the skew for all the channels that require it, from the Options menu in TekExpress M-PHY TX, select Deskew.
7.In the Deskew and Attenuation dialog box, select the desired level:
•Less than 100 mV signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is less than
100 mV/division.
•100 mV or greater signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is greater
than 100 mV/division.
Figure 1: Deskew
8.Click Set on Scope to set the stored deskew and attenuation values on oscilloscope.
9.Click Read from Scope to read the deskew and attenuation values from the oscilloscope.
10. Click View values to view the deskew, attenuation, and bandwidth values.
11. When the status in the dialog box indicates the deskew is finished, click Close.
Each input channel has its own deskew settings. Deskew compensates individual channels for probes or cables of different lengths. The
instrument applies the delay values after each completed acquisition. The deskew values are saved as part of the instrument setup. The
deskew values for the selected channel are retained until you change the probe, you restore a saved setup, or you recall the factory setup.
Figure 2: Deskew-View values
Note: If you perform the de-embed settings, then performing the Deskew and Attenuation settings are not required.
Running tests
After selecting and configuring the test, review the pre-run checklist and then click Start to run the tests. While tests are running, you
cannot access the Setup or Reports panels. To monitor the test progress, switch back and forth between the Status panel and the Results
panel.
The application displays a report when the tests are complete. While the tests are running, other applications may display windows in the
background. The TekScope application takes precedence over other applications, but you can switch to other applications by using the Alt
+ Tab key combination. To keep the TekExpress M-PHY TX application on top, select Keep On Top from the M-PHY TX Options menu.
See also
Configure test parameters
About setting up tests
Before you click Start
Before you click start
Before you run tests for the first time, do the following:
1. Understand where your test files are stored on the instrument.
After you install and launch TekExpress M-PHY TX, it creates the following folders on the oscilloscope:
Every time you launch TekExpress M-PHY TX, an Untitled Session folder is created in the M-PHY TX folder. The
Untitled Session folder is automatically deleted when you exit the M-PHY TX application (you are prompted to save
the session before exiting if it has not already been saved or if there are unsaved changes).
CAUTION: Do not directly edit or modify any of the session files or folders because this may result in loss of data or corrupted
session files. Each session has multiple files associated with it. When you save a session, the application creates a .TekX file,
and a folder named for the session that contains associated files, on the oscilloscope X: drive.
2. Review the pre-run checklist before you run a test.
See also
View test-related files
Application directories and file types
File name extensions
Pre-test checklist
Do the following before you click Start to run a test. If this is the first time you are running a test for a setup, refer to the information in
Before you click Start.
On the oscilloscope:
•Make sure that all the required instruments are properly warmed up (approximately 20 minutes).
•Perform Signal Path Compensation (SPC).
1. On the oscilloscope main menu, select the Utilities menu.
2. Select Instrument Calibration and run the SPC utility.
•Perform deskew on any cables.
In the M-PHY TX application:
1. Verify that the application is able to find the instrument. If it cannot, perform a search for connected instruments.
a. Select Setup > Test Selection. Select any test and then click Configure.
b. In the Configuration section, click Global Settings.
c. In the Instruments Detected section, click the drop-down arrow to the right of the listed instruments and make sure that the
To start the TekExpress M-PHY Tx, select from the oscilloscope menu bar.Applications > TekExpress M-PHY Tx
Starting the application
During start, a "My TekExpress" folder is created in the Documents folder of the current user and gets mapped to "X" drive. When the
application is closed properly, the "X" drive gets unmapped. Session files are then stored inside the X:\M-PHY Tx folder. If this file is
not found, the application runs an instrument discovery program to detect connected instruments before starting TekExpress M-PHY Tx.
To keep the TekExpress M-PHY Tx application on top of any application, select Keep On Top from the options menu. If the application
goes behind the oscilloscope application, select Applications >TekExpress M-PHY Tx to bring the application to the front.
Operating basics
Run the application
To run the M-PHY TX application, do either of the following:
•Select Analyze > TekExpress M-PHY TX from the TekScope menu.
•Click any saved M-PHY session file.
When you open the application after installation, the application checks for a file called Resources.xml located in the MyTekExpress folder. If this file is not found, instrument discovery is performed before launching M-PHY TX. The Resources.xml
file contains information regarding instruments that are available on your network.
If the application license was not installed using the TekScope menu Utilities > Option Installation selection, you can open and demo the
application 10 times. Each time you open the application without supplying a valid license key, one of the free trials is used.
This section describes the application controls with functionality and its details.
Table 6: Application control description
ItemDescription
Options menuMenu to display global application controls.
Test panelControls that open tabs for configuring test settings and options.
Starting the application
Start / Stop buttonUse the Start button to start the test run of the measurements in the selected order. If prior
acquired measurements are not cleared, then new measurements are added to the existing
set. The button toggles to the Stop mode while tests are running. Use the Stop button to
abort the test.
Pause / Continue buttonUse the Pause button to pause the acquisition. When a test is paused, this button changes
as Continue.
Clear buttonUse the Clear button to clear all existing measurement results. Adding or deleting a
measurement, or changing a configuration parameter of an existing measurement, also
clears measurements. This is to prevent the accumulation of measurement statistics or
sets of statistics that are not coherent. This button is available only on Results panel.
Note: This button is visible only when there are results data on the panel.
Application window move iconPlace the cursor over the top of the application window to move the application window to
Mini view / Normal viewMini view displays the run messages with the time stamp, progress bar, Start / Stop button,
and Pause / Continue button. The application moves to mini view when you click the Start
button.
Options menu functions
To access the Options menu, click in the upper-right corner of the application. It has the following selections:
Table 7: Options menu settings
MenuFunction
Default Test SetupOpens a new test setup with default configurations.
Open Test SetupOpens a previously saved test setup. Displays the list of previously saved test setup file
names. Make the selection and click OK to open the test setup.
Save Test SetupSaves the current test configurations with the specified file name.
Save Test Setup AsSaves the current test setup with a different file name or file type.
Open RecentDisplays the recently opened test setup file names. Make the selection and click OK to
open the test setup.
Instrument Control Settings
Keep On Top
Email SettingsConfigures email options for test run and result notifications.
DeskewLoads oscilloscope channel deskew settings into the application.
HelpDisplays the TekExpress M-PHY Tx help.
Table continued…
Detects, lists, and refreshes the connected instruments found on the specified connections
(LAN, GPIB, USB, Serial, Non-VISA Resources, TekLink, and VXI).
Always keeps the TekExpress M-PHY Tx application on top of all the applications.
Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to
configure email settings:
Figure 3: Email settings window
1.Select Options > Email Settings to open the Email Settings dialog box.
2.(Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate
the addresses with commas.
3.(Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name,
followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example:
user@yourcompany.com.
4.(Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location,
and the SMTP Port number, in the corresponding fields.
If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.
If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.
Note:
5.In the Email Attachments section, select from the following options:
•Reports: Select to receive the test report with the notification email.
•Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you
want to receive the full log or just the last 20 lines.
6.In the Email Configuration section:
•Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is
5 MB.
•Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a
notification. The default is 1. You can also specify a timeout period.
7.Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email
notifications.
Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You
can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected
instrument is displayed in the Retrieved Instruments window.
To access, click Options > Instrument Control Settings. Select GPIB as search criteria for TekExpress application and click Refresh.
The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in the test
configuration section.
Figure 4: TekExpress Instrument Control Settings window
Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT
settings also affect the list of available tests in the Test Selection tab.
Figure 5: DUT tab
Click Setup > DUT to access the DUT parameters:
Table 8: DUT tab configuration
SettingDescription
DUT IDAdds an optional text label for the DUT to reports. The default value is DUT001.
The maximum number of characters supported is 32. You cannot use the
characters (.,..,...,\,/:?”<>|*) in an ID name.
Opens a comments dialog box which allows you to enter optional text to add to
Comments icon (to the right of the DUT ID field)
Acquire live waveformsAcquire active signals from the oscilloscope for testing.
Use pre-recorded waveform filesRun an analysis on a saved run session file. Select a file from the Run Session
SessionLists saved run sessions (waveform acquisitions) on which you can perform
Table continued…
a report. You can enter a maximum number of 256 characters. Refer Configure
report view settings to enable or disable comments which displays on the test
report.
field.
analysis. Use in conjunction with the ‘Use pre-recorded waveform files’ control.
Note: Pre-recorded (saved) waveform file names follow a specific
naming syntax. To use your own waveform files (generated outside
Frequency Selection for SYSSelect one or more frequencies. Available frequencies are 26 MHz, 38.4 MHz,
Frequency Selection for UFS4 Ref ClkSelect one or more frequencies. Available frequencies are 19.2 MHz, 26 MHz,
Filter SelectionClick the Setup button to browse and select the filter files.
Multi-LaneClick the Setup button to select the number of lanes for testing. You can select
Select one or more Gears (0-7) relevant to your DUT PWM signal testing
requirements.
•Gear 0: 0.01-3 Mbps
•Gear 1: 3-9 Mbps
•Gear 2: 6-18 Mbps
•Gear 3: 12-36 Mbps
•Gear 4: 24-72 Mbps
•Gear 5: 48-144 Mbps
•Gear 6: 96-288 Mbps
•Gear 7: 192-576 Mbps
and 52 MHz.
38.4 MHz, and 52 MHz.
1/2/4/8 Lanes.
Note: The selected lanes can also be viewed on the DUT panel.
Embed / De-embed for Mid-bus probing
For M-PHY TX testing, measurements are specified at the TX pins. Many a times, users measure signals at the end of the channel to see
the effect at the RX pins or some test point in the middle of the channel (Mid-bus probing). For conformance testing, to ensure the values
meet the CTS, there would have a need to embed and/or de-embed channel to make measurements at the pin.
TekExpress Automated software allows you to do mid-bus probing via embedding/de-embedding signal path using filter files. You can use
the "Filter Setup" option in DUT panel to add the filters. This setting will be applied globally to all the measurements during acquisition.
Range
Test 1.1.11-HS-TX Slew Rate Monotonicity
Test 1.1.12-HS-TX Slew Rate Resolution
√√√√√√√√√√xxxxxxxxxx
6
√√√√√√√√√√xxxxxxxxxx
6
√√√√√√√√√√xxxxxxxxxx
Test 1.1.13-HS-TX Intra-Lane Output Skewxxxxx√√√√√xxxxx√√√√√
Test 1.1.14-HS-TX Transmitter Pulse Width√√√√√√√√√√√√√√√√√√√√
Test 1.1.15-HS-TX Total Jitterxxxxxxxxxx√√√√√√√√√√
Test 1.1.16-HS-TX Short-Term Total Jitterxxxxxxxxxx√√√√√√√√√√
Test 1.1.17-HS-TX Deterministic Jitter√√√√√√√√√√√√√√√√√√√√
Test 1.1.18-HS-TX Short term Deterministic
√√√√√√√√√√√√√√√√√√√√
Jitter
BER Eye Contour
4
xxxxxxxxxx√√√√√√√√√√
DUT Operation Mode - PWM Tests (Burst Mode)
Test NameDifferentialSingle Ended
G0 G1 G2 G3 G4 G5 G6 G7 G0 G1 G2 G3 G4 G5 G6 G7
Test 1.2.1-PWM-TX Transmit Bit Duration√√√√√√√√√√√√√√√√
Test 1.2.2-PWM-TX Transmit Ratio√√√√√√√√√√√√√√√√
Test 1.2.3-PWM-TX PREPARE Length√√√√√√√√√√√√√√√√
Test 1.2.4-PWM-TX Common Mode DC Output Voltage
xxxxxxxx√√√√√√√√
Amplitude
Test 1.2.5-PWM-TX Differential DC Output Voltage
√√√√√√√√√√√√√√√√
Amplitude
Test 1.2.7-PWM-TX Maximum Differential AC Output
√√√√√√√√√√√√√√√√
Voltage Amplitude
Test 1.2.8-PWM-TX 2080 Rise and Fall Times√√√√√√√√√√√√√√√√
Test 1.2.9-PWM-TX Lane-to-Lane Skew√√√√√√√√√√√√√√√√
Test 1.2.10-PWM-TX Transmit Bit Duration Tolerance√√√√√√√√√√√√√√√√
Test 1.2.11-PWM-TX G0 Minor Duration√xxxxxxx√xxxxxxx
DUT Operation Mode - PWM Tests (Continuous Mode)
Test NameDifferentialSingle Ended
G0 G1 G2 G3 G4 G5 G6 G7 G0 G1 G2 G3 G4 G5 G6 G7
Test 1.2.1-PWM-TX Transmit Bit Duration√√√√√√√√√√√√√√√√
Test 1.2.2-PWM-TX Transmit Ratioxxxxxxxxxxxxxxxx
Test 1.2.3-PWM-TX PREPARE Lengthxxxxxxxxxxxxxxxx
Test 1.2.4-PWM-TX Common Mode DC Output Voltage
xxxxxxxxxxxxxxxx
Amplitude
Test 1.2.5-PWM-TX Differential DC Output Voltage
xxxxxxxxxxxxxxxx
Amplitude
Test 1.2.7-PWM-TX Maximum Differential AC Output
√√√√√√√√√√√√√√√√
Voltage Amplitude
Test 1.2.8-PWM-TX 2080 Rise and Fall Timesxxxxxxxxxxxxxxxx
Test 1.2.9-PWM-TX Lane-to-Lane Skew√√√√√√√√√√√√√√√√
Test 1.2.10-PWM-TX Transmit Bit Duration Tolerancexxxxxxxxxxxxxxxx
Test 1.2.11-PWM-TX G0 Minor Durationxxxxxxxxxxxxxxxx
DUT Operation Mode - SYS Tests
Test NameBurstContinuous
DifferentialSingle EndedDifferentialSingle Ended
Test 1.3.1-SYS-TX Unit Interval and
√√√√
Frequency Offset
7
Test 1.3.2-SYS-TX Ref Clock frequency
xxxx
Test 1.3.3-SYS-TX PREPARE Length√√xx
Test 1.3.4-SYS-TX Common Mode DC
x√xx
Output Voltage Amplitude
Test 1.3.5-SYS-TX Differential DC Output
√√xx
Voltage Amplitude
Test 1.3.7-SYS-TX Maximum Differential AC
√√√√
Output Voltage Amplitude
Test 1.3.8-SYS-TX 20-80% Rise and Fall
Use the Test Selection tab to select the tests. The test measurements available depends on the settings selected in the DUT tab.
Figure 6: Test selection tab
Table 9: Test Selection tab configuration
SettingDescription
Deselect AllDeselects (clears) all tests.
Select RequiredSelects all test required to pass compliance.
Select AllSelects all listed tests.
Test selection fieldLists available test and if they are selected to run. Click in the box adjacent to a test
to select or unselect a test. Tests listed are affected by DUT tab selections (GEAR,
Continuous Mode, Burst Mode, Single-Ended, or Differential).
Test Description fieldShows a description of the selected test.
SchematicOpens a connection diagram that shows the DUT test setup. Use the diagram to verify
Use Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type and the tests
selected.
Figure 7: Acquisition tab
Table 10: Acquisitions tab configuration
SettingDescription
Refresh sourcesUpdates the list of available channel sources as used by the Source
fields in the Device list. Click this button if you want to change the
channel connections in the test setup.
View ProbesDisplays the Source, Probe Type, and Probe models.
Acquisition and Save OptionsSave and Analyze Acquisitions in Sequence
Show Acquire ParametersWhen selected it shows the acquisition parameters in the test list.
Acquire OnlyWhen selected will not analyze after waveforms are acquired.
Delete WaveformsWhen selected will delete the waveforms after the analysis.
Signal ValidationSelect a Signal validation parameter (Signal validation is valid only
Prompt me if signal failsSelect to open a dialog box when the application fails to acquire
a valid signal after a specified number of retries (as set in the
Configuration tab or fields). Select one of the three options in the
dialog box. Refer Signal validation overview on page 34 for more
details.
Skip test if signal failsSelect to skip all tests that depend on an acquired signal that fails
signal validation. The comments section in the report file will show
the details as "User skipped acquisitions for this pattern".
Use signal as is - Don't Check Select to skip signal validation and use the signal as-is for testing.
The test results may not be as expected.
Note: In Pre-recorded mode, the acquisition table includes a column called "Waveform File Name." Use the fields in this column
to browse and select waveform files to load for analysis.
TekExpress M-PHY Tx application saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder for each
session (a session is started when you click the Start button). The folder path is X:\TekExpress M-PHY Tx\UntitledSession\<dutid>\<date>_<time>. Images created for each analysis, XML files with result values, reports, and other
information specific to that particular execution are also saved in this folder.
Saving a session moves the session file contents from the Untitled Session folder to the specified folder name and changes the session
name to the specified name.
Signal validation overview
Options displayed in Acquisition panel for Signal Validation are
•Prompt me if signal fails: Signal validation is performed on the acquired signal and if the validation fails, the application will attempt to
re-acquire the signal depending on the retry count set by you in the configuration menu. In case the validation still fails after exceeding
the retry count, a pop-up is displayed to select one of the following three options:
•Re-acquire: A fresh attempt is made to re-acquire the signal.
•Use Anyway: Current acquired signal is used for all the tests.
•Skip Test: Any test(s) that depend on this acquisition will be skipped and the same will be displayed in the report.
•Skip test if signal fails: Signal validation is performed on the acquired signal and if validation fails, any test(s) that depend on this
acquisition will be skipped and the same will be displayed in the report. The comments section in the report file will display the details
as 'User skipped acquisitions for this pattern'.
•Use signal as is - Don't Check: Signal validity will be skipped and no check will be made after the signal is acquired. The signal will
directly be used for testing and hence, the final results in report may not be as expected.
Signal validation checks the following signal parameters on each acquisition for the indicated measurement type:
•Data Rate (HS): If the difference between the measured and expected data rate is less than 2000 ppm, the signal is considered valid
for this parameter. The Data Rate check is mandatory for signal validation.
•MARKER0 (HS): If MARKER0 is present, the signal is considered valid for this parameter. The MARKER0 check is mandatory for
signal validation.
•CRPAT (HS): If one complete CRPAT (LLI specific) is present, then the signal is considered valid for this parameter. The CRPAT check
is not mandatory for signal validation.
Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific
configurations available in this tab depends on the selections made in the DUT panel and Test Selection panel.
Table 11: Configuration tab: Common parameters
SettingsDescription
Limit Editor
Displays the upper and lower limits for the applicable measurement using different types of comparisons.
Table 12: Configuration tab: Global Settings configuration
SettingDescription
Compliance ModeSets the global and measurement parameters of all measurements
to the values required to pass compliance testing. If you are in User
Define Mode, selecting compliance mode returns all global settings
and measurement parameters to their compliance default values.
Note: Save test setups made in the User Defined Mode
before changing to Compliance Mode, as the application
does not automatically save user defined changes or
prompt you to save settings before changing modes.
User Defined ModeEnables editing of the global and measurement parameters for
tests.
Limits EditorOpens the Limits Editor window where you can set high and low
limits for each test when in User Defined Mode. If you are in
Compliance Mode you can only view the default limit values. Limits
Editor
Global Settings
Instruments Detected
Click this tab to list the detected instrument(s) and any available
global parameters that you can set. The global settings apply to all
tests.
Voltage Term Setting
To select a different instrument, click on the instruments list in the
Instruments Detected area and select an instrument from the menu.
If you do not see the desired instrument in the list, refresh the list. If
the instrument is still not listed, verify that the instrument is powered
on, has correct network settings, and is connected to the network or
instrument.
Lists all tests for the selected measurement type (HS or PWM
or SYS or UFS). Click on a measurement to view the available
parameters in the tabbed field below the list. The parameters and
parameter type tabs shown depend on the selected test.
Select User Defined Mode to edit test parameters.
Use the scroll bar in the parameters area to scroll through all
available parameters.
Note: Save test setups made in the User Defined Mode
before changing to Compliance Mode, as the application
does not automatically save user defined changes or
prompt you to save settings before changing modes.
Limits Editor controls
The Limits Editor window lets you set high and low limits for each test when in User Defined Mode.
In Compliance Mode limit settings can only be viewed and cannot be edited.
Test NameThe name of the test.
DetailsThe limit test(s) that are part of the overall test suite.
Compare StringSets the comparison logic for the high or low limit test parameter. Click on this field and
select the appropriate comparison logic from the menu. There is a separate Compare
String field for each low limit and the high limit parameter.
Low Limit/High LimitThe numeric value of the low or high limit parameter. Click in the field and enter a value.
The limit units are shown in the Description field for that limit test.
OKClick OK to close the Limits Editor window and return to the test configuration view.
Note: Save test setups made in the User Defined Mode before changing to
Compliance Mode, as the application does not automatically save user defined
changes or prompt you to save settings before changing modes.
Limits Editor warning
•Press the keyboard Esc button or click the X button (upper right corner of Limits Editor dialog box) to cancel or not save the current
edits.
•If you enter the wrong compare string or wrong value in a field, you cannot select or move to another cell until you enter a correct value
into the field in question.
•You cannot delete or clear a compare string or value once entered.
Use Preferences tab to set the application action on completion of a measurement. The Preferences tab has the feature to enable or
disable certain options related to the measurement execution.
Figure 11: Preferences tab
Refer the below table for the options available in the Preferences tab:
Table 15: Preferences tab settings
SettingDescription
Execution Options
Show alert when new deskew values are configured on TekScope
Actions on Test Measurement Failure
On Test Failure, stop and notify me of the failure
Select to stop the test run on Test Failure, and to get notified via
email. By default, it is unselected. Click Email Settings to configure
the email settings to receive notifications.
The Status panel contains the Test Status and Log View tabs, which provides status on the test acquisition and analysis (Test Status) and
listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start to execute the test. Select the
Test Status or the Log View tab to view these items while the test execution is in progress.
View test execution status
The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and
analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.
The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand (
collapse () the table rows.
) and
Figure 12: Test execution status view in Status panel
Table 16: Test execution status table headers
Table HeaderDescription
Test NameDisplays the measurement name.
AcquisitionDescribes the type of data being acquired.
Acquire StatusDisplays the progress state of the acquisition:
Analysis StatusDisplays the progress state of the analysis:
•To be started
•In Progress
•Completed
View test execution logs
The Test Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its
timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.
Figure 13: Log view in Status panel
Table 17: Status panel settings
ControlDescription
Message HistoryLists all the executed test operations and timestamp information.
Auto Scroll
Clear LogClears all the messages from the log view.
Save
Enables automatic scrolling of the log view as information is added to the log during the test execution.
Saves the log file into a text file format. Use the standard Save File window to navigate to and specify
the folder and file name to save the log text.
Results panel: View summary of test results
Results panel: View summary of test results
When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.
In the Results table, each test result occupies a row. By default, results are displayed in summary format with the measurement details
collapsed and with the Pass/Fail column visible.
Figure 14: Results panel with measurement results
Click icon on each measurement in the row to expand and to display the minimum and maximum parameter values of the
measurement.
Filter the test results
Each column in the result table can be customized and displayed by enabling or disabling any column as per your requirement. You can
change the view in the following ways:
•To remove or restore the Pass/Fail column, select Preferences > Show Pass/Fail.
•To expand all the listed tests, select View Results Details from the Preferences menu in the upper right corner.
•To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.
•To view the results grouped by lane or test, select the corresponding item from the Preferences menu.
•To expand the width of a column, place the cursor over the vertical line that separates the column from the column to the right. When
the cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.
•To clear all test results displayed, click Clear.
Click Reports panel to configure the report generation settings and select the test result information to include in the report. You can use
the Reports panel to configure report generation settings, select test content to include in reports, generate the report, view the report,
browse for reports, name and save reports, and select report viewing options.
Report configuration settings
The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test
or when creating and saving test setups. Report settings configured are included in saved test setups.
Figure 15: Report panel- Configuration tab
Table 18: Report configuration panel settings
ControlDescription
ViewClick to view the most current report.
Generate ReportGenerates a new report based on the current analysis results.
Save AsSpecify a name for the report.
Report Update Mode Settings
Generate new reportEach time when you click Run and when the test execution is complete, it will create a new
report. The report can be in either .mht, .pdf, or .csv file formats.
Append with previous run sessionAppends the latest test results to the end of the current test results report. Each time when
you click this option and run the tests, it will run the previously failed tests and replace the
failed test result with the new pass test result in the same report.
Include header in appended reportsSelect to include header in appended reports.
Replace current test resultsReplaces the previous test results with the latest test results. Results from newly added
tests are appended to the end of the report.
In previous run, current session
In any run, any sessionSelect to replace current test results in the report with the test result(s) in the selected run
Report Creation Settings
Report name
Select to replace current test results in the report with the test result(s) of previous run in
the current session.
session’s report. Click and select test result of any other run session.
Displays the name and path of the <Application Name> report. The default
location is at \My Documents>\My TekExpress\<ApplicationName>\Reports. The report file in this folder gets overwritten each time you run
a test unless you specify a unique name or select to auto increment the report name.
To change the report name or location, do one of the following:
•In the Report Path field, type the current folder path and name.
•Double-click in the Report Path field and then make selections from the popup
keyboard and click Enter.
Be sure to include the entire folder path, the file name, and the file extension.
For example: C:\Documents and Settings\your user name\MyDocuments\My TekExpress\<Application Name> \DUT001.mht.
Save as type
Auto increment report name if duplicate
Create report automatically at the end of the
run
View report after generating
Note: You cannot set the file location using the Browse button.
Open an existing report
Click Browse, locate and select the report file and then click View at the bottom of the
panel.
Saves a report in the specified file type, selected from the drop-down list. The report is
saved in .csv, .pdf, or .mht.
Note:
If you select a file type different from the default, be sure to change the report file
name extension in the Report Name field to match.
Sets the application to automatically increment the name of the report file if the application
finds a file with the same name as the one being generated. For example: DUT001,
DUT002, DUT003. This option is enabled by default.
Select to create the report with the settings configured, at the end of run.
Automatically opens the report in a Web browser when the test execution is complete. This
option is selected by default.
The View Settings tab describes the report view settings to configure the Reports panel. Select report view settings before running a test
or when creating and saving test setups. Report settings configured are included in saved test setups.
Figure 16: Report panel-View settings tab
Table 19: Report panel view settings
ControlDescription
Contents To Save Settings
Include pass/fail info in details tableSelect to include pass/fail information in the details table of the report.
Include detailed resultsSelect to include detailed results in the report.
Include plot imagesSelect to include the plot images in the report.
Include setup configurationSets the application to include hardware and software information in the summary box
at the top of the report. Information includes: the oscilloscope model and serial number,
the oscilloscope firmware version, and software versions for applications used in the
measurements.
Include complete application configurationSelect to include the complete application configuration in the report.
Include user commentsSelect to include any comments about the test that you or another user have added in
the DUT tab of the Setup panel. Comments appear in the Comments section, below the
Setup InformationThe summary box at the beginning of the report lists setup configuration information. This information
includes the oscilloscope model and serial number, optical module model and serial number, and software
version numbers of all associated applications.
Test Name Summary TableThe test summary table lists all the tests which are executed with its result status.
MeasurementThe measurement table displays the measurement related details with its parameter value.
User commentsIf you had selected to include comments in the test report, any comments you added in the DUT tab are
Saved test setup information (such as the selected oscilloscope, general parameters, acquisition parameters, measurement limits,
waveforms (if applicable), and other configuration settings) are saved under the setup name at X:\TekExpress M-PHY Tx.
Use test setups to:
•Run a new session, acquire live waveforms, using a saved test configuration.
•Create a new test setup using an existing one.
•View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results
summary.
•Run a saved test using saved waveforms.
Save the configured test setup
You can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default
test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other
configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s
default value.
Select Options > Save Test Setup to save the opened setup.
Select Options > Save Test Setup As to save the setup with different name.
Load a saved test setup
To open (load) a saved test setup, do the following:
•Select Options > Open Test Setup.
•Select the setup from the list and click Open. Setup files are located at X:\TekExpress M-PHY Tx.
Select a pre-run session from the loaded test setup
Complete the following steps to load a test setup from a pre-run session:
1. Select Options > Open Test Setup.
2. Select a setup from the list and then click Open. Setup files are located at X:\TekExpress M-PHY Tx\.
3. Switch the mode to Pre-recorded waveform files in the DUT panel.
4. Select the required waveforms from the selected setup in the Acquisition tab and Run the required test.
You can use the Standard Commands for Programmable Instruments (SCPI) to communicate remotely with the TekExpress application.
Complete the TCPIP socket configuration and the TekVISA configuration in the oscilloscope or in the device where you are executing the
script.
Note: If you are using an external PC to execute the remote interface commands, then install TekVISA in the PC to make the
configurations.
Socket configuration for SCPI commands
This section describes the steps to configure the TCPIP socket configuration in your script execution device and the steps to configure the
TekVISA configuration in the oscilloscope to execute the SCPI commands.
TCPIP socket configuration
1. Click Start > Control Panel > System and Security > Windows Firewall > Advanced settings.
2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer >
Inbound Rules and click New Rule…
2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of
the TekExpress device in Hostname and type Port as 5000. Click to configure the IP address with Port.
Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the
oscilloscope where the TekExpress application is running.
3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice
Instrument Manager > Instruments.
4. Double-click OpenChoice Talker Listener and enter the Command *IDN? in command entry field and click Query. Check that the
Operation is successful and Talker Listener Readout displays the Command / Data.
This command sets the value for the selected instrument type.
Syntax
TEKEXP:INSTRUMENT "<InstrumentType>",<Value>"\n
Inputs
InstrumentType
Value
Note: Check Command parameters list section for InstrumentType and Value parameters.
Outputs
NA
TEKEXP:INSTRUMENT?
This command queries the instrument selected for the specified instrument type.
SCPI Commands
Syntax
TEKEXP:INSTRUMENT? "<InstrumentType>"\n
Inputs
InstrumentType
Check Command parameters list section for InstrumentType parameters.
Note:
Outputs
Returns the instrument selected for the specified instrument type
TEKEXP:LASTERROR?
This command queries the last error string occurred for the current TCP session. If there are no errors since startup, or since the last call to
TEKEXP:LASTERROR?\n, this command returns an empty string.
Syntax
TEKEXP:LASTERROR?\n
Inputs
NA
Outputs
<string>
TEKEXP:LIST?
This command queries the list of available device, suite, test, version or instrument.
Note: This command returns the list of items within double quotes (""). Iterate the receive procedure until the list ends with double
quotes otherwise the next query commands won’t work as expected.
Returns the list of available device(s) as comma separated values.
Returns the list of available suite(s) as comma separated values.
Returns the list of available test(s) as comma separated values.
Returns the list of available version(s) as comma separated values.
Returns the list of available instruments' for the given Instrument
type as comma separated values.
Inputs
InstrumentType
Note: Check Command parameters list section for InstrumentType parameters.
TEKEXP:MODE
SCPI Commands
This command sets the execution mode as compliance or user defined.
Syntax
TEKEXP:MODE {COMPLIANCE | USER-DEFINED}\n
Inputs
{COMPLIANCE | USER-DEFINED}
Outputs
NA
TEKEXP:MODE?
This command queries the execution mode type.
Syntax
TEKEXP:MODE?\n
Inputs
NA
Outputs
{COMPLIANCE | USER-DEFINED}
TEKEXP:POPUP
This command sets the response to the active popup shown in the application.
Returns the value of Parameter for type GENERAL | ACQUIRE | ANALYZE | DUTID.
Test Name
Test Names for HS
Example to Select a Test TEKEXP:SELECT TEST,"Test 1.1.1-HS-TX Unit Interval and Frequency Offset",True
Example to check Test selection status TEKEXP:SELECT? TEST,"Test 1.1.1-HS-TX Unit Interval and Frequency Offset"
Example to Deselect a Test TEKEXP:SELECT TEST,"Test 1.1.1-HS-TX Unit Interval and Frequency Offset",False
Test Name
Test 1.1.1-HS-TX Unit Interval and Frequency Offset
Test 1.1.2-HS-TX Common-Mode AC Power Spectral Magnitude Limit
Test 1.1.3-HS-TX PREPARE Length
Test 1.1.4-HS-TX Common Mode DC Output Voltage Amplitude
Test 1.1.5-HS-TX Differential DC Output Voltage Amplitude
Test 1.1.6-HS-TX G1 and G2 Differential AC Eye
Test 1.1.7-HS-TX G3, G4 and G5 Differential AC Eye
Test 1.1.8-HS-TX 20-80% Rise and Fall Times
Test 1.1.9-HS-TX Lane-Lane Output Skew
Test 1.1.10-HS-TX Slew Rate Control Range
Test 1.1.11-HS-TX Slew Rate Monotonicity
Test 1.1.12-HS-TX Slew Rate Resolution
Test 1.1.13-HS-TX Intra-Lane Output Skew
Test 1.1.14-HS-TX Transmitter Pulse Width
Test 1.1.15-HS-TX Total Jitter
Test 1.1.16-HS-TX Short-Term Total Jitter
Test 1.1.17-HS-TX Deterministic Jitter
Test 1.1.18-HS-TX Short term Deterministic Jitter
BER Eye Contour
SCPI Commands
Test Names for SYS
Example to Select a Test TEKEXP:SELECT TEST,"Test 1.3.1-SYS-TX Unit Interval and Frequency Offset",True
Example to check Test selection status TEKEXP:SELECT? TEST,"Test 1.3.1-SYS-TX Unit Interval and Frequency Offset"
Example to Deselect a Test TEKEXP:SELECT TEST,"Test 1.3.1-SYS-TX Unit Interval and Frequency Offset",False
Test Name
Test 1.3.1-SYS-TX Unit Interval and Frequency Offset
Test 1.3.2-SYS-TX Ref Clock frequency
Test 1.3.3-SYS-TX PREPARE Length
Test 1.3.4-SYS-TX Common Mode DC Output Voltage Amplitude
Test 1.3.5-SYS-TX Differential DC Output Voltage Amplitude
Test 1.3.7-SYS-TX Maximum Diffrential AC Output Voltage Amplitude
Test 1.3.8-SYS-TX 20-80% Rise and Fall Times
Test 1.3.9-SYS-TX Lane-Lane Output Skew
Test Names for PWM
Example to Select a Test TEKEXP:SELECT TEST,"Test 1.2.1-PWM-TX Transmit Bit Duration",True
Example to check Test selection status TEKEXP:SELECT? TEST,"Test 1.2.1-PWM-TX Transmit Bit Duration"
Example to Deselect a Test TEKEXP:SELECT TEST,"Test 1.2.1-PWM-TX Transmit Bit Duration",False
Test Name
Test 1.2.1-PWM-TX Transmit Bit Duration
Test 1.2.2-PWM-TX Transmit Ratio
Test 1.2.3-PWM-TX PREPARE Length
Test 1.2.4-PWM-TX Common Mode DC Output Voltage Amplitude
Test 1.2.5-PWM-TX Differential DC Output Voltage Amplitude
Test 1.2.7-PWM-TX Maximum Differential AC Output Voltage Amplitude
Test 1.2.8-PWM-TX 2080 Rise and Fall Times
Test 1.2.9-PWM-TX Lane-Lane Output Skew
Test 1.2.10-PWM-TX Transmit Bit Duration Tolerance
Test 1.2.11-PWM-TX G0 Minor Duration
SCPI Commands
Test Names for UFS4 Ref Clock
Example to Select a Test TEKEXP:SELECT TEST,"Frequency",True
Example to check Test selection status TEKEXP:SELECT? TEST,"Frequency"
Example to Deselect a Test TEKEXP:SELECT TEST,"Frequency",False
Test Name
Frequency
Frequency Error
Input High Voltage
Input Low Voltage
Input Clock Rise Time
Input Clock Fall Time
Duty Cycle
Random Jitter
Deterministic Jitter
You can find the application files at C:\Program Files\Tektronix\TekExpress M-PHY Tx. The application directory and associated files are
organized as follows:
The following table lists the default directory names and their usage:
Table 20: Application directories and usage
Directory namesUsage
BinContains application libraries
Compliance SuitesContains test suite specific files
ICPContains instrument and application specific interface libraries
ImagesContains images of the application
LibContains utility files specific to the application
LicensesContains all the license files
Report GeneratorContains style sheets for report generation
ToolsContains instrument and application specific files
File name extensions
The TekExpress M-PHY Tx software uses the following file name extensions:
Table 21: File name extension
File name extensionDescription
*.TekXApplication session files (the extensions may not be displayed)
*.pyPython sequence file.
*.xml
*.csv
*.mht
*.pdf
*.xsltStyle sheet used to generate reports
*.pngCaptured images
Test-specific configuration information (encrypted) files.
Application log files
Test result reports
Plot data
Test result reports (default)
Test reports can also be saved in HTML format
Files related to tests are stored in My Documents\TekExpress M-PHY Tx\Untitled session folder. Each test setup in this folder has both a
test setup file and a test setup folder, both with the test setup name. The test setup file is preceded by the TekExpress icon.
Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.
Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session
using the naming convention (date)_(time). Each session file is stored outside its matching session folder:
Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran
tests using prerecorded waveform files, these are included here.
The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at X:\TekExpress M-PHY
Tx. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the
Untitled Session folder until you run a new test or until you close the application.
Waveform naming conventions (pre-recorded mode)
HS test output file name conventions
The following file name syntax is used for HS test output waveform files:
[Lanex]-[Source]-[AcquireType]-[Termination]-[Gear]-[Amplitude]-[SRn]-[RecordLength in M]-[SampleRate in G]-[Diff/SEPos/SENeg].wfm
Table 22: Waveform naming convention for HS signal type in TekExpress M-PHY Tx v10.2 and above
Test NameAcquistion Acquistion NameWaveform Naming in Pre-recorded mode for HS-Signal type
DifferentialSingle Ended
Test 1.1.11CRPATLane0-CH1-CRPAT-RT-Gear4A-LATest 1.1.3
Test 1.1.4
Test 1.1.5
Test 1.1.8
Test 1.1.14
Test 1.1.22CRPAT PSD-Single-
ended
Test 1.1.63CRPAT - 3MNot applicable for pre-recorded mode
Test 1.1.74CRPAT - EyeNot applicable for pre-recorded mode
The following file name syntax is used for PWM test output waveform files:
[LANEx] [CHy] [CRPAT] [Termination] [Gear] [Amplitude] [Horizontal Scale] [Resolution] [POS/NEG].wfm
The following are a few PWM file name examples:
Lane0 CH3 CRPAT RT Gear0 LA 2000usdiv 4000pspt POS.wfm
Lane0 CH3 CRPAT RT Gear0 LA 2000usdiv 4000pspt NEG.wfm
SYS test output file name conventions
The following file name syntax is used for SYS test output waveform files:
[LANEx] [CHy] [CRPAT] [Termination] [Gear] [Amplitude] [Horizontal Scale] [Resolution] [POS/NEG].wfm
In the pre recorded mode, the automation expects the waveforms to be provided in the same naming format.
Note: For Lane to Lane skew measurements in HS, PWM, and SYS (Test 1.1.9 - HS-TX Lane-to-Lane Skew, 1.2.9 - PWM-TX
Lane-to Lane Skew, and 1.3.9 -SYS-TX Lane-to-Lane Skew) uses inputs from two lanes. The following file name syntax is used
for Lane to Lane skew measurements for HS, PWM and SYS tests for output waveform file:
[LANEx] [LANEX1] [CHy] [CRPAT] [Termination] [Gear] [Amplitude] [Horizontal Scale] [Resolution] [POS/NEG].wfm
where X is reference lane (Lane0/L0) and X1 is another lane (Lane1, Lane2, Lane3...).
UFS4 test output file name conventions
The following file name syntax is used for UFS test output waveform files:
UFS4-[Source]-[AcquireType]-[Termination]-[Frequency]-[RecordLength in M]-[SampleRate in G]-[Diff/SEPos/SENeg].wfm
Table 23: Waveform naming convention for UFS4 Ref Clock signal type in TekExpress M-PHY Tx v10.2 and above
Test NameAcquistionAcquistion
Name
Frequency1UFS4-RefFrequency Error
Input High Voltage
Input Low Voltage
Input Clock Rise Time
Input Clock Fall Time
Duty Cycle
RJ
DJ
Clock
Waveform Naming in Pre-recorded mode for UFS4-Signal type
DifferentialSingle Ended
Save the test setup 47
Save the test setup 48
Save the test setup with a different name 48
Saving test setup 47
SCPI command 49
SCPI commands
TEKEXP:*IDN? 55
TEKEXP:*OPC? 55
TEKEXP:ACQUIRE_MODE 56
TEKEXP:ACQUIRE_MODE? 56
TEKEXP:EXPORT 56
TEKEXP:INFO? 56
TEKEXP:INSTRUMENT 57
TEKEXP:INSTRUMENT? 57
TEKEXP:LASTERROR? 57
TEKEXP:LIST? 57
TEKEXP:MODE 58
TEKEXP:MODE? 58
TEKEXP:POPUP 58
TEKEXP:POPUP? 59
TEKEXP:REPORT 59
TEKEXP:REPORT? 59
TEKEXP:RESULT? 59
TEKEXP:SELECT 60
TEKEXP:SELECT? 60
TEKEXP:SETUP 61
TEKEXP:STATE 61
TEKEXP:STATE? 61
TEKEXP:VALUE 61
TEKEXP:VALUE? 62
SCPI Commands
SCPI Commands (continued)
SCPI 49
Search instruments connected
instruments connected to the application 15
Select a loaded test setup 47
Select a pre-run session loaded test setup 47
Select the tests 32
Setting up the test environment
test environment 14
Setup panel 25
Signal Path Compensation (SPC) 16
Socket configuration for SCPI commands
Socket configuration 49
Software requirements
Softwares 12
software version 13
Start the application 18
Status panel 40
Support 10
Supported instruments 11
Supported oscilloscopes 11
Supported probes 11
System requirements 11
T
Technical support 10
Tek Link 24
test execution status 40
Test groups 14
Test results
send by email 23
test run preferences 39
Test Selection
Test Selection tab 32
Test setup files overview
Test setup files 47
Test setup overview 14
Test Status 40
Tests
running 16
setting up 14
U
Untitled Session folder 16
V
View a report 46
View summary of test results
summary of test results 42
View test execution logs 41
View the test execution status 40
|
W
waveform acquisition settings 33
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