Tektronix TekExpress MHL Help User manual

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MHL Advanced Analysis and Compliance Test Software

Printable Online Help

*P077062008*

077-0620-08

MHL Advanced Analysis and Compliance Test Software

Printable Online Help

www.tek.com

077-0620-08

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

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In North America, call 1-800-833-9200.

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Worldwide, visit www.tek.com to find contacts in your area.

Welcome ............................................................................................................................................. ix

Getting help and support

Technical support ........................................................................................................................... 1

Overview and key specifications

Overview and key specifications .................................................................................................... 3

Supported tests: MHL 3.0 Transmitter ........................................................................................... 4

Supported tests: MHL 3.0 Receiver ............................................................................................... 8

Supported tests: MHL Transmitter ............................................................................................... 11

Supported tests: MHL Receiver ................................................................................................... 15

Supported tests: MHL Cables ....................................................................................................... 17

Supported tests: MHL Receiver Protocol ..................................................................................... 18

Supported data rate: MHL 3.0 Transmitter .................................................................................. 20

Supported data rate: MHL 3.0 Receiver ....................................................................................... 20

Supported resolutions: MHL Transmitter ..................................................................................... 20

Supported resolutions: MHL Receiver ......................................................................................... 22

Supported resolutions: MHL Cables ............................................................................................ 24

Supported resolutions: MHL Receiver Protocol .......................................................................... 24

Operating basics

Equipment connection setup using the TF-MHL-CBS2-SOSI (MHL transmitter and receiver) . 27

Equipment connection setup (MHL 3.0 Transmitter) .................................................................. 29

Equipment connection setup (MHL 3.0 Receiver) ....................................................................... 35

Equipment connection setup (MHL Transmitter) ........................................................................ 41

Equipment connection setup (MHL Receiver protocol and MHL protocol) ................................ 44

Equipment connection setup (MHL Cables) ................................................................................ 54

Application directories and usage ................................................................................................. 57

View test-related files ................................................................................................................... 58

File name extensions .................................................................................................................... 59

Getting started

Installing the software .................................................................................................................. 61

Compatibility ........................................................................................................................... 61

Minimum system requirements ............................................................................................... 61

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Table of Contents

Install the software .................................................................................................................. 64

Activate the license ................................................................................................................. 65

View version and license information ..................................................................................... 66

Starting the software ..................................................................................................................... 67

Start the application ................................................................................................................. 67

Options menu .......................................................................................................................... 69

View connected instruments: the instrument control settings ................................................. 71

Application controls ................................................................................................................ 72

Exit the application .................................................................................................................. 73

Application basics

Application basics ......................................................................................................................... 75

Setting up tests

Setting up tests: the Setup panel ................................................................................................... 77

Select the device parameters on the DUT tab ............................................................................... 79

Choose test from the Test Selection tab ....................................................................................... 95

Configure the cable tests using the Configuration tab ................................................................ 102

Selecting acquisitions ................................................................................................................. 103

Acquire waveforms with the acquisitions tab ....................................................................... 103

Use prerecorded waveforms for analysis .............................................................................. 108

Acquire live waveforms for analysis ..................................................................................... 110

Configure tests ............................................................................................................................ 111

Configure tests using the Configuration tab .......................................................................... 111

Compliance mode or user defined mode ............................................................................... 115

DUT Automation (MHL 3.0 transmitter) .............................................................................. 116

DUT Automation (MHL 3.0 receiver) .................................................................................. 117

Measurement parameter descriptions (MHL 3.0 Transmitter) .............................................. 117

Measurement parameter descriptions (MHL 3.0 Receiver) .................................................. 119

Measurement parameter descriptions (MHL Transmitter) .................................................... 119

Measurement parameter descriptions (MHL Receiver) ........................................................ 122

Measurement parameter descriptions (MHL Cable) ............................................................. 123

Measurement parameter descriptions (MHL Receiver protocol) .......................................... 126

Running tests

Before you click Start ................................................................................................................. 129

Pre-run check list ........................................................................................................................ 131

Configure email notification ....................................................................................................... 132

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Run test and view progress on the Status panel .......................................................................... 133

Viewing results

Viewing test results: the Results panel ....................................................................................... 137

Configuring and viewing reports

Configuring and viewing reports: the Reports panel .................................................................. 139

Saving and recalling test setups

About saving and recalling test setups ....................................................................................... 143

Saving a test setup ...................................................................................................................... 144

Recalling a saved test setup ........................................................................................................ 144

Creating a new test setup based on an existing one .................................................................... 145

Deleting a test setup .................................................................................................................... 145

Table of Contents

TekExpress programmatic interface

About the programmatic interface .............................................................................................. 147

Requirements for developing TekExpress client ........................................................................ 148

Remote proxy object ................................................................................................................... 149

Client proxy object ..................................................................................................................... 150

Client programmatic interface example ..................................................................................... 151

Program examples ...................................................................................................................... 154

MHL application commands ...................................................................................................... 158

Connect through an IP address .............................................................................................. 158

Lock the server ...................................................................................................................... 159

Disable the popups ................................................................................................................ 160

Set or get the DUT ID ........................................................................................................... 162

Set the configuration parameters for a suite or measurement ............................................... 164

Query the configuration parameters for a suite or measurement .......................................... 169

Select a measurement ............................................................................................................ 173

Select a suite .......................................................................................................................... 190

Set pixel mode ....................................................................................................................... 192

Set resolution ......................................................................................................................... 194

Set data rate (CTS 3.2) .......................................................................................................... 196

Set termination source method .............................................................................................. 198

Set termination voltage .......................................................................................................... 199

Set the Auto Calibration patterns .......................................................................................... 201

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Table of Contents

Run with set configurations or stop the run operation .......................................................... 202

Handle error codes ................................................................................................................. 203

Get or set the timeout value ................................................................................................... 204

Wait for the test to complete ................................................................................................. 205

After the test is complete ....................................................................................................... 209

Save recall or check if a session is saved .............................................................................. 215

Unlock the server ................................................................................................................... 217

Disconnect from the server .................................................................................................... 218

Algorithms

About algorithms ........................................................................................................................ 219

3.1.1.1: Standby output voltage test - VOFF .............................................................................. 219

MHL 3.0 transmitter output group: Data tests

3.7.2.1: Single-ended high level output voltage of differential TMDS data+/-:

VSE_HIGH_DF_TMDS_DATA (CTS 3.3) ......................................................................... 223

3.7.2.2: Single-ended low level output voltage of differential TMDS data+/-:

VSE_LOW_DF_TMDS_DATA (CTS 3.3) .......................................................................... 224

3.7.2.5: Differential output swing voltage of differential TMDS data:

VDF_SWING_DF_TMDS_DATA (CTS 3.3) ...................................................................... 225

3.7.2.13: Rise time of differential TMDS data: TR_DF_TMDS_DATA (CTS 3.3) ................. 226

3.7.2.14: Fall time of differential TMDS data: TF_DF_TMDS_DATA (CTS 3.3) ................... 226

3.7.2.17: Peak-to-peak amplitude of differential TMDS data: TPP_TP1_DF_TMDS_DATA (CTS

3.3) ......................................................................................................................................... 227

3.7.2.27: Differential TMDS data eye diagram at TP2 (CTS 3.3) ............................................. 228

MHL 3.0 transmitter output group: Clock tests

3.7.2.7: Single-ended high level output voltage of single-ended MHL clock data:

VSE_HIGH_SE_MHL_CLK (CTS 3.3) ............................................................................... 229

3.7.2.8: Single-ended low level output voltage of single-ended MHL clock data:

VSE_LOW_SE_MHL_CLK(CTS 3.3) ................................................................................. 230

3.7.2.9: Single-ended output swing voltage of single-ended MHL clock data:

VSE_SWING_SE_MHL_CLK (CTS 3.3) ............................................................................ 231

3.7.2.20: Single-ended MHL clock frequency: FSE_MHL_CLK (CTS 3.3) ............................. 231

3.7.2.21: Single-ended MHL clock front porch: TCFP_SE_MHL_CLK (CTS 3.3) ................. 232

3.7.2.22: Single-ended MHL clock back porth: TCBP_SE_MHL_CLK (CTS 3.3) .................. 233

3.7.2.23: Rise time of single-ended MHL clock: TTR_SE_MHL_CLK (CTS 3.3) .................. 234

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3.7.2.26: Single-ended MHL clock jitter at TP2: TCLOCK_JITTER_TP2_SE_MHL_CLK (CTS

3.3) ......................................................................................................................................... 234

MHL 3.0 transmitter output group: eCBUS tests

3.7.2.7: Single-ended high level output voltage of single-ended eCBUS-S forward data:

VSE_HIHG_SE_eCBUS_FWD (CTS 3.3) ........................................................................... 237

3.7.2.8: Single-ended low level output voltage of single-ended eCBUS-S forward data:

VSE_LOW_SE_eCBUS_FWD (CTS 3.3) ............................................................................ 238

3.7.2.9: Single-ended output swing voltage of single-ended eCBUS-S forward data:

VSE_SWING_SE_eCBUS_FWD (CTS 3.3) ........................................................................ 239

3.7.2.24: Fall time of single-ended eCBUS-S forward data: TF_SE_eCBUS_FWD (CTS 3.3) 240

3.7.2.25: Peak-to-peak amplitude of eCBUS-S forward data: VPP_TP1_SE_eCBUS_FWD (CTS

3.3) ......................................................................................................................................... 241

3.7.2.29: eCBUS-S forward data eye diagram at TP2 (CTS 3.3) ............................................... 242

Table of Contents

MHL 3.0 transmitter input group: eCBUS tests

3.7.2.32: Input DC voltage tolerance of eCBUS-S backward data: VIDC_SE_eCBUS_BWD(CTS

3.3) ......................................................................................................................................... 243

3.7.2.36: Jitter tolerance of eCBUS-S backward data (CTS 3.3) ............................................... 244

3.7.2.40 Duty Cycle Tolerance of Single-Ended MHLClock - Source ...................................... 244

Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data) ................................. 245

MHL 3.0 receiver output group: Sink tests

4.7.2.14: Single-ended high level output voltage of eCBUS-S backward data:

VSE_HIGH_SE_eCBUS_BWD (CTS 3.3) .......................................................................... 247

4.7.2.15: Single-ended low level output voltage of eCBUS-S backward data:

VSE_LOW_SE_eCBUS_BWD (CTS 3.3) ........................................................................... 248

4.7.2.16: Single-ended output swing voltage of eCBUS-S backward data:

VSE_SWING_SE_eCBUS_BWD (CTS 3.3) ....................................................................... 249

4.7.2.20: Rise time of eCBUS-S backward data: TR_SE_eCBUS_BWD (CTS 3.3) ................ 250

4.7.2.21: Fall time of eCBUS-S backward data: TF_SE_eCBUS_BWD (CTS 3.3) ................. 250

4.7.2.22: Peak-to-peak amplitude of eCBUS-S backward data: VPP_TP2_SE_eCBUS_BWD

(CTS 3.3) ............................................................................................................................... 251

4.7.2.24: eCBUS-S backward data eye diagram at TP1 (CTS 3.3) ............................................ 252

MHL 3.0 receiver output group: Dongle tests

5.7.2.16: Output DC Voltage of eCBUS-S BWD Data: VODC_SE_eCBUS_BWD (CTS 3.3) 253

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Table of Contents

5.7.2.17: Single-ended output swing voltage of eCBUS-S backward data:

VSE_SWING_SE_eCBUS_BWD (CTS 3.3) ....................................................................... 254

5.7.2.19: eCBUS-S backward data eye diagram at TP3 (CTS 3.3) ............................................ 255

MHL 3.0 receiver input group: Sink tests

4.7.2.1: Input DC voltage tolerance of differential TMDS data: VIDC_DF_TMDS_DATA(CTS

3.3) ......................................................................................................................................... 257

4.7.2.3: Differential input swing voltage tolerance of differential TMDS data:

VIDF_SWING_DF_TMDS_DATA (CTS 3.3) .................................................................... 258

4.7.2.5: Input DC voltage tolerance of single-ended MHL clock and eCBUS-S forward data:

VIDC_SE_MHL_CLK, VIDC_SE_eCBUS_FWD(CTS 3.3) .............................................. 259

4.7.2.7: Differential intra-pair skew tolerance of differential TMDS data:

TSKEW_TP2_DF_TMDS_DATA (CTS 3.3) ...................................................................... 260

4.7.2.10: Jitter tolerance of single-ended MHL clock: TCLOCK_JITTER_TP2_SE_MHL_CLK

(CTS 3.3) ............................................................................................................................... 261

4.7.2.28 Duty Cycle Tolerance of Single-Ended MHLClock - Sink .......................................... 262

MHL 3.0 receiver input group: Dongle tests

5.7.2.1: Single-ended high level input voltage tolerance of differential TMDS data:

VSE_HIGH_DF_TMDS_DATA .......................................................................................... 263

5.7.2.2: Single-ended low level input voltage tolerance of differential TMDS data:

VSE_LOW_DF_TMDS_DATA(CTS 3.3) ........................................................................... 264

5.7.2.5: Differential input swing voltage tolerance of differential TMDS data:

VIDF_SWING_DF_TMDS_DATA (CTS 3.3) .................................................................... 265

5.7.2.7: Single-ended high level input voltage tolerance of single-ended MHL clock and eCBUS-

S forward data: VSE_HIGH_SE_MHL_CLK, VSE_HIGH_SE_eCBUS_FWD (CTS 3.3) 266

5.7.2.8: Single-ended low level input voltage tolerance of single-ended MHL clock and eCBUS-S

forward data: VSE_LOW_SE_MHL_CLK, VSE_LOW_SE_eCBUS_FWD(CTS 3.3) ...... 267

5.7.2.10: Differential intra-pair skew tolerance of differential TMDS data:

TSKEW_TP3_DF_TMDS_DATA (CTS 3.3) ...................................................................... 268

5.7.2.13: Jitter tolerance of single-ended MHL clock (CTS 3.3) ............................................... 269

5.7.2.23 Duty Cycle Tolerance of Single-Ended MHL Clock - Dongle .................................... 270

MHL transmitter group 1: Clock tests

3.1.1.5: Common-mode output swing voltage test - VCMSWING ........................................... 271

3.1.1.7: Common-mode rise and fall times test - TR_CM,TF_CM ........................................... 272

3.1.1.10: MHL clock duty cycle test - 24 bit or packed pixel mode (CTS 1.0); normal mode (CTS

2.0 and CTS 1.3/2.1) ............................................................................................................. 273

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3.1.1.11: MHL clock jitter test (CTS 1.0) - in normal mode (CTS 2.0) ..................................... 274

3.1.1.14: MHL clock duty cycle test - packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ............. 275

3.1.1.15: MHL clock jitter test - packed pixel mode .................................................................. 275

3.1.1.17: TP2 clock jitter test (CTS 1.3/2.1) - normal mode ...................................................... 275

3.1.1.19: TP2 clock jitter test - packed pixel mode .................................................................... 276

MHL transmitter group 2: Data tests

3.1.1.2: Single-ended high level voltage test - VSE_HIGH ....................................................... 277

3.1.1.3: Single-ended low level voltages test - VSE_LOW ....................................................... 278

3.1.1.4: Differential output swing voltage test - VDF_SWING ................................................. 279

3.1.1.6: Differential rise and fall times test - TR_DF,TF_DF .................................................... 280

3.1.1.8: Differential intra-pair skew test - TSKEW_DF ............................................................. 280

3.1.1.12: MHL data eye diagram test (CTS 1.0) - in normal mode (CTS 2.0) ........................... 281

3.1.1.16: MHL data eye diagram test in packed pixel mode ...................................................... 282

3.1.1.18: TP2 data eye diagram test (CTS 1.3/2.1) - normal mode ............................................ 282

3.1.1.20: TP2 data eye diagram test - packed pixel mode .......................................................... 283

Table of Contents

MHL receiver group 1: Sink tests

4.1.1.1: Input signal DC voltage level tolerance test .................................................................. 285

4.1.1.2: Input signal minimum and maximum swing voltages tolerance test ............................ 288

4.1.1.3: Intra-pair skew tolerance test ......................................................................................... 292

4.1.1.4: Jitter tolerance test (CTS 1.X) - in normal mode (CTS 2.0 and CTS 1.3/2.1) .............. 295

4.1.1.8: Jitter tolerance test in packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ......................... 298

MHL receiver group 2: Dongle tests

5.1.1.1: Input signal single-ended voltage level tolerance ......................................................... 299

5.1.1.2: Input signal minimum and maximum swing voltage tolerance test .............................. 302

5.1.1.3: Intra-pair skew tolerance test ......................................................................................... 306

5.1.1.4: Jitter tolerance test (CTS 1.X) - in normal mode (CTS 2.0 and CTS 1.3/2.1) .............. 309

5.1.1.9: Jitter tolerance test in packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ......................... 312

MHL cable group 1: Clock tests

7.2.1.16 Cable test: MHL minimum clock measurement ........................................................... 313

MHL cable group 2: Data tests

7.2.1.17 Cable test: eye diagram test .......................................................................................... 315

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Table of Contents

Reference

MHL data eye diagram test - mask movement ........................................................................... 319

Map the My TekExpress folder .................................................................................................. 322

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Welcome

MHL application

Engineers designing and validating the Mobile High-definition Link (MHL) Interface of their devices face constant pressure to improve efficiency. Engineers need to perform a wide range of compliance tests quickly and reliably right on their bench.

The MHL 1.X, 2.0, 1.3/2.1, 3.2 specification enables mobile devices to transmit uncompressed audio/video to an HDTV or receiver with HD capability. Option MHD advanced analysis and compliance test software meets the MHL 1.X,

2.0 and 1.3/2.1 CTS specification and option MHD3 advanced analysis and compliance test software meets the MHL 3.0 early CTS, 3.2 CTS and 3.3 CTS specification . MHD3 automates a comprehensive range of tests, enabling unprecedented efficiency with reliable results.

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CTS 3.3

MHL Printable Online Help ix

Welcome

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CTS 1.X, 2.0, 1.3 / 2.1

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Getting help and support

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site,

www.tektronix.com.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

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General Information

All instrument model numbers

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Hardware options, if any

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Probes used

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Your name, company, mailing address, phone number, FAX number

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Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application Specific

Information

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Software version number

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Description of the problem such that technical support can duplicate the problem

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If possible, save the setup files for all the instruments used and the application.

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If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file.

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If possible, save the waveform on which you are performing the measurement as a .wfm file.

MHL Printable Online Help 1

Getting help and support

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Overview and key specifications

The TekExpress MHL Advanced Analysis and Compliance Solution gives you the tools to easily run Mobile High-definition Link (MHL) tests under the MHL compliance test specifications 1.X, 2.0, 1.3 / 2.1 and 3.2. It provides a complete and reliable solution for quick testing.

The application functionality is generally divided into six parts:

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MHL 3.0 Transmitter test (CTS 3.3)

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MHL 3.0 Receiver test (CTS 3.3)

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MHL Transmitter test (CTS 1.X, 2.0, 1.3 / 2.1)

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MHL Receiver test (CTS 1.X, 2.0, 1.3 / 2.1)

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MHL Cable test (CTS 1.3 / 2.1)

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MHL Receiver Protocol test (CTS 1.X, 2.0, 1.3 / 2.1)

Select the suite and version of the CTS by clicking on the Setup panel and clicking the DUT tab. See Application basics for more information.

Supported Tests:

TekExpress MHL 3.0 Transmitter supports these automated Data, Clock and

eCBUS tests.

TekExpress MHL 3.0 Receiver supports these automated Sink and Dongle tests.

TekExpress MHL Transmitter supports these automated Clock and Data tests.

TekExpress MHL Receiver supports these automated Sink and Dongle tests.

TekExpress MHL Cables supports these automated Clock and Data tests.

Additional tests may be performed manually by loading the test patterns on the Tektronix Arbitrary Waveform Generator (AWG).

MHL Cable Assembly Electrical Tests

NOTE. Contact your local Tektronix representative for the MOI of cable tests.

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Impedance

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Intra-Pair Skew

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Delay

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Insertion Loss

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Differential and Common Mode Conversion

MHL Printable Online Help 3

Overview and key specifications

Supported Resolutions:

Supported tests: MHL 3.0 Transmitter

TekExpress MHL 3.0 Transmitter supports the following automated Data, Clock and eCBUS tests:

These tests are supported for CTS Version 3.3:

MHL 3.0 Transmitter output tests

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TMDS Data

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3.7.2.1: Single-ended high level output voltage of differential TMDS data +/-: V

SE_HIGH_DF_TMDS_DATA

This test confirms that the single-ended high level voltage of the differential TMDS data output is within the specified limits.

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3.7.2.2: Single-ended low level output voltage of differential TMDS data +/-: V

SE_LOW_DF_TMDS_DATA

This test confirms that the single-ended low level voltage of the differential TMDS data is within the specified limits.

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3.7.2.5: Differential output swing voltage of differential TMDS data: V

DF_SWING_DF_TMDS_DATA

This test confirms that the differential swing voltage of the differential TMDS data is within the specified limits.

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3.7.2.13: Rise time of differential TMDS data: T

R_DF_TMDS_DATA

This test confirms that the rise time of differential TMDS data is within the specified limits.

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Overview and key specifications

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3.7.2.14: Fall time of differential TMDS data: T

F_DF_TMDS_DATA

This test confirms that the fall time of differential TMDS data is within the specified limits.

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3.7.2.17: Peak-to-peak amplitude of differential TMDS data: T

PP_TP1_DF_TMDS_DATA

This test confirms that the peak-to-peak amplitude of differential TMDS data is within the specified limits.

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3.7.2.27: Differential TMDS data eye diagram at TP2

This test confirms that the differential TMDS data eye diagram is within the specified limits.

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MHL Clock

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3.7.2.7: Single-ended high level output voltage of single-ended MHL clock data: V

SE_HIGH_SE_MHL_CLK

This test confirms that the single-ended high level voltages of the singleended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.8: Single-ended low level output voltage of single-ended MHL clock data: V

SE_LOW_SE_MHL_CLK

This test confirms that the single-ended low level voltages of the singleended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.9: Single-ended output swing voltage of single-ended MHL clock data: V

SE_SWING_SE_MHL_CLK

This test confirms that the single-ended output swing voltages of the Single-Ended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.20: Single-ended MHL clock frequency: F

SE_MHL_CLK

This test confirms that the single-ended MHL clock frequency is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.21: Single-ended MHL clock front porch: T

CFP_SE_MHL_CLK

This test confirms that the single-ended MHL clock front porch time is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.22: Single-ended MHL clock back porth: T

CBP_SE_MHL_CLK

This test confirms that the single-ended MHL clock back porch time is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.23: Rise time of single-ended MHL clock: T

TR_SE_MHL_CLK

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Overview and key specifications

This test confirms that the rise time of single-ended MHL clock is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.26: Single-ended MHL clock jitter at TP2: T

CLOCK_JITTER_TP2_SE_MHL_CLK

This test confirms that single-ended MHL clock jitter at TP2 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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MHL eCBUS

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3.7.2.7: Single-ended high level output voltage of single-ended eCBUS-S forward data: V

SE_HIHG_SE_eCBUS_FWD

This test confirms that the single-ended high level voltages of the singleended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.8: Single-ended low level output voltage of single-ended eCBUS-S forward data: V

SE_LOW_SE_eCBUS_FWD

This test confirms that the single-ended low level voltages of the singleended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.9: Single-ended output swing voltage of single-ended eCBUS-S forward data: V

SE_SWING_SE_eCBUS_FWD

This test confirms that the single-ended output swing voltages of the single-ended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.24: Fall time of single-ended MHL clock, eCBUS-S forward data: T

F_SE_eCBUS_CLK

, T

F_SE_eCBUS_FWD

This test confirms that the fall times of single-ended MHL clock and eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.25: Peak--to-peak amplitude of eCBUS-S forward data: V

PP_TP1_SE_eCBUS_FWD

This test confirms that the peak-to-peak amplitude of eCBUS-S forward data is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.29: eCBUS-S forward data eye diagram at TP2

This test confirms that the clock jitter of the TMDS differential clock complies with the limits mentioned in specification.

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Overview and key specifications

MHL 3.0 Transmitter input tests

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MHL eCBUS tests

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3.7.2.32: Input DC voltage Tolerance of eCBUS-S backward data: V

IDC_SE_eCBUS_BWD

This test confirms that the source DUT tolerates the input DC voltage levels of eCBUS-S backward data specified in the specification.

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3.7.2.36: Jitter tolerance of eCBUS-S backward data

This test confirms that the source DUT tolerates the maximum jitter of input eCBUS-S backward data specified in the specification.

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3.7.2.40 Duty Cycle Tolerance of Single-Ended MHLClock - Source

This test confirms that the Source DUT tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification

■

Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data)

This test confirms that the Nominal Jitter & Error patterns used for "3.7.2.36 - Jitter tolerance of eCBUS-S backward data" test meets the required specification.

NOTE.

For Eye diagram test, TekExpress MHL solution uses the Auto mask feature to automatically place the mask to achieve zero or minimal hits. In case of Mask hit, Manual mode options permit user to manually place the mask. Refer to the Mask

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

MHL Printable Online Help 7

Overview and key specifications

Supported tests: MHL 3.0 Receiver

TekExpress MHL 3.0 Receiver supports the following automated Sink and Dongle tests.

These tests are supported for CTS Version 3.3:

MHL 3.0 Receiver output tests

■

MHL Sink

■

4.7.2.14: Single-ended high level output voltage of eCBUS-S backward data: V

This test confirms that the single-ended high level voltage of eCBUS-S backward data output is within the specified limits.. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.15: Single-ended low level output voltage of eCBUS-S forward data: V

This test confirms that the single-ended low level voltage of eCBUS-S backward data output is within the specified limts. This test is applied only to the DUT with eCBUS-S.

SE_HIGH_SE_eCBUS_BWD

SE_LOW_SE_eCBUS_BWD

■

4.7.2.16: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

This test confirms that the single-ended output swing voltage of eCBUSS backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.20: Rise time of eCBUS-S backward data: T

R_SE_eCBUS_BWD

This test confirms that the rise time of eCBUS-S backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.21: Fall time of eCBUS-S backward data: T

F_SE_eCBUS_BWD

This test confirms that the fall time of eCBUS-S BWD data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.22: Peak-to-peak amplitude of eCBUS-S backward data: V

PP_TP2_SE_eCBUS_BWD

This test confirms that the peak-to-peak amplitude of eCBUS-S backward data output is within the specified limits.. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.24: eCBUS-S backward data eye diagram at TP1

8 MHL Printable Online Help

Overview and key specifications

This test confirms that the eCBUS-S backward data eye diagram at TP1 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

MHL Dongle

■

5.7.2.16: Output DC voltage of eCBUS-S backward data: V

ODC_SE_eCBUS_BWD

This test confirms that the DC voltage level of eCBUS-S backward data output signal is within the specified limits. This test is applied only to the DUT with eCBUS-D.

■

5.7.2.17: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

This test confirms that the single-ended output swing voltage of eCBUSS backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.19: eCBUS-S backward data eye diagram at TP3

This test confirms that the eCBUS-S backward data eye diagram at TP3 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

MHL 3.0 Receiver input tests

■

MHL Sink

■

4.7.2.1: Input DC voltage tolerance of differential TMDS data: V

IDC_DF_TMDS_DATA

This test confirms that the Sink device supports the DC voltage level of the differential TMDS data input signal allowed by the specification.

■

4.7.2.3: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

This test confirms that the Sink device supports the differential swing voltage of the differential TMDS data input signal allowed by the specification.

■

4.7.2.5: Input DC voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V

This test confirms that the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.7: Differential intra-pair skew tolerance of differential TMDS data: T

SKEW_TP2_DF_TMDS_DATA

IDC_SELMHL_CLK

, V

IDC_SE_eCBUS_FWD

This test confirms that the Sink device tolerates the differential intra-pair skew of the differential TMDS data input signal allowed by the specification.

■

4.7.2.10: Jitter tolerance of single-ended MHL clock: T

CLOCK_JITTER_TP2_SE_MHL_CLK

MHL Printable Online Help 9

Overview and key specifications

This test confirms that the Sink device tolerates the single-ended MHL clock jitter. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.28 Duty Cycle Tolerance of Single-Ended MHLClock - Sink

This test confirms that the Sink DUT tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification.

■

MHL Dongle

■

5.7.2.1: Single-ended high level input voltage tolerance of differential TMDS data: V

SE_HIGH_DF_TMDS_DATA

This test confirms that the Dongle device supports the single-ended high level voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.2: Single-ended low level input voltage tolerance of differential TMDS data: V

SE_LOW_DF_TMDS_DATA

This test confirms that the Dongle device supports the single-ended low level voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.5: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

This test confirms that the Dongle device supports the differential swing voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.7: Single-ended high level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V V

SE_HIGH_SE_eCBUS_FWD

SE_HIGH_SE_MHL_CLK

This test confirms that the Dongle device supports the single-ended high level voltage of the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.8: Single-ended low level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V V

SE_LOW_SE_eCBUS_FWD

SE_LOW_SE_MHL_CLK

This test confirms that the Dongle device supports the single-ended low level voltage of the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.10: Differential intra-pair skew tolerance of differential TMDS data: T

SKEW_TP3_DF_TMDS_DATA

This test confirms that the Donge device tolerates the differential intrapair skew of the differential TMDS data input signal allowed by the specification.

■

5.7.2.13: Jitter tolerance of single-ended MHL clock

10 MHL Printable Online Help

Overview and key specifications

This test confirms that the Dongle device tolerates the single-ended MHL clock jitter and eCBUS-S forward data eye diagram impairments and differential TMDS data eye diagram impairments allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.23 Duty Cycle Tolerance of Single-Ended MHLClock - Dongle

This test confirms that the Dongle device tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification.

Supported tests: MHL Transmitter

TekExpress MHL Transmitter supports the following automated Clock and Data tests:

These tests are supported for CTS Version 1.0:

Clock tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - 24 Bit or Packed Pixel Mode

This test confirms that the MHL clock duty cycle in 24-bit or packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.11: MHL Clock Jitter Test

This test confirms that the MHL Clock output does not contain excessive jitter larger than the limit allowed by the specification.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

MHL Printable Online Help 11

Overview and key specifications

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.8: Differential Intra-Pair Skew Test - T

SKEW_DF

This test confirms that the timing skew in the differential signal pair is below the specified limits.

■

3.1.1.12: MHL Data Eye Diagram Test

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

These tests are supported for CTS Version 2.0:

Clock tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - Normal Mode

This test confirms that the MHL clock duty cycle does not exceed the limits allowed by the specification in Normal Mode.

■

3.1.1.11: MHL Clock Jitter Test - Normal Mode

This test confirms that the MHL Clock output does not contain excessive jitter greater than the limit allowed by the specification in Normal Mode.

■

3.1.1.14: MHL Clock Duty Cycle Test - Packed Pixel Mode

12 MHL Printable Online Help

Overview and key specifications

This test confirms that the MHL clock duty cycle in packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.15: MHL Clock Jitter Test - Packed Pixel Mode

This test confirms that the MHL Clock output does not contain excessive jitter larger than the limit allowed by the specification in Packed Pixel Mode.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.8: Differential Intra-Pair Skew Test - T

SKEW_DF

This test confirms that the timing skew in the differential signal pair is below the specified limits.

■

3.1.1.12: MHL Data Eye Diagram Test - Normal Mode

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification in Normal Mode.

■

3.1.1.16: MHL Data Eye Diagram Test - Packed Pixel Mode

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification in Packed Pixel Mode.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

These tests are supported for CTS Version 1.3/2.1:Clock Tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

MHL Printable Online Help 13

Overview and key specifications

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - Normal Mode

This test confirms that the MHL clock duty cycle does not exceed the limits allowed by the specification in Normal Mode.

■

3.1.1.14: MHL Clock Duty Cycle Test - Packed Pixel Mode

This test confirms that the MHL clock duty cycle in packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.17: TP2 Clock Jitter Test - Normal Mode

This test confirms that the TP2 Clock output does not contain excessive jitter larger than the limit allowed by the specification in Normal Mode.

■

3.1.1.19: TP2 Clock Jitter Test - Packed Pixel Mode

This test confirms that the TP2 Clock output does not contain excessive jitter larger than the limit allowed by the specification in Packed Pixel Mode.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.18: TP2 Data Eye Diagram Test - Normal Mode

This test confirms that the TP2 Data output has signal quality that meets the eye opening required by the specification in Normal Mode.

■

3.1.1.20: TP2 Data Eye Diagram Test - Packed Pixel Mode

14 MHL Printable Online Help

Overview and key specifications

This test confirms that the TP2 Data output has signal quality that meets the eye opening required by the specification in Packed Pixel Mode.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

Supported tests: MHL Receiver

TekExpress MHL Receiver supports the following automated Sink and Dongle tests.

These tests are supported for CTS version 1.0:

MHL Sink tests

■

4.1.1.1: Input Signal DC Voltage Level Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level allowed by the specification.

■

4.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level and swing voltage allowed by the specification.

■

4.1.1.3: Intra Pair Skew Tolerance Test

This test confirms that the Sink device can tolerate the maximum intra-pair skew allowed by the specification.

■

4.1.1.4: Jitter Tolerance Test

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification.

MHL Dongle tests

■

5.1.1.1: Input Signal Single-Ended Voltage Level Tolerance Test

This test confirms that the Dongle device supports input signal single-ended voltage level allowed by the specification.

■

5.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Dongle device supports input signal minimum and maximum swing voltages allowed by the specification.

■

5.1.1.3: Intra-Pair Skew Tolerance Test

MHL Printable Online Help 15

Overview and key specifications

This test confirms that the Dongle device can tolerate the maximum intra-pair skew allowed by the specification.

■

5.1.1.4: Jitter Tolerance Test

This test confirms that the Dongle device can tolerate the maximum clock and data jitter amounts allowed by the specification.

These tests are supported for CTS version 2.0 and version 1.3/2.1:

MHL Sink tests

■

4.1.1.1: Input Signal DC Voltage Level Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level allowed by the specification.

■

4.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level and swing voltage allowed by the specification.

■

4.1.1.3: Intra Pair Skew Tolerance Test

This test confirms that the Sink device can tolerate the maximum intra-pair skew allowed by the specification.

■

4.1.1.4: Jitter Tolerance Test in Normal Mode

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification in Normal Mode with cable emulator.

■

4.1.1.8: Jitter Tolerance Test – Packed Pixel Mode

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification in Packed Pixel Mode.

MHL Dongle tests

■

5.1.1.1: Input Signal Single-Ended Voltage Level Tolerance Test

This test confirms that the Dongle device supports input signal single-ended voltage level allowed by the specification.

■

5.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Dongle device supports input signal minimum and maximum swing voltages allowed by the specification.

■

5.1.1.3: Intra-Pair Skew Tolerance Test

This test confirms that the Dongle device can tolerate the maximum intra-pair skew allowed by the specification.

■

5.1.1.4: Jitter Tolerance Test – Normal Mode

16 MHL Printable Online Help

Overview and key specifications

This test confirms that the Dongle device can tolerate the maximum clock and data jitter amounts allowed by the specification in Normal Mode.

■

5.1.1.9: Jitter Tolerance Test – Packed Pixel Mode

This test confirms that the Dongle device can tolerate the maximum clock and data jitter amounts allowed by the specification in Packed Pixel Mode.

NOTE. All sink tests are applicable for CTS 1.3 / 2.1 direct attach device.

Supported tests: MHL Cables

TekExpress MHL Cables supports the following automated Clock and Data tests.

These tests are supported for CTS Version 1.3/2.1:

MHL Clock tests

■

7.2.1.16: Minimum clock swing test

This test confirms that minimum clock voltage swing amplitude is within the specified limits allowed by the specification.

MHL Data tests

■

7.2.1.17: MHL eye diagram test

This test confirms that the MHL data cable output has signal quality that meets the eye opening required by the specification.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

MHL Printable Online Help 17

Overview and key specifications

Supported tests: MHL Receiver Protocol

TekExpress MHL Receiver Protocol supports the following automated Sink and Dongle tests for CTS 1.X, 2.0, 1.3/2.1 versions.

MHL Sink Protocol tests based on the AWG direct synthesis patterns

These tests confirm that the sink DUT synchronizes if the data stream provides only minimum length Control Periods.

■

4.2.1.1: Character Synchronization in Normal mode

■

4.2.1.3: Character Synchronization in Packed Pixel mode

CTS 2.0, CTS 1.3/2.1 only.

These tests confirm that the sink DUT accepts all valid packet types.

■

4.2.1.2: Packet Types in Normal Mode

■

4.2.1.4: Packet Types in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

These tests verify that the sink DUT supports the video formats with no distortion.

■

4.2.2.1: Video Formats in Normal Mode

■

4.2.2.4: Video Formats in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

This test verifies that the sink supports RGB, YCbCr, 4:2:2 pixel encoding in Normal mode.

■

4.2.2.2: Pixel Encoding in Normal Mode

This test verifies that the sink has the correct QY and QS bits in the Video Capability Data Block, and the Sink displays with no distortion.

■

4.2.2.3: Video Quantization Range

This test verifies that the sink supports the required Audio formats and reproduces audio properly.

■

4.2.3.1: IEC 60958 / IEC61937

This test verifies that the sink properly regenerates audio when different Audio Clock Regeneration parameters are used.

■

4.2.3.2: Audio Clock Regeneration

These tests confirm that the sink DUT supports the required and optional 3D video modes.

■

4.2.8.2: 3D Video Format in Normal Mode

CTS 2.0, CTS 1.3/2.1 only.

■

4.2.8.3: 3D Video Format in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

18 MHL Printable Online Help

Overview and key specifications

MHL Dongle Protocol tests based on AWG direct synthesis patterns

This test confirms that the dongle DUT synchronizes if the data stream provides only minimum length Control Periods.

■

5.2.1.1: Character Synchronization in Normal mode

■

5.2.1.3: Character Synchronization in Packed Pixel mode

CTS 2.0, CTS 1.3/2.1 only.

These tests confirm that the dongle DUT accepts all valid packet types.

■

5.2.1.2: Packet Types in Normal Mode

■

5.2.1.4: Packet Types in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

These tests verify that the dongle DUT supports the video formats with no distortion.

■

5.2.2.1: Video Formats in Normal Mode

■

5.2.2.4: Video Formats in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

This test confirms that the dongle supports RGB, YCbCr, 4:2:2 pixel encoding in Normal mode.

■

5.2.2.2: Pixel Encoding in Normal Mode

This test verifies that the dongle has correct QY and QS bits in the Video Capability Data Block, and the dongle displays with no distortion.

■

5.2.2.3: Video Quantization Range

This test verifies that the dongle converts audio properly.

■

5.2.3.1: IEC 60958 / IEC61937

This test verifies that the dongle properly regenerates audio when different Audio Clock Regeneration parameters are used.

■

5.2.3.2: Audio Clock Regeneration

These tests confirm that the dongle DUT supports the required and optional 3D video modes.

■

5.2.8.2: 3D Video Format in Normal Mode

CTS 2.0, CTS 1.3/2.1 only.

■

5.2.8.3: 3D Video Format in Packed Pixel Mode

CTS 2.0, CTS 1.3/2.1 only.

MHL Printable Online Help 19

Overview and key specifications

Supported data rate: MHL 3.0 Transmitter

CTS 3.2: All of the TekExpress MHL tests can be performed for DUTs operating in data between 6Gbps and 1.5Gbps. For instance, a DUT could have any of the following:

Low: 1.5Gbps High: 6 Gbps

Low: 1.5Gbps High: 3 Gbps

Low: 3Gbps High: 6 Gbps

NOTE. When date rate selected is one only, then Low and High data rate are the same and software performs the test at selected data rate.

Supported data rate: MHL 3.0 Receiver

CTS 3.3: All of the TekExpress MHL tests can be performed for DUTs operating at these data rates (Gbps):

■

6Gbps

■

3Gbps

■

1.5Gbps

Supported resolutions: MHL Transmitter

CTS 1.0: All of the TekExpress MHL tests can be performed for DUTs operating in resolutions between 25 MHz and 74.25 MHz. Other resolutions that fall within this range can be entered in the Low Resolution and High Resolution fields on the DUT tab of the Setup panel. For instance, a DUT could have any of the following:

Low : 25 High : 25

Low : 25 High : 27

Low : 25 High : 74.25

When Low and High resolutions are the same, the software performs the test at that one resolution.

CTS 2.0, CTS 1.3/2.1: All of the TekExpress MHL tests can be performed for DUTs operating at these data rates (Gbps):

24 Bit mode:

Low : 0.75 High : 2.22

Low : 0.81 High : 2.22

Packed Pixel mode:

20 MHL Printable Online Help

Overview and key specifications

Low : 2.97 High : 2.97

Other data rates that fall within this range can be entered in the Low Data Rate and High Data Rate fields on the DUT tab of the Setup panel.

Table 1: Supported resolutions (Transmitter)

Test group Test name Supported resolutions

MHL Clock 3.1.1.1: Standby Output Voltage – V

3.1.1.5: Common-mode Output Swing Voltage V

CMSWING

3.1.1.7: Common-mode Rise and Fall TimesT

, T

R_CM

F_CM

CTS 1.X

3.1.1.10: MHL Clock Duty Cycle – 24 Bit or Packed Pixel Mode

CTS 2.0

3.1.1.10: MHL Clock Duty Cycle – Normal Mode

CTS 1.X

3.1.1.11: MHL Clock Jitter

CTS 2.0

3.1.1.11: MHL Clock Jitter – Normal Mode

CTS 2.0

3.1.1.14: MHL Clock Duty Cycle – Packed Pixel Mode

CTS 2.0

3.1.1.15: MHL Clock Jitter – Packed Pixel Mode

CTS 1.3 / 2.1

3.1.1.17: TP2 Clock Jitter Test - Normal Mode

CTS 1.3 / 2.1

3.1.1.19: TP2 Clock Jitter Test - Packed Pixel Mode

OFF

—

Low resolution

High resolution

Low and High resolutions

High resolution (PP)

Low and High resolutions

High resolution (PP)

MHL Printable Online Help 21

Overview and key specifications

Test group Test name Supported resolutions

MHL Data 3.1.1.2: Single-ended High Level Voltage –

SE_HIGH

3.1.1.3: Single-ended Low Level Voltages – V

SE_LOW

3.1.1.4: Differential Output Swing Voltage – V

DF_SWING

3.1.1.6: Differential Rise and Fall Times – T T

F_DF

3.1.1.8: Differential Intra-Pair Skew – T

CTS 1.X, CTS 2.0

3.1.1.12: MHL Data Eye Diagram

CTS 2.0

3.1.1.12: MHL Data Eye Diagram – Normal Mode

CTS 2.0

3.1.1.16: MHL Data Eye Diagram – Packed Pixel Mode

CTS 1.3 / 2.1

3.1.1.18: TP2 Data Eye Diagram Test - Normal Mode

CTS 1.3 / 2.1

3.1.1.20: TP2 Data Eye Diagram Test - Packed Pixel Mode

SKEW_DF

Low resolution

High resolution

R_DF

Low resolution

Low and High resolutions

High resolution (PP)

Low and High resolutions

High resolution (PP)

Supported resolutions: MHL Receiver

CTS 1.X: All of the TekExpress MHL Receiver tests can be performed for DUTs operating in resolutions of 25, 27 and 74.25 MHz according to the standard. Other resolutions that fall within this range can be entered in the Low Resolution and High Resolution fields on the DUT tab of the Setup panel. Either of the Resolutions can be High according to the Manufacturer. For instance, a DUT could have any of the following:

Low : 25 High : 25

Low : 25 High : 27

Low : 25 High : 74.25

CTS 2.0 and CTS 1.3 / 2.1: All of the TekExpress MHL tests can be performed for DUTs operating at these data rates (Gpbs):

24 Bit mode:

Low : 0.75 High : 2.22

Low : 0.81 High : 2.22

Packed Pixel mode:

22 MHL Printable Online Help

Overview and key specifications

Low : 2.97 High : 2.97

Other data rates that fall within this range can be entered in the Low Data Rate and High Data Rate fields on the DUT tab of the Setup panel.

Table 2: Supported resolutions (MHL Receiver)

Test group Test name Supported resolutions

MHL Sink 4.1.1.1: Input Signal DC Voltage Level

Tolerance

4.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance

4.1.1.3: Intra-Pair Skew Tolerance Highest

CTS 1.X

4.1.1.4: Jitter Tolerance CTS 2.0 and CTS 1.3 / 2.1

4.1.1.4: Jitter Tolerance in Normal Mode

CTS 2.0 and CTS 1.3 / 2.1

4.1.1.8: Jitter Tolerance in Packed Pixell Mode

MHL Dongle CTS 2.0 and CTS 1.3 / 2.1

5.1.1.1: Input Signal Single-Ended Voltage Level Tolerance

5.1.1.2: Input Signal Minimum and Maximum Swing Voltage Tolerance

5.1.1.3: Intra-Pair Skew Tolerance Highest

CTS 1.X

5.1.1.4: Jitter Tolerance CTS 2.0 and CTS 1.3 / 2.1

5.1.1.4: Jitter Tolerance in Normal Mode

CTS 2.0 and CTS 1.3 / 2.1

5.1.1.9: Jitter Tolerance in Packed Pixel Mode

Highest

Lowest and Highest

Highest

Lowest and Highest

Highest

MHL Printable Online Help 23

Overview and key specifications

Supported resolutions: MHL Cables

CTS 1.3/2.1: All of the TekExpress MHL tests can be performed for DUTs operating at these data rates (Gbps):

Packed Pixel mode:

Low : 2.97 High : 2.97

Table 3: Supported resolutions (Cables)

Test group Test name Supported resolutions

MHL Clock 7.2.1.16: MHL Minimum Clock Swing Test High (PP) resolution

MHL Data 7.2.1.17: MHL Cable Data Eye Diagram High (PP )resolution

Supported resolutions: MHL Receiver Protocol

The following MHL Receiver Protocol resolutions are supported for all CTS versions, unless noted otherwise.

24 MHL Printable Online Help

Overview and key specifications

Table 4: Supported resolutions (MHL Receiver Protocol)

Test group Test name Supported resolutions

MHL Sink 4.2.1.1: Character Synchronization 720x576p

720x480p

4.2.1.2: Packet Types in Normal mode

CTS 2.0 and CTS 1.3 / 2.1

4.2.1.3: Character Synchronization in Packed Pixel Mode

CTS 2.0 and CTS 1.3 / 2.1

4.2.1.4: Packet Types in Packed Pixel mode

4.2.2.1: Video Formats in Normal mode

4.2.2.2: Pixel Encoding in Normal mode

4.2.2.3: Video Quantization Range 720x576p

CTS 2.0 and CTS 1.3 / 2.1

4.2.2.4: Video Formats in Packed Pixel mode

CTS 2.0 and CTS 1.3 / 2.1

4.2.8.2: 3D Video Formats in Normal mode

CTS 2.0 and CTS 1.3 / 2.1

4.2.8.3: 3D Video Formats in Packed Pixel mode

4.2.3.1: Audio Test IEC 60958 / IEC61937

4.2.3.2: Audio Clock Regeneration 720x576p

720x576p 720x480p 640x480p

1920x1080p

2880x576i 1920x1080p, 1920x1080i 1440x576p, 1440x576i 1440x480i 1280x720p 720x480p 640x480p

720x576p 720x480p

720x480p

1920x1080p

1920x1080p, 1920x1080i 1280x720p

1920x1080p 1280x720p

720x576p 720x480p

720x480p

MHL Printable Online Help 25

Overview and key specifications

Test group Test name Supported resolutions

MHL Dongle 5.2.1.1: Character Synchronization 720x576p

720x480p

CTS 2.0 and CTS 1.3 / 2.1

5.2.1.2: Packet Types in Normal mode

CTS 2.0 and CTS 1.3 / 2.1

5.2.1.3: Character Synchronization in Packed Pixel mode

CTS 2.0 and CTS 1.3 / 2.1

5.2.1.4: Packet Types in Packed Pixel mode

5.2.2.1: Video Formats in Normal mode

5.2.2.2: Pixel Encoding in Normal mode

5.2.2.3: Video Quantization Range 720x576p

CTS 2.0 and CTS 1.3 / 2.1

5.2.2.4: Video Formats in Packed Pixel mode

CTS 2.0 and CTS 1.3 / 2.1

5.2.8.2: 3D Video Formats in Normal mode

CTS 2.0 and CTS 1.3 / 2.1

5.2.8.3: 3D Video Formats in Packed Pixel mode

5.2.3.1: Audio Test IEC 60958 / IEC61937

5.2.3.2: Audio Clock Regeneration 720x576p

720x576p 720x480p 640x480p

1920x1080p

2880x576i 1920x1080p, 1920x1080i 1440x576p, 1440x576i 1440x480i 1280x720p 720x480p 640x480p

720x576p 720x480p

720x480p

1920x1080p

1920x1080p, 1920x1080i 1280x720p

1920x1080p 1280x720p

720x576p 720x480p

720x480p

26 MHL Printable Online Help

Operating basics

Equipment connection setup using the TF-MHL-CBS2-SOSI (MHL transmitter and receiver)

The Source Sink board (TF-MHL-CBS2-SOSI) is a low cost alternative to the CBus Analyzer. It provides an alternative solution for setup and can be used for the following:

■

Source tests, electrical – 3.1.1.1 to 3.1.1.20 (excluding 3.1.1.13)

■

Source System tests – 3.2.2.1 to 3.2.2.3 ; 3.2.3.1 to 3.2.3.4 ;

3.2..1.12 (excluding 3.1.1.13)

■

Sink tests, electrical – 4.1.1.1 to 4.1.1.8 (excluding 4.1.1.7)

■

Sink system test – 4.2.1.1 to 4.2.1.2 ; 4.2.2.1 to 4.2.2.3; 4.2.3.1 to 4.2.3.2

■

Dongle tests, electrical - 5.1.1.1 to 5.1.1.9 (excluding 5.1.1.7, 5.1.1.8)

■

Dongle System tests - 5.2.1.1 to 5.2.1.2 ; 5.2.2.1 to 5.2.2.3; 5.2.3.1 to 5.2.3.2

NOTE. The low cost TF-MHL-CBS2-SOSI cannot be used for C-Bus tests 3.3.x.x and 4.3.x.x.

Figure 1: Low cost Source Sink board (TF-MHL-CBS2-SOSI)

MHL Printable Online Help 27

Operating basics

TF-MHL-CBS2-SOSI setup

for source testing

Figure 2: TF-MHL-CBS2-SOSI acting as a sink for source testing

TF-MHL-CBS2-SOSI setup

for sink testing

Figure 3: TF-MHL-CBS2-SOSI acting as a source for sink testing

28 MHL Printable Online Help

Operating basics

Equipment connection setup (MHL 3.0 Transmitter)

You need the following equipment to run MHL Transmitter tests. (For details, see Minimum system requirements):

■

A supported Tektronix oscilloscope

■

Two or three differential probes – P7313SMA, for single ended and differential tests

■

Device-under-test (DUT)

■

Wilder/Tektronix fixtures

■

TCA-SMA adapter (Not required if third probe used is P7313SMA)

■

P7240 probe

■

C-Bus Sink boards

■

MHL Signal generator: AWG7122C for eCBUS source

Connection diagrams and the tests they apply to are listed below.

Table 5: MHL 3.0 Transmitter Output tests

Connection diagram 1

TMDS Data

3.7.2.1: Single-ended high level output voltage of differential TMDS data+/-: V

SE_HIGH_DF_TMDS_DATA

3.7.2.2 Single-ended low level output voltage of differential TMDS data+/-: V

3.7.2.5 Differential output swing voltage of differential TMDS data: V

3.7.2.13 Rise time of differential TMDS data: T

3.7.2.14 Fall time of differential TMDS data: T

3.7.2.17 Peak-to-peak amplitude of differential TMDS data: V

R_DF_TMDS_DATA

F_DF_TMDS_DATA

PP_TP1_DF_TMDS_DATA

3.7.2.27 TMDS data eye diagram

MHL Clock

3.7.2.7 Single-ended high level output voltage of single-ended MHL clock data: V

SE_HIGH_SE_MHL_CLK

3.7.2.8 Single-ended low level output voltage of single-ended MHL clock data: V

SE_LOW_SE_MHL_CLK

3.7.2.9 Single-ended output swing voltage of single-ended MHL clock data: V

3.7.2.20 Single-ended MHL clock frequency: F

3.7.2.21 Single-ended MHL clock front porch: T

3.7.2.22 Single-ended MHL clock back porch: T

3.7.2.23 Rise time of single-ended MHL clock: T

3.7.2.26 Single-ended MHL clock jitter at TP2: T

SE_MHL_CLK

CFP_SE_MHL_CLK

CBP_SE_MHL_CLK

R_SE_MHL_CLK

CLOCK_JITTER_TP2_SE_MHL_CLK

MHL eCBUS

3.7.2.7 Single-ended high level output voltage of single-ended MHL clock and eCBUS-S forward data: V

SE_HIGH_SE_eCBUS_FWD

SE_LOW_DF_TMDS_DATA

DF_SWING_DF_TMDS_DATA

SE_SWING_SE_MHL_CLK

MHL Printable Online Help 29

Operating basics

Connection diagram 1

3.7.2.8 Single-ended low level output voltage of eingle-ended MHL clock and eCBUS-S forward data: V

SE_LOW_SE_eCBUS_FWD

3.7.2.9 Single-ended output swing voltage of single-ended MHL clock and eCBUS-S forward data: V

SE_SWING_SE_eCBUS_FWD

3.7.2.24 Fall time of single-ended MHL clock and eCBUS-S forward data: V T

F_SE_eCBUS_FWD

3.7.2.25 Peak-to-peak smplitude of eCBUS-S forward data: V

PP_TP1_SE_eCBUS_FWD

3.7.2.29 eCBUS-S forward data eye diagram at TP2

F_SE_MHL_CLK

Table 6: MHL 3.0 Transmitter Input tests

Connection diagram 2

MHL eCBUS

3.7.2.32: Input DC voltage tolerance of eCBUS-S backward data: V

IDC_SE_eCBUS_BWD

3.7.2.36: Jitter tolerance of eCBUS-S backward data

3.7.2.40 Duty Cycle Tolerance of Single-Ended MHLClock - Source

30 MHL Printable Online Help

Operating basics

Connection diagram 2

MHL Printable Online Help 31

Operating basics

Connection diagram 2

Figure 4: Transmitter Input for 70K

32 MHL Printable Online Help

Operating basics

Connection diagram 3

Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data)

MHL Printable Online Help 33

Operating basics

Connection diagram 3

Figure 5: Transmitter Input - Calibration for 70K

34 MHL Printable Online Help

Operating basics

See Also

Equipment connection setup MHL 3.0 Receiver

Equipment connection Setup MHL Receiver

Equipment connection setup MHL Cables

About algorithms

View connected instruments

Equipment connection setup (MHL 3.0 Receiver)

You need the following equipment (for details, see Minimum system

requirements):

■

A supported Tektronix oscilloscope

■

Two or three differential probes – P7313SMA, for single ended and differential tests

■

Device-under-test (DUT)

■

Wilder fixtures

■

TCA-SMA adapter (Not required if third probe used is P7313SMA)

■

C-Bus Sink boards

■

MHL Signal generator: AWG7122C for eCBUS source with AWG70002A or AWG7122C for AV_Link

Connection diagrams and the tests they apply to are listed below.

Table 7: MHL 3.0 Receiver Output tests

Connection diagram 4

MHL Sink

4.7.2.14: Single-ended high level output voltage of eCBUS-S backward data: V

SE_HIGH_SE_eCBUS_BWD

4.7.2.15: Single-ended low level output voltage of eCBUS-S forward data: V

4.7.2.16: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

4.7.2.20: Rise time of eCBUS-S backward data: T

4.7.2.21: Fall time of eCBUS-S backward data: T

4.7.2.22: Peak-to-peak amplitude of eCBUS-S backward data: V

4.7.2.24: eCBUS-S backward data eye diagram at TP1

MHL Dongle

5.7.2.16: Output DC voltage of eCBUS-S backward data: V

5.7.2.17: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

5.7.2.19: eCBUS-S backward data eye diagram at TP3

R_SE_eCBUS_BWD

F_SE_eCBUS_BWD

PP_TP2_SE_eCBUS_BWD

ODC_SE_eCBUS_BWD

SE_LOW_SE_eCBUS_BWD

MHL Printable Online Help 35

Operating basics

Connection diagram 4

36 MHL Printable Online Help

Operating basics

Connection diagram 4

Figure 6: Receiver Output for 70k

Table 8: MHL 3.0 Receiver Input tests

Connection diagram 5

MHL Sink

4.7.2.1: Input DC voltage tolerance of differential TMDS data: V

IDC_DF_TMDS_DATA

4.7.2.3: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

MHL Printable Online Help 37

Operating basics

Connection diagram 5

4.7.2.5: Input DC voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V

IDC_SE_MHL_CLK

4.7.2.10: Jitter tolerance of single-ended MHL clock: T

4.7.2.28 Duty Cycle Tolerance of Single-Ended MHLClock - Sink

MHL Dongle

5.7.2.1: Single-ended high level input voltage tolerance of differential TMDS data: VSE_HIGH_DF_TMDS_DATA

5.7.2.2: Single-ended low level input voltage tolerance of differential TMDS data: VSE_LOW_DF_TMDS_DATA

5.7.2.5: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

5.7.2.7: Single-ended high level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V

5.7.2.8: Single-ended low level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V

5.7.2.23 Duty Cycle Tolerance of Single-Ended MHLClock - Dongle

MHL Sink

4.7.2.7: Differential intra-pair skew tolerance of differential TMDS data: T

MHL Dongle

5.7.2.10: Differential intra-pair skew tolerance of differential TMDS data: T

5.7.2.13: Jitter tolerance of single-ended MHL clock, eCBUS-S forward data and differential TMDS data

, V

IDC_SE_eCBUS_FWD

SE_HIGH_SE_MHL_CLK

SE_LOW_SE_MHL_CLK

, V

SE_HIGH_SE_eCBUS_FWD

, V

SE_LOW_SE_eCBUS_FWD

CLOCK_JITTER_TP2_SE_MHL_CLK

SKEW_TP2_DF_TMDS_DATA

SKEW_TP3_DF_TMDS_DATA

38 MHL Printable Online Help

Connection diagram 5

Operating basics

MHL Printable Online Help 39

Operating basics

Connection diagram 5

Figure 7: Receiver Input for 70K

40 MHL Printable Online Help

Operating basics

See Also

Equipment connection setup MHL 3.0 Transmitter

Equipment connection setup MHL Transmitter

Equipment connection setup MHL Cables

About algorithms

View connected instruments

Equipment connection setup (MHL Transmitter)

You need the following equipment to run MHL Transmitter tests. (For details, see Minimum system requirements):

■

A supported Tektronix oscilloscope

■

Two differential probes – P7313SMA, for single ended and differential tests

■

One single ended probe – Probe P7240 for common mode tests

■

Device under test (DUT)

■

Wilder/Tektronix fixtures

■

C-Bus Sink boards

Clock and Data Tests

Connection diagrams and the tests they apply to are listed below.

Connection diagram 1 (Transmitter)

3.1.1.4: Differential output swing voltage Test - V

3.1.1.5: Common-mode output swing voltage Test - V

3.1.1.6: Differential rise and fall times test -T

3.1.1.7: Common-mode rise and fall times test -T

3.1.1.10: MHL Clock duty cycle test – normal mode

3.1.1.11: MHL Clock jitter test – normal mode

3.1.1.12: MHL Data eye diagram test – normal mode

3.1.1.14: MHL Clock duty cycle test – packed pixel mode

3.1.1.15: MHL Clock jitter test – packed pixel mode

R_DF

DF_SWING

CMSWING

, T

F_DF

, T

R_CM

F_CM

MHL Printable Online Help 41

Operating basics

Connection diagram 1 (Transmitter)

3.1.1.16: MHL Data eye diagram test in packed pixel mode

Connection diagram 2 (Transmitter)

3.1.1.2 Single-ended high level voltage — VSE_HIGH

3.1.1.3 Single-ended low level voltages — VSE_LOW

3.1.1.8: Differential intra-pair skew test - T

SKEW_DF

3.1.1.17 TP2 Clock jitter — normal Mode

3.1.1.18 TP2 Eye diagram — normal Mode

3.1.1.19 TP2 Clock jitter — packed pixel Mode

3.1.1.20 TP2 Eye diagram — packed pixel Mode

42 MHL Printable Online Help

Operating basics

Connection diagram 3 (Transmitter)

3.1.1.1 Standby output voltage — V

OFF

See Also

Equipment connection setup MHL Receiver

Equipment connection setup MHL Cables

About algorithms

View connected instruments

MHL Printable Online Help 43

Operating basics

Equipment connection setup (MHL Receiver protocol and MHL protocol)

You need the following equipment (for details, see Minimum system

requirements):

■

A supported Tektronix oscilloscope

■

One differential probe – P7313SMA

■

Device under test (DUT)

■

Wilder fixtures

■

C-Bus Sink boards

■

MHL Signal generator: AWG7122B/C with option 01 and 02 or 06 and 08

Connection diagrams and the tests they apply to are listed below.

Sink tests

4.1.1.1: Input signal DC voltage level tolerance

4.1.1.3: Intra-pair skew tolerance

CTS 1.X

4.1.1.4: Jitter tolerance CTS 2.0, CTS 1.3 / 2.1

4.1.1.4: Jitter tolerance in normal mode

CTS 2.0, CTS 1.3 / 2.1

4.1.1.8: Jitter tolerance in packed pixel mode

4.2.1.1: Character synchronization

CTS 2.0, CTS 1.3 / 2.1

4.2.1.3: Character synchronization in packed pixel mode

4.2.1.2: Packet types in normal node

CTS 2.0, CTS 1.3 / 2.1

4.2.1.4: Packet types in packed pixel node

4.2.2.1: Video formats in normal mode

CTS 2.0, CTS 1.3 / 2.1

4.2.2.4: Video formats in packed pixel mode

4.2.2.2: Pixel encoding in normal mode

4.2.2.3: Video quantization range

CTS 2.0, CTS 1.3 / 2.1

4.2.8.2: 3D Video format in normal mode

CTS 2.0, CTS 1.3 / 2.1

4.2.8.3: 3D Video format in packed pixel mode

4.2.3.1: IEC 60958 / IEC61937

4.2.3.2: Audio clock regeneration

44 MHL Printable Online Help

Operating basics

Sink tests

Sink-MHL Input Signal DC Voltage Level Test

MHL Printable Online Help 45

Operating basics

Sink tests

Single-Ended Signals Calibration Setup for Sink Test

Differential and Common-Mode Signals Calibration Setup for Sink Test

46 MHL Printable Online Help

Operating basics

Sink tests

4.1.1.2: Input signal minimum and maximum swing voltages tolerance:

Sink — MHL Input Signal DC Voltage Level Min-Max Test

Amplifier Connections to Power Supply

MHL Printable Online Help 47

Operating basics

Sink tests

Single Ended Signals Calibration Setup for Sink Min-Max Test

Differential and Common-Mode Signals Calibration Setup for Sink Min-Max Test

48 MHL Printable Online Help

Operating basics

Dongle tests

5.1.1.1: Input signal single-ended voltage level tolerance

5.1.1.3: Intra-pair skew tolerance test

CTS 1.X

5.1.1.4: Jitter tolerance CTS 2.0

5.1.1.4: Jitter tolerance in normal mode

CTS 2.0

5.1.1.9: Jitter tolerance in packed pixel mode

5.2.1.1: Character synchronization

CTS 2.0, CTS 1.3 / 2.1

5.2.1.3: Character synchronization in packed pixel mode

5.2.1.2: Packet types in normal mode

CTS 2.0, CTS 1.3 / 2.1

5.2.1.4: Packet types in packed pixel mode

5.2.2.1: Video formats in normal mode

CTS 2.0, CTS 1.3 / 2.1

5.2.2.4: Video formats in packed pixel mode

5.2.2.2: Pixel encoding in normal mode

5.2.2.3: Video quantization range

CTS 2.0, CTS 1.3 / 2.1

5.2.8.2: 3D Video format in normal mode

CTS 2.0, CTS 1.3 / 2.1

5.2.8.3: 3D Video format in packed pixel mode

5.2.3.1: IEC 60958 / IEC61937

5.2.3.2: Audio clock regeneration

MHL Printable Online Help 49

Operating basics

Dongle tests

Dongle — Input Signal Single-Ended Voltage level Tolerance Test

50 MHL Printable Online Help

Operating basics

Dongle tests

Single-Ended Signals Calibration Setup for Dongle Test

Differential and Common-Mode Signals Calibration Setup for Dongle Test

MHL Printable Online Help 51

Operating basics

Dongle tests

5.1.1.2: Input signal minimum and maximum swing voltage tolerance

Dongle Min-Max Setup

Amplifier Connections to DC Power Supply

52 MHL Printable Online Help

Operating basics

Dongle tests

Single-Ended Signals Calibration Setup for Dongle Min Max Test

Differential and Common-Mode Signals Calibration Setup for Dongle Min Max Test

MHL Printable Online Help 53

Operating basics

See Also

Equipment connection setup MHL Transmitter

Equipment connection setup MHL Cables

About algorithms

View connected instruments

Equipment connection setup (MHL Cables)

You need the following equipment to run MHL Cables tests. (For details, see

Minimum system requirements):

■

A supported Tektronix oscilloscope

■

Two differential probes – P7313SMA, for single ended and differential tests

■

One single ended probe – P7240 for common mode tests

■

Device under test (DUT)

■

Wilder/Tektronix fixtures

■

C-Bus source boards

■

MHL Signal generator: AWG7122B/C with option 01 and 02 or 06 and 08

Connection diagrams and the tests they apply to are listed below.

54 MHL Printable Online Help

Operating basics

Clock and Data Tests

Connection diagram 1 (Cables)

7.2.1.16: Minimum clock swing test

7.2.1.17: Eye diagram test

Single-Ended Signals Calibration Setup for Cable Tests

Differential & Common-Mode Signals Calibration Setup for Cable Tests

MHL Printable Online Help 55

Operating basics

Connection diagram 1 (Cables)

Cable – Minimum Clock Swing Test / Eye Diagram Test Setup

See Also

Equipment connection setup MHL Transmitter

Equipment connection setup MHL Receiver

About algorithms

View connected Instruments

56 MHL Printable Online Help

Operating basics

Application directories and usage

The application directory and associated files are organized as follows:

The following table lists the default directory names and their usage.

Table 9: Application directories and usage

Directory names Usage

InstallDir\TekExpress\TekExpress MHL Contains the application and associated files

TekExpress MHL\ACP Contains instrument and MHL application-

specific interface libraries

TekExpress MHL\Bin Contains miscellaneous MHL application

libraries

TekExpress MHL\Compliance Suites Contains compliance-specific files and filter files

TekExpress MHL\Data Manager Contains result management-specific libraries of

the MHL application

TekExpress MHL\Data Storage Contains libraries needed for storing data

TekExpress MHL\Documents Contains the technical documentation for the

MHL application

TekExpress MHL\Examples Contains various support files

TekExpress MHL\ICP Contains instrument and MHL application-

specific interface libraries

TekExpress MHL\Lib Contains utility files specific to the MHL

application

TekExpress MHL\Report Generator Contains style sheets for report generation

TekExpress MHL\SCP Contains instrument and MHL application-

specific interface libraries

TekExpress MHL\Tools Contains instrument and MHL application-

specific files

MHL Printable Online Help 57

Operating basics

See Also

View test-related files

Files related to MHL tests are stored in the MHL folder under the My TekExpress shared folder. In the MHL folder, each test setup has a test setup file and a test setup folder, both with the test setup name. The test setup file is preceded by the MHL icon and usually has no file extension displayed.

Inside the test setup folder is another folder named for the DUT ID used in the test sessions (the default is DUT001).

Inside the DUT001 folder are the session folders and files. Each session has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside of its matching session folder.

Each session folder contains image files of any plots generated by the test session, and any waveform files if prerecorded waveform files were used during the session.

The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\MHL. Once you name and save the session, the Untitled Session folder name is changed to the one you specified.

NOTE. By default, test report files are saved in the session folder. You can change

the report file location for a specific test.

58 MHL Printable Online Help

Operating basics

See Also

File name extensions

The TekExpress MHL software uses the following file name extensions:

File name extension Description

.TekX Session files are saved in this format but the

extensions may not be displayed

.py The test sequence file

.xml The encrypted XML file that contains the test-

specific configuration information The log file extension is also xml

.wfm The test waveform file

.mht Test result reports are saved in this format by

default. Test reports can also be saved in

MHTML format.

.flt Filter file used with transmitter tests

See Also

Application directories and usage

MHL Printable Online Help 59

Operating basics

60 MHL Printable Online Help

Getting started

Installing the software

Compatibility

Minimum system

requirements

The TekExpress Suite MHL 3.0 Transmitter and MHL 3.0 Receiver of version CTS 3.3 application runs on the following Tektronix oscilloscopes:

■

DPO/DSA/MSO71254C,DPO/DSA/MSO71604C, DPO/DSA/MSO72004C, DPO/DSA72504D, DPO/DSA73304D Digital Oscilloscopes with Option DJA.

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DPO/MSO72304Dx, DPO/MSO72504Dx, DPO/MSO73304Dx Digital Oscilloscopes with Option DJA.

The TekExpress Suite MHL Transmitter, MHL Receiver, MHL Cable test and MHL Receiver protocol of version CTS 1.x, 2.0, 1.3/2.1 application runs on the following Tektronix oscilloscopes:

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DPO/DSA/MSO70804C, DPO/DSA/MSO71254C, DPO/DSA/MSO71604C, DPO/DSA/MSO72004C, DPO/DSA72504D, DPO/DSA73304D Digital Oscilloscopes with Option DJA.

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DPO/MSO72304Dx, DPO/MSO72504Dx, DPO/MSO73304Dx Digital Oscilloscopes with Option DJA.

Install the software

Other devices

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Microsoft compatible mouse or compatible pointing device

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Four USB ports (two USB ports minimum)

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PCI-GPIB or equivalent interface for instrument connectivity.

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2 pair of SMA cables

Activate the license

Starting the software

Start the application

The Options section in the dialog box displays a list of installed options, including TekExpress MHL.

2. To view the Option key, look in the Option Installation Key section. When finished, click OK to close the dialog box.

Options menu

Options menu. The Options menu is located in the upper right corner of the

application.

It has the following selections:

Menu Function

Default Test Setup Opens an untitled test setup with defaults

selected

Open Test Setup Opens a saved test setup

Save Test Setup Saves the current test setup selections

Save Test Setup As Creates a new test setup based on an existing

one

Open Recent Displays a menu of recently opened test setups

to select from

Instrument control settings Shows the list of instruments connected to the

test setup and allows you to locate and refresh connections to connected instruments

Keep On Top Keeps the TekExpress MHL application on top

of other open windows on the desktop

Email settings Use to configure email options for test run and

results notifications

Help Displays TekExpress Help

About TekExpress

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Displays application details such as software name, version number, and copyright

Options Menu

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Provides access to license information for your MHL installation

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Provides a link to the Tektronix Web site

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Getting started

Instrument Control Settings

The Instrument Control Settings dialog box shows the list of resources found on different connections. It serves two purposes:

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Discovers the connected instruments

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Confirms the instrument connection setup

Use the Instrument Control Settings feature to search for and view connected

instruments and view instrument connection details. Connected instruments

displayed here can be selected for use in the Global Settings section of the Setup panel’s Configuration section.

See Also

Options menu

Email Settings

Use the Email Settings utility to configure email notifications if you want the application to notify you when a tests completes or produces an error. Select the type of test run information to be included in the notification, such as test reports and test logs, the email message format, and the email message size limit.

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Options menu

Getting started

View connected

instruments: the

instrument control

settings

Use the Instrument Control Settings dialog box to view or search for connected instruments required for the tests. The application uses TekVISA to discover the connected instruments.

To refresh the list of connected instruments:

1. From the Options menu, select Instrument control settings.

2. In the Search Criteria section of the Instrument Control Settings dialog box,

select the connection types of the instruments to search for.

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Getting started

Instrument search is based on the VISA layer but different connected cables determine the resource type, such as LAN, GPIB, USB. For example, if you choose LAN, you can search for all the instruments supported by TekExpress that are communicating over the LAN. If the search does not find any instruments that match a selected resource type, a message appears telling you that no such instruments were found. Click OK to close the message window.

3. Click Refresh. TekExpress searches for connected instruments.

4. After discovery, the dialog box lists the instrument-related details based on

the search criteria you selected. For example, if you selected LAN and GPIB as the search criteria, the application checks for the availability of instruments over LAN, then GPIB.

The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the Last Updated field.

See Also. Equipment connection setup (MHL Transmitter)

Equipment connection setup (MHL Receiver)

Application controls

Equipment connection setup (MHL Cables)

Table 11: Application controls descriptions

Item Description

Options menu Opens the Options menu for access to global

controls

Panels Visual frames with sets of related options. Some

panels are further divided into tabs and other sections.

Start button

Use the Start button to continuously acquire and accumulate measurements. If prior acquired measurements have not been cleared, the new measurements are added to the existing set.

Stop button

Use the Stop button to abort a test in progress.

Pause \ Continue button

Use the Pause button to interrupt the current acquisition. When a test is paused, the button name changes to Continue.

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Getting started

Item Description

Clear button

Available only on the Results panel. Use the Clear button to clear all existing measurement results. Note that adding or deleting a measurement, or changing a configuration parameter of an existing measurement also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent.

Application window move icon

Place the cursor over the three-dot pattern in the upper left corner of the application window. When the cursor changes to a hand, drag the window to the desired location.

Exit the application

Use the following method to exit the application:

NOTE. Using other methods to exit the application results in abnormal termination of the application.

Click

on the application title bar.

2. Do one of the following:

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A message box appears asking if you really want to exit TekExpress. To exit, click Yes. Otherwise, click No.

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If you have an unsaved session or test setup open, you will be asked if you want to save it before exiting. To save it, click Yes. If you do not wish to save, click No. To remain in the session, click Cancel.

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Getting started

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Application basics

The TekExpress MHL software user interface is intuitive and easy to use. In addition to the UI, a programmatic interface is available.

The user interface has four main panels whose options differ depending upon Suite selected from the following list:

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The following steps explains application basics:

MHL 3.0 Transmitter

MHL 3.0 Receiver

MHL Transmitter

MHL Receiver

MHL Cable

MHL Receiver protocol

See Also

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First, set up the tests.

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Then, prepare to run the tests.

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Then, run the tests and view the progress of analysis.

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Then, view the results of the tests.

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You can configure and view reports.

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You can save and recall test setups.

Overview and key specifications

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Application basics

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Setting up tests

Setting up tests: the Setup panel

The Setup panel guides you through the MHL test setup process using tabs. The options selected in a tab affect the options available in the following tab. The available options differ depending on options selected under Suite and Version tab.

Setup Panel

NOTE. A check mark next to a tab title means you have made changes. However, if you make changes on a tab that significantly affects a previous tab, the check mark of the affected tab is replaced with its number, indicating that you should check the settings on that tab.

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DUT tab

Here, you can Specify the DUT ID, device, applications suite (MHL

3.0 Transmitter/MHL 3.0 Receiver/MHL Transmitter/Receiver/MHL Cable), the CTS version, the view and device profile settings. These settings apply to all tests for the current session, and affect the test list in the Test Selection tab.

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Test selection tab

Here, Select tests individually or by group, view a short description of a selected test, and view a schematic showing appropriate device connections.

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Setting up tests

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Acquisitions tab (MHL 3.0 Transmitter, MHL 3.0 Receiver, MHL

Transmitter and MHL Cable Test only)

View configurations for attached probes, view a list of signals and sources, and view the Acquisitions table.

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Configuration tab (Displays only when View: Advanced is selected in the

DUT tab.)

Here, Select either Compliance Mode or User Defined Mode, view Global Settings, select measurement settings, and view or edit test parameter limits.

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Preferences tab

Here, you may specify that an email be sent to you upon test completion.

Preferences tab

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Setting up tests

Select the device parameters on the DUT tab

1. Click the DUT on the Setup panel

Specify the DUT ID, Device, Suite (MHL 3.0 Transmitter/ MHL

3.0 Receiver/ MHL Transmitter/ MHLReceiver/ MHL Cable), CTS version, View, Acquisition method and Device Profile settings. These settings apply to all current tests, and affect the test list in the Test Selection tab.

2. Enter the device ID: The default value is DUT001. This ID appears on test

reports. To add comments to the top of a report, click 256 characters.

3. Select Suite: Scroll down and select Suite from the following list.

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MHL 3.0 Transmitter

and enter up to

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MHL 3.0 Receiver

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MHL Transmitter

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MHL Receiver

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MHL Cable

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MHL Receiver protocol

4. Select Version: Version choice determines which Device Profile options appear on the screen, and which tests appear on the Test Selection tab.

CTS 1.X, CTS 2.0, or CTS 1.3/2.1 version test selection measurements will be displayed when Suite selection is either MHL Transmitter, MHL Receiver, MHL Cable or MHL Receiver protocol.

CTS 3.2 version test selection measurements will be displayed when Suite selection is MHL 3.0 Transmitter or MHL 3.0 Receiver Suite.

5. Select Waveform type : Select either “Acquire Live Waveforms” or “Use pre-recorded waveform files” for testing. If the suite selection is MHL Receiver, only pre-recorded waveform measurement option is available.

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Setting up tests

6. Select View: Select either Compliance or Advanced. If the suite selection is MHL Receiver, only compilance view is supported.

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If you select the Advanced view, an additional Configuration tab appears.

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To access configuration options for Compliance view, click the

Configure button on the Test Selection tab.

7. Set the Device Profile options (again, these will differ depending upon the

CTS version selected above).

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MHL 3.0 Transmitter only: If you select Version CTS 3.3, you will see this DUT screen.These Device profile options will be available.

DUT tab - CTS 3.3 (MHL 3.0 Transmitter)

Table 12: Device Profile options for CTS 3.0 (MHL 3.0 Transmitter)

Setting Option Description

eCBUS mode Single-ended Single ended eCBUS mode.

Data rate 6 GBPS Select high and low data rate.

3 GBPS

1 GBPS

Termination source Internal Select this if the termination

voltage control mode is INT (Internal).

External other Select this if the termination

voltage control mode is EXT (External) and you are using an external power supply.

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Setting up tests

Setting Option Description

VTerm (v) 3.3 Value must be greater than or

equal to (≥) 1 V and less than or equal to (≤) 5 V.

MHL+ compensation factor 1.0 Used for fixture compensation.

Value should be between 1 and

2. Default value of MHL+ Compensation factor is 1.0.

MHL- compensation factor 1.0 Used for fixture compensation.

Value should be between 1 and

2. Default value of MHLCompensation factor is 1.0.

Single threshold Min(mv) 250 Used for signal validation.

Value should be between 50 and 600 mV.

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MHL 3.0 Receiver only: If you select Version CTS 3.3, you will see this DUT screen.These Device profile options will be available.

DUT tab - CTS 3.3 (MHL 3.0 Receiver)

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Setting up tests

Table 13: Device Profile options for CTS 3.0 (MHL 3.0 Receiver)

Setting Option Description

Data Rate 6 GBPS Select the highest data rate

3 GBPS

1.5 GBPS

Refresh Rate 60Hz Select this if the DUT refresh

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MHL Transmitter only: If you select Version CTS 1.X, you will see this

supported by the DUT.

rate is 60 Hz.

DUT screen. These Device Profile options will be available.

DUT tab – CTS 1.X (Transmitter)

Table 14: Device Profile options for CTS 1.X (Transmitter)

Setting Option Description

Pixel Mode 24 Bits This is the only option available.

Low Resolution (MHz) 25 Enter a value from 25 to 100.

High Resolution (MHz) 74.25

Low Resolution value should be less than or equal to High Resolution, and High Resolutions should be greater than or equal to Low resolution.

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Setting up tests

Setting Option Description

Num of Other Resolutions 0 If the DUT can support more

than the three standard resolutions, enter the number here. Value can be from 0 to

10. Applicable tests will be run for the number of other resolutions specified here.

MHL+ Compensation Factor 1.2 Used for fixture compensation.

Value should be between 1 and

MHL– Compensation Factor 1.2 Used for fixture compensation.

Value should be between 1 and

Min Signal Threshold 250 Used for signal validation.

Value should be between 50 and 600 mV.

Termination Source Internal Select this if the termination

voltage control mode is INT (Internal).

External Other Select this if the termination

voltage control mode is EXT (External) and you are using an external power supply.

VTerm Min (V) 3.135 Value must be greater than or

equal to (≥) 1V and less than or equal to (≤) VTerm Max.

VTerm Max (V) 3.465 Value must be greater than or

equal to (≥) VTerm Min, and less than or equal to (≤) 5V.

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MHL Transmitter only: If you select Version CTS 2.0, the DUT screen and Device Profile options you will see will differ depending upon the Pixel Mode selected. This screen shows the DUT tab with pixel mode of both. These Device profile options will be available.

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Setting up tests

DUT tab – CTS 2.0 with Pixel Mode of Both (Transmitter)

Table 15: Device Profile options for CTS 2.0 (Transmitter)

Setting Option Description

Pixel Mode 24 Bits Select this if the DUT uses

24 Bit mode.

Packed Pixel Select this if the DUT uses

packed pixel mode.

Both Select this if the DUT uses both

24 Bit and packed pixel mode.

When Pixel Mode is 24 Bits:

Low Data Rate (Gbps) 0.75 Enter a value from 0.75 –

High Data Rate (Gbps) 2.22

Num of Other Data Rates 0 If the DUT can support more

When Pixel Mode is Packed Pixel:

2.22 Gbps. Low Data Rate value should be less than or equal to High Data Rate and High Data Rate values should be greater than or equal to Low Data Rate.

than the three standard resolutions, enter the number here. Value can be from 0 to

10. Applicable tests will be run for the number of other resolutions specified here.

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Setting up tests

Setting Option Description

Low Data Rate (Gbps) 2.25 Enter a value from 2.25 –

High Data Rate (Gbps) 2.97

Num of Other Data Rates 0 If the DUT can support more

When Pixel Mode is Both:

24 Bits:

Low Data Rate (Gbps) 0.75 Enter a value from 0.75 –

High Data Rate (Gbps) 2.22

Packed Pixel:

High Data Rate (Gbps) 2.97 Low Data Rate value should be

MHL+ Compensation Factor 1.2 Used for fixture compensation.

MHL– Compensation Factor 1.2 Used for fixture compensation.

Min Signal Threshold 250 Used for signal validation.

Termination Source Internal Select this if the termination

External Other Select this if the termination

VTerm Min (V) 3.135 Value must be greater than or

2.97 Gbps. Low Data Rate value should be less than or equal to High Data Rate and High Data Rate values should be greater than or equal to Low Data Rate.

than the three standard resolutions; enter the number here. Value can be from 0 to

10. Applicable tests will be run for the number of other resolutions specified here.

2.22 Gbps. Low Data Rate value should be less than or equal to High Data Rate and High Data Rate values should be greater than or equal to Low Data Rate.

less than or equal to High Data Rate and High Data Rate values should be greater than or equal to Low Data Rate.

Value should be between 1 and

Value should be between 50 and 600 mV.

voltage control mode is INT (Internal).

voltage control mode is EXT (External) and you are using an external power supply.

equal to (≥) 1V and less than or equal to (≤) VTerm Max.

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Setting up tests

Setting Option Description

VTerm Max (V) 3.465 Value must be greater than or

equal to (≥) VTerm Min, and less than or equal to (≤) 5V.

Direct Attach (Applicable for CTS 1.3 / 2.1 only)

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MHL Transmitter only: If you select Version CTS 1.3 / 2.1, the DUT

Check / Uncheck Select the checkbox when you

are testing Direct Attach Device.

screen and Device Profile options you will see will differ depending upon the Pixel Mode selected. This screen shows this DUT tab screen. These Device profile options will be available.

DUT tab – CTS 1.3 / 2.1 (Transmitter)

Table 16: Device Profile options for CTS 1.3 / 2.1 (Transmitter)

Setting Option Description

Pixel Mode 24 Bits Select this if the DUT uses

24 Bit mode.

Packed Pixel Select this if the DUT uses

packed pixel mode.

Both Select this if the DUT uses both

24 Bit and packed pixel mode.

When Pixel Mode is 24 Bits:

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Tektronix TekExpress MHL Help User manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

Getting help and support

Technical support

Overview and key specifications

Overview and key specifications

Supported tests: MHL 3.0 Transmitter

Supported tests: MHL 3.0 Receiver

Supported tests: MHL Transmitter

Supported tests: MHL Receiver

Supported tests: MHL Cables

Supported tests: MHL Receiver Protocol

Supported data rate: MHL 3.0 Transmitter

Supported data rate: MHL 3.0 Receiver

Supported resolutions: MHL Transmitter

Supported resolutions: MHL Receiver

Supported resolutions: MHL Cables

Supported resolutions: MHL Receiver Protocol

Operating basics

Equipment connection setup using the TF-MHL-CBS2-SOSI (MHL transmitter and receiver)

Equipment connection setup (MHL 3.0 Transmitter)

Equipment connection setup (MHL 3.0 Receiver)

Equipment connection setup (MHL Transmitter)

Equipment connection setup (MHL Receiver protocol and MHL protocol)

Equipment connection setup (MHL Cables)

Application directories and usage

View test-related files

File name extensions

Getting started

Installing the software

Compatibility

See Also. Minimum system requirements

Install the software

Activate the license

See Also. View version and license information

Starting the software

Start the application

Options menu

Application controls

Exit the application

Application basics

Application basics

Setting up tests

Setting up tests: the Setup panel

Select the device parameters on the DUT tab