Tektronix TekExpress MHL Help User manual

MHL Advanced Analysis and Compliance Test Software

Printable Online Help

*P077062008*

077-0620-08

MHL Advanced Analysis and Compliance Test Software

Printable Online Help

www.tek.com

077-0620-08

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

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In North America, call 1-800-833-9200.

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Worldwide, visit www.tek.com to find contacts in your area.

Welcome ............................................................................................................................................. ix

Getting help and support

Technical support ........................................................................................................................... 1

Overview and key specifications

Overview and key specifications .................................................................................................... 3

Supported tests: MHL 3.0 Transmitter ........................................................................................... 4

Supported tests: MHL 3.0 Receiver ............................................................................................... 8

Supported tests: MHL Transmitter ............................................................................................... 11

Supported tests: MHL Receiver ................................................................................................... 15

Supported tests: MHL Cables ....................................................................................................... 17

Supported tests: MHL Receiver Protocol ..................................................................................... 18

Supported data rate: MHL 3.0 Transmitter .................................................................................. 20

Supported data rate: MHL 3.0 Receiver ....................................................................................... 20

Supported resolutions: MHL Transmitter ..................................................................................... 20

Supported resolutions: MHL Receiver ......................................................................................... 22

Supported resolutions: MHL Cables ............................................................................................ 24

Supported resolutions: MHL Receiver Protocol .......................................................................... 24

Operating basics

Equipment connection setup using the TF-MHL-CBS2-SOSI (MHL transmitter and receiver) . 27

Equipment connection setup (MHL 3.0 Transmitter) .................................................................. 29

Equipment connection setup (MHL 3.0 Receiver) ....................................................................... 35

Equipment connection setup (MHL Transmitter) ........................................................................ 41

Equipment connection setup (MHL Receiver protocol and MHL protocol) ................................ 44

Equipment connection setup (MHL Cables) ................................................................................ 54

Application directories and usage ................................................................................................. 57

View test-related files ................................................................................................................... 58

File name extensions .................................................................................................................... 59

Getting started

Installing the software .................................................................................................................. 61

Compatibility ........................................................................................................................... 61

Minimum system requirements ............................................................................................... 61

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Table of Contents

Install the software .................................................................................................................. 64

Activate the license ................................................................................................................. 65

View version and license information ..................................................................................... 66

Starting the software ..................................................................................................................... 67

Start the application ................................................................................................................. 67

Options menu .......................................................................................................................... 69

View connected instruments: the instrument control settings ................................................. 71

Application controls ................................................................................................................ 72

Exit the application .................................................................................................................. 73

Application basics

Application basics ......................................................................................................................... 75

Setting up tests

Setting up tests: the Setup panel ................................................................................................... 77

Select the device parameters on the DUT tab ............................................................................... 79

Choose test from the Test Selection tab ....................................................................................... 95

Configure the cable tests using the Configuration tab ................................................................ 102

Selecting acquisitions ................................................................................................................. 103

Acquire waveforms with the acquisitions tab ....................................................................... 103

Use prerecorded waveforms for analysis .............................................................................. 108

Acquire live waveforms for analysis ..................................................................................... 110

Configure tests ............................................................................................................................ 111

Configure tests using the Configuration tab .......................................................................... 111

Compliance mode or user defined mode ............................................................................... 115

DUT Automation (MHL 3.0 transmitter) .............................................................................. 116

DUT Automation (MHL 3.0 receiver) .................................................................................. 117

Measurement parameter descriptions (MHL 3.0 Transmitter) .............................................. 117

Measurement parameter descriptions (MHL 3.0 Receiver) .................................................. 119

Measurement parameter descriptions (MHL Transmitter) .................................................... 119

Measurement parameter descriptions (MHL Receiver) ........................................................ 122

Measurement parameter descriptions (MHL Cable) ............................................................. 123

Measurement parameter descriptions (MHL Receiver protocol) .......................................... 126

Running tests

Before you click Start ................................................................................................................. 129

Pre-run check list ........................................................................................................................ 131

Configure email notification ....................................................................................................... 132

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Run test and view progress on the Status panel .......................................................................... 133

Viewing results

Viewing test results: the Results panel ....................................................................................... 137

Configuring and viewing reports

Configuring and viewing reports: the Reports panel .................................................................. 139

Saving and recalling test setups

About saving and recalling test setups ....................................................................................... 143

Saving a test setup ...................................................................................................................... 144

Recalling a saved test setup ........................................................................................................ 144

Creating a new test setup based on an existing one .................................................................... 145

Deleting a test setup .................................................................................................................... 145

Table of Contents

TekExpress programmatic interface

About the programmatic interface .............................................................................................. 147

Requirements for developing TekExpress client ........................................................................ 148

Remote proxy object ................................................................................................................... 149

Client proxy object ..................................................................................................................... 150

Client programmatic interface example ..................................................................................... 151

Program examples ...................................................................................................................... 154

MHL application commands ...................................................................................................... 158

Connect through an IP address .............................................................................................. 158

Lock the server ...................................................................................................................... 159

Disable the popups ................................................................................................................ 160

Set or get the DUT ID ........................................................................................................... 162

Set the configuration parameters for a suite or measurement ............................................... 164

Query the configuration parameters for a suite or measurement .......................................... 169

Select a measurement ............................................................................................................ 173

Select a suite .......................................................................................................................... 190

Set pixel mode ....................................................................................................................... 192

Set resolution ......................................................................................................................... 194

Set data rate (CTS 3.2) .......................................................................................................... 196

Set termination source method .............................................................................................. 198

Set termination voltage .......................................................................................................... 199

Set the Auto Calibration patterns .......................................................................................... 201

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Table of Contents

Run with set configurations or stop the run operation .......................................................... 202

Handle error codes ................................................................................................................. 203

Get or set the timeout value ................................................................................................... 204

Wait for the test to complete ................................................................................................. 205

After the test is complete ....................................................................................................... 209

Save recall or check if a session is saved .............................................................................. 215

Unlock the server ................................................................................................................... 217

Disconnect from the server .................................................................................................... 218

Algorithms

About algorithms ........................................................................................................................ 219

3.1.1.1: Standby output voltage test - VOFF .............................................................................. 219

MHL 3.0 transmitter output group: Data tests

3.7.2.1: Single-ended high level output voltage of differential TMDS data+/-:

VSE_HIGH_DF_TMDS_DATA (CTS 3.3) ......................................................................... 223

3.7.2.2: Single-ended low level output voltage of differential TMDS data+/-:

VSE_LOW_DF_TMDS_DATA (CTS 3.3) .......................................................................... 224

3.7.2.5: Differential output swing voltage of differential TMDS data:

VDF_SWING_DF_TMDS_DATA (CTS 3.3) ...................................................................... 225

3.7.2.13: Rise time of differential TMDS data: TR_DF_TMDS_DATA (CTS 3.3) ................. 226

3.7.2.14: Fall time of differential TMDS data: TF_DF_TMDS_DATA (CTS 3.3) ................... 226

3.7.2.17: Peak-to-peak amplitude of differential TMDS data: TPP_TP1_DF_TMDS_DATA (CTS

3.3) ......................................................................................................................................... 227

3.7.2.27: Differential TMDS data eye diagram at TP2 (CTS 3.3) ............................................. 228

MHL 3.0 transmitter output group: Clock tests

3.7.2.7: Single-ended high level output voltage of single-ended MHL clock data:

VSE_HIGH_SE_MHL_CLK (CTS 3.3) ............................................................................... 229

3.7.2.8: Single-ended low level output voltage of single-ended MHL clock data:

VSE_LOW_SE_MHL_CLK(CTS 3.3) ................................................................................. 230

3.7.2.9: Single-ended output swing voltage of single-ended MHL clock data:

VSE_SWING_SE_MHL_CLK (CTS 3.3) ............................................................................ 231

3.7.2.20: Single-ended MHL clock frequency: FSE_MHL_CLK (CTS 3.3) ............................. 231

3.7.2.21: Single-ended MHL clock front porch: TCFP_SE_MHL_CLK (CTS 3.3) ................. 232

3.7.2.22: Single-ended MHL clock back porth: TCBP_SE_MHL_CLK (CTS 3.3) .................. 233

3.7.2.23: Rise time of single-ended MHL clock: TTR_SE_MHL_CLK (CTS 3.3) .................. 234

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3.7.2.26: Single-ended MHL clock jitter at TP2: TCLOCK_JITTER_TP2_SE_MHL_CLK (CTS

3.3) ......................................................................................................................................... 234

MHL 3.0 transmitter output group: eCBUS tests

3.7.2.7: Single-ended high level output voltage of single-ended eCBUS-S forward data:

VSE_HIHG_SE_eCBUS_FWD (CTS 3.3) ........................................................................... 237

3.7.2.8: Single-ended low level output voltage of single-ended eCBUS-S forward data:

VSE_LOW_SE_eCBUS_FWD (CTS 3.3) ............................................................................ 238

3.7.2.9: Single-ended output swing voltage of single-ended eCBUS-S forward data:

VSE_SWING_SE_eCBUS_FWD (CTS 3.3) ........................................................................ 239

3.7.2.24: Fall time of single-ended eCBUS-S forward data: TF_SE_eCBUS_FWD (CTS 3.3) 240

3.7.2.25: Peak-to-peak amplitude of eCBUS-S forward data: VPP_TP1_SE_eCBUS_FWD (CTS

3.3) ......................................................................................................................................... 241

3.7.2.29: eCBUS-S forward data eye diagram at TP2 (CTS 3.3) ............................................... 242

Table of Contents

MHL 3.0 transmitter input group: eCBUS tests

3.7.2.32: Input DC voltage tolerance of eCBUS-S backward data: VIDC_SE_eCBUS_BWD(CTS

3.3) ......................................................................................................................................... 243

3.7.2.36: Jitter tolerance of eCBUS-S backward data (CTS 3.3) ............................................... 244

3.7.2.40 Duty Cycle Tolerance of Single-Ended MHLClock - Source ...................................... 244

Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data) ................................. 245

MHL 3.0 receiver output group: Sink tests

4.7.2.14: Single-ended high level output voltage of eCBUS-S backward data:

VSE_HIGH_SE_eCBUS_BWD (CTS 3.3) .......................................................................... 247

4.7.2.15: Single-ended low level output voltage of eCBUS-S backward data:

VSE_LOW_SE_eCBUS_BWD (CTS 3.3) ........................................................................... 248

4.7.2.16: Single-ended output swing voltage of eCBUS-S backward data:

VSE_SWING_SE_eCBUS_BWD (CTS 3.3) ....................................................................... 249

4.7.2.20: Rise time of eCBUS-S backward data: TR_SE_eCBUS_BWD (CTS 3.3) ................ 250

4.7.2.21: Fall time of eCBUS-S backward data: TF_SE_eCBUS_BWD (CTS 3.3) ................. 250

4.7.2.22: Peak-to-peak amplitude of eCBUS-S backward data: VPP_TP2_SE_eCBUS_BWD

(CTS 3.3) ............................................................................................................................... 251

4.7.2.24: eCBUS-S backward data eye diagram at TP1 (CTS 3.3) ............................................ 252

MHL 3.0 receiver output group: Dongle tests

5.7.2.16: Output DC Voltage of eCBUS-S BWD Data: VODC_SE_eCBUS_BWD (CTS 3.3) 253

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Table of Contents

5.7.2.17: Single-ended output swing voltage of eCBUS-S backward data:

VSE_SWING_SE_eCBUS_BWD (CTS 3.3) ....................................................................... 254

5.7.2.19: eCBUS-S backward data eye diagram at TP3 (CTS 3.3) ............................................ 255

MHL 3.0 receiver input group: Sink tests

4.7.2.1: Input DC voltage tolerance of differential TMDS data: VIDC_DF_TMDS_DATA(CTS

3.3) ......................................................................................................................................... 257

4.7.2.3: Differential input swing voltage tolerance of differential TMDS data:

VIDF_SWING_DF_TMDS_DATA (CTS 3.3) .................................................................... 258

4.7.2.5: Input DC voltage tolerance of single-ended MHL clock and eCBUS-S forward data:

VIDC_SE_MHL_CLK, VIDC_SE_eCBUS_FWD(CTS 3.3) .............................................. 259

4.7.2.7: Differential intra-pair skew tolerance of differential TMDS data:

TSKEW_TP2_DF_TMDS_DATA (CTS 3.3) ...................................................................... 260

4.7.2.10: Jitter tolerance of single-ended MHL clock: TCLOCK_JITTER_TP2_SE_MHL_CLK

(CTS 3.3) ............................................................................................................................... 261

4.7.2.28 Duty Cycle Tolerance of Single-Ended MHLClock - Sink .......................................... 262

MHL 3.0 receiver input group: Dongle tests

5.7.2.1: Single-ended high level input voltage tolerance of differential TMDS data:

VSE_HIGH_DF_TMDS_DATA .......................................................................................... 263

5.7.2.2: Single-ended low level input voltage tolerance of differential TMDS data:

VSE_LOW_DF_TMDS_DATA(CTS 3.3) ........................................................................... 264

5.7.2.5: Differential input swing voltage tolerance of differential TMDS data:

VIDF_SWING_DF_TMDS_DATA (CTS 3.3) .................................................................... 265

5.7.2.7: Single-ended high level input voltage tolerance of single-ended MHL clock and eCBUS-

S forward data: VSE_HIGH_SE_MHL_CLK, VSE_HIGH_SE_eCBUS_FWD (CTS 3.3) 266

5.7.2.8: Single-ended low level input voltage tolerance of single-ended MHL clock and eCBUS-S

forward data: VSE_LOW_SE_MHL_CLK, VSE_LOW_SE_eCBUS_FWD(CTS 3.3) ...... 267

5.7.2.10: Differential intra-pair skew tolerance of differential TMDS data:

TSKEW_TP3_DF_TMDS_DATA (CTS 3.3) ...................................................................... 268

5.7.2.13: Jitter tolerance of single-ended MHL clock (CTS 3.3) ............................................... 269

5.7.2.23 Duty Cycle Tolerance of Single-Ended MHL Clock - Dongle .................................... 270

MHL transmitter group 1: Clock tests

3.1.1.5: Common-mode output swing voltage test - VCMSWING ........................................... 271

3.1.1.7: Common-mode rise and fall times test - TR_CM,TF_CM ........................................... 272

3.1.1.10: MHL clock duty cycle test - 24 bit or packed pixel mode (CTS 1.0); normal mode (CTS

2.0 and CTS 1.3/2.1) ............................................................................................................. 273

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3.1.1.11: MHL clock jitter test (CTS 1.0) - in normal mode (CTS 2.0) ..................................... 274

3.1.1.14: MHL clock duty cycle test - packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ............. 275

3.1.1.15: MHL clock jitter test - packed pixel mode .................................................................. 275

3.1.1.17: TP2 clock jitter test (CTS 1.3/2.1) - normal mode ...................................................... 275

3.1.1.19: TP2 clock jitter test - packed pixel mode .................................................................... 276

MHL transmitter group 2: Data tests

3.1.1.2: Single-ended high level voltage test - VSE_HIGH ....................................................... 277

3.1.1.3: Single-ended low level voltages test - VSE_LOW ....................................................... 278

3.1.1.4: Differential output swing voltage test - VDF_SWING ................................................. 279

3.1.1.6: Differential rise and fall times test - TR_DF,TF_DF .................................................... 280

3.1.1.8: Differential intra-pair skew test - TSKEW_DF ............................................................. 280

3.1.1.12: MHL data eye diagram test (CTS 1.0) - in normal mode (CTS 2.0) ........................... 281

3.1.1.16: MHL data eye diagram test in packed pixel mode ...................................................... 282

3.1.1.18: TP2 data eye diagram test (CTS 1.3/2.1) - normal mode ............................................ 282

3.1.1.20: TP2 data eye diagram test - packed pixel mode .......................................................... 283

Table of Contents

MHL receiver group 1: Sink tests

4.1.1.1: Input signal DC voltage level tolerance test .................................................................. 285

4.1.1.2: Input signal minimum and maximum swing voltages tolerance test ............................ 288

4.1.1.3: Intra-pair skew tolerance test ......................................................................................... 292

4.1.1.4: Jitter tolerance test (CTS 1.X) - in normal mode (CTS 2.0 and CTS 1.3/2.1) .............. 295

4.1.1.8: Jitter tolerance test in packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ......................... 298

MHL receiver group 2: Dongle tests

5.1.1.1: Input signal single-ended voltage level tolerance ......................................................... 299

5.1.1.2: Input signal minimum and maximum swing voltage tolerance test .............................. 302

5.1.1.3: Intra-pair skew tolerance test ......................................................................................... 306

5.1.1.4: Jitter tolerance test (CTS 1.X) - in normal mode (CTS 2.0 and CTS 1.3/2.1) .............. 309

5.1.1.9: Jitter tolerance test in packed pixel mode (CTS 2.0 and CTS 1.3/2.1) ......................... 312

MHL cable group 1: Clock tests

7.2.1.16 Cable test: MHL minimum clock measurement ........................................................... 313

MHL cable group 2: Data tests

7.2.1.17 Cable test: eye diagram test .......................................................................................... 315

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Table of Contents

Reference

MHL data eye diagram test - mask movement ........................................................................... 319

Map the My TekExpress folder .................................................................................................. 322

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Welcome

MHL application

Engineers designing and validating the Mobile High-definition Link (MHL) Interface of their devices face constant pressure to improve efficiency. Engineers need to perform a wide range of compliance tests quickly and reliably right on their bench.

The MHL 1.X, 2.0, 1.3/2.1, 3.2 specification enables mobile devices to transmit uncompressed audio/video to an HDTV or receiver with HD capability. Option MHD advanced analysis and compliance test software meets the MHL 1.X,

2.0 and 1.3/2.1 CTS specification and option MHD3 advanced analysis and compliance test software meets the MHL 3.0 early CTS, 3.2 CTS and 3.3 CTS specification . MHD3 automates a comprehensive range of tests, enabling unprecedented efficiency with reliable results.

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CTS 3.3

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Welcome

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CTS 1.X, 2.0, 1.3 / 2.1

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Getting help and support

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site,

www.tektronix.com.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

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General Information

All instrument model numbers

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Hardware options, if any

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Probes used

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Your name, company, mailing address, phone number, FAX number

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Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application Specific

Information

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Software version number

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Description of the problem such that technical support can duplicate the problem

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If possible, save the setup files for all the instruments used and the application.

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If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file.

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If possible, save the waveform on which you are performing the measurement as a .wfm file.

MHL Printable Online Help 1

Getting help and support

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Overview and key specifications

The TekExpress MHL Advanced Analysis and Compliance Solution gives you the tools to easily run Mobile High-definition Link (MHL) tests under the MHL compliance test specifications 1.X, 2.0, 1.3 / 2.1 and 3.2. It provides a complete and reliable solution for quick testing.

The application functionality is generally divided into six parts:

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MHL 3.0 Transmitter test (CTS 3.3)

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MHL 3.0 Receiver test (CTS 3.3)

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MHL Transmitter test (CTS 1.X, 2.0, 1.3 / 2.1)

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MHL Receiver test (CTS 1.X, 2.0, 1.3 / 2.1)

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MHL Cable test (CTS 1.3 / 2.1)

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MHL Receiver Protocol test (CTS 1.X, 2.0, 1.3 / 2.1)

Select the suite and version of the CTS by clicking on the Setup panel and clicking the DUT tab. See Application basics for more information.

Supported Tests:

TekExpress MHL 3.0 Transmitter supports these automated Data, Clock and

eCBUS tests.

TekExpress MHL 3.0 Receiver supports these automated Sink and Dongle tests.

TekExpress MHL Transmitter supports these automated Clock and Data tests.

TekExpress MHL Receiver supports these automated Sink and Dongle tests.

TekExpress MHL Cables supports these automated Clock and Data tests.

Additional tests may be performed manually by loading the test patterns on the Tektronix Arbitrary Waveform Generator (AWG).

MHL Cable Assembly Electrical Tests

NOTE. Contact your local Tektronix representative for the MOI of cable tests.

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Impedance

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Intra-Pair Skew

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Delay

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Insertion Loss

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Differential and Common Mode Conversion

MHL Printable Online Help 3

Overview and key specifications

Supported Resolutions:

Supported tests: MHL 3.0 Transmitter

TekExpress MHL 3.0 Transmitter supports the following automated Data, Clock and eCBUS tests:

These tests are supported for CTS Version 3.3:

MHL 3.0 Transmitter output tests

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TMDS Data

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3.7.2.1: Single-ended high level output voltage of differential TMDS data +/-: V

SE_HIGH_DF_TMDS_DATA

This test confirms that the single-ended high level voltage of the differential TMDS data output is within the specified limits.

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3.7.2.2: Single-ended low level output voltage of differential TMDS data +/-: V

SE_LOW_DF_TMDS_DATA

This test confirms that the single-ended low level voltage of the differential TMDS data is within the specified limits.

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3.7.2.5: Differential output swing voltage of differential TMDS data: V

DF_SWING_DF_TMDS_DATA

This test confirms that the differential swing voltage of the differential TMDS data is within the specified limits.

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3.7.2.13: Rise time of differential TMDS data: T

R_DF_TMDS_DATA

This test confirms that the rise time of differential TMDS data is within the specified limits.

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Overview and key specifications

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3.7.2.14: Fall time of differential TMDS data: T

F_DF_TMDS_DATA

This test confirms that the fall time of differential TMDS data is within the specified limits.

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3.7.2.17: Peak-to-peak amplitude of differential TMDS data: T

PP_TP1_DF_TMDS_DATA

This test confirms that the peak-to-peak amplitude of differential TMDS data is within the specified limits.

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3.7.2.27: Differential TMDS data eye diagram at TP2

This test confirms that the differential TMDS data eye diagram is within the specified limits.

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MHL Clock

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3.7.2.7: Single-ended high level output voltage of single-ended MHL clock data: V

SE_HIGH_SE_MHL_CLK

This test confirms that the single-ended high level voltages of the singleended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.8: Single-ended low level output voltage of single-ended MHL clock data: V

SE_LOW_SE_MHL_CLK

This test confirms that the single-ended low level voltages of the singleended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.9: Single-ended output swing voltage of single-ended MHL clock data: V

SE_SWING_SE_MHL_CLK

This test confirms that the single-ended output swing voltages of the Single-Ended MHL clock are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.20: Single-ended MHL clock frequency: F

SE_MHL_CLK

This test confirms that the single-ended MHL clock frequency is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.21: Single-ended MHL clock front porch: T

CFP_SE_MHL_CLK

This test confirms that the single-ended MHL clock front porch time is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.22: Single-ended MHL clock back porth: T

CBP_SE_MHL_CLK

This test confirms that the single-ended MHL clock back porch time is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.23: Rise time of single-ended MHL clock: T

TR_SE_MHL_CLK

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Overview and key specifications

This test confirms that the rise time of single-ended MHL clock is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.26: Single-ended MHL clock jitter at TP2: T

CLOCK_JITTER_TP2_SE_MHL_CLK

This test confirms that single-ended MHL clock jitter at TP2 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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MHL eCBUS

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3.7.2.7: Single-ended high level output voltage of single-ended eCBUS-S forward data: V

SE_HIHG_SE_eCBUS_FWD

This test confirms that the single-ended high level voltages of the singleended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.8: Single-ended low level output voltage of single-ended eCBUS-S forward data: V

SE_LOW_SE_eCBUS_FWD

This test confirms that the single-ended low level voltages of the singleended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.9: Single-ended output swing voltage of single-ended eCBUS-S forward data: V

SE_SWING_SE_eCBUS_FWD

This test confirms that the single-ended output swing voltages of the single-ended eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.24: Fall time of single-ended MHL clock, eCBUS-S forward data: T

F_SE_eCBUS_CLK

, T

F_SE_eCBUS_FWD

This test confirms that the fall times of single-ended MHL clock and eCBUS-S forward data are within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.25: Peak--to-peak amplitude of eCBUS-S forward data: V

PP_TP1_SE_eCBUS_FWD

This test confirms that the peak-to-peak amplitude of eCBUS-S forward data is within the specified limits. This test is applied only to the DUT with eCBUS-S.

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3.7.2.29: eCBUS-S forward data eye diagram at TP2

This test confirms that the clock jitter of the TMDS differential clock complies with the limits mentioned in specification.

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Overview and key specifications

MHL 3.0 Transmitter input tests

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MHL eCBUS tests

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3.7.2.32: Input DC voltage Tolerance of eCBUS-S backward data: V

IDC_SE_eCBUS_BWD

This test confirms that the source DUT tolerates the input DC voltage levels of eCBUS-S backward data specified in the specification.

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3.7.2.36: Jitter tolerance of eCBUS-S backward data

This test confirms that the source DUT tolerates the maximum jitter of input eCBUS-S backward data specified in the specification.

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3.7.2.40 Duty Cycle Tolerance of Single-Ended MHLClock - Source

This test confirms that the Source DUT tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification

■

Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data)

This test confirms that the Nominal Jitter & Error patterns used for "3.7.2.36 - Jitter tolerance of eCBUS-S backward data" test meets the required specification.

NOTE.

For Eye diagram test, TekExpress MHL solution uses the Auto mask feature to automatically place the mask to achieve zero or minimal hits. In case of Mask hit, Manual mode options permit user to manually place the mask. Refer to the Mask

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

MHL Printable Online Help 7

Overview and key specifications

Supported tests: MHL 3.0 Receiver

TekExpress MHL 3.0 Receiver supports the following automated Sink and Dongle tests.

These tests are supported for CTS Version 3.3:

MHL 3.0 Receiver output tests

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MHL Sink

■

4.7.2.14: Single-ended high level output voltage of eCBUS-S backward data: V

This test confirms that the single-ended high level voltage of eCBUS-S backward data output is within the specified limits.. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.15: Single-ended low level output voltage of eCBUS-S forward data: V

This test confirms that the single-ended low level voltage of eCBUS-S backward data output is within the specified limts. This test is applied only to the DUT with eCBUS-S.

SE_HIGH_SE_eCBUS_BWD

SE_LOW_SE_eCBUS_BWD

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4.7.2.16: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

This test confirms that the single-ended output swing voltage of eCBUSS backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.20: Rise time of eCBUS-S backward data: T

R_SE_eCBUS_BWD

This test confirms that the rise time of eCBUS-S backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.21: Fall time of eCBUS-S backward data: T

F_SE_eCBUS_BWD

This test confirms that the fall time of eCBUS-S BWD data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.22: Peak-to-peak amplitude of eCBUS-S backward data: V

PP_TP2_SE_eCBUS_BWD

This test confirms that the peak-to-peak amplitude of eCBUS-S backward data output is within the specified limits.. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.24: eCBUS-S backward data eye diagram at TP1

8 MHL Printable Online Help

Overview and key specifications

This test confirms that the eCBUS-S backward data eye diagram at TP1 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

MHL Dongle

■

5.7.2.16: Output DC voltage of eCBUS-S backward data: V

ODC_SE_eCBUS_BWD

This test confirms that the DC voltage level of eCBUS-S backward data output signal is within the specified limits. This test is applied only to the DUT with eCBUS-D.

■

5.7.2.17: Single-ended output swing voltage of eCBUS-S backward data: V

SE_SWING_SE_eCBUS_BWD

This test confirms that the single-ended output swing voltage of eCBUSS backward data output is within the specified limits. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.19: eCBUS-S backward data eye diagram at TP3

This test confirms that the eCBUS-S backward data eye diagram at TP3 is within the specified limits. This test is applied only to the DUT with eCBUS-S.

MHL 3.0 Receiver input tests

■

MHL Sink

■

4.7.2.1: Input DC voltage tolerance of differential TMDS data: V

IDC_DF_TMDS_DATA

This test confirms that the Sink device supports the DC voltage level of the differential TMDS data input signal allowed by the specification.

■

4.7.2.3: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

This test confirms that the Sink device supports the differential swing voltage of the differential TMDS data input signal allowed by the specification.

■

4.7.2.5: Input DC voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V

This test confirms that the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.7: Differential intra-pair skew tolerance of differential TMDS data: T

SKEW_TP2_DF_TMDS_DATA

IDC_SELMHL_CLK

, V

IDC_SE_eCBUS_FWD

This test confirms that the Sink device tolerates the differential intra-pair skew of the differential TMDS data input signal allowed by the specification.

■

4.7.2.10: Jitter tolerance of single-ended MHL clock: T

CLOCK_JITTER_TP2_SE_MHL_CLK

MHL Printable Online Help 9

Overview and key specifications

This test confirms that the Sink device tolerates the single-ended MHL clock jitter. This test is applied only to the DUT with eCBUS-S.

■

4.7.2.28 Duty Cycle Tolerance of Single-Ended MHLClock - Sink

This test confirms that the Sink DUT tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification.

■

MHL Dongle

■

5.7.2.1: Single-ended high level input voltage tolerance of differential TMDS data: V

SE_HIGH_DF_TMDS_DATA

This test confirms that the Dongle device supports the single-ended high level voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.2: Single-ended low level input voltage tolerance of differential TMDS data: V

SE_LOW_DF_TMDS_DATA

This test confirms that the Dongle device supports the single-ended low level voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.5: Differential input swing voltage tolerance of differential TMDS data: V

IDF_SWING_DF_TMDS_DATA

This test confirms that the Dongle device supports the differential swing voltage of the differential TMDS data input signal allowed by the specification.

■

5.7.2.7: Single-ended high level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V V

SE_HIGH_SE_eCBUS_FWD

SE_HIGH_SE_MHL_CLK

This test confirms that the Dongle device supports the single-ended high level voltage of the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.8: Single-ended low level input voltage tolerance of single-ended MHL clock and eCBUS-S forward data: V V

SE_LOW_SE_eCBUS_FWD

SE_LOW_SE_MHL_CLK

This test confirms that the Dongle device supports the single-ended low level voltage of the single-ended MHL clock and eCBUS-S forward data input signals allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.10: Differential intra-pair skew tolerance of differential TMDS data: T

SKEW_TP3_DF_TMDS_DATA

This test confirms that the Donge device tolerates the differential intrapair skew of the differential TMDS data input signal allowed by the specification.

■

5.7.2.13: Jitter tolerance of single-ended MHL clock

10 MHL Printable Online Help

Overview and key specifications

This test confirms that the Dongle device tolerates the single-ended MHL clock jitter and eCBUS-S forward data eye diagram impairments and differential TMDS data eye diagram impairments allowed by the specification. This test is applied only to the DUT with eCBUS-S.

■

5.7.2.23 Duty Cycle Tolerance of Single-Ended MHLClock - Dongle

This test confirms that the Dongle device tolerates duty cycle variation of the input Single-Ended MHL Clock during the eCBUS-S Start-Up sequence specified in the specification.

Supported tests: MHL Transmitter

TekExpress MHL Transmitter supports the following automated Clock and Data tests:

These tests are supported for CTS Version 1.0:

Clock tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - 24 Bit or Packed Pixel Mode

This test confirms that the MHL clock duty cycle in 24-bit or packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.11: MHL Clock Jitter Test

This test confirms that the MHL Clock output does not contain excessive jitter larger than the limit allowed by the specification.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

MHL Printable Online Help 11

Overview and key specifications

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.8: Differential Intra-Pair Skew Test - T

SKEW_DF

This test confirms that the timing skew in the differential signal pair is below the specified limits.

■

3.1.1.12: MHL Data Eye Diagram Test

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

These tests are supported for CTS Version 2.0:

Clock tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - Normal Mode

This test confirms that the MHL clock duty cycle does not exceed the limits allowed by the specification in Normal Mode.

■

3.1.1.11: MHL Clock Jitter Test - Normal Mode

This test confirms that the MHL Clock output does not contain excessive jitter greater than the limit allowed by the specification in Normal Mode.

■

3.1.1.14: MHL Clock Duty Cycle Test - Packed Pixel Mode

12 MHL Printable Online Help

Overview and key specifications

This test confirms that the MHL clock duty cycle in packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.15: MHL Clock Jitter Test - Packed Pixel Mode

This test confirms that the MHL Clock output does not contain excessive jitter larger than the limit allowed by the specification in Packed Pixel Mode.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.8: Differential Intra-Pair Skew Test - T

SKEW_DF

This test confirms that the timing skew in the differential signal pair is below the specified limits.

■

3.1.1.12: MHL Data Eye Diagram Test - Normal Mode

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification in Normal Mode.

■

3.1.1.16: MHL Data Eye Diagram Test - Packed Pixel Mode

This test confirms that the MHL Data output has signal quality that meets the eye opening required by the specification in Packed Pixel Mode.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

These tests are supported for CTS Version 1.3/2.1:Clock Tests

■

3.1.1.1: Standby (Off) Output Voltage Test - V

OFF

MHL Printable Online Help 13

Overview and key specifications

This test measures that the MHL source output voltage is within the specified level limits when the source device is in Standby State or power off mode as specified in the CDF.

■

3.1.1.5: Common-mode Output Swing Voltage Test - V

CMSWING

This test confirms that common-mode output voltage swing amplitude is within the specified limits when the DUT operates in normal mode.

■

3.1.1.7: Common-mode Rise and Fall Times Test - T

R_CM

, T

F_CM

This test confirms that the rise time and fall time of the common-mode output signal are within the specified limits.

■

3.1.1.10: MHL Clock Duty Cycle Test - Normal Mode

This test confirms that the MHL clock duty cycle does not exceed the limits allowed by the specification in Normal Mode.

■

3.1.1.14: MHL Clock Duty Cycle Test - Packed Pixel Mode

This test confirms that the MHL clock duty cycle in packed pixel mode does not exceed the limits allowed by the specification.

■

3.1.1.17: TP2 Clock Jitter Test - Normal Mode

This test confirms that the TP2 Clock output does not contain excessive jitter larger than the limit allowed by the specification in Normal Mode.

■

3.1.1.19: TP2 Clock Jitter Test - Packed Pixel Mode

This test confirms that the TP2 Clock output does not contain excessive jitter larger than the limit allowed by the specification in Packed Pixel Mode.

Data tests

■

3.1.1.2: Single-ended High Level Voltage Test - V

SE_HIGH

This test confirms that the single-ended high output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.3: Single-ended Low Level Voltage Test - V

SE_LOW

This test confirms that the single-ended low output voltage level is within the specified limits when the DUT is in normal mode.

■

3.1.1.4: Differential Output Swing Voltage Test - V

DF_SWING

This test confirms that the differential output voltage swing amplitude is within the specified limits when the DUT is in normal mode.

■

3.1.1.6: Differential Rise and Fall Times Test - T

R_DF

, T

F_DF

This test confirms that the rise and fall times of the differential output signal are equal to or larger than the minimum limit.

■

3.1.1.18: TP2 Data Eye Diagram Test - Normal Mode

This test confirms that the TP2 Data output has signal quality that meets the eye opening required by the specification in Normal Mode.

■

3.1.1.20: TP2 Data Eye Diagram Test - Packed Pixel Mode

14 MHL Printable Online Help

Overview and key specifications

This test confirms that the TP2 Data output has signal quality that meets the eye opening required by the specification in Packed Pixel Mode.

NOTE.

movement procedure.

TekExpress MHL solution supports only Horizontal movement of mask.

Supported tests: MHL Receiver

TekExpress MHL Receiver supports the following automated Sink and Dongle tests.

These tests are supported for CTS version 1.0:

MHL Sink tests

■

4.1.1.1: Input Signal DC Voltage Level Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level allowed by the specification.

■

4.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level and swing voltage allowed by the specification.

■

4.1.1.3: Intra Pair Skew Tolerance Test

This test confirms that the Sink device can tolerate the maximum intra-pair skew allowed by the specification.

■

4.1.1.4: Jitter Tolerance Test

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification.

MHL Dongle tests

■

5.1.1.1: Input Signal Single-Ended Voltage Level Tolerance Test

This test confirms that the Dongle device supports input signal single-ended voltage level allowed by the specification.

■

5.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Dongle device supports input signal minimum and maximum swing voltages allowed by the specification.

■

5.1.1.3: Intra-Pair Skew Tolerance Test

MHL Printable Online Help 15

Overview and key specifications

This test confirms that the Dongle device can tolerate the maximum intra-pair skew allowed by the specification.

■

5.1.1.4: Jitter Tolerance Test

This test confirms that the Dongle device can tolerate the maximum clock and data jitter amounts allowed by the specification.

These tests are supported for CTS version 2.0 and version 1.3/2.1:

MHL Sink tests

■

4.1.1.1: Input Signal DC Voltage Level Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level allowed by the specification.

■

4.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Sink device supports input signal DC voltage level and swing voltage allowed by the specification.

■

4.1.1.3: Intra Pair Skew Tolerance Test

This test confirms that the Sink device can tolerate the maximum intra-pair skew allowed by the specification.

■

4.1.1.4: Jitter Tolerance Test in Normal Mode

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification in Normal Mode with cable emulator.

■

4.1.1.8: Jitter Tolerance Test – Packed Pixel Mode

This test confirms that the Sink device can tolerate the maximum clock and data jitter amounts allowed by the specification in Packed Pixel Mode.

MHL Dongle tests

■

5.1.1.1: Input Signal Single-Ended Voltage Level Tolerance Test

This test confirms that the Dongle device supports input signal single-ended voltage level allowed by the specification.

■

5.1.1.2: Input Signal Minimum and Maximum Swing Voltages Tolerance Test

This test confirms that the Dongle device supports input signal minimum and maximum swing voltages allowed by the specification.

■

5.1.1.3: Intra-Pair Skew Tolerance Test

This test confirms that the Dongle device can tolerate the maximum intra-pair skew allowed by the specification.

■

5.1.1.4: Jitter Tolerance Test – Normal Mode

16 MHL Printable Online Help

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Tektronix TekExpress MHL Help User manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

Getting help and support

Technical support

Overview and key specifications

Overview and key specifications

Supported tests: MHL 3.0 Transmitter

Supported tests: MHL 3.0 Receiver

Supported tests: MHL Transmitter

Supported tests: MHL Receiver