List of Figures................................................................................................................................................................................9
List of Tables............................................................................................................................................................................... 12
Getting help and support.............................................................................................................................................................14
Related documentation........................................................................................................................................................ 14
Minimum system requirements............................................................................................................................................ 16
Instruments and accessories required................................................................................................................................. 16
Installing the software.......................................................................................................................................................... 17
File name extensions........................................................................................................................................................... 18
Launch the application......................................................................................................................................................... 20
Global application controls...................................................................................................................................................22
Options menu overview................................................................................................................................................ 23
TekExpress instrument control settings........................................................................................................................ 24
Set DUT parameters.....................................................................................................................................................28
Set acquisition tab parameters..................................................................................................................................... 30
Set configuration tab parameters..................................................................................................................................32
Set preferences tab parameters................................................................................................................................... 56
Status panel......................................................................................................................................................................... 57
Status panel overview...................................................................................................................................................57
View a report.................................................................................................................................................................63
Compensate the signal path......................................................................................................................................... 97
View test results...................................................................................................................................................................98
Saving and recalling test setup................................................................................................................................................... 99
Test setup files overview...................................................................................................................................................... 99
Save a test setup................................................................................................................................................................. 99
Open (load) a saved test setup............................................................................................................................................99
Create a test setup from default settings............................................................................................................................. 99
Create a test setup using an existing one..........................................................................................................................100
About SCPI command....................................................................................................................................................... 101
Socket configuration for SCPI commands......................................................................................................................... 101
1000BASE-T and 1000BASE-T-Multi Pair.........................................................................................................................129
1000BASE-T CM voltage............................................................................................................................................132
100BASE-T signal amplitude symmetry..................................................................................................................... 133
100BASE-T rise and fall time......................................................................................................................................133
10BASE-T MAU Ext....................................................................................................................................................134
10BASE-T MAU Int.....................................................................................................................................................134
10BASE-T link pulse...................................................................................................................................................135
10BASE-T CM Voltage............................................................................................................................................... 136
Figure 6: Connection diagram for SHORT Calibration ...............................................................................................................41
Figure 7: Configuration Panel to select Signal Source and to perform Return Loss Calibration ................................................42
Figure 8: Calibration panel before performing calibration .......................................................................................................... 43
Figure 9: Calibration panel after calibration is performed for OPEN, SHORT, and LOAD and then Apply ................................ 43
Figure 10: Connection diagram for SHORT Calibration .............................................................................................................44
Figure 11: Calibration output for SHORT calibration .................................................................................................................. 44
Figure 12: Connection diagram for OPEN Calibration ............................................................................................................... 45
Figure 13: Calibration output for OPEN calibration .................................................................................................................... 45
Figure 14: Calibration output for LOAD calibration .................................................................................................................... 46
Figure 15: Calibration output for LOAD calibration .................................................................................................................... 46
Figure 16: Return Loss Signal Source selection, with Do not use configuration.........................................................................47
Figure 17: AWG with Return Loss waveform loaded.................................................................................................................. 47
Figure 18: AFG with Return Loss waveforms loaded..................................................................................................................48
Figure 20: Configuration Panel for selecting Signal Source and to perform JigMatch Calibration..............................................50
Figure 21: Connection diagram to measure Disturbing Signal using JigMatch ..........................................................................51
Figure 22: Disturber Compensation in JigMatch......................................................................................................................... 51
Figure 23: Connection diagram to measure linearities of Test Fixture using JigMatch .............................................................. 52
Figure 24: Test Fixture Compensation in JigMatch..................................................................................................................... 52
Figure 25: Connection diagram to measure linearities of the Test Fixture using JigMatch ........................................................ 53
Figure 26: Test Fixture Compensation in JigMatch..................................................................................................................... 53
Figure 27: JigMatch Signal Source selection, with "Do not use" configuration........................................................................... 54
Figure 28: AWG with Test Mode 1 waveform loaded.................................................................................................................. 54
Figure 29: AWG with Test Mode 4 waveform loaded.................................................................................................................. 55
Figure 30: AFG with Test Mode 1 waveform loaded................................................................................................................... 55
Figure 31: AFG with Test Mode 4 waveform loaded................................................................................................................... 56
Figure 32: Test status view..........................................................................................................................................................57
Figure 34: 1000BASE-T Template, Peak Volt, and Droop (Without Disturber) .......................................................................... 65
Figure 35: 1000BASE-T Template, Peak Volt, and Droop (With Disturber) ............................................................................... 66
Figure 36: Distortion with Disturber with Clock .......................................................................................................................... 67
Figure 37: Distortion with Disturber without Clock ..................................................................................................................... 68
Figure 38: Distortion without Disturber with Clock ..................................................................................................................... 69
Figure 39: Distortion without Disturber without Clock ................................................................................................................ 70
Figure 40: Master and Slave Jitter without Clock .......................................................................................................................71
Figure 46: Slave Unfiltered Jitter with Clock .............................................................................................................................. 77
Figure 47: 1000BASE-T CM Voltage ......................................................................................................................................... 78
Figure 48: 1000BASE-T Transmitter Return Loss ......................................................................................................................79
Figure 49: 1000BASE-T Receiver Return Loss ......................................................................................................................... 80
Figure 50: 1000BASE-T-Multi Pair Template, Peak Volt, and Droop (Without Disturber)........................................................... 81
Figure 51: 1000BASE-T-Multi Pair Template, Peak Volt, and Droop (With Disturber)................................................................ 81
Figure 52: Distortion with Disturber with Clock........................................................................................................................... 82
Figure 53: Distortion with Disturber without Clock...................................................................................................................... 83
Figure 54: Distortion without Disturber with Clock...................................................................................................................... 84
Figure 55: Distortion without Disturber without Clock................................................................................................................. 84
Figure 56: Master and Slave Jitter without Clock........................................................................................................................85
Figure 62: Slave Unfiltered Jitter with Clock............................................................................................................................... 88
Figure 63: 1000BASE-T-Multi Pair CM Voltage.......................................................................................................................... 89
Figure 64: 1000BASE-T-Multi Pair Transmitter Return Loss ......................................................................................................90
Figure 65: 100BASE-T connection diagram for all tests except Return Loss ............................................................................ 91
Figure 66: 100BASE-T Transmitter Return Loss ........................................................................................................................92
Figure 67: 100BASE-T Receiver Return Loss ........................................................................................................................... 93
10
List of Figures
Figure 68: 10BASE-T MAU, Jitter, TP_IDL Load With TPM, Link Pulse Timing With TPM, and Link Pulse Load With TPM .... 94
Figure 69: 10BASE-T TP_IDL Load Without TPM, Jitter, Link Pulse Load Without TPM, Harmonic, and Link Pulse Timing
Without TPM , and Differential Voltage ........................................................................................................................95
Figure 70: 10BASE-T Transmitter Return Loss ..........................................................................................................................96
Figure 71: 10BASE-T Receiver Return Loss ............................................................................................................................. 97
Table 2: System requirements.....................................................................................................................................................16
Table 3: Instruments and accessories required for Ethernet application.....................................................................................16
Table 4: Application directories and usage..................................................................................................................................18
Table 11: Return Loss test method configuration and bandwidth limiting....................................................................................35
Table 12: Measurements configuration for Analyze 1000BASE-T and 1000BASE-T-Multi Pair ................................................ 35
Table 13: Measurements configuration for Analyze 100BASE-T ............................................................................................... 36
Table 14: Measurements configuration for Analyze 10BASE-T ................................................................................................. 37
Table 15: Measurements configuration for Acquire 1000BASE-T ..............................................................................................38
Table 16: Measurements configuration for Acquire 100BASE-T.................................................................................................39
Table 17: Measurements configuration for Acquire for 10BASE-T .............................................................................................40
Table 21: Parameter Name and Value for DUT tab ..................................................................................................................115
Table 22: Parameter Name and Value for Test Selection tab ...................................................................................................116
Table 23: Parameter Name and Value of Acquisitions ............................................................................................................. 119
Table 24: Parameter Name and Value for Preferences tab ......................................................................................................119
Table 25: Parameter Name and Value for Acquire (1000BASE-T)............................................................................................119
Table 26: Parameter Name and Value for Acquire (100BASE-T)..............................................................................................120
Table 27: Parameter Name and Value for Acquire (10BASE-T)................................................................................................121
Table 28: Parameter Name and Value for Analyze (1000BASE-T)...........................................................................................123
Table 29: Parameter Name and Value for Analyze (100BASE-T).............................................................................................124
Table 30: Parameter Name and Value for Analyze (10BASE-T)...............................................................................................124
Table 31: Parameter Name and Value for General .................................................................................................................. 126
12
Welcome
Welcome
Welcome to the TekExpress® Ethernet Electrical Testing software application. The application provides more visibility into your Ethernet
designs with 1000BASE-T/100BASE-TX/10BASE-T PHY measurements as outlined in IEEE 802.3 Section 40, ANSI X3.263, and IEEE
802.3 Section 14 specific measurements for different Ethernet standards to the already existing rich tool set of generic jitter, timing, and
signal quality measurements in the 5/6/6B Series MSO oscilloscope.
Key features of TekExpress Ethernet include:
•Solution offers most comprehensive Ethernet PHY test coverage supporting multiple speeds.
•Highly optimized, intuitive user interface flow that sets up the test configuration for easy ethernet electrical validation.
•Compliance and margin testing for accurate analysis and improved interoperability.
•Time-domain and frequency-domain measurements made with single analysis instrument.
•Jitter and timing measurements with and without filters.
•Amplitude and droop testing for transmitter performance.
•User-defined mode enables flexible parameter control for characterization and margin analysis.
•Detailed test reports with margin and statistical information and analysis.
•Ability to modify limits of test parameters in TekExpress for debug and characterization.
•Ability to easily configure multiple test runs.
•Ability to preview test mode waveform prior to running the tests.
•Additional Peak Distortion Vs Phase Offset and Error Values Vs Symbol Number plots for 1000BASE-T distortion test.
•Plot panel is available to view the plot for Return Loss measurement.
•Ability to test multiple pairs together for 1000BASE-T.
•Ability to import VNA results and generate report using TekExpress Application.
•The term "Application" and "Software" refers to the TekExpress Ethernet Electrical Testing Application.
•The term “DUT” is an abbreviation for Device Under Test.
•The term “select” is a generic term that applies to the different methods of choosing a screen item (button, control, list item): using a
mouse or using the touch screen.
IconMeaning
This icon identifies important information.
This icon identifies conditions or practices that could result in loss of
data.
This icon identifies additional information that will help you use the
application more efficiently.
Related documentation
The following documentation is available as part of the TekExpress® Ethernet Electrical Testing Application.
Table 1: Product Information
ItemPurposeLocation
Help
PDF of helpPrintable version of the compiled help
Application operation and User Interface
help
PDF file that ships with TekExpress Ethernet
solution (TekExpress-Ethernet-SolutionSoftware-Printable-Help-EN-US.pdf).
14
You can download the PDF version of the
manual from the Tektronix website.
Part number: 077-1635-02
www.tek.com/en
Getting help and support
Technical support
Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on
your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site, www.tek.com
When you contact Tektronix Technical Support, please include the following information (be as specific as possible):
General Information
•All instrument model numbers
•Hardware options, if any
•Probes used
•Your name, company, mailing address, phone number, and FAX number
•Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.
Application Specific Information
•Software version number
•Description of the problem such that technical support can duplicate the problem
•If possible, save the setup files for all the instruments used and the application.
•If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file.
•If possible, save the waveform on which you are performing the measurement as a .wfm file.
ICPContains instrument and TekExpress Ethernet application-specific interface libraries
ImagesContains images of the TekExpress Ethernet application
LibContains utility files specific to the TekExpress Ethernet application
MiscellaneousContains log files
Report GeneratorContains style sheets for report generation
ToolsContains instrument and TekExpress Ethernet application-specific files
See also
View test-related files
File name extensions
File name extensions
The TekExpress Ethernet application uses the following file name extensions:
18
File name extensionDescription
.TekXApplication session files (the extensions may not be displayed)
.pyPython sequence files
.xmlTest-specific configuration information (encrypted) files
Application log files
.csvTest result reports
Plot data
.mhtTest result reports (default)
Test reports can also be saved in HTML format
.pdfTest result reports
Application help documents
.xsltStyle sheet used to generate reports
Getting started
See also
View test-related files
Application directories
View software version
Use the following instructions to view version information for the application and for the application modules such as the Programmatic
Interface and the Programmatic Interface Client.
To view version information for Ethernet, click button in the TekExpress application and select About TekExpress.
This example shows a typical Version Details dialog box, and may not reflect the actual values as shown when you open
To launch the TekExpress Ethernet solution, select Applications > TekExpress Ethernet from the TekScope menu.
When you launch the application for the first time, the file C:\Users\<username>\My Documents\MyTekExpress\Ethernet\Resources.xml is mapped to drive X:. This file contains information about available networkconnected instruments. The session files are stored in X:\Ethernet\. If this file is not found, then the application runs Instrument
Discovery Program to detect the network-connected instruments before launching Ethernet solution.
If the application is behind the oscilloscope application, click Applications > TekExpress Ethernet to bring it to the front. To keep the
Ethernet application window on top, select Keep On Top from the Ethernet Options menu .
After installing the application, wait until the instruments gets discovered in the TEKVISA before launching the application.
Note:
See also
Application controls
Application panel overview
Application panels overview
TekExpress Ethernet solution uses panels to group Configuration, Results, and Reports settings. Click any button to open the associated
panel. A panel may have one or more tabs that list the selections available in that panel. Controls in a tab can change depending on
settings made in the same tab or another tab.
20
Operating basics
Table 5: Application panels overview
Panel NamePurpose
Setup panelThe Setup panel shows the test setup controls. Click the Setup button to open this panel.
Use this panel to:
•Set DUT tab parameters
•Select tests
•Set acquisition tab parameters
•Set configuration tab parameters
•Set preferences tab parameters
Status panelView the progress and analysis status of the selected tests, and view test logs.
Results panelView the summary of test results and select result viewing preferences.
Plots panelView the plot for Return Loss measurement. Plot is displayed as a two dimensional plot for additional
measurement analysis.
Reports panelBrowse for reports, save reports as specific file types, specify report naming conventions, select report
content to include (summary information, detailed information, user comments, setup configuration,
application configuration), and select report viewing options.
Options menuTo select global application controls.
Test Panel buttonsControls that open tabs for configuring test settings and options.
Start / Stop buttonUse the Start button to start the test run of the measurements in the selected order. If prior acquired
measurements are not cleared, then new measurements are added to the existing set.
The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.
Pause / Continue buttonUse the Pause button to pause the acquisition. When a test is paused, this button toggles to Continue.
Clear buttonUse the Clear button to clear all existing measurement results. Adding or deleting a measurement, or
changing a configuration parameter of an existing measurement, also clears measurements. This is
to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This
button is available only on Results panel.
Application window move iconPlace the cursor over the three-dot pattern in the upper left corner of the application window. When the
cursor changes to a hand, drag the window to the desired location.
Table continued…
22
ItemDescription
Minimize iconClick to minimize the application.
Close iconClick to close the application.
Mini view / Normal viewToggles the application between mini view and normal view.
Mini view displays the run messages with the time stamp, progress bar, Start / Stop button, and
Pause / Continue button.
The application moves to mini view when you click the Start button.
Operating basics
See also
Application panel overview
Options menu overview
To access Options menu, click in the upper-right corner of the application.
Default Test SetupOpens an untitled test setup with defaults selected.
Acquire Live Waveforms.
Data rate: 1000BASE-T.
Open Test SetupOpens a saved test setup.
Save Test SetupSaves the current test setup.
Save Test Setup AsSaves the current test setup with a different file name or file type.
Open RecentDisplays the recently opened test setups to open.
Instrument Control Settings
Keep On TopKeeps the TekExpress Ethernet application on top of all applications.
Email Settings
HelpDisplays the TekExpress Ethernet help.
About TekExpress•Displays application details such as software name, version number, and copyright.
Detects, lists, and refreshes the connected instruments found on specified connections (LAN, GPIB,
USB, and so on).
Use to configure email options for test run and result notification.
•Provides a link to the end-user license agreement.
•Provides a link to the Tektronix Web site.
See also
Application controls
TekExpress instrument control settings
Use TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You can use
the Search Criteria to search the connected instruments depending on the connection type. The details of the connected instrument is
displayed in the Retrieved Instruments window.
You can access this dialog box from the Options menu.
24
The connected instruments displayed here can be selected for use under Global Settings in the test configuration section.
Note: Select GPIB (Default) when using TekExpress Ethernet application.
Operating basics
See also
Options menu overview
View connected instruments
Use TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The application
uses TekVISA to discover the connected instruments.
The instruments required for the test setup must be connected and it must be recognized by the application before running
Note:
the test.
To refresh the list of connected instruments:
1. From the Options menu, select Instrument Control Settings.
2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to search.
Instrument search is based on the VISA layer, but different connections determine the resource type, such as LAN, GPIB, and USB.
For example, if you choose LAN, the search will include all the instruments supported by TekExpress that are communicating over the
LAN.
3. Click Refresh. TekExpress searches for connected instruments.
4. After searching, the dialog box lists the instrument-related details based on the search criteria. For example, For the Search Criteria as
LAN and GPIB, the application displays all LAN and GPIB instruments connected to the application.
The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the
Last Updated field.
See also
1000BASE-T-Multi Pair connection diagram
1000BASE-T connection setup
100BASE-T connection setup
10BASE-T connection setup
Configure email settings
Use the Email Settings utility to get notified by email when a measurement completes, or produces any error condition. Follow the steps to
configure email settings:
1.Select Options > Email Settings to open the Email Settings dialog box.
2.(Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate
the addresses with commas.
3.(Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name,
followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example:
user@yourcompany.com.
4.(Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location, and
the SMTP Port number, in the corresponding fields.
If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.
If any of the above required fields are left blank, the settings will not be saved and email notifications will not be sent.
Note:
5.In the Email Attachments section, select from the following options:
•Reports: Select to receive the test report with the notification email.
26
Operating basics
•Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you
want to receive the full log or just the last 20 lines.
6.In the Email Configuration section:
•Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is
5 MB.
•Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a
notification. The default is 1. You can also specify a timeout period.
7.Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email
notifications.
8.To test your email settings, click Test Email.
9.To apply your settings, click Apply.
10. Click Close when finished.
Email Settings
Setup panel
Setup panel overview
The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.
Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. The
DUT settings also affect the list of available tests in the Test Selection tab.
Click Setp > DUT to access the DUT parameters:
28
Operating basics
Table 7: DUT tab settings
SettingDescription
DUT IDAdds an optional text label for the DUT to reports. The default value is DUT001. The maximum number of
characters is 32.
You cannot use the following characters in an ID name: (.,..,...,\,/:?”<>|*)
Opens Comments dialog box to enter text to add to the report. Maximum size is 256 characters. To enable or
Comments
icon (to the right of
the DUT ID field)
disable comments appearing on the test report, see Select report options.
Acquire live
waveforms
Use pre-recorded
waveform files
Data Rate
1000BASE-TIEEE 802.3, Section 40
100BASE-TANSIX 3.263-1995
10BASE-TIEEE 802.3, Section 14
1000BASE-T Multi
Pair
Perform analysis on live waveforms.
Perform analysis on pre-recorded waveforms.
IEEE 802.3, Section 40
See also
Select tests
Select tests
Use the Test Selection tab to select the tests. The test measurements available depends on the standard selected in the DUT tab.
TestsClick on a test to select or unselect. Highlight a test to show details in the Test Description pane.
Test DescriptionShows brief description of the highlighted test in the Test field.
PreviewClick to preview the schematic and the expected waveform example for the selected test.
Click to clear all tests.
Click to select all the tests required for compliance.
Click to select all tests. All tests are selected by default.
See also
Set acquisition tab parameters
Set acquisition tab parameters
Use Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type, Suite selected,
and the tests selected.
30
Operating basics
Note: TekExpress Ethernet application acquires all waveforms needed by each test group before performing analysis.
View ProbesClick to view the detected probe configuration. Use the View Probes dialog box to enable or disable probe
signal source access in the application.
If probe connection is changed, user has to click on Refresh button to view updated probe information.
SourceSelect the signal source for Data, Master Clock and/or Slave Clock for the measurement. Ensure that no two
sources have the same channel selected.
Same set of channels can be used for Return Loss with a Data as positive input and Master Clock as
negative input and Slave Clock for sync input.
AuxSelect to use oscilloscope's Aux channel.
Acquisition and Save
Options
•Save All Waveforms
•Delete All Waveforms
After Analysis
Show Acquire Parameters Select to view the acquisition parameters.
Connection SetupAllows to configure multiple pairs and map with channels.
TekExpress Ethernet saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder for
each session (a session is started when you click the Start button). The folder path is X:\Ethernet\UntitledSession\<dutid>\<date>_<time>. Images created for each analysis, CSV files with result values, reports, and other
information specific to that particular execution are also saved in this folder.
Saving a session moves the session file contents from the Untitled Session folder to the specified folder name, and changes the session
name to the specified name.
•Saves all the waveforms after the analysis.
•Deletes all the waveforms after the analysis.
Set configuration tab parameters
Use Configuration tab to view and configure the Global Settings and the measurement configurations. The Global Settings and the
measurements with configurations available in this tab depends on the Standards selected in the DUT tab.
Compliance ModeSelect to run test(s) in compliance mode. By default Compliance Mode is selected.
User Defined ModeSelect to run test(s) in user defined mode.
Global Settings
Instruments Detected
JigMatch Calibration
Return Loss Calibration
Displays the instruments connected to this application. Click on the instrument name to
open a list of available (detected) instruments.
Select Options > Instrument Control Settings and click Refresh to update the instrument
list.
Note: Verify that the GPIB search criteria (default setting) in the Instrument
Control Settings is selected when using TekExpress Ethernet application.
Measures the Amplitude and the Frequency of the disturbing signals. The default values
can be set. The application measures and displays the values in the Measured Value fields.
You can validate the disturbing signal by comparing the Measured Value with the Expected
Value.
Displays the schematics for Return Loss Calibration. The Transmitter and Receiver Return
Loss calibration for OPEN, SHORT, and LOAD terminations can be performed.
Bandwidth Limiting
34
Bandwidth limit can be set from the drop down for the measurements to be run. The
Effective Bandwidth will be lesser of the Oscilloscope and the probe connected.
Operating basics
Table 11: Return Loss test method configuration and bandwidth limiting
MethodDescription
Oscilloscope Based
VNA Data ImportPerform Return Loss measurement using VNA and the data is
Calibration for the given setup and Return Loss Measurement are
made using the connected signal generator and the oscilloscope.
imported here.
Table 12: Measurements configuration for Analyze 1000BASE-T and 1000BASE-T-Multi Pair
Figure 14: Calibration output for LOAD calibration
The following figure shows a typical waveform for Return Loss LOAD Calibration.
Figure 15: Calibration output for LOAD calibration
After OPEN, SHORT, and LOAD calibration, click Apply in Return Loss Calibration window which generates the Return Loss
measurements pre-requisite data by using calibration values.
Clicking Apply will not apply any setting on the oscilloscope nor does any acquisition.
Note:
Note: If you change any of the following configurations, calibration for Open, Short, and Load must be performed again before
running the return loss measurement:
•Channels and Trigger Sync input
•Signal Source selected
46
Operating basics
•Return Loss type (Transmitter or Receiver)
Method to set up the Signal Source for Do not use configuration:
In Configuration Panel if the Signal source is selected as For Return Loss test: AWG/AFG is Do not use, then the waveform need to be
manually loaded in the Signal Source before running the Calibration or Return Loss measurement.
Figure 16: Return Loss Signal Source selection, with Do not use configuration
Method for loading the waveform on the supported AWG:
•Copy the waveform available at Oscilloscope at C:\Program Files\Tektronix\TekExpress\TekExpress Ethernet\AWGWaveforms\10BaseT Return Loss\AWG Format\RL10_AWG.wfm, to the AWG using LAN or USB.
Example mentioned above is for 10BaseT, select the folder accordingly for 1000BaseT or 100BaseT. The above path is applicable for
all supported AWG models.
•Open the waveform for the corresponding speed and AWG series from Open File option, and when prompted, select option Max &Preserve Offset settings.
•Set Amplitude to 1.5 Vpp. (Maximum supported Amplitude)
•Click Setup > Clock > set the Sample Rate to 250 MS/s.
•Click Setup > Channel > set the Resolution(bits) to (15 + 1 Mkr).
•Switch ON the channel and click Play.
Figure 17: AWG with Return Loss waveform loaded
Method for loading the waveforms on the supported AFG:
For AFG3000 series:
1. Copy the waveform available at Oscilloscope at C:\Program Files\Tektronix\TekExpress\TekExpress Ethernet\AWG
Waveforms\10BaseT Return Loss\AFG Format\RL10_AFG.tfw, to AFG using USB. Example mentioned above is for 10BaseT, select
the folder accordingly for 1000BaseT or 100BaseT. The above path is applicable for all supported AFG 3000 series models.
2. Click Arb > Arb Waveform menu > USB > select the waveforms (.tfw) on both the channels.
3. Set the Frequency to 6.052682549 kHz for 100BaseT and 1000BaseT and 6.097560976 kHz for 10BaseT, for both the channels.
4. Set the Amplitude to 2.0 Vpp, for both the channels.
5. Invert the waveforms on channel 2.
6. Switch ON both the channels.
Figure 18: AFG with Return Loss waveforms loaded
For AFG31000 series:
1.Copy the waveform available at Oscilloscope at C:\Program Files\Tektronix\TekExpress\TekExpress Ethernet\AWG
Waveforms\10BaseT Return Loss\AFG Format\RL10_AFG.tfw, to AFG using USB. Example mentioned above is for 10BaseT,
select the folder accordingly for 1000BaseT or 100BaseT. The above path is applicable for all the supported AFG models.
2.Click Home > ArbBuilder > Open > USB, select corresponding folder and file (.tfw) and click OK.
3.Click Save As and save the waveform on the Memory (.tfwx). Click OK.
4.Click Home > Basic > select Arb from drop down menu for the channel 1.
5.From Shape > File > USB > select the waveform file for the corresponding speeds from Memory(.tfwx).
6.Repeat steps 4 and 5 for channel 2.
7.Set the Frequency to 6.052682549 kHz for 100BaseT and 1000BaseT and 6.097560976 kHz for 10BaseT, for both the channels.
8.Set the Amplitude to 2.0 Vpp, for both the channels.
9.Invert the waveforms on channel 2.
10. Switch ON both the channels.
JigMatch calibration steps
You can measure the Amplitude and Frequency of the disturbing signal and set the default values. The application measures and displays
the values in the Measured Value fields. You can validate the disturbing signal by comparing the measured value with the expected value.
a. Make the connections as shown in the following figure.
Figure 23: Connection diagram to measure linearities of Test Fixture using JigMatch
2. For Template, Droop, and Peak Voltage tests, set the DUT to generate Test Mode 1 signal. For Distortion test, set the DUT to generate
Test Mode 4 signal.
3. Connect the Ethernet cable to J490 and the test port of the DUT.
4. In the JigMatch dialog box >Test Fixture Compensation group box, selectMeasure.
Figure 24: Test Fixture Compensation in JigMatch
To compensate the linearities of Test Fixture (TC5) using JigMatch, follow the steps given below:
Test Fixture Compensation, Step 2:
1. Use TC5 of the test fixture.
2. Make the connections as shown in the following figure.
52
Operating basics
Figure 25: Connection diagram to measure linearities of the Test Fixture using JigMatch
3. For Template, Droop, and Peak Voltage tests, set the DUT to generate Test Mode 1 signal. For Distortion test, set the DUT to generate
Test Mode 4 signal.
4. Connect the Ethernet cable to J700 and test port of the DUT.
5. Switch OFF the Arbitrary Waveform Generator/Arbitrary Function Generator.
Short the jumpers J621, J630, J623, J721, J723, J680, and J781.
Note:
6. Connect the differential probe to P18 and configured channel of the oscilloscope.
7. In the Jig Match dialog box >under step 2 of Test Fixture Compensation group box, select Measure.
Figure 26: Test Fixture Compensation in JigMatch
Method to set up the Signal Source for Do not use configuration:
In Configuration Panel if the Signal source is selected as For JigMatch test: AWG/AFG/Scope AFG is Do not use, then the waveform need
to be manually loaded in the Signal Source before running the JigMatch Calibration.
Use Preferences tab to set the application action on completion of a measurement.
Table 18: Preferences tab settings
SettingDescription
Number of Runs
Acquire/Analyze each test <no>
times (not applicable to Custom
Tests)
Table continued…
56
Select to repeat the test run by setting the number of times. By default, it is selected with 1 run.
SettingDescription
Actions on Test Measurement Failure
Operating basics
On Test Failure, stop and notify
me of the failure
Pop-up Settings
Auto close Warnings and
Informations during Sequencing
Auto close after <no> Seconds
Auto close Error Messages
during Sequencing. Show in
Reports
Auto close after <no> Seconds
Select to stop the test run on Test Failure, and to get notified via email. By default, it is unselected.
Click Email Settings to configure.
Select to auto close warnings/informations during sequencing. Set the Auto close time. By default it is
unselected.
Select to auto close Error Messages during Sequencing. Set the Auto close time. By default it is
unselected.
Status panel
Status panel overview
The Status panel accesses the Test Status and Log View tabs, which provide status on test acquisition and analysis (Test Status) and a
listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start a test run. You can select the Test
Status or the Log View tab to view these items while tests are running.
Message HistoryLists all executed test operations and timestamp information.
Auto ScrollEnables automatic scrolling of the log view as information is added to the log during the test.
Clear LogClears all messages from the log view.
SaveSaves the log file to a text file. Use the standard Save File window to navigate to and specify the folder and file name
to which to save the log text.
See also
Application panel overview
Results panel
Results panel overview
When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.
58
Operating basics
See also
View a report
Application panel overview
View test-related files
Files related to tests are stored in My TekExpress\Ethernet\ . Each test setup in this folder has both a test setup file and a test
setup folder, both with the test setup name.
The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.
Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.
Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session
using the naming convention (date)_(time). Each session file is stored outside its matching session folder:
Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran
tests using prerecorded waveform files, these are included here.
The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\MyTekExpress\Ethernet\. When you name and save the session, the files are placed in a folder with the name that you specify. A
copy of the test files stay in the Untitled Session folder until you run a new test or until you close the Ethernet application.
See also
File name extensions
Plots panel
Plots panel overview
The Plots panel displays the result as a two-dimensional plot for additional measurement analysis. The plots are displayed only for Return
Loss measurements.
Toolbar functions in plot windows
The Plot Toolbar window includes the following functions:
IconFunctions
Saves the plot.
Save
Expands the selected plot area. Left-click and drag the mouse to mark the region on the plot to zoom.
Select & Zoom
Expands part of the plot (Horizontal and Vertical); the data appears in more detail.
Zoom In
Contracts part of the plot (Horizontal and Vertical); the data appears in less detail.
Zoom Out
Table continued…
60
IconFunctions
Moves the plot anywhere within the scale.
Pan
Hides the gridlines.
Hide Gridlines
Resets the zoom to 100%.
Reset
Sets the plot color. Click and select the color in the Color window and click OK. Click in the plot area to
Choose Waveform Colors
Show/Hide Markers
UnDock/Dock
Select TestSelect the measurement.
apply the color.
Displays or hides the markers
Click to undock/dock the plot window.
Operating basics
Reports panel
Reports panel overview
Use Reports panel to browse for reports, name and save reports, select test content to include in reports, and select report viewing
options.
For information on setting up reports, see Select report options. For information on viewing reports, see View a report.
Click Reports panel and use the Reports panel controls to select which test result information to include in the report, and the naming
conventions to use for the report. For example, always give the report a unique name or select to have the same name increment each
time you run a particular test.
Select report options before running a test or when creating and saving test setups. Report settings are included in saved test setups.
In the Reports panel, select from the following report options:
Table 20: Report options
SettingDescription
Report Update Mode
Generate new reportCreates a new report. The report can be in either .mht or .pdf file formats.
Append with previous run sessionAppends the latest test results to the end of the current test results report.
Include header in appended reports
Replace current test in previous run session Replaces the previous test results with the latest test results. Results from newly added
Report Creation Settings
Report nameDisplays the name and location from which to open an Ethernet report. The default location
Select to include header in the appended reports.
tests are appended to the end of the report.
is at \My TekExpress\Ethernet\Untitled Session. The report file in this folder gets overwritten
each time you run a test unless you specify a unique name or select to auto increment the
report name.
Do one of the following:
•In the Report Path field, type over the current folder path and name.
•Double-click in the Report Path field and then make selections from the pop-up
keyboard and click the Enter button.
Be sure to include the entire folder path, the file name, and the file extension.
For example: C:\Documents and Settings\your user name\My Documents\My
TekExpress\Ethernet\DUT001.mht.
Note: You cannot set the file location using the Browse button.
Open an existing report.
Table continued…
62
Click Browse, locate and select the report file and then click View at the bottom of the
panel.
Operating basics
SettingDescription
Save as typeSaves a report in the specified file type, selected from the drop-down list.
Note: If you select a file type different from the default, be sure to change the
report file name extension in the Report Name field to match.
Auto increment report name if duplicateSets the application to automatically increment the name of the report file if the application
finds a file with the same name as the one being generated. For example: DUT001,
DUT002, DUT003. This option is enabled by default.
Create report automatically at the end of the
run
Contents To Save
Include pass/fail info in details tableIncludes pass/fail info in the details table of the report.
Include detailed resultsIncludes detailed results in the report.
Include plot imagesIncludes plot images in the report.
Include setup configurationSets the application to include hardware and software information in the summary box
Margin value in percentageSelect to include the margin value in percentage in the report.
Include user commentsSelect to include any comments about the test that you or another user added in the DUT
View report after generatingAutomatically opens the report in a Web browser when the test completes. This option is
Creates report at the end of the run.
at the top of the report. Information includes: the oscilloscope model and serial number,
the oscilloscope firmware version, and software versions for applications used in the
measurements.
tab of the Setup panel. Comments appear in the Comments section, under the summary
box at the beginning of each report.
selected by default.
ViewClick to view the most current report.
Generate ReportGenerates a new report based on the current analysis results.
Save AsSpecify a name for the report.
View a report
The application automatically generates a report when test execution is complete and displays the report in your default Web browser
(unless you cleared the View Report After Generating check box in the Reports panel before running the test). If you cleared this check
box, or to view a different test report, do the following:
1. Click the Reports button.
2. Click the Browse button and locate and select the report file to view.
For information on changing the file type, file name, and other report options, see Select report options.
Report contents
A report shows detailed results and plots, as set in the Reports panel.
Setup configuration information
The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and
serial number, optical module model and serial number, and software version numbers of all associated applications.
To exclude this information from a report, clear the Include Setup Configuration check box in the Reports panel before running the test.
User comments
If you selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.
See also
Results panel overview
View test-related files
64
Running tests
1000BASE-T connection diagram
Click Setup > Test Selection > Preview to view the equipment setup diagram(s).
Running tests
Figure 34: 1000BASE-T Template, Peak Volt, and Droop (Without Disturber)
Figure 68: 10BASE-T MAU, Jitter, TP_IDL Load With TPM, Link Pulse Timing With TPM, and Link Pulse Load With TPM
94
Running tests
Figure 69: 10BASE-T TP_IDL Load Without TPM, Jitter, Link Pulse Load Without TPM, Harmonic, and Link Pulse Timing Without TPM , and Differential Voltage
Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has
changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a
week. Failure to do so may result in the instrument not meeting warranted performance levels.
1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.
2. Disconnect any probes you have connected to the input channels.
3. Set the instrument to Menu mode.
4. Select Instrument Calibration from the Utilities menu.
5. Note any instructions that appear in the resulting control window.
6. Click Run SPC to begin the procedure. The procedure may take several minutes to complete.
7. Verify that the Status changes to Pass after the procedure is complete. If the Calibration Status field indicates anything other than
Compensated, see Signal Path Compensation Status for information on the readout and recommended action.
Note: When making measurements at vertical scale settings less than or equal to 5 mV, you should perform the signal path
compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at
those volts/div settings.
Running tests
Select tests, set acquisition parameters, set configuration parameters, set preferences parameters, and click Start to run the tests. While
tests are running, you cannot access the Setup or Reports panels. To monitor the test progress, switch between the Status panel and the
Results panel.
While the tests are running, other applications may display windows in the background. The TekScope application takes precedence
over other applications, but you can switch to other applications by using Alt + Tab key combination. To keep the TekExpress Ethernet
application on top, select Keep On Top from the TekExpress Options menu.
The application displays report when the tests execution is complete.
Prerun checklist
1. Make sure that the instruments are warmed up (approximately 20 minutes) and stabilized.
2. Perform compensation: In the oscilloscope main menu, select Utilities > Instrument Compensation. Click Help in the compensation
window for steps to perform instrument compensation.
View test results
When a test completes, the application switches to the Results panel, which shows a summary of test results.
Each test result occupies a row in the Results table. By default, results are displayed in summary format, with the measurement details
collapsed. You can change the view in the following ways:
•To view the results grouped by pair or test, select the corresponding item from the Preferences menu.
•To expand all tests listed, select View Results Details from the Preferences menu.
•To expand and collapse tests, use the plus and minus buttons to the left of the test rows.
•To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.
•To expand the width of a column, place the cursor over the vertical line that separates the column from the one to the right. When the
cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.
•To sort the test information by column, click the column head. When sorted in ascending order, a small up arrow is displayed. When
sorted in descending order, a small down arrow is displayed.
•To clear all test results displayed, click Clear ( ).
See Also
View a report
98
Saving and recalling test setup
Saving and recalling test setup
Test setup files overview
Saved test setup information (such as the selected oscilloscope, general parameters, acquisition parameters, measurement limits,
waveforms (if applicable), and other configuration settings) are saved under the setup name at X:\Ethernet.
Use test setups to:
•Run a new session, acquiring live waveforms, using a saved test configuration.
•Create a new test setup using an existing one.
•View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results
summary.
•Run a saved test using saved waveforms.
See also
Save a test setup
Open (load) a saved test setup
Save a test setup
You can save a test setup before or after running a test. You can create a test setup from already created test setup, or using default test
setup. When you select the default test setup, the parameters are set to the application’s default value.
Select Options > Save Test Setup to save the opened setup.
Select Options > Save Test Setup As to save the setup with different name.
Open (load) a saved test setup
To Open (load) a saved test setup, do the following:
1. Select Options > Open Test Setup.
2. Select the setup from the list and click Open. Setup files are located at X:\Ethernet\.
See also
About test setups
Create a test setup using an existing one
Create a test setup from default settings
Create a test setup from default settings
To create a test setup using default settings, follow the steps:
1. Select Options > Default Test Setup. For default test setup, the parameters are set to the application’s default value.
2. Click application Setup and set the parameters.
3. Click application Reports and set the report options.
4. Optional: Click Start to run the test and verify that it runs correctly and captures the specified test information and reports. If it does not,
then edit the parameters and repeat this step until the test runs to your satisfaction.
5. Select Options > Save Test Setup. Enter the file name and click Save. The application saves the file to X:\Ethernet\<session_name>.