Tektronix TekExpress D-PHY Automated Solution User manual

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TekExpress®D-PHY

ZZZ

Automated Solution

Printable Online Help

*P077051403*

077-0514-03

TekExpress®D-PHY Automated Solution

ZZZ

PrintableOnlineHelp

www.tektronix.com

077-0514-03

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions.

Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Speciﬁcations and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

TekExpress is a registered trademark of Tektronix, Inc.

MIPI is a registered trademark of MIPI Alliance.

TekExpress D-PHY Automated Solution Online Help, 076-0227-03.

Contacting Tektronix

Tektronix, Inc. 14150 SW P.O . Box 500 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

In Nor Worldwide, visit www.tektronix.com to ﬁnd contacts in your area.

Karl Braun Drive

th America, call 1-800-833-9200.

Table of Contents

Introduction to the Application

Related Documentation ............... ................................ ................................ ............. 1

Conventions ................................ ................................ ................................ ......... 1

Technical Support ......... ................................ ................................ ......................... 2

Getting Started

Compatib

Minimum System Requirements....................... .................................. ......................... 3

Install the Software ............................ ................................ .................................. ... 4

Application Directories and Usage .... .................................. ................................ ......... 5

Folder Structure..................................................................................................... 6

File Name Extensions .............................................................................................. 7

Activate the License................................... ................................ ............................. 7

Before You Click Run.............................................................................................. 9

ility..... .... . .... . .... .... . .... . .... ..... ... . . .... ..... ..... .... . .... . .... .... . .... . .... ..... ... . . .... . .... 3

Table of Contents

Operating Basics

D-PHY Application Overview ............................... .................................. .................. 11

Starting the Application....................................... ................................ .................... 12

Resizing the Application Window........... ................................ .................................. .. 13

Exiting the Application .... . .... .... . .... . .... ..... .... . .... ..... ... . . .... . .... ..... .... . .... . .... .... . .... . .... .. 13

Global Controls .................................. ................................ ................................ .. 14

Menus ............................. .................................. ................................ ................ 14

File Menu........ ................................ .................................. ............................ 14

View Menu ...... ................................ ................................ .............................. 15

Tools Menu .................................................................................................... 15

Help Menu..................................................................................................... 17

How To

Select Test(s) ............. ................................ .................................. ........................ 19

Conﬁgure and Run the Test(s).......................................... .................................. ........ 23

Typical Conﬁguration Parameters ................... ................................ ............................ 28

View and Select Connected Instruments ...................... .................................. ................ 30

Acquire Live Waveform for Analysis. ................................ ................................ .......... 31

Use Prerecorded Waveforms for Analysis ...... ................................ ................................ 33

View the Progress of Analysis ................. ................................ ................................ .. 35

View the Report.................................................................................................... 37

View Test Related Files............... ................................ ................................ ............ 38

TekExpress D-PHY Automated Solution i

Table of Contents

Application Examples

Connection Setup ................................ ................................ ................................ .. 40

Conﬁguring Parameter Values.......... .................................. ................................ ........ 42

Temperature Chamber Testing ........................... ................................ ........................ 43

Multilane Testing with RF Switch ... ... . . .... . .... ..... ..... .... . .... . .... ..... ..... .... . .... . .... ..... .... . .... 47

Group1Tests

Testing Data Lane LP-TX Thevenin Output High Level Voltage (VOH)

Connections for Data Lane LP-TX Thevenin Output High Level Voltage (VOH) ............... 48

Conﬁgure and Run Data Lane LP-TX Thevenin Output High Level Voltage (VOH)............ 48

Testing Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Connections for Data Lane LP-TX Thevenin Output Low Level Voltage (VOL) ................ 50

Conﬁgure and Run Data Lane LP-TX Thevenin Output Low Level Voltage (VOL) . .... . .... .. 50

Testing Data Lane Rise Time

Connections for Data Lane Rise Time........... ................................ ...................... 51

Conﬁgure and Run Data Lane Rise Time ............................................................. 51

Testing Data Lane Fall Time

Connections for Data Lane Fall Time ....... .................................. ........................ 53

Conﬁgure and Run Data Lane Fall Time .............................. ................................ 53

Testing Data Lane Slew Rate Versus CLOAD

Connections for Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR) ....................... 54

Conﬁgure and Run Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR) .................... 54

Testing Data Lane Pulse Width of Exclusive-OR Clock

Connections for Data Lane LP-TX Pulse Width of Exclusive-OR Clock ..................... .... 56

Conﬁgure and Run Data Lane LP-TX Pulse Width of Exclusive-OR Clock...................... 56

Testing Data Lane Period of Exclusive-OR Clock

Connections for Data Lane LP-TX Period of Exclusi

Conﬁgure and Run Data Lane LP-TX Period of Exclusive-OR Clock ............................ 57

View Report for Group 1 Tests.............................................................................. 58

Group2Tests

Testing Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

Connections for Clock Lane LP-TX Thevenin Output High Level Voltage (VOH).............. 59

Conﬁgure and Run Clock Lane LP-TX Thevenin Output High Level Voltage (VOH) . .... . .... 59

Testing Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Connections for Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL) .............. 61

Conﬁgure and Run Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL) ........... 61

Testing Clock Lane Rise Time

Connections for Clock Lane Rise Time ............................................................... 62

Conﬁgure and Run Clock Lane Rise Time............................................................ 62

Testing Clock Lane Fall Time

Connections for Clock Lane Fall Time ............................ .................................. .. 64

Conﬁgure and Run Clock Lane Fall Time ............................................................ 64

Testing Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

ve-OR Clock.............................. .. 57

ii TekExpress D-PHY Automated Solution

Table of Contents

Connections for Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR).................. .... 65

Conﬁgure and Run Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR) .................. 65

View Report for Group 2 Tests.............................................................................. 67

Group3Tests

Testing Data Lane HS Entry: Data Lane TLPX Value

Connections for Data Lane HS Entry: Data Lane TLPX Value . .... . .... ... . . .... . .... ..... .... . .. 67

Conﬁgure and Run Data Lane HS Entry: D

Testing Data Lane HS Entry: THS-PREPARE Value

Connections for Data Lane HS Entry: THS-PREPARE Value ....................... .............. 69

Conﬁgure and Run Data Lane HS Entry: THS-PREPARE Value .................................. 69

Testing Data Lane HS Entry: THS-PREPARE + THS-ZERO Value

Connections for Data Lane HS Entry: THS-PREPARE + THS-ZERO Value .................... 71

Conﬁgure and Run Data Lane HS Entry: THS-PREPARE + THS-ZERO Value................. 71

Testing Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Connections for Data Lane HS-TX Differential Voltages (VOD(0), VOD(1)) ................... 72

Conﬁgure and Run Data Lane HS-TX Differential Voltages (VOD(0), VO

Testing Data Lane HS-TX Differential Voltage Mismatch (VOD)

Connections for Data Lane HS-TX Differential Voltage Mismatch (VOD)..................... .. 74

Conﬁgure and Run Data Lane HS-TX Differential Voltage Mismatch (VOD) ... ................ 74

Testing Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP), VOHHS(DN))

Connections for Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. ................ 75

Conﬁgure and Run Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. ................ 75

Testing Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

Connections for Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1),

VCMTX(0)) ....... ................................ ................................ .................. 77

Conﬁgure and Run Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1),

VCMTX(0)) ....... ................................ ................................ .................. 77

Testing Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Connections for Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0)) 78 Conﬁgure and Run Data Lane HS-TX Static Common-Mode Voltage Mismatch

(VCMTX(1,0)) .............................. .................................. ...................... 78

Testing Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

Connections for Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz

(VCMTX(LF)) ...................................................................................... 80

Conﬁgure and Run Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz

(VCMTX(LF)) ...................................................................................... 80

TestingDataLaneHS-TXDynamicCommon-Level Variations Above450MHz (VCMTX(HF))

Connections for Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz

(VCMTX(HF)) ...................................................................................... 82

Conﬁgure and Run Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz

(VCMTX(HF)) ...................................................................................... 82

ata Lane TLPX Value.. . .... ... . . .... . .... ..... ..... .. 67

D(1))................ 72

TekExpress D-PHY Automated Solution iii

Table of Contents

Testing Data Lane HS-TX 20%-80% Rise time (tR)

Testing Data Lane HS-TX 80%-20% Fall time (tF)

Testing Data Lane HS Exit: THS-TRAIL Value

Testing Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

Testing Data Lane HS Exit: TEOT Value

Testing Data Lane HS Exit: THS-Exit Value

View Report for Group 3 Tests.............................................................................. 92

Group4Tests

Testing Clock Lane HS Entry TLPX Value

Testing Clock Lane HS Entry TCLK-PREPARE Value

Testing Clock Lane HS Entry TCLK-PREPARE+TCLK–ZERO Value

Testing Clock Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Testing Clock Lane HS-TX Differential Voltage Mismatch

Testing Clock Lane HS-TX Single-Ended Output High Voltages (VOHHS(DP), VOHHS(DN))

Testing Clock Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

Connections for Data Lane HS-TX 20%-80% Rise time (tR) ...................................... 84

Conﬁgure and Run Data Lane HS-TX 20%-80% Rise time (tR)... ................................ 84

Connections for Data Lane HS-TX 80%-20% Fall time (tF) ................. ...................... 85

Conﬁgure and Run Data Lane HS-TX 80%-20% Fall time (tF).................................... 85

Connections for Data Lane HS Exit: THS-TRAIL Value ........................................... 86

Conﬁgure and Run Data Lane HS Exit: THS-TRAIL Value........ ................................ 86

Connections for Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT).................. 88

Conﬁgure and Run Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT) .............. 88

Connections for Data Lane HS Exit: TEOT Value................................................... 89

Conﬁgure and Run Data Lane HS Exit: TEOT Value ............................................... 89

Connections for Data Lane HS Exit: THS-Exit Value............................. .................. 91

Conﬁgure and Run Data Lane HS Exit: THS-Exit Value . ................................ .......... 91

Connections for Clock Lane HS Entry TLPX Value . . .... . .... ..... ... . . .... ..... ..... .... . .... . .... 93

Conﬁgure and Run Clock Lane HS Entry TLPX Value ..... .... . .... . .... ..... ..... .... . .... . .... .. 93

Connections for Clock Lane HS Entry TCLK-PREPARE Value ................................... 94

Conﬁgure and Run Clock Lane HS Entry TCLK-PREPARE Value ....... ........................ 94

Connections for Clock Lane HS Entry TCLK-PREPARE+TCLK–ZERO Value................. 96

Conﬁgure and Run Clock Lane HS Entry TCLK-PREPARE+TCLK–ZERO Value ............ 96

Connections for Clock Lane HS-TX Differential Voltages (VOD(0), VOD(1)) .................. 97

Conﬁgure and Run Clock Lane HS-TX Differential Voltages (VOD(0), VOD(1)) .............. 97

Connections for Clock Lane HS-TX Differential Voltage Mismatch .. ............................ 99

Conﬁgure and Run Clock Lane HS-TX Differential Voltage Mismatch........................... 99

Connections for Clock Lane HS-TX Single-Ended Output High Voltages (VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. .............. 101

Conﬁgure and Run Clock Lane HS-TX Single-Ended Output High Voltages (VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. .............. 101

iv TekExpress D-PHY Automated Solution

Table of Contents

Connections for Clock Lane HS-TX Static Common-Mode Voltages (VCMTX(1),

VCMTX(0)) ....... ................................ ................................ ................ 103

Conﬁgure and Run Clock Lane HS-TX Static Common-Mode Voltages (VCMTX(1),

VCMTX(0)) ....... ................................ ................................ ................ 103

Testing Clock Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Connections for Clock Lane HS-TX Static Common-Mode Voltage Mismatch

(VCMTX(1,0)) .............................. .................................. .................... 104

Conﬁgure and Run Clock Lane HS-TX Static Common-Mode Voltage Mismatch

(VCMTX(1,0)) .............................. .................................. .................... 104

Testing Clock Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

Connections for Clock Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz

(VCMTX(LF)) .................................................................................... 106

Conﬁgure and Run Clock Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz

(VCMTX(LF)) .................................................................................... 106

Testing C lock Lane HS-TX Dynamic Common-Level Variations Above450MHz (VCMTX(HF))

Connections for Clock Lane HS-TX Dynamic Common-Level Variations Above 450MHz

(VCMTX(HF)) .................................................................................... 108

Conﬁgure and Run Clock Lane HS-TX Dynamic Common-Level Variations Above 450MHz

(VCMTX(HF)) .................................................................................... 108

Testing Clock Lane HS-TX 20%-80% Rise time (tR)

Connections for Clock Lane HS-TX 20%-80% Rise time (tR)..... .............................. 110

Conﬁgure and Run Clock Lane HS-TX 20%-80% Rise time (tR) . .............................. 110

Testing Clock Lane HS-TX 80%-20% Fall time (tF)

Connections for Clock Lane HS-TX 80%-20% Fall time (tF).................................... 112

Conﬁgure and Run Clock Lane HS-TX 80%-20% Fall time (tF) ................................ 11

Testing Clock Lane HS Exit: TCLK-TRAIL Value

Connections for Clock Lane HS Exit: TCLK-TRAIL Value ....................... .............. 113

Conﬁgure and Run Clock Lane HS Exit: TCLK-TRAIL Value .................................. 113

Testing Clock Lane HS Exit: 30%-85% Post-EoT Rise Time (TREOT)

Connections for Clock Lane HS Exit: 30%-85% Post-EoT Rise Time (TREOT) ... . . .... . .... 115

Conﬁgure and Run Clock Lane HS Exit: 30%-85% Post-EoT Rise Time (TREOT) .... . .... . 115

Testing Clock Lane HS Exit: TEOT Value

Connections for Clock Lane HS Exit: TEOT Value ............................................... 116

Conﬁgure and Run Clock Lane HS Exit: TEOT Value.......... ................................ .. 116

Testing Clock Lane HS Exit: THS-Exit Value

Connections for Clock Lane HS Exit: THS-Exit Value ... ................................ ........ 117

Conﬁgure and Run Clock Lane HS Exit: THS-Exit Value........................................ 117

Testing Clock Lane HS Clock Instantaneous (UIINST)

Connections for Clock Lane HS Clock Instantaneous (UIINST)................................. 119

Conﬁgure and Run Clock Lane HS Clock Instantaneous (UIINST) ............................. 119

View Report for Group 4 Tests............................................................................ 120

Group5Tests

Testing HS Entry TCLK PREValue

TekExpress D-PHY Automated Solution v

Table of Contents

Connections for HS Entry TCLK PREValue ....................................................... 121

Conﬁgure and Run HS Entry TCLK PREValue .................................................... 121

Testing HS Exit TCLK POSTValue

Connections for HS Exit TCLK POSTValue ....................................................... 123

Conﬁgure and Run HS Entry TCLK POSTValue ................................................. 123

Testing Clock Rising Edge Alignment to First Payload Bit

Connections for Cloc

Conﬁgure and Run Clock Rising Edge Alignment to First Payload Bit......................... 124

Testing Data-to-Clock Skew (TSKEW[TX])

Connections for Data-to-Clock Skew (TSKEW[TX]) ................... .......................... 126

Conﬁgure and Run Data-to-Clock Skew (TSKEW[TX]) ... ................................ ...... 126

View Report for Group 5 Tests............................................................................ 127

Group6Tests

Connections for Group 6 Tests ............ ................................ ................................ 128

Conﬁgure and Run Group 6 Tests......................................................................... 128

k Rising Edge Alignment to First Payload Bit............................. 124

TekExpress Programmatic Interface

About the Programmatic Interface............................................................................. 133

Server and Client Proxy Objects............................................................................... 134

Remote Proxy Object......................... ................................ .............................. 134

Client Proxy Object..... ................................ .................................. .................. 135

Client Programmatic Interface: An Example................................................................. 136

D-PHY Application Command Arguments and Queries........ ................................ ............ 139

Handle Error Codes ............................................................................................. 174

Program Example................................ ................................ ................................ 175

Reference

Algorithms

Group 1 Tests.................... ................................ .................................. .......... 179

Group 2 Tests.................... ................................ .................................. .......... 185

Test 1.1.1 Data Lane LP-TX Thevenin Output High Level Voltage (VOH) .................... 179

Test 1.1.2 Data Lane LP-TX Thevenin Output Low Level Voltage (VOL) ..... ................ 179

Test 1.1.3 Data Lane Rise Time ...................................................................... 180

Test 1.1.4 Data Lane Fall Time............. ................................ .......................... 181

Test 1.1.5 Data Lane LP-TX Slew Rate Versus CLOA

Test 1.1.6 Data Lane LP-TX Pulse Width of Exclusive-OR Clock (TLP-PULSE-TX) . ..... .. 184

Test 1.1.7 Data Lane LP-TX Period of Exclusive-OR Clock (TLP-PER-TX) ..... ..... .... . ... 184

Test 1.2.1 Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)........... ........ 185

Test 1.2.2 Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL).................... 185

Test 1.2.3 Clock Lane Rise Time..................................................................... 186

Test 1.2.4 Clock Lane Fall Time ..................................................................... 186

Test 1.2.5 Clock Lane LP-TX Slew Rate Versus CLOAD (ōV/ōtSR) ........................... 187

D(ōV/ōtSR)............................. 182

vi TekExpress D-PHY Automated Solution

Table of Contents

Group 3 Tests................................................................................................ 189

Test 1.3.1 Data Lane HS Entry: Data Lane TLPX Value . .... . .... ..... ..... .... . .... . .... ..... ... 189

Test 1.3.2 Data Lane HS Entry: THS-PREPARE Value..... ................................ ...... 190

Test 1.3.3 Data Lane HS Entry: THS-PREPARE + THS-ZERO Value.......................... 191

Test 1.3.4 Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))......................... 192

Test 1.3.5 Data Lane HS-TX Differential Voltage Mismatch (VOD) ............................ 193

Test 1.3.6 Data Lane HS-TX Single-Ended Output High Voltages (VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. .............. 194

Test 1.3.7 Data Lane HS-TX Static Common Mode Voltages (VCMTX(0), VCVMTX(1)) . . 194

Test 1.3.8 Data Lane HS-TX Static Common-Mode Voltage Mismatch (ΔVCMTX(1,0))... . 195

Test 1.3.9 Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz ... 195

Test 1.3.10 Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz .... . ... 196

Test 1.3.11 Data Lane HS-TX 20%-80% Rise Time (tR) ......................................... 196

Test 1.3.12 Data Lane HS-TX 80%-20% Fall Time (tF) .................. ........................ 197

Test 1.3.13 Data Lane HS Exit: THS-TRAIL Value ............................................... 197

Test 1.3.14 Data Lane HS Exit:

Test 1.3.15 Data Lane HS Exit: TEOT Value....................................................... 198

Test 1.3.16 Data Lane HS Exit: THS-EXIT Value ..................... ............................ 198

Group 4 Tests................................................................................................ 199

Test 1.4.1 Clock Lane HS Entry: TLPX Value . .... ..... .... . .... ... . . .... . .... .... . .... . .... .... . . 199

Test 1.4.2 Clock Lane HS Entry: TCLK-PREPARE Value ............................... ........ 199

Test 1.4.3 Clock Lane HS Entry: TCLK-PREPARE+TCLK-ZERO Value ..................... 199

Test 1.4.4 Clock Lane HS-TX Differential Voltages (VOD(0), VOD(1)) ....................... 200

Test 1.4.5 Clock Lane HS-TX Differential Voltage Mismatch (VOD)........................... 200

Test 1.4.6 Clock Lane HS-TX Single-Ended Output High Voltages (VOHHS(DP),

VOHHS(DN)) ..... ................................ .................................. .............. 201

Test 1.4.7 Clock Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0)) .. 201 Test 1.4.8 Clock Lane HS-TX Static Common-Mode Voltage Mismatch (ΔVCMTX(1,0)) . . 202 Test 1.4.9 Clock Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz

(ΔVCMTX(LF))... .................................. ................................ .............. 202

Test 1.4.10 Clock Lane HS-TX Dynamic Common-Level Variatio

(ΔVCMTX(HF)) ............ .................................. ................................ .... 203

Test 1.4.11 Clock Lane HS-TX 20%-80% Rise Time (tR)........................................ 203

Test 1.4.12 Clock Lane HS-TX 80%-20% Fall Time (tF) ......................... ................ 204

Test 1.4.13 Clock Lane HS Exit: THS-TRAIL Value............ .................................. 204

Test 1.4.14 Clock Lane HS Exit: 30%-85% Post-EOT Rise Time (TREOT) ................... 204

Test 1.4.15 Clock Lane HS Exit: TEOT Value ..................................................... 205

Test 1.4.16 Clock Lane HS Exit: THS-EXIT Value ............................... ................ 205

Test 1.4.17 Clock Lane HS Clock Instantaneous (UIINST)....................................... 205

Group 5 Tests................................................................................................ 206

Test 1.5.1 HS Entry TCLK PREValue............................................................... 206

Test 1.5.2 HS Exit TCLK POSTValue............................................................... 207

30%-85% Post-EOT Rise Time (TREOT) .................... 198

ns Above 450MHz

TekExpress D-PHY Automated Solution vii

Table of Contents

Group6Tests

Test 1.6.1 INIT: LP-TX Initialization Period (T

Test 1.6.2 ULPS Entry: Veriﬁcation of Clock Lane LP-TX ULPS Support . ........................ 209

Test 1.6.3 ULPS Exit: Transmitted T Test 1.6.4 BTA: TX-Side T Test 1.6.5 BTA: RX-Side T

Test 1.6.6

Shortcut Keys .. ................................ ................................ .................................. 210

Error Codes....................................................................................................... 211

Oscilloscope Setup . .... . .... . .... . .... ..... ..... .... . .... . .... . .... . .... ..... ..... .... . .... . .... . .... . .... ..... . 211

Index

Test 1.5.3 HS Clock Rising Edge Alignment to First Payload Bit ............................... 208

Test 1.5.4 Data-to-Clock Skew (TSKEW[TX}) .................................................... 209

)............................................. 209

BTA: RX-Side T

INIT,MASTER

WAKEUP

Interval Value ................................. ........................ 210

TA- GO

TA- SU RE

TA- GE T

Interval Value ..... .................................. ................ 210

Interval Value ........................................................ 210

Interval ................................................... 210

viii TekExpress D-PHY Automated Solution

Introduction to the Application Related Documentation

Conventions

Online Help uses the following conventions:

The term “DUT” is an abbreviation for Device Under Test.

The term “select” is a generic term that applies to the two mechanical methods of choosing an option: using a mouse or using the touch screen.

A Note identiﬁes important information.

In-depth op

eration and UI help.

TekExpress D-PHY Automated Solution 1

Introduction to the Application Technical Support

Technical Support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope.

When you contact Tektronix Technical Support, please include the following information (be as speciﬁcas possible):

General Information

All instru

Hardware options, if any.

Probes used.

Your name, company, mailing address, phone number, FAX number.

Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

ment model numbers.

Application Speciﬁc Information

Software version number.

Description of the problem such that technical support can duplicate the problem.

If possible, save the setup ﬁles for all the instruments used and the application.

ssible, save the TekExpress setup ﬁles, log.xml , *.TekX (session ﬁles and folders), and status

If po

messages text ﬁle.

ossible, save the waveform on which you are performing the measurement as a .wfm ﬁle.

If p

Forward the information to technical support using one of these methods:

E-mail – techsupport@tektronix.com

FAX – (503) 627-5695

2 TekExpress D-PHY Automated Solution

Getting Started Compatibility

Compatibility

The TekExpress D-PHY application runs on the following Tektronix oscilloscopes:

MSO70404C, MSO70604C, MSO7

0804C, MSO71254C, MSO71604C, and MSO72004C Series

Mixed Signal Oscilloscopes

DPO/DSA70404C, DPO/DSA70604C, DPO/DSA70804C, DPO/DSA71254C, DPO/DSA71604C, and DPO/DSA72004C Series Digital Oscilloscopes

MSO70404, MSO70604, MSO70804, MSO71254, MSO71604, and

MSO72004 Series Mixed

Signal Oscilloscopes

DPO/DSA70404B, DPO/DSA70604B, DPO/DSA70804B, DPO/DSA71254B, DPO/DSA71604B, and DPO/DSA72004B Series Digital Oscilloscopes

DPO/DSA70404, DPO/DSA70604, DPO/DSA70804, DPO/DSA71254, DPO/DSA71604, and DPO/DSA72004 Series Digital Oscilloscopes

DPO7254C1and DPO7354C Digital Oscilloscope

DPO72541and DPO7354 Digital Oscilloscope

The DPO7254/C oscilloscope may not meet the Rise/Fall time speciﬁcations of D-PHY standards. If that is not critical, then you can use the DPO7254/C oscilloscope for the D-PHY measurement.

The TekExpress D-PHY application supports the following Tektronix probes:

TAP1500

P7240

P6245

P7380A

P7508 (supports HS-tests only, with known limitations for DSI DUTs)

TDP3500

Minimum System Requirements

The minimum system requirements for a PC to run TekExpress are as follows:

Processor Pentium 4/M or equivalent processor. Operating System Windows XP Service Pack 2.

Memory

Hard Disk

512 MB of memory. Approximately 2 GB of available hard-disk space for the recommended

installation, which includes full TekExpress installation and distributed components.

TekExpress D-PHY Automated Solution 3

Getting Started Install the Software

Drive DVD drive.

Display

Software Microsoft Excel 2002 or above.

Other Devices Microsoft compatible mouse or compatible pointing device.

xxx

If TekExpress is running on an instrument having a video resolution lower than 800x600 (for example, sampling oscilloscope), it is recommended to connect a secondary monitor and this must be enabled before launching the application.

If TekExpress is installed on a Tektronix oscilloscope, the virtual GPIB port will be used by TekExpress for communicating with oscilloscope applications. If external GPIB communication devices like USB-GPIB-HS or equivalent are used for instrument connectivity, ensure that the Talker

utility is enabled in the DPO/DSA oscilloscope's GPIB menu. For ease of use, connect to an external (secondary) monitor.

Listener

Super VGA resolution or higher video adapter (800x600 minimum video resolution fo The application is best viewed at 96 dpi display settings

r small fonts or 1024x768 minimum video resolution for large fonts).

Microsoft Internet Explorer 6.0 SP1 or later.

Microsoft Photo Editor 3.0 or equivalent software for viewing image ﬁles.

Adobe Reader 6.0 or equivalent software for viewing portable document

format (PDF) ﬁles.

Four USB ports (two USB ports minimum).

PCI-GPIB or equivalent interface for instrument connectivity2.

Install the Software

1. Close all applications.

2. Download D-PHYWebinstaller_<version>.EXE.

3. Double-click the executable to extract the ﬁles. After extraction, the installer launches and the software

is installed in

C:\Program Files\Tektronix\TekExpress\TekExpress D-PHY.

4 TekExpress D-PHY Automated Solution

Getting Started Application Directories and Usage

Application Directories and Usage

The application directory and associated ﬁles are organized as follows:

The following table lists the default directory names and their usage:

Directory names Usage

InstallDir\TekExpress\TekExpress D-PHY Contains the application and associated ﬁles. TekExpress D-PHY\Compliance Suites Contains compliance speciﬁc ﬁles. TekExpress D-PHY\Bin TekExpress D-PHY\Lib TekExpress D-PHY\Tools

TekExpress D-PHY\ACP TekExpress D-PHY\SCP TekExpress D-PHY\ICP TekExpress D-PHY\Documents Includes the technical documentation for the application. TekExpress D-PHY\Data Manager TekExpress D-PHY\Data Storage TekExpress D-PHY\Report Generator

xxx

Includes the Miscellaneous libraries of the D-PHY application. Includes utility ﬁles speciﬁc to the D-PHY application. Includes instrument application s peciﬁc ﬁles for the D-PHY

application. Includes instrument and application speciﬁc interface libraries of

the D-PHY application.

Includes the result management speciﬁc libraries of the D-PHY application are present in these folders.

Includes Excel Active X interface Library for Report Generation.

Includes the ﬁlter ﬁles for the D-PHY application.

TekExpress D-PHY Automated Solution 5

Getting Started Folder Structure

Folder Structure

After you install D-PHY, it creates the following folders on your computer:

\Program Files\Tektronix\TekExpress\TekExpress D-PHY.

NOTE. Ensure that the “TekExpress” folder has read and write access.

\My Documents\My TekExpress\D-PHY.

\My Documents\My TekExpress\D-PHY\Untitled Session.

Every time the

D-PHY folder. The Untitled Session folder is deleted when you exit the D-PHY application.

TekExpress D-PHY.exe is launched, an Untitled Session folder is created under

CAUTION. Each session has multiple ﬁles associated with it. Do not modify any of the session ﬁles and/or folders as this may result in loss of data or corrupted session ﬁles.

The My TekExpress folder is created as a shared folder with share name as <domain><user ID>My

TekExpress (or if the PC is not connected to domain, then share name is

ID> My TekExpress)

<Computer name><user

The above shared folder is mapped as X: (X drive) on to the instrument where D-PHY is running.

NOTE. If X drive is mapped to any other shared folder, the application will display a warning message

ow asking you to disconnect the X: drive manually.

wind

6 TekExpress D-PHY Automated Solution

Getting Started File Name Extensions

File Name Extensions

Thesoftwareusesthefollowingﬁle name extensions:

File name extension Description

.TekX .seq

.xml

.wfm The test wa .mht .ﬂtTheﬁlte

xxx

The session ﬁle will be saved in this format. The test sequence ﬁle. The encrypted XML ﬁle that contains the test speciﬁcconﬁguration

information. The log ﬁle

The test r

extension is also xml. veform ﬁle.

esult report will be saved in this format.

r ﬁles are in this format.

Activate the License

Follow the steps below to activate the license:

1. Click Help > Activate License or Help > About TekExpress > License Info to view the license information and activate the application.

2. Click the View Version Details link to check the version numbers of the installed test suites.

TekExpress D-PHY Automated Solution 7

Getting Started Activate the License

3. Click the View End-User License Agreement link to open the following Tektronix Software License Agreement window. Click Print to print the License Agreement.

4. Click License Info to view the available software options. This window shows the license key and supported options with their status (ac

tive or inactive) with the current license key.

8 TekExpress D-PHY Automated Solution

Getting Started Before You Click Run

5. If you are activating the license for the ﬁrst time, the license key ﬁeld will be empty. To activate the license, connect the USB dongle to your computer, enter the license key provided in the license key certiﬁcate, and click Activate. If the activation is successful, a sign is displayed next to the license key ﬁeld.

6. If you are reactivating the license, click Reactivate, enter the new license key and click Activate.

Before You Click Run

Do the following before you click Run:

NOTE. Ensure that the network connectivity is enabled on the instrument running the D-PHY application.

1. Map (see page 9) the shared My TekExpress folder as X: (X drive) on all the instruments used in test

setup running Microsoft Windows Operating System. This shared folder is used to save the waveform ﬁles or

used during any other ﬁle transfer operations.

2. Right-click on the My TekExpress folder and open the Properties dialog box. Select the General tab

en Advanced.IntheAdvanced Attributes window, ensure that the option Encrypt contents to

and th

secure data is NOT selected. Click here

3. Ensu

re that all the required instruments are properly warmed up, Signal Path Compensation (SPC)

page 10) performed, followed by cable deskew.

(see page 10) to view the picture.

(see

Mapping My TekExpress Folder

To map the My TekExpress folder on the instruments, follow the steps below:

1. Open Windows Explorer.

om the Windows Explorer menu, select Tools > Map Network drive.

2. Fr

3. Select the Drive letter as X: (if there is any previous connection on X:, disconnect it ﬁrst through ools > Disconnect Network drive menu of Windows Explorer).

4. In the Folder ﬁeld, enter the remote My TekExpress folder path (for example, \\192.158.97.65\

John’s My TekExpress)

5. To determine the IP address of the PC where “My TekExpress” folder exists, do the following:

Select Start > Run menu on the PC where the My TekExpress folder exists.

Enter cmd and press Enter.

At the command prompt, type ipconﬁg.

TekExpress D-PHY Automated Solution 9

Getting Started Before You Click Run

To ﬁnd SPC, do the following:

1. On the

2. Click the Instr u ment Calibration option.

10 TekExpress D-PHY Automated Solution

oscilloscope main menu, select the Utilities menu.

Operating Basics D-PHY Application Overview

D-PHY Application Overview

TekExpress is the Tektronix Test Automation Framework, developed to support your current and future test automation needs. TekExpress uses a highly modular architecture that lets you deploy automated test solutions fo

Key Features

The key features of the D-PHY application are:

r various standards in a relatively short time.

Allows con

Comprehensive test coverage performing all conformance tests to the latest CTS. (100% test coverage)

Fully-automated Multi-lane testing using an external RF switch

Automated testing:

Eliminates user intervention to conduct time-consuming testing

Reduces the time required to conduct testing

Enable

Automated temperature chamber testing p rovides automated setup to validate all High Speed tests using

Customizing the setup:

Allows you to modify the test s etup as per the DUT conﬁguration

Automatically calculates unit intervals based on the DUT data rates

Margin testing and characterization:

Allows custom-limits or limits-editing to perform Margin testing

formance testing to the latest Compliance Test Speciﬁcation (CTS v1.0)

s you to test devices faster

XL cables, temperature tips and standard ﬁlter ﬁles

rforms characterization of your design

Flexible probing allows you to probe your Design Under Test (DUT) using either Differential or

ingle-ended probes.

Selective testing:

Performs fully-automated testing for transmitter measurements

Allows you to select individual tests or test groups in the tree-structure

Avoids repeated testing, through accurate and reliable results from a single run

Escape mode support allows you to perform both Escape Mode (ULPS Mode) and the Normal Mode tests.

TekExpress D-PHY Automated Solution 11

Operating Basics Starting the Application

Clock Continuous Mode support allows you to perform all tests in normal mode or selective tests in Clock Continuous mode

Detailed test reporting:

Provides a Pass/Fail summary table

Provides margin details on each test

Provides a consolidated report for all tests

Starting t

The appli instrument hosting the D-PHY application.

The appl not found, instrument discovery is performed before launching D-PHY. The Resources.xml ﬁle contains information regarding instruments available on network.

When the application starts, it checks for the appropriate license key. If the valid license key is not present, the application switches to the “Evaluation” mode. If the application fails to detect the dongle, it continues to run in Evaluation mode.

Start the application in one of the following ways:

Click Start > Programs > Tektronix > TekEx p ress > TekExpress D-PHY.

Double click the icon on the desktop.

If you have previously saved a session, double-click the session ﬁle stored under My TekExpress\D-PHY.

he Application

cation uses a USB dongle that contains the license key. This dongle must be present on the

ication also checks for a ﬁ le, called Resources.xml, located in My TekExpress folder. If this ﬁle is

12 TekExpress D-PHY Automated Solution

Operating Basics Resizing the Application Window

NOTE. If the application was not terminated properly during the last use, a dialog box asks to recall the previously unsaved session.

Resizing the A pplication Window

To minimize the application, click on the application title bar. To restore the application to its previous

size, selec

To maximize the application, click application title bar.

Exiting the Application

To exit the application, do one of the following:

Click File > Exit.

Click on the application title bar.

NOTE. Using other methods to exit the application results in abnormal termination of the application.

in the Windows task bar.

. To restore the application to its previous size, click on the

TekExpress D-PHY Automated Solution 13

Operating Basics Global Controls

Global Controls

The menus and controls that appear outside the individual tabs are called “Global Controls”. These are used to specify the devices to be tested.

Table 2: Global controls

Control name Function

DUT

The device ID is speciﬁed at the global level and the information is stored in the default location for all data ﬁles. This ﬁeld cannot be empty and does not allow these special characters (.,..,...,\,/:?”<>|*). The maximum length of characters allowed is 32.

Displays the status of the disk space. When the disk space is low, a warning dialog appears to perform the c leanup and continue working on the application.

You will be able to run, pause, resume, and stop the tests.

xxx

Menus

File Menu

Click File on the application menu bar.

14 TekExpress D-PHY Automated Solution

Operating Basics Menus

The File menu has the following selections:

Menu Function

New Session Starts a default session of D-PHY. Open Session Opens a saved session. Save Session Saves the session. Save Session As Saves a session in a different name. Recently Recalled Setup

Recalls the recently saved setup. Save Report As Saves the report in user speciﬁed location. Print Preview Report Print Report Exit

xxx

Previews the report before printing.

Opens the Windows “Print” dialog box.

Closes the application.

View Menu

Click View on the application menu bar.

The View menu has the following selections:

Menu Function

Log

xxx

Tools Menu

Click Tools on the application menu bar.

The Tools menu has the following selections:

Menu Function

Instrument Bench (see page 16) Shows the list of instruments connected to the test setup. E-mail Setting (see page 16) Allowsyoutoconﬁgure and set the e-mail options.

xxx

Opens the log (log.xml) ﬁle in the default viewer.

TekExpress D-PHY Automated Solution 15

Operating Basics Menus

Instrument Bench

The Instrument Bench window shows the list of VISA and Non-VISA resources found on different interfaces/connections. It serves two purposes at the launch of TekExpress:

Discovers the connected instruments.

Conﬁrms the instrument connection setup.

When you click Tools > Instrument Bench, the following dialog box is displayed:

E-mail Settings

-mail Settings utility allows you to conﬁgure and set the e-mail options. The following ﬁelds are

The E mandatory for receiving e-mail notiﬁcation from TekExpress:

1. Rec

2. Sender's Address

3. SMTP Server address of the Mail server conﬁgured at client location

ipient Email Addres ses. For example, User@domain.com

16 TekExpress D-PHY Automated Solution

Operating Basics Menus

If any of the above mentioned ﬁelds are left blank, the settings will not get saved and e-mail notiﬁcation will not be sent.

Check the option “ E-mail Test Results When Complete or on Error” to receive the e-mail. The attachment list depends on the choice which is made while conﬁguring the email setup.

NOTE. The Analysis Screenshot option in the Add Email Attachments pane is not yet functional.

Help Menu

Click Help on the application menu bar.

The Help menu has the following selections:

Menu Function

TekExpress Help About TekExpress Displays the TekExpress s creen with the application title.

Activate License (see page 7) Displays the details of activating the application.

xxx

Displays TekExpress Help (F1).

Also displays the application details such as software name, version number, and copyright.

TekExpress D-PHY Automated Solution 17

Operating Basics Menus

18 TekExpress D-PHY Automated Solution

How To Select Test(s)

Select Test(s)

The application supports the following D-PHY tests:

Group 1 tests that are Single-ended tests and available only in the Escape mode:

1.1.1 Data Lane LP-TX Thevenin Output High Level Voltage (VOH) (Single-ended only)

1.1.2 Data Lane LP-TX Thevenin Output Low Level

1.1.3DataLaneRiseTime(Single-endedonly)

1.1.4. Data Lane Fall Time (Single-ended only)

1.1.5. Data Lane LP-TX Slew Rate versus CLOAD (ōVō/tSR) (Single-ended only)

1.1.6. Data Lane LP-TX Pulse Width of Exclusive-OR Clock (TLP-PULSE-TX) (Single-ended only)

1.1.7. Data Lane LP-TX Period of Exclusive-OR Clock (TLP-PER-TX) (Single-ended only)

NOTE. Group 1 tests are supported on LP-HS waveforms although it is not recommended to use LP-HS waveforms for these tests.

Group 2 tests that are Single-ended tests and available only in the Escape mode:

1.2.1 Clock Lane LP-TX Thevenin Output High Level Voltage (VOH) (Single-ended only)

1.2.2 Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL) (Single-ended only)

1.2.3 C lock Lane Rise Time (S

1.2.4. Clock Lane Fall Time (Single-ended only)

1.2.5. Clock Lane LP-TX Slew Rate versus CLOAD (ōV/ōtSR) (Single-ended only)

ingle-ended only)

Voltage (VOL) (Single-ended only)

NOTE. Group 2 tests are supported on LP-HS waveforms although it is not recommended to use LP-HS waveforms for these tests.

Group 3 tests:

The following Group 3 tests are single-ended and differential tests, except where indicated:

1.3.1 Data Lane HS Entry: Data Lane TLPX Value (Single-ended only)

NOTE. The Data Lane HS Entry: Data Lane TLPX Value test is supported on LP-HS waveforms although it is not recommended to use LP-HS waveforms for this test.

1.3.2DataLaneHSEntry: THS-PREPAREValue

TekExpress D-PHY Automated Solution 19

How To Select Test(s)

1.3.3DataLaneHSEntry: THS-PREPARE+THS-ZEROValue

1.3.4 Data

1.3.5 Data Lane HS-TX Differential Voltage Mismatch (ΔVOD)

1.3.6 Data Lane HS-TX Single-ended Output High Voltages (VOHHS(DP)), VOHHS(DN)) (Single-ended only)

1.3.7 Data Lane HS-TX Common Mode Voltages (VCMTX(1), VCMTX(0))

1.3.8 Data Lane HS-TX Common Mode Voltage Mismatch (ΔVCMTX(1,0))

1.3.9 Data Lane HS-TX Dynamic Common-Level Variations Between 50–450MHz (ΔVCMTX(HF))

1.3.10 Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (ΔVCMTX(HF))

1.3.11 Data Lane HS-TX 20%–80% Rise Time (tR)

1.3.12 Data Lane HS-TX 80%–20% Fall Time (tF)

1.3.13 Data Lane HS Exit: THS-TRAIL Value

1.3.14 Data Lane HS Exit 30%–80% POST-EoT Rise Time (TREOT)

1.3.15. Data Lane HS Exit: TEOT Value

1.3.16. DATA Lane HS Exit: THS-EXIT Value

Group 4 tests:

The following Group 4 tests are single-ended and differential tests, except where indicated:

Lane HS-TX Differential Voltages (VOD(0), VOD(1))

1.4.1 Clock Lane HS Entry: TLPX Value (Single-ended only)

1.4.2 Clock Lane HS Entry: TCLK-PREPARE Value (Single-ended only)

1.4.3 Clock Lane HS Entry: TCLK-PREPARE+ TZERO Value (Single-ended only)

1.4.4 Clock Lane HS-TX Differential Voltages (VOD(0), VOD(1))

1.4.5 Clock Lane HS-TX Differential Voltage Mismatch (ΔVOD)

1.4.6 Clock Lane HS-TX Single-ended Output High Voltages (VOHHS(DP)), VOHHS(DN)) (Single-ended only)

1.4.7 Clock Lane HS-TX Common Mode Voltages (VCMTX(1), VCMTX(0)) (Single-ended only)

1.4.8 Clock Lane HS-TX Common Mode Voltage Mismatch (ΔVCMTX(1,0)) (Single-ended only)

1.4.9 Clock Lane HS-TX Dynamic Common-Level Variations Between 50–450MHz (ΔVCMTX(LF)) (Single-ended only)

1.4.10 Clock Lane HS-TX Dynamic Common-Level Variations Above 450MHz (ΔVCMTX(HF)) (Single-ended only)

1.4.11 Clock Lane HS-TX 20%–80% Rise Time (tR)

1.4.12 Clock Lane HS-TX 80%–20% Fall Time (tF)

1.4.13 Clock Lane HS Exit: TCLK-TRAIL Value (Single-ended only)

20 TekExpress D-PHY Automated Solution

How To Select Test(s)

1.4.14 Clock Lane HS Exit 30%–80% POST-EoT Rise Time (TREOT) (Single-ended only)

1.4.15. Clock Lane HS Exit: TEOT Value (Single-ended only)

1.4.16. Clock Lane HS Exit: THS-EXIT Value (Single-ended only)

1.4.17 Clock Lane HS Clock Instantaneous (UIINST) (Single-ended only)

Group 5 test

The following Group 5 tests are single-ended and differential tests, except where indicated:

1.5.1 HS Entry: TCLK PRE Value

1.5.2 HS Entry: TCLK POST Value

1.5.3 HS Clock Rising Edge Alignment to First Payload Bit (Single-ended only)

1.5.4. Data-to-Clock Skew (TSKEW[TX])

NOTE. Group 5 tests are not available in the Clock Continuous mode.

The fol

Clock m

Normal Normal

Normal Escape

lowing table lists the tests (ids) that are supported in the clock and test modes:

ode

Test mo

Test id

e-ended tests: Group 3, Group 4, and Group 5.

Singl Test ids: 1.3.1, 1.3.2, 1.3.3, 1.3.4, 1.3.5, 1.3.6, 1.3.7,

1.3.8, 1.3.9, 1.3.10, 1.3.11, 1.3.12, 1.3.13, 1.3.14, 1.3.15,

1.3.1 Test ids: 1.4.1, 1.4.2, 1.4.3, 1.4.4, 1.4.5, 1.4.6, 1.4.7,

1.4.8, 1.4.9, 1.4.10, 1.4.11, 1.4.12, 1.4.13, 1.4.14, 1.4.15, 16, 1.4.17.

1.4.

Test ids: 1.5.1, 1.5.2, 1.5.3, 1.5.4. Differential tests: Group 3, Group 4, and Group 5.

Test ids: 1.3.2, 1.3.3, 1.3.4, 1.3.5, 1.3.7, 1.3.8, 1.3.9,

.10, 1.3.11, 1.3.12, 1.3.13, 1.3.14, 1.3.15, 1.3.16.

1.3

Test ids: 1.4.4, 1.4.5, 1.4.11, 1.4.12, 1.4.17. Test ids: 1.5.1, 1.5.2, 1.5.4.

Single-ended tests: Group 1, Group 2, and Group 3.

st ids: 1.1.1, 1.1.2, 1.1.3, 1.1.4, 1.1.5, 1.1.6, 1.1.7 Test

Te ids: 1.2.1, 1.2.2, 1.2.3, 1.2.4, 1.2.5. Test id: 1 .3.1

TekExpress D-PHY Automated Solution 21

How To Select Test(s)

Clock mode Test mode Test ids

Continuous

xxx

Use the Sel

Normal

Single-ended Test ids: 1.3.1, 1.3.2, 1.3.3, 1.3.4, 1.3.5, 1.3.6, 1.3.7,

1.3.8, 1.3.9, 1.3.10, 1.3.11, 1.3.12, 1.3.13, 1.3.14, 1.3.15,

1.3.16. Test ids: 1.4.4, 1.4.5, 1.4.6, 1.4.7, 1.4.8, 1.4.9, 1.4.10,

1.4.11, 1.4.12, 1.4.17. Differential tests: Group 3 and Group 4.

Test ids: 1.

1.3.10, 1.3.11, 1.3.12, 1.3.13, 1.3.14, 1.3.15, 1.3.16. Test ids: 1.4.4, 1.4.5, 1.4.11, 1.4.12, 1.4.17.

ect panel to select conﬁgure, and run one or more groups of tests.

tests: Group 3 and Group 4.

3.2, 1.3.3, 1.3.4, 1.3.5, 1.3.7, 1.3.8, 1.3.9,

Select Device. Select the device type from the list: D-PHY CSI-2 or D-PHY DSI. The default value is

D-PHY-CSI-2. Enter the DUT ID for the device.

Select Clock Mode. Select the Clock Mode: Normal or Continuous. Select Continuous when the signal has

only the high speed region. Select Normal when the signal has both, the high speed and the low power regions. The application uses Edge trigger for Continuous mode and Transition trigger for Normal mode. The default Sample rate is 12.5 Gs/s and the default Record Length is 1M.

Select Clock Lane Probing. Select the probing method: D ifferential or Single-Ended. Based on this

selection, the application displays the single-ended and differential tes ts. If probing type is Single-ended

22 TekExpress D-PHY Automated Solution

How To Conﬁgure and Run the Test(s)

then you will need four probes (Dp, Dn, Clkp, Clkn). If probing type is Differential, then you will need three probes (Dp, Dn, Clkp-Clkn). Group 1 and Group 2 tests are not available for the Differential probing metho

Select Lanes to Test. Select the lane to test. You can manually select the lanes to test, or you can select

Automate Lane Switching with RF switch. If you select multiple lanes without automation, a control window is displayed when you need to switch the probing to the next lane. If you select automated lane switching, the system automatically switches to the next lanes for you.

Select Test Mode. Select the test mode from the list: Normal or Escape. The default value is Normal.

Escape is available only when the Clock Mode is Normal. The application does not support Clock continuous mode for Escape mode tests. As a result, the trigger is Transition trigger. When you select Escape mode, you must connect a ULPS signal to the oscilloscope on which the measurements will be done. However, the application can still perform the measurements on the LP-HS signals. The default Sample r

ate is 12.5 Gs/s and the default Record Length is 1M.

Version. Select the Compliance Test Speciﬁcation version, the default value is CTS 1.0. For the selected

CTS v ersion, select any particular test, or one or more test groups.

3: Select panel buttons

Table

Butto

xxx

Conﬁgure and Run the Test(s)

The conﬁguration panel is used to view and edit the parameters associated with the acquisition and the analysis of the selected test. Click here

Descr

Opens

Opens the schematic for the selected test. This is useful if you w

Sele

Dese

for the options.

iption

the conﬁguration panel for the selected test.

ant to verify the test setup before running the test.

cts all tests in the table.

lects all tests in the table.

TekExpress D-PHY Automated Solution 23

How To Conﬁgure and Run the Test(s)

NOTE. If any of the test parameters are grayed, it means that these parameters are not editable.

The upper part of the Conﬁguration Panel shows parameters and their values. These parameters are common for a group of tests. Parameters speciﬁc to a select test are shown in the lower part of t he Conﬁguration Panel. Test-speciﬁc parameters include acquisition, analysis, and limit parameters.

ollowing table lists the common parameters and their values:

The f

Table 4: Common parameters and values

Parameter Value

Real Time Scope Select the oscilloscope to which to connect. Measurement Method

Select the measurement method: Automatic or Manual. In the Automatic mode, you perform a test without any intervention. In the Manual mode, you will be prompted to place the cursors on the acquired waveform before the application proceeds with the analysis.

NOTE. The Manual method is available only in the User Deﬁned

mode.

24 TekExpress D-PHY Automated Solution

How To Conﬁgure and Run the Test(s)

Table 4: Common parameters and values (cont.)

Parameter Value

Filter File 1 (for testing in Temperature Chamber) Select the ﬁlter ﬁle to use for temperature chamber testing. Click on

the browse button in the ﬁeld and select a ﬁle.IfyouselectNone,no ﬁlter ﬁle is used (testing in temperature chamber is not considered).

NOTE. Filter ﬁle selection is available only in the User Deﬁned mode.

Filter File 2 (for testing in Temperature Chamber with Differential Probing)

Select the ﬁlter ﬁle to use with differential probing for temperature chamber testing. Click on the browse button in the ﬁeld and select a ﬁle. If you select None, no ﬁ lter ﬁle is used (testing in temperature chamber is not considered).

NOTE. Filter ﬁle selection is available only in the User Deﬁned mode.

xxx

NOTE. If you change the channel selection for Data+ (DP), Data– (DN), Clock+ (CP), and Clock– (CN) signals, make sure that you change the trigger source correspondingly in the Analyze tab for each of the measurements. If you do not do this, the waveform might not trigger and the measurements might not be completed.

For temperature chamber testing, a ﬁlter ﬁle with S4 parameters is used to compensate the factors introduced due to length of the probe cable when testing the DUT in temperature chamber. You will need one or two ﬁlter ﬁles based on the selected clock probing. If you select Single-ended probing, you must specifyonlyoneﬁlter ﬁle (Filter File 1). The application ignores the Filter File 2 even if you provide it. If

elect Differential probing, then you must specify both the ﬁlter ﬁles (Filter File 1 and Filter File 2).

you s

The following table lists the tabs and button controls for the tests:

Table 5: Conﬁgure panel buttons

Conﬁgure parameters Description

Acquire (see page 26) Shows the various parameters related to acquisition of a selected test. Analyze (see page 28) Shows the various parameters r elated to analysis of a selected test.

These parameters can vary from one test to another test. For example, Vertical scale, Vertical offset, Horizontal scale, and others.

Limits (see page 27) Applies to a speciﬁc version. It shows the measurement lower and

upper limits using different types of comparisons like EQ(==), NE(!=), GT(>), LT(<), GE(>=), LE(<=), GTLT(> <), GELT(>= <), GTLE(> <=), LTGT(< >), LEGE(<= >=), LEGT(<= >), LTGE(< G=), GELE(>= <=). Some use unary operands and some use binary operands. For unary

operands, only value1 (on the left) is active. Comments Specify a comment up to 256 characters long for selected test. Restore Save Saves and applies the conﬁguration parameters that you have set. Cancel

xxx

Restores the default values.

Dismisses the dialog box.

Click Run in the Select panel to run the selected tests.

TekExpress D-PHY Automated Solution 25

How To Conﬁgure and Run the Test(s)

Refer to the following table for various test limit comparisons:

Table 6: Test limit comparisons

Comparison string Description

EQ(==) NE(!=)

Equal to

Not equal to GT(>) Greater than LT(<)

Less than GE(>=) Greater than or Equal to LE(<=)

Less than or Equal to GTLT(><) Greater than and Less than GELT(>=<) Greater than or equal to and Less than GTLE(><=) Greater than and Less or equal to LTGT(<>) Less than and Greater than LEGE(<= >=) Less than or equal to and Greater than or equal to LEGT(<= >) Less than or equal to and Greater than LTGE(< >=) Less than and Greater than or equal to GELE(>= =<) Greater than or equal to and Less than or equal to

xxx

Conﬁgure Acquire Panel

26 TekExpress D-PHY Automated Solution

How To Conﬁgure and Run the Test(s)

You have the following options:

Restore compliance mode values.

Change the parameters associated with analysis conﬁguration.

Change the test limits in the U ser Deﬁned mode.

Add comments

for the selected test that would appear in the Report panel.

ConﬁgureLimitsPanel

TekExpress D-PHY Automated Solution 27

How To Typical Conﬁguration Parameters

Conﬁgure Analyze Panel

Typical Conﬁguration Parameters

The following table shows the typical or default conﬁguration parameters for single-ended and differential tests in the clock normal and clock continuous modes.

28 TekExpress D-PHY Automated Solution

How To Typical Conﬁguration Parameters

ests

Clock lane tests

Acquire parameters

Vertical

Single-ended tests (Clock Mode Normal)

Data lane tests

Clock lane tests

Single-ended tests(ClockMode Continuous)

Data lane tests

Clock lane tests

Differential tests (Clock Mode Normal)

Data lane tests

Clock lane tests

Differential t (Clock Mode Continuous)

Data lane tests

200 200 200 200 200 200 200 200

Scale (mV) Vertical Po

sition

–2.6 NA –2.6 NA –2.6 NA –2.6 NA

for Data (div) Vertical Po

sition

NA –2.6 NA –2.6 NA 2.6 NA 2.6

for Clock (div) Vertical

–2.6 –2.6 –2.6 –2.6 2.6 2.6 2.6 2.6

Position (div) Vertical O ffset (V) Horizontal Scale

00000000 88888888

(us) Sample Rate

12.5 12.5 12.5 12.5 12.5 12.5 12.5 12.5

(GS/s) Record Length 1000000 1000000 1000000 1000000 1000000 1000000 1000000 1000000

Analyze parameters

Trigge

rType

Transi tion

Transi

tion

Transi tion

Edge Transi

tion

Transi tion

Edge

Trigger Source Ch1 Ch3 Ch1 Ch3 Ch1 C h3 Ch1 Ch3

ger Upper

Trig

111NA111NA

Level (V)

ger Lower

Trig

0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05

Level (V) Trigger Level for

NA NA NA 0.2 NA NA 0.2 0.2

Continuous Clock

e(V)

Mod

igger Time (ps)

Tr Trigger Transition

Trigger Slope

Trigger If Violation Occurs Occurs Occurs

xxx

500 500 500 500 500 500 500 500

eater

Gr Than

ositive,

P Negative

eater

Gr Than

ositive,

P Negative

eater

Gr Than

ositive,

P Negative

ositive,

P Negative

eater

Gr Than

ositive,

P Negative

eater

Gr Than

ositive,

P Negative

eater

Gr Than

ositive,

P Negative

Occurs Occurs Occurs

ositive,

P Negative

TekExpress D-PHY Automated Solution 29

How To View and Select Connected Instruments

View and Select Connected Instruments

Viewing Conne

The Tools > Instrume nt Bench menu item is used to discover connected instruments required for the tests. The ap the Instrument Bench dialog box resumes operation and lists the instrument-related details based on the selected search criteria.

NOTE. When the TekVISA Instrument Manager checks for connected Instruments, the Instrument Bench dialog box does not respond.

For example, if you select LAN and GPIB as the search criteria in the Instrument Bench dialog box and click Refresh, the TekVISA Instrument Manager checks for the availability of instruments over LAN and the details of the instruments are displayed under Retrieved Instruments table.

cted Instruments

plication uses TekVISA to discover the connected instruments. Once the operation is done,

ovide the time in the TekVISA Refresh Timeout (Seconds) ﬁeld, within which if the TekVISA

Pr Instrument Manager does not ﬁnd the instruments, the TekExpress application resumes the operation. If you choose Non-VISA resources, all the instruments supported by TekExpress but not communicating over the VISA layer can be searched.

30 TekExpress D-PHY Automated Solution

How To Acquire Live Waveform for Analysis

Selecting Connected Instruments

View the instruments connected in the Conﬁguration panel. The upper half of the panel displays the general param from the drop-down list.

eters for the tests under the selected test suite. Select the Real Time Scope to connect to

NOTE. The list of instruments displayed is speciﬁc to the selected test suite. It does not show all the connected instruments.

Acquire Live Waveform for Analysis

Select the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock (Clkp

Clkn) sources. When you click Run, by default the application acquires live signals from the source.

and

Click the Acquire tab to see acquisition parameters, and acquisition status of the selected test suite. The

quire panel is speciﬁc to a suite and gets updated every time the selected test suite is changed. This

Ac panel shows the acquisition details for the tests in the currently selected suite. The tests with common acquisition parameters are grouped together and shown as a single acquisition.

TekExpress D-PHY Automated Solution 31

How To Acquire Live Waveform for Analysis

This example shows the acquire panel with channel selections.

32 TekExpress D-PHY Automated Solution

How To Use Prerecorded Waveforms for Analysis

Table 7: Controls on the Acquire panel

Selection Function

Data Source Lists the sources assigned for each data line (Dp and Dn).

Select the source (channel) for each data line (Dp and Dn). Once you select a channel for Dp, you cannot select the same channel for other lines (Dn, Clkp, and Clkn) and vice versa).

Clock Source Lists the sources assigned for each clock line (Clkp and

Clkn). Select the source (channel) for each clock line (Dp and Dn). Once you select a channel for Clkp, you cannot select the same channel for other lines (Dn, Dn, and Clkn) and vice versa).

If you have selected Differential Clock Lane Probing in the Select panel, only one source selection is displayed (differential probe clock needs only one channel as source).

Column Name

Test

Status Acquisition status of the running test at intervals. The

Acquisition

Acquire Option s

Use Pre-recorded Waveform Files When enabled, uses pre-recorded waveforms for the

Acquire Step By Step When enabled, displays the reference input waveform of

xxx

Displays the name of the selected test for performing acquisitions. One or more tests can perform the same acquisitions.

messages are passed only in live acquisition. Updates the location of the acquisition name.

selected test.

the selected test. This helps you to compare the input waveform with the reference waveform, allows you to change the setup before acquiring the waveforms, and then proceeds with the next selected test.

Use Prerecorded Waveforms for Analysis

Select the Acquire tab to see unique acquisitions, acquisition parameters, acquisition status, and prerecorded waveform ﬁles of the selected test suite. The Acquire panel is speciﬁc to a group and gets updated every time the selected test group is changed. This panel shows the acquisition details for the tests in the currently selected g roup. The tests with the common acquisition parameters are grouped together and shown as a single acquisition.

For pre-recorded testing, it is recommended that you capture the waveforms at 12.5 Gs/s sample rate. However, if you capture the waveforms at a different sample rate, ensure that you change the Sample Rate parameter in the Conﬁgure Panel appropriately for each of the selected tests.

TekExpress D-PHY Automated Solution 33

How To Use Prerecorded Waveforms for Analysis

NOTE. You can only use saved sessions in which the tests have been run in Automatic mode for prerecorded testing. You cannot use the sessions in which tests have been run in Manual mode for prerecorded testing.

NOTE. You cannot use the prerecorded waveform option for the 1.5.3 HS Clock Rising Edge Alignment to First Payload Bit test.

Column name Function

Test N ame

Acquisition Waveform File Prerecorded waveform ﬁles of unique acquisitions. You can select waveform

xxx

Name of the tests performing acquisitions. One or more tests can perform the same acquisitions.

Test acquisition status of the running test passed at intervals.

ﬁles by clicking the hyperlink. This allows you to select any waveform ﬁle using the standard ﬁle open window.

NOTE. To use the prerecorded option, it is recommended that you use a waveform ﬁle (.wfm) which has been captured from a Tektronix oscilloscope. This eliminates the need to use an oscilloscope. You can manually select waveforms and perform the tests with a click of the Run button.

34 TekExpress D-PHY Automated Solution

How To View the Progress of Analysis

The following Acquire source options are available:

Use Pre-recorded Waveform Files: Enabling or disabling the option shows or hides the waveform ﬁle column in the acquisition table.

Follow these steps to save a session and use the pre-recorded mode to run it:

a. Open a new session.

b. Select the tests.

c. Highlight a

each of the selected tests.

d. Save the se

e. In the Acquire panel, select Use Pre-recorded Waveform Files and then select the waveforms for

each of th

the data and clock waveforms. For example.....

Acquire

to the next one.

Show Ac

When you select “Use Pre-recorded”, the ﬁrst column shows the Acquisition, the second column shows

st, and the next column shows the Waveform File for analysis.

the Te

test and click Conﬁgure. Change the sample rate parameter to the desired value for

ssion.

e tests. Make sure that the waveform names have a sufﬁx DP, DN, CP, and CN indicating

Step by Step: Selecting this prompts you at the end of each acquisition before proceeding

quire Parameters: Selecting this shows the acquisition parameters.

ViewtheProgressofAnalysis

Click the Analyze tab to view the progress of the analysis. As the analysis of each test is complete, the

ult value is updated.

res

TekExpress D-PHY Automated Solution 35

How To View the Progress of Analysis

Analyz

The Analyze table contains the following:

The tests that are not yet started are shown with a “To be Started” status. A summarized status of the currently running test is shown in the Status Messages panel.

The Status Messages window time-stamps all ru following:

eTable

The test name.

The status of the tests that are being run.

The low and high limit values, and margins, for the tests.

The measured values for the tests.

The pass/fail status of the tests.

n time messages and displays them. You can do the

Display Status: Enable/Disable status messages.

Auto Scroll: Scroll the status messages automatically.

Clear All: Clear all status messages in Status Window.

Save Status: Save all status messages in text ﬁle. Displays a standard save ﬁle window a nd saves the

status messages in the user speciﬁed ﬁle.

36 TekExpress D-PHY Automated Solution

How To View the Report

View the Report

After the analysis, a report is automatically generated and displayed in the report panel. The device information such as oscilloscope model, serial number, ﬁrmware version of the oscilloscope, version information

A t able shows the test name, measurement details, test result (pass/fail), compliance mode, and analysis time. Save t

NOTE. If you use a secondary m onitor, verify that the screen resolution of the secondary monitor is the same as that of the primary display. This ensures that captured images in the reports are of the same size.

of the TekExpress and the application, start time, and the execution time are displayed.

he report as an MHT ﬁle using the File > Save As option.

TekExpress D-PHY Automated Solution 37

How To View Test Related Files

View Test Related Files

All the test related ﬁles for currently selected tests are always saved under: My Documents\My

TekExpress\D-PHY\SessionName

Case 1. An example image of data when the session is still not saved and is in the

path as “Untitled Session”,theDUTIDissettoDUT001, and the tests are performed twice (two folders are created with the ﬁle naming convention

Case 2. An example image of data when the session is still not saved and is in the My TekExpress/D-PHY

path as “Untitl ed Session”,theDUT001 folder already present (tests are performed twice), and the DUT ID is now set to

DUT002 (here the tests are performed once).

YYYYMMDD_HHMMSS (Date_Time).

My TekExpress/D–PHY

Case 3. An example image of data when the session is saved and is in the My TekExpress/D-PHY

has

pat

38 TekExpress D-PHY Automated Solution

“Test”.

Application Examples View Test Related Files

TekExpress D-PHY Automated Solution 39

Application Examples Connection Setup

Connection Setup

Youneedthefollowingequipment(seeCompatibility (see page 3)):

A supported Tektronix DPO oscilloscope

Single-ende

Differential probe

Device under test

Probing board

NOTE. If you have a partial setup, such as only Tx and no Rx, then the probing board should be connected to the termination board, which provides proper termination for the LP and HS signals. If you have a full setup, t

Make co

hen there is no need for the termination board.

For multilane testing, RF switch:

nnections as follows for single-ended tests:

dprobe

40 TekExpress D-PHY Automated Solution

Application Examples Connection Setup

Make connections as follows for differential tests:

TekExpress D-PHY Automated Solution 41

Application Examples Conﬁguring Parameter Values

Make connections as follows when you are using an RF switch and probing board:

Conﬁg

42 TekExpress D-PHY Automated Solution

uring Parameter Values

To con

1. In the Select panel click Conﬁgure.

2. In the Conﬁgure panel, set the following general parameters that are common for all tests:

Parameter Value

Real Time Scope Select the oscilloscope to which to connect. Mea

ﬁgure a test, do the following:

surement Method

Select the measurement method: Automatic or Manual.

NOTE. The Manual method is available only when in the User

ﬁned mode.

Application Examples Temperature Chamber Testing

Filter File 1 (f

Filter File 2 ( with Differential Probing)

or testing in temperature chamber)

for testing in temperature chamber

Select the ﬁlte the browse button in the ﬁeld and select a ﬁle.IfyouselectNone,no ﬁlter ﬁle is used (testing in temperature chamber is not considered).

NOTE. Filter ﬁ

Select the ﬁlt chamber testing. Click on the browse button in the ﬁeld and select a ﬁle. If you select None, no ﬁ lter ﬁle is used (testing in temperature chamber is no

r ﬁle to use for temperature chamber testing. Click on

le selection is available only in the User Deﬁned mode.

er ﬁle to use with differential probing for temperature

t considered).

NOTE. Filter ﬁle selection is available only in the User Deﬁned mode.

xxx

The A utomatic measurement method mode, lets you perform a test without any intervention. You must select one or more tests, conﬁgure the tests (or use the default values) and click Run to perform the test. T

he application acquires and analyzes the data, and displays a report when complete.

If you select the Manual mode, select one or more tests, conﬁgure the tests (or use the default values) and click

Run to perform the test. The application begins to acquire data. A window opens where you are prompted to place the cursors on the acquired waveform a nd click OK. Go to the TekScope application and zoom the waveform around the trigger point. Place the cursors on the waveform to capture the values at those points and click OK in the window. The application completes the test and displays the report.

st specify only one ﬁlter ﬁle (Filter File 1). The application ignores the Filter File 2 even if you provide it. If you select Differential probing, then you must specify both the ﬁlter ﬁles (Filter File 1 and Filter File 2).

NOTE. Other applications will display there windows in the background. The TekScope application takes precedence over other applications. Use Alt+Tab to view the other application windows.

3. Select either Compliance M ode or User Deﬁned Mode. In the User Deﬁned Mode, you can modify the test parameters but you will no longer be testing against the compliance standards.

Temperature Chamber Testing

The TekExpress D-PHY offers the temperature chamber testing which is done at system level when the device is put in the oven and the connection points from the DUT are extended to the probe using a wire. This wire is 60” (5 ft) long and the signal must be de-embedded for t he measurement. Filter ﬁles are needed to offset the cable effects that are introduced in temperature chamber testing.

The setup shown below is expected to be done by the user. The DUT is ideally placed in an environment in which t he temperature can be externally controlled, which we call the Temperature Oven. The DUT is then connected to the setup using the above-mentioned long cables that come from within the oven to

TekExpress D-PHY Automated Solution 43

Application Examples Temperature Chamber Testing

the Tektronix P7500 series probes that are then connected to the desired channels of the Tektronix real time scope.

However, the P7500 probe does not support LP measurement but can support all measurements in normal mode. All the measurements that can be performed using the LP-HS transition mode are supported in Temper ature

The next speciﬁes how to control this testing through the application once the setup is ready.

chamber mode.

Steps for Performing Temperature Chamber Testing

The a pplication provides a set of ﬁlter ﬁles. However, you have the option of selecting your own set of ﬁlter ﬁles.

Temperature chamber testing is available only in the User Deﬁned mode.

1. Select the test and click Conﬁgure.

2. Select the User Deﬁned mode.

44 TekExpress D-PHY Automated Solution

Application Examples Temperature Chamber Testing

3. Select Filter File1 by browsing to the folder.

4. Select Filter File 2 to use with differential probing for temperature chamber testing by browsing to

the folder.

Youwillneedoneortwoﬁlter ﬁles based on the selected clock probing. If you select Single-ended probing, you must specify only one ﬁlter ﬁle (Filter File 1). If you select Differential probing, then you must specify both the ﬁlter ﬁles (Filter File 1 and Filter File 2).

The ﬁlter ﬁle for each of the combinations is listed in the table

Table 8: Filter ﬁle names

Selection Affected channels/Lanes File name

NORMAL CLOCK, SINGLE ENDED Dp, Dn,Cp,Cn Single ended ﬁlter for all lanes NORMAL CLOCK, DIFFERENTIAL Dp, Dn,Cp-n Single ended for Data lane, Differential

ﬁlter for clock lane

CONTINUOUS CLOCK, SINGLE ENDED

CONTINUOUS CLOCK, DIFFERENTIAL

xxx

Dp, Dn,Cp, Cn Single ended ﬁlter for all lanes

Dp, Dn,Cp-n Single ended for Data lane, Differential

ﬁlter for clock lane

TekExpress D-PHY Automated Solution 45

Application Examples Temperature Chamber Testing

Logic Flow of Temperature Chamber Testing in TekExpress D-PHY

46 TekExpress D-PHY Automated Solution

Application Examples Multilane Testing with RF Switch

Multilane Testing with RF Switch

Multilane testing with an RF switch takes measurements on four lanes. The system can automatically receive signals from all four lanes without user intervention, save the acquisitions, and then take measurement measurements are performed.

s on one lane, and then the signals from next lane are automatically selected and the

Without aut

omation you can select which lane (s) to test, and based on the selection, the application acquires the desired signals and takes the selected measurements on those acquired waveforms. When done with a lane, the software prompts you to change the connection over to the next lane.

After each acquisition the waveforms are saved, with proper naming convention for speciﬁc lanes, analyzed, and the results for eac h lane updated in the analyze panel and the report panel.

Table 9: Required Equipment

Item Description

RF switch Reference Termination Board

(otpional)

GPIB cable A GPIB cable is required when using an RF switch for multi-lane automation.

xxx

Keithley S46 series Microwave Switch System D-PHY Reference Termination Board (RTB) available from University

of New Hampshire (UNH-IOL). This UNH RTB is orderable from, http://www.iol.unh.edu/services/testing/mipi/MIPI_Test_Fixture_Order_Form.doc

Setting up Multilane Testing

Click here for information on connections for multilane testing. Perform the following steps to set up the

equipment for multilane testing:

1. Connect a GPIB cable between the oscilloscope and the RF switch.

2. Connect the input channels of the oscilloscope to the outputs of the Probing board.

3. Connect the inputs of the Probing board to the outputs of the RF switch.

4. Connect the Dp signals form each lane of the DUT to the inputs of channel 1 of the RF switch.

5. Connect the Dn signals from each lane of the DUT to the corresponding inputs of channel 2 of the

RF switch.

6. Connect the Cp signal to the input of channel 3 of the RF switch. The clock lane is connected through

the RF switch to ensure that there is no skew between the data and clock signals.

7. Connect the Cn signal to the input of channel 4 of the RF switch.

8. In the Select tab, select t he Automate Lane switching with RF switch check box

9. In the Acquire tab, select Acquire Live Waveforms.

10. Select RF Switch setup.

11. Map the lanes and input types to the location on the RF switch.

TekExpress D-PHY Automated Solution 47

Application Examples Connections for Data Lane LP-TX Thevenin Output High Level Voltage (VOH)

Connect (VOH)

Click h

(VOH) test.

Conﬁg Volt

ure and Run Data Lane LP-TX Thevenin Output High Level

age (VOH)

1. In th

ions for Data Lane LP-TX Thevenin Output High Level Voltage

ere

for information on connections for the Data Lane LP-TX Thevenin Output High Level Voltage

e Select panel, select the Device.

48 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane LP-TX Thevenin Output High Level Voltage (VOH)

NOTE. The Data Lane LP-TX Thevenin Output High Level Voltage (VOH) test is not available when the selected clock lane probing is Differential.

You can also perform Data Lane LP related measurements on a signal that has an LP-HS transition.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Versio

n default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type (Data Lanes Acquisition

in Escape Mode with Data as Trigger). The following table lists the compliance mode values and the permitt

ed range of values for the user-deﬁned mode:

Table 10: Conﬁguration parameters for Data Lane LP-TX Thevenin Output High Level Voltage (VOH)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the fol

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

lowing analysis parameters:

Table 11: Analysis parameters for Data Lane LP-TX Thevenin Output High Level Voltage (VOH)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Data Lane LP-TX Thevenin Ou

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

tput High Voltage DP and Data

Lane LP-TX Thevenin Output High Voltage DN values, and the compare string.

9. Click Comments to enter comments. The comments are shown in th

etestreport.

TekExpress D-PHY Automated Solution 49

Application Examples Connections for Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)

10. Click Save to accept the changes, o r click Cancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connection

s for Data Lane LP-TX Thevenin Output Low Level Voltage

(VOL)

Click here f

(VOL) test.

or information on connections for the Data Lane LP-TX Thevenin Output Low Level Voltage

Conﬁgure and Run Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)

1. In the Select panel, select the Device.

NOTE. The Data Lane LP-TX Thevenin Output Low Level Voltage (VOL) test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition

in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 12: C onﬁguration parameters for Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Offset (V) Horizontal Scale (us)

50 TekExpress D-PHY Automated Solution

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

Application Examples ConnectionsforDataLaneRiseTime

Table 12: Conﬁguration parameters for Data Lane LP-TX Thevenin Output Low Level Voltage (VOL) (cont.)

Parameter Default User deﬁned mode

Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 13:

Parameter Default User deﬁned mode

Trigger T Trigger Trigge Trigge Trigg Trigger Transition Trig

gger If Violation

Tri

xxx

Analysis parameters for Data Lane LP-TX Thevenin Output Low Level Voltage (VOL)

ype

Source r Upper Level (V) r Lower Level (V)

er Time (pS)

ger Slope

Transiti Ch1 Ch1, Ch2 1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500

er Than

Great Negative Positive, Negative, Either

urs

Occ

Transiti

, Ch3, Ch4

er Than, Less Than

Great

urs, Logic

Occ

8. Click Limits to view and change the Data Lane LP-TX Thevenin Output Low Voltage DP and Data Lane LP-TX Thevenin Output Low Voltage DN values in mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or click Cancel.

lick the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

11.C

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane Rise Time

Click here for information on connections for the Data Lane Rise Time test.

ConﬁgureandRunDataLaneRiseTime

1. In the Select panel, select the Device.

TekExpress D-PHY Automated Solution 51

Application Examples ConﬁgureandRunDataLaneRiseTime

NOTE. The Data Lane Rise Time test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version

default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition

in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitte

d range of values for the user-deﬁned mode:

Table 14: Conﬁguration parameters for Data Lane Rise Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table15: AnalysisparametersforDataLaneRiseTime

Parameter Default User deﬁned mode

xxx

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the Data Lane Rise Time DP and Data Lane Rise Time DN values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

52 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane Fall Time

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock (Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane Fall Time

Click here for information on connections for the Data Lane Fall Time test.

ConﬁgureandRunDataLaneFallTime

1. In the Select panel, select the Device.

NOTE. The Data Lane Fall Time test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select

Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition

in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 16: Conﬁguration parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

TekExpress D-PHY Automated Solution 53

Application Examples Connections for Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

Table 17: Analysis parameters for Data Lane Fall Time

Parameter Default User deﬁned mod

xxx

8. Click Li

mits to view and change the Data Lane Fall Time DP and Data Lane Fall Time DN values in

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

nS, and the compare string.

9. Click C

omments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

Click here for information on connections for the Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

test.

Conﬁgure and Run Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

1. In the Select panel, select the Device.

NOTE. The Data Lane Fall Time test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

54 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitted ran

ge of values for the user-deﬁned mode:

Table 18: Conﬁguration parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 19: Analysis parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS)

gger Transition

Tri Trigger Slope

1Ente

0.05 0.05 500 250 Greater Than Greater Than, Less Than

gative

r a value based on the test

,0.1,1

, 500

sitive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Data Lane Fall Time DP and Data Lane Fall Time DN values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 55

Application Examples Connections for Data Lane LP-TX Pulse Width of Exclusive-OR Clock

Connections for D ata Lane LP-TX Pulse Width of Exclusive-OR Clock

Click here for information on connections for the Data Lane LP-TX Pulse Width of Exclusive-OR

Clock test.

Conﬁgure and Run Data Lane LP-TX Pulse Width of Exclusive-OR Clock

1. In the Select panel, select the Device.

NOTE. The Data Lane Fall Time test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition

in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 20: Conﬁguration parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 21: Analysis parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V)

1 Enter a value based on the test

56 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane LP-TX Period of Exclusive-OR Clock

Table 21: Analysis parameters for Data Lane Fall Time (cont.)

Parameter Default User deﬁned mode

Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Data Lane Fall Time DP and Data Lane Fall Time DN values in nS, and t

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

he compare string.

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

nections for Data Lane LP-TX Period of Exclusive-OR Clock

Con

Cli

ck here

for information on connections for the Data Lane LP-TX Period of Exclusive-OR Clock test.

Conﬁgure and Run Data Lane LP-TX Period of Exclusive-OR Clock

1. In the Select panel, select the Device.

NOTE. The Data Lane Fall Time test is not available when the selected clock lane probing is Differential.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Data Lanes Acquisition

in Escape Mode with Data as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

TekExpress D-PHY Automated Solution 57

Application Examples View Report for Group 1 Tests

Table 22: Conﬁguration parameters for Data Lane Fall Time

Parameter Default User deﬁned mod

Vertical Scal Vertical Pos Vertical Off Horizontal Sample Rat Record Length 1000000 100000 to 10000000

xxx

7. Click Ana

e(mV)

ition (div) set (V) Scale (us)

e(GS/s)

lyze. View and change the following analysis parameters:

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Table 23: Analysis parameters for Data Lane Fall Time

Parameter Default User deﬁned mode

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

8. Click Limits to view and change the Data Lane Fall Time DP and Data Lane Fall Time DN values in S, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

View Report for Group 1 Tests

The application automatically displays a report in the Report panel once the test is successfully completed. A table shows the test name, measurement details, test result (pass/fail), compliance mode, and analysis time. Save the report as an MHT ﬁle using the File > Save As option. The following screen shows the results for Group 1 tests.

58 TekExpress D-PHY Automated Solution

Application Examples Connections for Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

Connections for Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

Click here for information on connections for the Clock Lane LP-TX Thevenin Output High Level Voltage

(VOH) test.

Conﬁgure and Run Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

1. In the Select panel, select the Device.

2. Sel

3. Select Clock Lane Probing as Single-ended.

ect the Clock Mode as Normal.

TekExpress D-PHY Automated Solution 59

Application Examples Conﬁgure and Run Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

NOTE. The Clock Lane LP-TX Thevenin Output High Level Voltage (VOH) test is not available when the selected clock lane probing is Differential.

You can also perform Clock LP mode measurements using LP-HS transition.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁ

guration Panel, set the following parameters for the acquire type Clock Lanes Acquisition in Escape Mode with Clock as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 24: Conﬁguration parameters for Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 25: Analysis parameters for Clock Lane LP-TX Thevenin Output High Level Voltage (VOH)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch3 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Level for Clock

Continuous Mode (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

1 Enter a value based on the test

0.05 0.05, 0.1, 1

0.2 0.2, 0,05, 0.1

500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the Clock Lane LP-TX Thevenin Output High Voltage CP and Clock Lane LP-TX Thevenin Output High Voltage CN values in mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

60 TekExpress D-PHY Automated Solution

Application Examples Connections for Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock (Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Click here for information on connections for the Clock Lane LP-TX Thevenin Output Low Level Voltage

(VOL) test.

Conﬁgure and Run Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

NOTE. The Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL) test is not available when the selected clock lane probing is Differential.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Clock Lanes Acquisition

in Escape Mode with Clock as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 26: Conﬁguration parameters for Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

TekExpress D-PHY Automated Solution 61

Application Examples Connections for Clock Lane Rise Time

7. Click Analyze. View and change the following analysis parameters:

Table 27: Analysis parameters for Clock Lane LP-TX Thevenin Output Low Level Voltage (VOL)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch3 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Level for Clock

Continuous Mode (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

1 Enter a value based on the test

0.05 0.05, 0.1, 1

0.2 0.2, 0.05, 0.1

500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the Clock Lane LP-TX Thevenin Output Low Voltage CP and Clock Lane LP-TX Thevenin Output Low Voltage CN values, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Clock Lane Rise Time

Click here for information on connections for the Clock Lane Rise Time test.

Conﬁgure and Run Clock Lane Rise Time

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

NOTE. The Clock Lane Rise Time test is not available when the selected clock lane probing is Differential.

4. Select the Test Mode as Escape.

62 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Clock Lane Rise Time

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Clock Lanes Acquisition

in Escape Mode with Clock as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 28: Conﬁguration parameters for Cloc k Lane Rise Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 29: Analysis parameters for Clock Lane Rise Time

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch3 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Level for Clock

Continuous Mode (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

1 Enter a value based on the test

0.05 0.05, 0.1, 1

0.2 0.2, 0.05, 0.1

500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the Clock Lane Rise Time CP and Clock Lane Rise Time CN values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. In the Select panel, click Run to start the test. The Acquire panel shows the progress and status ofthetestasitruns.

TekExpress D-PHY Automated Solution 63

Application Examples Connections for Clock Lane Fall Time

Connections for Clock Lane Fall Time

Click here for information on connections for the Clock Lane Rise Time test.

Conﬁgure and Run Clock Lane Fall Time

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

NOTE. The Clock Lane Fall Time test is not available when the selected clock lane probing is Differential.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the acquire type Clock Lanes Acquisition

in Escape Mode with Clock as Trigger. The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 30: Conﬁguration parameters for Clock Lane Fall Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 31: Analysis parameters for Clock Lane Fall Time

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch3 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V)

1 Enter a value based on the test

0.05 0.05, 0.1, 1

64 TekExpress D-PHY Automated Solution

Application Examples Connections for Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

Table 31: Analysis parameters for Clock Lane Fall Time (cont.)

Parameter Default User deﬁned mode

Trigger Level for Clock Continuous Mode (V)

Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

0.2 0.2, 0.05, 0.1

500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

8. Click Limits to view and change the Clock Lane Fall Time CP and Clock Lane Fall Time CN values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click

Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

p and Clkn) sources.

(Clk

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for C lock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

Click here for information on connections for the Clock Lane LP-TX Slew Rate Versus CLOAD test.

Conﬁgure and Run Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal.

3. Select Clock Lane Probing as Single-ended.

NOTE. The Clock Lane Fall Time test is not available when the selected clock lane probing is Differential.

4. Select the Test Mode as Escape.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

TekExpress D-PHY Automated Solution 65

Application Examples Conﬁgure and Run Clock Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

6. In the Conﬁguration Panel, set the following parameters for the acquire type Clock Lanes Acquisition in Escape Mode with Clock as Trigger. The following table lists the compliance mode values and the permitted ran

ge of values for the user-deﬁned mode:

Table 32: Conﬁguration parameters for Clock Lane Fall Time

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

200 100, 200, 300 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 33: Analysis parameters for Clock Lane Fall Time

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch3 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Level for Clock

1 Ente

0.05 0.05

0.2 0.2

r a value based on the test

,0.1,1

, 0.05, 0.1

Continuous Mode (V) Trigger Time (pS) Trigger Transition Trigger Slope

500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Clock Lane Fall Time CP and Clock Lane Fall Time CN values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

66 TekExpress D-PHY Automated Solution

Application Examples View Report for Group 2 Tests

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock (Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

View Report for Group 2 Tests

The application automatically displays a report in the Report panel once the test is successfully completed. A t able shows the test name, measurement details, test result (pass/fail), compliance mode, and analysis time. Save the report as an MHT ﬁle using the File > Save As option. The following screen shows the results for Group 2 tests.

Connections for Data Lane HS Entry: Data Lane TLPX Value

Click here for information on connections for the Data Lane HS Entry: Data Lane TLPX Value test.

Conﬁgure and Run Data Lane HS Entry: Data Lane TLPX Value

The Data Lane HS Entry: Data Lane TLPX Va lue test is supported on LP-HS waveforms although it is not recommended to use LP-HS waveforms for this test.

TekExpress D-PHY Automated Solution 67

Application Examples Conﬁgure and Run Data Lane HS Entry: Data Lane TLPX Value

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

NOTE. The Clock mode Continuous is available only when the test mode is Normal.

3. Select Clock Lane Probing as Single-ended.

NOTE. The Data Lane HS Entry: Data Lane TLPX Value test is not available when the selected clock lane probing is Differential.

4. Select the Test Mode as Escape or Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 34: Conﬁguration parameters for Data Lane HS Entry: Data Lane TLPX Value

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Position for C lock (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

Table 35: Analysis parameters for Data Lane HS Entry: Data Lane TLPX Value

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level V) Trigger Time (pS) Trigger Transition

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than

68 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane HS Entry: THS-PREPARE Value

Table 35: Analysis parameters for Data Lane HS Entry: Data Lane TLPX Value (cont.)

Parameter Default User deﬁned mode

Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

Positive Positive, Negative, Either

8. Click Limits to view and change the Data Lane HS Entry DATA Lane TLP value and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane HS Entry: THS-PREPARE Value

Click here for information on connections for the Data Lane HS Entry: THS-PREPARE Value test.

Conﬁgure and Run Data Lane HS Entry: THS-PREPARE Value

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 36: Conﬁguration parameters for Data Lane HS Entry: THS-PREPARE Value

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Position for Clock (div)

Single-ended probing Differential probing

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

–3 to +3 +3 to –3

TekExpress D-PHY Automated Solution 69

Application Examples Conﬁgure and Run Data Lane HS Entry: THS-PREPARE Value

Table 36: Conﬁguration parameters for Data Lane HS Entry: THS-PREPARE Value (cont.)

Parameter Default User deﬁned mode

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 37

: Analysis parameters for Data Lane HS Entry: THS-PREPARE Value

Parameter Default User deﬁned mode

rType

Trigge

r Source

Trigge

er Upper Level (V)

Trigg

er Lower Level (V)

Trigg

ger Time (pS)

Trig Trigger Transition

gger Slope

Tri

igger If Violation

xxx

tion

Transi Ch1 Ch1, Ch

Transi

tion

2, Ch3, Ch4

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500

ater Than

Gre

ater Than, Less Than

Gre Positive Positive, Negative, Either Oc

curs

curs, Logic

8. Click Limits to view and c hange the Data Lane HS Entry: THS-PREPARE values in ns, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

70 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane HS Entry: THS-PREPARE + THS-ZERO Value

Connections for Data Lane HS Entry: THS-PREPARE + THS-ZERO Value

Click here for information on connections for the Data Lane HS Entry: THS-PREPARE + THS-ZERO

Value test.

ConﬁgureandRunDataLaneHSEntry:THS-PREPARE+THS-ZERO Value

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 38: Conﬁguration parameters for Data Lane HS Entry: THS-PREPARE + THS-ZERO

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Position for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

–3 to +3 –3 to –3

7. Click Analyze. View and change the following analysis parameters:

Table 39: Analysis parameters for Data Lane HS Entry: THS-PREPARE + THS-ZERO

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V)

1 Enter a value based on the test

TekExpress D-PHY Automated Solution 71

Application Examples Connections for Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Table 39: Analysis parameters for Data Lane HS Entry: THS-PREPARE + THS-ZERO (cont.)

Parameter Default User deﬁned mode

Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Data Lane HS Entry: THS-PREPARE + THS-ZERO values in ns, and t

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

he compare string.

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

nections for D ata Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Con

ck here

Cli

VOD(1)) Value test.

onﬁgure and Run Data Lane HS-TX Differential Voltages (VOD(0),

OD(1))

1.I

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

for information on connections for the Data Lane HS-TX Differential Voltages (VOD(0),

n the Select panel, select the Device.

72 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Table 40: Conﬁguration parameters for Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Parameter Default User deﬁned mod

Vertical Scal Vertical Pos Vertical Pos

e(mV) ition for Data (div) ition for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

+3 to –3 –3 to +3

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 41: Analysis parameters for Data Lane HS-TX Differential Voltages (VOD(0), VOD(1))

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the VOD(1) and VOD(0) values in mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 73

Application Examples Connections for Data Lane HS-TX Differential Voltage Mismatch (VOD)

Connections for Data Lane HS-TX Differential Voltage Mismatch (VOD)

Click here for information on connections for the Data Lane HS-TX Differential Voltage Mismatch

(VOD) Value test.

Conﬁgure and Run Data Lane HS-TX Differential Voltage Mismatch (VOD)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 42: Conﬁguration parameters for D ata Lane HS-TX Differential Voltage Mismatch (V

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Position for C lock (div)

Single-ended probing Differential probing

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3

+2.6 –3 to +3

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

OD)

7. Click Analyze. View and change the following analysis parameters:

Table 43: Analysis parameters for Data Lane HS-TX Differential Voltage Mismatch (VOD)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V)

1 Enter a value based on the test

0.05 0.05, 0.1, 1

74 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane

HS-TX Single-E

Table 43: Analysis parameters for Data Lane HS-TX Differential Voltage Mismatch (VOD) (cont.)

Parameter Default User deﬁned mode

Trigger Time (pS) Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the VOD values in mV, and t he compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

nded Output High Voltages ((VOHHS(DP), VOHHS(DN))

Connections for Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP), VOHHS(DN))

Click here for information on connections for the Data Lane HS-TX Single-Ended Output High Voltages

OHHS(DP), VOHHS(DN)) test.

((V

Conﬁgure and Run Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP), VOHHS(DN))

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

TekExpress D-PHY Automated Solution 75

Application Examples Conﬁgure and Run Data Lane

HS-TX Single-E

nded Output High Voltages ((VOHHS(DP), VOHHS(DN))

Table 44: Conﬁguration parameters for Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP), VOHHS(DN))

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Position for C lock (div) Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

200 50, 100, 200 –2.6 +3 to –3 –2.6 +3 to –3 0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 45: Analysis parameters for Data Lane HS-TX Single-Ended Output High Voltages ((VOHHS(DP), VOHHS(DN))

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xxx

8. Click Limits to view and change the Data Lane HS-TX Single-Ended Output High Voltages DP and DN values in mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

76 TekExpress D-PHY Automated Solution

Application Examples Connections for

Data Lane HS-TX

Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

Connections for Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

Click here for information on connections for the Data Lane HS-TX Static Common-Mode Voltages

(VCMTX(1), VCMTX(0)) test.

Conﬁgure and Run Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Vers

ion default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range

ues for the user-deﬁned mode:

of val

Table 46: Conﬁguration parameters for Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

meter

Para

tical Scale (mV)

Ver

tical Position for Data (div)

Ver

rtical Position for Clock (div)

Single-ended probing Differential probing

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

ult

Defa

200 50, 100, 200 –2.6 +3 to –3

–2 +2.6 0Do 88

12.5 7.5, 10, 12.5

deﬁned mode

User

to –3

+3 –3 to +3

not change

, 10, 12

7. Click Analyze. View and change the following analysis parameters:

TekExpress D-PHY Automated Solution 77

Application Examples Connections for Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Table 47: Analysis parameters for Data Lane HS-TX Static Common-Mode Voltages (VCMTX(1), VCMTX(0))

Parameter Default User deﬁned mod

xxx

8. Click Li and the compare string.

9. Click C

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

mits to view and change the Common Mode Voltages VTX(0) and VTX(1) values in mV,

omments to enter comments. The comments are shown in the test report.

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

Connections for Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Click here for information on connections for the Data Lane HS-TX Static Common-Mode Voltage

Mismatch (VCMTX(1,0)) test

Conﬁgure and Run Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

78 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run

Data Lane HS-TX

Static Common-Mode Voltage Mismatch (VCMTX(1,0))

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for t

he user-deﬁned mode:

Table 48: Conﬁguration parameters for Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Position for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

7. Click Analyze. View and change the following analysis parameters:

49: Analysis parameters for Data Lane HS-TX Static Common-Mode Voltage Mismatch (VCMTX(1,0))

Table

Parameter Default User deﬁned mode

ger Type

Trig

ger Source

Trig

gger Upper Level (V)

Tri

gger Lower Level (V)

Tri

igger Time (pS)

Tr Trigger Transition

rigger Slope

T Trigger If Violation Occurs Occurs, Logic

xxx

sition

Tran Ch1 Ch1, 1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500

reater Than

G Negative Positive, Negative, Either

sition

Tran

Ch2, Ch3, Ch4

reater Than, Less Than

8. Click Limits to view and change the Common Mode Voltage Mismatch values in mV, and the

compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 79

Application Examples Connections for Data Lane

HS-TX Dynamic C

ommon-Level Variations Between 50-450MHz (VCMTX(LF))

Connections for Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

Click here for information on connections for the Data Lane HS-TX Dynamic Common-Level Variations

Between 50-450MHz (VCMTX(LF)) test

Conﬁgure and Run Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

The Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF)) test uses a band pass ﬁlter. To perform the measurement, the appli (unﬁltered) and the ﬁltered waveform as follows:

1. Acquires unﬁltered waveforms from the oscilloscope channels. Typical waveform names are like

Filter_Lane1_DN.wfm BandPass Filter_Lane1_DP.wfm

Acq1_Data Lanes Acquisition with Data As Trigger and BandPass

and Acq1 _Data Lanes Acquisition with Data As Trigger and

cation uses both the original waveform

2. Applies a band pass ﬁlter on live channels and stores them on the Math channel. Typical ﬁltered waveform ﬁle name are like

Filter_DN.WFM ter_DP.WFM

3. Saves both Live and Math waveforms to the disk.

4. Performs the measurement using both the Live

In the pre-recorded mode, it is enough if you to select the unﬁltered waveforms. However, make sure that the ﬁltered waveforms are in the same folder as the unﬁltered w aveforms for these measurements to run correctly in pre-recorded mode. The ﬁltered waveforms for the measurements must be the ones saved by the TekExpress application. The measurements will not work as expected if any other ﬁltered waveforms are used. .

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data Lanes Acquisition with

Data as Trigger and BandPass Filter). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

and Lane1_FilteredTwoChannelwithDataasTriggerAndBandPassFil-

Lane1_FilteredTwoChannelwithDataasTriggerAndBandPass-

and Math waveforms.

80 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane

HS-TX Dynamic C

ommon-Level Variations Between 50-450MHz (VCMTX(LF))

Table 50: Conﬁguration parameters for Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div)

200 100, 200, 300 –2.6 +3 to –3

Vertical Position for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 51: Analysis parameters for Data Lane HS-TX Dynamic Common-Level Variations Between 50-450MHz (VCMTX(LF))

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xx x

8. Click Limits to view and change the Data Lane HS-TX Dynamic Common-Level Variations value in

mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 81

Application Examples Connections for Data Lane

HS-TX Dynamic C

ommon-Level Variations Above 450MHz (VCMTX(HF))

Connections for Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (VCMTX(HF))

Click here for information on connections for the Data Lane HS-TX Dynamic Common-Level Variations

Above 450MHz (VCMTX(HF)) test

Conﬁgure and Run Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (VCMTX(HF))

The Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (VCMTX(LF)) test uses a high pass ﬁlter. To perform the measurement, the applicatio and the ﬁltered waveform as follows:

1. Acquires unﬁltered waveforms from the oscilloscope channels. Typical waveform names are like

Filter_Lane1_DN.wfm HighPass Filter_Lane1_DP.wfm

Acq2_Data Lanes Acquisition with Data As Trigger and HighPass

and Acq2 _Data Lanes Acquisition with Data As Trigger and

n uses both the original waveform (unﬁltered)

2. Applies a high pass ﬁlter on live channels and stores them on the Math channel. Typical ﬁltered waveform ﬁle names are like

PassFilter_DN.WFM Filter_DP.WFM

3. Saves both Live and Math waveforms to the disk.

4. Performs the measurement using both the Live

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data Lanes Acquisition with

Data as Trigger and HighPass Filter). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Lane1_FilteredTwoChannelwithDataasTriggerAndHigh-

and Lan e1_FilteredTwoChannelwithDataasTriggerAndHighPass-

and Math waveforms.

82 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane

HS-TX Dynamic C

ommon-Level Variations Above 450MHz (VCMTX(HF))

Table 52: Conﬁguration parameters for Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (VCMTX(HF))

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div)

200 100, 200, 300 –2.6 +3 to –3

Vertical Position for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s)

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

Record Length 1000000 100000 to 10000000

xxx

7. Click Analyze. View and change the following analysis parameters:

Table 53: Analysis parameters for Data Lane HS-TX Dynamic Common-Level Variations Above 450MHz (VCMTX(HF))

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS) Trigger Transition Trigger Slope

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Negative Positive, Negative, Either

Trigger If Violation Occurs Occurs, Logic

xx x

8. Click Limits to view and change the Data Lane HS-TX Dynamic Common-Level Variations value in

mV, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 83

Application Examples Connections for Data Lane HS-TX 20%-80% Rise time (tR)

Connections for Data Lane HS-TX 20%-80% Rise time (tR)

Click here for information on connections for the Data Lane HS-TX 20%-80% Rise time (tR) test.

Conﬁgure and Run Data Lane HS-TX 20%-80% Rise time (tR)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 54: Co nﬁguration parameters for Data LaneHS-TX20%-80%Risetime(tR)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position for Data (div) Vertical Position for C lock (div)

Single-ended probing Differential probing

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

7. Click Analyze. View and change the following analysis parameters:

Table 55: Analysis parameters for Data Lane HS-TX 20%-80% R ise time (tR)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4 Trigger Upper Level (V) Trigger Lower Level (V) Trigger Time (pS)

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500

84 TekExpress D-PHY Automated Solution

Application Examples Connections for Data Lane HS-TX 80%-20% Fall time (tF)

Table 55: Analysis parameters for Data Lane HS-TX 20%-80% Rise time (tR) (cont.)

Parameter Default User deﬁned mode

Trigger Transition Trigger Slope Trigger If Violation Occurs Occurs, Logic

xxx

Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the tR value in pS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane HS-TX 80%-20% Fall time (tF)

Click here for information on connections for the Data Lane HS-

TX 80%-20% Fall time (tF) test.

Conﬁgure and Run Data Lane HS-TX 80%-20% Fall time (tF)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 56: Conﬁguration parameters for Data Lane HS-TX 80%-20% Fall time (tF)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Position for Clock (div)

Single-ended probing

Differential probing

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

+3 to –3 –3 to +3

TekExpress D-PHY Automated Solution 85

Application Examples Connections for Data Lane HS Exit: THS-TRAIL Value

Table 56: Conﬁguration parameters for Data Lane HS-TX 80%-20% Fall time (tF) (cont.)

Parameter Default User deﬁned mode

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

7. Click Analyze. View and change the following analysis parameters:

57: Analysis parameters for Data Lane HS-TX 80%-20% Fall time (tF)

Table

Parameter Default User deﬁned mode

ger Type

Trig

ger Source

Trig

gger Upper Level (V)

Tri

gger Lower Level (V)

Tri

igger Time (pS)

Tr Trigger Transition

rigger Slope

T Trigger If Violation Occurs Occurs, Logic

xxx

sition

Tran Ch1 Ch1, 1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500

reater Than

G Positive Positive, Negative, Either

sition

Tran

Ch2, Ch3, Ch4

reater Than, Less Than

8. Click Limits to view and change the tF values in pS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

Connections for Data Lane HS Exit: THS-TRAIL Value

Click here for information on connections for the Data Lane HS Exit: THS-TRAIL Value test.

Conﬁgure and Run Data Lane HS Exit: THS-TRAIL Value

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

86 TekExpress D-PHY Automated Solution

Application Examples Conﬁgure and Run Data Lane HS Exit: THS-TRAIL Value

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). The following table lists the compliance mode values and the permitted range of values for the user-deﬁned mode:

Table 58: Conﬁguration parameters for Data Lane HS Exit: THS-TRAIL Value

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical P o sition for D ata (div) Vertical Position for Clock (div)

Single-ended probing

Differential probing Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

7. Click Analyze. View and change the following analysis parameters:

Table 59: Analysis parameters for Data Lane HS Exit: THS-TRAIL Value

Parameter Default User deﬁned mode

xxx

1 Enter a value based on the test

0.05 0.05, 0.1, 1 500 250, 500 Greater Than Greater Than, Less Than Positive Positive, Negative, Either

8. Click Limits to view and change the Data Lane THS-TRAIL values in nS, and the compare string.

9. Click Comments to enter comments. The comments are shown in the test report.

10. Click Save to effect the changes, or clickCancel.

11. Click the Acquire tab to view the acquisition parameters. Select the Data (Dp and Dn) and Clock

(Clkp and Clkn) sources.

12. Click Run to start the test. The Acquire panel shows the progress and status of the test as it runs.

TekExpress D-PHY Automated Solution 87

Application Examples Connections for Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

Connections for Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

Click here for information on connections for the Data Lane HS Exit: 30%–80% Post-EOT Rise Test

(TREOT) test.

Conﬁgure and Run Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

1. In the Select panel, select the Device.

2. Select the Clock Mode as Normal or Continuous.

3. Select Clock Lane Probing as Single-ended or Differential.

4. Select the Test Mode as Normal.

The Version default value is CTS 1.0.

5. Select the test and click Conﬁgure.

6. In the Conﬁguration Panel, set the following parameters for the test (Data and Clock Lanes Acquisition

with Data as Trigger). T

he following table lists the compliance mode values and the permitted range

of values for the user-deﬁned mode:

Table 60: Conﬁguration parameters for Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

Parameter Default User deﬁned mode

Vertical Scale (mV) Vertical Position fo Vertical Position f

Single-ended probing Differential probing

Vertical Offset (V) Horizontal Scale (us) Sample Rate (GS/s) Record Length 1000000 100000 to 10000000

xxx

r Data (div)

or Clock (div)

200 50, 100, 200 –2.6 +3 to –3

–2.6 +2.6

0 Do not change 8 8, 10, 12

12.5 7.5, 10, 12.5

+3 to –3 –3 to +3

7. Click Analyze. View and change the following analysis parameters:

Table 61: Analysis parameters for Data Lane HS Exit: 30%-80% Post-EOT Rise Test (TREOT)

Parameter Default User deﬁned mode

Trigger Type Transition Transition Trigger Source Ch1 Ch1, Ch2, Ch3, Ch4

88 TekExpress D-PHY Automated Solution

Tektronix TekExpress D-PHY Automated Solution User manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Introduction to the Application Related Documentation

Related Documentation

Conventions

Technical Support

Getting Started Compatibility

Compatibility

Minimum System Requirements

Install the Software

Application Directories and Usage

Folder Structure

File Name Extensions

Activate the License

Before You Click Run

Operating Basics D-PHY Application Overview

D-PHY Application Overview

Operating Basics Starting the Application

Resizing the A pplication Window

Exiting the Application

Global Controls

Menus

File Menu

View Menu

Tools Menu

Help Menu

How To Select Test(s)

Select Test(s)

View and Select Connected Instruments

Acquire Live Waveform for Analysis

Use Prerecorded Waveforms for Analysis

ViewtheProgressofAnalysis

View the Report

View Test Related Files

Application Examples View Test Related Files

Connection Setup

Temperature Chamber Testing

Multilane Testing with RF Switch

Connections for Data Lane Rise Time

Connections for Data Lane Fall Time

Connections for Data Lane LP-TX Slew Rate Versus CLOAD (ōVō/tSR)

Application Examples Connections for Data Lane LP-TX Period of Exclusive-OR Clock

View Report for Group 1 Tests

Connections for Clock Lane Rise Time

Connections for Clock Lane Fall Time

View Report for Group 2 Tests

Connections for Data Lane HS Entry: Data Lane TLPX Value

Connections for Data Lane HS Entry: THS-PREPARE Value

Connections for Data Lane HS Entry: THS-PREPARE + THS-ZERO Value

Connections for Data Lane HS-TX 20%-80% Rise time (tR)

Connections for Data Lane HS-TX 80%-20% Fall time (tF)

Connections for Data Lane HS Exit: THS-TRAIL Value