Tektronix TekExpress C-PHY v2.0 TX Automated Compliance Solution Online Help Online Help

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TekExpress® C-PHY Automated Test Software

Application Help (70K Series MSO/DPO)

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TekExpress® C-PHY Automated Test Software

Application Help (70K Series MSO/DPO)

*P077 1715 00*

077- 1715 -00

Table of Contents

Welcome..................................................................................................................................................................................... 10

C-PHY Tx 2.0 key features...................................................................................................................................................11

Getting help and support.............................................................................................................................................................12

Product documents.............................................................................................................................................................. 12

Conventions......................................................................................................................................................................... 12

Technical support................................................................................................................................................................. 13

Getting started.............................................................................................................................................................................14

Hardware requirements....................................................................................................................................................... 14

Supported oscilloscopes...............................................................................................................................................14

Minimum system requirements.....................................................................................................................................14

Instruments and accessories........................................................................................................................................ 15

Software requirements.........................................................................................................................................................15

Downloading and installing the software.......................................................................................................................15

Activate the license.......................................................................................................................................................15

View software version and license key details..............................................................................................................15

Setting up the test environment.................................................................................................................................................. 17

Installing the software.......................................................................................................................................................... 17

About setting up tests.......................................................................................................................................................... 17

Instrument connection setup................................................................................................................................................17

Search instruments connected to the application................................................................................................................ 22

Test setup overview............................................................................................................................................................. 23

About running tests.............................................................................................................................................................. 23

Before you click start............................................................................................................................................................23

Pre-test checklist..................................................................................................................................................................24

Launching the application........................................................................................................................................................... 25

Application controls..............................................................................................................................................................25

Options menu functions....................................................................................................................................................... 27

Configure email settings............................................................................................................................................... 28

TekExpress instrument control settings............................................................................................................................... 29

Setup panel: Configure the test setup.........................................................................................................................................30

DUT: Set DUT settings.........................................................................................................................................................31

Multiple-session run .....................................................................................................................................................34

Test Selection: Select the tests............................................................................................................................................ 34

Acquisitions: Set waveform acquisition settings.................................................................................................................. 35

Configuration: Set measurement limits for tests.................................................................................................................. 37

Preferences: Set the test run preferences........................................................................................................................... 41

Status panel: View the test execution status...............................................................................................................................43

View test execution status....................................................................................................................................................43

View test execution logs.......................................................................................................................................................44

Results panel: View summary of test results...............................................................................................................................46

Filter the test results.............................................................................................................................................................46

Reports panel: Configure report generation settings.................................................................................................................. 47

Report configuration settings............................................................................................................................................... 47

Configure report view settings............................................................................................................................................. 49

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 5

Table of Contents

View a generated report.......................................................................................................................................................50

Saving and recalling test setup................................................................................................................................................... 51

Test setup files overview...................................................................................................................................................... 51

Save the configured test setup............................................................................................................................................ 51

Load a saved test setup.......................................................................................................................................................51

Select a pre-run session from the loaded test setup............................................................................................................51

Save the test setup with a different name............................................................................................................................52

Application measurements..........................................................................................................................................................53

1.1.1 Thevenin Output High Level Voltage (VOH)............................................................................................................... 53

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)..................................................................................................... 53

1.1.3 LP-TX 15%-85% Rise Time (tRLP).............................................................................................................................53

1.1.4 LP-TX 15%-85% Fall Time (t

1.1.5 LP-TX Slew Rate versus C

1.1.6 LP-TX pulse width of Exclusive-OR Clock (t

1.1.7 LP-TX Period of Exclusive-OR Clock (t

1.1.8 t

value............................................................................................................................................................... 54

LP-EXIT

)................................................................................................................................ 53

FLP

(dV/dtSR).................................................................................................................. 54

LOAD

LP-PULSE-TX

LP-PER-TX

)............................................................................................ 54

)....................................................................................................... 54

1.2.1 tLPX Duration..............................................................................................................................................................55

1.2.2 t3-PREPARE Duration................................................................................................................................................ 55

1.2.3 t3-PREBEGIN Duration...............................................................................................................................................55

1.2.4 t3-PROGSEQ Duration............................................................................................................................................... 55

1.2.5 t3- PREEND Duration................................................................................................................................................. 56

1.2.6 t3-SYNC Duration ...................................................................................................................................................... 56

1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA).....................................................................................56

1.2.8 HS-TX Differential Voltage Mismatch (ΔVOD)............................................................................................................56

1.2.9 HS-TX Single-Ended Output High Voltages (VOHHS(VA), VOHHS(VB), VOHHS(VC))............................................ 56

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)......................................................................................................57

1.2.11 HS-TX Static Common-Point Voltage Mismatch (ΔVCPTX(HS))..............................................................................57

1.2.12 HS-TX Dynamic Common-Point Variations Between 50-450 MHz (ΔVCPTX(LF))...................................................57

1.2.13 HS-TX Dynamic Common-Point Variations Above 450 MHz (ΔVCPTX(HF))...........................................................57

1.2.14 HS-TX Rise Time (tR)............................................................................................................................................... 58

1.2.15 HS-TX Fall Time (tF).................................................................................................................................................58

1.2.16 t3-POST Duration..................................................................................................................................................... 58

1.2.17 30%-85% Post-EoT Rise Time (tREOT)...................................................................................................................58

1.2.18 tHS-EXIT Value.........................................................................................................................................................58

1.2.19 HS Clock Instantaneous UI (UIINST)........................................................................................................................59

1.2 20 HS Clock Delta UI (ΔUI) (OBSOLETE).....................................................................................................................59

1.2.21 HS-TX Eye Diagram................................................................................................................................................. 59

1.2.22 HS-TX UI Jitter (UI_JitterPEAK_TX).........................................................................................................................59

1.3.1 INIT: LP-TX Initialization Period (t

1.3.2 ULPS Exit: Transmitted t

1.3.3 BTA: TX-Side t

1.3.4 BTA: RX-Side t

1.3.5 BTA: RX-Side t

TA-GO

TA-SURE

TA-GET

WAKEUP

Interval Value.............................................................................................................................60

Interval Value..........................................................................................................................60

Interval Value............................................................................................................................61

INIT,MASTER

Interval.................................................................................................................... 60

1.4.1 HS-TX Differential Voltages Unterminated (V

1.4.2 HS-TX Differential Voltage Mismatch Unterminated (ΔV

1.4.3 HS-TX Single-Ended Output High Voltages Unterminated (V

1.4.4 HS-TX Static Common-Point Voltages Unterminated (V

)............................................................................................................. 60

OD(UT)-AB

, V

OD(UT)-BC

OD(UT)

CPTX(UT)

, V

OD(UT)-CA

)......................................................... 61

)................................................................................. 61

OHHS(UT)(VA)

, V

OHHS(UT)(VB),VOHHS(UT)(VC)

)....................61

)...............................................................................62

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 6

Table of Contents

1.5.1 t3-CALPREAMBLE Duration (Informative)..................................................................................................................62

1.5.2 t3-ASID Duration (Informative)....................................................................................................................................62

1.5.3 t3-CALALTSEQ Duration (Informative).......................................................................................................................62

1.5.4 Calibration Sequence t3-SYNC Duration (Informative)...............................................................................................63

SCPI Commands........................................................................................................................................................................ 64

About SCPI command......................................................................................................................................................... 64

Socket configuration for SCPI commands........................................................................................................................... 64

Set or query the device name of application........................................................................................................................70

Set or query the DUTID of application................................................................................................................................. 70

Set or query the suite name of the application.....................................................................................................................71

Set or query the test name of the application...................................................................................................................... 71

Set or query the version name of the application.................................................................................................................75

Set or query the general parameter values..........................................................................................................................75

Set or query the acquire parameter values..........................................................................................................................80

Set or query the analyze parameter values......................................................................................................................... 93

Set or query the user defined acquisition values................................................................................................................. 98

Query the available devices in the DUT panel of the application.........................................................................................98

Query the available suites for the selected device...............................................................................................................99

Query the list of available tests of the application................................................................................................................99

Query the available version names of the application......................................................................................................... 99

Query the list of available instruments based on the specified instrument type.................................................................100

Set or query the IP address of the instrument based on the specified instrument type.....................................................100

Query the information of the generated report file............................................................................................................. 101

Query the information of the generated waveform files..................................................................................................... 101

Query the information of the generated image files........................................................................................................... 101

Query the active TekExpress application name................................................................................................................. 102

Sets or query the acquire mode status.............................................................................................................................. 102

Set or query the execution mode status............................................................................................................................ 102

Generate the report for the current session....................................................................................................................... 103

Query the value of specified report header field in the report............................................................................................ 103

Query the value of specified result detail available in report summary/details table..........................................................104

Restore the setup to default settings................................................................................................................................. 105

Save the settings to a specified session............................................................................................................................ 105

Open the setup from a specified session...........................................................................................................................105

Query the current setup file name......................................................................................................................................106

Run/stop/pause/resume the selected measurements execution in the application........................................................... 106

Query the current measurement execution status............................................................................................................. 106

Query whether the current setup is saved or not saved.................................................................................................... 107

Query the status of the previous command execution.......................................................................................................107

Query the last error occurred............................................................................................................................................. 107

Set or query the popup details........................................................................................................................................... 107

Query the enable or disable status of Continuous run function......................................................................................... 108

Set or query the enable/disable status of Continuous Run function.................................................................................. 108

Set or query the enable/disable status of Verbose function...............................................................................................109

Set or query the continuous run duration time value......................................................................................................... 109

Set or query the session create option in the continuous run function...............................................................................110

Set or query the View report after generating option status............................................................................................... 111

Sets or query the limit values in the limits editor window................................................................................................... 111

Set or query the waveform file recalled for the specified test name and acquire type....................................................... 112

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 7

Table of Contents

Set the default session.......................................................................................................................................................112

Save the run/config sessions............................................................................................................................................. 112

Load the run/config session............................................................................................................................................... 113

Delete the run/config session.............................................................................................................................................113

Run the run/config saved session...................................................................................................................................... 113

Query the available list in the run/config session............................................................................................................... 114

Query the current run/config session................................................................................................................................. 114

Override the run/config session..........................................................................................................................................114

Example............................................................................................................................................................................. 115

References................................................................................................................................................................................ 118

Application directories........................................................................................................................................................ 118

File name extensions......................................................................................................................................................... 119

View test-related files......................................................................................................................................................... 119

Probe and termination voltage........................................................................................................................................... 120

Default values.................................................................................................................................................................... 122

Index......................................................................................................................................................................................... 124

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 8

Contacting Tektronix

Tektronix, Inc.

14150 SW Karl Braun Drive

P.O. Box 500

Beaverton, OR 97077

USA

For product information, sales, service, and technical support:

• In North America, call 1-800-833-9200.

• Worldwide, visit to www.tek.com find contacts in your area.

Contacting Tektronix

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 9

Welcome

The Tektronix C-PHY Tx 2.0 Automated Test software runs on Tektronix real-time oscilloscopes that are based on Windows 10 computer operating systems. C-PHY Tx 2.0 delivers the TekExpress based C-PHY automation solution with Tx measurement.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 10

Welcome

C-PHY Tx 2.0 key features

C-PHY Tx 2.0 delivers 100% Automated TekExpress based C-PHY solution for all the Tx measurements.

The TekExpress C-PHY application supports the following key features:

• Supports C-PHY specification version for MIPI C-PHY 1.0, 1.1, and 2.0

• Live and pre-acquired waveform Analysis

• Easily select and configure the desired tests

• Modify limits of test parameters for debug, margin, and characterization testing

• Supports LP-TX and HS-TX signaling tests at highest symbol rate — 8 GS/s

• Supports dynamic data rate updation for the waveform captured

• Options to select LVLP, LVHS, and ALP mode functionality for LP and HS tests

• Supports Eye Diagram Test with CTLE for symbol rates above 3.5 GS/s and without CTLE at symbol rates below 3.5 GS/s

• Supports Hexagonal shaped eye diagram for devices with maximum operating symbol rates <1 GS/s and for devices with maximum operating symbol rates ≥1 GS/s, a diamond shaped eye diagram is displayed

• Supports horizontal mask movement to a position where there are zero mask hits

• User-defined options to select three reference templates (Short, Standard, and Long) for differential insertion loss that are applicable for all symbol rates

• Provision to run in user-defined mode with user-defined parameters for triggering the LP-HS signals

• Manual Cursor Mode support to enable the user to capture and measure the desired LP-HS regions

• Debug Mode support to load waveforms on Ref and Math channels for Analysis

• Reporting measurement test run details and repeatability with option to save the waveforms only for a fail test run.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 11

Getting help and support

Product documents

Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program or operate the application, and do other tasks.

Table 1: TekExpress Application documents

To learn about Use this document

How to use the application

How to remotely control the instrument

TekExpress <Application Name> Help

PDF version of this document can be downloaded from www.tek.com/downloads

Compiled HTML (CHM) version is integrated with the application. Press F1 key from the keyboard to launch the help.

Tektronix Part Number: 077-xxxx-xx

Conventions

This application help uses the following conventions:

• The term "Application," and "Software" refers to the TekExpress Application.

• The term “DUT” is an abbreviation for Device Under Test.

• The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse or using the touch screen.

• A Note identifies important information.

Table 2: Icons used in the help

Icon Description

This icon identifies important information

This icon identifies conditions or practices that could result in loss of data.

This icon identifies additional information that will help you use the application more efficiently.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 12

Getting help and support

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See Contacting Tektronix at the front of this document for contact information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

General information

• All instrument model numbers

• Hardware options, if any

• Modules used

• Your name, company, mailing address, phone number, FAX number

• Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application specific information

• Software version number

• Description of the problem such that technical support can duplicate the problem

• If possible, save the setup files for all the instruments used and the application

• If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 13

Getting started

Hardware requirements

Supported oscilloscopes

The C-PHY Tx application runs on the following Tektronix oscilloscopes:

• MSO/DPO 72304DX

• MSO/DPO 72504DX

• MSO/DPO 73304DX

• DPO71304SX/DPO71604SX/DPO72304SX/DPO73304SX

• DPO75902SX/DPO75002SX/DPO77002SX/DPO73304SX stacked setup

Minimum system requirements

The following table shows the minimum system requirements for an oscilloscope to run TekExpress.

Table 3: System requirements

Component Requirement

Processor Same as the oscilloscope

Operating System Same as the oscilloscope:

Getting started

Win 10 64-bit

Memory Same as the oscilloscope

Hard Disk Same as the oscilloscope

Display

Firmware

Software

Other Devices

Note: If TekExpress is installed on a Tektronix oscilloscope, TekExpress uses a virtual GPIB port to communicate with

oscilloscope applications. If external GPIB communication devices such as USB-GPIB-HS or equivalent are used for instrument connectivity, make sure that the Talker Listener utility is enabled in the DPO/DSA/MSO oscilloscope GPIB menu. For ease of use, connect to an external (secondary) monitor.

Same as the oscilloscope

DPO/DSA/MSO TekScope v10.11.0.x or later and DPOJET verrsion is 10.2.0.x

• IronPython 2.7.3 installed

• MATLAB Compiler run time v8.0

• PyVisa 1.0.0.25 installed

• Microsoft .NET 4.0 Framework

• Microsoft Internet Explorer 7.0 SP1 or greater, or other Web browser for viewing reports

• Adobe Reader software 7.0 or greater for viewing portable document format (PDF) files

• Matched pair of SMA cables, two-set minimum for single lane

• Microsoft compatible mouse or compatible pointing device

If TekExpress is running on an instrument having a video resolution lower than 800x600 (for example, sampling oscilloscope), it is recommended that you connect a secondary monitor. The secondary monitor must be configured and active before launching the application.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 14

Getting started

See also

Supported oscilloscopes and probes

Instrument connection setup

Instruments and accessories

The table below lists the instruments and accessories for C-PHY application:

Table 4: Instruments and accessories

Component Description

Oscilloscope Supported oscilloscopes and probes

Probes P77xx (P7708/13/16/20) Series Tri-mode probe with P77STFLXA

solder-in tip with TekFlex connector technology (Quantity: 3 number).

Software requirements

Downloading and installing the software

Complete the following steps to download and install the latest TekExpress <Application Name> application.

1. Go to www.tek.com.

2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as Software and enter the application name in the MODEL OR KEYWORD field and click SEARCH.

3. Select the latest version of software and follow the instructions to download the software. Copy the executable file into the

oscilloscope.

4. Double-click the executable and follow the on-screen instructions.

The software is installed at C:\Program Files\Tektronix\TekExpress\TekExpress <Application Name>.

5. Select Analyze > TekExpress <Application Name> from the Oscilloscope menu, to open the application.

Activate the license

Activate the license using the Option Installation wizard in the TekScope application:

1. In the TekScope application menu bar, click Utilities > Option Installation. The TekScope Option Installation wizard opens.

2. Push the F1 key on the oscilloscope keyboard to open the Option Installation help topic.

3. Follow the directions in the help topic to activate the license.

View software version and license key details

To view version information of the application, click Options > About TekExpress.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 15

Getting started

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 16

Setting up the test environment

Installing the software

About setting up tests

Set up tests using the tabs in the Setup panel. Settings in the DUT tab use a top-down, left-to-right logic flow, so that any parameter that affects or acts as a filter for other parameters appears either to the top of or to the left of the affected parameters.

Tests are saved when you save a test setup. To avoid overwriting test results, remember to assign a unique name to the test either before running it or immediately after.

All listed tests are required for compliance testing.

See also

Test setup overview

Before you click Start

About running tests

Instrument connection setup

The following diagram shows how to connect the DUT to the oscilloscope for all the C-PHY Tx measurements.

Click Setup > Test Selection > Schematic to view the equipment setup diagram(s).

For Terminator, these probes can be connected through TCA-SMA or P77XX.

Note:

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 17

Setting up the test environment

Figure 1: LP Transmitter

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 18

Setting up the test environment

Figure 2: LP-HS RTB

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 19

Setting up the test environment

Figure 3: HS Transmitter Direct Connection

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 20

Setting up the test environment

Figure 4: HS Transmitter with RTB

Figure 5: LP Bus Turnaround

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 21

Setting up the test environment

See also

Minimum system requirements

Search instruments connected to the application

About setting up tests

Search instruments connected to the application

Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The application uses TekVISA to discover the connected instruments.

Note: The instruments required for the test setup must be connected and detected by the application, before running the test.

To refresh the list of connected instruments:

1. Select Options > Instrument Control Settings.

2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to

search. Instrument search is based on the VISA layer, but different connections determine the resource type, such as LAN, GPIB, and USB. For example, if you choose LAN, the search will include all the instruments supported by the TekExpress that are communicating over the LAN.

3. Click Refresh. The TekExpress application searches for the connected instruments.

Figure 6: Search status of the instruments connected to LAN

4. When the search is complete, a dialog box lists the instrument-related details based on the search criteria. For example, for the Search Criteria as LAN and GPIB, the application displays all the LAN and GPIB instruments connected to the application.

Figure 7: TekExpress Instrument Control Settings window

The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the Last Updated field.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 22

Setting up the test environment

Test setup overview

A test setup includes configuration parameters and report options. Use the options in the Setup panel and Reports panel to select and configure tests.

1. Select the DUT parameters.

2. Select one or more tests.

3. Configure test parameters.

4. Select test notification preferences.

5. Select report options.

See also

Pre-test checklist

Before you click Start

About running tests

After selecting and configuring the test, review the pre-run checklist and then click Start to run the tests. While tests are running, you cannot access the Setup or Reports panels. To monitor the test progress, switch back and forth between the Status panel and the Results panel.

The application displays a report when the tests are complete. While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using the Alt + Tab key combination. To keep the TekExpress C-PHY Tx application on top, select Keep On Top from the C-PHY Tx Options menu.

See also

Configure test parameters

About setting up tests

Before you click Start

Before you click start

Before you run tests for the first time, do the following:

1. Understand where your test files are stored on the instrument.

2. Map my TekExpress folder as X: (X drive) on all instruments used in test setup running Microsoft Windows Operating System.

The My TekExpress folder has the shared name format <domain><user ID>My TekExpress. Or, if the instrument is not connected to a domain, then the shared name format is <instrument name><user ID>My TekExpress. This shared folder is used to save the test session files and is used during any other file transfer operations.

If the X: drive is mapped to any other shared folder, the application will display a warning message asking you to

Note:

disconnect the X: drive manually.

3. Make sure that the My TekExpress folder has read and write access and that the contents are not set to be encrypted:

a. Right-click the My TekExpress folder and select Properties. b. Select the General tab and then click Advanced. c. In the Advanced Attributes dialog box, make sure that the option Encrypt contents to secure data is NOT selected.

4. Review the pre-run checklist before you run a test.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 23

Setting up the test environment

See also

View test-related files

Application directories and file types

File name extensions

Pre-test checklist

Do the following before you click Start to run a test. If this is the first time you are running a test for a setup, refer to the information in

Before you click Start.

On the oscilloscope:

• Make sure that all the required instruments are properly warmed up (approximately 20 minutes).

• Perform Signal Path Compensation (SPC).

• Perform deskew on any cables.

In the C-PHY Tx application:

• Verify that the application is able to find the instrument. If it cannot, perform a search for connected instruments.

See also

Instrument connection setup

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 24

Launching the application

To launch the TekExpress C-PHY, select Analyze > TekExpress C-PHY from the oscilloscope menu bar.

Launching the application

During launch, a "My TekExpress" folder is created in the Documents folder of the current user and gets mapped to "X" drive. When the application is closed properly, the "X" drive gets unmapped. Session files are then stored inside the X:\C-PHY folder. If this file is not found, the application runs an instrument discovery program to detect connected instruments before launching TekExpress C-PHY.

To keep the TekExpress C-PHY application on top of any application, select Keep On Top from the options menu. If the application goes behind the oscilloscope application, select Analyze > TekExpress C-PHY to bring the application to the front.

Application controls

This section describes the application controls.

Table 5: Application control description

Item Description

Options menu Menu to display global application controls.

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 25

Item Description

Test panel Controls that open tabs for configuring test settings and options.

Launching the application

Start / Stop button

Pause / Continue button Use the Pause button to pause the acquisition. When a test is paused, this button changes

Clear button

Application window move icon

Minimize icon Minimizes the application.

Use the Start button to start the test run of the measurements in the selected order. If prior acquired measurements are not cleared, then new measurements are added to the existing set.

The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.

as Continue.

Use the Clear button to clear all existing measurement results. Adding or deleting a measurement, or changing a configuration parameter of an existing measurement, also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on Results panel: View

summary of test results on page 46.

Note: This button is visible only when there are results data on the panel.

Place the cursor over the top of the application window to move the application window to the desired location

Close icon Close the application.

Mini view / Normal view

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 26

Toggles the application between mini view and normal view.

Mini view displays the run messages with the time stamp, progress bar,

Start / Stop button, and Pause / Continue button.

The application moves to mini view when you click the Start button.

Options menu functions

To access the Options menu, click in the upper-right corner of the application. It has the following selections:

Options menu

Launching the application

Figure 8: Option menu

Table 6: Options menu settings

Menu Function

Default Test Setup Opens a new test setup with default configurations.

Open Test Setup Opens a previously saved test setup. Displays the list of previously saved test setup file

names. Make the selection and click OK to open the test setup.

Save Test Setup Saves the current test configurations with the specified file name.

Save Test Setup As Saves the current test setup with a different file name or file type.

Open Recent Displays the recently opened test setup file names. Make the selection and click OK to

open the test setup.

Instrument Control Settings

Keep On Top

Email Settings Configures email options for test run and result notifications.

Help Displays the TekExpress help.

About TekExpress

Detects, lists, and refreshes the connected instruments found on the specified connections (LAN, GPIB, USB, Serial, Non-VISA Resources, TekLink, and VXI).

Always keeps the TekExpress application on top of all the applications.

Displays the application name, version, and hyperlink to end the user license agreement.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 27

Launching the application

Configure email settings

Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to configure email settings:

Figure 9: Email settings window

1. Select Options > Email Settings to open the Email Settings dialog box.

2. (Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate

the addresses with commas.

3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name,

followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example: user@yourcompany.com.

4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location,

and the SMTP Port number, in the corresponding fields.

If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.

If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.

Note:

5. In the Email Attachments section, select from the following options:

• Reports: Select to receive the test report with the notification email.

• Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

6. In the Email Configuration section:

• Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 5 MB.

• Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

8. To test your email settings, click Test Email.

9. To apply your settings, click Apply.

10. Click Close when finished.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 28

Launching the application

TekExpress instrument control settings

Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected instrument is displayed in the Retrieved Instruments window.

To access, click Options > Instrument Control Settings. Select USB and LAN as search criteria for TekExpress application and click Refresh. The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in the test configuration section.

Figure 10: TekExpress Instrument Control Settings window

See also

Options menu functions on page 27

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 29

Setup panel: Configure the test setup

The Setup panel contains sequentially ordered tabs that help to guide you through a typical test setup process.

Items selected in one Setup tab may change options available in the other tabs. You can switch between the tabs in any order to modify your test parameters.

Also refer

DUT: Set DUT settings on page 31

Test Selection: Select the tests on page 34

Acquisitions: Set waveform acquisition settings on page 35

Configuration: Set measurement limits for tests on page 37

Preferences: Set the test run preferences on page 41

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 30

Setup panel: Configure the test setup

DUT: Set DUT settings

Use the Setup panel DUT tab to select parameters for the device under test. The settings are global and apply to all tests for the current session. The DUT settings available and the options in the drop-down list depends on the selections made in the settings. DUT settings also affect the list of available tests in the Test Selection tab.

Figure 11: DUT tab settings

Click Setup> DUT to access the DUT parameters.

Table 7: DUT tab parameter settings

Parameter Description

DUT ID

Comments icon (to the right of the DUT ID field)

Table continued…

Adds an optional text label for the DUT to reports. The default value is DUT001. The maximum number of characters is 32.

You cannot use the following characters in an ID name:

(.,..,...,\,/:?”<>|*).

Open a Comments dialog box which allows you to enter optional text to add to a report. You can enter a maximum number of 256 characters. Refer

Configure report view settings to enable or disable comments which appear

on the test report.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 31

Setup panel: Configure the test setup

Parameter Description

User Defined Acquisition

Acquire live waveforms Acquire active signals from the DUT for measurement and analysis.

Use prerecorded waveform files Run tests on a saved waveform. Refer Load a saved test

Session Allows you to save multiple config sessions and run multiple config/run

Device Select Device name as Transmitter.

Version Displays the CTS version. C-PHY application supports CTS 2.0, 1.1, and

Select the check box to enable Ref or Math channel in the Acquisitions tab and run the test.

Prerequisite:

• Ensure waveform is available/recalled on selected source each time before click on "Start".

• Waveform is saved for the selected source in TekExpress session and the scope settings are overridden during test run in UDA Mode.

setup on page 51 to save the test setup.

sessions together.

1.0 version.

Select the Version from the drop-down:

• C-PHY 2.0 for CTS 1.0 Spec 2.0

• C-PHY 1.1 for CTS 1.0 Spec 1.1

• C-PHY 1.0 for CTS 1.0 Spec 1.0

Device Profile

Symbol Rate Select one or multiple data rates for waveform acquisition.

Calculate Computes Symbol Rate of HS signals.

Note: There will be mis-match in the auto-calculated dynamic data rate value if the LP region is dominant in the captured signal from the DUT.

Auto calculation of Symbol Rate is applicable only for HS tests.

Signal Type Select the Signal type from the drop-down:

• HS

• LP

• LP-HS

Note: Based on the selection of Signal Type, the list of tests will change in the Test Selection panel.

LVLP Available only when Version=C-PHY 2.0

Select the check box to run the low voltage low power tests.

LVHS Available only when Version=C-PHY 2.0

Select the check box to run the low voltage high speed tests.

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 32

Setup panel: Configure the test setup

Parameter Description

ALP Mode Select the check box to run the Alternate Low Power

Note: It is applicable for Test ID 1.2.19 only

Termination Voltage Enter the Termination Voltage value for the direct connection from DUT to

oscilloscope.

Note: Equals 0 for RTB and VCPTX for direct connection.

T3 Post Duration (UI) Enter T3 Post Duration in terms of number of unit interval.

Note: Enter number of 4's, which should be adjustable at the transmitter from 7 UI minimum to 224 UI maximum in increments of 7 UI.

T3-PROGSEQ Select if DUT supports T3-PROGSEQ for Test ID 1.2.3, 1.2.4, 1.2.5, 1.2.6

PROGSEQ When selected, the DUT supports the programmable sequence.

Sequence Enter the programmable sequence value.

See also

About setting up tests

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 33

Setup panel: Configure the test setup

Multiple-session run

Multiple-sessions run feature allows you to save multiple config sessions and runs the multiple config/run sessions together.

Click ( ) button in the DUT panel. The Run/Config Sessions window displays the list of saved Run/Config sessions.

Run the test that are selected in the Test Selection tab, the Run sessions are created automatically and displayed in the Run/Config Sessions window after the test is executed. You can also save the Config session by configuring the settings in the application.

The Run/Config sessions window provides the summary of the sessions with session name, Type. You can also note-down the configuration changes in the comment column.

The Run/Config Session window allows you to save, load, delete, and set the sessions as default.

• Session name: Enter the name to save the config session. The maximum number of character supported is 40 and special characters (.,..,...,\,/:?”<>|*) are not supported.

• Save Session: Save current configuration as a session with the given session name.

• Close: Close the Run/Config Session window.

• Default Session: Sets the application configurations to default values.

• Load session: Load the selected config/run session.

• Delete Session(s): Delete the selected config/run session.

• Run Sessions: Run the selected config/run session.

Enable/ Disable the Multi Run session

By default the Multi Run Session is enabled in the application. Set the IsMultiSessionRunEnabled value to false to disable the Multi Run Session feature in the TekExpress.exe.Config file, which is downloaded along the application.

Test Selection: Select the tests

Use the Test Selection tab to select C-PHY tests. Listed tests depend on settings in the DUT tab.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 34

Setup panel: Configure the test setup

Table 8: Test Selection tab settings

Setting Description

Deselect All, Select All, Deselect or selects all tests in the list.

Select Required

Tests

Show MOI Displays MOI document when you click the button.

Schematic

Selects the required test in the listed tests.

Click a test to select or deselect. Selecting a test also show details about the selected test in the Test Description pane.

All required tests are selected in the Compliance test mode.

Displays equipment connection setup for the selected measurements. You need to select at least a measurement before you click the Schematic button.

See also

About setting up tests

Acquisitions: Set waveform acquisition settings

Use Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type and the tests selected.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 35

Setup panel: Configure the test setup

Table 9: Acquisition tab settings

Settings Description

Lane Select the lane from the drop-down:

• Lane0

• Lane1

• Lane2

• Lane3

View Probes Displays the list of connected probes.

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 36

Setup panel: Configure the test setup

Settings Description

VA, VB, VC Selects the lane from the drop-down and are based on the selection of User Defined

Acquisition in the DUT panel:

• CH1

• CH2

• CH3

• CH4

• REF1

• REF2

• REF3

• REF4

• MATH1

• MATH2

• MATH3

• MATH4

Acquisition and Save options

Save all waveforms before Analysis When selected saves all the waveforms. When it executes, all waveforms will be saved.

Show acquire parameters When enabled displays the parameter name.

TekExpress C-PHY saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder for each session (a session is started when you click the Start button). The folder path is X:\C-PHY\Untitled Session\<dutid>\<date>_<time>. Images created for each analysis, XML files with result values, reports, and other information specific to that particular execution are also saved in this folder. Saving a session moves the session file contents from the Untitled Session folder to the specified folder name and changes the session name to the specified name.

Configuration: Set measurement limits for tests

Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific configurations available in this tab depends on the selections made in the DUT panel and Test Selection panel.

Table 10: Configuration tab: Common parameters

Settings Description

Limits Editor Displays the upper and lower limits for the applicable measurement

using different types of comparisons.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 37

Setup panel: Configure the test setup

Figure 12: Configuration tab - Global Settings

Table 11: Configuration tab: Global settings

Settings Description

Instruments Detected Displays the instruments connected to this application. Click

on the instrument name to open a list of available (detected) instruments.

Select Options > Instrument Control Settings to refresh the connected instrument list refer TekExpress instrument control

settings on page 29

Use Cursors Select the cursor from the drop-down:

• Automatic: Displays the calculated results automatically.

• Manual: Application allows you to place the cursor on the desired region of acquired waveform. The cursors are used as the gating criteria for the measurement and provides the report for measured value.

Note: This is not applicable for Test ID 1.2.21, 1.2.22,

1.3.3, 1.3.4, and 1.3.5 measurements.

Autoset For Vertical Settings

Insertion Loss Va Select to browse the filter file for respective Va, Vb, and Vc

Sources.

Note: This is applicable for Test ID 1.2.21 and 1.2.22

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 38

Setup panel: Configure the test setup

Settings Description

CTLE

Note: This is applicable for Test ID 1.2.21 and 1.2.22

CTLE File Path Select to browse the filter file for Continuous Time Linear

Equalizer.

Figure 13: Configuration tab - Measurements

Table 12: Configuration tab: Measurement settings

Settings Description

Measurements Displays the measurement groups, that are selected in the Test

Selection tab. Select the respective test group to view or modify the measurement configuration.

Trigger settings

Trigger Type Transition Transition Time triggering allows you to trigger the time interval from

the low-to-high and/or high-to-low thresholds is slower (larger) than, or faster (smaller) than a specified time, with Positive, Negative, or Either polarity selected.

Edge Edge triggering is usually an adequate to give you a look at the

essential amplitude and timing characteristics of the waveform.

Width Width triggering allows you to accept (or reject) triggers, defined by

pulse widths that are between two defined time limits.

Source Source channel or waveform used to trigger or search. Types that

require multiple inputs will replace this control with a different source definition control.

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 39

Setup panel: Configure the test setup

Settings Description

Slope The slope controls provide the basic trigger point definition and

determine how a waveform is displayed

Level

Horizontal Settings

Record Length Specifies the waveform record length.

Sample Rate (GS/s) Specifies the oscilloscope's sample rate for all tests.

Vertical Settings

Data Vertical Scale (mV) Sets the Vertical Scale of the signal.

Vertical Position (div) Sets the Vertical Position of the signal.

Vertical Offset (V) Sets the channel signal vertical offset.

Note: This setting is not applicable for Reference Channels or UDA.

See also

Configure tests

About running tests

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 40

Setup panel: Configure the test setup

Preferences: Set the test run preferences

Use Preferences tab to set the application action on completion of a measurement. The Preferences tab has the feature to enable or disable certain options related to the measurement execution.

Refer the below table for the options available in the Preferences tab:

Table 13: Preferences tab settings

Setting Description

Execution Options

Acquire/Analyze each test <no> times (not applicable to Custom Tests)

Save data for initial <no> set of <type> waveforms Saves the set(s) of Pass/Fail waveforms to the session path.

Actions on Test Measurement Failure

On Test Failure, stop and notify me of the failure

Enable Logging

Capture snapshot

Table continued…

Select to repeat the test run by setting the number of times. By default, check box is disabled. Upon enabling, the default value is

10.

Select to stop the test run on Test Failure, and to get notified via email. By default, it is unselected. Click Email Settings to configure the email settings to receive notifications.

Select to record the actions of the user by the application. By default, it is selected.

Note: Uncheck and Check this feature for the log to be available in the session folder.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 41

Setup panel: Configure the test setup

Setting Description

Capture Analysis Region Snapshot Enables the Analysis region snapshot in the report.

Note: This is not applicable for Test ID 1.2.21, 1.2.22,

1.3.3, 1.3.4, and 1.3.5 measurements.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 42

Status panel: View the test execution status

The Status panel contains the Test Status and Log View tabs, which provides status on the test acquisition and analysis (Test Status) and listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start to execute the test. Select the

Test Status or the Log View tab to view these items while the test execution is in progress.

View test execution status

The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.

The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand ( collapse ( ) the table rows.

) and

Figure 14: Test execution status view in Status panel

Table 14: Test execution status table headers

Table Header Description

Test Name Displays the measurement name.

Acquisition Describes the type of data being acquired.

Acquire Status Displays the progress state of the acquisition:

• To be started

• Started

• Completed

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 43

Status panel: View the test execution status

Table Header Description

Analysis Status Displays the progress state of the analysis:

• To be started

• In Progress

• Completed

• Aborted

View test execution logs

The Test Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.

Figure 15: Log view in Status panel

Table 15: Status panel settings

Control Description

Message History Lists all the executed test operations and timestamp information.

Auto Scroll

Clear Log Clears all the messages from the log view.

Save

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 44

Enables automatic scrolling of the log view as information is added to the log during the test execution.

Saves the log file into a text file format. Use the standard Save File window to navigate to and specify the folder and file name to save the log text.

Status panel: View the test execution status

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 45

Results panel: View summary of test results

Figure 16: Results panel with measurement results

Click measurement.

icon on each measurement in the row to expand and to display the minimum and maximum parameter values of the

Filter the test results

Each column in the result table can be customized and displayed by enabling or disabling any column as per your requirement. You can change the view in the following ways:

• To remove or restore the Pass/Fail column, select Preferences > Show Pass/Fail.

• To collapse all expanded tests, select Preferences > View Results Summary.

• To expand all the listed tests, select View Results Details from the Preferences menu in the upper right corner.

• To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.

• To view the results grouped by lane or test, select the corresponding item from the Preferences menu.

• To expand the width of a column, place the cursor over the vertical line that separates the column from the column to the right. When the cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.

• To clear all test results displayed, click Clear.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 46

Reports panel: Configure report generation settings

to configure the report generation settings and select the test result information to include in the report. You can use the Reports panel to configure report generation settings, select test content to include in reports, generate the report, view the report, browse for reports, name and save reports, and select report viewing options.

Report configuration settings

The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 17: Report panel-Configuration tab details

Table 16: Report configuration panel settings

Control Description

View report after generating

View Click to view the most current report.

Generate Report Generates a new report based on the current analysis results.

Save As Specify a name for the report.

Report Update Mode Settings

Generate new report Each time when you click Run and when the test execution is complete, it will create a new

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 47

Automatically opens the report in a Web browser when the test execution is complete. This option is selected by default.

report. The report can be in either .mht, .pdf, or .csv file formats.

Reports panel: Configure report generation settings

Control Description

Append with previous run session Appends the latest test results to the end of the current test results report. Each time when

you click this option and run the tests, it will run the previously failed tests and replace the failed test result with the new pass test result in the same report.

Include header in appended reports Select to include header in appended reports.

Replace current test in previous run session Replaces the previous test results with the latest test results. Results from newly added

tests are appended to the end of the report.

In previous run, current session

In any run, any session Select to replace current test results in the report with the test result(s) in the selected run

Report Creation Settings

Report name

Select to replace current test results in the report with the test result(s) of previous run in the current session.

session’s report. Click and select test result of any other run session.

Displays the name and path of the <Application Name> report. The default location is at \My Documents>\My TekExpress\<Application Name>\Reports. The report file in this folder gets overwritten each time you run a test unless you specify a unique name or select to auto increment the report name.

To change the report name or location, do one of the following:

Save as type

Auto increment report name if duplicate

• In the Report Path field, type the current folder path and name.

• Double-click in the Report Path field and then make selections from the popup keyboard and click Enter.

Be sure to include the entire folder path, the file name, and the file extension. For example: C:\Documents and Settings\your user name\My Documents\My TekExpress\<Application Name> \DUT001.mht.

Note: You cannot set the file location using the Browse button.

Open an existing report

Click Browse, locate and select the report file and then click View at the bottom of the panel.

Saves a report in the specified file type, selected from the drop-down list. The report is saved in .csv, .pdf, or .mht.

Note:

If you select a file type different from the default, be sure to change the report file name extension in the Report Name field to match.

Sets the application to automatically increment the name of the report file if the application finds a file with the same name as the one being generated. For example: DUT001, DUT002, DUT003. This option is enabled by default.

Create report automatically at the end of the run

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 48

Select to create the report with the settings configured, at the end of run.

Reports panel: Configure report generation settings

Configure report view settings

The View Settings tab describes the report view settings to configure the Reports panel. Select report view settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 18: Report panel-View settings tab

Table 17: Report panel view settings

Control Description

Contents To Save Settings

Include pass/fail info in details table Select to include pass/fail information in the details table of the report.

Include detailed results Select to include detailed results in the report.

Include plot images Select to include the plot images in the report.

Include setup configuration

Include complete application configuration Select to include the complete application configuration in the report.

Include user comments

Group Report By

Test Name Select to group the test results based on the test name in the report..

Test Result Select to group the test results based on the test result in the report.

Sets the application to include hardware and software information in the summary box at the top of the report. Information includes: the oscilloscope model and serial number, the oscilloscope firmware version, and software versions for applications used in the measurements.

Select to include any comments about the test that you or another user have added in the DUT tab of the Setup panel. Comments appear in the Comments section, below the summary box at the beginning of each report.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 49

View a generated report

Sample report and its contents

A report shows detailed results and plots, as set in the Reports panel.

Reports panel: Configure report generation settings

Figure 19: Report of C-PHY

Setup Information The summary box at the beginning of the report lists setup configuration information. This information

includes the oscilloscope model and serial number, optical module model and serial number, and software version numbers of all associated applications.

The test summary table lists all the tests which are executed with its result status.

Measurement The measurement table displays the measurement related details with its parameter value.

User comments If you had selected to include comments in the test report, any comments you added in the DUT tab are

shown at the top of the report.

Note: To navigate to the plot click on the first row in the measurement table for each iteration.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 50

Saving and recalling test setup

Test setup files overview

Saved test setup information (such as the selected oscilloscope, general parameters, acquisition parameters, measurement limits, waveforms (if applicable), and other configuration settings) are saved under the setup name at X:\<Application Name>.

Use test setups to:

• Run a new session, acquire live waveforms, using a saved test configuration.

• Create a new test setup using an existing one.

• View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results summary.

• Run a saved test using saved waveforms.

Save the configured test setup

You can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s default value.

Select Options > Save Test Setup to save the opened setup.

Select Options > Save Test Setup As to save the setup with different name.

Load a saved test setup

To open (load) a saved test setup, do the following:

• Select Options > Open Test Setup.

• Select the setup from the list and click Open. Setup files are located at X:\<Application Name>.

Select a pre-run session from the loaded test setup

Complete the following steps to load a test setup from a pre-run session:

1. Select Options > Open Test Setup.

2. Select a setup from the list and then click Open. Setup files are located at X:\<Application Name>\.

3. Switch the mode to Pre-recorded waveform files in the DUT panel.

4. Select the required waveforms from the selected setup in the Acquisition tab and Run the required test.

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Save the test setup with a different name

To create a test setup with a different name, follow the steps:

1. Select Options > Open Test Setup.

2. Select a setup from the list and then click Open.

3. Click application setup and modify the parameters.

4. Click application reports and modify the report options.

5. Select Options > Save Test Setup As.

6. Enter the test setup name and click Save.

Saving and recalling test setup

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 52

Application measurements

1.1.1 Thevenin Output High Level Voltage (VOH)

CPHY-TX test verifies that Thevenin Output High Level Voltage (VOH) of the DUTs LP transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT

2. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

3. LP-1 states are found and VOH is measured as mode of all samples which are greater than 50% of absolute peak-to-peak of VA.

4. Repeat Step 3 for VB and VC waveform.

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

This CPHY-TX test verifies that Thevenin Output High Level Voltage (VOH) of the DUTs LP transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedures

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

3. LP-0 states are found and VOH is measured as mode of all samples which are less than 50% of absolute peak-to-peak of VA.

4. Repeat Step 3 for VB and VC waveform.

1.1.3 LP-TX 15%-85% Rise Time (tRLP)

This CPHY-TX test verifies that 15%-85% Rise Time (tRLP) of the DUT’s LP transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedures

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. LP regions are found from the acquired VA,VB, and VC waveform.

3. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

4. Refer 1.1.1 Thevenin Output High Level Voltage (VOH) on page 53 and 1.1.2 LP-TX Thevenin Output Low Level Voltage

(VOL) on page 53 to calculate VOH and VOL.

5. Repeat Step 4 to Step 5 for VB and VC waveform.

1.1.4 LP-TX 15%-85% Fall Time (t

This CPHY-TX test verifies that 15%-85% Fall Time (t Specification.

)

FLP

) of the DUT’s LP transmitter is within the conformance limits as per MIPI CPHY

FLP

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. LP regions are found from the acquired VA,VB, and VC waveform.

3. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 53

Application measurements

4. Refer 1.1.1 Thevenin Output High Level Voltage (VOH) on page 53 and 1.1.2 LP-TX Thevenin Output Low Level Voltage

(VOL) on page 53 to calculate VOH and VOL.

5. Fall Time (t

6. Repeat Step 4 to Step 5 for VB and VC waveform.

) is measured as mean of 15%-85% fall time for VA across all falling edges of LP region found.

FLP

1.1.5 LP-TX Slew Rate versus C

This CPHY-TX test verifies that slew rate (dV/dtSR) of the DUT’s LP transmitter is within the conformance limits as per MIPI CPHY Specification.

LOAD

(dV/dtSR)

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. LP regions are found from the acquired VA,VB, and VC waveform.

3. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

4. The maximum and minimum slew rate (dV/dtSR) for falling and rising edge is measured over desired region as per MIPI-CPHY CTS for

VA.

5. Repeat Step 4 for VB and VC waveform.

1.1.6 LP-TX pulse width of Exclusive-OR Clock (t

This CPHY-TX test verifies that pulse width (t MIPI CPHY Specification.

LP-PULSE-TX

) of the DUT’s LP transmitter XOR clock is within the conformance limits as per

LP-PULSE-TX

)

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. Mark1 and stop state are found from the acquired VA,VB, and VC waveform.

3. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

4. XOR clock computed from VA and VC waveform.

5. Pulse width is measured for the XOR clock based on minimum and maximum trip level defined in MIPI-CPHY CTS.

1.1.7 LP-TX Period of Exclusive-OR Clock (t

This CPHY-TX test verifies the period (t CPHY Specification.

LP-PER-TX

) of the DUT’s LP transmitter XOR clock is within the conformance limits as per MIPI

LP-PER-TX

)

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. Mark1 and stop state are found from the acquired VA,VB and VC waveform.

3. 400 MHz, 4th order Butterworth Lowpass test filter is applied to the acquired waveform.

4. XOR clock computed from VA and VC waveform.

5. Period is measured for the XOR clock based on minimum and maximum trip level defined in MIPI-CPHY CTS.

1.1.8 t

This CPHY-TX test verifies that t

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 54

LP-EXIT

value

of the DUT’s LP transmitter is within the conformance limits as per MIPI CPHY Specification.

LP-EXIT

Application measurements

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. t

interval is measured when VB rising edge crosses VIH_Min until VB falling edge VIL_Max up to the next sequence respectively.

LP-EXIT

1.2.1 tLPX Duration

This CPHY-TX test verifies that the duration (tLPX) of the final LP-001 state immediately before HS transmission is as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence is captured from DUT.

2. The desired LP region is found from the acquired waveforms.

3. tLPX duration is measured from the point where VA crosses below VIL_MAX till the point where VC crosses below VIL_MAX as

defined in MIPI CPHY CTS.

1.2.2 t3-PREPARE Duration

This CPHY-TX test verifies that the duration of the final LP-000 state immediately before HS transmission (t3-PREPARE) is as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence is captured from DUT.

2. The desired LP and HS regions are found from the acquired waveforms.

3. t3- PREPARE duration is measured from the point where VC crosses below VIL_MAX till the point where the VAB, VBC, and VCA

differential waveforms all cross above the minimum differential threshold level as defined in MIPI CPHY CTS.

1.2.3 t3-PREBEGIN Duration

This CPHY-TX test verifies that duration of t3-PREBEGIN is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence is captured from DUT.

2. The captured signal is decoded.

3. If t3-PROGSEQ is enabled, t3- PREBEGIN is measured from the start of HS burst (point where the VAB, VBC, and VCA differential

waveforms all cross above the minimum differential threshold level as defined in MIPI CPHY CTS) till start of t3-PROGSEQ.

4. Else, t3- PREBEGIN is measured from the start of HS burst (point where the VAB, VBC, and VCA differential waveforms all cross above the minimum differential threshold level as defined in MIPI CPHY CTS) till start of t3-PREEND.

1.2.4 t3-PROGSEQ Duration

This CPHY-TX test verifies that duration of t3-PREBEGIN is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence is captured from DUT.

2. The captured signal is decoded and t3- PROGSEQ sequence is read as input from user.

3. The given t3-PROGSEQ sequence is searched from the decoded bursts.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 55

Application measurements

1.2.5 t3- PREEND Duration

This CPHY-TX test verifies that duration of t3- CALALTSEQ is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence is captured from DUT.

2. The captured signal is decoded, and t3-PREEND, which is “3,3,3,3,3,3,3” is found from the decoded burst.

1.2.6 t3-SYNC Duration

This CPHY-TX test verifies that duration of t3- SYNC is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB & VC signals with HS burst sequence is captured from DUT.

2. The captured signal is decoded.

3. t3-SYNC Word, which is “3,4,4,4,4,4,3” is found from the decoded burst.

1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA)

This CPHY-TX test verifies that differential voltages (VOD_AB, VOD_BC, VOD_CA) of the DUT HS transmitter are within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Mean value of maximum VOD_AB for the Strong 1, Weak 0 and mean value of minimum VOD_AB for the Weak 0, Strong 0 levels of

the AB pair are calculated as defined in MIPI-CPHY CTS.

3. Repeat Step 2 for VBC and VCA waveform.

1.2.8 HS-TX Differential Voltage Mismatch (ΔVOD)

This CPHY-TX test Differential Voltage Mismatch (ΔVOD) of the DUT HS transmitter is within the conformance limits per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Refer 1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA) on page 56 to obtain VOD value for VAB, VBC, VCA

differential pairs.

3. Differential voltage mismatch, ΔVOD is calculated as defined in MIPI-CPHY CTS.

1.2.9 HS-TX Single-Ended Output High Voltages (VOHHS(VA), VOHHS(VB),

VOHHS(VC))

This CPHY-TX test verifies that single-Ended output high voltages (VOHHS(VA), VOHHS(VB), and VOHHS(VC)) of the DUT HS transmitter are less than the maximum conformance limit as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 56

Application measurements

2. Values of VOHHS(VA), VOHHS(VB), and VOHHS(VC) are calculated as defined in MIPI-CPHY CTS similar to the test 1.2.7 HS-TX

Differential Voltages (VOD_AB, VOD_BC, VOD_CA) on page 56 using VA, VB and VC signals.

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

This CPHY-TX test verifies that Static Common-Point Voltages (VCPTX) of the DUT HS transmitter are within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Mean values for VCPTX for each of the +x, +y, +z, -x, -y, and –z states are calculated as defined in MIPI-CPHY CTS.

1.2.11 HS-TX Static Common-Point Voltage Mismatch (ΔVCPTX(HS))

This CPHY-TX test verifies that Static Common-Point Voltage Mismatch (ΔVCPTX(HS)) of the DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Refer 1.2.10 HS-TX Static Common-Point Voltages (VCPTX) on page 57to calculate static common-mode levels for VA, VB and VC

signals.

3. Static common-point voltage mismatch is calculated as defined in MIPI CPHY CTS.

4. Repeat Step 2 to Step 3 for all Lanes.

1.2.12 HS-TX Dynamic Common-Point Variations Between 50-450 MHz

(ΔVCPTX(LF))

This CPHY-TX test verifies that AC Common-Point Signal Level Variations between 50 and 450 MHz (ΔVCPTX(LF)) of the DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Common-point voltage, VCPTX signal is computed and 8th-order Butterworth IIR bandpass filter with -3 dB cutoff frequencies of 50

MHz and 450 MHz is applied as defined in MIPI CPHY CTS.

3. The peak voltage of the bandpass-filtered VCPTX waveform is measured.

4. Repeat Step 2 to Step 5 for all Lanes.

1.2.13 HS-TX Dynamic Common-Point Variations Above 450 MHz (ΔVCPTX(HF))

This CPHY-TX test verifies that AC Common-Mode Signal Level Variations above 450 MHz (ΔVCPTX(HF)) of the DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Common-point voltage VCPTX signal is computed and 8th-order Butterworth highpass filter with cutoff frequencies of 450 MHz is

applied as defined in MIPI CPHY CTS.

3. The RMS value of the filtered VCPTX waveform is measured.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 57

Application measurements

1.2.14 HS-TX Rise Time (tR)

This CPHY-TX test verifies that Rise Time (tR) of the DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. The differential waveform is computed as difference of the VA and VB single-ended waveforms (VA-VB).

3. The averaged rise time waveform is computed for the strong zero to weak one transition.

4. Measure the Rise Time (tR) of the averaged reference waveform between the –58 and +58 mV levels.

1.2.15 HS-TX Fall Time (tF)

This CPHY-TX test verifies that Fall Time (tF)of the DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. The differential waveform is computed as difference of the VA and VB single-ended waveforms (VA-VB).

3. The averaged Fall Time (tF) is measured for the weak one to strong zero transition.

4. Measure the Fall Time (tF) of the averaged reference waveform between the –58 and +58 mV levels.

1.2.16 t3-POST Duration

This CPHY-TX test verifies that duration of HS-TX burst (t3-POST), is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. The captured signal is decoded and length of t3- POST is read as input from user.

3. The t3-POST sequence (all 4’s) of given length is searched from the decoded bursts.

1.2.17 30%-85% Post-EoT Rise Time (tREOT)

This CPHY-TX test verifies that 30%-85% Post-EoT Rise Time (tREOT)), is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. The differential waveform is computed as difference of single-ended waveforms VA and VC (VC–VA).

3. tREOT Rise Time is measured at the starting point where the differential waveform last crosses below the minimum valid HS-RX

differential threshold level (± 40 mV), until VA crosses VIH_MIN as defined in MIPI CPHY CTS.

1.2.18 tHS-EXIT Value

This CPHY-TX test verifies that duration of in the LP-111 (Stop) state, is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. tHS-EXIT interval for a given Lane is measured at the starting point which is from the end of the t3-POST interval until the VA (LP-001)

falling edge crosses VIL_MAX as defined in MIPI CPHY CTS.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 58

Application measurements

1.2.19 HS Clock Instantaneous UI (UIINST)

This CPHY-TX test verifies that Instantaneous Unit Interval values (UIINST), is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Differential waveforms are calculated to observe the zero crossings between each UI.

3. The UIINST values for each UI are measured as the difference between successive 0 V crossing times of the differential waveforms is

calculated as mentioned in MIPI CPHY CTS.

1.2 20 HS Clock Delta UI (ΔUI) (OBSOLETE)

This CPHY-TX test verifies that frequency stability of the DUT HS Clock during a single burst, is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Differential waveforms Vab are calculated to observe the zero crossings between each UI.

3. Butterworth lowpass filter with a -3 dB cutoff frequency of 2.0 MHz is applied.

4. The HS Clock Delta UI (ΔUI) values for each UI are measured as The widths for each UI is measured as the difference between

successive 0 V crossing times of the differential waveforms.

1.2.21 HS-TX Eye Diagram

This CPHY-TX test verifies that Transmitter Eye Diagram, is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with continuous pseudo random (PRBS9) HS test sequence is captured from DUT.

2. Capture at least 1 million UIs of the differential waveforms Vab from the HS sequence using the DSO

3. Generate RCLK

4. Reference channel and CTLE is applied on the differential waveform computed as required.

Devices that operates at Symbol Rate greater than 4.5 Gsps (Short Reference Channel), greater than 3.5 Gsps

Note:

(Standard Reference Channel), greater than 2.3 Gsps (Long Reference Channel) continuity CTLE should be used.

5. Check for mask hit using Eye Diagram as described in MIPI CPHY CTS.

6. Repeat Step 2 to Step 6 for VBC and VCA

1.2.22 HS-TX UI Jitter (UI_JitterPEAK_TX)

This CPHY-TX test verifies that Transmitter UI Jitter specification., is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with continuous pseudo random (PRBS9) HS sequence is captured from DUT.

2. Capture l000 UIs of the differential waveforms Vab from the HS sequence.

3. Generate the RCLK.

4. 25 GHz low pass filter applied on RCLK signal before performing measurements.

5. Reference channel and CTLE is applied on the differential waveform computed as required.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 59

Note: Devices that operates at Symbol Rate greater than 4.5 Gsps (Short Reference Channel), greater than 3.5 Gsps (Standard Reference Channel), greater than 2.3 Gsps (Long Reference Channel) continuity CTLE should be used.

6. The peak-to-peak values of the histogram are reported as mentioned in MIPI CPHY CTS.

7. Repeat Step 2 to Step 5 for Vbc and Vca.

Application measurements

1.3.1 INIT: LP-TX Initialization Period (t

This CPHY-TX test verifies that duration of the DUTs transmitted LP Initialization period (t per MIPI CPHY Specification.

INIT,MASTER

)

INIT,MASTER

) is within the conformance limits as

Procedure

1. Using DSO, VA, VB, and VC signals with LP signaling sequence is captured from DUT.

2. Desired LP region is found from the acquired VA,VB, and VC waveforms.

3. LP-111 initialization period is measured from the point where VA first crosses above VIH_MIN till the first point where VA crosses below

VIL_MAX as defined in MIPI-CPHY CTS.

1.3.2 ULPS Exit: Transmitted t

This CPHY-TX test verifies that duration of the DUTs transmitted Mark-1 (t conformance limits as per MIPI CPHY Specification.

WAKEUP

Interval

WAKEUP

) when initiating a ULPS Exit sequence is within the

Procedure

1. Using DSO, VA, VB, and VC signals with ULPS entry sequence followed by a Mark-1 ULPS Exit sequence is captured from DUT.

2. Desired LP region is found from the acquired VA, VB, and VC waveforms.

3. The t

LP-111 transition crosses VIH_MIN as defined in MIPI-CPHY CTS.

is measured from the point where the VA line of LP-100 transition crosses VIH_MIN, to the point where the VC line of

WAKEUP

1.3.3 BTA: TX-Side t

This CPHY-TX test verifies that DUT drives the Bridge state (LP-000) for the proper period (t per MIPI CPHY Specification.

TA-GO

Interval Value

) and is within the conformance limits as

TA-GO

Procedure

1. Using DSO, VA, VB, and VC signals with Turnaround sequence is captured from DUT.

2. The desired Link Turnaround sequence region is identified and recalled on DSO.

3. Measure the required LP-000 duration manually by placing the cursor on appropriate region as defined in MIPI-CPHY CTS.

4. TLPX Duration value is obtained (follow the procedure listed in the 1.2.1 tLPX Duration on page 55) which is updated in report for

reference under test comment as part of observable result.

1.3.4 BTA: RX-Side t

This CPHY-TX test verifies that DUT waits the required period (t the conformance limits as per MIPI CPHY Specification.

TA-SURE

Interval Value

TA-SURE

) while observing the TX-Side Bridge state (LP-000) and is within

Procedure

1. Using DSO, VA, VB, and VC signals with Turnaround sequence is captured from DUT.

2. The desired Link Turnaround sequence region is identified and recalled on DSO.

3. Measure the required LP-000 duration manually by placing the cursor on appropriate region as defined in MIPI-CPHY CTS.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 60

Application measurements

4. TLPX Duration value is obtained (follow the procedure listed in the 1.2.1 tLPX Duration on page 55) which is updated in report for reference under test comment as part of observable result.

1.3.5 BTA: RX-Side t

This CPHY-TX test verifies that DUT drives the Bridge state (LP-000) for the required period (t as per MIPI CPHY Specification.

TA-GET

Interval Value

) and is within the conformance limits

TA-GET

Procedure

1. Using DSO, VA, VB, and VC signals with Turnaround sequence is captured from DUT.

2. The desired Link Turnaround sequence region is identified and recalled on DSO.

3. Measure the required LP-000 duration manually by placing the cursor on appropriate region as defined in MIPI-CPHY CTS.

4. TLPX Duration value is obtained (follow the procedure listed in the 1.2.1 tLPX Duration on page 55) which is updated in report for

reference under test comment as part of observable result.

1.4.1 HS-TX Differential Voltages Unterminated (V

This CPHY-TX test verifies that Unterminated Differential Voltages (V the conformance limits as per MIPI CPHY Specification.

OD(UT)-AB

, V

OD(UT)-BC

OD(UT)-AB

, V

OD(UT)-CA)

OD(UT)-BC

of the DUT HS transmitter is within

, V

OD(UT)-CA

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Mode value of maximum V

are calculated as defined in MIPI-CPHY CTS.

3. Repeat Step 2 for VBC and VCA waveform.

OD(UT)-AB

for the Strong 1, Weak 0 and minimum V

OD(UT)-AB

for the Weak 0, Strong 0 levels of the AB pair

)

1.4.2 HS-TX Differential Voltage Mismatch Unterminated (ΔV

This CPHY-TX test verifies that Unterminated Differential Voltage Mismatch (ΔV limits as per MIPI CPHY Specification.

) of DUT HS transmitter is within the conformance

OD(UT)

)

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Refer 1.4.1 HS-TX Differential Voltages Unterminated (VOD(UT)-AB, VOD(UT)-BC, VOD(UT)-CA) on page 61 to obtain the V

value for VAB, VBC, and VCA differential pairs.

3. Differential voltage mismatch (ΔVOD) is calculated as defined in MIPI-CPHY CTS.

1.4.3 HS-TX Single-Ended Output High Voltages Unterminated (V

OHHS(UT)(VB),VOHHS(UT)(VC)

This CPHY-TX test verifies that Unterminated Single-Ended Output High Voltages (V DUT HS transmitter is within the conformance limits as per MIPI CPHY Specification.

)

OHHS(UT)(VA)

, V

OHHS(UT)(VB)

OHHS(UT)(VA)

, and V

OHHS(UT)(VC)

ODUT

) of the

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Refer 1.4.1 HS-TX Differential Voltages Unterminated (VOD(UT)-AB, VOD(UT)-BC, VOD(UT)-CA) on page 61 to calculate the mode

value of V

OHHS(UT)(VA)

, V

OHHS(UT)(VB)

, and V

OHHS(UT)(VC)

as defined in MIPI-CPHY CTS.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 61

Application measurements

1.4.4 HS-TX Static Common-Point Voltages Unterminated (V

This CPHY-TX test verifies that Static Common-Point Voltages (V MIPI CPHY Specification.

) of DUT HS transmitter is within the conformance limits as per

CPTX(UT)

)

Procedure

1. Using DSO, VA, VB, and VC signals with HS signaling sequence is captured from DUT.

2. Mean values for V

for each of the +x, +y, +z, -x, -y, and –z states are calculated as defined in MIPI-CPHY CTS.

CPTX(UT)

1.5.1 t3-CALPREAMBLE Duration (Informative)

This CPHY-TX test verifies that duration of t3-CALPREAMBLE is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence containing Format 1 Calibration Preamble is captured from DUT.

2. t3-CALPREAMBLE is measured from start of HS Burst (point where all 3 differential signals: VAB, VBC, VCA cross above the minimum

threshold ± 40 mV) till the start of t3-SYNC Word.

3. The captured signal is decoded, and t3-SYNC Word position is found from the decoded burst.

4. t3-CALPREAMBLE duration is measured from start of the HS burst to start of t3-SYNC Word. It is also verified that t3- CALPREAMBLE

contains all 1’s.

1.5.2 t3-ASID Duration (Informative)

This CPHY-TX test verifies that duration of t3-ASID is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence containing Format 2 Calibration Preamble is captured from DUT.

2. The captured signal is decoded, and t3-ASID, which is “3,3,3,3,3,3,3” is found from the decoded burst.

1.5.3 t3-CALALTSEQ Duration (Informative)

This CPHY-TX test verifies that duration of t3- CALALTSEQ is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence containing Format 2 Calibration Preamble is captured from DUT.

2. The captured signal is decoded.

3. t3-SYNC Word position and t3-ASID position is found from the decoded burst.

4. t3- CALALTSEQ is measured from end of the t3- ASID to start of t3-SYNC Word. It is also verified that t3- CALALTSEQ length is a

multiple of 7UI.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 62

Application measurements

1.5.4 Calibration Sequence t3-SYNC Duration (Informative)

This CPHY-TX test verifies that duration of t3- SYNC is within the conformance limits as per MIPI CPHY Specification.

Procedure

1. Using DSO, VA, VB, and VC signals with HS burst sequence containing Format 1 Calibration Preamble is captured from DUT.

2. The captured signal is decoded.

3. t3-SYNC Word, which is “3,4,4,4,4,4,3” is found from the decoded burst.

4. Repeat the procedure for Format 2 Calibration Preamble.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 63

SCPI Commands

About SCPI command

You can use the Standard Commands for Programmable Instruments (SCPI) to communicate remotely with the TekExpress application. Complete the TCPIP socket configuration and the TekVISA configuration in the oscilloscope or in the device where you are executing the script.

Note: If you are using an external PC to execute the remote interface commands, then install TekVISA in the PC to make the configurations.

Socket configuration for SCPI commands

This section describes the steps to configure the TCPIP socket configuration in your script execution device and the steps to configure the TekVISA configuration in the oscilloscope to execute the SCPI commands.

TCPIP socket configuration

1. Click Start > Control Panel > System and Security > Windows Firewall > Advanced settings.

2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer > Inbound Rules and click New Rule…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 64

3. In New Inbound Rule Wizard menu

a. Select Port and click Next.

SCPI Commands

b. Select TCP as rule apply, enter 5000 for Specific local ports and click Next.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 65

SCPI Commands

c. Select Allow the connection and click Next.

d. Select Domain, Private, Public checkbox and click Next.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 66

SCPI Commands

e. Enter Name, Description (optional), and click Finish.

4. Check whether the Rule name is displayed in Windows Firewall with Advanced Security menu > Inbound Rules.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 67

TekVISA configuration

1. Click Start > All Programs > TekVISA > OpenChoice Instrument Manager.

SCPI Commands

2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of

the TekExpress device in Hostname and type Port as 5000. Click to configure the IP address with Port.

Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the oscilloscope where the TekExpress application is running.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 68

SCPI Commands

3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager > Instruments.

4. Double-click OpenChoice Talker Listener and enter the Command *IDN? in command entry field and click Query. Check that the

Operation is successful and Talker Listener Readout displays the Command / Data.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 69

SCPI Commands

Set or query the device name of application

This command sets or queries the device name of the application.

Syntax

TEKEXP:SELECT DEVICE,"<DeviceName>" (Set)

TEKEXP:SELECT? DEVICE (Query)

Command arguments

Argument Name Argument Type

Returns

Examples

TEKEXP:SELECT DEVICE,"<DUT001>" command sets the device name of the application to DUT001.

TEKEXP:SELECT? DEVICE command returns the selected device name of the application.

Set or query the DUTID of application

This command sets or queries the DUTID of the application.

Syntax

TEKEXP:VALUE DUTID,"<Value>" (Set)

TEKEXP:VALUE? DUTID (Query)

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 70

Command arguments

Argument Name Argument Type

Returns

Examples

TEKEXP:VALUE DUTID,"DUT001" command sets the DUTID of the application to DUT001.

TEKEXP:VALUE? DUTID command returns the DUTID of the application.

Set or query the suite name of the application

This command sets or queries the suite name of the application.

Syntax

TEKEXP:SELECT SUITE,"<SuiteName>" (Set)

TEKEXP:SELECT? SUITE (Query)

SCPI Commands

Command arguments

Returns

Examples

TEKEXP:SELECT SUITE,"<SuiteName>" command sets the suite name of the application.

TEKEXP:SELECT? SUITE command returns the selected suite of the application.

Set or query the test name of the application

This command selects or deselects the specified test name of the application.

Syntax

TEKEXP:SELECT TEST,"<TestName>",<Value> (Set)

TEKEXP:SELECT TEST,"<ALL>" (Set)

TEKEXP:SELECT? TEST (Query)

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 71

Command arguments

TestName Value

C-PHY 1.1

{True | False} or {1 | 0}

SCPI Commands

• Test 1.1.1 LP-TX Thevenin Output High Level Voltage (VOH)

• Test 1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

• Test 1.1.3 LP-TX 15%-85% Rise Time (tRLP)

• Test 1.1.4 LP-TX 15%-85% Fall Time (tFLP)

• Test 1.1.5 LP-TX Slew Rate vs. CLOAD (dV_dtSR)

• Test 1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-PULSE-TX)

• Test 1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

• Test 1.2.1 LP_TX tLPX Duration

• Test 1.2.2 LP_TX t3-PREPARE Duration

• Test 1.2.3 LP_TX t3-PREBEGIN Duration

• Test 1.2.4 LP_TX t3-PROGSEQ Duration

• Test 1.2.5 LP_TX t3-PREEND Duration

• Test 1.2.6 LP_TX t3-SYNC Duration

• Test 1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA)

• Test 1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

• Test 1.2.9 HS-TX Single-Ended Output High Voltages (VOHHS(VA),VOHHS(VB),VOHHS(VC))

• Test 1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

• Test 1.2.11 HS-TX Static Common-Point Voltage Mismatch (Delta VCPTX(HS))

• Test 1.2.12 HS-TX Dynamic Common-Point Variations Between 50-450MHz (Delta VCPTX(LF))

• Test 1.2.13 HS-TX Dynamic Common-Point Variations Above 450MHz (Delta VCPTX(HF))

• Test 1.2.16 HS_TX t3-POST Duration

• Test 1.2.17 HS_TX Post-EoT Rise Time(tREOT)

• Test 1.2.18 HS_TX tHS-EXIT Value

• Test 1.2.19 HS Clock Instantaneous UI (UIINST)

• Test 1.2.20 HS Clock Delta UI (Delta_UI)

• Test 1.2.21 HS-TX Eye Diagram

• Test 1.3.1 INIT LP-TX Initialization Period (tINIT,MASTER)

• Test 1.3.2 ULPS Exit Transmitted tWAKEUP Interval

• Test 1.3.3 BTA TX-Side tTA-GO Interval Value

• Test 1.3.4 BTA RX-Side tTA-SURE Interval Value

• Test 1.3.5 BTA RX-Side tTA-GET Interval Value

• Test 1.4.1 HS-TX Differential Voltages Unterminated (VOD(UT)-AB, VOD(UT)-BC, VOD(UT)-CA)

• Test 1.4.2 HS-TX Differential Voltages Mismatch Unterminated (Delta_VOD(UT))

• Test 1.4.3 HS-TX Single-Ended Output High Voltages Unterminated (VOHHS(VA),VOHHS(VB),VOHHS(VC))

• Test 1.4.4 HS-TX Static Common-Point Voltages Unterminated (VCPTX(UT))

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 72

TestName Value

C-PHY 2.0

{True | False} or {1 | 0}

SCPI Commands

• Test 1.1.1 LP-TX Thevenin Output High Level Voltage (VOH)

• Test 1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

• Test 1.1.3 LP-TX 15%-85% Rise Time (tRLP)

• Test 1.1.4 LP-TX 15%-85% Fall Time (tFLP)

• Test 1.1.5 LP-TX Slew Rate vs. CLOAD (dV_dtSR)

• Test 1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-PULSE-TX)

• Test 1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

• Test 1.1.8 LP-TX tLP-EXIT Value

• Test 1.2.1 LP_TX tLPX Duration

• Test 1.2.2 LP_TX t3-PREPARE Duration

• Test 1.2.3 LP_TX t3-PREBEGIN Duration

• Test 1.2.4 LP_TX t3-PROGSEQ Duration

• Test 1.2.5 LP_TX t3-PREEND Duration

• Test 1.2.6 LP_TX t3-SYNC Duration

• Test 1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA)

• Test 1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

• Test 1.2.9 HS-TX Single-Ended Output High Voltages (VOHHS(VA),VOHHS(VB),VOHHS(VC))

• Test 1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

• Test 1.2.11 HS-TX Static Common-Point Voltage Mismatch (Delta VCPTX(HS))

• Test 1.2.12 HS-TX Dynamic Common-Point Variations Between 50-450MHz (Delta VCPTX(LF))

• Test 1.2.13 HS-TX Dynamic Common-Point Variations Above 450MHz (Delta VCPTX(HF))

• Test 1.2.16 HS_TX t3-POST Duration

• Test 1.2.17 HS_TX Post-EoT Rise Time(tREOT)

• Test 1.2.18 HS_TX tHS-EXIT Value

• Test 1.2.19 HS Clock Instantaneous UI (UIINST)

• Test 1.2.21 HS-TX Eye Diagram

• Test 1.2.22 HS-TX UI Jitter (UI_JitterPEAK_TX)

• Test 1.3.1 INIT LP-TX Initialization Period (tINIT,MASTER)

• Test 1.3.2 ULPS Exit Transmitted tWAKEUP Interval

• Test 1.3.3 BTA TX-Side tTA-GO Interval Value

• Test 1.3.4 BTA RX-Side tTA-SURE Interval Value

• Test 1.3.5 BTA RX-Side tTA-GET Interval Value

• Test 1.4.1 HS-TX Differential Voltages Unterminated (VOD(UT)-AB, VOD(UT)-BC, VOD(UT)-CA)

• Test 1.4.2 HS-TX Differential Voltages Mismatch Unterminated (Delta_VOD(UT))

• Test 1.4.3 HS-TX Single-Ended Output High Voltages Unterminated (VOHHS(VA),VOHHS(VB),VOHHS(VC))

• Test 1.4.4 HS-TX Static Common-Point Voltages Unterminated (VCPTX(UT))

• Test 1.5.1 t3-CALPREAMBLE Duration

• Test 1.5.2 t3-ASID Duration

• Test 1.5.3 t3-CALALTSEQ Duration

• Test 1.5.4 Calibration Sequence t3-SYNC Duration

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 73

TestName Value

C-PHY 1.0

{True | False} or {1 | 0}

SCPI Commands

• Test 1.1.1 LP-TX Thevenin Output High Level Voltage (VOH)

• Test 1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

• Test 1.1.3 LP-TX 15%-85% Rise Time (tRLP)

• Test 1.1.4 LP-TX 15%-85% Fall Time (tFLP)

• Test 1.1.5 LP-TX Slew Rate vs. CLOAD (dV_dtSR)

• Test 1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-PULSE-TX)

• Test 1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

• Test 1.2.1 LP_TX tLPX Duration

• Test 1.2.2 LP_TX t3-PREPARE Duration

• Test 1.2.3 LP_TX t3-PREBEGIN Duration

• Test 1.2.4 LP_TX t3-PROGSEQ Duration

• Test 1.2.5 LP_TX t3-PREEND Duration

• Test 1.2.6 LP_TX t3-SYNC Duration

• Test 1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA)

• Test 1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

• Test 1.2.9 HS-TX Single-Ended Output High Voltages (VOHHS(VA),VOHHS(VB),VOHHS(VC))

• Test 1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

• Test 1.2.11 HS-TX Static Common-Point Voltage Mismatch (Delta VCPTX(HS))

• Test 1.2.12 HS-TX Dynamic Common-Point Variations Between 50-450MHz (Delta VCPTX(LF))

• Test 1.2.13 HS-TX Dynamic Common-Point Variations Above 450MHz (Delta VCPTX(HF))

• Test 1.2.14 HS-TX Rise Time (tR)

• Test 1.2.15 HS-TX Fall Time (tF)

• Test 1.2.16 HS_TX t3-POST Duration

• Test 1.2.17 HS_TX Post-EoT Rise Time(tREOT)

• Test 1.2.18 HS_TX tHS-EXIT Value

• Test 1.2.19 HS Clock Instantaneous UI (UIINST)

• Test 1.2.20 HS Clock Delta UI (Delta_UI)

• Test 1.3.1 INIT LP-TX Initialization Period (tINIT,MASTER)

• Test 1.3.2 ULPS Exit Transmitted tWAKEUP Interval

• Test 1.3.3 BTA TX-Side tTA-GO Interval Value

• Test 1.3.4 BTA RX-Side tTA-SURE Interval Value

• Test 1.3.5 BTA RX-Side tTA-GET Interval Value

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Returns

{True | False} or {1 | 0}

Examples

TEKEXP:SELECT TEST,"<TestName>",1 command selects the specified test in the Test Panel.

TEKEXP:SELECT TEST,"<ALL>" command select all the tests in the Test Panel.

TEKEXP:SELECT? TEST command returns the list of selected tests.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 74

SCPI Commands

Set or query the version name of the application

This command sets or queries the version name of the application.

Syntax

TEKEXP:SELECT VERSION,”<VersionName>” (Set)

TEKEXP:SELECT? VERSION (Query)

Command arguments

Argument Name Argument Type Valid Values

<VersionName> <String> It is the name of the version on the DUT panel of the application.

VersionName

• C-PHY 1.0

• C-PHY 1.1

• C-PHY 2.0

Returns

Examples

TEKEXP:SELECT VERSION,”<VersionName>” command sets the version name of application.

TEKEXP:SELECT? VERSION command returns the version name of application.

Set or query the general parameter values

This command sets or queries the general parameter values of the application.

Syntax

TEKEXP:VALUE GENERAL,"<ParameterName>","<Value>" (Set)

TEKEXP:VALUE? GENERAL,"<ParameterName>" (Query)

Command arguments

Table 18: General command parameters

ParameterName Value

LVHS Mode

• TRUE

• FALSE

LVLP Mode

Termination Voltage (V) 0 to 5

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 75

• TRUE

• FALSE

ParameterName Value

Cursor Mode

Data Rate 0.08 to 8

Signal Types

• Automatic

• Manual

• HS

• LP

• LP-HS

SCPI Commands

Insertion Loss Selection

CTLE Selection

CTLE File PathC-PHY 1.1

Va Filter File Path

• TRUE

• FALSE

• TRUE

• FALSE

• For C-PHY 1.1:

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

1.1\CTLE\CTLE_8Gsps.flt

• C-PHY 2.0

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

2.0\CTLE\CTLE_8Gsps.flt

• C-PHY 1.1

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

1.1\Standard_VAB.flt

• C-PHY 2.0

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

2.0\Standard_VAB.flt

Vb Filter File Path

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 76

• C-PHY 1.1

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

1.1\Standard_VBC.flt

• C-PHY 2.0

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

2.0\Standard_VBC.flt

ParameterName Value

Vc Filter File Path

• C-PHY 1.1

• C-PHY 2.0

SCPI Commands

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

1.1\Standard_VCA.flt

C:\Program Files\Tektronix\TekExpress\TekExpress C-PHY\Compliance Suites\C-PHY\TX-Device\C-PHY

2.0\Standard_VCA.flt

Enable Logging

Acquisition Save Options Save All Waveforms Before Analysis

Number Lane

SourceVA

SourceVB

SourceVC

• TRUE

• FALSE

• Lane0

• Lane1

• Lane2

• Lane3

• CH1

• CH2

• CH3

• CH4

• CH1

• CH2

• CH3

• CH4

• CH1

• CH2

• CH3

• CH4

Number of Runs 1 to 1000

On Failure Stop and Notify

Save Number Of Waveform 1 to 30 (Available only when Suite=C-PHY 2.0)

Result Type (Available only when Suite=C-PHY 2.0)

Autoset - For Vertical Settings (Available only when Suite=C-PHY 2.0)

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 77

• TRUE

• FALSE

• FAIL

• ALL

• TRUE

• FALSE

Table 19: Report panel command parameters

On Test Failure, stop and notify me of the failure {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

SCPI Commands

Report Update Mode

Report Path

Save As Type

Auto increment report name if duplicate {True | False} or {1 | 0}

Create report at the end {True | False} or {1 | 0}

• New

• Append

• Replace

X:\<application name>\Reports\DUT001.mht

• Web Archive (*.mht;*.mhtml)

• PDF (*.pdf;)

• CSV (*.csv;)

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Include Pass/Fail Results Summary {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Include Detailed Results {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 78

Include Plot Images {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Include Setup Configuration {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Include Complete Application Configuration {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

SCPI Commands

Include User Comments {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Report Settings:Include Header In Appended Reports {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

View Report After Generating {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Report Group Mode

• Test Name

• Test Result

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 79

SCPI Commands

Append Report {True | False} or {1 | 0}

It represents selected or unselected.

Where,

• True or 1 - Selected

• False or 0 - Unselected

Returns

Examples

TEKEXP:VALUE GENERAL,"<ParameterName>","<Value>" command set the value for the specified general parameter.

TEKEXP:VALUE? GENERAL,"<ParameterName>" command returns the value for the specified general parameter.

Set or query the acquire parameter values

This command sets or queries the acquire parameter values of the application.

Syntax

TEKEXP:VALUE ACQUIRE,”<TestName>",”<AcquireType>”,”<ParameterName>","<ParameterValue>" (Set)

TEKEXP:VALUE? ACQUIRE,”<TestName>",”<AcquireType>”,”<ParameterName>" (Query)

Command arguments

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 80

Table 20:

TestName AcquireType ParameterName ParameterValue

1.1.1 Thevenin Output High

Level Voltage (VOH)

1.1.2 LP-TX Thevenin Output

Low Level Voltage (VOL)

1.1.3 LP-TX 15%-85% Rise Time

(tRLP)

1.1.4 LP-TX 15%-85% Fall Time

(tFLP)

1.1.5 LP-TX Slew Rate vs.

CLOAD (dV/dtSR)

1.1.6 LP-TX Pulse Width

of Exclusive-OR Clock (tLPPULSE-TX)

1.1.7 LP-TX Period of Exclusive-

OR Clock (tLP-PER-TX)

1.1.8 tLP-EXIT Value

LP_ULPS Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

• 6.25

• 12.5

• 25

• 50

• Transition

• Edge

• Width

• VA

• VB

• VC

• Positive

• Negative

SCPI Commands

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

Trigger If Violation

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

• Occurs

• Logic

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 81

TestName AcquireType ParameterName ParameterValue

1.2.1 tLPX Duration

1.2.2 t3-PREPARE Duration

1.2.3 t3-PREBEGIN Duration

1.2.16 t3-POST Duration

1.2.17 30%-85% Post-EoT

RiseTime (tREOT)

1.2.18 tHS-EXIT Value

LPHS_Timing Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 82

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.2.4 t3-PROGSEQ Duration

1.2.5 t3-PREEND Duration

1.2.6 t3-SYNC Duration

1.2.7 HS-TX Differential Voltages

(VOD_AB, VOD_BC, VOD_CA)

1.2.8 HS-TX Differential Voltage

Mismatch (Delta_VOD)

1.2.9 HS-TX Single-Ended

Output High Voltages (VOHHS(VA),VOHHS(VB),VOHH S(VC))

1.2.10 HS-TX Static Common-

Point Voltages (VCPTX)

1.2.11 HS-TX Static Common-

Point Voltage Mismatch (Delta VCPTX(HS))

1.2.12 HS-TX Dynamic

Common-Point Variations Between 50-450MHz (Delta VCPTX(LF))

1.2.13 HS-TX Dynamic

Common-Point Variations Above 450MHz (Delta VCPTX(HF))

1.2.14 HS-TX Rise Time (tR)

1.2.15 HS-TX Fall Time (tF)

1.2.19 HS Clock Instantaneous

UI (UIINST)

HS_Timing_Voltage Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

SCPI Commands

1.2.20 HS Clock Delta UI

(Delta_UI)

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 83

Trigger Transition

Trigger Slope

Trigger If Violation

• Less Than

• Greater Than

• Positive

• Negative

• Either

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.2.21 HS-TX Eye Diagram HS_EYE Termination Voltage (V) 0 to 5

Vertical Scale (mV) 10 to 500

Vertical Position (div) -3 to 3

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Number of UI 100 to 2000000

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 84

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.2.22 HS-TX UI Jitter

(UI_JitterPEAK_TX)

HS_JITTER Termination Voltage (V) 0 to 5

Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 85

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.3.1 INIT: LP-TX Initialization

Period (tINIT,MASTER)

LP_INIT_Period Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 50000000

Trigger Type

• 3.125

• 6.25

• 12.5

• 25

• 50

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 86

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.3.2 ULPS Exit: Transmitted

tWAKEUP Interval

LP_WAKEUP Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 50000000

Trigger Type

• 3.125

• 6.25

• 12.5

• 25

• 50

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 87

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.3.3 BTA: TX-Side tTA-GO

Interval Value

1.3.4 BTA: RX-Side tTA-SURE

Interval Value

1.3.5 BTA: RX-Side tTA-GET

Interval Value

LP_BTA Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 50000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 88

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.4.1 HS-TX Differential Voltages

Unterminated (VOD(UT)-AB, VOD(UT)-BC, VOD(UT)-CA)

1.4.2 HS-TX Differential

Voltage Mismatch Unterminated (Delta_VOD(UT))

1.4.3 HS-TX Single-

Ended Output High Voltages Unterminated (VOHHS(UT)(VA),VOHHS(UT) (VB),VOHHS(UT)(VC))

1.4.4 HS-TX Static Common-

Point Voltages Unterminated (VCPTX(UT))

HS_Unterminated Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 89

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.5.1 t3-CALPREAMBLE

Duration

LPHS_Format1_CALPREAMBLEVertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 90

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.5.2 t3-ASID Duration

1.5.3 t3-CALALTSEQ Duration

LPHS_Format2_CALPREAMBLEVertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 91

• Occurs

• Logic

TestName AcquireType ParameterName ParameterValue

1.5.4 Calibration Sequence t3-

SYNC Duration

LPHS_CALPREAMBLE Vertical Scale (mV) 10 to 500

Vertical Position (div) -5 to 5

Vertical Offset (V) -1.3 to 1.3

Sample Rate (GS/s)

Record Length 100000 to 10000000

Trigger Type

• 6.25

• 12.5

• 25

• 50

• AUTO

• Transition

• Edge

• Width

SCPI Commands

Trigger Source

Trigger Upper Level (V) -5 to 5

Trigger Lower Level (V) -6 to 1

Trigger Upper Limit (us)

Trigger Lower Limit (us)

Trigger Polarity

Edge Trigger Level(V) 0 to 1

Trigger Time (ps)

Trigger Transition

Trigger Slope

• VA

• VB

• VC

• Positive

• Negative

• 250

• 500

• Less Than

• Greater Than

• Positive

• Negative

• Either

Trigger If Violation

• Occurs

• Logic

Returns

<Nrf>

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 92

SCPI Commands

Examples

TEKEXP:VALUE ACQUIRE,”<TestName>",”<AcquireType>”,"<ParameterName>","<ParameterValue>" command sets

the value for the specified test and its acquire parameter.

TEKEXP:VALUE? ACQUIRE,”<TestName>",”<AcquireType>”,"<ParameterName>" command returns the value for the specified test and its acquire parameter.

Set or query the analyze parameter values

This command sets or queries the analyze parameter values of the application.

Syntax

TEKEXP:VALUE ANALYZE,”<TestName>","<ParameterName>","<ParameterValue>" (Set)

TEKEXP:VALUE? ANALYZE,”<TestName>","<ParameterName>" (Query)

Command arguments

Table 21: For C-PHY 1.0

TestName ParameterName ParameterValue

1.1.1 Thevenin Output High Level Voltage (VOH) Supported Settings LP Signal Types

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

1.1.3 LP-TX 15%-85% Rise Time (tRLP)

1.1.4 LP-TX 15%-85% Fall Time (tFLP)

1.1.5 LP-TX Slew Rate vs. CLOAD (dV/dtSR)

1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-

PULSE-TX)

1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

1.3.1 INIT: LP-TX Initialization Period (tINITMASTER)

1.3.2 ULPS Exit: Transmitted tWAKEUP Interval

1.3.3 BTA: TX-Side tTA-GO Interval Value

1.3.4 BTA: RX-Side tTA-SURE Interval Value

1.3.5 BTA: RX-Side tTA-GET Interval Value

1.2.1 tLPX Duration Supported Settings LP-HS Signal Types

1.2.2 t3-PREPARE Duration

1.2.3 t3-PREBEGIN Duration

1.2.16 t3-POST Duration

1.2.17 30%-85% Post-EoT Rise Time (tREOT)

1.2.18 tHS-EXIT Value

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 93

TestName ParameterName ParameterValue

1.2.4 t3-PROGSEQ Duration Supported Settings HS Signal Types

1.2.5 t3-PREEND Duration

1.2.6 t3-SYNC Duration

1.2.7 HS-TX Differential Voltages (VOD_AB VOD_BC

VOD_CA)

1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

1.2.9 HS-TX Single-Ended Output High Voltages

(VOHHS(VA)VOHHS(VB)VOHHS(VC))

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

1.2.11 HS-TX Static Common-Point Voltage Mismatch

(Delta VCPTX(HS))

1.2.12 HS-TX Dynamic Common-Point Variations

Between 50-450MHz (Delta VCPTX(LF))

1.2.13 HS-TX Dynamic Common-Point Variations Above

450MHz (Delta VCPTX(HF))

1.2.14 HS-TX Rise Time (tR)

1.2.15 HS-TX Fall Time (tF)

1.2.20 HS Clock Delta UI (Delta_UI)

1.2.19 HS Clock Instantaneous UI (UIINST) UI INST MIN (ps) 1 to 12500000

Supported Settings HS Signal Types

SCPI Commands

Table 22: For C-PHY 1.1

TestName ParameterName ParameterValue

1.1.1 Thevenin Output High Level Voltage (VOH) Supported Settings LP Signal Types

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

1.1.3 LP-TX 15%-85% Rise Time (tRLP)

1.1.4 LP-TX 15%-85% Fall Time (tFLP)

1.1.5 LP-TX Slew Rate vs. CLOAD (dV/dtSR)

1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-

PULSE-TX)

1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

1.3.1 INIT: LP-TX Initialization Period (tINITMASTER)

1.3.2 ULPS Exit: Transmitted tWAKEUP Interval

1.3.3 BTA: TX-Side tTA-GO Interval Value

1.3.4 BTA: RX-Side tTA-SURE Interval Value

1.3.5 BTA: RX-Side tTA-GET Interval Value

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 94

TestName ParameterName ParameterValue

1.2.1 tLPX Duration Supported Settings LP-HS Signal Types

1.2.2 t3-PREPARE Duration

1.2.3 t3-PREBEGIN Duration

1.2.16 t3-POST Duration

1.2.17 30%-85% Post-EoT Rise Time (tREOT)

1.2.18 tHS-EXIT Value

1.2.4 t3-PROGSEQ Duration Supported Settings HS Signal Types

1.2.5 t3-PREEND Duration

1.2.6 t3-SYNC Duration

1.2.7 HS-TX Differential Voltages (VOD_AB VOD_BC

VOD_CA)

1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

1.2.9 HS-TX Single-Ended Output High Voltages

(VOHHS(VA)VOHHS(VB)VOHHS(VC))

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

1.2.11 HS-TX Static Common-Point Voltage Mismatch

(Delta VCPTX(HS))

1.2.12 HS-TX Dynamic Common-Point Variations

Between 50-450MHz (Delta VCPTX(LF))

1.2.13 HS-TX Dynamic Common-Point Variations Above

450MHz (Delta VCPTX(HF))

1.2.20 HS Clock Delta UI (Delta_UI)

1.4.1 HS-TX Differential Voltages Unterminated

(VOD(UT)-AB VOD(UT)-BC VOD(UT)-CA)

1.4.2 HS-TX Differential Voltage Mismatch Unterminated

(Delta_VOD(UT))

1.4.3 HS-TX Single-Ended Output High

Voltages Unterminated (VOHHS(UT)(VA)VOHHS(UT) (VB)VOHHS(UT)(VC))

1.4.4 HS-TX Static Common-Point Voltages Unterminated

(VCPTX(UT))

1.2.19 HS Clock Instantaneous UI (UIINST) UI INST MIN (ps) 1 to 12500000

Supported Settings HS Signal Types

Table continued…

SCPI Commands

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 95

TestName ParameterName ParameterValue

1.2.21 HS-TX Eye Diagram Clock Edge

• RISE

• FALL

• BOTH

SCPI Commands

Clock Recovery Method

Signal Type

Mask Hit Type

Loop Bandwidth 1 to 10

Supported Settings HS Signal Types

• EXPEDGE

• EXPPLL

• CLOCK

• DATA

• AUTO

• Auto

• Manual

Table 23: For C-PHY 2.0

TestName ParameterName ParameterValue

1.1.1 Thevenin Output High Level Voltage (VOH) Supported Settings LP Signal Types

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

1.1.3 LP-TX 15%-85% Rise Time (tRLP)

1.1.4 LP-TX 15%-85% Fall Time (tFLP)

1.1.5 LP-TX Slew Rate vs. CLOAD (dV/dtSR)

1.1.6 LP-TX Pulse Width of Exclusive-OR Clock (tLP-

PULSE-TX)

1.1.7 LP-TX Period of Exclusive-OR Clock (tLP-PER-TX)

1.3.1 INIT: LP-TX Initialization Period (tINITMASTER)

1.3.2 ULPS Exit: Transmitted tWAKEUP Interval

1.3.3 BTA: TX-Side tTA-GO Interval Value

1.3.4 BTA: RX-Side tTA-SURE Interval Value

1.3.5 BTA: RX-Side tTA-GET Interval Value

1.1.8 tLP-EXIT Value

1.2.1 tLPX Duration Supported Settings LP-HS Signal Types

1.2.2 t3-PREPARE Duration

1.2.3 t3-PREBEGIN Duration

1.2.16 t3-POST Duration

1.2.17 30%-85% Post-EoT Rise Time (tREOT)

1.2.18 tHS-EXIT Value

1.5.1 t3-CALPREAMBLE Duration

Table continued…

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 96

TestName ParameterName ParameterValue

1.2.4 t3-PROGSEQ Duration Supported Settings HS Signal Types

1.2.5 t3-PREEND Duration

1.2.6 t3-SYNC Duration

1.2.7 HS-TX Differential Voltages (VOD_AB VOD_BC

VOD_CA)

1.2.8 HS-TX Differential Voltage Mismatch (Delta_VOD)

1.2.9 HS-TX Single-Ended Output High Voltages

(VOHHS(VA)VOHHS(VB)VOHHS(VC))

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

1.2.11 HS-TX Static Common-Point Voltage Mismatch

(Delta VCPTX(HS))

1.2.12 HS-TX Dynamic Common-Point Variations

Between 50-450MHz (Delta VCPTX(LF))

1.2.13 HS-TX Dynamic Common-Point Variations Above

450MHz (Delta VCPTX(HF))

1.2.19 HS Clock Instantaneous UI (UIINST)

1.2.22 HS-TX UI Jitter (UI_JitterPEAK_TX)

1.4.1 HS-TX Differential Voltages Unterminated

(VOD(UT)-AB VOD(UT)-BC VOD(UT)-CA)

1.4.2 HS-TX Differential Voltage Mismatch Unterminated

(Delta_VOD(UT))

1.4.3 HS-TX Single-Ended Output High

Voltages Unterminated (VOHHS(UT)(VA)VOHHS(UT) (VB)VOHHS(UT)(VC))

1.4.4 HS-TX Static Common-Point Voltages Unterminated

(VCPTX(UT))

1.5.2 t3-ASID Duration

1.5.3 t3-CALALTSEQ Duration

1.5.4 Calibration Sequence t3-SYNC Duration

Table continued…

SCPI Commands

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 97

TestName ParameterName ParameterValue

1.2.21 HS-TX Eye Diagram Clock Edge

• RISE

• FALL

• BOTH

SCPI Commands

Clock Recovery Method

Signal Type

Mask Hit Type

Loop Bandwidth 1 to 10

Supported Settings HS Signal Types

• EXPEDGE

• EXPPLL

• CLOCK

• DATA

• AUTO

• Auto

• Manual

Returns

<Nrf>

Examples

TEKEXP:VALUE ANALYZE,”<TestName>","<ParameterName>","<ParameterValue>" command set the value for the specified test and its analyze parameter.

TEKEXP:VALUE? ANALYZE,”<TestName>","<ParameterName>" command returns the value for the specified test and its analyze parameter.

Set or query the user defined acquisition values

This command sets or queries the user defined acquisition values.

Syntax

TEKEXP:USER_DEF_ACQ (Set)

TEKEXP:USER_DEF_ACQ? (Query)

Returns

{0 | 1} or {True | False}

1 or True indicates that the user defined acqusition is enabled.

0 or False indicates that the user defined acqusition is disabled.

Examples

TEKEXP:USER_DEF_ACQ? command returns the enable or disable status of user defined acquistion.

Query the available devices in the DUT panel of the application

This command queries the list of available devices on the DUT panel as comma separated values.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 98

SCPI Commands

Syntax

TEKEXP:LIST? DEVICE (Query)

Command arguments

Device Device Type and value Description

<Device> It is the name of the device on the DUT panel of the application.

Returns

Examples

TEKEXP:LIST? DEVICE command returns the list of available devices.

Query the available suites for the selected device

This command queries the list of available suites for the selected device as comma separated values.

Syntax

TEKEXP:LIST? SUITE (Query)

Returns

Examples

TEKEXP:LIST? SUITE command returns the list of available suites for the selected device.

Query the list of available tests of the application

This command queries the list of available tests of the application for the selected device as comma separated values.

Syntax

TEKEXP:LIST? TEST (Query)

Command arguments

Returns

Examples

TEKEXP:LIST? TEST command returns the list of available tests for the selected device.

Query the available version names of the application

This command queries the list of available version names of the application for the selected device as comma separated values.

Syntax

TEKEXP:LIST? VERSION (Query)

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 99

SCPI Commands

Returns

Examples

TEKEXP:LIST? VERSION command returns the list of version names for the selected device.

Query the list of available instruments based on the specified instrument type

This command queries the list of available instruments based on the specified instrument type.

Syntax

TEKEXP:LIST? INSTRUMENT,"<InstrumentType>" (Query)

Command argument

Argument Name Argument value

Returns

Examples

TEKEXP:LIST? INSTRUMENT,"Real Time Scope" command returns the list of available instruments based on the real time scope type.

Set or query the IP address of the instrument based on the specified instrument type

This command sets or queries the IP address of the instrument based on the specified instrument type.

Syntax

TEKEXP:INSTRUMENT? "<InstrumentType>" (Query)

TEKEXP:INSTRUMENT, "<InstrumentType>","<Value>" (Set)

Command argument

Argument Name Argument Type

TCPIP::XXX.XX.XXX.XXX::INSTR

Returns

Examples

TEKEXP:INSTRUMENT? "<InstrumentType>" command returns the IP address of the oscilloscope.

TekExpress® C-PHY Automated Test Software Application Help (70K Series MSO/DPO) 100

Tektronix TekExpress C-PHY v2.0 TX Automated Compliance Solution Online Help Online Help

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

C-PHY Tx 2.0 key features

Getting help and support

Product documents

Conventions

Technical support

Getting started

Hardware requirements

Supported oscilloscopes

Minimum system requirements

Instruments and accessories

Software requirements

Downloading and installing the software

Activate the license

View software version and license key details

Setting up the test environment

Installing the software

About setting up tests

Instrument connection setup

Search instruments connected to the application

Test setup overview

Before you click Start

About running tests

Pre-test checklist

Launching the application

Application controls

Options menu functions

Configure email settings

TekExpress instrument control settings

Setup panel: Configure the test setup

DUT: Set DUT settings

Multiple-session run

Test Selection: Select the tests

Acquisitions: Set waveform acquisition settings

Configuration: Set measurement limits for tests

Preferences: Set the test run preferences

Status panel: View the test execution status

View test execution status

View test execution logs

Results panel: View summary of test results

Filter the test results

Reports panel: Configure report generation settings

Report configuration settings

Configure report view settings

View a generated report

Saving and recalling test setup

Test setup files overview

Save the configured test setup

Load a saved test setup

Select a pre-run session from the loaded test setup

Save the test setup with a different name

Application measurements

1.1.1 Thevenin Output High Level Voltage (VOH)

1.1.2 LP-TX Thevenin Output Low Level Voltage (VOL)

1.1.3 LP-TX 15%-85% Rise Time (tRLP)

1.2.1 tLPX Duration

1.2.2 t3-PREPARE Duration

1.2.3 t3-PREBEGIN Duration

1.2.4 t3-PROGSEQ Duration

1.2.5 t3- PREEND Duration

1.2.6 t3-SYNC Duration

1.2.7 HS-TX Differential Voltages (VOD_AB, VOD_BC, VOD_CA)

1.2.8 HS-TX Differential Voltage Mismatch (ΔVOD)

1.2.10 HS-TX Static Common-Point Voltages (VCPTX)

1.2.11 HS-TX Static Common-Point Voltage Mismatch (ΔVCPTX(HS))

1.2.13 HS-TX Dynamic Common-Point Variations Above 450 MHz (ΔVCPTX(HF))

1.2.14 HS-TX Rise Time (tR)

1.2.15 HS-TX Fall Time (tF)

1.2.16 t3-POST Duration

1.2.17 30%-85% Post-EoT Rise Time (tREOT)

1.2.18 tHS-EXIT Value

1.2.19 HS Clock Instantaneous UI (UIINST)

1.2 20 HS Clock Delta UI (ΔUI) (OBSOLETE)

1.2.21 HS-TX Eye Diagram

1.2.22 HS-TX UI Jitter (UI_JitterPEAK_TX)