Getting help and support............................................................................................................................................................. 11
Required instruments and applications................................................................................................................................13
Required instruments and applications for 10Base-T1S Suite..................................................................................... 13
Required instruments and applications for 100Base-T1 Suite......................................................................................14
Required instruments and applications for 1000Base-T1 Suite....................................................................................15
Required instruments and applications for MultiGBase-T1 Suite................................................................................. 17
List of supported instrument models.................................................................................................................................... 19
List of supported instrument models for 10Base-T1S...................................................................................................19
List of supported instrument models for 100Base-T1................................................................................................... 20
List of supported instrument models for 1000Base-T1................................................................................................. 21
List of supported instrument models for MultiGBase-T1...............................................................................................23
Downloading and installing the software..............................................................................................................................24
Activate the license.............................................................................................................................................................. 24
View software version and license key details.....................................................................................................................24
Setting up the test environment.................................................................................................................................................. 26
Calibrate the Oscilloscope................................................................................................................................................... 26
Search instruments connected to the application................................................................................................................ 29
Automate AWG/AFG signal generation............................................................................................................................... 30
Before you click start............................................................................................................................................................32
Starting the application................................................................................................................................................................33
Options menu functions....................................................................................................................................................... 36
TekExpress instrument control settings............................................................................................................................... 38
Setup panel: Configure the test setup.........................................................................................................................................39
DUT: Set DUT settings.........................................................................................................................................................41
Test Selection: Select the tests............................................................................................................................................ 45
Acquisitions: Set waveform acquisition settings.................................................................................................................. 47
Acquire live waveforms for analysis..............................................................................................................................49
Use pre-recorded waveforms for analysis.................................................................................................................... 51
Acquire step by step..................................................................................................................................................... 52
Naming convention of Pre-recoded mode.................................................................................................................... 53
Configuration: Set measurement limits for tests.................................................................................................................. 54
Preferences: Set the test run preferences........................................................................................................................... 69
Status panel: View the test execution status...............................................................................................................................71
View test execution status....................................................................................................................................................71
View test execution logs.......................................................................................................................................................72
Results panel: View summary of test results...............................................................................................................................74
Filter the test results.............................................................................................................................................................74
View a generated report.......................................................................................................................................................81
Saving and recalling test setup................................................................................................................................................... 85
Test setup files overview...................................................................................................................................................... 85
Save the configured test setup............................................................................................................................................ 85
Load a saved test setup.......................................................................................................................................................85
Select a pre-run session from the loaded test setup............................................................................................................85
Save the test setup with a different name............................................................................................................................86
10Base-T1S Test limits................................................................................................................................................. 87
10Base-T1S Example Test Mode waveforms...............................................................................................................88
100Base-T1 Test limits..................................................................................................................................................89
100Base-T1 Example Test Mode waveforms............................................................................................................... 89
1000Base-T1 Test limits................................................................................................................................................91
1000Base-T1 Example Test Mode waveforms............................................................................................................. 92
MultiGBASE-T1 Test Limits...........................................................................................................................................93
MultiGBASE-T1 example Test Mode waveforms..........................................................................................................94
Test Fixture.......................................................................................................................................................................... 95
10/100/1000Base-T1 Test Fixture: Differential..............................................................................................................95
10/100/1000Base-T1 Test Fixture: Single-Ended......................................................................................................... 97
Test Mode list for each Technology......................................................................................................................................99
10Base-T1S: Setting up the different transmitter load conditions with the fixture..............................................................100
Measurements using symbol rate clock (TX_TCLK) of DUT............................................................................................. 101
Measurement procedure using TC1 differential coupon and the single-ended test fixture................................................103
Return Loss measurement Calibration...............................................................................................................................110
Return Loss measurement.................................................................................................................................................116
Return Loss measurement using VNA Result File.............................................................................................................120
Test mode list..................................................................................................................................................................... 148
Clock line measurements...................................................................................................................................................148
Return loss measurement using VNA Result File..............................................................................................................155
Socket configuration for SCPI commands......................................................................................................................... 158
Set or query the device name of application......................................................................................................................164
Set or query the suite name of the application...................................................................................................................164
Set or query the test name of the application.................................................................................................................... 165
Set or query the general parameter values........................................................................................................................167
Set or query the acquire parameter values........................................................................................................................172
Set or query the analyze parameter values....................................................................................................................... 181
Query the list of available instruments based on the specified instrument type.................................................................184
Set or query the IP address of the instrument based on the specified instrument type.....................................................184
Query the information of the generated report file............................................................................................................. 184
Query the information of the generated waveform files..................................................................................................... 185
Query the information of the generated image files........................................................................................................... 185
Query the active TekExpress application name................................................................................................................. 186
Sets or query the acquire mode status.............................................................................................................................. 186
Set or query the execution mode status............................................................................................................................ 186
Generate the report for the current session....................................................................................................................... 187
Query the value of specified report header field in the report............................................................................................ 187
Query the value of specified result detail available in report summary/details table..........................................................188
Restore the setup to default settings................................................................................................................................. 188
Save the setup................................................................................................................................................................... 189
Save the settings to a specified session............................................................................................................................ 189
Open the setup from a specified session...........................................................................................................................189
Query the current setup file name......................................................................................................................................189
Run/stop/pause/resume the selected measurements execution in the application........................................................... 190
Query the current measurement execution status............................................................................................................. 190
Query whether the current setup is saved or not saved.................................................................................................... 190
Query the status of the previous command execution.......................................................................................................191
Query the last error occurred............................................................................................................................................. 191
Set or query the popup details........................................................................................................................................... 191
Set or query the session create option in the continuous run function.............................................................................. 192
Set or query the View report after generating option status...............................................................................................192
Set or query the waveform file recalled for the specified test name and acquire type.......................................................193
Sets or query the limit values in the limits editor window...................................................................................................193
Set or query the enable/disable status of Verbose function...............................................................................................194
Exit or close the application............................................................................................................................................... 194
File name extensions......................................................................................................................................................... 198
Measurement and application error messages..................................................................................................................199
How to load the setup file into AFG31000 for Return Loss measurement (100 BASE-T1)................................................202
Measurement results saved in CSV file format..................................................................................................................203
Return Loss measurement..........................................................................................................................................205
MDI Random Jitter......................................................................................................................................................208
Transmit MDI deterministic jitter in master mode........................................................................................................208
Transmit MDI Even-Odd jitter in master mode............................................................................................................209
Oscilloscope noise calculation procedure using Linearity measurement....................................................................217
BAT Files Location......................................................................................................................................................221
The TekExpress Automotive Ethernet application is a compliance test solution to perform transmitter electrical specification measurements
and MDI return loss measurements in accordance to IEEE. Supports an OPEN Alliance PMA test suites for the Automotive Ethernet
technologies; 10BASE-T1S, 100BASE-T1, 1000BASE-T1, and MultiGBASE-T1. The IEEE specifications for 10BASE-T1S, 100BASE-T1,
1000BASE-T1, and MultiGBASE-T1 technologies are IEEE Std 802.3cg™-2019, IEEE P802.3bw™/D3.3 , IEEE P802.3bpTM-2016 and
IEEE Std 802.3ch™ -2020 respectively.
Key features
•Fully automated setup wizard to perform transmitter electrical specification measurements and MDI electrical specification return loss
measurements.
•Comprehensive reports of results with Pass/Fail status along with plots
•Offers full coverage of test measurements
•An instrument offers full coverage of measurements. Return Loss measurement is offered as a patented approach and requires an
oscilloscope only, without the need of an additional instrument (VNA).
•Power Spectral Density (PSD) is an oscilloscope-based measurement and Spectrum analyzer is not required.
•TekExpress Automotive Ethernet application offers you a patented Return Loss measurement, which allows you to perform the
measurement without using a VNA.
•Transmit distortion measurement without need of external hardware clock divider unit, using software signal correction method.
•Validates Test Mode signals before performing measurements.
•Ability to run the measurements multiple times and generate result statistics across runs.
Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program
or operate the application, and do other tasks.
Table 1: TekExpress Application documents
To learn aboutUse this document
How to use the application
How to remotely control the instrument
TekExpress <Application Name> Help
PDF version of this document can be downloaded from www
.tek.com/downloads
Compiled HTML (CHM) version is integrated with the application. Press F1
keyboard to start the help.
Tektronix Part Number: 077-xxxx-xx
key from the
Conventions
This application help uses the following conventions:
•The term "Application," and "Software" refers to the T
•The term “DUT” is an abbreviation for Device Under Test.
•The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse
or using the touch screen.
•A Note identifies important information.
Table 2: Icons used in the help
IconDescription
This icon identifies important information
This icon identifies conditions or practices that could result in loss of data.
ekExpress Application.
This icon identifies additional information that will help you use the application more
efficiently
Tektronix values your feedback on our products. T
your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See Contacting Tektronix at the front of this
document for contact information.
When you contact Tektronix Technical Support, please include the following information (be as specific as possible):
o help us serve you better, please send us your suggestions, ideas, or comments on
General information
•All instrument model numbers
•Hardware options, if any
•Modules used
•Your name, company, mailing address, phone number, FAX number
•Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.
Application specific information
•Software version number
•Description of the problem such that technical support can duplicate the problem
•If possible, save the setup files for all the instruments used and the application
•If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file
Calibration step is done to calibrate the disturber signal source amplitude and frequency
PIN points on the test fixture. You can perform calibration on live DUT signal and disturber source signal connected as mentioned in the
calibration connection diagram.
Note: It is recommended to do calibration of the waveforms for Transmitter Distortion
measurement on page 116.
Calibration for transmitter distortion measurement
. It measures the DUT signal level at defined
on page 122 and Return Loss
Figure 1: Calibration tab for 1000Base-T1 transmitter distortion measurement
Figure 4: Calibration tab for return loss measurement for 10Base-T1S
Table 13: Calibration settings
ParameterDescription
Live CalibrationSets the live calibration process. The live Calibration files are saved in
X:\Automotive Ethernet\Calibration folder.
Use Pre-recorded Calibration
Channel drop downAllows you to select relevant channel and probes.
Cal TypeDisplays the type of calibration: Load, Open, and Short.
Cal StatusDisplays the status of the calibration: Pending, Done.
Cal TimeDisplays the previous calibration time: Date, Month, and Year.
SchematicClick to view the schematic diagram for the selected measurement.
PlotClick to view the plot.
ApplyClick to apply the configured parameters to calibration.
RunClick to run the process of calibration.
Table continued…
Sets the calibration process with prerecorded calibrated waveforms and allows you
to browse and select the calibrated waveforms. The path for selecting the calibrated
waveforms is
Default buttonClick to perform calibration by using default values.
Setting up the test environment
ransmitter distortion
ransmitter
To manually set up signal source: Click here and
copy files to USB drive and recall on connected
signal source.
Note: This button is applicable only for T
measurement. The expected and measured values for T
distortion on Calibration tab will be initially empty, when you launch the
application for the first time and they get populated once you click the
Default button.
In case of manual signal source (AFG/AWG) setup, click the link and copy the
relevant folder and recall the setup on connected signal source.
Search instruments connected to the application
Use the TekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The
application uses T
Note: The instruments required for the test setup must be connected and detected by the application, before running the test.
To refresh the list of connected instruments:
1. Select Options > Instrument Control Settings.
2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to
search. Instrument search is based on the VISA layer, but dif
USB. For example, if you choose LAN, the search will include all the instruments supported by the TekExpress that are communicating
over the LAN.
3. Click Refresh. The TekExpress application searches for the connected instruments.
ekVISA to discover the connected instruments.
ferent connections determine the resource type, such as LAN, GPIB, and
Figure 5: Search status of the instruments connected to LAN
4. When the search is complete, a dialog box lists the instrument-related details based on the search criteria. For example, for the Search
Criteria as LAN and GPIB, the application displays all the LAN and GPIB instruments connected to the application.
Figure 6: TekExpress Instrument Control Settings window
The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in
the Last Updated field.
Automate AWG/AFG signal generation
The T
ekExpress Automotive Ethernet application allows you to automatically load the pattern files in AWG/AFG and generate the signals.
Ensure that the GPIB/LAN/USB connection between the oscilloscope and AWG/AFG is established, before you automate the signal
generation. The AWG/AFG automation is supported for the following measurements:
•Transmitter Distortion on page 122: AWG/AFG is used to transmit a disturbing signal. CH1 and CH1_inverted are used.
•Return Loss measurement on page 116: AWG/AFG is used to transmit a wide band signal. CH1 and CH1_inverted are used for
transmission of the signal. A marker signal has to be connected to the auxiliary channel of the oscilloscope (used as trigger source).
How to automate AWG/AFG signal generation
Complete the following steps in the TekExpress application to automate the signal generation from AWG/AFG:
1. Click in the upper right corner of the application and select Instrument Control Settings.
2. Select Search Criteria as USB and click Refresh; when the Retrieved Instruments table is uploaded with the connected instruments
WG/AFG is listed as shown above, go to the Global Settings tab from the Configuration menu of the Tests. If the A
is supported, it will be listed as a drop-down menu option next to the Automate with AWG/AFG label. By default, the application will
consider the connected AWG to be used for automation.
WG/AFG
Figure 8: Test Selection tab
Note: If Automate with AWG/AFG is set as Do not use, you must manually copy the A
WG/AFG waveforms from the oscilloscope
to the AWG/AFG. Waveforms are located at C:\Program Files\Tektronix\TekExpress\TekExpress
Before you run a test for the first time, review these steps:
1. Understand where your test files are stored on the instrument.
2. Ensure that the My TekExpress folder has read and write access, and that the contents are not set to be encrypted:
Before running any test
1. Review the
2. Configure the email setting if you want the application to notify you by email when a test completes or produces an error. Access the
email options either from the Options menu in the upper right corner, or from the Preferences tab on the Setup panel.
3. Select the Report options.
See Also
Pre-run check list on page 32
Pre-run check list on page 32.
Pre-run check list
Do the following before you click Start to run a test. If this is the first time you are running a test on a setup, then refer also to the
guidelines above.
1. Ensure that all the required instruments are properly warmed up (about 20 minutes).
2. Perform the Signal Path Compensation (SPC).
3. If any signal path differences are present, enter de-skew values to align the signals perfectly.
4. Ensure that the application is able to find the DUT. If it cannot, perform a Search instruments connected to the application on page 29.
To start the TekExpress , select from the oscilloscope menu bar.
Starting the application
During start, a "My TekExpress" folder is created in the Documents folder of the current user and gets mapped to "X" drive. When the
application is closed properly, the "X" drive gets unmapped. Session files are then stored inside the folder. If this file is not found, the
application runs an instrument discovery program to detect connected instruments before starting TekExpress .
T
o keep the TekExpress application on top of any application, select Keep On Top from the options menu. If the application goes behind
the oscilloscope application, select to bring the application to the front.
This section describes the application controls with functionality and its details.
Table 14: Application control description
ItemDescription
Options menuMenu to display global application controls.
Starting the application
Test panel
Start / Stop button
Pause / Continue button
Controls that open tabs for configuring test settings and options.
Use the Start button to start the test run of the measurements in the selected order. If prior
acquired measurements are not cleared, then new measurements are added to the existing
set. The button toggles to the Stop mode while tests are running. Use the Stop
abort the test.
Use the Pause button to pause the acquisition. When a test is paused, this button changes
as Continue.
Use the Clear button to clear all existing measurement results. Adding or deleting a
measurement, or changing a configuration parameter of an existing measurement, also
clears measurements. This is to prevent the accumulation of measurement statistics or
sets of statistics that are not coherent. This button is available only on Results panel.
Note: This button is visible only when there are results data on the panel.
Place the cursor over the top of the application window to move the application window to
the desired location
ItemDescription
Close iconClose the application.
Starting the application
Mini view / Normal view
Mini view displays the run messages with the time stamp, progress bar, Start / Stop button,
and Pause / Continue button. The application moves to mini view when you click the Start
button.
Always keeps the TekExpress application on top of all the applications.
Displays the application name, version, and hyperlink to end the user license agreement.
Starting the application
Configure email settings
Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to
configure email settings:
Figure 11: Email settings window
1.Select Options > Email Settings to open the Email Settings dialog box.
2.(Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate
the addresses with commas.
3.(Required) For
followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example:
user@yourcompany.com.
4.(Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location,
and the SMTP Port number, in the corresponding fields.
If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.
5.In the Email Attachments section, select from the following options:
•Reports: Select to receive the test report with the notification email.
•Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you
want to receive the full log or just the last 20 lines.
6.In the Email Configuration section:
•
Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is
5 MB.
Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a
•
notification. The default is 1. You can also specify a timeout period.
7.Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email
notifications.
8.To test your email settings, click Test Email.
9.To apply your settings, click Apply.
10. Click Close when finished.
Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name,
Note: If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.
Use the TekExpress Instrument Control Settings
can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected
instrument is displayed in the Retrieved Instruments window.
To access, click Options > Instrument Control Settings. Select USB and LAN as search criteria for TekExpress application and click
Refresh. The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in
the test configuration section.
Figure 12: TekExpress Instrument Control Settings window
dialog box to search the instruments (resources) connected to the application. You
Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of the current session. The
DUT settings also affect the list of available tests in the T
Adds an optional text label for the DUT to reports. The default value is DUT001. The
maximum number of characters is 32.
ou cannot use the following characters in an ID name: (.,..,...,\,/:?”<>|*)
Y
Setup panel: Configure the test setup
Comments icon (to the right of the DUT
ID field)
Acquire live waveformsPerform analysis on live waveforms.
Use pre-recorded waveform filesPerform analysis on pre-recorded waveforms.
Suite
VersionDisplays the CTS specification for the selected suite.
Transmitter load
Return Loss Measurement preferencesAvailable only, when Return Loss measurement is selected in the Test Selection tab.
Opens a Comments dialog box in which you can enter optional text to add to a report.
Maximum size is 256 characters. T
report. See Select
•10Base-T1S
•100Base-T1
•1000Base-T1
•MultiGBase-T1
Select the operating mode from the drop-down list. The available values are 100 Ω, 50 Ω,
Both.
•Oscilloscope: Fully automated oscilloscope based method
•VNA Report: Select to run the return loss measurement with a VNA report file (SParameter). For steps to run the return loss measurement by VNA Report file method,
refer Return Loss measurement using VNA Result File on page 120
Note:
report options for details.
o enable or disable comments appearing on the test
ou cannot run the batch file for the Return Loss Measurement when, the DUT
Y
Automation
DataRate(Available only when Suite=MultiGBase-T1)
Select the data rate from drop down:
•2.5GBase-T1
•5GBase-T1
•10GBase-T1
Note: MSO6/6B Series Oscilloscope supports the data rate 2.5GBase-T1 and
5GBase-T1 only.
DUT AutomationAvailable only, when Suite=MultiGBase-T1
Setup panel: Configure the test setup
Automates the DUT configuration for T
measurement.
Automate DUTSet or clear to enable/disable the DUT automation check box for the test session.
BA
T Files LocationThis is the predefined path C:\ProgramData\MultiG\ with admin privileges to access.
Wait for 30 sec for pattern changeSpecifies the maximum wait time for the execution of a BAT file.
Allows an unknown time execution of the batch file and any other delay in DUT
configuration. Essentially the feature accounts the time needed for the BAT file to execute
the setup of the DUT to transmit the Test Mode signal. Expect you to determine the
particular DUTs BAT files and set the time in TekExpress Automotive Ethernet application.
Note: Do not Pause while executing BAT file, the application have no control over
the completion of the BA
est Mode signal with selected data rate and
T file in this case.
See also
Test Selection: Select the tests on page
Configuration: Set measurement limits for tests on page 54
Oscilloscope channels to which the positive and negative signal of the DUT is
connected.
Data +ve Channel DeskewAvailable only when Probe Type=Single-Ended
Compensates the skew between the positive and negative channels of the oscilloscope
Refresh SourcesClick to refresh the selected resources.
Show Acquire ParametersSelect to view the acquisition parameters.
Signal ValidationSelect the signal validation type
•Prompt me if Signal Validation Fails
•Skip test if Signal Validation Fails
•Use signal as is - Don't Validate
VNA Import(Available only when Suite=MultiGBase-T1)
Imports a VNA result file (s-parameter) to the application for return loss measurement
TekExpress Automotive Ethernet saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder
for each session (a session starts when you click the Start button). The folder path is X:\Automotive-Ethernet \Untitled Session
\<dutid>\<date>_<time>. Images created for each analysis, CSV files with result values, reports and other information specific to that
particular execution are also saved in this folder.
=Single-Ended
Saving a session moves the session file contents from the Untitled Session folder to the specified folder name and changes the session
name to the specified name.
Select Use pre-recorded waveform files on the DUT tab, to use pre-recorded waveforms for analysis. Click for the selected
measurement and select the waveform file (.wfm).
Figure 30: Acquisitions tab with Use pre-recorded waveform files selected for 10Base-T1S
Figure 31: Acquisitions tab with Use pre-recorded waveform files selected for 100/1000Base-T1
Figure 32: Acquisitions tab with Use pre-recorded waveform files selected for MultiGBase-T1
Table 20: Acquisitions tab settings for Use pre-recorded waveform files
Column nameDescription
Refresh SourcesClick to refresh the sources.
Show Acquire ParametersSelect to view the acquisition parameters for the selected tests in the results table.
VNA Import(Available only when Suite=MultiGBase-T1)
ektronix recommends to use a Tektronix oscilloscope to capture the waveform files.
Note: T
See also
Acquire live waveforms for analysis
Acquire step by step
The Acquire Step By Step option is available in the Acquisitions panel. This is a global parameter that is applied to all tests when selected.
By default, this option is deselected.
When selected, this parameter allows for display of the reference input waveform of the selected measurement. This helps to compare the
input waveform coming from DUT with the typical reference waveform (snapshot), allowing you to change the setup before acquiring the
waveforms.
Note: When using prerecorded waveform files, the Acquire Step By Step option is not available.
Follow the naming convention for single-ended and differential waveforms which are saved in the session. Use the same naming
convention to save the waveform for pre-recorded mode analysis as shown in the below points:
The naming convention for differential 5GBASE-T1 waveform will be _DataRate_5G_Run1_Diff_
•
5GConveys the data rate of the waveform.
Run1Indicates the iteration index, which is helpful for the Muti-Run
Session feature in the DUT panel.
DiffRefers to the probing selection on the DUT panel as differential.
•The naming convention for single ended 2.5G BASE-T1 waveform will be _DataRate_2Dot5_Run1_P for positive and
_DataRate_2Dot5_Run1_N for negative waveforms.
2Dot5GConveys the data rate of the waveform.
Run1Indicates the iteration index, which is helpful for the Muti-Run
Session feature in the DUT panel.
Pos and NegRefers to the probing selection on the DUT panel as single-ended.
Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific
configurations available in this tab depends on the selections made in the DUT panel and Test Selection panel.
Figure 33: Configure tab settings for 10Base-T1S
Figure 34: Configure tab settings for 100Base-T1/1000Base-T1
Displays the upper and lower limits for the applicable measurement using different types of
comparisons.
In Compliance Mode, use the Limits Editor to view the measurement high and low limits used for
selected tests.
In User Defined Mode, use the Limits Editor to edit the limit settings.
Figure 36: Limits editor
To edit a value, click that field and either select from the displayed list or enter a new value. Use the
bottom scroll bar to view all available fields.
Setup panel: Configure the test setup
Global Settings
Instruments Detected
VNA Result File
Apply Band-pass Filter for Jitter
Measurements
Apply Scope Bandwidth
Limit(25GHz)
Table continued…
Displays the instruments connected to this application. Click on the instrument name to open a list of
available (detected) instruments. Select Options > Instrument Control Settings and click Refresh
to update the instrument list.
Note: Verify that the GPIB/LAN search criteria (default setting) in the Instrument Control
Settings is selected when using T
ekExpress Automotive Ethernet application.
Click Browse. Navigate to the folder path and select a return loss result file (s1p/s2p) generated
using a Vector Network Analyzer
. Available only, when Return Loss measurement is selected in the
Test Selection tab.
Select to apply the Band pass filter for the selected jitter measurements. Available only, either when
one among Transmitter Timing Jitter - MDI Jitter, Transmitter Timing Jitter - Master Jitter orTransmitter Timing Jitter - Slave Jitter measurements or all these measurements are selected in
the Test Selection tab.
Note: Band pass filter is applicable only for 1000Base-T1 Jitter Measurements and it is
disabled for 100Base-T1 and MultiGBase-T1.
When enabled, applies the bandwidth limit filter of 350 MHZ for 10BASE-T1S, 1 GHz for 100BASE-T1
and 2 GHz for 1000BASE-T1. This bandwidth limiting feature is applicable to all the measurements
except 100/1000BASE-T1 Return loss. A 100 MHz filter is applied for 10BASE-T1S Return loss.
In the case of MSO5/6 series, in pre-recorded mode this feature will not have an impact on the
measurement execution.
Scope BandwidthSelect to limit the effect of high frequency noise by limiting the oscilloscope bandwidth appropriately
for each data rate.
vailable only when Suite
(A
•2.5GBase-T1
•5GBase-T1
•10GBase-T1
The Configuration screen shows Global parameters, which are common for all tests, and Measurement parameters, which are specific to
selected tests, including acquisition, analysis, and limit parameters.
Note: You cannot change the Test parameters that are greyed out.
=MultiGBase-T1)
See also
DUT: Set DUT settings
Test Selection: Select the tests on page 45
Acquisitions: Set waveform acquisition settings on page 47
You can view or change the measurement parameters in the Configuration tab of the Setup panel. Configuration parameters are displayed
for the measurement selected, in the T
measurements are running tests in User Defined Mode. You cannot change the parameters in Compliance Mode.
10Base-T1S
est Selection tab. The parameters listed are enabled based on the measurement selected and if the
Figure 37: Configuration tab: Measurement for 10Base-T1S
Table 22: Configuration tab: Measurement settings for 10Base-T1S
Table 23: Configuration tab: Measurement settings for 100Base-T1
Setup panel: Configure the test setup
NameUnitRange/Allowable
values
Record LengthM Samples1 to 200.5
AveragesNA2 to 10016
2 to 1000500Return Loss
Spectral AverageNA2 to 2562
Hardware Clock
Divider
NANANA
DefaultDescriptionApplies to
12.5
Sets the record
length to use.
Sets the number of
averages (number of
acquisitions) for
average mode
acquisition.
Sets the number of
spectral averages
Select to use the
external hardware
clock divider unit
(66.66 MHz Tx_CLK
to 10 MHz) to
synchronize the DUT,
disturber signal
source (AWG/AFG),
and the oscilloscope.
Transmit Clock
Frequency
Transmitter Timing
Jitter (Master Jitter)
ransmitter T
T
Jitter (Slave Jitter)
Transmitter Output
Droop
Transmitter Power
Spectral Density
Transmitter Distortion
iming
Software Signal
Correction
NoneNANANA
Edge
•Falling
•Rising
Table continued…
NANANA
NANARising
When Software
Signal correction
method is selected,
the software
computes Tx
distortion for TM4
signal with disturber
source without using
hardware CDU
synchronization.
Select to check the
behavior of the DUT
without any Ref clock
(External or Internal).
Used to select the
type of edges on
which RMS jitter will
be calculated.
Select to use the
external hardware
clock divider unit (125
MHz Tx_CLK to 10
MHz) to synchronize
, disturber
the DUT
signal source (A
AFG), and the
oscilloscope.
When Software
Signal correction
method is selected,
the software
computes Tx
distortion for TM4
signal with disturber
source without using
hardware CDU
synchronization.
Select to check the
behavior of the DUT
without any Ref clock
(External or Internal).
WG/
Transmitter Distortion
Transmitter Distortion
Transmitter Distortion
Unit of Measurement
•dBm
•dBm/Hz
Edge
•Falling
•Rising
Hysteresis%1 to 105
Table continued…
NANAdBm
NANARising
Selects the unit of
measurement on
which Transmitter
Power Spectral
Density will be
displayed.
Used to select the
type of edges on
which RMS Jitter and
Peak-to-Peak Jitter
will be calculated.
Sets the hysteresis in
percentage that gets
used during edge
finding.
Transmitter Power
Spectral Density and
Power Level
Refer the below table for the options available in the Preferences tab:
Table 26: Preferences tab settings
SettingDescription
Execution Options
Acquire/Analyze each test <no> times (not applicable to Custom
ests)
T
Save data for initial <no> set of <type> waveformsSaves the set(s) of Pass/Fail waveforms to the session path.
Enable Logging
Actions on Test Measurement Failure
On Test Failure, stop and notify me of the failure
Hide schematics popup while running the test (for single test
selection only)
Manually configure Oscilloscope parameters
Select to repeat the test run by setting the number of times. By
default, the check box is disabled. Upon enabling, the default value
is 10. Refer
Multi-Run description on page 215 to perform the
measurements for a user defined number of iterations.
Select to record the actions of the user by the application. By
default, it is selected.
Select to stop the test run on Test Failure, and to get notified via
email. By default, it is unselected. Click Email Settings to configure
the email settings to receive notifications.
Enable to hide schematics popup while running the single test.
Available only when Suite=MultiGBase-T1
The feature allows you to configure the oscilloscope settings
manually such as Horizontal, Vertical and Trigger settings to capture
a waveform. In general TekExpress application configures the
oscilloscope optimally for each measurement as per the needs of
the specification. If you want to debug using different settings, then
select this feature.
The Status panel contains the Test Status and Log View tabs, which provides status on the test acquisition and analysis (Test Status) and
listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start to execute the test. Select the
Test Status or the Log View tab to view these items while the test execution is in progress.
View test execution status
The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and
analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.
The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand (
collapse () the table rows.
) and
Figure 42: Test execution status view in Status panel
Table 27: Test execution status table headers
Table HeaderDescription
Test NameDisplays the measurement name.
AcquisitionDescribes the type of data being acquired.
Acquire StatusDisplays the progress state of the acquisition:
T
o be started
•
•In Progress
•Completed
Analysis StatusDisplays the progress state of the analysis:
•To be started
•In Progress
•Completed
•Aborted
View test execution logs
The Test Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its
timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.
Figure 43: Log view in Status panel
Table 28: Status panel settings
ControlDescription
Message HistoryLists all the executed test operations and timestamp information.
Clear LogClears all the messages from the log view.
Save
Enables automatic scrolling of the log view as information is added to the log during the test execution.
Saves the log file into a text file format. Use the standard Save File window to navigate to and specify
the folder and file name to save the log text.
Click icon on each measurement in the row to expand and to display the minimum and maximum parameter values of the
measurement.
Filter the test results
Each column in the result table can be customized and displayed by enabling or disabling any column as per your requirement. You can
change the view in the following ways:
To remove or restore the Pass/Fail column, select Preferences > Show Pass/Fail.
•To expand all the listed tests, select View Results Details from the Preferences menu in the upper right corner.
•To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.
•To view the results grouped by lane or test, select the corresponding item from the Preferences menu.
•To expand the width of a column, place the cursor over the vertical line that separates the column from the column to the right. When
the cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.
•To clear all test results displayed, click Clear.
The Plots panel displays the result as a two-dimensional plot for additional measurement analysis. The plots are displayed only during run
and only for the measurements which supports plots.
Figure 45: Plots panel
Toolbar functions in plot windows
The Plot T
IconFunctions
Save
Select & Zoom
Zoom In
Zoom Out
Pan
Hide Gridlines
Table continued…
oolbar window includes the following functions:
Saves the plot.
Expands the selected plot area. Left-click and drag the mouse to mark the region on the plot to zoom.
Expands part of the plot (Horizontal and Vertical); the data appears in more detail.
Contracts part of the plot (Horizontal and Vertical); the data appears in less detail.
Sets the plot color. Click and select the color in the Color window and click OK. Click in the plot area to
Choose Waveform Colors
Show/Hide Markers
UnDock/Dock
apply the color.
Displays or hides the markers.
Click to undock/dock the plot window.
Select the measurement.
Viewing plots
The Plots panel displays a summary of plot generated during run. The plots have zoom, cursors, save, dock/undock, and select test
features. An Example of the plot generated during run, based on the measurement(s) selected is as shown:
Figure 46: Transmit Clock Frequency - 1000Base-T1 Histogram Plot
The Report panel contains the Configuration and View Settings tabs to configure the report generation settings and select the test result
information to include in the report. You can use the Reports panel to configure report generation settings, select test content to include in
reports, generate the report, view the report, browse for reports, name and save reports, and select report viewing options.
Report configuration settings
The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test
or when creating and saving test setups. Report settings configured are included in saved test setups.
Figure 47: Report panel- Configuration tab
Table 29: Report configuration panel settings
ControlDescription
ViewClick to view the most current report.
GenerateGenerates a new report based on the current analysis results.
Save AsSpecify a name for the report.
Report Update Mode Settings
Generate new reportEach time when you click Run and when the test execution is complete, it will create a new
report. The report can be in either .mht, .pdf, or .csv file formats.
Append with previous run sessionAppends the latest test results to the end of the current test results report. Each time when
you click this option and run the tests, it will run the previously failed tests and replace the
failed test result with the new pass test result in the same report.
Include header in appended reportsSelect to include header in appended reports.
Replace current test resultsReplaces the previous test results with the latest test results. Results from newly added
tests are appended to the end of the report.
In previous run, current session
In any run, any sessionSelect to replace current test results in the report with the test result(s) in the selected run
Report Creation Settings
Report name
Select to replace current test results in the report with the test result(s) of previous run in
the current session.
s report. Click and select test result of any other run session.
session’
Displays the name and path of the <Application Name> report. The default
location is at \My Documents>\My TekExpress\<ApplicationName>\Reports. The report file in this folder gets overwritten each time you run
a test unless you specify a unique name or select to auto increment the report name.
To change the report name or location, do one of the following:
•
In the Report Path field, type the current folder path and name.
•Double-click in the Report Path field and then make selections from the popup
keyboard and click Enter.
Save as type
Auto increment report name if duplicate
Create report automatically at the end of the
run
iew report after generating
V
Be sure to include the entire folder path, the file name, and the file extension.
For example: C:\Documents and Settings\your user name\MyDocuments\My TekExpress\<Application Name> \DUT001.mht.
Note: Y
ou cannot set the file location using the Browse button.
Open an existing report
Browse, locate and select the report file and then click View
Click
panel.
Saves a report in the specified file type, selected from the drop-down list. The report is
saved in .csv, .pdf, or .mht.
Note:
If you select a file type different from the default, be sure to change the report file
name extension in the Report Name field to match.
Sets the application to automatically increment the name of the report file if the application
finds a file with the same name as the one being generated. For example: DUT001,
DUT002, DUT003. This option is enabled by default.
Select to create the report with the settings configured, at the end of run.
Automatically opens the report in a Web browser when the test execution is complete. This
option is selected by default.
The View Settings
or when creating and saving test setups. Report settings configured are included in saved test setups.
tab describes the report view settings to configure the Reports panel. Select report view settings before running a test
Figure 48: Report panel-View settings tab
Table 30: Report panel view settings
ControlDescription
Contents To Save Settings
Include pass/fail info in details tableSelect to include pass/fail information in the details table of the report.
Include detailed resultsSelect to include detailed results in the report.
Include plot imagesSelect to include the plot images in the report.
Include setup configurationSets the application to include hardware and software information in the summary box
at the top of the report. Information includes: the oscilloscope model and serial number,
the oscilloscope firmware version, and software versions for applications used in the
measurements.
Include complete application configuration
Include user commentsSelect to include any comments about the test that you or another user have added in
Include statics tableSelect to include test run statistics in the report. This is enabled when you run any test for
Table continued…
Select to include the complete application configuration in the report.
the DUT tab of the Setup panel. Comments appear in the Comments section, below the
summary box at the beginning of each report.
more than once. Set Acquire/Analyze each test in the Preferences tab to more than one,
to run any test for multiple times.
Saved test setup information (such as the selected oscilloscope, general parameters, acquisition parameters, measurement limits,
waveforms (if applicable), and other configuration settings) are saved under the setup name at X:\<Application Name>.
Use test setups to:
•Run a new session, acquire live waveforms, using a saved test configuration.
•Create a new test setup using an existing one.
•View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results
summary.
•Run a saved test using saved waveforms.
Save the configured test setup
You can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default
test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other
configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s
default value.
Select Options > Save Test Setup to save the opened setup.
Select Options > Save Test Setup As to save the setup with different name.
Load a saved test setup
To open (load) a saved test setup, do the following:
•Select Options > Open Test Setup.
•Select the setup from the list and click Open. Setup files are located at X:\<Application Name>.
Select a pre-run session from the loaded test setup
Complete the following steps to load a test setup from a pre-run session:
1. Select Options > Open Test Setup.
2. Select a setup from the list and then click Open. Setup files are located at X:\<Application Name>\.
3. Switch the mode to Pre-recorded waveform files in the DUT panel.
4. Select the required waveforms from the selected setup in the Acquisition tab and Run the required test.
Refer Section 147.5.4 and section 147.9.2 in IEEE Std 802.3cg™-2019.IEEE Standard for Ethernet Amendment 5: Physical Layers
Specifications and Management Parameters for 10 Mb/s Operation and Associated Power Delivery over a Single Balanced Pair of
Conductors.
The table below lists the measurements and its reference section for a detailed test procedure:
Measurement NameTest Mode SignalReference section for Test Procedure
Transmitter Output DroopTest Mode 2Measurement procedure using TC1
dif
ferential coupon and the single-ended test
on page 103
fixture.
Transmitter Timing JitterTest Mode 1, TX_TCLK lineMeasurements using symbol rate clock
(TX_TCLK) of DUT on page 101
Transmitter Power Spectral DensityTest Mode 3Measurement procedure using TC1
Transmitter Output VoltageTest Mode 1
Transmit Clock Frequency (Informative)Test Mode 1, TX_TCLK line
MDI Return LossSlave Idle ModeReturn Loss measurement on page 116
differential coupon and the single-ended test
fixture. on page 103
10Base-T1S Test limits
The below table lists the 10Base-T1S test measurement limits:
Refer section 96.5.4 and section 96.8.2.1 in IEEE P802.3bw™/D3.3 Standard for Ethernet Amendment: Physical Layer Specifications and
Management Parameters for 100 Mb/s Operation over a Single Balanced Twisted Pair Cable.
The table below list the measurements and its reference section for a detailed test procedure:
Measurement NameTest Mode SignalReference section for Test Procedure
Maximum Transmitter Output DroopTest Mode 1Measurement procedure using TC1
differential coupon and the single-ended test
on page 103
fixture.
Transmitter DistortionTest Mode 4Transmitter Distortion on page 122
Transmitter Timing Jitter- Master and SlaveTest Mode 2, TX_TCLKMeasurements using symbol rate clock
Figure 56: Example TestMode 5, PAM3 waveform for probing type differential
Automotive Ethernet measurements
Figure 57: Example TestMode 2, Clock waveform for probing type single-ended
1000Base-T1 Measurements
1000Base-T1 Measurement list
Reference specification
Refer section 97.1 and section 97.3.1 in IEEE P802.3bpTM-2016, IEEE Standard for Ethernet Amendment 4: Physical Layer Specifications
and Management Parameters for 1 Gb/s Operation over a Single Twisted-Pair Copper Cable.
The table below list the measurements and its reference section for a detailed test procedure:
Measurement NameTest Mode SignalReference section for Test Procedure
Maximum Transmitter Output DroopTest Mode 6Measurement procedure using TC1
ferential coupon and the single-ended test
dif
fixture.
on page 103
Transmitter DistortionTest Mode 4Transmitter Distortion on page 122
Transmitter Timing Jitter - Master and Slave Test Mode 1, TX_TCLK lineMeasurements using symbol rate clock
(TX_TCLK) of DUT on page 101
Transmitter Timing Jitter - MDITest Mode 2Measurement procedure using TC1
Transmitter Power Spectral DensityTest Mode 5
Transmit Clock FrequencyTest Mode 2
MDI Return LossSlave Idle ModeReturn Loss measurement on page 116
Transmitter Peak Differential OutputTest Mode 5Measurement procedure using TC1
MDI Mode Conversion LossSlave Idle Mode
differential coupon and the single-ended test
fixture. on page 103
differential coupon and the single-ended test
fixture. on page 103
Given below are the example test mode waveforms for 1000Base-T1.
Figure 58: Example TestMode 2, Clock waveform
Automotive Ethernet measurements
Figure 59: Example TestMode 5 waveform
Figure 60: Example TestMode 6, Droop waveform
MultiGBASE-T1 Measurements
MultiGBASE-T1 Measurement List
Reference specification:
Refer Section 149.5.2 in IEEE Std 802.3ch™‐2020, IEEE Standard for Ethernet Amendment 4: Physical Layer Specifications and
Management Parameters for 1 Gb/s Operation over a Single Twisted-Pair Copper Cable.
Refer section 149.8.2.1 in IEEE Standard for Ethernet Amendment 8: Physical Layer Specifications and Management Parameters for 2.5
Gb/s, 5 Gb/s, and 10 Gb/s Automotive Electrical Ethernet.
The following table lists the measurements and its reference section for a detailed test procedure:
For 10Base-T1S all the test can be performed and excluding the return loss using the soldering fixture. For list of measurement Refer Table
31 on page 96.
For 100Base-T1/1000Base-T1 all the test can be performed and excluding the return loss using the soldering fixture and Automotive
Ethernet MateNet. For list of measurement Refer T
able 32 on page 96 and Table 33 on page 96.
For 100Base-T1/1000Base-T1 Transmitter distortion test can be performed using Automotive Ethernet Distortion Card and one of the
fixture mentioned in above steps.
Table 34: Probing Type Single-Ended: Test Fixture Details Suit Measurement
Test SuitMeasurement NameFixturePart number
10 BaseT1-SAll Test (Exclude Return Loss)Soldering Fixture640-1028-000
100/1000Base-T1All Test (Exclude Return Loss, Tx Dist)ETH-TPA-AW-MN (Automotive Ethernet,
MateNet, Tyco)
All Test (Exclude Return Loss, Tx Dist)Soldering Fixture640-1028-000