Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes Online Help

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TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes

Printable Application Help

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077-1366-00

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes

Printable Application Help

www.tek.com

077-1366-00

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

■

In North America, call 1-800-833-9200.

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Worldwide, visit www.tek.com to find contacts in your area.

Welcome .............................................................................................................................................. v

Getting help and support

Conventions .................................................................................................................................... 1

Related documentation ................................................................................................................... 2

Technical support ........................................................................................................................... 3

Getting started

Minimum system requirements ...................................................................................................... 5

Instruments and accessories required ............................................................................................. 6

Downloading and installing the software ....................................................................................... 7

View software version .................................................................................................................... 7

Application directories ................................................................................................................... 8

File name extensions ...................................................................................................................... 9

Operating basics

Launch the application .................................................................................................................. 11

Application panels overview ........................................................................................................ 12

Global application controls ........................................................................................................... 14

Application controls ................................................................................................................ 14

Options menu overview ........................................................................................................... 16

TekExpress instrument control settings .................................................................................. 17

View connected instruments ................................................................................................... 18

Configure email settings .......................................................................................................... 19

Setup panel ................................................................................................................................... 20

Setup panel overview .............................................................................................................. 20

Set DUT parameters ................................................................................................................ 21

Select tests ............................................................................................................................... 22

Set acquisition tab parameters ................................................................................................. 23

Set configuration tab parameters ............................................................................................. 24

Set preferences tab parameters ................................................................................................ 27

Status panel ................................................................................................................................... 28

Status panel overview .............................................................................................................. 28

Results panel ................................................................................................................................. 29

Results panel overview ............................................................................................................ 29

TekExpress® 400G-TXE Printable Application Help i

Table of Contents

View test-related files .............................................................................................................. 30

Reports panel ................................................................................................................................ 31

Reports panel overview ........................................................................................................... 31

Select report options ................................................................................................................ 31

View a report ........................................................................................................................... 34

Report contents ........................................................................................................................ 34

Running tests

Equipment connection setup ......................................................................................................... 37

Prerequisite ................................................................................................................................... 40

Compensate the signal path ..................................................................................................... 40

Deskew .................................................................................................................................... 40

Running tests ................................................................................................................................ 42

400G-TXE compliance measurements

DC common mode output voltage ................................................................................................ 43

Common mode noise .................................................................................................................... 44

Single-ended output voltage ......................................................................................................... 45

Diff peak to peak output voltage Tx enabled ............................................................................... 46

Transition time .............................................................................................................................. 47

Eye width, eye height, and eye linearity ....................................................................................... 48

Eye symmetry mask width ........................................................................................................... 49

Signal-to-noise and distortion ratio .............................................................................................. 50

Level separation mismatch ratio ................................................................................................... 51

Linear fit pulse peak ..................................................................................................................... 52

Steady state voltage ...................................................................................................................... 53

Even odd jitter .............................................................................................................................. 54

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter ........... 55

SCPI commands

About SCPI command .................................................................................................................. 57

Socket configuration for SCPI commands ................................................................................... 57

TEKEXP:*IDN? ........................................................................................................................... 65

TEKEXP:*OPC? .......................................................................................................................... 65

TEKEXP:ACQUIRE_MODE ...................................................................................................... 66

TEKEXP:ACQUIRE_MODE? .................................................................................................... 66

TEKEXP:EXPORT ...................................................................................................................... 67

TEKEXP:INFO? ........................................................................................................................... 67

ii TekExpress® 400G-TXE Printable Application Help

Table of Contents

TEKEXP:INSTRUMENT ............................................................................................................ 68

TEKEXP:INSTRUMENT? .......................................................................................................... 68

TEKEXP:LASTERROR? ............................................................................................................. 69

TEKEXP:LIST? ............................................................................................................................ 69

TEKEXP:MODE .......................................................................................................................... 70

TEKEXP:MODE? ........................................................................................................................ 71

TEKEXP:POPUP ......................................................................................................................... 71

TEKEXP:POPUP? ........................................................................................................................ 72

TEKEXP:REPORT ...................................................................................................................... 72

TEKEXP:REPORT? ..................................................................................................................... 73

TEKEXP:RESULT? ..................................................................................................................... 73

TEKEXP:SELECT ....................................................................................................................... 74

TEKEXP:SELECT? ..................................................................................................................... 75

TEKEXP:SETUP .......................................................................................................................... 75

TEKEXP:STATE ......................................................................................................................... 76

TEKEXP:STATE? ........................................................................................................................ 76

TEKEXP:VALUE ........................................................................................................................ 77

TEKEXP:VALUE? ...................................................................................................................... 78

Command parameters list ............................................................................................................. 79

Examples ..................................................................................................................................... 84

References

Parameters .................................................................................................................................... 87

About application parameters .................................................................................................. 87

Setup panel configuration parameters ..................................................................................... 87

Reports panel parameters ........................................................................................................ 91

TekExpress® 400G-TXE Printable Application Help iii

Table of Contents

iv TekExpress® 400G-TXE Printable Application Help

Welcome

Welcome to Tektronix Real Time Oscilloscope based 400G-TXE electrical compliance test solution. The 400G-TXE is a TekExpress compliance software which evaluates the electrical PAM4 signals to the specification-mandated limits.

The 400G-TXE Real-Time electrical compliance test solution provides turnkey testing and debug of the TX electrical properties, key to OIF-CEI-VSR/MR/LR standards. It tests the OIF-CEI specification levels in a simple, cost effective manner. It aligns the best in class Real Time Oscilloscope performance with strong market demand for 400G based electrical PAM4 analysis tools.

The 400G-TXE solution specifically targets sections 16.3.2, 16.3.3, 16.B of OIFCEI-56-VSR standard, section 17.3 of OIF-CEI-56G-MR standard, and section 21.3 of OFI-CEI-56G-LR standard, while offering comprehensive test automation, results margining, data logging, and results reporting in an advanced testing framework.

TekExpress® 400G-TXE Printable Application Help v

Welcome

Key features of TekExpress 400G-TXE include:

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Streamlined and fully automated transmitter characterization of OIFCEI-56G-VSR, OIF-CEI-56G-MR, and OIF-CEI-56G-LR electrical transmitter specifications (chip-to-chip and chip-to-module)

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In-depth analysis and debug capabilities of electrical PAM4 signals in combination with the PAM4 software package

vi TekExpress® 400G-TXE Printable Application Help

Getting help and support

Conventions

Help uses the following conventions:

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The term "Application" and "Software" refers to the TekExpress 400G-TXE Solution application.

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The term “DUT” is an abbreviation for Device Under Test.

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The term “select” is a generic term that applies to the different methods of choosing a screen item (button, control, list item): using a mouse or using the touch screen.

Table 1: Icon descriptions

Icon Meaning

This icon identifies important information.

This icon identifies conditions or practices that could result in loss of data.

This icon identifies additional information that will help you use the application more efficiently.

TekExpress® 400G-TXE Printable Application Help 1

Getting help and support

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the website. See

Contacting Tektronix for more information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

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General information

All instrument model numbers

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Hardware options, if any

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Probes used

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Your name, company, mailing address, phone number, FAX number

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Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application specific

information

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Software version number

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Description of the problem such that technical support can duplicate the problem

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If possible, save the setup files for all the instruments used and the application

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If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file

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If possible, save the waveform on which you are performing the measurement as a .wfm file

TekExpress® 400G-TXE Printable Application Help 3

Getting help and support

4 TekExpress® 400G-TXE Printable Application Help

Getting started

Minimum system requirements

The following table shows the minimum system requirements to install and run the TekExpress 400G-TXE solution.

Table 3: System requirements

Component Description

Oscilloscope

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Tektronix DPO70K, DX / SX series oscilloscope

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Firmware Version: 10.4 or above

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Opt. DJA, DJAN, PAM4, and SDLA64

Software

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IronPython 2.7.3 installed

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PyVisa 1.0.0.25 installed

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Microsoft .NET 4.0 Framework

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Microsoft Internet Explorer 7.0 SP1 or greater, or other Web browser for viewing reports

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Adobe Reader software 7.0 or greater for viewing portable document format (PDF) files

TekExpress® 400G-TXE Printable Application Help 5

Getting started

Instruments and accessories required

TekExpress 400G-TXE application is launched on DPO70K series oscilloscope. The following table lists the instruments and accessories required for this application.

Table 4: Instruments and accessories required for 400G-TXE application

Instrument/Accessory Model number Quantity

Oscilloscope DPO73304DX, MSO73304DX,

DPO73304SX, DPS73308SX, DPO75002SX, DPS75004SX, DPO77002SX, DPS77004SX, DPO75902SX, DPS75904SX

Cables Compatible SMA cables with

bandwidth greater than 40 GHz for connecting single ended sources ATI channel.

Fixtures

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Wilder Host compliance board at TP1a (HCB-P) (Wilder part number: 640-0822-000)

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Wilder Module compliance board at TP4 (MCB) (Wilder part number: 640-0823-000)

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Any compatible text fixture for CEI-VSR at TP0a, CEIMR and CEI-LR

DC Blocks Compatible DC block with

bandwidth range 50 KHz to 65 GHz

Attenuator 3, 6, or 10 dB attenuators 2

6 TekExpress® 400G-TXE Printable Application Help

Downloading and installing the software

Complete the following steps to download and install the latest 400G-TXE application. See Minimum system requirements for compatibility.

1. Go to www.tek.com.

2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as

Software and enter 400G-TXE in the MODEL OR KEYWORD field and click SEARCH.

3. Select the latest version of software and follow the instructions to download. Copy the executable file to the oscilloscope.

Getting started

View software version

4. Double-click the executable and follow the on-screen instructions. The software is installed at C:\Program Files\Tektronix\TekExpress\400G-TXE\.

5. Select Analyze > 400G-TXE from the TekScope menu to Launch the

application.

Use the following instructions to view version information for the application and for the application modules such as the Programmatic Interface and the Programmatic Interface Client.

To view version information for 400G-TXE, click button in the TekExpress application and select About TekExpress.

NOTE. This example shows a typical Version Details dialog box, and may not reflect the actual values as shown when you open this item in the application.

TekExpress® 400G-TXE Printable Application Help 7

Getting started

Application directories

The TekExpress 400G-TXE application files are installed at the following location:

C:\Program Files\Tektronix\TekExpress\TekExpress 400G-TXE

The following table lists the application directory names and their purpose.

Table 5: Application directories and usage

Directory names Usage

Bin Contains TekExpress 400G-TXE application libraries

Compliance Suites Contains compliance-specific files

Examples Contains various support files

ICP Contains instrument and TekExpress 400G-TXE application-

specific interface libraries

Images Contains images of the TekExpress 400G-TXE application

Lib Contains utility files specific to the TekExpress 400G-TXE

application

Report Generator Contains style sheets for report generation

Tools Contains instrument and TekExpress 400G-TXE application-

specific files

8 TekExpress® 400G-TXE Printable Application Help

Getting started

File name extensions

View test-related files

File name extensions

The TekExpress 400G-TXE application uses the following file name extensions:

File name extension Description

.TekX Application session files (the extensions may not be displayed)

.py Python sequence file

.xml Test-specific configuration information (encrypted) files

Application log files

.csv Test result reports

Plot data

.mht Test result reports (default)

Test reports can also be saved in HTML format

.pdf Test result reports

Application help document

.xslt Style sheet used to generate reports

Operating basics

Launch the application

To launch the TekExpress 400G-TXE solution, select Analyze > 400G-TXE from the TekScope menu.

When you launch the application for the first time, the file C:\Users\<username> \Documents\My TekExpress\400G-TXE\Resources.xml is mapped to drive X:. This file contains information about available network-connected instruments. The session files are stored in X:\400G-TXE\. If this file is not found, then the application runs Instrument Discovery Program to detect the network-connected instruments before launching 400G-TXE solution.

If the application is behind the oscilloscope application, click Analyze > 400G- TXE to bring it to the front. To keep the 400G-TXE application window on top, select Keep On Top from the 400G-TXE Options menu.

TekExpress® 400G-TXE Printable Application Help 11

Operating basics

Application panels overview

TekExpress 400G-TXE solution uses panels to group Configuration, Results, and Reports settings. Click any button to open the associated panel. A panel may have one or more tabs that list the selections available in that panel. Controls in a tab can change depending on settings made in the same tab or another tab.

12 TekExpress® 400G-TXE Printable Application Help

Operating basics

Table 6: Application panels overview

Panel Name Purpose

Setup panel To select the test setup controls which are grouped in tabs. The controls

in a tab can change depending on settings made in the same tab or another tab. Click the Setup button to open this panel. Use this panel to:

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Set the DUT parameters

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Select the tests

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Set the acquisition parameters

■

Set the configuration parameters

■

Set the preferences parameters

Status panel This panel displays the acquisition status and analysis status for the

selected tests in Test Status and logs in Log View.

Results panel This tab displays the summary of test results and select result viewing

preferences.

Reports panel Browse for reports, save reports as specific file types, specify report

naming conventions, replace current test results in the report with the test result(s) of previous run in current session, select report content to include (summary information, detailed information, user comments, setup configuration, application configuration), and select report viewing options.

Global application controls

Application controls

Table 7: Application controls descriptions

Item Description

Options menu

Panel buttons

Start/Stop button

Menu to display global application controls

Controls that open panels for configuring test settings and options.

Use the Start button to start the test run of the measurements in the selected order. If prior acquired measurements have not been cleared, the new measurements are added to the existing set. The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.

Pause \ Continue button

Use the Pause button to temporarily interrupt the current acquisition. When a test is paused, the button name changes to “Continue.”

14 TekExpress® 400G-TXE Printable Application Help

Operating basics

Item Description

Clear button

Minimize button

Close button

Application window move Place the cursor over the application window and drag it to the

Mini view / Normal view

Use the Clear button to clear all existing measurement results. Adding or deleting a measurement, or changing a configuration parameter of an existing measurement also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on the Results panel.

Minimizes the application.

Exits the application.

desired location.

Toggles the application between mini view and normal view. Mini view displays the run messages with the time stamp, progress bar, Start / Stop button, and Pause / Continue button. The application moves to mini view when you click the Start button.

TekExpress® 400G-TXE Printable Application Help 15

Operating basics

Options menu overview

To access Options menu, click in the upper-right corner of the application. It has the following:

Options menu

Menu Function

Default Test Setup Opens an untitled test setup with defaults selected

Acquire Live Waveforms

Mode: Compliance Standard: OIF-PAM4 Specification: CEI-VSR Test Point: TP0a Specification: OIF-CEI-VSR, Section 16.B.1.1 Data rate: 26.5625 GBd

Open Test Setup Opens a saved test setup

Save Test Setup Saves the current test setup

Save Test Setup As Saves the current test setup with a different file name or file type

Open Recent Displays the recently opened test setups to open

Instrument Control Settings

Keep On Top Keeps the TekExpress 400G-TXE application on top of all the application

Email Settings Use to configure email options for test run and results notifications

Deskew Use to set deskew parameter and read the deskew/attenuation values of

Detects, lists, and refreshes the connected instruments found on specified connections (LAN, GPIB, USB, and so on)

the instrument.

16 TekExpress® 400G-TXE Printable Application Help

Menu Function

Help Displays the TekExpress 400G-TXE help

About TekExpress

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Displays application details such as software name, version number, and copyright

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Provides a link to the end-user license agreement

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Provides a link to the Tektronix Web site

Operating basics

Configure email settings

To be notified by email when a test completes, fails, or produces an error, configure the email settings.

1. Click Options > Email Settings to open the Email Settings dialog box.

2. (Required) For Recipient email Address(es), enter one or more email

addresses to which to send the test notification. To include multiple addresses, separate the addresses with commas.

3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name followed by an underscore followed by the instrument serial number, then the @ symbol and the email server used. For example: DPO72016C_B130099@yourcompany.com.

4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location, and the SMTP Port number, in the corresponding fields.

Enter a valid login name and password in the corresponding fields. Select Enable SSL, if the server requires SSL/TLS technology.

NOTE. If any of the above required fields are left blank, the settings will not be saved and email notifications will not be sent.

5. In the Email Attachments section, select from the following options:

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Reports: Select to receive the test report with the notification email.

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Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

6. In the Email Configuration section:

■

Select the message file format to send: HTML (the default) or plain text.

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Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 5 MB.

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Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

8. To test your email settings, click Test Email.

9. To apply your settings, click Apply.

10. Click Close when finished.

TekExpress® 400G-TXE Printable Application Help 19

Operating basics

Setup panel

Email settings

Setup panel overview

The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.

20 TekExpress® 400G-TXE Printable Application Help

Operating basics

Set DUT parameters

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also affect the list of available tests in the Test Selection tab.

Click Setup > DUT to access the DUT parameters:

Table 8: DUT tab settings

Setting Description

DUT ID Adds an optional text label for the DUT to reports. The default

value is DUT001. The maximum number of characters is 32. You cannot use the following characters in an ID name: (.,..,..., \,/:?”<>|*)

Opens Comments dialog box to enter text to add to the report.

Comments icon (to the

right of the DUT ID field)

Acquire live waveforms Acquire active signals from the DUT for measurement and

Use pre-recorded waveform files

Mode

Standard OIF-PAM4

Maximum size is 256 characters. To enable or disable comments appearing on the test report, see Select report options.

analysis.

Run tests on a saved waveform. Select Options > Open Test Setup to recall a saved test setup.

■

Compliance

■

User Defined

TekExpress® 400G-TXE Printable Application Help 21

Operating basics

Setting Description

Specification

Test Points Select the test points from the drop-down list. The options

Specification Version Displays the specification version for the selected Specification

Device Profile

Data Rate Set the data rate to be tested.

Crosstalk Source Select crosstalk source when a cross talk generator is

■

CEI-VSR

■

CEI-MR

■

CEI-LR

available depends on the Specification selected. For CEI-VSR, the test points are TP0a, TP1a, TP4. For CEI-MR and CEI-LR, the test point is Testpoint-T.

and Test Points.

connected. This is applicable for eye measurements only.

Select tests

Use the Test Selection tab to select the tests. The test measurements available depend on the standards selected in the DUT tab.

22 TekExpress® 400G-TXE Printable Application Help

Operating basics

Table 9: Test Selection tab settings

Setting Description

Tests Select or clear a test. Highlight a test to show details in the Test

Description pane.

Test Description Shows brief description of the highlighted test in the Test field.

Deselect All Click to clear all tests.

Select All Click to select all tests. All tests are selected by default.

Schematic Click to display the schematic diagram of the DUT test setup for

the selected test. Use the diagram to verify the test setup before running the test.

Status panel

Status panel overview

The Status panel accesses the Test Status and Log View tabs, which provide status on test acquisition and analysis (Test Status tab) and a listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start a test run. You can select the Test Status or the Log View tab to view these items while the tests are running.

Test status view

Log view

28 TekExpress® 400G-TXE Printable Application Help

Results panel

Operating basics

Table 13: Status panel Log View controls

Control Description

Message History Lists all executed test operations and timestamp

information.

Auto Scroll Enables automatic scrolling of the log view as

information is added to the log during the test.

Clear Log Clears all messages from the log view.

Save Saves the log file to a text file. Use the standard

Save File window to navigate to and specify the folder and file name to which to save the log text.

Results panel overview

When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.

TekExpress® 400G-TXE Printable Application Help 29

Operating basics

View test-related files

Files related to tests are stored in C:\Users\<username>\Documents\My TekExpress\400G-TXE\. Each test setup in this folder has a test setup file and a test setup folder, both with the test setup name.

The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.

Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.

Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside its matching session folder:

Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran tests using prerecorded waveform files, these are included here.

The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\400G-TXE\. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the Untitled Session folder until you run a new test or until you close the 400G-TXE application.

Reports panel

Operating basics

Reports panel overview

Use the Reports panel to browse for reports, to name and save reports, select test content to include in reports, and to select report viewing options.

Select report options

For information on setting up reports, see Select report options. For information on viewing reports, see View a report.

View a report

Report contents

The application automatically generates a report when test execution is complete and displays the report in your default Web browser (unless you cleared the View Report After Generating check box in the Reports panel before running the test). If you cleared this check box, or to view a different test report, do the following:

1. Click the Reports button.

2. Click the Browse button and locate and select the report file to view.

3. In the Reports panel, click View.

For information on changing the file type, file name, and other report options, see

Select report options.

A report shows detailed results and plots, as set in the Reports panel.

Setup configuration information

The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and serial number, electrical module model, and software version numbers of all associated applications.

To exclude this information from a report, clear the Include Setup Configuration check box in the Reports panel before running the test.

User comments

If you selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.

34 TekExpress® 400G-TXE Printable Application Help

Operating basics

Running tests

Equipment connection setup

Click Setup > Test Selection > Schematic to view the equipment setup diagram(s).

Figure 1: Connection diagram for CEI-VSR at test point TP0a, CEI-MR, and CEI-LR

Figure 2: Connection diagram for CEI-VSR at test point TP1a

TekExpress® 400G-TXE Printable Application Help 37

Running tests

Figure 3: Connection diagram for CEI-VSR at test point TP1a (for Eye measurements)

Figure 4: Connection diagram for CEI-VSR at test point TP4

38 TekExpress® 400G-TXE Printable Application Help

Running tests

Figure 5: Connection diagram for CEI-VSR at test point TP4 (for Eye measurements)

TekExpress® 400G-TXE Printable Application Help 39

Running tests

Prerequisite

Compensate the signal

path

Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a week. Failure to do so may result in the instrument not meeting warranted performance levels.

1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.

2. Disconnect any probes you have connected to the input channels.

3. Set the instrument to Menu mode.

4. Select Instrument Calibration from the Utilities menu.

5. Note any instructions that appear in the resulting control window.

6. Click Run SPC to begin the procedure. The procedure may take several

minutes to complete.

7. Verify that the Status changes to Compensated after the procedure is complete. If the Calibration Status field indicates anything other than Compensated, see Signal Path Compensation Status for information on the readout and recommended action.

NOTE. When making measurements at vertical scale settings less than or equal to 5 mV, you should perform the signal path compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at those volts/div settings.

Deskew

40 TekExpress® 400G-TXE Printable Application Help

If skew is present between positive and negative channels, then the channels need to be deskewed before being used for waveform measurements. TekExpress 400G-TXE provides support for channel deskew using the following method:

1. Determine what the skew is for each channel.

2. From the TekScope menu, select Vertical > Deskew.

3. In the Deskew/Attenuation window, click the channel (1 – 4) button for the

first channel to be deskewed.

4. Click in the Ch(x) Deskew Time entry field and enter the skew. The skew can be +ve or –ve.

5. Click the channel button for the next channel and repeat step 4.

6. After entering the skew for all the channels that require it, from the Options

menu in TekExpress 400G-TXE, select Deskew.

Running tests

7. In the Deskew dialog box, select the desired level:

■

Less than 100 mV signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is less than 100 mV/division.

■

100 mV or greater signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is greater than 100 mV/ division.

Figure 6: Deskew

8. Click Read Deskew/Attn.

9. When the status in the dialog box indicates the deskew is finished, click

Close.

Each input channel has its own deskew settings. Deskew compensates individual channels for probes or cables of different lengths. The instrument applies the delay values after each completed acquisition. The deskew values are saved as part of the instrument setup. The deskew values for the selected channel are retained until you change the probe, you restore a saved setup, or you recall the factory setup.

NOTE. If you perform the de-embed settings, then performing the De-Skew and Attenuation settings are not required.

TekExpress® 400G-TXE Printable Application Help 41

Running tests

Select tests, set acquisition parameters, set configuration parameters, set preferences parameters, and click Start to run the tests. While tests are running,

you cannot access the Setup or Reports panels. To monitor the test progress, switch between the Status panel and the Results panel.

While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using Alt + Tab key combination. To keep the TekExpress 400G-TXE application on top, select Keep On Top from the TekExpress Options menu.

The application displays report when the tests execution is complete.

Prerun checklist

1. Make sure that the instruments are warmed up (approximately 20 minutes) and stabilized.

2. Perform compensation: In the oscilloscope main menu, select Utilities > Instrument Compensation. Click Help in the compensation window for

steps to perform instrument compensation.

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400G-TXE compliance measurements

DC common mode output voltage

This section verifies that the DC common mode output voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

TP0a -0.3 V 2.8 V

TP1a -0.3 V 2.8 V

TP4 -0.35 V 2.85 V

Testpoint-T 0 V 1.9 V

Min Max

Measurement procedure

Maximum input to be provided to the ATI channels is ≤ 300 mV peak-to-peak. The DC common mode voltage of the signal cannot be measured using ATI channels. Measure the voltage using an external digital multimeter and enter the value in the application.

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400G-TXE compliance measurements

Common mode noise

This section verifies that the common mode noise of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

TP0a NA 12 mV

TP1a NA 17.5 mV

TP4 NA 17.5 mV

Testpoint-T NA 30 mV

Input

Any valid positive and negative signals from the oscilloscope

Measurement procedure

The common mode voltage is a measure of the deviation of the common mode signal around the mean value. Find the sum of the positive and negative signals to create the common mode signal and create a vertical histogram on this signal. The RMS value of the vertical histogram is the Common Mode Noise.

To find the effective common mode voltage after removing the instrumentation noise, use the following formula:

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400G-TXE compliance measurements

Single-ended output voltage

This section verifies that the single-ended output voltage of the data positive and data negative signals of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

Input

Testpoint-T -0.3 V 1.9 V

Data positive and data negative signals

Measurement procedure

The single-ended output voltage is the measure of maximum and minimum values of the single-ended signals. Since the voltage levels can go beyond the 300 mV peak-to-peak, this measurement cannot be done using the ATI channels of the oscilloscope. Connect a DC block to eliminate the DC content present in the signal and then measure the maximum and minimum values of the positive and negative signals.

Effective Data Positive Max voltage = DC Common Mode + Data Positive Max

Effective Data Positive Max voltage = DC Common Mode + Data Positive Min

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400G-TXE compliance measurements

Diff peak to peak output voltage Tx enabled

This section verifies that the differential peak-to-peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

TP0a 750 mV NA

TP1a NA 880 mV

TP4 NA 900 mV

Testpoint-T NA 1200 mV

Input

QPRBS13-CEI or any valid signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

The differential peak-to-peak voltage is the peak-to-peak value of the signal acquired using a base oscilloscope.

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400G-TXE compliance measurements

Transition time

This section verifies that the transition time of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

TP0a 7.5 ps NA

TP1a 12 ps NA

TP4 9.5 ps NA

Input

QPRBS13-CEI test pattern or any valid signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

Transition times (rise and fall times) are defined as the time between the 20% and 80% times, or 80% and 20% times respectively, of the isolated -1 to +1 or +1 to

-1 PAM4 edges.

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400G-TXE compliance measurements

Eye width, eye height, and eye linearity

This section verifies that the eye width, eye height, and eye linearity of the DUT are within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Measurement Specification Test Points Limits

Min Max

OIF-PAM4 Eye Width OIF-CEI-VSR,

Eye Height 35 mV NA

Eye Linearity 0.85

Near End Eye Width

Near End Eye Height

Near End Eye Linearity

Far End Eye Width

Far End Eye Height

Far End Eye Linearity

Table 16-1

OIF-CEI-VSR, Table 16-4

TP1a 0.22 UI NA

TP4 0.35 UI NA

105 mV NA

0.75

0.2 UI NA

30 mV NA

0.75

Input

Differential signal filtered through a fourth order Bessel Thomson filter through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz with a Continuous Time Linear Equalizer (CTLE).

Measurement procedure

Calibrate the Crosstalk Amplitude Differential voltage peak-to-peak and Crosstalk transition time of the co-propagating signals to 900 mV and 12 ps respectively.

Eye width and eye height are measured using a fourth order Bessel Thomson filter with an appropriate bandwidth cutoff and a selectable continuous time linear equalizer. It is recommended to use PRBS13Q pattern for this measurement.

The CTLE filters are selected as per the following table:

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400G-TXE compliance measurements

Specification CTLE filters

CEI-VSR Host output TP1a From 1dB to 8dB

CEI-VSR Module output TP4 (Near End) From 1dB to 2dB

CEI-VSR Module output TP4 (Far End) From 1dB to 8dB

Eye linearity is calculated by the following formula:

Eye linearity = Min (Vupp, Vmid, Vlow) / Max (Vupp, Vmid, Vlow)

The best CTLE filter is the one which has the maximum eye area and gives passing result for eye width, eye height, and eye linearity.

At module output (TP4), the eye width is divided into 2 types:

■

Near End Eye Width and Near End Eye Height

■

Far End Eye Width and Far End Eye Height

Near End Eye Width and Near End Eye Height are same as the Eye Width and Eye Height measurements. The Far End Eye Width and Far End Eye Height measurements are done with an emulated loss channel.

Eye symmetry mask width

This section verifies that the eye diagram of the DUT is passing the eye mask, according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR,

Input

Any compliant signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz and best CTLE filter.

Measurement procedure

Table 16-1

OIF-CEI-VSR, Table 16-4

Min Max

TP1a EW6 NA

TP4 EW6 NA

An eye mask of width as per the specification is drawn on the top of the eye diagram. All the three eyes have to open beyond the mask drawn which will make the test pass, otherwise the test will fail.

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400G-TXE compliance measurements

Signal-to-noise and distortion ratio

This section verifies that the signal-to-noise and distortion ratio (SNDR) of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

Min Max

TP0a 31 dB NA

Testpoint-T 31 dB NA

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

Signal-to-noise and distortion ratio is measured using the following formula:

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400G-TXE compliance measurements

Where,

is the linear fit pulse peak

max

σe - RMS error

σn – Standard deviation of noise

Level separation mismatch ratio

This section verifies that the level separation mismatch ratio of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

Testpoint-T 0.95 NA

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

The level separation mismatch ratio RLM is defined by the following equation:

RLM = min ( ( 3.ES1), (3.ES2), (2 - 3.ES1), (2-3.ES2))

Where,

ES1 = (V

ES2 = (V

= (V-1 + V+1) / 2

mid

+1/3

-1/3

- V

/ (V+1 - V

mid

/ (V-1 - V

mid

)

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400G-TXE compliance measurements

Linear fit pulse peak

V-1, V

-1/3

, V

, and V+1 are the mean signal levels for each symbol of -1, -1/3,

+1/3

+1/3, and +1 PAM4 symbols, respectively.

This section verifies that the linear fit pulse peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

Testpoint-T 0.8*Steady state

voltage

Testpoint-T 0.8*Steady state

voltage

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

The linear fit pulse peak is the peak value of linear fit pulse p(k).

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400G-TXE compliance measurements

Steady state voltage

This section verifies that the steady state voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

Testpoint-T 0.4 V 0.6 V

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

The steady state voltage vf is defined as the sum of the linear fit pulse p(k), divided by M, as shown in following equation:

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400G-TXE compliance measurements

Even odd jitter

This section verifies that the maximum value of the even odd jitter of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-MR, Table 17-3

OIF-CEI-LR, Table 21-3

TP0a NA 0.019 UI

Testpoint-T NA 0.019 UI

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

Even odd jitter is the measure of two repetitions of a QPRBS13-CEI test pattern. The deviation of the time of each transition from an ideal clock at the signaling rate is measured.

Even odd jitter is defined as the magnitude of the difference between the average deviation of all even-numbered transitions and the average deviation of all oddnumbered transitions. Determining if a transition is even or odd is based on the possible transitions (only actual transitions are measured and averaged).

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400G-TXE compliance measurements

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

This section verifies that the maximum value of the uncorrelated bounded high probability jitter (UBHPJ) and Uncorrelated unbounded gaussian jitter (UUGJ) is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points UBHPJ limits UUGJ limits

Min Max Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-MR, Table 17-3

OIF-CEI-LR, Table 21-3

TP0a NA 0.05 UI NA 0.01 UI

Testpoint-T NA 0.05 UI NA 0.01 UI

Input

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

UBHPJ and UUGJ are measured using a QPRBS13-CEI test pattern. This measurement requires at least 107 symbols.

This measurement finds all the zero crossings in the signal and then finds the average pulse width. The difference of the edge time is the jitter value. The jitter is filtered through a high pass filter. Find the CDF of the filtered jitter. The UBHPJ and UUGJ are calculated by the following equation:

Where,

J5 is the difference between the τHPF at the (1-0.5 × 10-5) and 0.5 × 10

-5

probabilities.

J6 as the difference between the τHPF at the (1-0.5 × 10-6) and 0.5 ×10

-6

probabilities.

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400G-TXE compliance measurements

56 TekExpress® 400G-TXE Printable Application Help

SCPI commands

About SCPI command

You can use Standard Commands for Programmable Instruments (SCPI) to communicate with the TekExpress application.

Socket configuration for SCPI commands

This section describes the steps for TCPIP socket configuration and TekVISA configuration to execute the SCPI commands.

TCPIP socket configuration

1. Click Start > Control Panel > System and Security > Windows Firewall >

Advanced settings

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SCPI commands

2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer > Inbound Rules

and click New Rule…

3. In New Inbound Rule Wizard menu a. Select Port and click Next

58 TekExpress® 400G-TXE Printable Application Help

b. Select TCP as rule apply and enter 5000 for Specific local ports and

click Next

SCPI commands

c. Select Allow the connection and click Next

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SCPI commands

d. Select Domain, Private, Public and click Next

e. Enter Name, Description (optional), and click Finish

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SCPI commands

4. Check whether the Rule name is displayed in Windows Firewall with Advanced Security menu > Inbound Rules

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SCPI commands

TekVISA configuration

1. Click Start > All Programs > TekVISA > OpenChoice Instrument

Manager

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SCPI commands

2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of the

TekExpress device in Hostname and type Port as 5000. Click configure the IP address with Port.

Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the TekExpress application system.

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SCPI commands

3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager >

Instruments

4. Double-click OpenChoice Takler Listener and enter the Command *IDN?

in command entry field and click Query. Check that the Operation is successful and Talker Listener Readout displays the Command / Data.

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SCPI commands

TEKEXP:*IDN?

This command queries the active TekExpress application name running on the oscilloscope.

Outputs

TEKEXP:*OPC?

Syntax

Inputs

Syntax

Inputs

TEKEXP:*IDN?\n

Returns active TekExpress application name running on the oscilloscope.

TIP. Click here for examples.

This command queries the execution status of the last executed command.

TEKEXP:*OPC?\n

Outputs

TekExpress® 400G-TXE Printable Application Help 65

0 - last command execution is not complete

1 - last command execution is complete

TIP. Click here for examples.

SCPI commands

TEKEXP:ACQUIRE_MODE

This command sets the acquire mode as live or pre-recorded.

Syntax

Inputs

Outputs

TEKEXP:ACQUIRE_MODE {LIVE | PRE-RECORDED}\n

{LIVE | PRE-RECORDED}

TIP. Click here for examples.

TEKEXP:ACQUIRE_MODE?

This command queries the acquire mode type.

Syntax

Inputs

TEKEXP:ACQUIRE_MODE?\n

Outputs

{LIVE | PRE-RECORDED}

TIP. Click here for examples.

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SCPI commands

TEKEXP:EXPORT

This command returns all the bytes of data to the specified file.

Syntax Outputs

TEKEXP:EXPORT REPORT\n Returns the report file in bytes

TEKEXP:EXPORT WFM,"<FileName>"\n Returns the specified waveform file in bytes

TEKEXP:EXPORT IMAGE,"<FileName>"\n Returns the specified image file in bytes

TEKEXP:INFO?

Inputs

FileName - Specifies the file name

TIP. Click here for examples.

This command queries the information about the file(s).

Syntax Outputs

TEKEXP:INFO? REPORT\n <ReportFileSize>,"<ReportFileName.mht>"

TEKEXP:INFO? WFM\n <WfmFile1Size>,"<WfmFileName1.wfm>";<Wfm

File2Size>,"<WfmFileName2.wfm>";...

TEKEXP:INFO? IMAGE\n <Image1FileSize>,"<Image1FileName>";<Image

2FileSize>,"<Image2FileName>" ;...

TIP. Click here for examples.

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SCPI commands

TEKEXP:INSTRUMENT

This command sets the value for the selected instrument type.

Syntax

Inputs

Outputs

TEKEXP:INSTRUMENT?

TEKEXP:INSTRUMENT "<InstrumentType>",<Value>"\n

InstrumentType

Value

TIP. Check Command parameters list for InstrumentType and Value parameters.

TIP. Click here for examples.

This command queries the instrument selected for the specified instrument type.

Syntax

Inputs

TEKEXP:INSTRUMENT? "<InstrumentType>"\n

InstrumentType

TIP. Check Command parameters list for InstrumentType parameters.

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SCPI commands

Outputs

TEKEXP:LASTERROR?

Syntax

Inputs

Outputs

Returns the instrument selected for the specified instrument type

TIP. Click here for examples.

This command queries the last error string occurred for the current TCP session. If there are no errors since startup, or since the last call to TEKEXP:LASTERROR?\n, this command returns an empty string.

TEKEXP:LASTERROR?\n

TEKEXP:LIST?

TIP. Click here for examples.

This command queries the list of available device, suite, test, version or instrument.

Syntax Outputs

TEKEXP:LIST? DEVICE\n Returns the list of available device(s) as comma

separated values.

TEKEXP:LIST? SUITE\n Returns the list of available suite(s) as comma

separated values.

TEKEXP:LIST? TEST\n Returns the list of available test(s) as comma

separated values.

TEKEXP:LIST? VERSION\n Returns the list of available version(s) as comma

separated values.

TEKEXP:LIST? INSTRUMENT,"<InstrumentType>"\n

Returns the list of available instruments' for the given Instrument type as comma separated values.

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SCPI commands

NOTE. This command returns the list of items within double quotes (""). Iterate the receive procedure until the list ends with double quotes otherwise the next query commands won’t work as expected.

TEKEXP:MODE

Inputs

Syntax

Inputs

Outputs

InstrumentType

TIP. Check Command parameters list for InstrumentType parameters.

TIP. Click here for examples.

This command sets the execution mode as compliance or user defined.

TEKEXP:MODE {COMPLIANCE | USER-DEFINED}\n

{COMPLIANCE | USER-DEFINED}

TIP. Click here for examples.

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SCPI commands

TEKEXP:MODE?

This command queries the execution mode type.

Syntax

Outputs

TEKEXP:POPUP

Syntax

Inputs

TEKEXP:MODE?\n

{COMPLIANCE | USER-DEFINED}

TIP. Click here for examples.

This command sets the response to the active popup shown in the application.

TEKEXP:POPUP “<PopupResponse>”\n

PopupResponse

Outputs

TIP. Click here for examples.

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SCPI commands

TEKEXP:POPUP?

This command queries the active popup information shown in the application.

Syntax

Inputs

Outputs

TEKEXP:REPORT

Syntax

Inputs

TEKEXP:POPUP?\n

Returns the active popup information in the application.

TIP. Click here for examples.

This command generates the report for the current session.

TEKEXP:REPORT GENERATE\n

GENERATE

Outputs

TIP. Click here for examples.

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SCPI commands

TEKEXP:REPORT?

This command queries the queried header field value in the report.

Syntax

Inputs

Outputs

TEKEXP:RESULT?

TEKEXP:REPORT? “<HeaderField>”\n

HeaderField - Specifies to return the measured value for the indicated test.

TIP. Check Report for HeaderField parameters.

Returns the queried header field value in the report

TIP. Click here for examples.

This command queries the result available in report summary/details table.

Syntax Outputs

TEKEXP:RESULT? "<TestName>"\n Return Pass/Fail status of the test.

TEKEXP:RESULT? "<TestName>","<ColumnName>"\n

TEKEXP:RESULT? "<TestName>","<ColumnName>",<RowNumber >\n

Returns all the row values of the specified column for the test.

Returns the column value for the specified row number

Row number starts from zero.

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SCPI commands

Inputs

TEKEXP:SELECT

Syntax

TestName - Specifies the name of the test for which to obtain the test result value.

ColumnName - Specifies the column name for the measurement

RowNumber - Specifies the row number of the measurement

TIP. Check Results panel for TestName, ColumnName, and RowNumber parameters.

TIP. Click here for examples.

This command selects the device, suite, version, or test.

TEKEXP:SELECT <string1>,<string2>,<string4>\n

TEKEXP:SELECT TEST,<string3>,<string4>\n

Inputs

<string1> = {DEVICE | SUITE | VERSION}

<string2> = {DeviceName | SuiteName | VersionName}

<string3> = {“<TestName>"| ALL| REQUIRED }

<string4> = {TRUE | FALSE}

TIP. Check Command parameters list for DeviceName, SuiteName, VersionName, and TestName parameters.

TIP. Click here for examples.

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SCPI commands

Outputs

TEKEXP:SELECT?

Syntax

Inputs

Outputs

This command queries the name of the selected device, suite, version, or test.

TEKEXP:SELECT? {DEVICE | SUITE | TEST | VERSION}\n

{DEVICE | SUITE | TEST | VERSION}

Returns the name of the selected device, suite, version, or test.

TIP. Click here for examples.

TEKEXP:SETUP

Inputs

This command sets the value of the current setup.

Syntax Outputs

TEKEXP:SETUP DEFAULT\n Restore to default Setup

TEKEXP:SETUP OPEN,"<SessionName>"\n Open the session

TEKEXP:SETUP SAVE\n Save the session

TEKEXP:SETUP SAVE,"<SessionName>"\n Save the session

SessionName - The name of the session

TIP. Click here for examples.

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SCPI commands

TEKEXP:STATE

This command sets the execution state of the application.

Syntax

Inputs

Outputs

TEKEXP:STATE?

TEKEXP:STATE {RUN | STOP | PAUSE | RESUME}\n

{RUN | STOP | PAUSE | RESUME}

TIP. Click here for examples.

This command queries the current setup state.

Syntax Outputs

TEKEXP:STATE? RUNNING | PAUSED | WAIT | ERROR | READY

| STOPPED

TEKEXP:STATE? SETUP SAVED | NOT_SAVED

TIP. Click here for examples.

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SCPI commands

TEKEXP:VALUE

This command sets the value of parameters of type General, Acquire, Analyze, or DUTID.

Syntax

Inputs

Outputs

TEKEXP:VALUE GENERAL,"<ParameterName>",“<Value>”\n

TEKEXP:VALUE ACQUIRE,“<TestName>","<AcquireType>", "<ParameterName>",“<Value>”\n

TEKEXP:VALUE ANALYZE,“<TestName>","<ParameterName>".“<Value>” \n

TEKEXP:VALUE DUTID,“<Value>”\n

ParameterName - Specifies the parameter name

TestName - Specifies the test name

AcquireType - Specifies the acquire type

Value - Specifes the value to set

TIP. Check Command parameters list for ParameterName, AcquireType, and Value parameters.

TIP. Click here for examples.

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SCPI commands

TEKEXP:VALUE?

This command queries the value of the parameter for type General, Acquire, Analyze, or DUTID.

Syntax Outputs

TEKEXP:VALUE? GENERAL,"<ParameterName>"\n

TEKEXP:VALUE? ACQUIRE,“<TestName>", "<AcquireType>","<ParameterName>"\n

TEKEXP:VALUE? ANALYZE, “<TestName>","<ParameterName>"\n

TEKEXP:VALUE? DUTID\n Returns the DUTID value

Returns the value of Parameter for type GENERAL

Returns the value of Parameter for type ACQUIRE

Returns the value of Parameter for type ANALYZE

Inputs

Outputs

ParameterName - Specifies the parameter name

TestName - Specifies the test name

AcquireType - Specifies the acquire type

TIP. Check Command parameters list for ParameterName and AcquireType parameters.

Returns the value of Parameter for type GENERAL | ACQUIRE | ANALYZE | DUTID.

TIP. Click here for examples.

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SCPI commands

Command parameters list

This section provides the parameters list for the SCPI commands.

TekExpress 400G-TXE

Parameters Description

command parameters

InstrumentType Specifies the instrument type.

Valid value is Real Time Scope.

Value Specifies the value parameters.

■

For InstrumentType, valid values are:

■

Do not use

■

GPIB8::1::INSTR

■

For DUTID, valid value is Comment.

DeviceName Specifies the device name. Valid values are:

■

OIF-PAM4 CEI-VSR

■

OIF-PAM4 CEI-MR

■

OIF-PAM4 CEI-LR

SuiteName Specifies the suite name.

Valid values are:

■

TP0a, TP1a, TP4 for OIF-PAM4 CEI-VSR

■

Testpoint-T for OIF-PAM4 CEI-MR and OIF-PAM4 CEI-LR

VersionName Specifies the version name. Valid values are

■

400G-TXE,Section-16.B.1.1,Table 16-10

■

400G-TXE,Section-16.3.2,Table 16-1

■

400G-TXE,Section-16.3.3,Table 16-4

■

400G-TXE,Section-17.3.1,Table 17-2

■

400G-TXE,Section-21.3,Table 21-2

TekExpress® 400G-TXE Printable Application Help 79

SCPI commands

Parameters Description

TestName for OIF-PAM4 CEIVSR

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Transition Time

■

Signal To Noise And Distortion Ratio

■

Uncorrelated Bounded High Probability Jitter

■

Uncorrelated Unbounded Gaussian Jitter

■

Even Odd Jitter

■

Eye Width

■

Eye Height

■

Eye Linearity

■

Eye Symmetry Mask Width

■

Near End Eye Width

TestName for OIF-PAM4 CEI-MR and OIF-PAM4 CEI-LR

■

Near End Eye Height

■

Near End Eye Linearity

■

Near End Eye Symmetry Mask Width

■

Far End Eye Width

■

Far End Eye Height

■

Far End Eye Symmetry Mask Width

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Single Ended Output Voltage

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Level Separation Mismatch Ratio

■

Signal To Noise And Distortion Ratio

■

Uncorrelated Bounded High Probability Jitter

■

Uncorrelated Unbounded Gaussian Jitter

■

Even Odd Jitter

■

Linear Fit Pulse Peak

■

Steady State Voltage

ParameterName and Value for General, Acquire and Analyze

Specifies the ParameterName and Value for General, Acquire and Analyze. The configuration parameters available are not same for measurements.

80 TekExpress® 400G-TXE Printable Application Help

SCPI commands

Table 15: ParameterName and Value for General

ParameterName Value

DUTID Comment User comment

MODE

■

COMPLIANCE

■

USER-DEFINED

Report Update Mode

■

New

■

Append

■

Replace

■

ReplaceAny

Replace Runsession Path Session file path.

Example: X:\400G-TXE\Session1\DUT001\20170421_121534

Auto increment report name if

"True" or "False"

duplicate

Include Pass/Fail Results

"True" or "False"

Summary

Include Detailed Results "True" or "False"

Include Plot Images "True" or "False"

Include Setup Configuration "True" or "False"

Include User Comments "True" or "False"

Report Path File path

Example: TEKEXP:VALUE GENERAL,"Report Path", "X:\400G-TXE\Reports\"

Save As Type

■

Web Archive (*.mht;*.mhtml)

■

PDF (*.pdf;)

■

CSV (*.csv;)

View Report After Generating "True" or "False"

Report Group Mode

■

Test Name

Test Result

Create report at the end "True" or "False"

Run Test More than Once "True" or "False"

Number of Runs 1 to 100

On Failure Stop and Notify "True" or "False"

Timer Warning Info Message

"True" or "False"

Popup

Timer Warning Info Message

1 to 300

Popup Duration

Timer Error Message Popup "True" or "False"

Timer Error Message Popup

1 to 300

Duration

TekExpress® 400G-TXE Printable Application Help 81

SCPI commands

ParameterName Value

Lane0 Connected to:Lane0+: Single Ended

Data Rate 18 to 29

Samples per Symbol (M) 32 to 200

Linear pulse length (Np) 5 to 100

Linear pulse delay (Dp) 1 to 99

NearEnd Mask Width 0.1 to 0.5

FarEnd Mask Width 0.1 to 0.5

Bandwidth

Valid values are:

■

CH1

■

CH2

■

CH3

■

CH4

■

"Full BW"

■

"50GHz"

Target BER (1e-) 5 to 6

Mask Width 0.1 to 0.5

CTLE FilterFile

■

ALL(1-9dB)

1 dB

1.5 dB

2 dB

2.5 dB

3 dB

3.5 dB

4 dB

4.5 dB

5 dB

5.5 dB

6 dB

6.5 dB

7 dB

■

7.5 dB

■

8 dB

■

Custom

■

BestCTLE

82 TekExpress® 400G-TXE Printable Application Help

SCPI commands

ParameterName Value

Near End CTLE FilterFile

■

ALL(1-9dB)

1 dB

1.5 dB

2 dB

Custom

BestCTLE

Far End CTLE FilterFile

■

ALL(1-9dB)

1 dB

1.5 dB

2 dB

2.5 dB

3 dB

3.5 dB

4 dB

4.5 dB

5 dB

5.5 dB

6 dB

6.5 dB

7 dB

7.5 dB

8 dB

■

Custom

■

BestCTLE

Apply Filter "True" or "False"

Data Positive De-Embedding filter

Data Negative De-Embedding filter

Filter file path Example: TEKEXP:VALUE GENERAL,"De-Embedding filter","C:\"

Crosstalk source "True" or "False"

Table 16: ParameterName and Value for Analyze

TestName ParameterName Value

Common mode noise Scope Noise 0 to 300

TekExpress® 400G-TXE Printable Application Help 83

SCPI commands

Examples

This section provides the examples for the SCPI commands.

Example Description

TEKEXP:*IDN?\n It returns the active TekExpress application name running on the

oscilloscope.

TEKEXP:*OPC?\n It returns the last command execution status.

TEKEXP:ACQUIRE_MODE PRE-RECORDED\n It sets the acquire mode as pre-recorded.

TEKEXP:ACQUIRE_MODE?\n It returns LIVE when acquire mode is set to live.

TEKEXP:EXPORT REPORT\n It returns the report file in bytes. This can be written into another file

for further analysis.

TEKEXP:EXPORT IMAGE,"ImageA.png"\n It returns the image file in bytes. This can be written into another file

for further analysis.

TEKEXP:EXPORT WFM,"WaveformA.wfm"\n It returns the waveform file in bytes. This can be written into another

file for further analysis.

TEKEXP:INFO? REPORT\n It returns “100,”ReportFileName.mht”", when 100 is the filesize in

bytes for the filename ReportFileName.

TEKEXP:INFO? WFM\n It returns “100,“WfmFileName1.wfm”";“200,“WfmFileName2.wfm”"

when 100 is the filesize in bytes for the filename WfmFileName1.wfm and 200 is the filesize in bytes for the filename WfmFileName2.wfm.

TEKEXP:INFO? IMAGE It returns the image file name.

TEKEXP:INSTRUMENT "Real Time Scope",DPO77002SX ( GPIB8::1::INSTR )\n

TEKEXP:INSTRUMENT? “Real Time Scope”\n It returns "IDPO77002SX ( GPIB8::1::INSTR ), when DPO77002SX

TEKEXP:LASTERROR?\n It returns ERROR: INSTRUMENT_NOT_FOUND, when no

TEKEXP:LIST? DEVICE\n It returns "TX-Device,RX-Device" when TX-Device, RX-Device are

TEKEXP:LIST? INSTRUMENT,"Real Time Scope"\n It returns "DPO77002SX ( GPIB8::1::INSTR ),MSO73304DX

TEKEXP:MODE COMPLIANCE\n It sets the execution mode as compliance.

TEKEXP:MODE?\n It returns COMPLIANCE when the execution mode is compliance.

TEKEXP:POPUP “OK”\n It sets OK as the response to active popup in the application.

TEKEXP:POPUP?\n It returns "OK", when OK is the active popup information shown in

TEKEXP:REPORT GENERATE\n It generates report for the current session.

TEKEXP:REPORT? “Scope Information”\n It returns "DPO73304SX" when DPO73304SX is the scope model.

TEKEXP:REPORT? “DUT ID”\n It returns "DUT001" when DNI_DUT001 is the DUT ID.

It sets the instrument value as DPO77002SX ( GPIB8::1::INSTR ) for the selected instrument type Real Time Scope.

( GPIB8::1::INSTR )" is the selected instrument for the instrument type Real Time Scope.

instrument is found.

the available device.

( TCPIP::134.64.248.91::INSTR )" when DPO72504D ( GPIB8::1::INSTR ), MSO73304DX ( TCPIP::

134.64.248.91::INSTR ) are the list of available instruments.

the application.

84 TekExpress® 400G-TXE Printable Application Help

SCPI commands

Example Description

TEKEXP:RESULT? "Period using SCOPE (Acquire-Analyze Combined)"\n

TEKEXP:RESULT? "Period using SCOPE (Acquire-Analyze Combined)","Margin",1\n

TEKEXP:SELECT DEVICE, TX_Device, TRUE\n It selects TX_Device

TEKEXP:SELECT? DEVICE\n It returns "TX-Device" when TX-Device is the selected device type.

TEKEXP:SETUP DEFAULT\n It restores the application to default setup.

TEKEXP:STATE STOP\n It stops the test execution.

TEKEXP:STATE?\n It returns as READY when the application is ready to run next

TEKEXP:STATE? SETUP\n It returns as NOT_SAVED when the current setup is not saved.

It returns Pass when the test result is Pass.

It returns "L:-50.000ps H:2000.000ps" when L:-50.000ps H:

2000.000ps is the value.

measurement.

TekExpress® 400G-TXE Printable Application Help 85

SCPI commands

86 TekExpress® 400G-TXE Printable Application Help

References

Parameters

About application

parameters

Setup panel configuration

parameters

This section describes the 400G-TXE application parameters, and includes the default menu settings.

The parameters for the menus, and options list the selections available for each and include the default values.

DUT tab parameters.

Parameters Selection Default Setting

DUTID - DUT001

Mode Compliance, User

defined

Standard OIF-PAM4 OIF-PAM4

Specification CEI-VSR, CEI-MR,

CEI-LR

Test Points for CEI-VSR TP0a, TP1a, TP4 TP0a

for CEI-MR and CEI-LR Testpoint-T Testpoint-T

Device Profile

Data Rate 25 GBd to 28.05 GBd 26.5625 GBd

Crosstalk source Select, De-select De-select

Compliance

CEI-VSR

TekExpress® 400G-TXE Printable Application Help 87

References

Test Selection tab parameters.

Parameters Selection Default Setting

CEI-VSR at TP0a

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Transition Time

■

Signal to Noise And Distortion Ratio

■

Even Odd Jitter

■

Uncorrelated Bounded High Probability Jitter

■

Uncorrelated Unbounded Gaussian Jitter

All measurements selected

CEI-VSR at TP1a

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Transition Time

■

Eye Width

■

Eye Height

■

Eye Linearity

■

Eye Symmetry Mask Width

All measurements selected

88 TekExpress® 400G-TXE Printable Application Help

References

Parameters Selection Default Setting

CEI-VSR at TP4

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Transition Time

■

Near End Eye Width

■

Near End Eye Height

■

Near End Eye Linearity

■

Near End Eye Symmetry Mask Width

■

Far End Eye Width

■

Far End Eye Height

■

Far End Eye Symmetry Mask Width

All measurements selected

CEI-MR and CEI-LR

■

DC Common Mode Output Voltage

■

Common Mode Noise

■

Single Ended Output Voltage

■

Diff Peak to Peak Output Voltage Tx Enabled

■

Signal to Noise And Distortion Ratio

■

Level Separation Mismatch Ratio

■

Linear Fit Pulse Peak

■

Steady State Voltage

■

Even Odd Jitter

■

Uncorrelated Bounded High Probability Jitter

■

Uncorrelated Unbounded Gaussian Jitter

All measurements selected

TekExpress® 400G-TXE Printable Application Help 89

References

Configuration tab parameters.

Table 17: Global settings parameters

Parameters Selection Default Setting

General Configuration

De-embedding Filter Select, De-select De-select

Data+ File path None

Data- File path None

Bandwidth Full BW, 50 GHz Full BW

Tx Output Waveform

Samples per Symbol (M) 32 to 200 32

Linear Pulse Length (Np) 5 to 100 14

Linear Pulse Delay (Dp) 1 to 99 2

Eye Configuration for test point TP1a

CTLE Filter File All(1-8dB) All(1-8dB)

Target BER (1e-) 5 to 6 6

Mask Width 0.1 UI to 0.5 UI 0.22 UI

Eye Configuration for test point TP4

Near End CTLE Filter File All(1-2dB), 1 dB,

1.5 dB, 2 dB, Custom

Far End CTLE Filter File All(1-8dB)

Target BER (1e-) 5 to 6 6

Mask Width Near End 0.1 UI to 0.5 UI 0.4 UI

Far End 0.1 UI to 0.5 UI 0.22 UI

All(1-2dB)

Table 18: Measurement parameters

Parameters Selection Default Setting

Common Mode Noise Analyze 0 μV to 300 μV 0 μV

Table 18: Measurement parameters

Parameters Selection Default Setting

Common Mode Noise Analyze 0 μV to 300 μV 0 μV

90 TekExpress® 400G-TXE Printable Application Help

Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes Online Help

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

Getting help and support

Conventions

Related documentation

Technical support

Getting started

Minimum system requirements

Instruments and accessories required

Downloading and installing the software

View software version

Application directories

File name extensions

Operating basics

Launch the application

Application panels overview

Global application controls

Application controls

Options menu overview

Configure email settings

Setup panel

Setup panel overview

Set DUT parameters

Select tests

See also:. Set acquisition tab parameters

Status panel

Status panel overview

Results panel

Results panel overview

View test-related files

Reports panel

Reports panel overview

Select report options

View a report

Report contents

Running tests

Equipment connection setup

Prerequisite

Deskew

Running tests

400G-TXE compliance measurements

DC common mode output voltage

Common mode noise

Single-ended output voltage

Diff peak to peak output voltage Tx enabled

Transition time

Eye width, eye height, and eye linearity

Eye symmetry mask width

Signal-to-noise and distortion ratio

Level separation mismatch ratio

Linear fit pulse peak

Steady state voltage

Even odd jitter

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

SCPI commands

About SCPI command

Socket configuration for SCPI commands

TEKEXP:*IDN?

TEKEXP:*OPC?

TEKEXP:ACQUIRE_MODE

TEKEXP:ACQUIRE_MODE?

TEKEXP:EXPORT

TEKEXP:INFO?

TEKEXP:INSTRUMENT

TEKEXP:INSTRUMENT?

TEKEXP:LASTERROR?

TEKEXP:LIST?

TEKEXP:MODE

TEKEXP:MODE?

TEKEXP:POPUP

TEKEXP:POPUP?

TEKEXP:REPORT

TEKEXP:REPORT?

TEKEXP:RESULT?

TEKEXP:SELECT

TEKEXP:SELECT?