Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes User manual

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TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes

Printable Application Help

*P077136602*

077-1366-02

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes

Printable Application Help

www.tek.com

077-1366-02

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14150 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

■

In North America, call 1-800-833-9200.

■

Worldwide, visit www.tek.com to find contacts in your area.

Welcome .............................................................................................................................................. v

Getting help and support

Conventions .................................................................................................................................... 1

Related documentation ................................................................................................................... 2

Technical support ........................................................................................................................... 3

Getting started

Minimum system requirements ...................................................................................................... 5

Instruments and accessories required ............................................................................................. 6

Downloading and installing the software ....................................................................................... 7

View software version .................................................................................................................... 7

Application directories ................................................................................................................... 8

File name extensions ...................................................................................................................... 9

Operating basics

Launch the application .................................................................................................................. 11

Application panels overview ........................................................................................................ 12

Global application controls ........................................................................................................... 14

Application controls ................................................................................................................ 14

Options menu overview ........................................................................................................... 16

TekExpress instrument control settings .................................................................................. 17

View connected instruments ................................................................................................... 18

Configure email settings .......................................................................................................... 19

Setup panel ................................................................................................................................... 20

Setup panel overview .............................................................................................................. 20

Set DUT parameters ................................................................................................................ 21

Select tests ............................................................................................................................... 22

Set acquisition tab parameters ................................................................................................. 24

Set configuration tab parameters ............................................................................................. 25

Set preferences tab parameters ................................................................................................ 28

Status panel ................................................................................................................................... 29

Status panel overview .............................................................................................................. 29

Results panel ................................................................................................................................. 30

Results panel overview ............................................................................................................ 30

TekExpress® 400G-TXE Printable Application Help i

Table of Contents

View test-related files .............................................................................................................. 31

Reports panel ................................................................................................................................ 32

Reports panel overview ........................................................................................................... 32

Select report options ................................................................................................................ 32

View a report ........................................................................................................................... 35

Report contents ........................................................................................................................ 35

Running tests

Equipment connection setup ......................................................................................................... 37

Prerequisite ................................................................................................................................... 40

Compensate the signal path ..................................................................................................... 40

Deskew .................................................................................................................................... 40

Running tests ................................................................................................................................ 42

400G-TXE compliance measurements

DC common mode output voltage ................................................................................................ 43

AC Common Mode Output Voltage ............................................................................................. 44

Single-ended output voltage ......................................................................................................... 45

Diff peak to peak output voltage Tx enabled ............................................................................... 46

Diff peak to peak output voltage Tx disabled ............................................................................... 47

Transition time .............................................................................................................................. 48

Eye width, eye height, eye linearity, and eye symmetry mask width ........................................... 49

Signal-to-noise and distortion ratio .............................................................................................. 52

Pre-cursor and post-cursor equalization ratio ............................................................................... 54

Coefficient range (OIF) ................................................................................................................ 56

Coefficient range (IEEE) .............................................................................................................. 57

Far end pre-cursor ISI ratio .......................................................................................................... 58

Transmitter output residual ISI ..................................................................................................... 59

Normalized coefficients step size ................................................................................................. 60

Coefficient initialization ............................................................................................................... 62

Signaling rate ................................................................................................................................ 63

Level separation mismatch ratio ................................................................................................... 64

Linear fit pulse peak ..................................................................................................................... 65

Steady state voltage ...................................................................................................................... 66

Even odd jitter .............................................................................................................................. 67

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter ........... 68

Uncorrelated jitter RMS and uncorrelated J4 jitter ...................................................................... 69

ii TekExpress® 400G-TXE Printable Application Help

SCPI commands

About SCPI command .................................................................................................................. 71

Socket configuration for SCPI commands ................................................................................... 71

TEKEXP:*IDN? ........................................................................................................................... 79

TEKEXP:*OPC? .......................................................................................................................... 79

TEKEXP:ACQUIRE_MODE ...................................................................................................... 80

TEKEXP:ACQUIRE_MODE? .................................................................................................... 80

TEKEXP:EXPORT ...................................................................................................................... 81

TEKEXP:INFO? ........................................................................................................................... 81

TEKEXP:INSTRUMENT ............................................................................................................ 82

TEKEXP:INSTRUMENT? .......................................................................................................... 82

TEKEXP:LASTERROR? ............................................................................................................. 83

TEKEXP:LIST? ............................................................................................................................ 83

TEKEXP:MODE .......................................................................................................................... 84

TEKEXP:MODE? ........................................................................................................................ 85

TEKEXP:POPUP ......................................................................................................................... 85

TEKEXP:POPUP? ........................................................................................................................ 86

TEKEXP:REPORT ...................................................................................................................... 86

TEKEXP:REPORT? ..................................................................................................................... 87

TEKEXP:RESULT? ..................................................................................................................... 87

TEKEXP:SELECT ....................................................................................................................... 88

TEKEXP:SELECT? ..................................................................................................................... 89

TEKEXP:SETUP .......................................................................................................................... 89

TEKEXP:STATE ......................................................................................................................... 90

TEKEXP:STATE? ........................................................................................................................ 90

TEKEXP:VALUE ........................................................................................................................ 91

TEKEXP:VALUE? ...................................................................................................................... 92

Command parameters list ............................................................................................................. 93

Examples ................................................................................................................................... 104

Table of Contents

References

Parameters .................................................................................................................................. 107

About application parameters ................................................................................................ 107

Setup panel configuration parameters ................................................................................... 107

Reports panel parameters ...................................................................................................... 117

TekExpress® 400G-TXE Printable Application Help iii

Table of Contents

iv TekExpress® 400G-TXE Printable Application Help

Welcome

Welcome to Tektronix Real Time Oscilloscope based 400G-TXE electrical compliance test solution. The 400G-TXE is a TekExpress compliance software which evaluates the electrical PAM4 signals to the specification-mandated limits.

The 400G-TXE Real-Time electrical compliance test solution provides turnkey testing and debug of the TX electrical properties, key to OIF (CEI-VSR/CEI-MR/ CEI-LR) and IEEE (AUI4/CR4/KR4) PAM4 standards. It tests the OIF-PAM4 and IEEE-PAM4 specification levels in a simple, cost effective manner. It aligns the best in class Real Time Oscilloscope performance with strong market demand for 400G based electrical PAM4 analysis tools.

The 400G-TXE solution offers comprehensive test automation, results margining, data logging, and results reporting in an advanced testing framework.

TekExpress® 400G-TXE Printable Application Help v

Welcome

Key features of TekExpress 400G-TXE include:

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TekExpress 400G-TXE specifically targets the following sections:

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OIF-CEI-56G-VSR at TP0a: oif2017.449.03, Sections 16.B, Table 16-10

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OIF-CEI-56G-VSR at TP1a: oif2017.449.03, Sections 16.3.2, Table 16-1

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OIF-CEI-56G-VSR at TP4: oif2017.449.03, Sections 16.3.3, Table 16-4

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OIF-CEI-56G-MR at Test point T: oif2014.245.12, section 17.3, Table 17-2, 17-3

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OIF-CEI-56G-LR at Test point T: oif2014.340.08, section 21.3, Table 21-2, 21-3

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OIF-CEI-112G-VSR at TP0a: oif2017.346.04, Table 23-9, Section 23.B.

1.1

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OIF-CEI-112G-VSR at TP1a: oif2017.346.04, Table 23-1, Section

23.3.2

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OIF-CEI-112G-VSR at TP4: oif2017.346.04, Table 23-4, Section 23.3

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AUI-4/8 at TP0a: IEEE 802.3bs, Draft 3.5, Annex 120D.3.1, Table 120D-1

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AUI-4/8 at TP1a: IEEE 802.3bs, Draft 3.5, Annex 120E.3.1, Table 120E-1

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AUI-4/8 at TP4: IEEE 802.3bs, Draft 3.5, Annex 120E.3.2, Table 120E-3

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50GBASE-CR/100GBASE-CR2/200GBASE-CR4: IEEE802.3cd Draft

3.0 Section 136.9.3, Table 136-11

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50GBASE-KR/100GBASE-KR2/200GBASE-KR4: IEEE802.3cd Draft

3.0 Section 137.9.2

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Streamlined and fully automated transmitter characterization of OIF (CEIVSR/CEI-MR/CEI-LR) and IEEE (AUI4/CR4/KR4) PAM4 electrical transmitter specifications (chip-to-chip and chip-to-module)

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In-depth analysis and debug capabilities of electrical PAM4 signals in combination with the PAM4 software package

vi TekExpress® 400G-TXE Printable Application Help

Getting help and support

Conventions

Help uses the following conventions:

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The term "Application" and "Software" refers to the TekExpress 400G-TXE Solution application.

■

The term “DUT” is an abbreviation for Device Under Test.

■

The term “select” is a generic term that applies to the different methods of choosing a screen item (button, control, list item): using a mouse or using the touch screen.

Table 1: Icon descriptions

Icon Meaning

This icon identifies important information.

This icon identifies conditions or practices that could result in loss of data.

This icon identifies additional information that will help you use the application more efficiently.

TekExpress® 400G-TXE Printable Application Help 1

Getting help and support

Technical support

Tektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on your application or oscilloscope. Contact Tektronix through mail, telephone, or the website. See

Contacting Tektronix for more information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

■

General information

All instrument model numbers

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Hardware options, if any

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Probes used

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Your name, company, mailing address, phone number, FAX number

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Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application specific

information

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Software version number

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Description of the problem such that technical support can duplicate the problem

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If possible, save the setup files for all the instruments used and the application

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If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file

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If possible, save the waveform on which you are performing the measurement as a .wfm file

TekExpress® 400G-TXE Printable Application Help 3

Getting help and support

4 TekExpress® 400G-TXE Printable Application Help

Getting started

Minimum system requirements

The following table shows the minimum system requirements to install and run the TekExpress 400G-TXE solution.

Table 3: System requirements

Component Description

Oscilloscope

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Tektronix DPO70K, DX / SX series oscilloscope

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Firmware Version: 10.8 or above

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Opt. DJA, DJAN, PAM4, and SDLA64

Software

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PAM4 analysis 10.5.0.8 installed

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IronPython 2.7.3 installed

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PyVisa 1.0.0.25 installed

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Microsoft .NET 4.0 Framework

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Microsoft Internet Explorer 7.0 SP1 or greater, or other Web browser for viewing reports

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Adobe Reader software 7.0 or greater for viewing portable document format (PDF) files

TekExpress® 400G-TXE Printable Application Help 5

Getting started

Instruments and accessories required

TekExpress 400G-TXE application is launched on DPO70K series oscilloscope. The following table lists the instruments and accessories required for this application.

Table 4: Instruments and accessories required for 400G-TXE application

Instrument/Accessory Model number Quantity

Oscilloscope DPO73304DX, MSO73304DX,

DPO73304SX, DPS73308SX, DPO75002SX, DPS75004SX, DPO77002SX, DPS77004SX, DPO75902SX, DPS75904SX

Cables Compatible SMA cables with

bandwidth greater than 40 GHz for connecting single ended sources ATI channel.

Fixtures

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Wilder Host compliance board CEI-VSR/AUI-4 at TP1a (HCB-P) (Wilder part number: 640-0822-000)

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Wilder Module compliance board CEI-VSR/AUI-4 at TP4 (MCB) (Wilder part number: 640-0823-000)

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Any compatible text fixture for CEI-VSR/AUI-4 at TP0a, CEI-MR, CEI-LR, CR and KR

DC Blocks Compatible DC block with

bandwidth range 50 KHz to 65 GHz

Attenuator 3, 6, or 10 dB attenuators 2

6 TekExpress® 400G-TXE Printable Application Help

Downloading and installing the software

Complete the following steps to download and install the latest 400G-TXE application. See Minimum system requirements for compatibility.

1. Go to www.tek.com.

2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as

Software and enter 400G-TXE in the MODEL OR KEYWORD field and click SEARCH.

3. Select the latest version of software and follow the instructions to download. Copy the executable file to the oscilloscope.

Getting started

View software version

4. Double-click the executable and follow the on-screen instructions. The software is installed at C:\Program Files\Tektronix\TekExpress\400G-TXE\.

5. Select Analyze > TekExpress 400G-TXE from the TekScope menu to

Launch the application.

Use the following instructions to view version information for the application and for the application modules such as the Programmatic Interface and the Programmatic Interface Client.

To view version information for 400G-TXE, click button in the TekExpress application and select About TekExpress.

NOTE. This example shows a typical Version Details dialog box, and may not reflect the actual values as shown when you open this item in the application.

TekExpress® 400G-TXE Printable Application Help 7

Getting started

Application directories

The TekExpress 400G-TXE application files are installed at the following location:

C:\Program Files\Tektronix\TekExpress\TekExpress 400G-TXE

The following table lists the application directory names and their purpose.

Table 5: Application directories and usage

Directory names Usage

Bin Contains TekExpress 400G-TXE application libraries

Compliance Suites Contains compliance-specific files

Examples Contains various support files

ICP Contains instrument and TekExpress 400G-TXE application-

specific interface libraries

Images Contains images of the TekExpress 400G-TXE application

Lib Contains utility files specific to the TekExpress 400G-TXE

application

Report Generator Contains style sheets for report generation

Tools Contains instrument and TekExpress 400G-TXE application-

specific files

8 TekExpress® 400G-TXE Printable Application Help

Getting started

File name extensions

View test-related files

File name extensions

The TekExpress 400G-TXE application uses the following file name extensions:

File name extension Description

.TekX Application session files (the extensions may not be displayed)

.py Python sequence file

.xml Test-specific configuration information (encrypted) files

Application log files

.csv Test result reports

Plot data

.mht Test result reports (default)

Test reports can also be saved in HTML format

.pdf Test result reports

Application help document

.xslt Style sheet used to generate reports

Operating basics

Launch the application

To launch the TekExpress 400G-TXE solution, select Analyze > TekExpress 400G-TXE from the TekScope menu.

When you launch the application for the first time, the file C:\Users\<username> \Documents\My TekExpress\400G-TXE\Resources.xml is mapped to drive X:. This file contains information about available network-connected instruments. The session files are stored in X:\400G-TXE\. If this file is not found, then the application runs Instrument Discovery Program to detect the network-connected instruments before launching 400G-TXE solution.

If the application is behind the oscilloscope application, click Analyze > TekExpress 400G-TXE to bring it to the front. To keep the 400G-TXE application window on top, select Keep On Top from the 400G-TXE Options

menu.

TekExpress® 400G-TXE Printable Application Help 11

Operating basics

Application panels overview

TekExpress 400G-TXE solution uses panels to group Configuration, Results, and Reports settings. Click any button to open the associated panel. A panel may have one or more tabs that list the selections available in that panel. Controls in a tab can change depending on settings made in the same tab or another tab.

12 TekExpress® 400G-TXE Printable Application Help

Operating basics

Table 6: Application panels overview

Panel Name Purpose

Setup panel To select the test setup controls which are grouped in tabs. The controls

in a tab can change depending on settings made in the same tab or another tab. Click the Setup button to open this panel. Use this panel to:

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Set the DUT parameters

■

Select the tests

■

Set the acquisition parameters

■

Set the configuration parameters

■

Set the preferences parameters

Status panel This panel displays the acquisition status and analysis status for the

selected tests in Test Status and logs in Log View.

Results panel This tab displays the summary of test results and select result viewing

preferences.

Reports panel Browse for reports, save reports as specific file types, specify report

naming conventions, replace current test results in the report with the test result(s) of previous run in current session, select report content to include (summary information, detailed information, user comments, setup configuration, application configuration), and select report viewing options.

Global application controls

Application controls

Table 7: Application controls descriptions

Item Description

Options menu

Panel buttons

Start/Stop button

Menu to display global application controls

Controls that open panels for configuring test settings and options.

Use the Start button to start the test run of the measurements in the selected order. If prior acquired measurements have not been cleared, the new measurements are added to the existing set. The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.

Pause \ Continue button

Use the Pause button to temporarily interrupt the current acquisition. When a test is paused, the button name changes to “Continue.”

14 TekExpress® 400G-TXE Printable Application Help

Operating basics

Item Description

Clear button

Minimize button

Close button

Application window move Place the cursor over the application window and drag it to the

Mini view / Normal view

Use the Clear button to clear all existing measurement results. Adding or deleting a measurement, or changing a configuration parameter of an existing measurement also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on the Results panel.

Minimizes the application.

Exits the application.

desired location.

Toggles the application between mini view and normal view. Mini view displays the run messages with the time stamp, progress bar, Start / Stop button, and Pause / Continue button. The application moves to mini view when you click the Start button.

TekExpress® 400G-TXE Printable Application Help 15

Operating basics

Options menu overview

To access Options menu, click in the upper-right corner of the application. It has the following:

Options menu

Menu Function

Default Test Setup Opens an untitled test setup with defaults selected

Acquire Live Waveforms

Mode: Compliance Standard: OIF-PAM4 Specification: CEI-VSR Test Point: TP0a Specification: OIF-CEI-VSR, Section 16.B.1.1 DUT Type: 56G Symbol rate: 28.1 GBd

Open Test Setup Opens a saved test setup

Save Test Setup Saves the current test setup

Save Test Setup As Saves the current test setup with a different file name or file type

Open Recent Displays the recently opened test setups to open

Instrument Control Settings

Keep On Top Keeps the TekExpress 400G-TXE application on top of all the application

Email Settings Use to configure email options for test run and results notifications

Deskew Use to set deskew parameter and read the deskew/attenuation values of

Detects, lists, and refreshes the connected instruments found on specified connections (LAN, GPIB, USB, and so on)

the instrument.

16 TekExpress® 400G-TXE Printable Application Help

Menu Function

Help Displays the TekExpress 400G-TXE help

About TekExpress

■

Displays application details such as software name, version number, and copyright

■

Provides a link to the end-user license agreement

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Provides a link to the Tektronix Web site

Operating basics

Configure email settings

To be notified by email when a test completes, fails, or produces an error, configure the email settings.

1. Click Options > Email Settings to open the Email Settings dialog box.

2. (Required) For Recipient email Address(es), enter one or more email

addresses to which to send the test notification. To include multiple addresses, separate the addresses with commas.

3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name followed by an underscore followed by the instrument serial number, then the @ symbol and the email server used. For example: DPO72016C_B130099@yourcompany.com.

4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location, and the SMTP Port number, in the corresponding fields.

Enter a valid login name and password in the corresponding fields. Select Enable SSL, if the server requires SSL/TLS technology.

NOTE. If any of the above required fields are left blank, the settings will not be saved and email notifications will not be sent.

5. In the Email Attachments section, select from the following options:

■

Reports: Select to receive the test report with the notification email.

■

Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

6. In the Email Configuration section:

■

Select the message file format to send: HTML (the default) or plain text.

■

Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 5 MB.

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Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

8. To test your email settings, click Test Email.

9. To apply your settings, click Apply.

10. Click Close when finished.

TekExpress® 400G-TXE Printable Application Help 19

Operating basics

Setup panel

Email settings

Setup panel overview

The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.

20 TekExpress® 400G-TXE Printable Application Help

Operating basics

Set DUT parameters

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also affect the list of available tests in the Test Selection tab.

Click Setup > DUT to access the DUT parameters:

Table 8: DUT tab settings

Setting Description

DUT ID Adds an optional text label for the DUT to reports. The default

value is DUT001. The maximum number of characters is 32. You cannot use the following characters in an ID name: (.,..,..., \,/:?”<>|*)

Opens Comments dialog box to enter text to add to the report.

Comments icon (to the

right of the DUT ID field)

Acquire live waveforms Acquire active signals from the DUT for measurement and

Use pre-recorded waveform files

Mode

Maximum size is 256 characters. To enable or disable comments appearing on the test report, see Select report options.

analysis.

Run tests on a saved waveform. Select Options > Open Test Setup to recall a saved test setup.

■

Compliance

■

User Defined

TekExpress® 400G-TXE Printable Application Help 21

Operating basics

Setting Description

Standard

Specification For OIF-PAM4 standard

Test Points Select the test points from the drop-down list. The options

Specification Version Displays the specification version for the selected Specification

Device Profile

DUT Type Select the DUT type

Symbol Rate Set the symbol rate to be tested.

Crosstalk Source Select crosstalk source when a cross talk generator is

■

OIF-PAM4

■

IEEE-PAM4

■

CEI-VSR

■

CEI-MR

■

CEI-LR

For IEEE-PAM4 standard

■

AUI4

■

CR4

■

KR4

available depends on the Specification selected. For CEI-VSR and AUI4, the test points are TP0a, TP1a, TP4. For CEI-MR and CEI-LR, the test point is Testpoint-T. For CR4, the test point is Testpoint-TP2. For KR4, the test point is Testpoint-TP0a.

and Test Points.

connected. This is applicable for eye measurements only.

Select tests

Use the Test Selection tab to select the tests. The test measurements available depend on the standards selected in the DUT tab.

22 TekExpress® 400G-TXE Printable Application Help

Operating basics

Table 9: Test Selection tab settings

Setting Description

Tests Select or clear a test. Highlight a test to show details in the Test

Description pane.

Test Description Shows brief description of the highlighted test in the Test field.

Deselect All Click to clear all tests.

Select All Click to select all tests. All tests are selected by default.

Schematic Click to display the schematic diagram of the DUT test setup for

the selected test. Use the diagram to verify the test setup before running the test.

See also:. Set acquisition tab parameters

TekExpress® 400G-TXE Printable Application Help 23

Operating basics

Set acquisition tab

parameters

Use the Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type and tests selected.

NOTE. 400G-TXE application acquires all waveforms needed by each test before performing the analysis.

Table 10: Acquisitions tab settings

Setting Description

Connection Setup

Data +ve

Data -ve

Select the source channel for data positive.

Select the source channel for data negative.

TekExpress 400G-TXE saves all acquisition waveforms to files by default. The waveforms are saved in a unique folder for each session (a session is started when you click the Start button). The folder path is X:\400G-TXE\Untitled Session\<dutid>\<date>_<time>. The images created for each analysis, CSV files with result values, reports, and other information specific to that particular execution are also saved in this folder.

The data sources must be either ATI or non-ATI channels.

24 TekExpress® 400G-TXE Printable Application Help

Operating basics

Saving a session moves the session file contents from the Untitled Session folder to the specified folder name, and changes the session name to the specified name.

Set configuration tab

parameters

Use Configuration tab to configure the Global Settings and test measurement configurations. The Global Settings and the measurements with configurations available in this tab depend on the Standards selected in the DUT tab.

Table 11: Configuration tab settings

Setting Description

Compliance Mode Select compliance mode. By default, Compliance Mode is selected.

User Defined Mode Select user defined mode

TekExpress® 400G-TXE Printable Application Help 25

Operating basics

Setting Description

Limits Editor Shows the upper and lower limits for the applicable measurement using different types of comparisons.

Limit names for CEI-VSR 56G and 112G are appended with "_56G" and "_112G" respectively. In Compliance Mode, use the Limits Editor to view the measurement high and low limits used for selected tests. In User Defined Mode, use the Limits Editor to edit the limit settings.

To edit a value, click that field and either select from the displayed list or enter a new value. Use the bottom scroll bar to view all available fields.

Global Settings

Instruments Detected Displays the instruments connected to this application. Click the instrument name to open a list of

available (detected) instruments. Select Options > Instrument Control Settings and click Refresh to update the instrument list.

NOTE. Verify that the GPIB search criteria (default) is selected in the Instrument Control Settings.

General Configuration

De-embedding Filter Select to apply the de-embedding filter file for Data Positive and Data Negative.

Phase Inverted Filter for Data(using SDLA with dual input mode)

Data+ Click Browse and select the de-embedding filter file (.flt) for data positive signal.

Data- Click Browse and select the de-embedding filter file (.flt) for data negative signal.

Bandwidth Select the bandwidth limit for the oscilloscope.

Tx Output Waveform

Samples per Symbol (M) Select the number of samples per symbol for calculating the Tx out waveform parameters.

Linear Pulse Length (Np) Select the linear fit pulse curve length in Unit intervals (UI).

Linear Pulse Delay (Dp) Select the delay of the linear fit pulse.

Eye Configuration

Select this option if the filter is created from SDLA using Dual input option. The negative channel filter must be phase inverted when you select this option.

If the acquired signal has less samples than specified, re-sampling is done to achieve the required samples per symbol. By default it is 32.

It is recommended to use higher value for better accuracy. The analysis time is more when you select higher value.

26 TekExpress® 400G-TXE Printable Application Help

Operating basics

Setting Description

CTLE Filter File Select the CTLE Filter File.

Compliance mode

■

All: Application will run through the CTLE filters.

■

For TP1a: CTLE filters from 1 dB - 9dB in steps of 0.5 dB

■

For TP4: For Near End, 1 dB, 1.5 dB, and 2 dB CTLE filters and for Far End, CTLE filters from 1 dB - 9 dB in steps of 0.5 dB

■

Best CTLE: After the first run, if the eye measurements are passed, best CTLE filter option gets enabled. User can run the measurement with the Best CLTE instead of looping through all CTLE filters in the specification.

NOTE. For 112G, CTLE filters from 1 dB - 13 dB in steps of 1 dB

User Defined mode

■

User can run the measurement with any specified CTLE filter. The application provides CTLE filters from 1 dB - 9 dB.

Select the CTLE filters from the drop-down list or Custom to browse and select the custom CTLE filter files. Custom CTLE filters (CSV) must contain the following data, delimited by comma:

CTLE peaking (dB): 1 to 9

Gain: 0.05 to 2

Poles and Zeros: 0.5 to 80

Example:

//dB,gain,pole1,pole2,pole3,zero1,zero2 1,0.8913,18.6,14.1,1.2,8.359,1.2

Target BER (1e-) Select the Target BER (1e-). As per the compliance, Target BER should be set to 1e-5 and 1e-6 for

IEEE and OIF standards respectively. If the Target BER is set to higher values, more time is required to analyse the data. You can select BER of 1e-5 for quicker analysis.

Mask Width Select the mask width in Unit intervals (UI). This configuration is for Eye symmetry mask width

measurement only.

Measurements

AC Common Mode Voltage Analyze Scope Noise Enter the scope noise in μV.

Scope noise is the noise value that is removed from the measured AC common mode voltage.

TekExpress® 400G-TXE Printable Application Help 27

Operating basics

Set preferences tab

parameters

Use the Preferences tab to set the application action on completion of a measurement.

Table 12: Preferences tab settings

Setting Description

Number of Runs

Acquire/Analyze each test <n> times (not applicable to Custom Tests)

Deskew

Show alert when new deskew values are configured on TekScope

Popup Settings

Auto close Warnings and Informations during Sequencing Auto close after <n> Seconds

Auto close Error Messages during Sequencing. Show in Reports Auto close after <n> Seconds

Select to repeat the test run by setting the number of times. By default, it is selected with 1 run.

Select to get notification when the deskew values are modified in TekScope.

Select to auto close warnings/informations during sequencing. Set the Auto close time. By default it is not selected.

Select to auto close Error Messages during Sequencing. Set the Auto close time. By default it is not selected.

28 TekExpress® 400G-TXE Printable Application Help

Status panel

Operating basics

Status panel overview

The Status panel accesses the Test Status and Log View tabs, which provide status on test acquisition and analysis (Test Status tab) and a listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start a test run. You can select the Test Status or the Log View tab to view these items while the tests are running.

Test status view

Log view

TekExpress® 400G-TXE Printable Application Help 29

Operating basics

Results panel

Table 13: Status panel Log View controls

Control Description

Message History Lists all executed test operations and timestamp

information.

Auto Scroll Enables automatic scrolling of the log view as

information is added to the log during the test.

Clear Log Clears all messages from the log view.

Save Saves the log file to a text file. Use the standard

Save File window to navigate to and specify the folder and file name to which to save the log text.

Results panel overview

When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.

30 TekExpress® 400G-TXE Printable Application Help

Operating basics

View test-related files

Files related to tests are stored in C:\Users\<username>\Documents\My TekExpress\400G-TXE\. Each test setup in this folder has a test setup file and a test setup folder, both with the test setup name.

The test setup file is preceded by the TekExpress icon and usually has no visible file name extension.

Inside the test setup folder is another folder named for the DUT ID used in the test sessions. The default is DUT001.

Inside the DUT001 folder are the session folders and files. Each session also has a folder and file pair, both named for the test session using the naming convention (date)_(time). Each session file is stored outside its matching session folder:

Each session folder contains image files of any plots generated from running the test session. If you selected to save all waveforms or ran tests using prerecorded waveform files, these are included here.

The first time you run a new, unsaved session, the session files are stored in the Untitled Session folder located at ..\My TekExpress\400G-TXE\. When you name and save the session, the files are placed in a folder with the name that you specify. A copy of the test files stay in the Untitled Session folder until you run a new test or until you close the 400G-TXE application.

Reports panel

Reports panel overview

Use the Reports panel to browse for reports, to name and save reports, select test content to include in reports, and to select report viewing options.

Select report options

For information on setting up reports, see Select report options. For information on viewing reports, see View a report.

View a report

Report contents

The application automatically generates a report when the test execution is complete and displays the report in your default Web browser (unless you had cleared the View Report After Generating check box in the Reports panel before running the test). If you cleared this check box, or to view a different test report, do the following:

1. Click the Reports button.

2. Click the Browse button and locate and select the report file to view.

3. In the Reports panel, click View.

For information on changing the file type, file name, and other report options, see

Select report options.

A report shows detailed results and plots, as set in the Reports panel.

Setup configuration information

The summary box at the beginning of the report lists setup configuration information. This information includes the oscilloscope model and serial number, electrical module model, and software version numbers of all associated applications.

To exclude this information from a report, clear the Include Setup Configuration check box in the Reports panel before running the test.

User comments

If you selected to include comments in the test report, any comments you added in the DUT tab are shown at the top of the report.

TekExpress® 400G-TXE Printable Application Help 35

Operating basics

Running tests

Equipment connection setup

Click Setup > Test Selection > Schematic to view the equipment setup diagram(s).

Figure 1: Connection diagram for OIF (CEI-VSR at TP0a, CEI-MR, and CEI-LR) and IEEE (AUI4 at TP0a, CR4, and KR4)

Figure 2: Connection diagram for OIF (CEI-VSR at TP1a) and IEEE (AUI4 at TP1a)

TekExpress® 400G-TXE Printable Application Help 37

Running tests

Figure 3: Connection diagram for OIF (CEI-VSR at TP1a) and IEEE (AUI4 at TP1a) for Eye measurements

Figure 4: Connection diagram for OIF (CEI-VSR at TP4) and IEEE (AUI4 at TP4)

38 TekExpress® 400G-TXE Printable Application Help

Running tests

Figure 5: Connection diagram OIF (CEI-VSR at TP4) and IEEE (AUI4 at TP4) for Eye measurements

TekExpress® 400G-TXE Printable Application Help 39

Running tests

Prerequisite

Compensate the signal

path

Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a week. Failure to do so may result in the instrument not meeting warranted performance levels.

1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.

2. Disconnect any probes you have connected to the input channels.

3. Set the instrument to Menu mode.

4. Select Instrument Calibration from the Utilities menu.

5. Note any instructions that appear in the resulting control window.

6. Click Run SPC to begin the procedure. The procedure may take several

minutes to complete.

7. Verify that the Status changes to Compensated after the procedure is complete. If the Calibration Status field indicates anything other than Compensated, see Signal Path Compensation Status for information on the readout and recommended action.

NOTE. When making measurements at vertical scale settings less than or equal to 5 mV, you should perform the signal path compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at those volts/div settings.

Deskew

40 TekExpress® 400G-TXE Printable Application Help

If skew is present between positive and negative channels, then the channels need to be deskewed before being used for waveform measurements. TekExpress 10GKR provides support for channel deskew using the following method:

1. Determine what the skew is for each channel.

2. From the TekScope menu, select Vertical > Deskew.

3. In the Deskew/Attenuation window, click the channel (1 – 4) button for the

first channel to be deskewed.

4. Click in the Ch(x) Deskew Time entry field and enter the skew. The skew can be +ve or –ve.

5. Click the channel button for the next channel and repeat step 4.

6. After entering the skew for all the channels that require it, from the Options

menu in TekExpress 10G-KR, select Deskew.

Running tests

7. In the Deskew and Attenuation dialog box, select the desired level:

■

Less than 100 mV signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is less than 100 mV/division.

■

100 mV or greater signal amplitude: Select this if the signal amplitude is such that the oscilloscope’s vertical setting is greater than 100 mV/ division.

Figure 6: Deskew

8. Click Set on Scope to set the stored deskew and attenuation values on oscilloscope.

9. Click Read from Scope to read the deskew and attenuation values from the oscilloscope.

10. Click View values to view the deskew, attenuation, and bandwidth values.

11. When the status in the dialog box indicates the deskew is finished, click Close.

Figure 7: Deskew-View values

TekExpress® 400G-TXE Printable Application Help 41

Running tests

Each input channel has its own deskew settings. Deskew compensates individual channels for probes or cables of different lengths. The instrument applies the delay values after each completed acquisition. The deskew values are saved as part of the instrument setup. The deskew values for the selected channel are retained until you change the probe, you restore a saved setup, or you recall the factory setup.

NOTE. If you perform the de-embed settings, then performing the Deskew and Attenuation settings are not required.

Running tests

Select tests, set acquisition parameters, set configuration parameters, set preferences parameters, and click Start to run the tests. While tests are running,

you cannot access the Setup or Reports panels. To monitor the test progress, switch between the Status panel and the Results panel.

Prerun checklist

While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using Alt + Tab key combination. To keep the TekExpress 400G-TXE application on top, select Keep On Top from the TekExpress Options menu.

The application displays report when the tests execution is complete.

1. Make sure that the instruments are warmed up (approximately 20 minutes) and stabilized.

2. Perform compensation: In the oscilloscope main menu, select Utilities > Instrument Compensation. Click Help in the compensation window for

steps to perform instrument compensation.

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400G-TXE compliance measurements

DC common mode output voltage

This section verifies that the DC common mode output voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP0a -0.3 V 2.8 V

TP1a -0.3 V 2.8 V

TP4 -0.35 V 2.85 V

Testpoint-T 0 V 1.9 V

TP0a -0.3 V 2.8 V

TP1a -0.35 V 2.85 V

TP4 0 V 1.9 V

TP2 0 V 1.9 V

TP0a 0 V 1.9 V

Min Max

Measurement procedure

Maximum input to be provided to the ATI channels is ≤ 300 mV peak-to-peak. The DC common mode voltage of the signal cannot be measured using ATI channels. Measure the voltage using an external digital multimeter and enter the value in the application.

TekExpress® 400G-TXE Printable Application Help 43

400G-TXE compliance measurements

AC Common Mode Output Voltage

This section verifies that the common mode noise of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP0a NA 12 mV

TP1a NA 17.5 mV

TP4 NA 17.5 mV

Testpoint-T NA 30 mV

TP0a NA 30 mV

TP1a NA 17.5 mV

TP4 NA 17.5 mV

TP2 NA 30 mV

TP0a NA 30 mV

Input

Positive and negative signals from the oscilloscope by setting the bandwidth to 40 GHz

Measurement procedure

The common mode voltage is a measure of the deviation of the common mode signal around the mean value. Find the sum of the positive and negative signals to create the common mode signal and create a vertical histogram on this signal. The RMS value of the vertical histogram is the AC common mode output voltage.

To find the effective common mode voltage after removing the instrumentation noise, use the following formula:

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400G-TXE compliance measurements

Single-ended output voltage

This section verifies that the single-ended output voltage of the data positive and data negative signals of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

IEEE802.3bs AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

Testpoint-T -0.3 V 1.9 V

TP1a -0.4 V 3.3 V

Input

Data positive and data negative signals

Measurement procedure

The single-ended output voltage is the measure of maximum and minimum values of the single-ended signals. Since the voltage levels can go beyond the 300 mV peak-to-peak, this measurement cannot be done using the ATI channels of the oscilloscope. Connect a DC block to eliminate the DC content present in the signal and then measure the maximum and minimum values of the positive and negative signals.

Effective Data Positive Max voltage = DC Common Mode + Data Positive Max

Effective Data Positive Max voltage = DC Common Mode + Data Positive Min

NOTE. DC Common Mode measurement is pre-requisite for this measurement and you will be prompted to measure DC voltage using external multimeter.

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400G-TXE compliance measurements

Diff peak to peak output voltage Tx enabled

This section verifies that the differential peak-to-peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP0a 750 mV NA

TP1a NA 880 mV

TP4 NA 900 mV

Testpoint-T NA 1200 mV

TP0a NA 1200 mV

TP1a NA 880 mV

TP4 NA 900 mV

TP2 NA 1200 mV

TP0a NA 1200 mV

Input

QPRBS13-CEI or any valid signal filtered through a fourth order Bessel Thomson filter.

Measurement procedure

The differential peak-to-peak voltage is the peak-to-peak value of the signal acquired using a base oscilloscope.

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400G-TXE compliance measurements

Diff peak to peak output voltage Tx disabled

This section verifies that the differential peak-to-peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 AUI4-

IEEE802.3bs,Draft

3.5, Annex 120D.

3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP1a NA 30 mV

TP0a NA 35 mV

TP2 NA 30 mV

TP0a NA 30 mV

Input

Noise signal captured when the DUT is disabled (without applying filters)

Measurement procedure

1. Capture the differential noise using Math1 as source (without applying

filters). Math1 = (Data positive – Data negative)

2. Select the oscilloscope free run mode option.

3. In oscilloscopes menu, select Measure > Amplitude and select peak-to-peak

measurement.

4. Value of Peak-Peak measurement is reported as the differential peak-to-peak output voltage.

TekExpress® 400G-TXE Printable Application Help 47

400G-TXE compliance measurements

Transition time

This section verifies that the transition time of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-VSR, Table 16-1

OIF-CEI-VSR, Table 16-4

IEEE802.3bs AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

AUI4IEEE802.3bs, Draft 3.5, Annex 120D.3.1

TP0a 7.5 ps NA

TP1a 12 ps NA

TP4 9.5 ps NA

TP1a 10 ps NA

TP4 9.5 ps NA

Input

QPRBS13-CEI test pattern or any valid signal filtered through a fourth order Bessel Thomson filter.

Measurement procedure

Transition time (rise and fall) are defined as the time between the 20% and 80% times, or 80% and 20% times, respectively, of isolated -1 to +1 or +1 to -1 PAM4 edges. Using the QPRBS13-CEI test pattern, the transitions within sequences of three -1s followed by three +1s, and three +1s followed by three -1s, respectively, are measured. These are PAM4 symbols 1820 to 1825 and 2086 to 2091, respectively, where symbols 1 to 7 are the run of seven +1’s. In this case, the 0% level and 100% level may be estimated as the average signal within windows from -1.5 UI to -1 UI and from 1.5 UI to 2 UI relative to the edge.

TekExpress 400G-TXE application captures sufficient record length and uses PAM4 utility to perform this measurement.

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400G-TXE compliance measurements

Eye width, eye height, eye linearity, and eye symmetry mask width

This section verifies that the eye width, eye height, eye linearity, and eye symmetry mask width of the DUT are within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Measurement Specification Test Points Limits

Min Max

OIF-PAM4 Eye Width OIF-CEI-VSR,

Eye Height 35 mV NA

Eye Linearity 0.85 NA

Eye Symmetry Mask Width

Near End Eye Width

Near End Eye Height

Near End Eye Linearity

Far End Eye Width

Far End Eye Height

Eye Symmetry Mask Width

IEEE-PAM4 Eye Symmetry

Mask Width

Eye Height 32 mV NA

Near End Eye Symmetry Mask Width

Near End Eye Height

Far End Eye Symmetry Mask Width

Far End Eye Height

Table 16-1

OIF-CEI-VSR, Table 16-4

AUI4IEEE802.3bs

TP1a 0.2 UI NA

EW6 NA

TP4 0.265 UI NA

70 mV NA

0.85 NA

0.2 UI NA

70 mV NA

EW6 NA

TP1a 0.2 UI NA

TP4 0.265 UI NA

70 mV NA

0.2 UI NA

30 mV NA

Input

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400G-TXE compliance measurements

Differential signal filtered through fourth order Bessel Thomson filter (with appropriate bandwidth) in concatenation with a Continuous Time Linear Equalizer (CTLE).

Cross talk calibration

Calibrate the co-propagating signals (signal on the other lanes) as per the specification, before performing the eye measurements.

If you want to run with cross talk source, select Crosstalk Source from the DUT panel. By default, this option is unselected and application will provide normal connection diagram procedure.

Eye measurements are done after passing the signal through a reference receiver which includes a fourth order Bessel Thomson filter with appropriate bandwidth cutoff and a selectable continuous time linear equalizer (CTLE filter). It is recommended to use PRBS13Q pattern for this measurement.

NOTE. For 112G-VSR eye measurements, signal will be passed through additional five tap FFE equalizer after Bessel Thomson and CTLE filters

CTLE filters are selected as per the below table:

Table 15: CTLE filters selection table

Specification Test point CTLE filters

CEI-56G-VSR At Host output TP1a 1 dB - 9 dB

At Module output TP4 (Near End)

At CEI-VSR Module output TP4 (Far End)

CEI-112G-VSR At Host output TP1a, TP4 1 dB - 13 dB

200/400GAUI-4/8 At Host output TP1a 1 dB - 9 dB

At Module output TP4 (Near End)

1 dB - 2 dB

1 dB - 9 dB

1 dB - 3 dB

1 dB - 9 dB

TekExpress uses PAM4 utility to perform this measurement. Details about measuring eye width and eye height from the equalized signal is explained in OIF-CEI-56G-VSR and IEEE802.3bs specifications.

At module output, the eye measurements is divided into 2 types:

1. Near End Eye measurements

2. Far End Eye measurements

Near end eye width and eye height are same as eye width and eye height measurements. Whereas far end eye width and eye height measurements are done with an emulated loss channel.

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400G-TXE compliance measurements

Steps to find the best CTLE filter:

1. Best CTLE filter is the one which gives maximum eye area (EW*EH) and it passes corresponding eye parameters.

2. In case of OIF standard, best CTLE filter is the one which gives passing result for Eye width, Eye height and Eye linearity.

3. In case of IEEE standard, best CTLE filter is the one which gives passing eye width and ESMW tests.

Measurement procedure:

1. Acquire the signal (record length depends on the symbol rate).

2. Calculate eye measurements (Eye width, Eye height and Eye linearity if

required) for all CTLE filters at BER of 1e-5.

3. Calculate the Eye Area (EW*EH), select the CTLE with maximum Eye area and passing Eye parameter limits of spec as reference CTLE filter for analysis.

4. Use the reference filter and measure the eye parameters configured at BER as per specification (By default for OIF:1e-6 and for IEEE:1e-5 BER is used).

Eye symmetry mask width (ESMW)

An eye mask of width as per the specification is drawn on the top of eye diagram. All the three eyes have to open beyond the mask drawn which will make the test pass.

Procedure to perform ESMW:

1. Use the reference CTLE filter for analysis. Horizontal mid-point of eye diagram (Tmid) is queried from the PAM4 utility.

2. Mask width has to be read from UI.

3. Mask_Left = Tmid - Mask_Width/2 and Mask_Right = Tmid + Mask_Width/

4. Test is pass if all 3 eyes extend beyond the Eye width mask, else test is fail.

5. Query Hupp_Left and Hupp_Right values from the PAM4 utility which

correspond to the left and right eye boundaries for upper eye.

6. If (Mask_left>=Hupp_Left and Mask_Right<=Hupp_Right) then pass, otherwise fail

7. Repeat steps 5 and 6 for middle and lower eyes. For middle eye, query Hmid_Left and Hmid_Right. Also for lower eye, query Hlow_left and Hlow_right

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400G-TXE compliance measurements

Signal-to-noise and distortion ratio

This section verifies that the signal-to-noise and distortion ratio (SNDR) of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR,

IEEE-PAM4 AUI4-

Table 16-10

OIF-CEI-MR, Table 17-2

OIF-CEI-LR, Table 21-2

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

Min Max

TP0a 31 dB NA

Testpoint-T 31 dB NA

TP0a 31 dB NA

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400G-TXE compliance measurements

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 CR4-

IEEE802.3cd, Section 136.9.3

IEEE-PAM4 KR4-IEEE802.3cd,

Section 137.9.2

TP2 33.3 dB NA

TP0a 32.5 dB NA

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth

Measurement procedure

Signal-to-noise and distortion ratio is measured using the following formula:

Where,

is the linear fit pulse peak

max

σe - RMS error

σn – Standard deviation of noise

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400G-TXE compliance measurements

Pre-cursor and post-cursor equalization ratio

This section verifies that the pre-cursor and post-cursor equalization ratio of the Device Under Test (DUT) is within conformance limits as given in IEEE802.3 200GAUI-4/400GAUI-8 specification at test point TP0a, Table 120D-1, Section 120D.3.1.5.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points

IEEE-PAM4 AUI4-IEEE802.3bs, Draft 3.5,

Annex 120D.3.1

Measurement procedure

1. Set the DUT in PRESET state and find the Linear fit pulse response.

TP0a

2. For pre-cursor test, prompt the user to vary the Local_eq_cm1 value from 0 to 3 and each time find the equalizer coefficients C(-1), C(0) and C(1) value using PRESET linear fit curve and linear fit of each state of Local_eq_cm1.

3. Find the pre-cursor equalization ratio using below formula:

4. Vary the Local_eq_c1 value from 0 to 5 and each time find the equalizer

coefficients C(-1), C(0) and C(1) value using PRESET Linear fit curve and Linear fit of each state of Local_eq_c1.

5. Find the Post-cursor equalization ratio using below formula:

Limits

Pre-cursor equalization ratio for each state of Local_eq_cm1 are the following:

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400G-TXE compliance measurements

Local_eq_cm1 value

0 0±0.04

1 -0.05±0.04

2 -0.1±0.04

3 -0.15±0.04

Pre-cursor equalization ratio for each state of Local_eq_c1 are the following:

Local_eq_c1 value

0 0±0.04

1 -0.05±0.04

2 -0.1±0.04

3 -0.15±0.04

4 -0.2±0.04

5 -0.25±0.04

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400G-TXE compliance measurements

Coefficient range (OIF)

This section verifies that the coefficient range of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

Testpoint-T C(-1) -15% 0%

C(0) 60% 100%

C(1) -25% 0%

Testpoint-T C(-2) 0% 10%

C(-1) -28% 0%

C(0) 60% 100%

C(1) -28% 0%

Measurement procedure

1. Acquire the PRESET signal. Export the linear fit impulse response curve

from PAM4 utility.

2. Increment a coefficient (C(-2), C(-1), C(0) or C(1)) such that it reaches its maximum value and keep all other coefficients in hold state. Export the Linear fit impulse response from PAM4 utility

3. Find the equalizer coefficients using PRESET and incremented linear fit pulses.

4. Similarly ask the user to sufficiently decrement the equalizer coefficient (C(-1), C(0) and C(1)) one by one such that it reaches its minimum value. Capture the waveform and find the linear fit pulse from the PAM4 utility

5. Find the equalizer coefficients using PRESET and decremented linear fit pulses.

6. Verify that each transmitter equalizer coefficient is within the minimum and maximum range of specification.

Increment each coefficient individually to reach its maximum value. You must reconfigure the coefficient to its original value before incrementing another coefficient.

Decrement each coefficient individually to reach its maximum value. You must reconfigure the coefficient to its original value before decrementing another coefficient.

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400G-TXE compliance measurements

Coefficient range (IEEE)

This section verifies that the coefficient range of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 CR4-

IEEE802.3cd, Section

136.9.3

KR4IEEE802.3cd, Section

137.9.2

TP2 C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

TP0a C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

Measurement procedure

1. Range for C(1) or value at minimum state for C(1): with c(−2) and c(−1) both

set to zero and both c(0) and c(1) having received sufficient “decrement” requests so that they are at their respective minimum values, c(1) shall be less than or equal to −0.25.

2. Range for C(-1) or value at minimum state for C(-1): with c(−2) and c(1) set to zero and both c(−1) and c(0) having received sufficient “decrement” requests so that they are at their respective minimum values, c(−1) shall be less than or equal to −0.25.

3. Range for C(-2) or value at maximum state for C(-2): with c(−1) and c(1) set to zero, c(0) having received sufficient “decrement” requests so that it is at its minimum value, and c(−2) having received sufficient “increment” requests so that it is at its maximum value, c(−2) shall be greater than or equal to 0.1.

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400G-TXE compliance measurements

Far end pre-cursor ISI ratio

This section verifies that the far end pre-cursor ISI ratio of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 CR4-

IEEE802.3cd, Section

136.9.3

KR4IEEE802.3cd, Section

137.9.2

TP2 C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

TP0a C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

Measurement procedure

1. Apply the CTLE filter which produces the optimal eye opening and export

the linear fit pulse from the PAM4 utility.

2. Using linear fit impulse, measure the far end pre-cursor ratio:

Far End Pre-cursor ratio = Ppre/Pmax

Where,

Ppre is the value of linear fit pulse 1 UI prior to the time of the pulse peak

Pmax is the peak amplitude of the linear fit pulse

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400G-TXE compliance measurements

Transmitter output residual ISI

This section verifies that the maximum value of transmitter output residual ISI of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP0a 34.8 dB NA

TP2 36.8 dB NA

TP0a 43 dB NA

Measurement procedure

1. Acquire the signal and export the linear fit pulse using PAM4 utility.

2. Perform single sequence in PAM4 utility and export the linear fit pulse to a

file.

3. Using Linear fit pulse, calculate the SNR-ISI value using below equation:

ISI cursors are calculated using below equation:

Where,

tp is the index of the linear fit pulse where p(tp) = pmax

M is the oversampling ratio of the measured waveform and linear fit pulse

Np is the linear fit pulse length

Nb is given in Table 120D–8

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400G-TXE compliance measurements

For UAI-4 at TP0a, Equalization has to be performed on signal before running measurement for SNR-ISI. For CR4 and KR4, measurement is done on unequalized signal.

Equalization procedure

gDC gDC2 G ZLF Z1 PLF P1 P2

-15 to 0 -4 to 0 1 fb/40 fb/2.5 fb*2

1. Equalize the signal with equalization filters given above(varying gDC and gDC2) ad measure the SNR-ISI in each case

2. Maximum value of SNR-ISI is reported out as result.

NOTE. The observed SNR setup, for example, the reflections in cables and connectors. High-precision measurement and careful calibration of the setup are recommended.

Normalized coefficients step size

This section verifies that the normalized coefficients step size of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points

OIF-PAM4 CEI-MR T

IEEE-PAM4 CR4-IEEE802.3cd, Section

can be significantly influenced by the measurement

ISI

CEI-LR T

TP2

136.9.3

KR4-IEEE802.3cd, Section

137.9.2

TP0a

Measurement procedure

Normalized coefficient step size is the measure of variation in the equalizer coefficient when the increment or decrement operations were done.

1. Set the DUT in PRESET state. Export the linear fit pulse response from PAM4 utility.

2. Set the DUT in INITIALIZE state. Export the Linear fit pulse response from PAM4 utility.

3. Calculate all the equalizer coefficient C(x) before using these linear fit pulse responses and denote it as C(x)_Before.

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400G-TXE compliance measurements

4. Increment or decrement the equalizer coefficient in DUT by giving an increment or decrement command.

5. Measure the linear fit pulse response. Calculate the updated equalizer coefficient C(x) in the signal using linear fit pulse response before and after sending increment or decrement request and denote it as C(x)_After.

6. Find the Increment or decrement step size for equalizer coefficient C(x) using below equation.

Increment or decrement step size = C(x)_After – C(x)_Before

Normalized coefficient step size for C(x) is calculated using below equation:

Normalized coefficient step size = Absolute value of ((Increment or Decrement step size) / C(x)_Before)*100

7. Repeat the above method for all the coefficients to find the increment and decrement step sizes.

Limits

Limits CEI-MR

(Normalized limit) C(-1), C(0) and C(1)

For coefficient increment

For coefficient decrement

Min 0.5% 0.5% 0.005 0.005

Max 5% 2% 0.025 0.05

Min -5% -2% -0.025 -0.05

Max -0.5% -0.5% -0.005 -0.005

CEI-LR (Normalized limit) C(-2), C(-1), C(0) and C(1)

CR4 at TP2 and KR4 at TP0a (Absolute limit)

C(-2) C(-1), C(0) and

C(1)

NOTE. C(x) is an equalizer coefficient and the values can be C(-2), C(-1), C(0), and C(1)

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400G-TXE compliance measurements

Coefficient initialization

This measurement measures the values of equalizer coefficient when the DUT is in OUT_OF_SYNC and NEW_IC states (PRESET1, PRESET2 and PRESET3).

Required test equipment

Minimum system requirements

Equipment connection diagram

Coefficient Update state

OUT_OF_S YNC

NEW_IC PRESET 1 Min -0.025 -0.05 0.95 -0.05

ic_reg Limits CR4 (TP2) and KR4 (TP0a)

C(-2) C(-1) C(0) C(1)

N/A Min -0.025 -0.05 0.95 -0.05

Max 0.025 0.05 1.05 +0.05

Max 0.025 0.05 1.05 0.05

PRESET 2 Min -0.025 -0.2 0.7 -0.15

Max 0.025 -0.1 0.8 -0.05

PRESET 3 Min -0.025 -0.3 0.7 -0.05

Max 0.025 -0.2 0.8 0.05

Measurement procedure

1. Configure the DUT in PRESET state, capture the signal and export the linear

fit pulse curve using PAM4 utility.

2. Configure the DUT into OUT_OF_SYNC state, capture the signal and export the linear fit pulse using PAM4 utility. Find the values of Equalizer coefficients in OUT_OF sync state using the linear fit curves of Preset state and OUT_OF_SYNC state.

3. Configure DUT into NEW_IC state with PRESET1, PRESET2 and PRESET3. Each time export the linear fit pulse using the PAM4 utility. Measure the Equalizer coefficients for the each state (PRESET1, PRESET2 and PRESET3). All the time equalizer coefficients should be within the specified limit as per the specification.

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400G-TXE compliance measurements

Signaling rate

This section verifies that the signaling speed of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

IEEE-PAM4 CR4-

IEEE802.3cd, Section 136.9.3

IEEE-PAM4 KR4-IEEE802.3cd,

Section 137.9.2

TP0a 26.5625 - 100ppm 26.5625 +100 rpm

TP1a 26.5625 - 100ppm 26.5625 +100 rpm

TP4 26.5625 - 100ppm 26.5625 +100 rpm

TP2 26.5625 - 100ppm 26.5625 +100 rpm

TP0a 26.5625 - 100ppm 26.5625 +100 rpm

Measurement procedure

1. Perform oscilloscope settings.

2. Capture the BT filtered differential signal using Math1 as source. Math1 =

BT_filter(Data positive – Data negative)

3. Configure signal source in PAM4 utility and perform single sequence.

4. Signaling rate is measured using PAM4 utility and the results are queried.

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400G-TXE compliance measurements

Level separation mismatch ratio

This section verifies that the level separation mismatch ratio of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

IEEE802.3bs 200GAUI-4/

400GAUI-8

IEEE802.3cd 50GBase CR/

100GBase CR2/ 200GBase CR4

IEEE802.3cd 50GBase KR/

100GBase KR2/ 200GBase KR4

Testpoint-T 0.95 NA

TP0a 0.95 NA

TP2 0.95 NA

TP0a 0.95 NA

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

The level separation mismatch ratio RLM is defined by the following equation:

RLM = min ( ( 3.ES1), (3.ES2), (2 - 3.ES1), (2-3.ES2))

Where,

ES1 = (V

ES2 = (V

= (V-1 + V+1) / 2

mid

V-1, V

-1/3

+1/3

-1/3

, V

- V

/ (V+1 - V

mid

- V

/ (V-1 - V

mid

, and V+1 are the mean signal levels for each symbol of -1, -1/3,

+1/3

mid

)

+1/3, and +1 PAM4 symbols, respectively.

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400G-TXE compliance measurements

Linear fit pulse peak

This section verifies that the linear fit pulse peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

Testpoint-T 0.83*Steady state

voltage

Testpoint-T 0.83*Steady state

voltage

TP0a 0.76*Steady state

voltage

TP2 0.49*Steady state

voltage

TP0a 0.75*Steady state

voltage

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

The linear fit pulse peak is the peak value of linear fit pulse p(k).

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400G-TXE compliance measurements

Steady state voltage

This section verifies that the steady state voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR,

Table 17-2

OIF-CEI-LR, Table 21-2

IEEE802.3bs AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

IEEE802.3cd CR4-

IEEE802.3cd, Section 136.9.3

IEEE802.3cd KR4-IEEE802.3cd,

Section 137.9.2

Testpoint-T 0.4 V 0.6 V

TP0a 0.4 V 0.6 V

TP2 0.34 V 0.6 V

TP0a 0.4 V 0.6 V

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400G-TXE compliance measurements

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

The steady state voltage vf is defined as the sum of the linear fit pulse p(k), divided by M, as shown in following equation:

Even odd jitter

This section verifies that the maximum value of the even odd jitter of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

OIF-CEI-MR, Table 17-3

OIF-CEI-LR, Table 21-3

IEEE-PAM4 AUI4-

IEEE802.3bs, Draft 3.5, Annex 120D.3.1

CR4IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

TP0a NA 0.019 UI

Testpoint-T NA 0.019 UI

TP0a NA 0.019 UI

TP2 NA 0.019 UI

TP0a NA 0.019 UI

Input

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400G-TXE compliance measurements

Differential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Measurement procedure

Even odd jitter is the measure of two repetitions of a QPRBS13-CEI test pattern. The deviation of the time of each transition from an ideal clock at the signaling rate is measured.

Even odd jitter is defined as the magnitude of the difference between the average deviation of all even-numbered transitions and the average deviation of all oddnumbered transitions. Determining if a transition is even or odd is based on the possible transitions (only actual transitions are measured and averaged).

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

This section verifies that the maximum value of the uncorrelated bounded high probability jitter (UBHPJ) and Uncorrelated unbounded gaussian jitter (UUGJ) is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points UBHPJ limits UUGJ limits

Min Max Min Max

OIF-PAM4 OIF-CEI-VSR,

Table 16-10

TP0a NA 0.05 UI NA 0.01 UI

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

UBHPJ and UUGJ are measured using a QPRBS13-CEI test pattern. This measurement requires at least 107 symbols.

This measurement finds all the zero crossings in the signal and then finds the average pulse width. The difference of the edge time is the jitter value. The jitter is filtered through a high pass filter. Find the CDF of the filtered jitter. The UBHPJ and UUGJ are calculated by the following equation:

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400G-TXE compliance measurements

Where,

J5 is the difference between the τHPF at the (1-0.5 × 10-5) and 0.5 × 10

-5

probabilities.

J6 as the difference between the τHPF at the (1-0.5 × 10-6) and 0.5 ×10

-6

probabilities.

Uncorrelated jitter RMS and uncorrelated J4 jitter

This section verifies that the maximum value of the uncorrelated J4 jitter (J4u) and Uncorrelated Jitter RMS (Jrms) are within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points

OIF-PAM4 CEI-MR T

CEI-LR T

IEEE-PAM4 200GAUI-4/ 400GAUI-8 TP0a

50GBase CR/ 100GBase CR2/ 200GBase CR4

50GBase KR/ 100GBase KR2/ 200GBase KR4

TP2

TP0a

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

J4 and Jrms are defined by measurements of 12 specific transitions in a PRBS13Q pattern to exclude correlated jitter. The 12 transitions represent all possible combinations of four identical symbols followed by two different identical symbols as shown in Table 120D–2. The sequences are located by the symbol indices given in the table where symbols 1 to 7 are the run of seven 3s.

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400G-TXE compliance measurements

J4 is defined as the time interval that includes all but 10–4 of fJ(t), from the

0.005th to the 99.995th percentile of fJ(t). JRMS is defined as the standard

deviation of fJ(t).

This measurement requires minimum of 3500 specific transitions. Hence the application will capture 10 waveforms each with 8M. It analyzes the waveforms one by one using PAM4 utility until it accumulates the required number of transitions (3500). Incase of noisy signals, more data is needed to get the required number of transitions which application takes care internally.

Limits

Table 16: J4 jitter limits

Specification Test Points Min Max

CEI-MR T NA 0.118 UI

CEI-LR T NA 0.118 UI

200GAUI-4/ 400GAUI-8

50GBase CR/ 100GBase CR2/ 200GBase CR4

50GBase KR/ 100GBase KR2/ 200GBase KR4

TP0a NA 0.118 UI

TP2 NA 0.118 UI

TP0a NA 0.118 UI

Table 17: Jrms limits

Specification Test Points Min Max

200GAUI-4/ 400GAUI-8

50GBase CR/ 100GBase CR2/ 200GBase CR4

50GBase KR/ 100GBase KR2/ 200GBase KR4

TP0a NA 0.023 UI

TP2 NA 0.023 UI

TP0a NA 0.023 UI

70 TekExpress® 400G-TXE Printable Application Help

SCPI commands

About SCPI command

You can use Standard Commands for Programmable Instruments (SCPI) to communicate with the TekExpress application.

Socket configuration for SCPI commands

This section describes the steps for TCPIP socket configuration and TekVISA configuration to execute the SCPI commands.

TCPIP socket configuration

1. Click Start > Control Panel > System and Security > Windows Firewall >

Advanced settings

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SCPI commands

2. In Windows Firewall with Advanced Security menu, select Windows Firewall with Advanced Security on Local Computer > Inbound Rules

and click New Rule…

3. In New Inbound Rule Wizard menu a. Select Port and click Next

72 TekExpress® 400G-TXE Printable Application Help

b. Select TCP as rule apply and enter 5000 for Specific local ports and

click Next

SCPI commands

c. Select Allow the connection and click Next

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SCPI commands

d. Select Domain, Private, Public and click Next

e. Enter Name, Description (optional), and click Finish

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SCPI commands

4. Check whether the Rule name is displayed in Windows Firewall with Advanced Security menu > Inbound Rules

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SCPI commands

TekVISA configuration

1. Click Start > All Programs > TekVISA > OpenChoice Instrument

Manager

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SCPI commands

2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of the

TekExpress device in Hostname and type Port as 5000. Click configure the IP address with Port.

Enter the Hostname as 127.0.0.1 if the TekVISA and TekExpress application are in the same system, else enter the IP address of the TekExpress application system.

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SCPI commands

3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager >

Instruments

4. Double-click OpenChoice Talker Listener and enter the Command *IDN?

in command entry field and click Query. Check that the Operation is successful and Talker Listener Readout displays the Command / Data.

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SCPI commands

TEKEXP:*IDN?

This command queries the active TekExpress application name running on the oscilloscope.

Outputs

TEKEXP:*OPC?

Syntax

Inputs

Syntax

Inputs

TEKEXP:*IDN?\n

Returns active TekExpress application name running on the oscilloscope.

TIP. Click here for examples.

This command queries the execution status of the last executed command.

TEKEXP:*OPC?\n

Outputs

TekExpress® 400G-TXE Printable Application Help 79

0 - last command execution is not complete

1 - last command execution is complete

TIP. Click here for examples.

SCPI commands

TEKEXP:ACQUIRE_MODE

This command sets the acquire mode as live or pre-recorded.

Syntax

Inputs

Outputs

TEKEXP:ACQUIRE_MODE {LIVE | PRE-RECORDED}\n

{LIVE | PRE-RECORDED}

TIP. Click here for examples.

TEKEXP:ACQUIRE_MODE?

This command queries the acquire mode type.

Syntax

Inputs

TEKEXP:ACQUIRE_MODE?\n

Outputs

{LIVE | PRE-RECORDED}

TIP. Click here for examples.

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SCPI commands

TEKEXP:EXPORT

This command returns all the bytes of data to the specified file.

Syntax Outputs

TEKEXP:EXPORT REPORT\n Returns the report file in bytes

TEKEXP:EXPORT WFM,"<FileName>"\n Returns the specified waveform file in bytes

TEKEXP:EXPORT IMAGE,"<FileName>"\n Returns the specified image file in bytes

TEKEXP:INFO?

Inputs

FileName - Specifies the file name

TIP. Click here for examples.

This command queries the information about the file(s).

Syntax Outputs

TEKEXP:INFO? REPORT\n <ReportFileSize>,"<ReportFileName.mht>"

TEKEXP:INFO? WFM\n <WfmFile1Size>,"<WfmFileName1.wfm>";<Wfm

File2Size>,"<WfmFileName2.wfm>";...

TEKEXP:INFO? IMAGE\n <Image1FileSize>,"<Image1FileName>";<Image

2FileSize>,"<Image2FileName>" ;...

TIP. Click here for examples.

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SCPI commands

TEKEXP:INSTRUMENT

This command sets the value for the selected instrument type.

Syntax

Inputs

Outputs

TEKEXP:INSTRUMENT?

TEKEXP:INSTRUMENT "<InstrumentType>",<Value>"\n

InstrumentType

Value

TIP. Check Command parameters list for InstrumentType and Value parameters.

TIP. Click here for examples.

This command queries the instrument selected for the specified instrument type.

Syntax

Inputs

TEKEXP:INSTRUMENT? "<InstrumentType>"\n

InstrumentType

TIP. Check Command parameters list for InstrumentType parameters.

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SCPI commands

Outputs

TEKEXP:LASTERROR?

Syntax

Inputs

Outputs

Returns the instrument selected for the specified instrument type

TIP. Click here for examples.

This command queries the last error string occurred for the current TCP session. If there are no errors since startup, or since the last call to TEKEXP:LASTERROR?\n, this command returns an empty string.

TEKEXP:LASTERROR?\n

TEKEXP:LIST?

TIP. Click here for examples.

This command queries the list of available device, suite, test, version or instrument.

Syntax Outputs

TEKEXP:LIST? DEVICE\n Returns the list of available device(s) as comma

separated values.

TEKEXP:LIST? SUITE\n Returns the list of available suite(s) as comma

separated values.

TEKEXP:LIST? TEST\n Returns the list of available test(s) as comma

separated values.

TEKEXP:LIST? VERSION\n Returns the list of available version(s) as comma

separated values.

TEKEXP:LIST? INSTRUMENT,"<InstrumentType>"\n

Returns the list of available instruments' for the given Instrument type as comma separated values.

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SCPI commands

NOTE. This command returns the list of items within double quotes (""). Iterate the receive procedure until the list ends with double quotes otherwise the next query commands won’t work as expected.

TEKEXP:MODE

Inputs

Syntax

Inputs

Outputs

InstrumentType

TIP. Check Command parameters list for InstrumentType parameters.

TIP. Click here for examples.

This command sets the execution mode as compliance or user defined.

TEKEXP:MODE {COMPLIANCE | USER-DEFINED}\n

{COMPLIANCE | USER-DEFINED}

TIP. Click here for examples.

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SCPI commands

TEKEXP:MODE?

This command queries the execution mode type.

Syntax

Outputs

TEKEXP:POPUP

Syntax

Inputs

TEKEXP:MODE?\n

{COMPLIANCE | USER-DEFINED}

TIP. Click here for examples.

This command sets the response to the active popup shown in the application.

TEKEXP:POPUP “<PopupResponse>”\n

PopupResponse

Outputs

TIP. Click here for examples.

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SCPI commands

TEKEXP:POPUP?

This command queries the active popup information shown in the application.

Syntax

Inputs

Outputs

TEKEXP:REPORT

Syntax

Inputs

TEKEXP:POPUP?\n

Returns the active popup information in the application.

TIP. Click here for examples.

This command generates the report for the current session.

TEKEXP:REPORT GENERATE\n

GENERATE

Outputs

TIP. Click here for examples.

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SCPI commands

TEKEXP:REPORT?

This command queries the queried header field value in the report.

Syntax

Inputs

Outputs

TEKEXP:RESULT?

TEKEXP:REPORT? “<HeaderField>”\n

HeaderField - Specifies to return the measured value for the indicated test.

TIP. Check Report for HeaderField parameters.

Returns the queried header field value in the report

TIP. Click here for examples.

This command queries the result available in report summary/details table.

Syntax Outputs

TEKEXP:RESULT? "<TestName>"\n Return Pass/Fail status of the test.

TEKEXP:RESULT? "<TestName>","<ColumnName>"\n

TEKEXP:RESULT? "<TestName>","<ColumnName>",<RowNumber >\n

Returns all the row values of the specified column for the test.

Returns the column value for the specified row number

Row number starts from zero.

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SCPI commands

Inputs

TEKEXP:SELECT

Syntax

TestName - Specifies the name of the test for which to obtain the test result value.

ColumnName - Specifies the column name for the measurement

RowNumber - Specifies the row number of the measurement

TIP. Check Results panel for TestName, ColumnName, and RowNumber parameters.

TIP. Click here for examples.

This command selects the device, suite, version, or test.

TEKEXP:SELECT <string1>,<string2>,<string4>\n

TEKEXP:SELECT TEST,<string3>,<string4>\n

Inputs

<string1> = {DEVICE | SUITE | VERSION}

<string2> = {DeviceName | SuiteName | VersionName}

<string3> = {“<TestName>"| ALL| REQUIRED }

<string4> = {TRUE | FALSE}

TIP. Check Command parameters list for DeviceName, SuiteName, VersionName, and TestName parameters.

TIP. Click here for examples.

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SCPI commands

Outputs

TEKEXP:SELECT?

Syntax

Inputs

Outputs

This command queries the name of the selected device, suite, version, or test.

TEKEXP:SELECT? {DEVICE | SUITE | TEST | VERSION}\n

{DEVICE | SUITE | TEST | VERSION}

Returns the name of the selected device, suite, version, or test.

TIP. Click here for examples.

TEKEXP:SETUP

Inputs

This command sets the value of the current setup.

Syntax Outputs

TEKEXP:SETUP DEFAULT\n Restore to default Setup

TEKEXP:SETUP OPEN,"<SessionName>"\n Open the session

TEKEXP:SETUP SAVE\n Save the session

TEKEXP:SETUP SAVE,"<SessionName>"\n Save the session

SessionName - The name of the session

TIP. Click here for examples.

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SCPI commands

TEKEXP:STATE

This command sets the execution state of the application.

Syntax

Inputs

Outputs

TEKEXP:STATE?

TEKEXP:STATE {RUN | STOP | PAUSE | RESUME}\n

{RUN | STOP | PAUSE | RESUME}

TIP. Click here for examples.

This command queries the current setup state.

Syntax Outputs

TEKEXP:STATE? RUNNING | PAUSED | WAIT | ERROR | READY

| STOPPED

TEKEXP:STATE? SETUP SAVED | NOT_SAVED

TIP. Click here for examples.

90 TekExpress® 400G-TXE Printable Application Help

Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscopes User manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

Getting help and support

Conventions

Related documentation

Technical support

Getting started

Minimum system requirements

Instruments and accessories required

Downloading and installing the software

View software version

Application directories

File name extensions

Operating basics

Launch the application

Application panels overview

Global application controls

Application controls

Options menu overview

Configure email settings

Setup panel

Setup panel overview

Set DUT parameters

Select tests

Status panel

Status panel overview

Results panel

Results panel overview

View test-related files

Reports panel

Reports panel overview

Select report options

View a report

Report contents

Running tests

Equipment connection setup

Prerequisite

Deskew

Running tests

400G-TXE compliance measurements

DC common mode output voltage

AC Common Mode Output Voltage

Single-ended output voltage

Diff peak to peak output voltage Tx enabled

Diff peak to peak output voltage Tx disabled

Transition time

Eye width, eye height, eye linearity, and eye symmetry mask width

Signal-to-noise and distortion ratio

Pre-cursor and post-cursor equalization ratio

Coefficient range (OIF)

Coefficient range (IEEE)

Far end pre-cursor ISI ratio

Transmitter output residual ISI

Normalized coefficients step size

Coefficient initialization

Signaling rate

Level separation mismatch ratio

Linear fit pulse peak

Steady state voltage

Even odd jitter

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

Uncorrelated jitter RMS and uncorrelated J4 jitter

SCPI commands

About SCPI command

Socket configuration for SCPI commands

TEKEXP:*IDN?

TEKEXP:*OPC?

TEKEXP:ACQUIRE_MODE

TEKEXP:ACQUIRE_MODE?

TEKEXP:EXPORT

TEKEXP:INFO?

TEKEXP:INSTRUMENT

TEKEXP:INSTRUMENT?

TEKEXP:LASTERROR?

TEKEXP:LIST?

TEKEXP:MODE