Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help User manual

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TekExpress® 400G-TXE Electrical Compliance Solution for Real T

Application Help

ime Oscilloscope

*P077136605*

077-1366-05

TekExpress® 400G-TXE Electrical Compliance Solution for Real T

Application Help

ime Oscilloscope

*P077136605*

077-1366-05

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions. T and pending. Information in this publication supersedes that in all previously published material. Specifications and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

ektronix products are covered by U.S. and foreign patents, issued

Contacting Tektronix

Tektronix, Inc.

14150 SW Karl Braun Drive

P.O. Box 500

Beaverton, OR 97077

USA

For product information, sales, service, and technical support:

• In North America, call 1-800-833-9200.

• Worldwide, visit to www.tek.com find contacts in your area.

Table of Contents

Welcome....................................................................................................................................................................................... 8

Getting help and support.............................................................................................................................................................10

Product documents.............................................................................................................................................................. 10

Conventions......................................................................................................................................................................... 10

Technical support................................................................................................................................................................. 11

Getting started.............................................................................................................................................................................12

Hardware requirements....................................................................................................................................................... 12

Minimum system requirements.....................................................................................................................................12

Instruments and accessories required..........................................................................................................................12

Software requirements.........................................................................................................................................................13

Downloading and installing the software.......................................................................................................................13

Activate the license.......................................................................................................................................................13

View software version and license key details..............................................................................................................13

Setting up the test environment.................................................................................................................................................. 14

Compensate the signal path................................................................................................................................................ 14

Deskew................................................................................................................................................................................ 14

Running tests....................................................................................................................................................................... 15

Equipment connection setup................................................................................................................................................16

Search instruments connected to the application................................................................................................................ 18

Starting the application................................................................................................................................................................20

Application controls..............................................................................................................................................................21

Options menu functions....................................................................................................................................................... 22

Configure email settings...................................................................................................................................................... 24

TekExpress instrument control settings............................................................................................................................... 25

Setup panel: Configure the test setup.........................................................................................................................................26

DUT: Set DUT settings.........................................................................................................................................................27

Test Selection: Select the tests............................................................................................................................................ 30

Acquisitions: Set waveform acquisition settings.................................................................................................................. 31

400G TX CK Measurement waveform naming............................................................................................................. 32

Configuration: Set measurement limits for tests.................................................................................................................. 34

Preferences: Set the test run preferences........................................................................................................................... 37

Status panel: View the test execution status...............................................................................................................................38

View test execution status....................................................................................................................................................38

View test execution logs.......................................................................................................................................................39

Results panel: View summary of test results...............................................................................................................................40

Filter the test results.............................................................................................................................................................40

Reports panel: Configure report generation settings.................................................................................................................. 41

Report configuration settings............................................................................................................................................... 41

Configure report view settings............................................................................................................................................. 43

View a generated report.......................................................................................................................................................44

Saving and recalling test setup................................................................................................................................................... 45

Overview.............................................................................................................................................................................. 45

Save the configured test setup............................................................................................................................................ 45

Load a saved test setup.......................................................................................................................................................46

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 5

Table of Contents

Perform a test using pre-run session files............................................................................................................................47

Save the test setup with a dif

ferent name............................................................................................................................51

400G-TXE compliance measurements....................................................................................................................................... 52

DC common mode output voltage....................................................................................................................................... 52

AC Common Mode Output Voltage......................................................................................................................................52

Single-ended output voltage................................................................................................................................................ 53

Diff peak to peak output voltage Tx enabled........................................................................................................................54

Diff peak to peak output voltage Tx disabled....................................................................................................................... 55

Transition time......................................................................................................................................................................56

Eye width, VEC (Vertical Eye Closure), Eye height, Eye linearity, and Eye symmetry mask width..................................... 57

Signal-to-noise and distortion ratio...................................................................................................................................... 62

Pre-cursor and post-cursor equalization ratio...................................................................................................................... 63

Coefficient range (OIF).........................................................................................................................................................64

Coefficient range (IEEE)...................................................................................................................................................... 65

Far end pre-cursor ISI ratio..................................................................................................................................................67

Transmitter output residual ISI.............................................................................................................................................67

Normalized coefficients step size.........................................................................................................................................68

Coefficient initialization.........................................................................................................................................................69

Signaling rate....................................................................................................................................................................... 70

Level separation mismatch ratio (RLM).................................................................................................................................71

Linear fit pulse peak.............................................................................................................................................................72

Steady state voltage............................................................................................................................................................ 73

Even odd jitter...................................................................................................................................................................... 74

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter..................................................... 75

Uncorrelated jitter RMS and uncorrelated J3 and J4 Jitter.................................................................................................. 75

Signal to AC common mode noise ratio (SCMR).................................................................................................................77

Peak-Peak AC Common mode voltage............................................................................................................................... 78

Signal to Residual Inter symbol Interface Ratio (SNR

).....................................................................................................79

ISI

Difference steady-state voltage dvf...................................................................................................................................... 79

Difference linear fit pulse peak ratio dR

Linear fit pulse peak ratio R

peak

......................................................................................................................... 80

peak

.................................................................................................................................... 81

SCPI Commands........................................................................................................................................................................ 82

About SCPI command......................................................................................................................................................... 82

Socket configuration for SCPI commands........................................................................................................................... 82

Set or query the device name of application........................................................................................................................88

Set or query the suite name of the application.....................................................................................................................88

Set or query the test name of the application...................................................................................................................... 89

Set or query the version name of the application.................................................................................................................94

Set or query the general parameter values..........................................................................................................................95

Set or query the acquire parameter values........................................................................................................................103

Set or query the analyze parameter values....................................................................................................................... 103

Query the available devices in the DUT panel of the application.......................................................................................104

Query the available suites for the selected device.............................................................................................................104

Query the list of available tests of the application..............................................................................................................104

Query the available version names of the application....................................................................................................... 107

Query the list of available instruments based on the specified instrument type.................................................................108

Set or query the IP address of the instrument based on the specified instrument type.....................................................108

Query the information of the generated report file............................................................................................................. 109

Table of Contents

Query the information of the generated waveform files..................................................................................................... 109

Query the information of the generated image files

........................................................................................................... 109

Query the active TekExpress application name................................................................................................................. 110

Set or query the DUTID of application................................................................................................................................110

Sets or query the acquire mode status...............................................................................................................................110

Set or query the execution mode status.............................................................................................................................111

Generate the report for the current session........................................................................................................................111

Query the value of specified report header field in the report............................................................................................ 112

Query the value of specified result detail available in report summary/details table..........................................................112

Restore the setup to default settings..................................................................................................................................113

Save the setup................................................................................................................................................................... 113

Save the settings to a specified session............................................................................................................................ 113

Open the setup from a specified session........................................................................................................................... 114

Query the current setup file name......................................................................................................................................114

Run/stop/pause/resume the selected measurements execution in the application............................................................114

Query the current measurement execution status............................................................................................................. 115

Query whether the current setup is saved or not saved.....................................................................................................115

Exit or close the application................................................................................................................................................115

Query the status of the previous command execution....................................................................................................... 115

Query the last error occurred............................................................................................................................................. 116

Set or query the popup details........................................................................................................................................... 116

Sets or query the limit values in the limits editor window................................................................................................... 116

Set or query the waveform file recalled for the specified test name and acquire type....................................................... 117

Set or query the enable/disable status of Verbose function...............................................................................................117

Query the enable or disable status of Continuous run function..........................................................................................118

Set or query the enable/disable status of Continuous Run function...................................................................................118

Set or query the continuous run duration time value..........................................................................................................119

Set or query the session create option in the continuous run function...............................................................................119

Set or query the View report after generating option status...............................................................................................120

Returns the report as XML string....................................................................................................................................... 121

Copies all the images from current run session to the given destination location..............................................................121

Selects the specified test(s) and deselect all other tests................................................................................................... 121

Returns the complete information about the selected test.................................................................................................122

Set the default session.......................................................................................................................................................122

Save the run/config sessions............................................................................................................................................. 122

Load the run/config session............................................................................................................................................... 122

Delete the run/config session.............................................................................................................................................123

Run the run/config saved session......................................................................................................................................123

Query the available list in the run/config session...............................................................................................................123

Query the current run/config session................................................................................................................................. 124

Override the run/config session......................................................................................................................................... 124

Examples........................................................................................................................................................................... 124

References................................................................................................................................................................................127

Application directories........................................................................................................................................................127

File name extensions......................................................................................................................................................... 127

View test-related files.........................................................................................................................................................128

Parameters........................................................................................................................................................................ 129

About application parameters..................................................................................................................................... 129

Index......................................................................................................................................................................................... 136

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 7

Welcome

Welcome to Tektronix Real Time Oscilloscope based 400G-TXE electrical compliance test solution. The 400G-TXE is an application running on the Tektronix automation platform. The 400G-TXE evaluates the electrical PAM4 signals to the specification-mandated limits. The 400G-TXE electrical compliance test solution provides turnkey compliance testing and debug of the TX electrical properties, key to OIF (CEI-VSR/CEI-MR/CEI-LR) and IEEE (AUI/CR4/KR4) PAM4 standards. It tests the OIF-PAM4 and IEEE-PAM4 electrical standards in a simple, cost effective manner. The 400G-TXE solution offers comprehensive test automation, results margining, data logging, and results reporting in an advanced testing framework.

Key Features

•

The Tektronix TekExpress 400G-TXE provides an automated test solution for following specifications:

• OIF-PAM4 Specifications:

• CEI-VSR: 56G

• Host output - TP1a (Section 16.3.2, Table: 16-1)

• Module output - TP4 (Section 16.3.3, Table: 16-4)

• TP0a (Section 16.B.1.1, Table: 16-10)

• CEI-VSR: 112G

• Host output - TP1a (Section 23.3.2, Table 23-1)

• Module output - TP4 (Section 23.3.3, Table 23-4)

• TP0a (Section 23.B.1.1, Table 23-9)

• CEI-MR: Section 17.31, Tables 17-2 and 17-3

• CEI-LR: Section 21.3.1, Tables 21-2 and 21-3

• IEEE-PAM4 50G-1, 100G-2, 200G-4, and 400G-8 Specifications:

• AUI TP0a: IEEE802.3bs Annex 120D.3.1

Welcome

• AUI TP1a: IEEE802.3bs Annex 120E.3.1 AUI TP4: IEEE802.3bs Annex 120E.3.2

•

• CR TP2: IEEE802.3cd Section 136.9.3

• KR TP0a: IEEE802.3cd Section 137.9.2

• IEEE-802.3ck Transmitter Electrical Specifications (100G-1, 200G-2, and 400G-4):

• AUI C2C TP0v: IEEE802.3ck, Annex 120F.3.1, Table 120F-1

• AUI C2M Host TP1a: IEEE802.3ck, Annex 120G.3.1, Table 120G-1

• AUI C2M Module TP4: IEEE802.3ck, Annex 120G.3.2, Table 120G-3

• CR TP2: IEEE802.3ck, Section 162.9, Table 162-11

• Streamlined and fully automated transmitter characterization of OIF (CEI-VSR/CEI-MR/CEI-LR) and IEEE (AUI/CR4/ KR4) PAM4 electrical transmitter specifications (chip-to-chip and chip-to-module)

• In-depth analysis and debug capabilities of electrical PAM4 signals in combination with the PAM4 software package

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 9

Getting help and support

Product documents

Use the product documents for more information on the application functions, understand the theory of operation, how to remotely program or operate the application, and do other tasks.

Table 1: TekExpress Application documents

To learn about Use this document

How to use the application

How to remotely control the instrument

Conventions

This application help uses the following conventions:

TekExpress 400G-TXE Help

PDF version of this document can be downloaded from www

Compiled HTML (CHM) version is integrated with the application. Press F1 key from the keyboard to start the help.

Tektronix Part Number: 077-xxxx-xx

.tek.com/downloads

The term "Application," and "Software" refers to the TekExpress 400G-TXE application.

•

• The term “DUT” is an abbreviation for Device Under Test.

• The term “select” is a generic term that applies to the two methods of choosing a screen item (button control, list item): using a mouse or using the touch screen.

• A Note identifies important information.

Table 2: Icons used in the help

Icon Description

This icon identifies important information

This icon identifies conditions or practices that could result in loss of data.

This icon identifies additional information that will help you use the application more

ficiently.

Getting help and support

Technical support

ektronix values your feedback on our products. To help us serve you better, please send us your suggestions, ideas, or comments on

T your application or oscilloscope. Contact Tektronix through mail, telephone, or the Web site. See Contacting Tektronix at the front of this document for contact information.

When you contact Tektronix Technical Support, please include the following information (be as specific as possible):

General information

• All instrument model numbers

• Hardware options, if any

• Modules used

• Your name, company, mailing address, phone number, FAX number

• Please indicate if you would like to be contacted by Tektronix about your suggestion or comments.

Application specific information

• Software version number

• Description of the problem such that technical support can duplicate the problem

• If possible, save the setup files for all the instruments used and the application

• If possible, save the TekExpress setup files, log.xml, *.TekX (session files and folders), and status messages text file

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 11

Getting started

Hardware requirements

Minimum system requirements

The following table shows the minimum system requirements to install and run the TekExpress 400G-TXE solution.

Table 3: System requirements

Component Description

Oscilloscope • DPO70K DX / SX series oscilloscopes

Firmware Version: 10.12 or above

•

• Opt. DJA/DJAN and PAM400GCK

Software • PAMJET 10.9.2.279 or above

• IronPython 2.7.3 installed

• PyVisa 1.0.0.25 installed

• Microsoft .NET 4.0 Framework

• Microsoft Internet Explorer 7.0 SP1 or greater, or other Web browser for viewing reports

• Adobe Reader software 7.0 or greater for viewing portable document format (PDF) files

Instruments and accessories required

ekExpress 400G-TXE application is launched on DPO70K series oscilloscope. The following table lists the instruments and accessories

T required for this application.

Table 4: Instruments and accessories required for 400G-TXE application

Instrument/Accessory Model number Quantity

Oscilloscope

Cables Compatible SMA cables with bandwidth > than 40 GHz (IEEE802.3cd/bs) and ≥

Fixtures

DPO73304DX, MSO73304DX, DPO73304SX, DPS73308SX, DPO75002SX, DPS75004SX, DPO77002SX, DPS77004SX, DPO75902SX, DPS75904SX

59 GHz (IEEE802.3ck) for connecting single ended sources A

For IEEE802.3cd/bs:

• Wilder Host compliance board CEI-VSR/AUI-4 at TP1a (HCB-P) (Wilder part number: 640-0822-000)

• Wilder Module compliance board CEI-VSR/AUI-4 at TP4 (MCB) (Wilder part number: 640-0823-000)

• Any compatible text fixture for CEI-VSR/AUI-4 at TP0a, CEI-MR, CEI-LR, CR and KR

TI channel.

DC Blocks Compatible DC block with bandwidth range 50 KHz to 65 GHz 2

Attenuator 3, 6, or 10 dB attenuators 2

Software requirements

Downloading and installing the software

Getting started

Complete the following steps to download and install the latest

1. Go to www.tek.com.

2. Click Downloads. In the Downloads menu, select DOWNLOAD TYPE as Software and enter the application name in the MODEL OR KEYWORD field and click SEARCH.

3. Select the latest version of software and follow the instructions to download the software. Copy the executable file into the

oscilloscope.

4. Double-click the executable and follow the on-screen instructions.

The software is installed at C:\Program Files\Tektronix\TekExpress\

5. Select Application > TekExpress 400G-TXE from the Oscilloscope menu, to open the application.

TekExpress 400G-TXE application.

TekExpress 400G-TXE.

Activate the license

Activate the license using the Option Installation wizard in the TekScope application:

1. In the TekScope application menu bar, click Utilities > Option Installation. The TekScope Option Installation wizard opens.

2. Push the F1 key on the oscilloscope keyboard to open the Option Installation help topic.

3. Follow the directions in the help topic to activate the license.

View software version and license key details

To view version information of the application, click Options > About TekExpress.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 13

Setting up the test environment

Compensate the signal path

Use the following procedure to compensate the internal signal acquisition path. Perform this procedure if the ambient temperature has changed more than 5 °C (9 °F) since you performed the last signal path compensation. Perform the signal path compensation once a week. Failure to do so may result in the instrument not meeting warranted performance levels.

1. Power on and wait for the instrument to complete its warm up period before continuing with this procedure.

2. Disconnect any probes you have connected to the input channels.

3. Set the instrument to Menu mode.

4. Select Instrument Calibration from the Utilities menu.

5. Note any instructions that appear in the resulting control window

6. Click Run SPC to begin the procedure. The procedure may take several minutes to complete.

7. Verify that the Status changes to Compensated after the procedure is complete. If the Calibration Status field indicates anything other

than Compensated, see Signal Path Compensation Status for information on the readout and recommended action.

Note: When making measurements at vertical scale settings less than or equal to 5 mV compensation at least once a week. Failure to do so may result in the instrument not meeting warranted performance levels at those volts/div settings.

, you should perform the signal path

Deskew

If skew is present between positive and negative channels, then the channels need to be deskewed before being used for waveform measurements.

Apply the appropriate input attenuator such that the signal on the screen for each channel can be adjusted (using the oscilloscope's V

ertical > Scale settings) to less than 10 division Pk-Pk but greater than 8 division Pk-Pk.

Use maximum instrument bandwidth so narrow noise peaks that might reach out-of-range are visible in their full amplitude, rather than limited by the post-digitizer bandwidth processing. Set the record length to 50 MSa or longer; Measure both channel 1 and channel 2 with a Measure > Amplitude > Peak - Peak to monitor that the trace is without clopping, that is the measurements don't display a warning indicating over-driven input.

TekExpress 400G-TXE provides support for channel deskew and attenuation using the following method:

1. Determine what the skew is for each channel.

Please use method recommended by Tektronix. DPO70k SX oscilloscope to find the skew, for example, minimum common mode. Tektronix recommends using channel 1 as a reference with 0 skew, and entering a measured skew value in channel 2.

2. From the TekScope menu, select Vertical > Deskew.

3. In the Deskew/Attenuation window, click the channel 1, and set the skew to 0. Then select channel 2 button for the first channel to be

deskewed.

4. Click in the Ch(x) Deskew Time entry field and enter the skew. The skew can be +ve or –ve.

5. Click the channel button for the next channel and repeat step 4.

6. After entering the skew for all the channels that require it, from the Options menu in TekExpress 400G-TXE, select Deskew.

Figure 1: Deskew

7. Click Read from Scope to read the deskew and attenuation values from the oscilloscope.

8. Click V

9. When the status in the dialog box indicates the deskew is finished, click Close.

iew values to view the deskew, attenuation, and bandwidth values.

Setting up the test environment

Figure 2: Deskew-View values

Each input channel has its own deskew settings. Deskew compensates individual channels for probes or cables of dif instrument applies the delay values after each completed acquisition. The deskew values are saved as part of the instrument setup. The deskew values for the selected channel are retained until you change the probe, you restore a saved setup, or you recall the factory setup.

Note: If you perform the de-embed settings of all oscilloscope input connected components, then the Attenuation settings should be left at default (0 dB).

ferent lengths. The

Running tests

Select tests, set acquisition parameters, set configuration parameters, set preferences parameters, and click Start to run the tests. While

tests are running, you cannot access the Setup or Reports panels. T Results panel.

While the tests are running, other applications may display windows in the background. The TekScope application takes precedence over other applications, but you can switch to other applications by using Alt + Tab key combination. To keep the TekExpress 400G-TXE application on top, select Keep On Top from the TekExpress Options menu.

The application displays report when the tests execution is complete.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 15

o monitor the test progress, switch between the Status panel and the

Setting up the test environment

Prerun checklist

1. Make sure that the instruments are warmed up (approximately 20 minutes) and stabilized.

2. Perform compensation: In the oscilloscope main menu, select Utilities > Instrument Compensation. Click Help in the compensation

window for steps to perform instrument compensation.

Equipment connection setup

Click Setup > T

Figure 3: Connection diagram for OIF (CEI-VSR at TP0a, CEI-MR, and CEI-LR) , IEEE (AUI at TP0a, TP0v, CR4, and KR4, and CR at TP2)

est Selection > Schematic to view the equipment setup diagram(s).

Figure 4: Connection diagram for OIF (CEI-VSR at TP1a) and IEEE (AUI at TP1a)

Setting up the test environment

Figure 5: Connection diagram for OIF (CEI-VSR at TP1a) and IEEE (AUI at TP1a) for Eye measurements

Figure 6: Connection diagram for OIF (CEI-VSR at TP4) and IEEE (AUI at TP4)

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 17

Setting up the test environment

Figure 7: Connection diagram OIF (CEI-VSR at TP4) and IEEE (AUI at TP4) for Eye measurements

Search instruments connected to the application

Use the T application uses TekVISA to discover the connected instruments.

To refresh the list of connected instruments:

1. Select Options > Instrument Control Settings.

2. In the Search Criteria section of the Instrument Control Settings dialog box, select the connection types of the instruments to

3. Click Refresh. The TekExpress application searches for the connected instruments.

ekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. The

Note: The instruments required for the test setup must be connected and detected by the application, before running the test.

search. Instrument search is based on the VISA layer USB. For example, if you choose LAN, the search will include all the instruments supported by the TekExpress that are communicating over the LAN.

Search status of the instruments connected to LAN

, but different connections determine the resource type, such as LAN, GPIB, and

Setting up the test environment

4. When the search is complete, a dialog box lists the instrument-related details based on the search criteria. For example, for the Search Criteria as GPIB, the application displays all the GPIB instruments connected to the application.

ekExpress Instrument Control Settings window.

The details of the instruments are displayed in the Retrieved Instruments table. The time and date of instrument refresh is displayed in the Last Updated field.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 19

Starting the application

To start the TekExpress 400G-TXE, select from the oscilloscope menu bar Applications > TekExpress 400G-TXE.

During start, a "My TekExpress" folder is created in the Documents folder of the current user and gets mapped to "X" drive. When the application is closed properly not found, the application runs an instrument discovery program to detect connected instruments before starting TekExpress 400G-TXE.

To keep the TekExpress 400G-TXE application on top of any application, select Keep On Top from the options menu. If the application goes behind the oscilloscope application, select Applications >TekExpress 400G-TXE to bring the application to the front.

, the "X" drive gets unmapped. Session files are then stored inside the X:\400G-TXE folder. If this file is

Application controls

This section describes the application controls with functionality and its details.

Table 5: Application control description

Item Description

Options menu Menu to display global application controls.

Starting the application

Test panel

Start / Stop button

Pause / Continue button

Clear button Use the Clear button to clear all existing measurement results. Adding or deleting a

Controls that open tabs for configuring test settings and options.

Use the Start button to start the test run of the measurements in the selected order acquired measurements are not cleared, then new measurements are added to the existing set. The button toggles to the Stop mode while tests are running. Use the Stop button to abort the test.

Use the Pause button to pause the acquisition. When a test is paused, this button changes as Continue.

measurement, or changing a configuration parameter of an existing measurement, also clears measurements. This is to prevent the accumulation of measurement statistics or sets of statistics that are not coherent. This button is available only on Results panel.

. If prior

Note: This button is visible only when there are results data on the panel.

Application window move icon Place the cursor over the top of the application window to move the application window to

the desired location

Minimize icon

Close icon Close the application.

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 21

Minimizes the application.

Starting the application

Item Description

Mini view / Normal view Mini view displays the run messages with the time stamp, progress bar, Start / Stop button,

and Pause / Continue button. The application moves to mini view when you click the Start button.

Options menu functions

o access the Options menu, click

in the upper-right corner of the application. It has the following selections:

Table 6: Options menu settings

Menu Function

Default Test Setup Opens a new test setup with default configurations.

Open Test Setup Opens a previously saved test setup. Displays the list of previously saved test setup file

names. Make the selection and click OK to open the test setup.

Save Test Setup Saves the current test configurations with the specified file name.

Save Test Setup As Saves the current test setup with a different file name or file type.

Open Recent Displays the recently opened test setup file names. Make the selection and click OK to

open the test setup.

Instrument Control Settings

Detects, lists, and refreshes the connected instruments found on the specified connections (LAN, GPIB, USB, Serial, Non-VISA Resources, T

ekLink, and VXI).

Keep On Top

Email Settings Configures email options for test run and result notifications.

Deskew Loads oscilloscope channel deskew settings into the application.

Help Displays the TekExpress 400G-TXE help.

Table continued…

Always keeps the TekExpress 400G-TXE application on top of all the applications.

Menu Function

About TekExpress

Displays the application name, version, and hyperlink to end the user license agreement.

Starting the application

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 23

Starting the application

Configure email settings

Use the Email Settings utility to get notified by email when a measurement completes or produces any error condition. Follow the steps to configure email settings:

Figure 8: Email settings window

1. Select Options > Email Settings to open the Email Settings dialog box.

2. (Required) For Recipient email Address(es), enter one or more recipient email addresses. To include multiple addresses, separate

the addresses with commas.

3. (Required) For Sender’s Address, enter the email address used by the instrument. This address consists of the instrument name,

followed by an underscore, followed by the instrument serial number, then the @ symbol, and the email server ID. For example: user@yourcompany.com.

4. (Required) In the Server Configuration section, type the SMTP Server address of the Mail server configured at the client location,

and the SMTP Port number, in the corresponding fields.

If this server requires password authentication, enter a valid login name, password, and host name in the corresponding fields.

Note: If any of the above required fields are left blank, the settings will not be saved, and email notifications will not be sent.

5. In the Email Attachments section, select from the following options:

• Reports: Select to receive the test report with the notification email.

• Status Log: Select to receive the test status log with the notification email. If you select this option, then also select whether you want to receive the full log or just the last 20 lines.

6. In the Email Configuration section:

•

Enter a maximum file size for the email message. Messages with attachments larger than this limit will not be sent. The default is 0 MB.

• Enter the number in the Number of Attempts to Send field, to limit the number of attempts that the system makes to send a notification. The default is 1. You can also specify a timeout period.

7. Select the Email Test Results When complete or on error check box. Use this check box to quickly enable or disable email notifications.

8. To test your email settings, click Test Email.

9. To apply your settings, click Apply.

10. Click Close when finished.

TekExpress instrument control settings

Starting the application

Use the T can use the Search Criteria options to search the connected instruments depending on the connection type. The details of the connected instrument is displayed in the Retrieved Instruments window.

To access, click Options > Instrument Control Settings. Select GPIB as search criteria for TekExpress application and click Refresh. The connected instruments displayed in the Retrieved Instruments window and can be selected for use under Global Settings in the test configuration section.

Figure 9: TekExpress Instrument Control Settings window

ekExpress Instrument Control Settings dialog box to search the instruments (resources) connected to the application. You

Setup panel: Configure the test setup

The Setup panel contains sequentially ordered tabs that help you guide through the test setup and execution process.

Setup panel: Configure the test setup

DUT: Set DUT settings

Use the DUT tab to select parameters for the device under test. These settings are global and apply to all tests of current session. DUT settings also af

fect the list of available tests in the Test Selection tab.

Figure 10: DUT tab

Click Setup > DUT to access the DUT parameters:

Table 7: DUT tab configuration

Setting Description

DUT ID

Comments icon (to the right of the DUT ID field)

Acquire live waveforms Acquire active signals from the DUT for measurement and analysis.

Use pre-recorded waveform files Run tests on a saved waveform. Select Options > Open Test Setup to

Mode

Standard

Table continued…

Adds an optional text label for the DUT to reports. The default value is DUT001. The maximum number of characters is 32.

ou cannot use the following characters in an ID name: (.,..,...,\,/:?”<>|*)

Opens Comments dialog box to enter text to add to the report. Maximum size is 256 characters. T test report, see Select report options.

recall a saved test setup.

• Compliance

• User Defined

• OIF-PAM4

o enable or disable comments appearing on the

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 27

Setup panel: Configure the test setup

Setting Description

• IEEE-802.3cd/bs

IEEE 802.3ck

•

Specification

Test Points

For OIF-PAM4 standard

•

CEI-VSR

• CEI-MR

• CEI-LR

For IEEE-802.3cd/bs standard

• AUI

• CR4

• KR4

For IEEE 802.3ckTM standard

• Version: IEEE 802.3ck

• Interface:

• AUI-C2C

• AUI-C2M Host

• AUI-C2M Module

• CR

For OIF-PAM4 standard

•

TP0a

• TP1a

• TP4

For IEEE-802.3cd/bs standard

• TP0a

• TP1a

• TP4

For IEEE 802.3ck standard

• Version: IEEE 802.3ck

• Interface:

• AUI-C2C

• AUI-C2M Host

• AUI-C2M Module

• CR

Specification Version Displays the specification version for the selected Specification and Test

Points.

Device Profile

DUT Type Select the DUT type

Table continued…

Setup panel: Configure the test setup

Setting Description

• 56G 112G

•

Symbol Rate Set the symbol rate to be tested.

Crosstalk Source Select crosstalk source when a cross talk generator is connected. This is

applicable for eye measurements only.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 29

Setup panel: Configure the test setup

Test Selection: Select the tests

Use the T

est Selection tab to select the tests. The test measurements available depends on the settings selected in the DUT tab.

Figure 11: Test selection tab

Table 8: Test Selection tab configuration

Setting Description

Tests Select or clear a test. Highlight a test to show details in the Test Description pane.

Test Description Shows brief description of the highlighted test in the Test field.

Deselect All Click to clear all tests.

Select All Click to select all tests. All tests are selected by default.

Schematic Click to display the schematic diagram of the DUT test setup for the selected test. Use the

diagram to verify the test setup before running the test.

Setup panel: Configure the test setup

Acquisitions: Set waveform acquisition settings

Use Acquisitions tab to view the test acquisition parameters. The contents displayed on this tab depends on the DUT type and the tests selected.

Figure 12: Acquisition tab

Note: 400G-TXE application acquires all waveforms needed by each test before performing the analysis.

Table 9: Acquisitions tab configuration

Setting Description

Connection Setup

Data +ve

Data -ve

Acquisition and Save Options All Waveforms are saved before analysis

TekExpress 400G-TXE application saves all acquisition waveforms to files by default. Waveforms are saved in a unique folder for each session (a session is started when you click the Start button). The folder path is X:\TekExpress 400G-TXE Session\<dutid>\<date>_<time>. Images created for each analysis, XML files with result values, reports, and other information specific to that particular execution are also saved in this folder.

Saving a session moves the session file contents from the Untitled Session folder to the specified folder name and changes the session name to the specified name.

Select the source channel for data positive.

Select the source channel for data negative.

\Untitled

The data sources must be either A

TI or non-ATI channels.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 31

Setup panel: Configure the test setup

400G TX CK Measurement waveform naming

When user captures the signals manually should be followed as per below table.

Note: Lane and Run details are must for all the measurement in waveform name.

Test Name Waveform Naming Convention Waveform Naming Example

C2C: Signal to AC Common mode

noise Ratio (SCMR)

C2C, C2M Host/Module, CR: Peakto-Peak AC-Common mode V

C2C, CR: Coefficient Range Input: 3 waveforms

oltage

, the naming convention and ordering to load the waveform to TekExpress Acquisition panel

Input: Two waveforms

Append 'Dif

Append 'LF'/'FB' DUT001_LF_Lane0_Run1.wfm

1. Append "PRESET", Lane and Run Details

2. Append C(-3), C(-2), C(-1), C(1), INCR, Lane

and Run details

3. Append C(-3), C(-2), C(-1), C(0), C(1), DECR, Lane and Run details

f'/'CommonMode'

• 1st waveform: SCMR_Acq_Dif

• 2nd waveform: SCMR_Acq_CommonModeLane0_Run1.wf m

1. PRESET_Lan0.wfm

2. C(-2)_INCR_Lane0.wfm

3. C(-2)_DECR_Lane0.wfm

fLane0_Run1.wfm

C2C: Normalized coefficient step size

C2M Host: Transition Time

C2M Module: Diff Peak to Peak

Output Voltage Tx Enabled

C2M Host: VEC,EH Inputs: 2 waveforms,

Table continued…

Input: 4 waveforms

1. Append “PRESET”, Lane Details

2. Append “INIT”, “ABS_COEFF_STEP_SIZE”,

Lan detail

3. Append “INCR”, “ABS_COEFF_STEP_SIZE”, Lan detail

4. Append “DECR”, “ABS_COEFF_STEP_SIZE”, Lan detail

Append 'Short’/ ‘Long’, Lane and Run details to the waveform name

• 1st waveform is Rough waveform and

• 2nd waveforms are Actual Waveform

1. PRESET_Lan0.wfm

2. TxOPWfm_INIT_ABS_COEFF_STEP_SIZE_

Lan0.wfm

3. TxOPWfm_INCR_ABS_COEFF_STEP_SIZE _Lan0.wfm

4. TxOPWfm_DECR_ABS_COEFF_STEP_SIZ E_Lan0.wfm

Short_Lane0_Run1.wfm, Long_Lane0_Run1.wfm

1. Dif

fTx_EH_VEC_Acq_Diff_Rough_AnalysisL

ane0_Run1.wfm

2. DiffTx_EH_VEC_Acq_Wfm1Lane0_Run1.wf m

Setup panel: Configure the test setup

Test Name Waveform Naming Convention Waveform Naming Example

C2M Module: Far End VEC, Far

End EH

These measurements have two modes Short and Long. If Both is selected, then user need to load Four waveforms in below order

• 1st waveform: Rough analysis Far End Short

• 2nd waveform: Far End Actual Short Waveform

• 3rd Waveform: Rough Analysis Far End Long

• 4th Waveform: Far End Actual Long Waveform

1. Dif

fTx_EH_VEC_Acq_Diff_Rough_Analysis_

FarEnd_Short_Lane0_Run1.wfm

2. DiffTx_EH_VEC_Acq_Wfm1_FarEnd_Short_ Lane0_Run1.wfm

3. DiffTx_EH_VEC_Acq_Diff_Rough_Analysis_ FarEnd_Long_Lane0_Run1.wfm

4. DiffTx_EH_VEC_Acq_Wfm1_FarEnd_Long_ Lane0_Run1.wfm

C2M Module: Near End VEC, Near End EH

CR: Coef

ficient Range

These measurements have two modes Short and Long. If Both is selected, then user need to load Four waveforms in below order

• 1st waveform: Rough analysis Near End Short

• 2nd waveform: Near End Actual Short Waveform

• 3rd Waveform: Rough Analysis Near End Long

• 4th Waveform: Near End Actual Long Waveform

Input: 2 waveforms,

1. Append “PRESET”, Lane and Run Details

2. Append C(-3), C(-1), C(0), C(1) , DECR,

Lane and Run details

3. Append C(-2), INCR, Lane and Run details

1. Dif

fTx_EH_VEC_Acq_Diff_Rough_Analysis_

NearEnd_Short_Lane0_Run1.wfm

2. DiffTx_EH_VEC_Acq_Wfm1_NearEnd_Short _Lane0_Run1.wfm

3. DiffTx_EH_VEC_Acq_Diff_Rough_Analysis_ NearEnd_Long_Lane0_Run1.wfm

4. DiffTx_EH_VEC_Acq_Wfm1_NearEnd_Long _Lane0_Run1.wfm

1. PRESET_Lan0.wfm,

2. C(-2)_INCR_Lane0.wfm,

3. C(-3)_DECR_Lane0.wfm

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 33

Setup panel: Configure the test setup

Configuration: Set measurement limits for tests

Use Configuration tab to view and configure the Global Settings and the measurement configurations. The measurement specific configurations available in this tab depends on the selections made in the DUT panel and T

Table 10: Configuration tab: Common parameters

Settings Description

Limit Editor

Displays the upper and lower limits for the applicable measurement using different types of comparisons.

est Selection panel.

Figure 13: Configuration tab: Global Settings

Table 11: Configuration tab: Global Settings configuration

Setting Description

Compliance Mode Select compliance mode. By default, Compliance Mode is selected.

User Defined Mode Select user defined mode

Table continued…

Setup panel: Configure the test setup

Setting Description

Global Settings

Instruments Detected

General Configuration

Bandwidth Select the bandwidth limit for the oscilloscope.

Scope Noise

De-embedding Filter Select to apply the de-embedding filter file for Data Positive and Data Negative.

Phase Inverted Filter for Data(using SDLA with dual input mode)

Data+ Click Browse and select the de-embedding filter file (.flt) for data positive signal.

Data- Click Browse and select the de-embedding filter file (.flt) for data negative signal.

Tx Output Waveform

Samples per Symbol (M)

Displays the instruments connected to this application. Click the instrument name to open a list of available (detected) instruments.

Select Options > Instrument Control Settings and click Refresh to update the instrument list.

erify that the GPIB search criteria (default) is selected in the Instrument Control

Note: V Settings.

Enter the scope noise in mV. Scope noise the standard deviation of the noise of the oscilloscope. Scope noise is important for many of the electrical measurements.

o ensure accurate measurement results, measure the scope noise manually and set the compensation value in the TekExpress. For more information on how to measure and apply scope noise, please refer PAM4 Analysis tool help document.

Select this option if the filter is created from SDLA using Dual input option. The negative channel filter must be phase inverted when you select this option.

Select the number of samples per symbol for calculating the Tx out waveform parameters.

If the acquired signal has less samples than specified, re-sampling is done to achieve the required samples per symbol. By default it is 32.

Linear Pulse Length (Np)

Linear Pulse Delay (Dp) (Dp<Np) Select the delay of the linear fit pulse.

Eye Configuration

Table continued…

Select the linear fit pulse curve length in Unit intervals (UI).

It is recommended to use higher value for better accuracy. The analysis time is more when you select higher value.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 35

Setup panel: Configure the test setup

Setting Description

CTLE Filter File Select the CTLE Filter File.

Compliance mode

All: Application will run through the CTLE filters.

•

• For TP1a: CTLE filters from 1 dB - 9dB in steps of 0.5 dB

• For TP4: For Near End, 1 dB, 1.5 dB, and 2 dB CTLE filters and for Far End, CTLE filters from 1 dB - 9 dB in steps of 0.5 dB

• Best CTLE: After the first run, if the eye measurements are passed, best CTLE filter option gets enabled. User can run the measurement with the Best CLTE instead of looping through all CTLE filters in the specification.

Target BER (1e-) /Target BER (10^-)

Note: For 1

User Defined mode

•

User can run the measurement with any specified CTLE filter. The application provides CTLE filters from 1 dB - 9 dB.

Select the CTLE filters from the drop-down list or Custom to browse and select the custom CTLE filter files. Custom CTLE filters (CSV) must contain the following data, delimited by comma:

CTLE peaking (dB): 1 to 9

Gain: 0.05 to 2

Poles and Zeros: 0.5 to 80

Example:

Select the Target BER (1e-). As per the compliance, Target BER should be set to 1e-5 and 1e-6 for IEEE and OIF standards respectively

If the Target BER is set to higher values, more time is required to analyse the data. You can select BER of 1e-5 for quicker analysis.

Select the Target BER (10^-). As per the compliance, Target BER values should be set to 4.00 to 6.00 for IEEE802.3ck standards respectively.

12G, CTLE filters from 1 dB - 13 dB in steps of 1 dB

//dB,gain,pole1,pole2,pole3,zero1,zero2 1,0.8913,18.6,14.1,1.2,8.359,1.2

Mask Width Select the mask width in Unit intervals (UI). This configuration is for Eye symmetry mask width

measurement only.

Setup panel: Configure the test setup

Preferences: Set the test run preferences

Use Preferences tab to set the application action on completion of a measurement. The Preferences tab has the feature to enable or disable certain options related to the measurement execution.

Figure 14: Preferences tab

Refer the below table for the options available in the Preferences tab:

Table 12: Preferences tab settings

Setting Description

Number of Runs

Acquire/Analyze each test <no> times (not applicable to Custom T

ests)

Deskew

Show alert when new deskew values are configured on TekScope

Popup Settings

Auto close Warnings and informations during Sequencing

Auto close after <no> seconds

Auto close Error Messages during Sequencing. Show in Reports

Auto close after <no> seconds

Select to repeat the test run by setting the number of times. By default, the check box is enabled.

Select to close the warnings and information window automatically after the specified amount of time.

Specify the time in seconds using the edit box.

Select to close the error message window automatically after the specified amount of time.

Specify the time in seconds using the edit box.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 37

Status panel: View the test execution status

The Status panel contains the Test Status and Log View tabs, which provides status on the test acquisition and analysis (Test Status) and listing of test tasks performed (Log View tab). The application opens the Test Status tab when you start to execute the test. Select the

Test Status or the Log View tab to view these items while the test execution is in progress.

View test execution status

The tests are grouped and displayed based on the Clock and Data lane. It displays the tests along with the acquisition type, acquire, and analysis status of the tests. In pre-recorded mode, Acquire Status is not valid.

The Test Status tab presents a collapsible table with information about each test as it is running. Use the symbols to expand ( collapse ( ) the table rows.

) and

Figure 15: Test execution status view in Status panel

Table 13: Test execution status table headers

Control Description

Test Name Displays the measurement name.

Acquisition Describes the type of data being acquired.

Acquire Status Displays the progress state of the acquisition:

•

To be started

• Started Acquisition

• Completed Acquisition

Table continued…

Status panel: View the test execution status

Control Description

Analysis Status Displays the progress state of the analysis:

To be started

•

• In Progress

• Completed

• Aborted

View test execution logs

est Status tab displays the detailed execution status of the tests. Also, displays each and every execution step in detail with its

The T timestamp information. The log details can be used to troubleshoot and resolve any issue/bug which is blocking the test execution process.

Figure 16: Log view in Status panel

Table 14: Status panel settings

Control Description

Message History Lists all the executed test operations and timestamp information.

Auto Scroll

Clear Log Clears all the messages from the log view.

Save

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 39

Enables automatic scrolling of the log view as information is added to the log during the test execution.

Saves the log file into a text file format. Use the standard Save File window to navigate to and specify the folder and file name to save the log text.

Results panel: View summary of test results

When a test execution is complete, the application automatically opens the Results panel to display a summary of test results.

In the Results table, each test result occupies a row. By default, results are displayed in summary format with the measurement details collapsed and with the Pass/Fail column visible.

Figure 17: Results panel with measurement results

Click icon on each measurement in the row to expand and to display the minimum and maximum parameter values of the measurement.

Filter the test results

Each column in the result table can be customized and displayed by enabling or disabling any column as per your requirement. Y change the view in the following ways:

• To remove or restore the Pass/Fail column, select Preferences > Show Pass/Fail.

• To collapse all expanded tests, select Preferences > View Results Summary.

• To expand all the listed tests, select View Results Details from the Preferences menu in the upper right corner.

• To enable or disable the wordwrap feature, select Preferences > Enable Wordwrap.

• To view the results grouped by lane or test, select the corresponding item from the Preferences menu.

• To expand the width of a column, place the cursor over the vertical line that separates the column from the column to the right. When the cursor changes to a double-ended arrow, hold down the mouse button and drag the column to the desired width.

• To clear all test results displayed, click Clear.

ou can

Reports panel: Configure report generation settings

Click Reports panel to configure the report generation settings and select the test result information to include in the report. You can use the Reports panel to configure report generation settings, select test content to include in reports, generate the report, view the report, browse for reports, name and save reports, and select report viewing options.

Report configuration settings

The Configuration tab describes the report generation settings to configure the Reports panel. Select report settings before running a test or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 18: Report panel- Configuration tab

Table 15: Report configuration panel settings

Control Description

View Click to view the most current report.

Generate Generates a new report based on the current analysis results.

Save As Specify a name for the report.

Report Update Mode Settings

Generate new report Each time when you click Run and when the test execution is complete, it will create a new

report. The report can be in either .mht, .pdf, or .csv file formats.

Append with previous run session Appends the latest test results to the end of the current test results report. Each time when

you click this option and run the tests, it will run the previously failed tests and replace the failed test result with the new pass test result in the same report.

Include header in appended reports Select to include header in appended reports.

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 41

Reports panel: Configure report generation settings

Control Description

Replace current test results Replaces the previous test results with the latest test results. Results from newly added

tests are appended to the end of the report.

In previous run, current session

In any run, any session Select to replace current test results in the report with the test result(s) in the selected run

Report Creation Settings

Report name

Select to replace current test results in the report with the test result(s) of previous run in the current session.

s report. Click and select test result of any other run session.

session’

Displays the name and path of the <Application Name> report. The default location is at \My Documents>\My TekExpress\<Application Name>\Reports. The report file in this folder gets overwritten each time you run a test unless you specify a unique name or select to auto increment the report name.

To change the report name or location, do one of the following:

• In the Report Path field, type the current folder path and name.

• Double-click in the Report Path field and then make selections from the popup keyboard and click Enter.

Be sure to include the entire folder path, the file name, and the file extension. For example: C:\Documents and Settings\your user name\My Documents\My TekExpress\<Application Name> \DUT001.mht.

Save as type

Auto increment report name if duplicate

Create report automatically at the end of the run

View report after generating

Note: Y

ou cannot set the file location using the Browse button.

Open an existing report

Click Browse, locate and select the report file and then click V panel.

Saves a report in the specified file type, selected from the drop-down list. The report is saved in .csv, .pdf, or .mht.

Note:

If you select a file type dif name extension in the Report Name field to match.

Sets the application to automatically increment the name of the report file if the application finds a file with the same name as the one being generated. For example: DUT001, DUT002, DUT003. This option is enabled by default.

Select to create the report with the settings configured, at the end of run.

Automatically opens the report in a Web browser when the test execution is complete. This option is selected by default.

ferent from the default, be sure to change the report file

iew at the bottom of the

Reports panel: Configure report generation settings

Configure report view settings

iew Settings tab describes the report view settings to configure the Reports panel. Select report view settings before running a test

The V or when creating and saving test setups. Report settings configured are included in saved test setups.

Figure 19: Report panel-View settings tab

Table 16: Report panel view settings

Control Description

Include setup configuration Sets the application to include hardware and software information in the summary box

at the top of the report. Information includes: the oscilloscope model and serial number the oscilloscope firmware version, and software versions for applications used in the measurements.

Group Report By

Test Name Select to group the test results based on the test name in the report..

Test Result Select to group the test results based on the test result in the report.

Include user logo Select to add your logo in the generated report. When selected, specify the logo file path in

the Image file path option. Click browse and select the logo image.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 43

Reports panel: Configure report generation settings

View a generated report

Sample report and its contents

A report shows detailed results and plots, as set in the Reports panel.

Figure 20: Report

Setup Information The summary box at the beginning of the report lists setup configuration information. This information

includes the oscilloscope model and serial number version numbers of all associated applications.

Test Name Summary Table The test summary table lists all the tests which are executed with its result status.

Measurement The measurement table displays the measurement related details with its parameter value.

User comments If you had selected to include comments in the test report, any comments you added in the DUT tab are

shown at the top of the report.

, optical module model and serial number, and software

Saving and recalling test setup

Overview

ou can save the test setup and recall it later for further analysis. Saved setup includes the selected oscilloscope, general parameters,

Y acquisition parameters, measurement limits, waveforms (if applicable), and other configuration settings. The setup files are saved under the setup name at X:\TekExpress 400G-TXE

Figure 21: Example of Test Setup File

Use test setups to:

Recall a saved configuration.

•

• Run a new session or acquire live waveforms.

• Create a new test setup using an existing one.

• View all the information associated with a saved test, including the log file, the history of the test status as it executed, and the results summary.

• Run a saved test using saved waveforms.

Note: Images that are shown in this Saving and recalling test setup chapter are for illustration purpose only and it may vary depending on the T

ekExpress application.

Save the configured test setup

ou can save a test setup before or after running a test. You can create a test setup from already created test setup or using a default

Y test setup. When you save a setup, all the parameters, measurement limits, waveform files (if applicable), test selections, and other configuration settings are saved under the setup name. When you select the default test setup, the parameters are set to the application’s default value.

• Select Options > Save Test Setup to save the opened setup.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 45

Saving and recalling test setup

• Select Options > Save T

est Setup As to save the setup with different name.

Load a saved test setup

o open (load) a saved test setup, do the following:

• Select Options > Open Test Setup.

• From the File Open menu, select the setup file name from the list and click Open.

Saving and recalling test setup

Note: Parameters that are set for the respective test setup will enable after opening the file.

Perform a test using pre-run session files

Complete the following steps to load a test setup from a pre-run session:

1. Select Options > Open T

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 47

est Setup.

Saving and recalling test setup

2. From the File Open menu, select a setup from the list and then click Open.

Note: Parameters that are set for the respective test setup will enable after opening the file.

3. Switch the mode to Use Pre-recorded waveform files in the DUT panel.

Saving and recalling test setup

4. Select the required waveforms from the selected setup in the Acquisitions tab and click Start.

5. The selected waveform file can be removed/replaced by clicking on the ( ) icon.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 49

Saving and recalling test setup

6. After successful completion of the test, the waveform report files are stored at X:\<Application Name>\Reports.

7. The overall test result status after completion of the test execution is displayed in the Results Panel.

Save the test setup with a different name

o save a test setup with a different name, follow the steps:

1. Select Options > Save Test Setup As.

Saving and recalling test setup

2. Enter the new test setup name and click Save.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 51

400G-TXE compliance measurements

DC common mode output voltage

This section verifies that the DC common mode output voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR, Table

16-10

OIF-CEI-VSR, Table 16-1 TP1a -0.3 V 2.8 V

OIF-CEI-VSR, Table 16-4 TP4 -0.35 V 2.85 V

OIF-CEI-MR, Table 17-2 Testpoint-T 0 V 1.9 V

OIF-CEI-LR, Table 21-2 Testpoint-T 0 V 1.9 V

IEEE-PAM4

AUI-IEEE802.3bs, Annex 120D.3.1

CR4-IEEE802.3cd Section 136.9.3

TP0a -0.3 V 2.8 V

TP1a -0.35 V 2.85 V

TP4 0 V 1.9 V

TP2 0 V 1.9 V

KR4-IEEE802.3cd Section

137.9.2

AUI-C2C. IEEE 802.3ck, Annex 120F 120F-1

AUI-C2M Host. IEEE

802.3ck Annex 120G.3.1, Table 120G-1

AUI-C2M Module. IEEE

802.3ck Annex 120G.3.2, Table 120G-3

CR. IEEE802.3ck Section

162.9.4, Table 162-11

Measurement procedure

Maximum input to be provided to the A measured using ATI channels. Measure the voltage using an external digital multimeter and enter the value in the application.

.3.1, Table

TI channels is ≤ 300 mV peak-to-peak. The DC common mode voltage of the signal cannot be

TP0a 0 V 1.9 V

TP0v 0.2 V 1 V

TP1a -0.3 V 2.8 V

TP4 -0.35 V 2.85 V

TP2 NA 1.9 V

AC Common Mode Output Voltage

This section verifies that the common mode noise of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR, Table

16-10

OIF-CEI-VSR, Table 16-1 TP1a NA 17.5 mV

OIF-CEI-VSR, Table 16-4 TP4 NA 17.5 mV

OIF-CEI-MR, Table 17-2 Testpoint-T NA 30 mV

OIF-CEI-LR, Table 21-2 Testpoint-T NA 30 mV

IEEE-PAM4 AUI-IEEE802.3bs, Annex

120D.3.1

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section

137.9.2

AUI-C2C. IEEE 802.3ck, Annex 120F 120F-1

.3.1, Table

TP0a NA 12 mV

TP0a NA 30 mV

TP1a NA 17.5 mV

TP4 NA 17.5 mV

TP2 NA 30 mV

TP0a NA 30 mV

TP0v 0.2 V 1 V

400G-TXE compliance measurements

Input

Positive and negative signals from the oscilloscope by setting the bandwidth to 40 GHz

Measurement procedure

The common mode voltage is a measure of the deviation of the common mode signal around the mean value. Find the sum of the positive and negative signals to create the common mode signal and create a vertical histogram on this signal. The RMS value of the vertical histogram is the AC common mode output voltage.

o find the effective common mode voltage after removing the instrumentation noise, use the following formula:

Single-ended output voltage

This section verifies that the single-ended output voltage of the data positive and data negative signals of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements

Equipment connection diagram

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 53

400G-TXE compliance measurements

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR, Table 17-2 Testpoint-T -0.3 V 1.9 V

OIF-CEI-LR, Table 21-2 Testpoint-T -0.3 V 1.9 V

IEEE802.3bs AUI-IEEE802.3bs, Annex

120D.3.1

IEEE 802.3ck AUI-C2M Host. IEEE

802.3ck Annex 120G.3.1, able 120G-1

Input

Data positive and data negative signals

Measurement procedure

The single-ended output voltage is the measure of maximum and minimum values of the single-ended signals. Since the voltage levels can go beyond the 300 mV peak-to-peak, this measurement cannot be done using the A eliminate the DC content present in the signal and then measure the maximum and minimum values of the positive and negative signals.

Effective Data Positive Max voltage = DC Common Mode + Data Positive Max

TP1a -0.4 V 3.3 V

TI channels of the oscilloscope. Connect a DC block to

Effective Data Positive Max voltage = DC Common Mode + Data Positive Min

Note: DC Common Mode measurement is pre-requisite for this measurement and you will be prompted to measure DC voltage using external multimeter

Diff peak to peak output voltage Tx enabled

This section verifies that the dif

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR, Table

Table continued…

ferential peak-to-peak voltage of the DUT is within the conformable limits according to the specification.

Min Max

TP0a 750 mV NA

16-10

OIF-CEI-VSR, Table 16-1 TP1a NA 880 mV

OIF-CEI-VSR, Table 16-4 TP4 NA 900 mV

OIF-CEI-MR, Table 17-2 Testpoint-T NA 1200 mV

OIF-CEI-LR, Table 21-2 Testpoint-T NA 1200 mV

Standard Specification Test Points Limits

Min Max

IEEE-PAM4

AUI-IEEE802.3bs, Annex 120D.3.1

CR4-IEEE802.3cd Section 136.9.3

TP0a NA 1200 mV

TP1a NA 880 mV

TP4 NA 900 mV

TP2 NA 1200 mV

400G-TXE compliance measurements

KR4-IEEE802.3cd Section

137.9.2

AUI-C2C. IEEE 802.3ck Annex 120F 120F-1

AUI-C2M Host. IEEE

802.3ck Annex 120G.3.1,

Table 120G-1

AUI-C2M Module. IEEE

802.3ck Annex 120G.3.2,

Table 120G-3

CR.IEEE 802.3ck Section

162.9.2, Table 162-11

Input

QPRBS13-CEI or any valid signal filtered through a fourth order Bessel Thomson filter

Measurement procedure

The differential peak-to-peak voltage is the peak-to-peak value of the signal acquired using a base oscilloscope.

.3.1, Table

TP0a NA 1200 mV

TP0v NA 1200 mV

TP1a NA 750 mV

TP4 NA

TP2 NA 1200 mV

Diff peak to peak output voltage Tx disabled

• 600 mV(Short mode)

• 845 mV (Long mode)

This section verifies that the differential peak-to-peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 55

400G-TXE compliance measurements

Standard Specification Test Points Limits

Min Max

IEEE-PAM4 AUI-IEEE802.3bs, Annex

120D.3.1

CR4-IEEE802.3cd Section 136.9.3

TP1a NA 30 mV

TP0a NA 35 mV

TP2 NA 30 mV

KR4-IEEE802.3cd Section

137.9.2

AUI-C2C. IEEE 802.3ck, Annex 120F 120F-1

AUI-C2M Host. IEEE

802.3ck, Annex 120G.3.1,

Table 120G-1

CR.IEEE 802.3ck Section

162.9.2, Table 162-11

Input

Noise signal captured when the DUT is disabled (without applying filters)

Measurement procedure

1. Capture the dif

2. Select the oscilloscope free run mode option.

3. In oscilloscopes menu, select Measure > Amplitude and select peak-to-peak measurement.

4. V

alue of Peak-Peak measurement is reported as the differential peak-to-peak output voltage.

ferential noise using Math1 as source (without applying filters). Math1 = (Data positive – Data negative)

Note: For IEEE 802.3ck, Capture the dif negative), Arbflt1 – Bessel Thomson Filter

.3.1, Table

TP0a NA 30 mV

TP0v NA 35 mV

TP1a NA 35 mV

TP2 NA 30 mV

ferential noise using Math1 as Source , Math1 = Arnflt1 (Data positive – Data

Transition time

This section verifies that the transition time of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR, Table

16-10

OIF-CEI-VSR, Table 16-1 TP1a 12 ps NA

OIF-CEI-VSR, Table 16-4 TP4 9.5 ps NA

Table continued…

TP0a 7.5 ps NA

Standard Specification Test Points Limits

Min Max

IEEE802.3bs AUI-IEEE802.3bs, Annex

120D.3.1

AUI-IEEE802.3bs, Annex 120D.3.1

IEEE 802.3ck AUI-C2M Host. Annex

120G.3.1, T

able 120G-1

TP1a 10 ps NA

TP4 9.5 ps NA

TP1a

• 10 ps (Short mode)

• 15 ps (Long mode)

400G-TXE compliance measurements

AUI-C2M Module. Annex 120G.3.2, Table 120G-3

Input

QPRBS13-CEI test pattern or any valid signal filtered through a fourth order Bessel Thomson filter

Measurement procedure

Transition time (rise and fall) are defined as the time between the 20% and 80% times, or 80% and 20% times, respectively, of isolated -1 to +1 or +1 to -1 PAM4 edges. Using the QPRBS13-CEI test pattern, the transitions within sequences of three -1s followed by three +1s, and three +1s followed by three -1s, respectively, are measured. These are PAM4 symbols 1820 to 1825 and 2086 to 2091, respectively, where symbols 1 to 7 are the run of seven +1’s. In this case, the 0% level and 100% level may be estimated as the average signal within windows from -1.5 UI to -1 UI and from 1.5 UI to 2 UI relative to the edge.

TekExpress 400G-TXE application captures sufficient record length and uses PAM4 utility to perform this measurement.

TP4 8.5 ps NA

Eye width, VEC (Vertical Eye Closure), Eye height, Eye linearity, and Eye symmetry mask width

This section verifies that the Eye width, VEC (Vertical Eye Closure), Eye height, Eye linearity, and Eye symmetry mask width of the DUT are within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 57

400G-TXE compliance measurements

Standard Measurement Specification Test Points Limits

Min Max

OIF-PAM4 Eye Width OIF-CEI-VSR,

able 16-1

Eye Height 35 mV NA

Eye Linearity 0.85 NA

Eye Symmetry Mask Width

Near End Eye Width OIF-CEI-VSR,

Near End Eye Height 70 mV NA

Near End Eye Linearity 0.85 NA

Far End Eye Width 0.2 UI NA

Far End Eye Height 70 mV NA

Eye Symmetry Mask Width

IEEE-PAM4 Eye Symmetry Mask

Width

Eye Height 32 mV NA

Near End Eye Symmetry Mask Width

Near End Eye Height 70 mV NA

Far End Eye Symmetry Mask Width

Far End Eye Height 30 mV NA

Eye height AUI-C2M Host.

Vertical Eye closure NA 12 dB

Near end Eye height AUI-C2M

Far end Eye height

Near end Vertical Eye closure

Far end Vertical Eye closure

Table 16-4

AUIIEEE802.3bs

IEEE 802.3ck Annex 120G.3.1, Table 120G-1

Module. IEEE

802.3ck Annex 120G.3.2, Table 120G-3

TP1a 0.2 UI NA

EW6 NA

TP4 0.265 UI NA

EW6 NA

TP1a 0.2 UI NA

TP4 0.265 UI NA

0.2 UI NA

TP1a 10 mV NA

TP4 15 mV NA

NA 12 dB

Input

ferential signal filtered through fourth order Bessel Thomson filter (with appropriate bandwidth) in concatenation with a Continuous Time

Dif Linear Equalizer (CTLE).

In case of AUI-IEEE802.ck, The Eye-opening parameters Eye height and VEC are measured with the effect of a reference receiver (Butterworth filter) which includes receiver input referred noise, a continuous-time filter and DFE (4th Order) as per the specification.

Cross talk calibration

Calibrate the co-propagating signals (signal on the other lanes) as per the specification, before performing the Eye measurements.

400G-TXE compliance measurements

If you want to run with cross talk source, select Crosstalk Source from the DUT panel. By default, this option is unselected and application will provide normal connection diagram procedure.

Eye measurements are done after passing the signal through a reference receiver which includes a fourth order Bessel Thomson filter (in case of IEEE802.3ck Eye measurement, receiver Butterworth filter is used) with appropriate bandwidth cutof time linear equalizer (CTLE filter). It is recommended to use PRBS13Q pattern for this measurement.

f and a selectable continuous

Note: For 1 and CTLE filters

CTLE filters are selected as per the below table:

12G-VSR Eye measurements, signal will be passed through additional five tap FFE equalizer after Bessel Thomson

Table 17: CTLE filters selection table

Specification Test point CTLE filters

CEI-56G-VSR At Host output TP1a 1 dB - 9 dB

At Module output TP4 (Near End) 1 dB - 2 dB

At CEI-VSR Module output TP4 (Far End) 1 dB - 9 dB

CEI-112G-VSR At Host output TP1a, TP4 1 dB - 13 dB

200/400GAUI-4/8 At Host output TP1a 1 dB - 9 dB

At Module output TP4 (Near End) 1 dB - 3 dB

At Module output TP4 (Near End) 1 dB - 9 dB

Table 18: CTLE filters selection table for IEEE802.3ck AUI

Parameter Symbol Value(dB)

Continuous time filter, DC gain for TP1a

Range for gDC2 = 0

Range for –1 ≤ gDC2 < 0 –2 to –11

Range for –2 ≤ gDC2 < –1 –4 to –10

Range for –3 ≤ gDC2 < –2 –4 to –9

Step size 1.0

Continuous time filter, DC gain 2 for TP1a

Range

Step size 0.5

Continuous time filter, DC gain for TP4 near-end

Range

Step size 1.0

Continuous time filter, DC gain 2 for TP4 near-end

Range

Step size 0.5

Table continued…

gDC

gDC2

gDC

gDC2

–2 to –9

–3 to 0

–5 to –1

–2 to 0

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 59

400G-TXE compliance measurements

Parameter Symbol Value(dB)

Continuous time filter, DC gain for TP4 far-end

Range

gDC

Step size 1.0

Continuous time filter, DC gain 2 for TP4 far-end

Range

gDC2

Step size 0.5

TekExpress uses PAM4/PAMJET utility to perform this measurement. Details about measuring Eye width and Eye height from the equalized signal is explained in OIF-CEI-56G-VSR and IEEE802.3bs specifications.

At module output, the Eye measurements is divided into 2 types:

1. Near End Eye measurements

2. Far End Eye measurements

Near End Eye width, VEC and Eye height are same as Eye width and Eye height measurements. Whereas far end Eye width and Eye height measurements are done with an emulated loss channel.

Steps to find the best CTLE filter:

–9 to –2

–3 to –1

1. Best CTLE filter is the one which gives maximum Eye area (EW*EH) and it passes corresponding Eye parameters.

2. In case of OIF standard, best CTLE filter is the one which gives passing result for Eye width, Eye height and Eye linearity

3. In case of IEEE standard, best CTLE filter is the one which gives maximum Margin from Limit for VEC and EH

For IEEE802.3ck Eye measure to find the Best CTLE there is two configuration in Application

• Rapid

• Exhaustive

Rapid approach finds the optimized and faster way to reach to best CTLE. Where exhaustive simply run each CTLE form list of individual and get the Best out of it. User can go the configuration tab and check the Best CTLE to run for next run.

Note: Eye measurement for IEEE802.3ck also use the below configuration as per specification.

400G-TXE compliance measurements

Figure 22: Gaussian weighting window with +/- 0.05 UI has been configure to compute the Eye parameters.

Figure 23: Effect of a reference receiver as per IEEE802.3ck Annex 129G.5 using the configured CTLE and Rx filters ( Butterworth filter).

Measurement procedure:

1. Acquire the signal (record length depends on the symbol rate).

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 61

400G-TXE compliance measurements

2. Calculate Eye measurements (Eye width, Eye height and Eye linearity if required) for all CTLE filters at BER of 1e-5.

3. Calculate the Eye Area (EW*EH), select the CTLE with maximum Eye area and passing Eye parameter limits of spec as reference

CTLE filter for analysis.

4. Use the reference filter and measure the Eye parameters configured at BER as per specification (By default for OIF:1e-6 and for IEEE:1e-5 BER is used).

Eye symmetry mask width (ESMW)

An Eye mask of width as per the specification is drawn on the top of Eye diagram. All the three Eyes have to open beyond the mask drawn which will make the test pass.

Procedure to perform ESMW

1. Use the reference CTLE filter for analysis. Horizontal mid-point of Eye diagram (Tmid) is queried from the PAM4 utility.

2. Mask width has to be read from UI.

3. Mask_Left = Tmid - Mask_Width/2 and Mask_Right = Tmid + Mask_Width/2

4. Test is pass if all 3 Eyes extend beyond the Eye width mask, else test is fail.

5. Query Hupp_Left and Hupp_Right values from the PAM4 utility which correspond to the left and right Eye boundaries for Upper Eye.

6. If (Mask_left>=Hupp_Left and Mask_Right<=Hupp_Right) then pass, otherwise fail

7. Repeat steps 5 on page 62 and 6 on page 62 for middle and Lower Eyes. For middle eye, query Hmid_Left and Hmid_Right. Also for

Lower Eye, query Hlow_left and Hlow_right

Signal-to-noise and distortion ratio

This section verifies that the signal-to-noise and distortion ratio (SNDR) of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-VSR, Table

16-10

OIF-CEI-MR, Table 17-2 Testpoint-T 31 dB NA

OIF-CEI-LR, Table 21-2 Testpoint-T 31 dB NA

IEEE-PAM4

AUI-IEEE802.3bs, Annex 120D.3.1

TP0a 31 dB NA

400G-TXE compliance measurements

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section

137.9.2

AUI-C2C. IEE 802.3ck, Annex 120F 120F-1

CR. IEEE 802.3ck Section

162.9.4, Table 162-11

Input

ferential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth

Dif

Measurement procedure

Signal-to-noise and distortion ratio is measured using the following formula:

.3.1, Table

TP2 33.3 dB NA

TP0a 32.5 dB NA

TP0v 32.5 dB NA

TP2 31.5 dB NA

Where,

is the linear fit pulse peak

max

σe - RMS error

σn – Standard deviation of noise

Pre-cursor and post-cursor equalization ratio

This section verifies that the pre-cursor and post-cursor equalization ratio of the Device Under Test (DUT) is within conformance limits as given in IEEE802.3 200GAUI-4/400GAUI-8 specification at test point TP0a, Table 120D-1, Section 120D.3.1.5.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 63

400G-TXE compliance measurements

Standard Specification Test Points

IEEE-PAM4

Measurement procedure

1. Set the DUT in PRESET state and find the Linear fit pulse response.

2. For pre-cursor test, prompt the user to vary the Local_eq_cm1 value from 0 to 3 and each time find the equalizer coef

C(0) and C(1) value using PRESET linear fit curve and linear fit of each state of Local_eq_cm1.

3. Find the pre-cursor equalization ratio using below formula:

ary the Local_eq_c1 value from 0 to 5 and each time find the equalizer coefficients C(-1), C(0) and C(1) value using PRESET Linear

4. V fit curve and Linear fit of each state of Local_eq_c1.

5. Find the Post-cursor equalization ratio using below formula:

Limits

AUI-IEEE802.3bs, Annex 120D.3.1

TP0a

ficients C(-1),

Pre-cursor equalization ratio for each state of Local_eq_cm1 are the following:

Local_eq_cm1 value

0 0±0.04

1 -0.05±0.04

2 -0.1±0.04

3 -0.15±0.04

Pre-cursor equalization ratio for each state of Local_eq_c1 are the following:

Local_eq_c1 value

0 0±0.04

1 -0.05±0.04

2 -0.1±0.04

3 -0.15±0.04

4 -0.2±0.04

5 -0.25±0.04

Coefficient range (OIF)

This section verifies that the coef

Required test equipment

Minimum system requirements on page 12

ficient range of the DUT is within the conformable limits according to the specification.

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR, Table

17-2

Testpoint-T C(-1) -15% 0%

C(0) 60% 100%

C(1) -25% 0%

OIF-CEI-LR, Table 21-2

Testpoint-T C(-2) 0% 10%

C(-1) -28% 0%

C(0) 60% 100%

C(1) -28% 0%

Measurement procedure

400G-TXE compliance measurements

1. Acquire the PRESET signal. Export the linear fit impulse response curve from P

AM4 utility.

2. Increment a coefficient (C(-2), C(-1), C(0) or C(1)) such that it reaches its maximum value and keep all other coefficients in hold state. Export the Linear fit impulse response from PAM4 utility 2.

3. Find the equalizer coefficients using PRESET and incremented linear fit pulses.

4. Similarly ask the user to sufficiently decrement the equalizer coefficient (C(-1), C(0) and C(1)) one by one such that it reaches its

minimum value. Capture the waveform and find the linear fit pulse from the PAM4 utility 3.

5. Find the equalizer coefficients using PRESET and decremented linear fit pulses.

6. Verify that each transmitter equalizer coefficient is within the minimum and maximum range of specification.

Coefficient range (IEEE)

This section verifies that the coefficient range of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Increment each coef

ficient individually to reach its maximum value. You must reconfigure the coefficient to its original value before

incrementing another coefficient.

Decrement each coefficient individually to reach its maximum value. You must reconfigure the coefficient to its original value before decrementing another coefficient.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 65

400G-TXE compliance measurements

Standard Specification Test Points Limits

Min Max

IEEE-PAM4

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section 137.9.2

AUI-C2C. IEEE

802.3ck, Annex .3.1, Table

120F 120F-1

CR.IEEE 802.3ck Section 162.9, Table 162-11

TP2 C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

TP0a C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

TP0v C(-3) decrement NA =<-0.05

C(-3) increment 0>= NA

C(-2) decrement NA <=0.0

C(-2) increment >=0.1 NA

C(-1) decrement NA <=-0.3

C(-1) increment >=0.0 NA

C(0) decrement NA =<0.5

C(1) decrement NA =<-0.1

C(1) increment >=0.0 NA

TP2 C(-3) decrement NA <= - 0.06

C(-2) decrement >= 0.12 NA

C(-1) decrement NA <= - 0.34

C(0) decrement NA <= - 0.5

C(1) decrement NA <= - 0.2

Measurement procedure

1. Range for C(1) or value at minimum state for C(1): with C(-2) and C(-1) both set to zero and both C(0) and C(1) having received

ficient “decrement” requests so that they are at their respective minimum values, C(1) shall be less than or equal to -0.25

suf

2. Range for C(-1) or value at minimum state for C(-1): with C(-2) and C(1) set to zero and both C(-1) and C(0) having received sufficient “decrement” requests so that they are at their respective minimum values, C(-1) shall be less than or equal to -0.25

3. Range for C(-2) or value at maximum state for C(-2): with C(-1) and C(1) set to zero, C(0) having received sufficient “decrement” requests so that it is at its minimum value, and C(-2) having received sufficient “increment” requests so that it is at its maximum value, C(-2) shall be greater than or equal to 0.1

Measurement procedure for IEEE 802.3ck

1. Range for C(1) or value at minimum state for C(1): With C(-3), C(-2), and C(-1) set to zero and both C(0) and C(1) having received

sufficient "increment" or “decrement” requests so that they are at their respective maximum or minimum values.

2. Range for C(0) or value at minimum state for C(0): With C(-3), C(-2), C(-1), and C(1) set to zero and having received sufficient “decrement” requests so that it is at its minimum value.

3. Range for C(-1) or value at minimum state for C(-1): with C(-3), C(-2), and C(1) set to zero and both C(-1) and C(0) having received sufficient "increment" or “decrement” requests so that they are at their respective maximum or minimum values.

4. Range for C(-2) or value at maximum state for C(-2): With C(-3), C(-1), and C(1) set to zero, C(0) having received sufficient "increment" or "decrement" requests so that it is at its maximum value, and C(-2) having received sufficient "increment" or "decrement" requests so that it is at its maximum or minimum value.

400G-TXE compliance measurements

5. Range for C(-3) or value at minimum state for C(-3): With C(-2), C(-1), and C(1) set to zero and both C(-3) and C(0) having received

ficient "increment" or “decrement” requests so that they are at their respective maximum or minimum values.

suf

Far end pre-cursor ISI ratio

This section verifies that the far end pre-cursor ISI ratio of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section 137.9.2

TP2 C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

TP0a C(-2) 0.1 NA

C(-1) NA -0.25

C(1) NA -0.25

Measurement procedure

1. Apply the CTLE filter which produces the optimal eye opening and export the linear fit pulse from the P

2. Using linear fit impulse, measure the far end pre-cursor ratio:

Far End Pre-cursor ratio = Ppre/Pmax

Where,

Ppre is the value of linear fit pulse 1 UI prior to the time of the pulse peak

Pmax is the peak amplitude of the linear fit pulse

AM4 utility.

Transmitter output residual ISI

This section verifies that the maximum value of transmitter output residual ISI of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4

AUI-IEEE802.3bs, Annex 120D.3.1

TP0a 34.8 dB NA

Measurement procedure

1. Acquire the signal and export the linear fit pulse using P

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 67

AM4 utility.

400G-TXE compliance measurements

2. Perform single sequence in P

3. Using Linear fit pulse, calculate the SNR-ISI value using below equation:

ISI cursors are calculated using below equation:

Where,

tp is the index of the linear fit pulse where p(tp) = pmax

M is the oversampling ratio of the measured waveform and linear fit pulse

Np is the linear fit pulse length

Nb is given in Table 120D–8

For UAI-4 at TP0a, Equalization has to be performed on signal before running measurement for SNR-ISI. For CR4 and KR4, measurement is done on unequalized signal.

Equalization procedure

gDC gDC2 G ZLF Z1 PLF P1 P2

-15 to 0 -4 to 0 1 fb/40 fb/2.5 fb*2

AM4 utility and export the linear fit pulse to a file.

1. Equalize the signal with equalization filters given above(varying gDC and gDC2) ad measure the SNR-ISI in each case

2. Maximum value of SNR-ISI is reported out as result.

Note: The observed SNR

connectors. High-precision measurement and careful calibration of the setup are recommended.

can be significantly influenced by the measurement setup, for example, the reflections in cables and

ISI

Normalized coefficients step size

This section verifies that the normalized coef

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points

OIF-PAM4 CEI-MR T

IEEE-PAM4

ficients step size of the DUT is within the conformable limits according to the specification.

CEI-LR T

CR4-IEEE802.3cd, Section 136.9.3

KR4-IEEE802.3cd, Section 137.9.2

AUI- IEEE802.3ck, Section 120F.3.1, Table 120F-1

TP2

TP0a

TP0v

Measurement procedure

400G-TXE compliance measurements

Normalized coef done.

1. Set the DUT in PRESET state. Export the linear fit pulse response from PAM4 utility.

2. Set the DUT in INITIALIZE state. Export the Linear fit pulse response from PAM4 utility.

3. Calculate all the equalizer coefficient C(x) before using these linear fit pulse responses and denote it as C(x)_Before.

4. Increment or decrement the equalizer coefficient in DUT by giving an increment or decrement command.

5. Measure the linear fit pulse response. Calculate the updated equalizer coefficient C(x) in the signal using linear fit pulse response

before and after sending increment or decrement request and denote it as C(x)_After.

6. Find the Increment or decrement step size for equalizer coefficient C(x) using below equation.

Increment or decrement step size = C(x)_After – C(x)_Before

Normalized coefficient step size for C(x) is calculated using below equation:

Normalized coefficient step size = Absolute value of ((Increment or Decrement step size) / C(x)_Before)*100

7. Repeat the above method for all the coefficients to find the increment and decrement step sizes.

Limits

Limits CEI-MR (Normalized

For coefficient increment

ficient step size is the measure of variation in the equalizer coefficient when the increment or decrement operations were

CEI-LR (Normalized limit) C(-1), C(0) and C(1)

Min 0.5% 0.5% 0.005 0.005

Max 5% 2% 0.025 0.05

limit) C(-2), C(-1),

C(0) and C(1)

CR4 at TP2 and KR4 at TP0a (Absolute limit)

C(-2) C(-1), C(0) and C(1)

For coefficient decrement

Note: C(x) is an equalizer coef

IEEE 802.3ck, Step size for co-efficient C(-3), C(-2), C(-1), C(0), and C(1)

Standard Specification Stage Test Point Limits

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex 120F.3.1,

Min -5% -2% -0.025 -0.05

Max -0.5% -0.5% -0.005 -0.005

ficient and the values can be C(-2), C(-1), C(0), and C(1)

Min Max

Increment TP0v 0.005 0.025

able 120F-1

CR.IEEE 802.3ck Annex 162.9, Table 162-11

Decrement -0.025 -0.005

Increment TP2 0.005 0.025

Decrement -0.025 -0.005

Coefficient initialization

This measurement measures the values of equalizer coef PRESET2 and PRESET3).

Required test equipment

ficient when the DUT is in OUT_OF_SYNC and NEW_IC states (PRESET1,

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 69

400G-TXE compliance measurements

Minimum system requirements on page 12

Equipment connection diagram

Coefficient Update state

OUT_OF_SYNC N/A Min -0.025 -0.05 0.95 -0.05

NEW_IC PRESET 1 Min -0.025 -0.05 0.95 -0.05

Measurement procedure

1. Configure the DUT in PRESET state, capture the signal and export the linear fit pulse curve using P

2. Configure the DUT into OUT_OF_SYNC state, capture the signal and export the linear fit pulse using PAM4 utility. Find the values of

Equalizer coefficients in OUT_OF sync state using the linear fit curves of Preset state and OUT_OF_SYNC state.

3. Configure DUT into NEW_IC state with PRESET1, PRESET2 and PRESET3. Each time export the linear fit pulse using the PAM4 utility. Measure the Equalizer coefficients for the each state (PRESET1, PRESET2 and PRESET3). All the time equalizer coefficients should be within the specified limit as per the specification.

ic_reg Limits CR4 (TP2) and KR4 (TP0a)

C(-2) C(-1) C(0) C(1)

Max 0.025 0.05 1.05 +0.05

Max 0.025 0.05 1.05 0.05

PRESET 2 Min -0.025 -0.2 0.7 -0.15

Max 0.025 -0.1 0.8 -0.05

PRESET 3 Min -0.025 -0.3 0.7 -0.05

Max 0.025 -0.2 0.8 0.05

AM4 utility.

Signaling rate

This section verifies that the signaling speed of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

IEEE-PAM4

Table continued…

AUI-IEEE802.3bs, Annex 120D.3.1

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section

137.9.2

TP0a 26.5625 - 100ppm 26.5625 +100 rpm

TP1a 26.5625 - 100ppm 26.5625 +100 rpm

TP4 26.5625 - 100ppm 26.5625 +100 rpm

TP2 26.5625 - 100ppm 26.5625 +100 rpm

TP0a 26.5625 - 100ppm 26.5625 +100 rpm

Standard Specification Test Points Limits

Min Max

IEEE 802.3ck AUI-C2C. IEEE 802.3ck,

Annex 120F 120F-1

AUI-C2M Host. IEEE

802.3ck, Annex 120G.3.1, Table 120G-1

AUI-C2M Module. IEEE

802.3ck, Annex 120G.3.2, Table 120G-3

CR.IEEE 802.3ck Section

162.9.2, T

Measurement procedure

1. Perform oscilloscope settings.

2. Capture the BT filtered dif

3. Configure signal source in PAM4 utility and perform single sequence.

4. Signaling rate is measured using PAM4 utility and the results are queried.

ferential signal using Math1 as source. Math1 = BT_filter(Data positive – Data negative)

.3.1, Table

able 162-11

TP0v

TP1a

TP4

TP2

53.125±50ppma GBd

53.125a GBd (Informative T

53.125 ± 50 ppma GBd

400G-TXE compliance measurements

est)

Level separation mismatch ratio (RLM)

This section verifies that the level separation mismatch ratio of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR, Table 17-2 Testpoint-T 0.95 NA

OIF-CEI-LR, Table 21-2 Testpoint-T 0.95 NA

IEEE802.3bs 200GAUI-4/ 400GAUI-8 TP0a

IEEE802.3cd 50GBase CR/ 100GBase

CR2/ 200GBase CR4

IEEE802.3cd 50GBase KR/ 100GBase

KR2/ 200GBase KR4

IEEE 802.3ck AUI-C2C. IEEE 802.3ck,

Annex 120F 120F-1

CR. IEEE 802.3ck Section

162.9.4, Table 162-11

.3.1, Table

TP2

TP0a

TP0v 0.95 NA

TP2 0.95 NA

0.95 NA

Input

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 71

400G-TXE compliance measurements

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

The level separation mismatch ratio RLM is defined by the following equation:

RLM = min ( ( 3.ES1), (3.ES2), (2 - 3.ES1), (2-3.ES2))

Where,

ES1 = (V

ES2 = (V

mid

V-1, V

- V

+1/3

mid

- V

-1/3

/ (V-1 - V

mid

= (V-1 + V+1) / 2

, V

-1/3

, and V+1 are the mean signal levels for each symbol of -1, -1/3, +1/3, and +1 P

+1/3

/ (V+1 - V

mid

)

AM4 symbols, respectively.

Linear fit pulse peak

This section verifies that the linear fit pulse peak voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR, Table 17-2 Testpoint-T 0.83*Steady state voltage NA

OIF-CEI-LR, Table 21-2 Testpoint-T 0.83*Steady state voltage NA

IEEE-PAM4

AUI-IEEE802.3bs, Annex

TP0a 0.76*Steady state voltage NA

120D.3.1

CR4-IEEE802.3cd

TP2 0.49*Steady state voltage NA

Section 136.9.3

KR4-IEEE802.3cd Section

TP0a 0.75*Steady state voltage NA

137.9.2

Input

Differential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Measurement procedure

The linear fit pulse peak is the peak value of linear fit pulse p(k).

400G-TXE compliance measurements

Steady state voltage

This section verifies that the steady state voltage of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points Limits

Min Max

OIF-PAM4 OIF-CEI-MR, Table 17-2 Testpoint-T 0.4 V 0.6 V

OIF-CEI-LR, Table 21-2 Testpoint-T 0.4 V 0.6 V

IEEE802.3bs

IEEE802.3cd

IEEE 802.3ck AUI-C2M Host. IEEE

AUI-IEEE802.3bs, Annex 120D.3.1

CR4-IEEE802.3cd Section 136.9.3

KR4-IEEE802.3cd Section

137.9.2

802.3ck, Annex 120G.3.1, T

able 120G-1

CR. IEEE 802.3ck Section

162.9.4, Table 162-11

TP0a 0.4 V 0.6 V

TP2 0.34 V 0.6 V

TP0a 0.4 V 0.6 V

TP1a NA 375 mV

TP2 0.387 V 0.6 V

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 73

400G-TXE compliance measurements

Input

ferential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Dif

Measurement procedure

The steady state voltage vf is defined as the sum of the linear fit pulse p(k), divided by M, as shown in following equation:

Even odd jitter

This section verifies that the maximum value of the even odd jitter of the DUT is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page

Equipment connection diagram

Standard Specification Test Points Limits

OIF-PAM4 OIF-CEI-VSR, Table 16-10 TP0a NA 0.019 UI

OIF-CEI-MR, Table 17-3 Testpoint-T NA 0.019 UI

OIF-CEI-LR, Table 21-3 Testpoint-T NA 0.019 UI

IEEE-PAM4

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex

AUI-IEEE802.3bs, Annex 120D.3.1

CR4-IEEE802.3cd Section

136.9.3

KR4-IEEE802.3cd Section

137.9.2

.3.1, Table 120F-1

120F

CR. IEEE 802.3ck Section

162.9.4, Table 162-11

Min Max

TP0a NA 0.019 UI

TP2 NA 0.019 UI

TP0a NA 0.019 UI

TP0v NA 0.025 UI

TP2 NA 0.025 UI

Input

ferential signal filtered through a fourth order Bessel Thomson filter with the bandwidth of 40 GHz.

Dif

Measurement procedure

Even odd jitter is the measure of two repetitions of a QPRBS13-CEI test pattern. The deviation of the time of each transition from an ideal clock at the signaling rate is measured.

400G-TXE compliance measurements

Even odd jitter is defined as the magnitude of the difference between the average deviation of all even-numbered transitions and the average deviation of all odd-numbered transitions. Determining if a transition is even or odd is based on the possible transitions (only actual transitions are measured and averaged).

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

This section verifies that the maximum value of the uncorrelated bounded high probability jitter (UBHPJ) and Uncorrelated unbounded gaussian jitter (UUGJ) is within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

Standard Specification Test Points UBHPJ limits UUGJ limits

Min Max Min Max

OIF-PAM4 OIF-CEI-VSR,

able 16-10

Input

TP0a NA 0.05 UI NA 0.01 UI

ferential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Dif

Measurement procedure

UBHPJ and UUGJ are measured using a QPRBS13-CEI test pattern. This measurement requires at least 107 symbols.

This measurement finds all the zero crossings in the signal and then finds the average pulse width. The difference of the edge time is the jitter value. The jitter is filtered through a high pass filter. Find the CDF of the filtered jitter. The UBHPJ and UUGJ are calculated by the following equation:

Where,

J5 is the dif

J6 as the difference between the τHPF at the (1-0.5 × 10-6) and 0.5 ×10-6 probabilities.

ference between the τHPF at the (1-0.5 × 10-5) and 0.5 × 10-5 probabilities.

Uncorrelated jitter RMS and uncorrelated J3 and J4 Jitter

This section verifies that the maximum value of the uncorrelated J3/J4 jitter (J3u/J4u) and Uncorrelated Jitter RMS (Jrms) are within the conformable limits according to the specification.

Required test equipment

Minimum system requirements on page 12

Equipment connection diagram

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 75

400G-TXE compliance measurements

Standard Specification Test Points

OIF-PAM4

CEI-MR T

CEI-LR T

IEEE-PAM4

Input

ferential signal filtered through a fourth order Bessel Thomson filter with appropriate bandwidth.

Dif

Measurement procedure

J4u, J3u and Jrms are defined by measurements of 12 specific transitions in a PRBS13Q pattern to exclude correlated jitter. The 12 transitions represent all possible combinations of four identical symbols followed by two different identical symbols as shown in Table 120D–2. The sequences are located by the symbol indices given in the table where symbols 1 to 7 are the run of seven 3s.

J4u is defined as the time interval that includes all but 10–4 of fJ(t), from the 0.005th to the 99.995th percentile of fJ(t). JRMS is defined as the standard deviation of fJ(t).

J4u03is calculated the same way as J4u except that the calculation uses only transitions R03 and F30 as define in IEEE802.3 specification.

J3u is defined as the time interval that includes all but 10–3 of fJ(t), from the 0.05th to the 99.95th percentile of fJ(t).

This measurement requires minimum of 3500 specific transitions. Hence the application will capture 10 waveforms each with 8M. It analyzes the waveforms one by one using PAM4 utility until it accumulates the required number of transitions (3500). Incase of noisy signals, more data is needed to get the required number of transitions which application takes care internally.

200GAUI-4/ 400GAUI-8 TP0a

50GBase CR/ 100GBase CR2/ 200GBase CR4

50GBase KR/ 100GBase KR2/ 200GBase KR4

TP2

TP0a

Limits

Table 19: J4u jitter limits

Specification Test Points Min Max

CEI-MR T

CEI-LR T

200GAUI-4/ 400GAUI-8 TP0a

AUI-C2C. IEEE 802.3ck, Annex 120F

.3.1, Table 120F-1

Table 20: Uncorrelated Jitter J4u

Specification Test Points Min Max

AUI-C2C. IEEE 802.3ck, Annex

.3.1, Table 120F-1

120F

TP0v NA 0.128 UI

TP0v NA 0.118 UI

NA 0.118 UI

400G-TXE compliance measurements

Table 21: J3u jitter limits

Specification Test Points Min Max

50GBase CR/ 100GBase CR2/ 200GBase CR4

TP2

NA 0.115 UI

50GBase KR/ 100GBase KR2/ 200GBase KR4

CR. IEEE 802.3ck Section

162.9.4, T

able 162-11

TP0a

TP2 NA 0.125 UI

NA 0.106 UI

Table 22: J3u03 jitter limits

Specification Test Points Min Max

CR. IEEE 802.3ck Section

162.9.4, T

able 162-11

TP2 NA 0.115 UI

Table 23: Jrms limits

Specification Test Points Min Max

200GAUI-4/ 400GAUI-8 TP0a

50GBase CR/ 100GBase CR2/ 200GBase CR4

50GBase KR/ 100GBase KR2/ 200GBase KR4

TP2

TP0a

NA 0.023 UI

AUI-C2C. IEEE 802.3ck, Annex

.3.1, Table 120F-1

120F

CR. IEEE802.3ck Section

162.9.4, Table 162-11

TP0v NA 0.023 UI

TP2 NA 0.023 UI

Signal to AC common mode noise ratio (SCMR)

This section verifies the Signal to AC common mode noise ratio (SCMR) within the comfortable limits according to the specification.

Standard Specification Test point Limits

Min Max

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex 120F.3.1, Table

120F-1

Measurement procedure

Signal to AC common-mode noise ratio, SCMR, is defined by the below equation with the exception that the full-band peak-to-peak AC common-mode voltage is defined in 120F

Signal to AC common-mode noise ratio, SCMR, is calculated using Equation,

.3.1.1.

TP0v 15 dB NA

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 77

400G-TXE compliance measurements

Where,

SCMR is the signal to AC common-mode noise ratio in dB

is defined as a maximum value of p(k).

peak

P(k) is linear fit pulse response

VCMFB is the full-band peak-to-peak AC common-mode voltage defined by the method specified in “Peak-Peak AC Common mode V

oltage” and measured with the transmitter equalization set to “no equalization”

Peak-Peak AC Common mode voltage

This section verifies Peak-Peak AC common mode voltage within the comfortable limits according to the specification.

Standard Specification Test point limits

Min Max

IEEE 802.3ck AUI-C2C. Annex 120F.3.1, Table 120F-1 TP0v NA 32 mV (Low Frequency

(VCMLF))

AUI-C2M Host. Annex 120G.3.1, Table 120G-1 TP1a NA

AUI-C2M Module. IEEE 802.3ck, Annex 120G.3.2,

able 120G-3

CR.IEEE802.3ck Section 162.9.2, Table 162-11 TP2 NA

TP4 NA

• 32 mV (Low Frequency (VCMLF))

80 mV (Full Band

• (VCMFB))

• 32 mV (Low Frequency (VCMLF))

• 80 mV (Full Band (VCMFB))

• 30 mV (Low Frequency (VCMLF))

80 mV (Full Band

• (VCMFB))

Measurement procedure

The low-frequency and full-band peak-to-peak AC common-mode voltage, VCMLF and VCMFB, respectively specified as below with the exception that the peak-to-peak AC common-mode voltage is defined as the AC common-mode voltage range measured at TP0v that includes all but 10-5 of the measured distribution, from 0.000005 to 0.999995 of the cumulative distribution.

Full-band peak-to-peak AC common-mode voltage, VCMFB, is defined as the AC common-mode voltage range that includes all TP0v but 10-5 of the measured distribution, from 0.000005 to 0.999995 of the cumulative distribution. The transmitter equalization is turned off

(preset 1 condition).

, are defined by the method

Low-frequency peak-to-peak AC common-mode voltage, VCMLF is defined in the same way as VCMFB, except that it is measured with a low-pass filter defined with cutoff 100 MHz.

400G-TXE compliance measurements

Signal to Residual Inter symbol Interface Ratio (SNR

This section verifies the Signal to Residual Inter Symbol Interface Ratio (SNR

) within the comfortable limits according to the specification.

ISI

)

Standard Specification Test point Limits

Min Max

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex 120F.3.1, Table

TP0v 28 dB NA

120F-1

CR. IEEE 802.3ck Section 162.9.4, Table 162-11 TP2 26.7 dB NA

Measurement procedure

Signal-to-residual-intersymbol-interference ratio SNR are provided in T

SNR

is computed using below equation. It is computed from p

ISI

able 120F–8

in specification and optimized for maximum SNR

ISI

=[p(tp +M x ( Nb +1)) , p(tp +M x ( Nb +2)) , ……………., p(tp +M x ( Nb -Dp-1)) ]

cursors

is defined by the method with the exception that the continuous time filter settings

ISI

and ISI

max

ISI

after these have been recalculated with CTLE described

cursors

tp – is the index of the linear fit pulse where p(tp) equals p

max

M – is the oversampling ratio of the measured waveform and linear fit pulse

Np – is the linear fit pulse length

Nb - 6

1. The linear fit pulse response p(k) is determined using the linear fit procedure in specification.

2. The continuous time filter parameters are provided in specification. For calculation of SNR

using above equation a value of 6 is used

ISI

for Nb.

3. A time of

fset is added to tp whose value is swept from –0.5 UI to 0.5 UI when calculating ISI

cursors

. SNR

is defined as the lowest

ISI

value found across the time offset sweep.

4. The transmitter equalizer setting is chosen, within the required coefficient ranges to result in the highest SNR

Difference steady-state voltage d

value.

ISI

This section verifies Difference steady-state voltage dvf within the comfortable limits according to the specification.

Standard Specification Test point Limits

Min Max

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex 120F.3.1, Table

TP0v 0 V NA

120F-1

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 79

400G-TXE compliance measurements

Measurement procedure

ference steady-state voltage, dvf, is calculated using below Equation

The dif

Figure 24: Measurement menthod for transmitter reference steady-state voltage, pulse peak and ERL

1. User need to brown T

est Fixture S4p file to compute the V

f(ref)

2. Measurement will compute the 'h()' using Reference device and Package model, Test Fixture scattering parameters.

3. Acquire the signal

4. Select the dvf test in PAMJET, which compute the v

5. Difference between V

f(mean)

and V

is reported to compare against the limit.

f(ref)

Difference linear fit pulse peak ratio dR

from acquire signal and v

f(mean)

peak

using above formula.

f(ref)

This section verifies the Difference steady-state voltage dvf within the comfortable limits according to the specification.

Standard Specification Test point Limits

Min Max

IEEE 802.3ck AUI-C2C. IEEE 802.3ck, Annex 120F.3.1, Table

TP0v 0V NA

120F-1

Measurement procedure

The dif

ference pulse peak ratio, dR

400G-TXE compliance measurements

, is calculated as the difference between measured pulse peak ratio, and reference pulse peak ratio.

peak

1. dR

2. dR

3. R

4. R

5. Final difference between R

Linear fit pulse peak ratio R

This section verifies the R

is same as dvf. All the steps of dvf are getting executed first.

peak

ratio is calculated as per above equations.

peak

peak(mean)

is ratio of V

peak(ref)

is the ration of V

peak(ref)

peak(meas)

and V

peak(mean)

and V

, which are calculated as define in “dvf” measurement equations.

f(ref)

and R

, which are calculated from acquired signal.

f(meas)

is reported to compare against the limit.

peak(ref)

peak

within the comfortable limits according to the specification.

peak

Standard Specification Test point Limits

Min Max

IEEE 802.3ck CR. IEEE 802.3ck Section 162.9.4, Table 162-11 TP2 0.397 V NA

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 81

SCPI Commands

About SCPI command

ou can use the Standard Commands for Programmable Instruments (SCPI) to communicate remotely with the TekExpress application.

Y Complete the TCPIP socket configuration and the TekVISA configuration in the oscilloscope or in the device where you are executing the script.

Note: If you are using an external PC to execute the remote interface commands, then install T configurations.

ekVISA in the PC to make the

Socket configuration for SCPI commands

This section describes the steps to configure the TCPIP socket configuration in your script execution device and the steps to configure the

ekVISA configuration in the oscilloscope to execute the SCPI commands.

TCPIP socket configuration

1. Click Start > Control Panel > System and Security > Windows Firewall > Advanced settings.

2. In Windows Firewall with Advanced Security menu, select W Inbound Rules and click New Rule…

indows Firewall with Advanced Security on Local Computer >

SCPI Commands

3. In New Inbound Rule W

a. Select Port and click Next.

izard menu

b. Select TCP as rule apply

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 83

, enter 5000 for Specific local ports and click Next.

SCPI Commands

c. Select Allow the connection and click Next.

d. Select Domain, Private, Public checkbox and click Next.

SCPI Commands

e. Enter Name, Description (optional), and click Finish.

4. Check whether the Rule name is displayed in W

indows Firewall with Advanced Security menu > Inbound Rules.

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 85

SCPI Commands

TekVISA configuration

1. Click Start > All Programs > T

2. Click Search Criteria. In Search Criteria menu, click LAN to Turn-on. Select Socket from the drop-down list, enter the IP address of

the TekExpress device in Hostname and type Port as 5000. Click to configure the IP address with Port.

ekVISA > OpenChoice Instrument Manager.

Enter the Hostname as 127.0.0.1 if the T oscilloscope where the TekExpress application is running.

ekVISA and TekExpress application are in the same system, else enter the IP address of the

SCPI Commands

3. Click Search to setup the TCPIP connection with the host. Check whether the TCPIP host name is displayed in OpenChoice Instrument Manager > Instruments.

4. Double-click OpenChoice T

Operation is successful and Talker Listener Readout displays the Command / Data.

alker Listener and enter the Command *IDN? in command entry field and click Query. Check that the

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 87

SCPI Commands

Set or query the device name of application

This command sets or queries the device name of the application.

Syntax

TEKEXP:SELECT DEVICE,"<DeviceName>" (Set)

TEKEXP:SELECT? DEVICE (Query)

Command arguments

Argument Name Argument Type

Returns

Examples

TEKEXP:SELECT DEVICE,"<DeviceName>" command sets the device name of the application.

TEKEXP:SELECT? DEVICE command returns the selected device name of the application.

Set or query the suite name of the application

This command sets or queries the suite name of the application.

Syntax

TEKEXP:SELECT SUITE,"<SuiteName>" (Set)

TEKEXP:SELECT? SUITE (Query)

Command arguments

SuiteName

• TP0a, TP1a, TP4 for OIF-PAM4 CEI-VSR Testpoint-T for OIF-PAM4 CEI-MR and OIF-PAM4 CEI-LR

•

• TP0a, TP1a, TP4 for IEEE-PAM4 AUI

• Testpoint-TP2 for IEEE-PAM4 CR4

• Testpoint-TP0a for IEEE-PAM4 KR4

Returns

Examples

TEKEXP:SELECT SUITE,"<SuiteName>" command sets the suite name of the application.

TEKEXP:SELECT? SUITE command returns the selected suite of the application.

Set or query the test name of the application

SCPI Commands

This command selects or deselects the specified test name of the application.

Syntax

TEKEXP:SELECT TEST,"<TestName>",<Value> (Set)

TEKEXP:SELECT TEST,"<ALL>" (Set)

TEKEXP:SELECT? TEST (Query)

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 89

SCPI Commands

Command arguments

TestName Value

OIF-PAM4 CEIVSR

DC Common Mode Output Voltage (TP0a, TP1a, TP4)

•

• Diff Peak to Peak Output Voltage Tx Enabled (TP0a, TP1a, TP4)

• AC Common Mode Output Voltage (TP0a, TP1a, TP4)

• Transition Time (TP0a, TP1a, TP4)

• Signal To Noise And Distortion Ratio (TP0a, TP1a, TP4)

• Even Odd Jitter (TP0a)

• Uncorrelated Bounded High Probability Jitter (TP0a)

• Uncorrelated Unbounded Gaussian Jitter (TP0a)

• Eye Width (TP1a)

• Eye Height (TP1a)

• Eye Linearity (TP1a)

• Eye Symmetry Mask Width (TP4)

• Near End Eye Width (TP4)

• Near End Eye Height (TP4)

• Near End Eye Linearity (TP4)

• Near End Eye Symmetry Mask Width (TP4)

• Far End Eye Width (TP4)

• Far End Eye Height (TP4)

• Far End Eye Symmetry Mask Width (TP4)

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Table continued…

TestName Value

OIF-PAM4 CEI-MR

DC Common Mode Output Voltage

•

• Diff Peak to Peak Output Voltage Tx Enabled

• AC Common Mode Output Voltage

• Single Ended Output Voltage

• Signal To Noise And Distortion Ratio

• Level Separation Mismatch Ratio

• Linear Fit Pulse Peak

• Steady State Voltage

• Step size for coefficient C(-1)

• Step size for coefficient C(0)

• Step size for coefficient C(1)

• Coefficient Range C(-1)

• Coefficient Range C(0)

• Coefficient Range C(1)

• Even Odd Jitter

• Jitter RMS

• Uncorrelated J4 Jitter

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

SCPI Commands

OIF-PAM4 CEI-LR

• DC Common Mode Output Voltage

• Diff Peak to Peak Output Voltage Tx Enabled

• AC Common Mode Output Voltage

• Single Ended Output Voltage

• Signal To Noise And Distortion Ratio

• Level Separation Mismatch Ratio

• Linear Fit Pulse Peak

• Steady State Voltage

• Step size for coefficient C(-2)

• Step size for coefficient C(-1)

• Step size for coefficient C(0)

• Step size for coefficient C(1)

• Coefficient Range C(-2)

• Coefficient Range C(-1)

• Coefficient Range C(0)

• Coefficient Range C(1)

• Even Odd Jitter

• Jitter RMS

• Uncorrelated J4 Jitter

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 91

SCPI Commands

TestName Value

IEEE-PAM4 AUI

DC Common Mode Output Voltage (TP0a, TP1a, TP4)

•

• Diff Peak to Peak Output Voltage Tx Disabled (TP0a, TP1a)

• Diff Peak to Peak Output Voltage Tx Enabled (TP0a, TP1a, TP4)

• AC Common Mode Output Voltage (TP0a, TP1a, TP4)

• Signaling Rate (TP0a, TP1a, TP4)

• Signal To Noise And Distortion Ratio (TP0a)

• Level Separation Mismatch Ratio (TP0a)

• Linear Fit Pulse Peak (TP0a)

• Steady State Voltage (TP0a)

• Pre Cursor Equalization (TP0a)

• Post Cursor Equalization (TP0a)

• Transmitter output residual ISI (TP0a)

• Even Odd Jitter (TP0a)

• Uncorrelated J4 Jitter (TP0a)

• Jitter RMS (TP0a)

• Single Ended Output Voltage (TP1a)

• Transition Time (TP1a, TP4)

• Eye Height (TP1a)

• Eye Symmetry Mask Width (TP1a)

• Near End Eye Height (TP4)

• Near End Eye Symmetry Mask Width (TP4)

• Far End Eye Height (TP4)

• Far End Eye Symmetry Mask Width (TP4)

• Far End Precursor ISI Ratio (TP4)

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Table continued…

TestName Value

IEEE-PAM4 CR4 and KR4

DC Common Mode Output Voltage

•

• Diff Peak to Peak Output Voltage Tx Disabled

• Diff Peak to Peak Output Voltage Tx Enabled

• AC Common Mode Output Voltage

• Signaling Rate

• Signal To Noise And Distortion Ratio

• Level Separation Mismatch Ratio

• Linear Fit Pulse Peak

• Steady State Voltage

• Coefficient Range

• OUT_OF_SYNC

• NEW_IC PRESET1

• NEW_IC PRESET2

• NEW_IC PRESET3

• Step size for coefficient C(-2)

• Step size for coefficient C(-1)

• Step size for coefficient C(0)

• Step size for coefficient C(1)

• Even Odd Jitter

• Jitter RMS

• Uncorrelated J3 Jitter

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

SCPI Commands

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 93

SCPI Commands

TestName Value

IEEE 802.3ck CR

DC Common Mode Output Voltage

•

• Diff Peak to Peak Output Voltage Tx Disabled

• Diff Peak to Peak Output Voltage Tx Enabled

• Signaling Rate

• Signal To Noise And Distortion Ratio

• Level Seperation Mismatch Ratio (RLM)

• Peak-to-peak AC common-mode Voltage

• Signal to Residual Intersymbol Interference ratio(SNRisi)

• Jitter RMS

• Uncorrelated J3 Jitter

• J3u03

• Steady State Voltage (vf)

• Even Odd Jitter

• Llinear fit pulse peak ratio (Rpeak)

• Coefficient Range C(-3)

• Coefficient Range C(-2)

• Coefficient Range C(-1)

• Coefficient Range C(1)

• Coefficient Range C(0)

• Step size for coefficient C(-3)

• Step size for coefficient C(-1)

• Step size for coefficient C(1)

• Step size for coefficient C(0)

{True | False} or {1 | 0}

It represents selected or unselected.

Where,

True or 1 - Selected

False or 0 - Unselected

Returns

rue | False} or {1 | 0}

Examples

TEKEXP:SELECT TEST,"<TestName>",1 command selects the specified test in the Test Panel.

TEKEXP:SELECT TEST,"<ALL>" command select all the tests in the Test Panel.

TEKEXP:SELECT? TEST command returns the list of selected tests.

Set or query the version name of the application

This command sets or queries the version name of the application.

Syntax

TEKEXP:SELECT VERSION,”<VersionName>” (Set)

TEKEXP:SELECT? VERSION (Query)

Command arguments

VersionName Argument Type Valid Values

It is the name of the version on the DUT panel of the application.

Returns

Examples

TEKEXP:SELECT VERSION,”<VersionName>” command sets the version name of application.

TEKEXP:SELECT? VERSION command returns the version name of application.

Set or query the general parameter values

This command sets or queries the general parameter values of the application.

Syntax

SCPI Commands

TEKEXP:VALUE GENERAL,"<ParameterName>","<Value>"

TEKEXP:VALUE? GENERAL,"<ParameterName>" (Query)

(Set)

Command arguments

Table 24: Command arguments for general settings

ParameterName Value

DUTID Comment User comment

DEVICE IEEE-CK

MODE

Replace Runsession Path

Include Pass/Fail Results Summary "True" or "False"

Include Detailed Results "True" or "False"

Include Plot Images "True" or "False"

Include Setup Configuration "True" or "False"

Include User Comments "True" or "False"

Save As Type

• COMPLIANCE

•

USER-DEFINED

Session file path.

Example: X:\400G-TXE\Session1\DUT001\20170421_121534

• Web Archive (*.mht;*.mhtml)

• PDF (*.pdf;)

• CSV (*.csv;)

Run Test More than Once "True" or "False"

Number of Runs 1 to 50

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 95

SCPI Commands

ParameterName Value

On Failure Stop and Notify "True" or "False"

Timer Warning Info Message Popup "True" or "False"

Timer Warning Info Message Popup Duration 1 to 300

Timer Error Message Popup "True" or "False"

Timer Error Message Popup Duration 1 to 300

Lane0 Connected to:Lane0+:

Single Ended

DUT Type Valid values are:

Data Rate (GBd) for OIF-PAM4 Valid values are:

Valid values are:

CH1

•

• CH2

• CH3

• CH4

• "56G"

• "112G"

• For "56G", limit is 18 to 29

• For "112G", limit is 36 to 58

Samples per Symbol (M) 32 to 200

Linear pulse length (Np) Valid values are:

• For OIF-PAM4: (5 to 100)

• For IEEE-PAM4: (5 to 200)

• For IEEE-CK: (5 to 200)

Linear pulse delay (Dp) Valid values are:

• For OIF-PAM4: (2 to Np-2)

• For IEEE-PAM4: (2 to Np-2)

• For IEEE-CK: (4 to 146)

NearEnd Mask Width 0.1 to 0.5

FarEnd Mask Width 0.1 to 0.5

Bandwidth

Scope Noise 1 to 20

Target BER (1e-)/Target BER (10^-) 4 to 6

Mask Width 0.1 to 0.5

Table continued…

• "50 GHz"

• "59 GHz"

• "Full BW"

ParameterName Value

CTLE FilterFile

• ALL(1-9dB)

•

• 1 dB

• 1.5 dB

• 2 dB

• 2.5 dB

• 3 dB

• 3.5 dB

• 4 dB

• 4.5 dB

• 5 dB

• 5.5 dB

• 6 dB

• 6.5 dB

• 7 dB

• 7.5 dB

• 8 dB

• 9 dB

• Custom

• BestCTLE

SCPI Commands

0 dB

Near End CTLE FilterFile

Table continued…

For OIF, valid values are:

• ALL(1-2dB)

• 0 dB

• 1 dB

• 1.5 dB

• 2 dB

• Custom

• BestCTLE

For IEEE, valid values are:

• ALL(1-3dB)

• 0 dB

• 1 dB

• 1.5 dB

• 2 dB

• 2.5 dB

• 3 dB

• Custom

• BestCTLE

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 97

SCPI Commands

ParameterName Value

Far End CTLE FilterFile

• ALL(1-9dB)

•

• 1 dB

• 1.5 dB

• 2 dB

• 2.5 dB

• 3 dB

• 3.5 dB

• 4 dB

• 4.5 dB

• 5 dB

• 5.5 dB

• 6 dB

• 6.5 dB

• 7 dB

• 7.5 dB

• 8 dB

• 9 dB

• Custom

• BestCTLE

0 dB

Apply Filter "True" or "False"

Data Positive De-Embedding filter

Data Negative De-Embedding filter

Crosstalk source "True" or "False"

Phase Inverted Filter For Data- "True" or "False"

Deskew Alert Enabled "True" or "False"

ParameterName Value

AUI-C2M Host

Crosstalk source "True" or "False"

Scope Noise 1 to 20

Transition Time Request

Table continued…

Filter file path

Example: TEKEXP:VALUE GENERAL,"De-Embedding filter","C:\"

Filter file path

Example: TEKEXP:VALUE GENERAL,"De-Embedding filter","C:\"

• Short Long

•

• Both

ParameterName Value

CTLE Search

• Exhaustive

•

SCPI Commands

Rapid

CTLE gDC Filter File

• All(-2 to -9 dB)

• -2 dB

• -3 dB

• -4 dB

• -5 dB

• -6 dB

• -7 dB

• -8 dB

• -9 dB

• Custom

• All(-2 to -11 dB)

• -2 dB

• -3 dB

• -4 dB

• -5 dB

• -6 dB

• -7 dB

• -8 dB

• -9 dB

• -10 dB

• -11 dB

• Custom

• All(-4 to -10 dB)

• -4 dB

• -5 dB

• -6 dB

• -7 dB

• -8 dB

• -9 dB

• -10 dB

• Custom

Table continued…

TekExpress® 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help 99

SCPI Commands

ParameterName Value

CTLE gDC2 Filter File

Apply DFE "True" or "False"

Target BER (1e-)/Target BER (10^-) 4 to 6

Mask Width 0.1 to 0.5

AUI-C2M Module

Crosstalk source "True" or "False"

Scope Noise 1 to 20

Apply Filter "True" or "False"

Phase Inverted Filter For Data- "True" or "False"

C2M Module Output Mode

• All(0 to -3 dB)

0 dB

•

• -0.5 dB

• -1 dB

• -1.5 dB

• -2 dB

• -2.5 dB

• -3 dB

• Custom

• Short

• Long

• Both

CTLE Search

Near End CTLE gDC Filter File

Near End CTLE gDC2 Filter File

Table continued…

• Exhaustive

• Rapid

• All(-1 to -5 dB)

• -1 dB

• -2 dB

• -3 dB

• -4 dB

• -5 dB

• Custom

• All(0 to -2 dB)

• 0 dB

• -0.5 dB

• -1 dB

• -1.5 dB

• -2 dB

• Custom

100

Tektronix TekExpress 400G-TXE Electrical Compliance Solution for Real Time Oscilloscope Application Help User manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

Welcome

Getting help and support

Product documents

Conventions

Technical support

Getting started

Hardware requirements

Minimum system requirements

Instruments and accessories required

Software requirements

Downloading and installing the software

Activate the license

View software version and license key details

Setting up the test environment

Compensate the signal path

Deskew

Running tests

Equipment connection setup

Search instruments connected to the application

Starting the application

Application controls

Options menu functions

Configure email settings

TekExpress instrument control settings

Setup panel: Configure the test setup

DUT: Set DUT settings

Test Selection: Select the tests

Acquisitions: Set waveform acquisition settings

400G TX CK Measurement waveform naming

Configuration: Set measurement limits for tests

Preferences: Set the test run preferences

Status panel: View the test execution status

View test execution status

View test execution logs

Results panel: View summary of test results

Filter the test results

Reports panel: Configure report generation settings

Report configuration settings

Configure report view settings

View a generated report

Saving and recalling test setup

Overview

Save the configured test setup

Load a saved test setup

Perform a test using pre-run session files

Save the test setup with a different name

400G-TXE compliance measurements

DC common mode output voltage

AC Common Mode Output Voltage

Single-ended output voltage

Diff peak to peak output voltage Tx enabled

Diff peak to peak output voltage Tx disabled

Transition time

Eye width, VEC (Vertical Eye Closure), Eye height, Eye linearity, and Eye symmetry mask width

Signal-to-noise and distortion ratio

Pre-cursor and post-cursor equalization ratio

Coefficient range (OIF)

Coefficient range (IEEE)

Far end pre-cursor ISI ratio

Transmitter output residual ISI

Normalized coefficients step size

Coefficient initialization

Signaling rate

Level separation mismatch ratio (RLM)

Linear fit pulse peak

Steady state voltage

Even odd jitter

Uncorrelated bounded high probability jitter & Uncorrelated unbounded gaussian jitter

Uncorrelated jitter RMS and uncorrelated J3 and J4 Jitter

Signal to AC common mode noise ratio (SCMR)

Peak-Peak AC Common mode voltage

SCPI Commands

About SCPI command

Socket configuration for SCPI commands

Set or query the device name of application