Tektronix SC6070 User Manual

Technical Reference

TDS5000B Series Digital Phosphor Oscilloscopes Specifications and Performance Verification

071-1420-03

This document applies to firmware version 1.00 and above.

Warning

The servicing instructions are for use by qualified personnel only. To avoid personal injury, do not perform any servicing unless you are qualified to do so. Refer to all safety summaries prior to performing service.

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Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes that in all previously published material. Spec ifications and price change privileges reserved.

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TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

General Safety Summary v...................................

Specifications

Product and Feature Description 1--1....................................

Specification Tables 1--5..............................................

Performance Verification

Conventions 2--2....................................................

Brief Procedures 2--5...........................................

Self Tests 2--5.......................................................

Functional Tests 2--6.................................................

Performance Tests 2--17.........................................

Prerequisites 2--17....................................................

Equipment Required 2--18..............................................

TDS5000B Series Test Record 2--20......................................

Signal Acquisition System Checks 2--24...................................

Time Base System Checks 2--39.........................................

Trigger System Checks 2--44............................................

Output Signal Checks 2--53.............................................

Sine Wave Generator Leveling Procedure 2--60.............................

Acquisition Features 1--2..........................................

Signal Processing Features 1--3.....................................

Display Features 1--3.............................................

Measurement Features 1--3.........................................

Trigger Features 1--4..............................................

Convenience Features 1--4.........................................

Verify Internal Adjustment, Self Compensation, and Diagnostics 2--5.......

Verify All Input Channels 2--7......................................

Verify the Time Base 2--9..........................................

Verify the A (Main) and B (Delayed) Trigger Systems 2--11...............

Verify the File System 2--12.........................................

Verify the Internal Printer 2--14......................................

Check DC Voltage Measurement Accuracy 2--24........................

Check Analog Bandwidth 2--28......................................

Check Delay Between Channels 2--33.................................

Check Channel Isolation (Crosstalk) 2--37.............................

Check Long-Term Sample Rate and Delay Time Accuracy 2--39...........

Check Delta Time Measurement Accuracy 2--41........................

Check Time Accuracy for Pulse, Glitch, Timeout, and Width Triggering 2--44.

Check Sensitivity, Edge Trigger, DC Coupled 2--47......................

Check Outputs 2--53...............................................

Check Probe Compensation Output 2--56..............................

TDS5000B Series Specifications and Performance Verification

Table of Contents

List of Figures

Figure 2 --1: Toolbar and menu bar 2--3...........................

Figure 2--2: Universal test hookup for functional tests --

CH 1 shown 2--7...........................................

Figure 2 --3: Channel button location 2--8..........................

Figure2--4:Setupfortimebasetest 2--9...........................

Figure 2--5: Setup for trigger test 2--11.............................

Figure 2--6: Setup for the file system test 2--13.......................

Figure 2--7: Example test page from the internal printer 2--15.........

Figure 2--8: Initial test hookup 2--25...............................

Figure 2--9: Measurement of DC accuracy at maximum offset

and position 2--27...........................................

Figure 2--10: Initial test hookup 2--29..............................

Figure 2--11: Optional initial test hookup 2--29......................

Figure 2--12: Measurement of analog bandwidth 2--32................

Figure 2--13: Initial test hookup 2--34..............................

Figure 2--14: Measurement of chann el delay 2--36...................

Figure 2--15: Initial test hookup 2--37..............................

Figure 2--16: Initial test hookup 2--39..............................

Figure 2--17: Measurement of accuracy --

long-term and delay time 2--41................................

Figure 2--18: Delta time accuracy test h ookup 2--42..................

Figure 2--19: Initial test hookup 2--45..............................

Figure 2--20: Measurement of time accuracy for pulse an d

glitch triggering 2--46........................................

Figure 2--21: Initial test hookup 2--48..............................

Figure 2--22: Measurement of trigger sensitivity showing

50 MHz results 2--50.........................................

Figure 2--23: Initial test hookup 2--53..............................

Figure 2--24: Measurement of main trigger out limits 2--55............

Figure 2--25: Initial test hookup 2--56..............................

Figure 2--26: Measurement of probe compensator frequency 2--57......

Figure 2 --27: Subsequent test hookup 2--58.........................

Figure 2--28: Measurement of probe compensator amplitude 2--59......

Figure 2 --29: Sine wave generator leveling equipment setup

(Method A) 2--60............................................

TDS5000B Series Specifications and Performance Verification

List of Tables

Table of Contents

Figure 2--30: Sine wave generator leveling equipment

setup(MethodB) 2--62.......................................

Table 1--1: TDS5000B Series models 1--1..........................

Table 1--2: Channel input and vertical specifications 1--5............

T able 1--3: Horizontal and acquisition system specifications 1--12......

Table 1--4: Trigger specifications 1--13.............................

Table 1--5: Display specifications 1--18.............................

Table 1--6: Input/output port specifications 1--18....................

Table 1--7: Data storage specifications 1--19........................

Table 1--8: Power source specifications 1--20........................

T able 1--9: Mechanical specifications 1--20.........................

Table 1--10: Environmental specifications 1--21.....................

Table 1--11: Certifications and compliances 1--22....................

Table 2--1: Test equipment 2--18..................................

T able 2--2: DC Voltage measurement accuracy 2--26.................

Table 2--3: Analog bandwidth 2--30...............................

Table 2--4: Delta time measurement 2--43..........................

TDS5000B Series Specifications and Performance Verification

iii

Table of Contents

TDS5000B Series Specifications and Performance Verification

General Safety Summary

Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it. To avoid potential hazards, use this product only as specified.

Only qualified personnel should perform service procedures.

While using this product, you may need to access other parts of the system. Read the General Safety Summary in other system manuals for warnings and cautions related to operating the system.

ToAvoidFireor

Personal Injury

Use Proper Power Cord. Use only the power cord specified for this product and certified for the country of use.

Connect and Disconnect Properly. Do not connect or disconnect probes or test leads while they are connected to a voltage source.

Ground the Product. This product is grounded through the grounding conductor of the power cord. To avoid electric shock, the grounding conductor must be connected to earth ground. Before making connections to the input or output terminals of the product, ensure that the product is properly grounded.

Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings and markings on the product. Consult the product manual for further ratings information before making connections to the product.

Do Not Operate Without Covers. Do not operate this product with covers or panels removed.

Use Proper Fuse. Use only the fuse type and rating specified for this product.

Avoid Exposed Circuitry. Do not touch exposed connections and components

when power is present.

Do Not Operate With Suspected Failures. If you suspect there is damage to this product, have it inspected by qualified service personnel.

Do Not Operate in Wet/Damp Conditions.

Do Not Operate in an Explosive Atmosphere.

Keep Product Surfaces Clean and Dry.

Provide Proper Ventilation. Refer to the manual’s installation instructions for

details on installing the product so it has proper ventilation.

TDS5000B Series Specifications and Performance Verification

General Safety Summary

Symbols and Terms

Terms in this Manual. These terms may appear in this manual:

WARNING. Warning statements identify conditions or practices that could result in injury or loss of life.

CAUTION. Caution statements identify conditions or practices that could result in damage to this product or other property.

Terms on the Product. These terms may appear on the product:

DANGER indicates an injury hazard immediately accessible as you read the marking.

WARNING indicates an injury hazard not immediately accessible as you read the marking.

CAUTION indicates a hazard to property including the product.

Symbols on the Product. The following symbols may appear on the product:

CAUTION

Refer to Manual

WARNING

High Voltage

Protective Ground

(Earth) Terminal

Standby

TDS5000B Series Specifications and Performance Verification

Specifications

This chapter contains specifications for the TDS5000B Series Digital Phosphor Oscilloscopes. All specifications are guaranteed unless labeled “typical.” Typical specifications are provided for your convenience but are not guaranteed. Specifications marked with the n symbol are verified in the Performance Verification section.

The specifications in this section apply to all TDS5000B Series models unless noted otherwise. To meet specifications, the following conditions must be met:

H The oscilloscope must have been calibrated in an ambient temperature

between 20 °C and 30 °C(68°F and 86 °F).

H The oscilloscope must be operating within the environmental limits listed in

Table 1--10 on page 1--22.

H The oscilloscope must be powered from a source that meets the specifica-

tions listed in Table 1--8 on page 1--21.

H The oscilloscope must have been operating continuously for at least 20

minutes within the specified operating temperature range.

H You must perform the Signal Path Compensation procedure after the

20-minute warm-up period and the ambient temperature must not change more than 5 °C(9°F) without first repeating the procedure. See Run the signal-path compensation routine on page 2--6 for instructions on how to perform this procedure.

H You must perform the Signal Path Compensation procedure after the

20-minute warm-up period, and the ambient temperature must not change more than 5 °C without first repeating the procedure. See Optimizing Measurement Accuracy on page NO TAG for instructions to perform this procedure.

Product and Feature Description

The TDS5000B Series Digital Phosphor Oscilloscope family consists of the models shown in Table 1--1.

TDS5000B Series Specifications and Performance Verification

1- 1

Specifications

Table 1- 1: TDS5000B Series models

Acquisition Features

Number of

Model

TDS5032B 2 350 MHz 5 GS/s

TDS5034B 4 350 MHz 5 GS/s

TDS5052B 2 500 MHz 5 GS/s

TDS5054B 4 500 MHz 5 GS/s

TDS5054BE 4 500 MHz 1 GS/s

TDS5104B 4 1GHz 5 GS/s

channels

Bandwidth

Maximum sample rate (real time)

Separate Digitizers. Ensure accurate timing measurements with separate digitizers for each channel. Acquisition on multiple channels is always concurrent and supports full bandwidth for single-shot acquisitions on each channel. The digitizers can also be combined to yield a higher sample rate on a single channel.

NOTE. Full bandwidth single-shot acquisition is not available for TDS5104B Series oscilloscopes, except in one or two channel mode.

Digitizers cannot be combined to yield a higher sample rate for a single channel when using TDS5054BE Series oscilloscopes.

1- 2

Fast Acquisition. Acquire up to 100,000 waveforms per second to see rapidly

changing signals or intermittent signal irregularities.

Long Record Lengths. Choose record lengths from 500 points to up to 2,000,000 points per channel (up 8,000,000 points on a single channel). Extend the maximum record length up to a maximum of 16,000,000 points with memory options.

Peak Detect Acquisition Mode. See pulses as narrow as 400 ps, even at the slower time base settings. Peak detect helps you see noise and glitches in your signal.

Acquisition Control. Acquire continuously or set up to capture single shot acquisitions. Enable or disable optional acquisition features such as equivalent time or roll mode.

TDS5000B Series Specifications and Performance Verification

Specifications

Horizontal Delay. Use delay when you want to acquire a s ignal at a significant time interval after the trigger point. Toggle delay on and off to quickly compare the signal at two different points in time.

TDS5000B Series Specifications and Performance Verification

1- 3

Specifications

Signal Processing

Features

Display Features

Average, Envelope, and Hi Res Acquisition. Use Average acquisition mode to remove uncorrelated noise from your signal. Use Envelope to capture and display the maximum variation of the signal. Use Hi Res to increase vertical resolution for lower bandwidth signals.

Waveform Math. Set up simple math waveforms using the basic arithmetic functions including FFT, or create more advanced math waveforms using the optional math expression editor. Waveform expressions can even contain measurement results and other math waveforms.

Spectral Analysis. Display spectral magnitude and phase waveforms based on your time-domain acquisitions. Control the oscilloscope using the traditional spectrum analyzer controls such as span and center frequency.

Color LCD Display. Identify and differentiate waveforms easily with color coding. Waveforms, readouts, and inputs are color matched to increase productivity and reduce operating errors.

Digital Phosphor. A Digital Phosphor Oscilloscope can clearly display intensity modulation in your signals. The oscilloscope automatically overlays subsequent acquisitions and then decays them to simulate the writing and decay of the phosphor in an analog oscilloscope CRT (cathode-ray tube). The feature results in an intensity-graded or color-graded waveform display that shows the information in the intensity modulation.

Measurement Features

1- 4

Fit to Screen. The Digital Phosphor technology performs the compression

required to represent all record points on the screen, even at the maximum record length settings.

Zoom. To take advantage of the full resolution of the oscilloscope you can zoom in on a waveform to see the fine details. Both vertical and horizontal zoom functions are available.

Cursors. Use cursors to take simple voltage, time, and frequency measurements.

Automatic Measurements. Choose from a large palette of amplitude, time, and

histogram measurements. You can customize the measurements by changing reference levels or by adding measurement gating.

TDS5000B Series Specifications and Performance Verification

Specifications

Trigger Features

Convenience Features

Simple and Advanced Trigger Types. Choose simple edge trigger or choose from many advanced trigger types to help you capture a specific signal fault or event.

Dual Triggers. Use the A (main) trigger system alone or add the B trigger to capture more complex events. You can use the A and B triggers together to set up a delay-by-time or delay-by-events trigger condition.

Autoset. Use Autoset to quickly set up the vertical, horizontal, and trigger controls for a usable display.

Touch Screen Interface. (Optional) You can operate all oscilloscope functions (except the power switch) from the touch screen interface. You can also install a mouse and keyboard to use the interface.

Toolbar or Menu Bar. You can choose a toolbar operating mode that is optimized for use with the touch screen, or a PC-style menu-bar operating mode that is optimized for use with a mouse.

Open Desktop. The oscilloscope is built on a Microsoft Windows software platform; the oscilloscope application program starts automatically when you apply power to the instrument. You can minimize the oscilloscope application and take full advantage of the built-in PC to run other applications. Moving waveform images and data into other applications is as simple as a copy/paste operation.

Dedicated Front Panel Controls. The front panel contains knobs and buttons to provide immediate access to the most common oscilloscope controls. Separate vertical controls are provided for each channel. The same functions are also available through the screen interface.

Data Storage and I/O. The oscilloscope has a standard floppy disk drive and CD-R/W drive or optional removable hard disk drive, that can be used for storage and retrieval of data. The oscilloscope has GPIB, USB, Parallel, RS232, and Ethernet ports for input and output to other devices.

Online Help. The oscilloscope has a complete online help system that covers all its features. The help system is context sensitive; help for the displayed control window is automatically shown if you touch the help button. Graphical aids in the help windows assist you in getting to the information you need. You can also access the help topics through a table of contents or index.

TDS5000B Series Specifications and Performance Verification

1- 5

Specifications

Specification Tables

Table 1- 2: Channel input and vertical specifications

Characteristic Description

Input coupling AC, DC, and GND

Input channels

TDS5034B, TDS5054B, TDS5054BE, TDS5104B

TDS5032B, TDS5052B Two identical channels

Input impedance selection 50 Ω or 1 MΩ.

Input impedance, DC coupled Product Limits

50 Ω,typical TDS5032B, TDS5052B,

VSWR TDS5032B, TDS5034B ≤1.6:1 typical from DC to

1MΩ TDS5032B, TDS5052B,

Four identical channels

TDS5104B bandwidth limited to 500 MHz, 1 MΩ selected

±1.0%

TDS5034B, TDS5054B, TDS5054BE

TDS5104B ±2.5%

350 MHz

TDS5052B, TDS5054B, TDS5054BE

TDS5104B ≤1.5:1 typical from DC to

TDS5034B, TDS5054B, TDS5054BE

TDS5104B ±1.0% in parallel with

≤1.6:1 typical from DC to 500 MHz

1GHz

±1.0% in parallel with

15.5 pF ±2pF

18 pF ±2pF

1- 6

Maximum voltage at input BNC AC, DC, or GND coupled

1MΩ 150 V

For steady state sinusoidal waveforms, derate at 20 dB/decade above 200 kHz to 9 V

50 Ω TDS5032B, TDS5052B,

TDS5034B, TDS5054B, TDS5054BE

TDS5104B <1 Vrms for settings be-

CAT I, and ≤400 peak

RMS

TDS5000B Series Specifications and Performance Verification

at ≥3MHz

RMS

with peaks less

RMS

than ±30 V

low 100mV/div

<5 Vrms for 100 mV/div settings and above

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

n Differential delay, DC 50 Ω input

Deskew range, typical ±75.0 ns

n Channel-to-channel crosstalk ≥100:1 at ≤100 MHz

Digitizers 8-bit resolution

≤100 ps between any two channels with DC input coupling and the same V/div scale settings at or above 10 mV/div

≥30:1 at >100 MHz up to the rated bandwidth for any two channels with equal V/div settings

TDS5032B, TDS5052B Two separate digitizers,

Specifications

each channel sampled simultaneously

TDS5034B, TDS5054B, TDS5054BE, TDS5104B

Sensitivity range Fine adjustment available with ≤1% resolution

1MΩ 1 mV/div to 10 V/div, in a 1-2-5 sequence

50 Ω 1 mV/div to 1 V/div, in a 1-2-5 sequence

n Analog bandwidth SCALE range Bandwidth

TDS5032B, TDS5034B 1mV/divto1.99mV/div DC to 150 MHz

2mV/divto4.98mV/div DC to 250 MHz

5mV/divto1V/div DC to 350 MHz

DC 50 Ω coupling; bandwidth limit set to Full; operating ambient ≤30 °C; derated by 2.5 MHz/°C above 30 °C

TDS5052B, TDS5054B, TDS5054BE

TDS5104B 1mV/divto1.99mV/div DC to 175 MHz

1mV/divto1.99mV/div DC to 175 MHz

2mV/divto4.98mV/div DC to 300 MHz

5mV/divto1V/div DC to 500 MHz

DC 50 Ω coupling; bandwidth limit set to Full; operating ambient ≤30 °C; derated by 2.5 MHz/°C above 30 °C

Four separate digitizers, each channel sampled simultaneously

Analog bandwidth selections 20 MHz, 150 MHz, or Full

TDS5000B Series Specifications and Performance Verification

2mV/divto1V/div DC to 1 GHz

DC 50 Ω coupling; bandwidth limit set to Full; operating ambient ≤30 °C; derated by 5 MHz/°C above 30 °C

1- 7

Specifications

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

Analog Bandwidth Limit

Low frequency, AC coupled 50 Ω: <200 kHz

1MΩ: <10 Hz, reduced by a factor of ten when using a 10X probe

High frequency, typical 20 MHz: with 20 MHz bandwidth limit turned on

150 MHz: with 150 MHz bandwidth limit turned on

Calculated rise time, typical DC 50 Ω coupl ing, bandwidth limit set to Full

SCALE range Rise time

TDS5032B, TDS5034B 1mV/divto1.99mV/div 2.67 ns

2mV/divto4.98mV/div 1.6 ns

5mV/divto1V/div 1.15 ns

TDS5052B, TDS5054B, TDS5054BE

TDS5104B 1mV/divto1.99mV/div 2.29 ns

Step response settling errors, typi

≤2 V step amplitude 1 mV/div to 99.5 mV/div 20 ns: ≤0.5%

≤20 V step amplitude 100 mV/div to 1.0 V/div 20 ns: ≤1.0%

≤200 V step amplitude 1.01 V/div to 10 V/div 20 ns: ≤1.0%

1mV/divto1.99mV/div 2.29 ns

2mV/divto4.98mV/div 1.33 ns

5mV/divto1V/div 800 ps

2mV/divto1V/div 300 ps

Bandwidth limit set to Full

SCALE range

Settling error at time after step

100 ns: ≤0.2%

20 ms: ≤0.1%

100 ns: ≤0.5%

20 ms: ≤0.2%

100 ns: ≤0.5%

20 ms: ≤0.2%

Position range ±5 divisions

1- 8

TDS5000B Series Specifications and Performance Verification

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

Peak Detect or Envelope Mode Pulse Response

Offset range User-adjustable input offset voltages

Capture of single event pulses

Number of channels Minimum pulse width

1or2 400 ps

3or4 800 ps

Specifications

TDS5032B, TDS5034B, TDS5052B, TDS5054B, TDS5054BE

1MΩ coupling 1 mV/div to 99.5 mV/div ±1V

50 Ω coupling 1 mV/div to 99.5 mV/div ±1V

TDS5104B SCALE range Offset range

1MΩ coupling 1 mV/div to 99.5 mV/div ±1V

50 Ω coupling 1 mV/div to 50 mV/div ±0.5 V

SCALE range Offset range

100 mV/div to 1 V/div ±10 V

1.01 V/div to 10 V/div ±100 V

100 mV/div to 1 V/div ±10 V

1.01 V/div to 10 V/div ±100 V

50.5 mV/div to 99.5 mV/div ±0.25 V

100 mV/div to 500 mV/div ±5V

505 mV/div to 1 V/div ±2.5 V

TDS5000B Series Specifications and Performance Verification

1- 9

Specifications

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

Offset accuracy SCALE range Offset range

1mV/divto9.95mV/div ±[(0.2% ×| net offset |) +

1.5 mV + (0.1 div ×V/div setting)]

10 mV/div to 99.5 mV/div ±[(0.35% ×| net offset |) +

1.5 mV + (0.1 div ×V/div setting)]

100 mV/div to 1.0 V/div ±[(0.35% ×| net offset |) +

15 mV + (0.1 div ×V/div setting)]

1.01 V/div to 10 V/div ±[(0.25% ×| net offset |) +

150 mV + (0.1 div ×V/div setting]

Temperatures >40 °C ±[(0.75% ×| net offset |) +

150 mV + (0.1 div ×V/div setting)]

DC gain accuracy, Sample or Average acquisition mode

where, net offset = offset -- (position × volts/division)

±1.5% + 1.0% × |net offset /offset range|

TDS5104B: ±3% + 1.0% × |net offset /offset range| for 2mV/div--3.98mV/div

Refer to Offset Range specifications

1- 10

TDS5000B Series Specifications and Performance Verification

Specifications

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

DC voltage measurement accuracy Measurement type DC accuracy (in volts)

Sample acquisition mode, typical

Any sample ±[(1.5% + 1.0% × |net

offset /offset range|)× |reading -- net offset| + offset accuracy + (0.13 div × V/div setting) + 0.6 mV]

TDS5104B: 2 mV/div --

3.98 mV/div ±[(1.5% + 3.0% × |net offset /offset range|)× |reading -- net offset| + offset accuracy + 0.13 div ×V/div setting + 0.6 mV]

Delta voltage measurement between any two points acquired under the same setup and ambient conditions

where, net offset = offset -- (position × volts/division)

±[1.5% + 1.0% × |net offset /offset range|× |reading -- net offset| + (0.26 div × V/div setting) +

1.2 mV]

TDS5104B: 2 mV/div --

3.98 mV/div ±[1.5% + 3.0% × |net offset /offset range|× |reading -- net offset| + 0.26 div ×V/div setting +1.2mV]

n Average acquisition mode

TDS5000B Series Specifications and Performance Verification

Average of ≥16 waveforms ±[1.5% + 1.0% × |net

offset /offset range|× |reading -- net offset| + offset accuracy + 0.06 div × V/div]

TDS5104B: 2 mV/div --

3.98 mV/div ±[1.5% + 3.0% × |net offset /offset range|× |reading -- net offset| + offset accuracy + 0.06 div × V/div]

1- 11

Specifications

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteristic Description

Delta voltage measurement between any two averages of ≥16 waveforms acquired under the same setup and ambient conditions

Where, net offset = offset -- (position × volts/division)

Nonlinearity, typical <1 LSB differential, <1 LSB integral, independently

based

±[1.5% + 1.0% × |net offset /offset range|× |reading -- net offset| + (0.1 div × V/div setting) +

0.3 mV]

TDS5104B: 2 mV/div --

3.98 mV/div ±[1.5% + 3.0% × |net offset /offset range|× |reading -- net offset| +0.1div× V/div +0.3mV]

Effective bits, typical Sine wave input at the indicated frequency and pk-pk

amplitude, 50 mV/div and 25 °C

Signal and input conditions Effective bits

TDS5032B, TDS5034B, TDS5052B, TDS5054B, TDS5054BE

TDS5032B, TDS5034B 350 MHz, 6.5 div, 5 GS/s

TDS5052B, TDS5054B, TDS5054BE

TDS5104B 1MHz,9.2div,5GS/s

1MHz,9.2div,5GS/s sample rate, Sample acquisition mode

1MHz,9.2div,10MS/s sample rate, HiRes acquisition mode

sample rate, Sample acquisition mode

500 MHz, 6.5 div, 5 GS/s sample rate, Sample acquisition mode

sample rate, Sample acquisition mode

1MHz,9.2div,10MS/s sample rate, HiRes acquisition mode

1GHz,6.5div,5GS/s sample rate, Sample acquisition mode

6.8 bits

9.1 bits

6.5 bits

6.6 bits

9.0 bits

4.7 bits

1- 12

TDS5000B Series Specifications and Performance Verification

Specifications

Table 1- 3: Horizontal and acquisition system specifications

Characteristic Description

Acquisition modes Sample, Peak detect, Hi Res, Average, and Envelope

Fast acquisition rate Up to 100,000 waveforms-per-second with Fast

Acquisition mode on

Up to 130 waveforms-per-second with Fast Acquisition mode off

Minimum record length 500 points

Maximum record length Depends on number of active channels and amount of

memory installed

Standard 2,000,000 points (3 or 4 channels)

4,000,000 points (2 channels) 8,000,000 points (1 channel)

Option 3M installed 4,000,000 points (3 or 4 channels)

8,000,000 points (2 channels) 16,000,000 points (1 channel)

Sample rate range, real-time Number acquired channels Sample rate range

TDS5032B, TDS5034B, TDS5052B, TDS5054B, TDS5104B

TDS5054BE 1,2,3, or 4 1.00 S/s to 1.00 GS/s

Equivalent-time sample rate or interpolated waveform rate range

TDS5032B, TDS5034B, TDS5052B, TDS5054B, TDS5104B

TDS5054BE 2 GS/s to 200 GS/s

Seconds/division range (s/div x 10) to 1,000 s

Horizontal delay range 16 ns to 250 s

n Long term sample rate and delay time accuracy

1 1.25 S/s to 5 GS/s

2 1.25 S/s to 2.5 GS/s

3or4 1.25 S/s to 1.25 GS/s

Listed values depend on the number of channels in use, horizontal scale, and resolution settings.

Equivalent-time acquisition can be enabled or disabled. When disabled, waveforms are interpolated at the fastest time base settings.

2.5 GS/s to 250 GS/s

±15 ppm over any ≥1 ms interval

RMS aperture uncertainty, typical ≤ [3 ps + (0.1 ppm × record duration)] for real-time or

TDS5000B Series Specifications and Performance Verification

interpolated records with a duration ≥1 minute

1- 13

Specifications

Table 1- 3: Horizontal and acquisition system specifications (Cont.)

Characteristic Description

n Delta time measurement accuracy

For a single channel, with signal amplitude > 5 div, reference level set at 50%, interpolation set to sin(x)/x, volts/division set to ≥ 5 mV/div, with (displayed risetime)/(sample interval) ratio between 1.4 and 4, where sample interval = 1/(real-time sample rate)

Conditions Accuracy

Single shot signal, Sample, or Hi Res acquisition mode, Full bandwidth

Average acquisition mode, ≥100 averages, Full bandwidth

Table 1- 4: Trigger specifications

Characteristic Description

Auxiliary trigger input resistance, typical

Maximum trigger input voltage, typical

n Edge trigger sensitivity, Main and Delayed trigger

TDS5032B, TDS5034B Any channel, DC coupled 0.35 div from DC to

≥1.5 kΩ

±20 V (DC or peak AC)

Trigger Source Sensitivity

Auxiliary input 400 mV from DC to

± (15 ppm × | reading | +

0.3 sample intervals)

± (15 ppm × | reading | + 20 ps)

50 MHz, increasing to 1 div at 350 MHz

50 MHz, increasing to 750 mV at 100 MHz

1- 14

TDS5052B, TDS5054B, TDS5054BE

TDS5104B Any channel, DC coupled 0.35 div from DC to

Any channel, DC coupled 0.35 div from DC to

50 MHz, increasing to 1 div at 500 MHz

Auxiliary input 400 mV from DC to

50 MHz, increasing to 750 mV at 100 MHz

50 MHz, increasing to 1 div at 1 GHz

Auxiliary input 400 mV from DC to

50 MHz, increasing to 750 mV at 100 MHz

TDS5000B Series Specifications and Performance Verification

Specifications

Table 1- 4: Trigger specifications (Cont.)

Characteristic Description

Edge trigger sensitivity, typical All sources, for vertical scale settings ≥10 mV/div and

≤1V/div

Trigger coupling Sensitivity

NOISE REJ 3 × the DC-coupled limits

AC Same as DC-coupled limits

for frequencies ≥60 Hz; attenuates signals <60 Hz

HF REJ 1.5 × the DC-coupled

limits from DC to 30 kHz; attenuates signals >30 kHz

LF REJ 1.5 × the DC-coupled

limits for frequencies ≥80 kHz; attenuates signals <80 kHz

Advanced trigger sensitivity, typical For all trigger types except Edge, wit h vertical scale

settings ≥10 mV/div and ≤1V/div

1.0 div from DC to 500 MHz

Event count sensitivity, typical For sequential trigger delayed by events, with vertical

scale settings ≥10 mV/div and ≤1V/div

1.0 div, from DC to 500 MHz

Video trigger sensitivity, typical For delayed and main triggers, with vertical scale settings

≥10 mV/div and ≤1V/div

Any channel 0.6 to 2.5 divisions of video

sync tip

Video Trigger Format Triggers from negative sync composite video, field 1 or

field 2 for interlaced systems, any field, specific line, or any line for interlaced or noninterlaced systems

Supported systems include NTSC, PAL, SECAM, and analog HDTV

Trigger level or threshold range Trigger Source Sensitivity

Any channel ±10 divisions from center of

screen

Auxiliary input ±8V

Line Fixed at zero volts

TDS5000B Series Specifications and Performance Verification

1- 15

Specifications

Table 1- 4: Trigger specifications (Cont.)

Characteristic Description

Trigger level or threshold accuracy, typical

Set level to 50% function, typical Operates with signals ≥30 Hz

Trigger position error, typical Edge trigger, DC coupling, for signals having a slew rate

Edge trigger, DC coupling, for signals having rise and fall times ≤20 ns

Trigger Source Accuracy

Any channel ± [(2% ×| setting -- net

offset |) + (0.3 div × volts/ div setting) + offset accuracy]

Auxiliary Not calibrated or specified

Where, net offset = offset -- (position × volts/division)

at the trigger point of ≤0.5 div/ns

Acquisition mode Error

Sample, Average ± (1 displayed pt + 1 ns)

Envelope ± (2 displayed pts + 1 ns)

Trigger jitter, typical σ = 8 ps RMS

B Event (Delayed) trigger Trigger After Time Trigger on nthEvent

Range Delay time = 16 ns to

250 s

Minimum time between arm (A Event) and trigger (B Event), typical

Minimum pulse width, typical

Maximum frequency, typical — B event frequency

Advanced trigger timing For vertical scale settings ≥10 mV/div and ≤1V/div

Glitch type Minimum glitch width = 1 ns 2 ns + 5% of glitch width

Runt or window type Minimum runt width = 2 ns 2ns

Runt or window type (time qualified)

2 ns from the end of the time period to the B trigger event

— B event width ≥1ns

Minimum recognizable event width or time

Minimum runt width = 2 ns 8.5 ns + 5% of runt width

Event count = 1 to 10

2 ns between the A trigger event and the first B trigger event

≤500 MHz

Minimum rearm time to recognize next event

setting

1- 16

Runt or window type (logic qualified)

TDS5000B Series Specifications and Performance Verification

Minimum runt width = 2 ns 8.5 ns + 5% of runt width

setting

Table 1- 4: Trigger specifications (Cont.)

Characteristic Description

Width type Minimum difference

between upper and lower limits = 1 ns

Specifications

2 ns + 5% of upper limit setting

Timeout type Minimum timeout time =

1ns

Transition type Minimum transition time =

600 ps

Pattern type, typical Minimum time the pattern is

true = 1 ns

Logic Not applicable 1ns

Events Delay 1 ns (single channel) Not applicable

State type, typical Minimum true time before

clock edge = 1 ns

Minimum true time after clock edge = 1 ns

Setup/Hold type, typical Minimum clock pulse width

from active edge to inactive edge

3 ns + hold time setting 2ns

Setup and Hold parameters Limits

Setup time (time from data transition to clock edge)

Hold time (time from clock edge to data transition)

2 ns + 5% of timeout setting

8.5 ns + 5% of transition time setting

1ns

Minimum clock pulse width from inactive edge to active edge

-- 100 ns minimum +100 ns maximum

-- 1 ns minimum +102 ns maximum

TDS5000B Series Specifications and Performance Verification

Setup time + Hold time (algebraic sum of the two settings)

+2 ns minimum +202 ns maximum

1- 17

Specifications

Table 1- 4: Trigger specifications (Cont.)

Characteristic Description

Advanced trigger timer ranges Limits

Glitch type 1nsto1s

Runt or window type, wider than

Runt or window type, time qualified

Width type 1nsto1s

Timeout type 1nsto1s

Transition type 1nsto1s

Pattern type 1nsto1s

Setup/Hold type Setup and Hold timers Limits

n Advanced trigger timer accuracy For Glitch, Timeout, or Width types

1nsto1s

Setup time (time from data transition to clock edge)

Hold time (time from clock edge to data transition)

Setup time + Hold time (algebraic sum of the two settings)

Time range Accuracy

1 ns to 500 ns ±(20% of setting + 0.5 ns)

--100 ns to +100 ns

--1 ns to +100 ns

+2 ns to +200 ns

1- 18

520 ns to 1 s ±(0.01% of setting +

100 ns)

Trigger holdoff range 1.5 s to 12 s, minimum resolution is 8 s for settings

≤1.2 ms

TDS5000B Series Specifications and Performance Verification

Specifications

Table 1- 5: Display specifications

Characteristic Description

Display type 264 mm (10.4 in) diagonal, liquid crystal active-matrix

color display

Width: 211.2 mm (8.3 in) Length:: 158.4 mm (6.2 in)

Display resolution 640 horizontal × 480 vertical pixels

Pixel pitch 0.33 mm horizontal, 0.33 mm vertical

Contrast ratio, typical 150:1

Response time, typical 50 ms, black to white

Display refresh rate 59.94 frames per second

Displayed intensity levels Supports Windows SVGA high-color mode

(16-bit or 24-bit)

Table 1- 6: Input/output port specifications

Characteristic Description

n Probe Compensator Output Front-panel terminals

Output voltage Frequency

1.0 V (from base to top) ±1.0% into a ≥ 10 kΩ load

n Analog Signal Output Rear-panel BNC connector, provides a buffered version of

the signal that is attached to the channel 3 signal input

50 mV/div ±20%intoa1MΩ load 25 mV/div ±20% into a 50 Ω load

Bandwidth, typical 100 MHz into a 50 Ω load

n Auxiliary Output levels Rear-panel BNC connector, provides a TTL-compatible,

negative-polarity pulse for each A or B trigger (selectable)

high V

out

≥2.5 V into open circuit, ≥1.0 V into 50 Ω load

Auxiliary Output pulse width, typical Pulse width varies, 1 s minimum

External Reference Input Rear-panel BNC connector

9.8 MHz to 10.2 MHz

1 kHz ±5%

low (true)

out

≤0.7 V with ≤4mAsink, ≤0.25 V into 50 Ω load

Side-panel I/O ports Ports located on the side panel

TDS5000B Series Specifications and Performance Verification

200 mV

p-p

to7V

p-p

<1.5 kΩ in series with ~10 nF DC blocking capacitor

1- 19

Specifications

Table 1- 6: Input/output port specifications (Cont.)

Characteristic Description

Parallel port (IEEE 1284) DB-25 connector, supports the following modes:

Standard, output only

Bidirectional, PS-2 compatible

Bidirectional Enhanced Parallel Port (IEEE 1284 standard, mode 1 or mode 2, v 1.7)

Bidirectional High-speed Extended Capabilities Port

Audio ports Miniature phone jacks for stereo microphone input and

stereo line output

USB port (2) Allows connection of USB keyboard/mouse and or other

devices while scope power is on

Supports USB 2.0 protocol

Keyboard port PS-2 compatible, oscilloscope power must be off to make

connection

Mouse port PS-2 compatible, oscilloscope power must be off to make

connection

LAN port RJ-45 connector, supports 10 base-T and 100 base-T

Serial port (COM1) DB-9 connector, uses NS16C550-compatible UARTS,

transfer speeds up to 115.2 kb/s

SVGA video port Upper video port, DB-15 female connector, connect a

second monitor to use dual-monitor display mode, supports Basic requirements of PC99 specifications

GPIB port IEEE 488.2 standard interface

Scope VGA video port Lower video port, DB-15 female connector, 31.6 kHz

sync, EIA RS-343A compliant, connect to show the oscilloscope display, including live waveforms, on an external monitor

Table 1- 7: Data storage specifications

Characteristic Description

CD-ROM Side-panel CD-R/W drive; reads CD/CD-ROM, CD-R, and

CD-R/W disks

24X read speed; 24X write speed

1- 20

Floppy disk Front-panel 3.5 in USB floppy disk drive, 1.44 MB

capacity

Hard disk Standard internal hard disk capacity: 80 GB

External hard disk capacity: refer to added options

TDS5000B Series Specifications and Performance Verification

Specifications

Table 1- 8: Power source specifications

Characteristic Description

Source voltage and frequency 100 to 240 V

Power consumption ≤220 Watts

Fuse rating Internal to power supply; not serviceable by user

Nonvolatile memory retention CMOS settings stored for a period of 3 years without

instrument connection to power mains

Calibration settings and error log entries stored for 1 million cycles or 20 years

Overvoltage Category Overvoltage Category II (as defined in IEC61010-1/A2)

±10%,47Hzto63Hz

RMS

Table 1- 9: Mechanical specifications

Characteristic Description

Weight

Benchtop configuration 24.75 lbs (10.2 kg) oscilloscope only

56.5 lbs (25.6 kg) when packaged for domestic shipment

Rackmount kit 5 lbs (2.3 kg) rackmount conversion kit

8 lbs (3.6 kg) kit packaged for domestic shipment

Dimensions

Benchtop configuration Height: 14.2 in (360.7 mm)

Height:, feet extended:14.25 in (362 mm) Width: 17.6 in (447 mm) Depth: 11.35 in (288.3 mm)

Rackmount configuration (Option 1R)

Cooling Fan-forced air circulation with no air filter

Required clearances Top 0in(0mm)

Height: 10.5 in (267 mm) Width: 19 in (483 mm) Depth: 9.1 in (231 mm)

Bottom 0.25 in minimum or

0 in (0 mm) when standing on the feet

Left side 3in(76mm)

Right side 0in[5in(126mm)required

to access CD-ROM]

Front 0in(0mm)

TDS5000B Series Specifications and Performance Verification

Rear 0in(0mm)

1- 21

Specifications

Table 1- 9: Mechanical specifications (Cont.)

Characteristic Description

Construction material Chassis parts constructed of aluminum alloy; front-panel

constructed of plastic laminate; circuit boards constructed of glass laminate; outer shell molded and textured from a polycarbonate/ABS blend

Table 1- 10: Environmental specifications

Characteristic Description

Temperature

Operating +5 °Cto+45°C(+41°Fto+113°F)

+15 °Cto+45°C 〈+59 °Fto+113 °F) with integrated printer, Option 1P, installed

Nonoperating -- 2 0 °Cto+60°C(--4°F to +140 °F)

Humidity

Operating 20% to 80% relative humidity with a maximum wet bulb

temperature of +29 °C (84.2 °F) at or below +45 °C (113 °F), noncondensing

Upper limit derated to 30% relative humidity at +45 °C (113 °F)

Nonoperating With no diskette in floppy disk drive

5% to 90% relative humidity with a maximum wet bulb temperature of +29 °C (84.2 °F) at or below +60 °C (+140 °F), noncondensing

Upper limit derated to 20% relative humidity at +60 °C (+140 °F)

Altitude

Operating 10,000 ft (3,048 m)

Nonoperating 40,000 ft (12, 190 m)

Random vibration

Operating 0.1 g

Nonoperating 2.0 g

Shock, nonoperating 30 g (11 ms half -sine wave) or less

RMimesS

axis

RMS

from 5 Hz to 500 Hz, 10 minutes on each

from 5 Hz to 500 Hz, 10 minutes on each axis

1- 22

TDS5000B Series Specifications and Performance Verification

Table 1- 11: Certifications and compliances

Category Standards or description

Specifications

EC Declaration of Conformity -EMC

Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility. Compliance was demonstrated to the following specifications as listed in the Official Journal of the European Union:

EN 61326 Emissions

EN 61326 Immunity

1, 3, 4

1, 4

Class A Radiated and Conducted Emissions

IEC 61000-4-2 Electrostatic Discharge Immunity

±4 kV contact discharge, ±8 kV air discharge

IEC 61000-4-3 RF field immunity

3V/m,80MHzto1GHz, 80% amplitude modulated with a 1 kHz sinewave

IEC 61000-4-4 Electrical Fast Transient/Burst Immunity

1 kV on AC mains, 500 V on I/O

IEC 61000-4-5 AC Surge Immunity

500 V differential mode, 1 kV common mode

IEC 61000-4-6 RF Conducted Immuni ty

3 V, 150 kHz to 80 MHz, amplitude modulated with a 1 kHz sinewave

IEC 61000-4-11 AC Mains Voltage Dips and Interruption Immunity

100% reduction for one cycle

EN 61000-3-2 Power Harmonic Current Emissions

EN 61000-3-3 Voltage Changes, Fluctuations, and Flicker

Use low-EMI shielded interconnect cables, equivalent to the following Tektronix cables: GPIB cable: 012-0991-01, 012-0991-02, or 012-0991-03. RS-232 cable: 012-1213-00 or CA part number 0294-9. Centronics Cable: 012-1214-00 or LCOM part number CTL3VGAMM-5 VGA Cable.

Under theses conditions, the specifications are amended as follows: 1 mV/division to 1 V/division: ≤0.2 division waveform displacement or ≤0.4 division increase in peak-to-peak noise.

Radiated emissions may exceed the levels specified in EN 61326 when this oscilloscope is connected to a test object.

Tested in accordance with EN 61326 Annex D.

FCC Radiated and conducted emissions do not exceed the levels specified in FCC47 CFR, Part 15,

Subpart B, for Class A equipment.

TDS5000B Series Specifications and Performance Verification

1- 23

Specifications

Table 1- 11: Certifications and compliances (cont.)

Category Standards or description

EC Declaration of Conformity -Low Voltage

U.S. Nationally Recognized Testing Laboratory Listing

Canadian Certification CAN/CSA C22.2, Safety requirements for electrical equipment for measurement,

Additional Compliance IEC61010-1/A2 Safety requirements for electrical equipment for measurement,

Installation (Overvoltage) Category

Pollution Degree A measure of the contaminates that could occur in the environment around and wit hin a product.

Safety Certification Compliance

Equipment Type Test and measuring

Safety Class Class 1 (as defined in IEC 61010-1/A2) -- grounded product

Pollution Degree Pollution Degree 2 as defined in IEC 61010-1/ A2

Compliance was demonstrated to the following specification as listed in the Official Journal of the European Union:

Low Voltage Directive 73/23/EEC, amended by 93/68/EEC

EN 61010-1/A2:1995 Safety requirements for electrical equipment for measurement

control and laboratory use.

UL3111-1, First Edition Standard for electrical measuring and test equipment.

No. 1010.1-92 control, and laboratory use.

control, and laboratory use.

Terminals on this product may have different installation (overvoltage) category designations. The installation categories are:

CAT III Distribution-level mains (usually permanently connected). Equipment at this level is

typically in a fixed industrial location.

CAT II Local-level mains (wall sockets). Equipment at this level includes appliances, portable

tools, and similar products. Equipment is usuall y cord-connected.

CAT I Secondary (signal level) or battery operated circuits of electronic equipment.

Typically the internal environment inside a product is considered to be t he same as the external. Products should be used only in the environment for which they are rated.

Pollution Degree 2 Normally only dry, nonconductive pollution occurs. Occasionally a

temporary conductivity that is caused by condensation must be expected. This location is a typical office/home environment. Temporary condensation occurs only when the product is out of service.

1- 24

Rated for indoor use only

TDS5000B Series Specifications and Performance Verification

Performance Verification

Two types of Performance Verification procedures can be performed on this product: Brief Procedures and Performance Tests. You may not need to perform all of these procedures, depending on what you want to accomplish.

H To rapidly confirm oscilloscope function and proper adjustment, perform the

procedures under Self Tests, which begin on page 2--5.

Advantages: These procedures are quick to do, require no external equipment or signal sources, and perform extensive functional and accuracy testing to provide high confidence that the oscilloscope will perform properly. They can be used as a quick check before making a series of important measurements.

H To further check functionality, first perform the Self Tests just mentioned;

then perform the procedures under Functional Tests that begin on page 2--6.

Advantages: These procedures require minimal additional time to perform, require no additional equipment other than a 10X probe such as a P5050, and more completely test the internal hardware of the oscilloscope. They can be used to quickly determine if the oscilloscope is suitable for putting into service, such as when it is first received.

H If more extensive confirmation of performance is desired, do the Perform-

ance Tests, beginning on page 2--17, after doing the Functional and Self Tests

mentioned above.

Advantages: These procedures add direct checking of the warranted specifications marked with the n symbol in the Specifications section. These procedures are fairly quick to execute but require specific test equipment. (See Table 2--1: Test equipment on page 2--18).

If you are not familiar with operating this oscilloscope, read the oscilloscope reference or user manuals or explore the online help.

TDS5000B Series Specifications and Performance Verification

2- 1

Performance Verification

Conventions

Throughout the performance verifications procedures the following conventions apply:

H Each test procedure uses the following general format:

H Title of Test

H Equipment Required

H Prerequisites

H Procedure

H Each procedure consists of as many steps, substeps, and subparts as required

to perform the test. Steps, substeps, and subparts are sequenced as follows:

1. First Step

a. First Substep

H First Subpart

H Second Subpart

b. Second Substep

2. Second Step

H In steps and substeps, the lead-in statement in italics instructs you what to

do, while the instructions that follow tell you how to do it, as in the example step below:

Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.

H Where instructed to use a control in the display or a front-panel button or

knob, the name of the control, button, or knob appears in boldface type. Where instructed to make or verify a setting, the value of the setting also appears in boldface type.

STOP.TheSTOP notation at the left is accompanied by information you must read to do the procedure properly.

H The term “toolbar” refers to a row of buttons at the top of the display. The

term “menu bar” refers to a row of menus at the top of the display . You can switch between toolbar and menu bar operating modes by clicking the button near the top right corner of the display. See Figure 2--1.

2- 2

TDS5000B Series Specifications and Performance Verification

Toolbar

Performance Verification

Menu bar

Click here to change to

menu bar mode

Click here to change to

toolbar mode

Figure 2- 1: Toolbar and m enu bar

H The procedures to follow assume that you have connected a mouse to the

oscilloscope so that you can click on the screen controls. If you have not connected a mouse, you can use the optional touch screen to operate all the screen controls.

TDS5000B Series Specifications and Performance Verification

2- 3

Performance Verification

2- 4

TDS5000B Series Specifications and Performance Verification

Brief Procedures

Self Tests

The Self Tests use internal routines to confirm basic functionality and proper adjustment. No test equipment is required to perform these test procedures.

The Functional Tests utilize the probe-compensation output at the front panel as a test-signal source for further verifying that the oscilloscope functions properly. A 10X probe, such as a P5050, is required to perform these test procedures.

This procedure uses internal routines to verify that the oscilloscope is adjusted and functioning properly. No test equipment or hookups are required.

Verify Internal Adjustment,

Self Compensation, and

Diagnostics

Equipment required

Prerequisites Power on the oscilloscope and allow a 20 minute warm-up before

1. Verify that internal diagnostics pass: Perform the following substeps to

verify passing of internal diagnostics.

a. Display the System diagnostics menu:

H If the oscilloscope is in toolbar mode, click the MENU button to put

the oscilloscope into menu bar mode.

H Pull down the Utility menu and select Instrument Diagnostics. . . .

This displays the diagnostics control window.

b. Run the System Diagnostics:

H First disconnect all input signals from the instrument.

H Click the Run button in the diagnostics control window.

c. Wait: The internal diagnostics do an exhaustive verification of proper

oscilloscope function. This verification may take several minutes. When the verification is complete, the resulting status will appear in the diagnostics control window.

None

initiating this test procedure.

d. Verify that no failures are found and reported on-screen. All tests should

pass. If any failures occur, you can use the GPIB command DIAG:RE- SULTS:VERBOSE? to query for details on the errors.

TDS5000B Series Specifications and Performance Verification

2- 5

Brief Procedures

e. Run the signal-path compensation routine:

H Pull down the Utilities menu and select Instrument Calibra-

tion.... This displays the instrument calibration control window.

NOTE. Signal Path Compensation is not valid until the oscilloscope reaches a valid temperature. Calibration Status must be Pass.

H Click the Calibrate button to start the routine.

f. Wait: Signal-path compensation may take ten minutes to run.

g. Confirm signal-path compensation returns passed status: Verify that the

word Pass appears in the instrument calibration control window.

2. Return to regular service: Click the Close button to exit the instrument

calibration control window.

Functional Tests

The purpose of these procedures is to confirm that the oscilloscope functions properly. The only equipment required is a 10X probe, such as a P5050.

To check the file system, a 3.5 inch, 720 K or 1.44 Mbyte, formatted floppy disk is required.

NOTE. If your instrument includes Option FHD (Front-Panel Removable Hard Disk Drive) you do not have a floppy disk drive. If you need to store settings during these procedures, access the local C:drive and store them in the TekScope > Setups directory.

STOP. The following procedures verify instrument functionality; that is, they verify that oscilloscope features operate properly. They do not verify that they operate within limits.

For example, when the instructions in the following functional tests request that you verify that a signal appears on-screen “that is about five divisions in amplitude” or “has a period of about six horizontal divisions,” do NOT interpret these quantities as given limits. Operation within limits is checked in Performance Tests, which begin on page 2--17.

2- 6

TDS5000B Series Specifications and Performance Verification

Brief Procedures

STOP. In the following procedures, do not make changes to front-panel settings that are not specifically called out. Each verification procedure requires that you to set the oscilloscope to certain default settings before verifying functions. If you make changes to settings other than those called out in a procedure, you may obtain invalid results. In such cases, repeat the procedure starting over from step 1.

If you are instructed to press a front-panel or screen button, the button may already be selected (its label will be highlighted). If this is the case, it is not necessary to press the button.

Verify All Input Channels

Equipment required

Prerequisites None

One 10X oscilloscope probe, such as Tektronix P5050

1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.

2. Hook up the signal source: Connect the probe to the probe compensation

connector and the channel input that you want to test (beginning with CH 1) as shown in Figure 2--2.

TDS5000B Series oscilloscope

Probe from PROBE COMPENSATION output to CH 1 input

Figure 2- 2: Universal test hookup for functional tests - CH 1 shown

3. Turn off all channels:If any of the front-panel channel buttons are lighted,

push those buttons to turn off the displayed channels. See Figure 2--3.

TDS5000B Series Specifications and Performance Verification

2- 7

Brief Procedures

Channel buttons

Figure 2- 3: Channel button location

4. Select the channel to test: Push the channel button for the channel that you

are currently testing. The button lights, and the channel display comes on.

5. Set up the oscilloscope: Push the front panel AUTOSET button. This sets

the horizontal and vertical scale for a usable display and also sets the trigger source to the channel that you are testing.

6. Verify that the channel is operational: Confirm that the following statements

are true.

H The vertical scale readout for the channel under test shows a setting of

500 mV, and a square-wave probe-compensation signal about 2 divisions in amplitude is on-screen.

H The front-panel vertical POSITION knob (for the channel that you are

testing) moves the signal up and down the screen when rotated.

H Turning the vertical SCALE knob counterclockwise (for the channel that

you are testing) decreases the amplitude of the waveform on-screen, turning the knob clockwise increases the amplitude, and returning the knob to 500 mV returns the amplitude to about 2 divisions.

7. Verify that the channel acquires in all acquisition modes: Pull down the

Horiz/Acq menu to select Horizontal/Acquisition Setup. . . . Click the

Acquisition tab in the control window that displays. Click each of the six acquisition modes and confirm that the following statements are true.

H Sample mode displays an actively acquiring waveform on-screen. (Note

that there is a small amount of noise present on the square wave).

H Peak Detect mode displays an actively acquiring waveform on-screen

with the noise present in Sample mode “peak detected.”

2- 8

H Hi Res mode displays an actively acquiring waveform on-screen with the

noise that was present in Sample mode reduced.

TDS5000B Series Specifications and Performance Verification

Brief Procedures

H Average mode displays an actively acquiring waveform on-screen with

the noise reduced.

H Envelope mode displays an actively acquiring waveform on-screen with

the noise displayed.

H WMFDB Mode displays an actively acquiring waveform on-screen with

noise. All channels will change to a red color.

8. Test all channels: Repeat steps 2 through 7 until all input channels are

verified.

9. Remove the test hookup: Disconnect the probe from the channel input and

the probe compensation output.

Verify the Time Base

Equipment required

Prerequisites None

One 10X oscilloscope probe, such as Tektronix P5050

1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.

2. Hook up the signal source: Connect the probe to the probe compensation

output and to the CH 1 input as shown in Figure 2--4.

TDS5000B Series oscilloscope

Probe from PROBE COMPENSATION output to CH 1 input

Figure 2- 4: Setup for time base t est

3. Set up the oscilloscope: Push the front panel AUTOSET button.

4. Set the time base: Set the horizontal SCALE to 200 s/div. The time-base

readout is displayed at the bottom of the graticule.

5. Verify that the time base operates: Confirm the following statements.

H One period of the square-wave probe-compensation signal is about five

horizontal divisions on-screen for the 200 s/div horizontal scale setting.

TDS5000B Series Specifications and Performance Verification

2- 9

Brief Procedures

H Rotating the horizontal SCALE knob clockwise expands the waveform

on-screen (more horizontal divisions per waveform period), counterclockwise rotation contracts it, and returning the horizontal scale to 200 s/div returns the period to about five divisions.

H The horizontal POSITION knob positions the signal left and right

on-screen when rotated.

6. Verify horizontal delay:

a. Center a rising edge on screen:

H Set the horizontal POSITION knob so the rising edge, where the

waveform is triggered, lines up with the center horizontal graticule.

H Change the horizontal SCALE to 20 s/div. The rising edge of the

waveform should remain near the center graticule and the falling edge should be off screen.

b. Turn on and set horizontal delay:

H Pull down the Horiz/Acq menu to select Horizontal/Acquisition

Setup. . . .

H Click the Horizontal tab in the control window that displays.

H Click the Delay Mode button to turn delay on.

H Double click the Horiz Delay control in the control window to

display the pop-up keypad. Click the keypad buttons to set the horizontal delay to 500 s, and then click the ENTER key.

c. Verify the waveform: Verify that a falling edge of the waveform is within

a few divisions of center screen.

d. Adjust the horizontal delay: Rotate the upper multipurpose knob to

change the horizontal delay setting. Verify that the falling edge shifts horizontally. Rotate the front-panel horizontal POSITION knob. Verify that this knob has the same effect (it also adjusts delay, but only when delay mode is on).

e. Verify the delay toggle function:

H Rotate the front-panel horizontal POSITION knob to center the

falling edge horizontally on the screen.

2- 10

H Change the horizontal SCALE to 40 ns/div (50 ns/div for

TDS5054BE). The falling edge of the waveform should remain near the center graticule. If not, readjust the delay setting to center the falling edge.

TDS5000B Series Specifications and Performance Verification

Brief Procedures

H Push the front-panel DELAY button several times to toggle delay off

and on and back off again. Verify that the display switches quickly between two different points in time (the rising and falling edges of this signal).

7. Remove the test hookup: Disconnect the probe from the channel input and

the probe compensation output.

Verify the A (Main) and B

(Delayed) Trigger Systems

Equipment required

Prerequisites None

One 10X oscilloscope probe, such as Tektronix P5050

1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.

2. Hook up the signal source: Connect the probe to the probe compensation

output and to the CH 1 input as shown in Figure 2--5.

TDS5000B Series oscilloscope

Probe from PROBE COMPENSATION output to CH 1 input

Figure 2- 5: Setup for trigger test

3. Set up the oscilloscope: Push the front-panel AUTOSET button.

4. Verify that the main trigger system operates: Confirm that the following

statements are true.

H The trigger level readout for the A (main) trigger system changes with

the trigger-LEVEL knob.

H The trigger-LEVEL knob can trigger and untrigger the square-wave

signal as you rotate it. (Leave the signal untriggered).

H Pushing the front-panel trigger LEVEL knob sets the trigger level to the

50% amplitude point of the signal and triggers the signal that you just left untriggered. (Leave the signal triggered.)

TDS5000B Series Specifications and Performance Verification

2- 11

Brief Procedures

5. Verify that the delayed trigger system operates:

a. Set up the delayed trigger:

H Pull down the Trig menu and select A→B Trigger Sequence. . . .

This displays the A→B Sequence tab of the trigger setup control window.

H Click the Trig After Time button under A Then B.

H Click the B Trig Level control in the control window.

H Set the Trigger MODE to NORM.

b. Confirm that the following statements are true:

H The trigger-level readout for the B trigger system changes as you

turn the lower multipurpose knob.

H As you rotate the lower multipurpose knob, the square-wave

probe-compensation signal can become triggered and untriggered. (Leave the signal triggered.)

Verify the File System

c. Verify the delayed trigger counter:

H Double-click the Trig Delay control to pop up a numeric keypad for

that control.

H Click on the keypad to enter a trigger delay time of 1 second,and

then click Enter.

H Verify that the TRIG’D indicator on the front panel flashes about

once every second as the waveform is updated on-screen.

6. Remove the test hookup: Disconnect the probe from the channel input and the probe compensation output.

Equipment required

Prerequisites None

One 10X oscilloscope probe, such as Tektronix P5050

One 720 K or 1.44 Mbyte, 3.5 inch DOS-compatible formatted disk. If your instrument does not include a floppy disk drive, see the Note on page 2--6.

1. Initialize the oscilloscope: Push the front-panel DEFAULT SETUP button.

2. Hook up the signal source: Connect the probe to the probe compensation

output and the CH 1 input as shown in Figure 2--6.

2- 12

TDS5000B Series Specifications and Performance Verification

Brief Procedures

TDS5000B Series oscilloscope

Probe from PROBE COMPENSATION output to CH 1 input

Figure 2- 6: Setup for the file system test

3. Insert the test disk: Insert the floppy disk in the floppy disk drive at the top

of the front panel. If your instrument does not include a floppy disk drive, see the Note on page 2--6.

4. Set up the oscilloscope: Push the front panel AUTOSET button.

5. Set the time base: Set the horizontal SCALE to 1ms/div. The time-base

readout is displayed at the bottom of the graticule.

6. Save the settings:

a. From the File menu select Save As. This displays the Save As dialog

box.

b. In the Save What field click Waveform.

c. In the Source drop-down list box select CH1.

d. In the Save in drop-down list box select 3

/2Floppy.

e. Note the default file name.

f. Click the Save button to save the waveform to the floppy disk.

7. Change the settings again: Set the horizontal SCALE to 200 s/div.

8. Verify the file system works:

a. From the File menu select Recall. This displays the Recall dialog box.

b. In the Recall What field click Waveform.

c. In the Look in drop-down list box select 3

/2Floppy. If your instrument

does not include a floppy disk drive, see the Note on page 2--6.

d. Locate and select the waveform file name you previously stored.

e. Click the Recall button to display the stored waveform on screen.

TDS5000B Series Specifications and Performance Verification

2- 13

Brief Procedures

f. Verify that the oscilloscope retrieved the saved waveform from the disk.

Do this by noticing the horizontal SCALE is again 1 ms and the waveform shows ten cycles just as it did when you saved the setup.

9. Remove the test hookup:

a. Disconnect the probe from the channel input and the probe compensation

output.

b. Remove the floppy disk from the floppy disk drive, if present.

Verify the Internal Printer

(Optional)

Equipment required

Prerequisites None

Integrated Thermal Printer (Option 1P)

1. From the Windows desktop, select Start > Settings > Control Panel.

2. Open the Printers file.

3. Right-click on the Integrated Thermal Printer icon; then select Properties.

4. Click the General tab.

5. Click PrintTestPage.

6. Verify that the test page advances through the printer and prints clearly.

Refer to Figure 2--7 on page 2--15 for a sample of the test page.

2- 14

TDS5000B Series Specifications and Performance Verification

Brief Procedures

Figure 2- 7: Example test page f rom the internal printer

TDS5000B Series Specifications and Performance Verification

2- 15

Brief Procedures

2- 16

TDS5000B Series Specifications and Performance Verification

Performance Tests

This section contains a collection of manual procedures for checking that the TDS5000B Series Oscilloscopes performs as warranted. The preceding procedures are faster to complete, and should be done first if you intend to perform the performance tests.

The procedures are arranged in four logical groupings: Signal Acquisition System

Checks, Time Base System Checks, Triggering System Checks,andOutput Ports Checks. They verify all characteristics designated as checked in the Specifications section. (The characteristics that are checked appear with a n).

STOP. The following procedures extend the confidence level provided by the basic procedures described on page 2--5. The basic procedures should be completed first; then complete the procedures in this section, if desired.

Prerequisites

The tests in this section comprise an extensive, valid confirmation of performance and functionality when the following requirements are met:

H The cover is not removed from the oscilloscope.

H You have performed and passed the procedures under Self Tests, found on

page 2--5, and those under Functional Tests, found on page 2--6.

H You have completed a signal-path compensation within the recommended

calibration interval and at a temperature within ±5 _C(±9 _F) of the present operating temperature. (If at the time you did the prerequisite Self Tests, the temperature was within the limits just stated, consider this prerequisite met).

H The oscilloscope was last adjusted at an ambient temperature between 20 _C

(68 _F) and 30 _C(86_F), has been warmed-up for a period of at least 20 minutes, and is operating within the ambient temperature described in Table 1--10 on page 1--22. (The warm-up requirement is usually met in the course of meeting the Self Tests and Functional Tests prerequisites listed above).

TDS5000B Series Specifications and Performance Verification

2- 17

Performance Tests

Equipment Required

Table 2- 1: Test equipment

Item number and description

The procedures starting on page 2--24 use external, traceable, signal sources to check warranted characteristics. Table 2--1 lists recommended equipment.

Minimum requirements Example Purpose

1. Attenuator,10X (two required)

Ratio: 10X; impedance 50 Ω; connectors: female BNC input, male BNC

Tektronix part number 011-0059-02

output

2. Attenuator, 5X Ratio: 5X; impedance 50 Ω; connec-

tors: female BNC input, male BNC

Tektronix part number 011-0060-02

output

3. Termination, 50 Ω Impedance 50 Ω; connectors: femal e

BNC input, male BNC output

4. Cable, Precision 50 Ω Coaxial (three required)

5. Connector, Dual-Banana

50 Ω, 36 in, male-to-male BNC connectors

Female BNC-to-dual banana Tektronix part number

(two required)

Tektronix part number 011-0049-01

Tektronix part number 012-0482-00

103-0090-00

6. Connector, BNC “T” Male BNC-to-dual female BNC Tektronix part number

103-0030-00

7. Coupler, Dual-Input Female BNC-to-dual male BNC Tektronix part number

067-0525-02

8. Probe, 10X A P5050, P6243, or P6245 probe

Tektronix part number P5050 or P6245

9. Floppy disk 3.5 inch, 720 K or 1.44 Mbyte,

DOS-compatible floppy disk

10. Generator, DC Calibration

Variable amplitude to ±104 V; accuracy to 0.1%

11. Generator, Calibration 500 mV square wave calibrator

Standard IBM PC-compatible disk

Wavetek 9500

amplitude; accuracy to 0.25%

12. Generator, Time Mark (optional)

Variable marker frequency from 10 ms to 10 ns; accuracy within 2 ppm

13. Generator, Sine Wave 250 kHz to ≥500 MHz (higher for

Wavetek 9500

higher-bandwidth oscilloscopes). Variable amplitude from 60 mV to 2V

into 50 Ω. Frequency error

p-p

>2.0%

14. Meter, Level and Power Sensor

Frequency range: 10 MHz to the oscilloscope bandwidth. Amplitude range: 6 mV

p-p

to2V

p-p

15. Splitter, Power Frequency range: DC to 4 GHz.

Wavetek 9500

Tracking: >2.0%

Signal Attenuation

Signal Termination for Channel Delay Test

Signal Interconnection

Various Accuracy Tests

Checking Trigger Sensitivity

Checking Delay Between Channels

Signal Interconnection

Checking File System Basic Functionality

Checking DC Offset, Gain, and Measurement Accuracy

To check accuracy of Signal Out

Checking Sample-Rate and Delay-time Accuracy

Checking Analog Bandwidth, Trigger Sensitivity, Samplerate, External Clock, and Delay-Time Accuracy

Checking Analog Bandwidth and Trigger Sensitivity

Checking Analog Bandwidth

2- 18

TDS5000B Series Specifications and Performance Verification

Table 2- 1: Test equipment (Cont.)

Item number and description

Performance Tests

PurposeExampleMinimum requirements

16. Adapter (three required) SMA female-to-female Tektronix part number 015-1012-00

17. Adapter (three required) SMA male-to-female BNC Tektronix part number 015-1018-00

18. Pulse Generator 250 MHz, ≤1 ns rise time, 5 V out Wavetek 9500

1,2

Checking the delay between channels

UsedtoTestDeltaTime Measurement Accuracy

19. Cable, Coaxial

(two required)

20. Adapter (four required) Male N-to-female BNC Tektronix part number

50 Ω, 20 in, male-to-male SMA connectors

Tektronix part number 174-1427-00

UsedtoTestDeltaTime Measurement Accuracy

Checking Analog Bandwidth

103-0045-00

21. Adapter Female N-to-male BNC Tektronix part number

Checking Analog Bandwidth

103-0058-00

22. Adapter SMA “T”, male to 2 SMA female Tektronix part number 015-1016-00

23. Adapter SMA female to BNC male Tektronix part number 015-0572-00

24. Adapter BNC male to female elbow Tektronix part number 103-0031-00

25. Adapter BNC female to clip lead Tektronix part number 013--0076--00

26. Termination Short circuit, SMA connector Tektronix part number 015-1021-00

27. Attenuator, 2X Ratio: 2X; impedance 50 Ω; c onnec-

tors: female BNC input, male BNC

Tektronix part number 011-0069-02

UsedtoTestDeltaTime Measurement Accuracy

Used to Test Probe Compensation Output

UsedtoTestDeltaTime Measurement Accuracy

output

28. Mouse or keyboard Tektronix part numbers:

Used to input test selections 119-6298-xx (mouse) 119-6297-xx (keyboard)

Wavetek 9500/Option 100 and output head appropriate for the bandwidth of the oscilloscope under test (9520, 9530, 9550). Warning: This generator can output dangerous voltages. Set the generator to Off or 0 volts before connecting, disconnecting, or changing any test hookup during all procedures to follow. Also read the Warning statement on page 2- 24.

For Delta Time Measurement Accuracy, use a Wavetek 9500 or a pulse generator with a rise time as shown in Table 2- 4 on page 2- 44.

Warning: The P6243 and P6245 probes that may be used with this oscilloscope provide an extremely low loading capacitance (<1 pF) to ensure the best possible signal reproduction. These probes should not be used to measure signals exceeding ±8 V, or errors in signal measurement will be observed. Above 40 V, damage to the probe may result. To make measurements beyond ±8 V, use either the P5050 probe (good to 500 V), or refer to the catalog for a recommended probe.

TDS5000B Series Specifications and Performance Verification

2- 19

Performance Tests

TDS5000B Series Test Record

Photocopy this table and use it to record the performance test results for your TDS5000B Series Oscilloscope.

TDS 5000B Series Test Record

Instrument Serial Number: Certificate Number: Temperature: RH %: Date of Calibration: Technician:

TDS5000B Series performance test Minimum Incoming Outgoing Maximum

DC voltage measurement accuracy (averaged)

CH1 5 mV Vert scale setting,

--5 Div position setting, +1 V offset

CH1 5 mV Vert scale setting,

+5 Div position setting, --1 V offset

CH1 200 mV Vert scale setting,

--5 Div position setting, +10 V offs et

CH1 200 mV Vert scale setting,

+5 Div position setting, --10 V offset

CH1 1.01 V Vert scale setting,

--5 Div position setting, +10 V offs et

CH1 1.01 V Vert scale setting,

+5 Div position setting, --10 V offset

CH2 5 mV Vert scale setting,

--5 Div position setting, +1 V offset

CH2 5 mV Vert scale setting,

+5 Div position setting, --1 V offset

CH2 200 mV Vert scale setting,

--5 Div position setting, +10 V offs et

CH2 200 mV Vert scale setting,

+5 Div position setting, --10 V offset

CH2 1.01 V Vert scale setting,

--5 Div position setting, +10 V offs et

CH2 1.01 V Vert scale setting,

+5 Div position setting, --10 V offset

CH3 5 mV Vert scale setting,

--5 Div position setting, +1 V offset

CH3 5 mV Vert scale setting,

+5 Div position setting, --1 V offset

CH3 200 mV Vert scale setting,

--5 Div position setting, +10 V offs et

+ 1.0353 V __________ __________ + 1.0447 V

-- 1.0447 V __________ __________ -- 1.0353 V

+ 11.4989 V __________ __________ + 11.7011 V

-- 11.7011 V __________ __________ -- 11.4989 V

+ 17.602 V __________ __________ + 18.398 V

-- 18.398 V __________ __________ -- 17.602 V

+ 1.0353 V __________ __________ + 1.0447 V

-- 1.0447 V __________ __________ -- 1.0353 V

+ 11.4989 V __________ __________ + 11.7011 V

-- 11.7011 V __________ __________ -- 11.4989 V

+ 17.602 V __________ __________ + 18.398 V

-- 18.398 V __________ __________ -- 17.602 V

+ 1.0353 V __________ __________ + 1.0447 V

-- 1.0447 V __________ __________ -- 1.0353 V

+ 11.4989 V __________ __________ + 11.7011 V

2- 20

TDS5000B Series Specifications and Performance Verification

TDS 5000B Series Test Record (cont.)

Instrument Serial Number: Certificate Number: Temperature: RH %: Date of Calibration: Technician:

TDS5000B Series performance test MaximumOutgoingIncomingMinimum

Performance Tests

CH3 200 mV Vert scale setting,

+5 Div position setting, --10 V offset

CH3 1.01 V Vert scale setting,

--5 Div position setting, +10 V offs et

CH3 1.01 V Vert scale setting,

+5 Div position setting, --10 V offset

CH4 5 mV Vert scale setting,

--5 Div position setting, +1 V offset

CH4 5 mV Vert scale setting,

+5 Div position setting, --1 V offset

CH4 200 mV Vert scale setting,

--5 Div position setting, +10 V offs et

CH4 200 mV Vert scale setting,

+5 Div position setting, --10 V offset

CH4 1.01 V Vert scale setting,

--5 Div position setting, +10 V offs et

CH4 1.01 V Vert scale setting,

+5 Div position setting, --10 V offset

Analog bandwidth

CH1 100 mV 424 mV __________ __________ N/A

CH2 100 mV 424 mV __________ __________ N/A

CH3 100 mV 424 mV __________ __________ N/A

CH4 100 mV 424 mV __________ __________ N/A

Delay between channels N/A __________ __________ 100 ps

-- 11.7011 V __________ __________ -- 11.4989 V

+ 17.602 V __________ __________ + 18.398 V

-- 18.398 V __________ __________ -- 17.602 V

+ 1.0353 V __________ __________ + 1.0447 V

-- 1.0447 V __________ __________ -- 1.0353 V

+ 11.4989 V __________ __________ + 11.7011 V

-- 11.7011 V __________ __________ -- 11.4989 V

+ 17.602 V __________ __________ + 18.398 V

-- 18.398 V __________ __________ -- 17.602 V

TDS5000B Series Specifications and Performance Verification

2- 21

Performance Tests

TDS 5000B Series Test Record (cont.)

Instrument Serial Number: Certificate Number: Temperature: RH %: Date of Calibration: Technician:

TDS5000B Series performance test MaximumOutgoingIncomingMinimum

Channel isolation: 100 MHz

Input to CH 1

CH 2 CH 3 CH 4

Channel isolation: 100 MHz

CH 1

Input to CH 2

CH 3 CH 4

Channel isolation: 100 MHz

CH 1 CH 2

Input to CH 3

CH 4

Channel isolation: 100 MHz

CH 1 CH 2 CH 3

Input to CH 4

Channel isolation: Full Bandwidth

Input to CH 1

CH 2 CH 3 CH 4

Channel isolation: Full Bandwidth

CH 1

Input to CH 2

CH 3 CH 4

Channel isolation: Full Bandwidth

CH 1 CH 2

Input to CH 3

CH 4

Channel isolation: Full Bandwidth

CH 1 CH 2 CH 3

Input to CH 4

N/A N/A N/A N/A

__________ __________ __________ __________

8.00 divisions

0.08 divisions

8.00 divisions

0.08 divisions

8.00 divisions

0.08 divisions

8.00 divisions

0.16 divisions

8.00 divisions

0.16 divisions

8.00 divisions

0.16 divisions

8.00 divisions

2- 22

TDS5000B Series Specifications and Performance Verification

Performance Tests

TDS 5000B Series Test Record (cont.)

Instrument Serial Number: Certificate Number: Temperature: RH %: Date of Calibration: Technician:

TDS5000B Series performance test MaximumOutgoingIncomingMinimum

Time base system

Long-term sample rate and delay time accuracy @ 100 ns/10.0 ms

Delta time measurement N/A Pass/Fail

Trigger system accuracy

Time accuracy for pulse, glitch, timeout, and Width, Hor. scale ≤ 1 s

Lower Limit Upper Limit

Time accuracy for pulse, glitch, timeout, and width, Hor. scale > 1 s

Lower Limit Upper Limit

CH1 trigger sensitivity, 50 MHz Pass/Fail __________ __________ Pass/Fail

CH1 delayed trigger sensitivity, 50 MHz Pass/Fail __________ __________ Pass/Fail

CH1 AUX trigger input, 50 MHz Pass/Fail __________ __________ Pass/Fail

CH1 trigger sensitivity, full bandwidth Pass/Fail __________ __________ Pass/Fail

CH1 delayed trigger sensitivity, full bandwidth Pass/Fail __________ __________ Pass/Fail

CH1 AUX trigger input, 100 MHz Pass/Fail __________ __________ Pass/Fail

Output signal checks

Auxiliary trigger output, open circuit

High Low

Auxiliary trigger output, 50 Ω

High Low

Analog signal output, 1 MΩ p-p ≥200 mV __________ __________ p-p ≤300 mV

Analog signal output, 50 Ω p-p ≥100 mV __________ __________ p-p ≤150 mV

Probe compensation output signal

Frequency 950 Hz __________ __________ 1.050 kHz

Voltage (difference) 990 mV __________ __________ 1010 mV

-- 1.5 divisions __________ __________ +1.5 divisions

3.5 ns

1.9 s

High ≥2.5 V __________

High ≥1.0 V __________

__________ __________

__________

__________ __________

6.5 ns

2.1 s

Low ≤0.7 V

Low ≤0.25 V

TDS5000B Series Specifications and Performance Verification

2- 23

Performance Tests

Signal Acquisition System Checks

The following procedures verify those characteristics that relate to the signal-acquisition system and are listed as checked under Warranted Characteristics in the Specifications section. Refer to Table 2--1 on page 2--18 for test equipment specifications.

NOTE. References to CH 3 and CH 4 apply to the TDS5034B, TDS5054B, TDS5054BE, and TDS5104B models only.

Check DC Voltage

Measurement Accuracy

WARNING. The generator is capable of outputting dangerous voltages. Be sure to set the DC calibration generator to off or 0 volts before connecting, disconnecting, and/or moving the test hookup during the performance of this procedure. Also, verify that the calibrator does not have shorting straps installed between the DC and sense outputs or grounds.

Equipment required

Prerequisites The oscilloscope must meet the prerequisites listed on page 2--17.

1. Install the test hookup and preset the instrument controls:

a. Hook up the test-signal source:

H Set the output of a DC calibration generator to off or 0 volts.

H Connect the output of a DC calibration generator through a

dual-banana connector followed by a 50 Ω precision coaxial cable to one side of a BNC T connector. See Figure 2--8.

H Connect the Sense output of the generator through a second

dual-banana connector followed by a 50 Ω precision coaxial cable to the other side of the BNC T connector. Now connect the BNC T connector to CH 1. See Figure 2--8.

Two dual-banana connectors (Item 5)

One BNC T connector (Item 6)

One DC calibration generator (Item 10)

Two precision 50 Ω coaxial cables (Item 4)

2- 24

TDS5000B Series Specifications and Performance Verification

Output Sense

DC calibrator

Dual banana to

BNC adapters

50 Ω coaxial cables

Figure 2- 8: Initial test hookup

b. Initialize the oscilloscope: Press DEFAULT SETUP.

c. Modify the default settings:

Performance Tests

TDS5000B Series oscilloscope

BNC T

connector

H From the toolbar bar, click Horiz and select the Acquisition tab.

H Click Average and set the number of averages to 16.

2. Confirm input channels are within limits for DC accuracy at maximum offset

and position: Perform the following substeps — test CH 1 first, skipping substep 2a, since CH 1 is already selected from step 1.

a. Select an unchecked channel:

H From the toolbar bar, click MEAS and then Clear to remove the

previous measurement.

H Press the Vertical button of the channel just confirmed to remove

the channel from the display.

H Press the front-panel Vertical button that corresponds to the channel

that you are to confirm.

H Set the generator output to 0 V.

H Move the test hookup to the channel that you selected.

b. Turn on the measurement Mean for the channel:

H From the toolbar bar, click MEAS and select the Ampl tab, and then

click Mean to measure the mean of the current channel.

H Press Close.

TDS5000B Series Specifications and Performance Verification

2- 25

Performance Tests

c. Set the vertical scale: Set the vertical SCALE to one of the settings

listed in Table 2--2 that is not yet checked. (Start with the first setting listed.)

Table 2- 2: DC Voltage measurement accuracy

Scale setting

5mV -- 5 +1 V +1.040 V +1.0353 V to +1.0447 V

200 mV -- 5 +10 V +11.6 V +11.4989 V to +11.7011 V

1.01 V -- 5 +10 V +18 V +17.602 V to +18.398 V

Position setting (Divs)

+5 -- 1 V --1.040 V --1.0447 V to --1.0353 V

+5 -- 1 0 V -- 11 . 6 V --11.7011 V to --11.4989 V

+5 -- 1 0 V -- 1 8 V --18.398 V to --17.602 V

Offset setting

Generator setting

Accuracy limits

d. Display the test signal:

H From the toolbar bar click VERT, and then click Position.

H Use the keypad to set vertical position to --5 divisions (press CLR,

5, -- ,andthenENTER, on the keypad). The baseline level will move off screen.

H Click Offset.

H Use the keypad to set vertical offset to the positive-polarity setting

listed in the table for the current vertical scale setting. The baseline level will remain off screen.

2- 26

H Set the generator to the level and polarity indicated in the table for

the vertical scale, position, and offset settings that you have made. The DC test level should appear on the screen. (If it doesn’t return, the DC accuracy check has failed for the current vertical scale setting of the current channel.)

e. Measure the test signal: Press Close. Read the measurement results at

the Mean measurement readout. See Figure 2--9.

TDS5000B Series Specifications and Performance Verification

Turn on the

measurement called

mean and read the

results here.

Performance Tests

Figure 2- 9: Measurement of DC accuracy at maximum offset and position

f. Check against limits:

H CHECK that the Mean readout on the screen is within the limits

listed for the current vertical scale and position/offset/generator settings. Enter the value in the test record.

H Repeat substep d, reversing the polarity of the position, offset, and

generator settings as is listed in the Table 2--2 on page 2--26.

H CHECK that the Mean measurement readout on the screen is within

the limits listed for the current vertical scale setting and position/offset/generator settings. Enter the value in the test record.

H Repeat substeps c through f until all vertical scale settings, listed in

Table 2--2, are checked for the channel under test.

g. Test all channels: Repeat substeps a through f for all channels.

3. Disconnect the hookup:

a. Set the generator output to 0V.

b. Disconnect the cable from the generator output at the input connector of

the channel last tested.

TDS5000B Series Specifications and Performance Verification

2- 27

Performance Tests

Check Analog Bandwidth

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

One sine wave generator (Item 13)

One level meter and power sensor (Item 14)

One power divider (Item 15)

One female N to male BNC adapter (Item 21)

Four male N to female BNC adapters (Item 20)

Two 50 Ω precision cables (Item 4)

Attenuators (Items 1 and 2)

Optional: One high-frequency leveled sine wave generator and its leveling head - replaces items 13, 14, 15, 20, and 21

1. Install the test hookup and preset the instrument controls:

a. Initialize the oscilloscope:

H Press DEFAULT SETUP.

b. Modify the default settings:

H Turn the horizontal SCALE knob to 40 ns (50 ns for TDS5054BE).

H From the toolbar bar, click Horiz and select the Acquisition tab.

H Click Average and set the number of averages to 16.

H Click ET (Equivalent Time).

H From the toolbars, click MEAS. Click Setup Ref Levs; then click

the Determine Base, Top From Min-Max button.

NOTE. The sine wave generator output amplitude must be leveled to within

0.35 db of the reference frequency (10 MHz) through the bandwidth frequency listed in Table 2--3 on page 2--30. The 0.35 db requirement is necessary to ensure a bandwidth that meets Tektronix specifications.

You can perform bandwidth Performance Verification using an unleveled sine wave generator (with amplitude error >0.35 db). Under these conditions, the bandwidth PV is subject to the flatness errors associated with the generator used.

Refer to the Sine Wave Generator Leveling Procedure on page 2--61 if your sine wave generator does not have automatic output amplitude leveling.

2- 28

TDS5000B Series Specifications and Performance Verification

Performance Tests

c. Hook up the test-signal source: Connect the sine wave output of a

leveled sine wave generator to CH 1. Set the output of the generator to a reference frequency of 10 MHz or less. See Figure 2--10.

For the optional setup using a leveled sine wave generator with a leveling head, see Figure 2--11 and, if using this optional setup with the example Tektronix SG504, set the generator output to 6 MHz.

Sine wave

generator

Output

50 Ω coaxial cable

Figure 2- 10: Initial test hookup

High frequency sine

wave generator

Output

TDS5000B Series oscilloscope

Leveling head

50 Ω coaxial cables

Figure 2- 11: Optional initial test hookup

2. Confirm the input channels are within limits for analog bandwidth: Do the following substeps — test CH 1 first, skipping substeps a and b since CH 1

is already set up for testing from step 1.

a. Select an unchecked channel:

H From the toolbar bar, click MEAS and then Clear to remove the

previous measurement.

H Press the Vertical button of the channel just confirmed to remove

the channel from the display.

TDS5000B Series Specifications and Performance Verification

2- 29

Performance Tests

(

H Press the front-panel Vertical button that corresponds to the channel

that you are to confirm.

H Move the leveling output of the sine wave generator to the channel

that you selected.

b. Match the trigger source to the channel selected:

H Press the Trigger SOURCE button until the source that corresponds

to the channel that you are to confirm is on.

c. Set its input impedance:

H From the toolbar, click the VERT button and select the tab for the

channel that you are to confirm. Click the Termination 50 Ω button.

d. Set the vertical scale: Set the vertical SCALE that corresponds to the

channel that you are to confirm to one of the settings listed in Table 2--3 not yet checked. (Start with the 100 mV setting.)

e. Set the triggering coupling:

H Click the Coupling DC button.

Table 2- 3: Analog bandwidth

Test frequency

Reference Vertical scale

1mV 6mV 1ns 150 MHz 175 MHz 175 MHz ≥4.24 mV

2mV 12 mV 1ns 250 MHz 300 MHz 1GHz ≥8.48 mV

5mV 30 mV 1ns 350 MHz 500 MHz 1GHz ≥21.2 mV

10 mV 60 mV 1ns 350 MHz 500 MHz 1GHz ≥42.4 mV

20 mV 120 mV 1ns 350 MHz 500 MHz 1GHz ≥84.8 mV

50 mV 300 mV 1ns 350 MHz 500 MHz 1GHz ≥212 mV

100 mV 600 mV 1ns 350 MHz 500 MHz 1GHz ≥424 mV

200 mV 1.2 V 1ns 350 MHz 500 MHz 1GHz ≥848 mV

500 mV 3V

1V 6V

If your generator cannot output 6 divisions of amplitude, determine its maximum output at the Test frequency, and use this for the reference amplitude. The - 3 db limit can be calculated as: 0.707 × reference amplitude.

amplitude

6 division)

Horizontal scale

1ns 350 MHz 500 MHz 1GHz ≥2.12 V

1ns 350 MHz 500 MHz 1GHz ≥4.24 V

TDS5032B TDS5034B

TDS5052B TDS5054B TDS50504BE

TDS5104B

- 3 db Limits

2- 30

TDS5000B Series Specifications and Performance Verification

Performance Tests

f. Display the test signal: Do the following subparts to first display the

reference signal and then the test signal.

H From the toolbar click MEAS; then select the Time tab.

H Click the Freq button to measure the frequency of the current

channel.

H Select the Ampl tab. Click the Pk-Pk button.

H Click Close button.

H Set the generator output so the CH<x> Pk-Pk readout equals the

reference amplitude in Table 2--3 that corresponds to the vertical scale set in substep d.

H Press the front-panel PUSH TO SET 50% as necessary to trigger a

stable display. At full bandwidth, you may also want to make small, manual adjustments to the trigger level. You can use the Trigger LEVEL knob to do this. (Full bandwidth varies with TDS model as isshowninTable2--3.)

g. Measure the test signal:

H Set the frequency of the generator, as shown on the screen, to the test

frequency in Table 2--3 that corresponds to the vertical scale set in substep d. See Figure 2--12.

H Set the horizontal SCALE to the horizontal scale setting in

Table 2--3 that corresponds to the vertical scale set in substep d. Press PUSH TO SET 50% as necessary to trigger the signal.

H Read the results at the CH<x> Pk-Pk readout, which will automati-

cally measure the amplitude of the test signal. See Figure 2--12.

TDS5000B Series Specifications and Performance Verification

2- 31

Performance Tests

Set the generator

(reference) frequency

to the test frequency

from Table 2--3.

Read results.

Set the horizontal scale

from Table 2--3.

Figure 2- 12: Measurement of analog bandwidth

h. Check against limits:

H CHECK that the Pk-Pk readout on the screen is within the limits

listed in Table 2--3 for the current vertical scale setting.

H Enter the voltage in the test record.

H When finished checking, set the horizontal SCALE back to the

40 ns (50 ns for TDS5054BE) setting.

STOP. Checking the bandwidth of each channel at all vertical scale settings is time consuming and unnecessary. You can skip checking the remaining vertical scale settings in Table 2--3 (that is, skip the following substep, i) if this oscilloscope has performed as follows:

2- 32

H Passed the 100 mV vertical scale setting just checked in this

procedure.

H Passed the Verify Internal Adjustment, Self Compensation, and

Diagnostics procedure found under Self Tests on page 2--5.

NOTE. Passing the Signal Path Compensation confirms the signal path for all vertical scale settings for all channels. Passing the Internal Diagnostics ensures that the factory-set adjustment constants that control the bandwidth for each vertical scale setting have not changed.

TDS5000B Series Specifications and Performance Verification

Performance Tests

i. Check remaining vertical scale settings against limits (optional):

H If desired, finish checking the remaining vertical scale settings for

the channel under test by repeating substeps d through h for each of the remaining scale settings listed in Table 2--3 for the channel under test.

H Before doing substep f, click the Clear button to remove the

previous channel measurements.

H When doing substep f, skip the subparts that turn on the CH<x>

Pk-Pk measurement until you check a new channel.

H Install/remove attenuators between the generator leveling head and

the channel input as needed to obtain the six division reference signals listed in the table.

j. Test all channels: Repeat substeps a through h for all channels.

3. Disconnect the hookup: Disconnect the test hook up from the input

connector of the channel last tested.

Check Delay Between

Channels

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

One sine wave generator (Item 13)

Three precision 50 Ω coaxial cables (Item 4)

One power divider (Item 15) or dual input coupler (item 7)

3 SMA female to female adapter connector (Item 16)

3 SMA male-to-female BNC adapter connector (Item 17)

STOP. Do not use the vertical position knob to reposition any channel while doing this check. T o do so invalidates the test.

1. Install the test hookup and preset the instrument controls:

a. Initialize the front panel: Press the DEFAULT SE TUP button.

b. Modify the initialized front-panel control settings:

H Do not adjust the vertical position of any channel during this

procedure.

H From the toolbar, click the V ert button.

H Set the termination of each channel to 50 Ω by selecting each

channel tab and clicking the Termination 50 Ω button.

TDS5000B Series Specifications and Performance Verification

2- 33

Performance Tests

H Set the horizontal SCALE to 400 ps (500 ps for TDS5054BE).

H From the toolbar bar, click Horiz, and select the Acquisition tab.

H Click Average, and set the number of averages to 16.

c. Hook up the test-signal source:

H Connect the sine wave output of a sine wave generator to a 50 Ω

precision coaxial cable.

H Connect the cable to either a coupler or power divider and two 50 Ω

precision coaxial cables, as shown in Figure 2--13. (See note below.)

NOTE. To ensure that you do not introduce errors into the delay measurements, use cables that have a delay difference of less than 10 ps between each other.

You can check the variance in delay between cables by connecting the cables to CH 1 and CH 2. and, using the Vbarcursors, measure the delay. Reverse the cables and repeat the measurement. Divide the difference between the two delay measurements by 2. If the result is less than 10 ps, you can proceed with the test.

H Connect the coupler or cables to CH 1 and CH 2. See Figure 2--13.

TDS5000B Series oscilloscope

Sine wave

generator

Output

50 Ω precision coaxial cables

Power divider

Male SMA to female BNC

SMA femaleto-female

3places

Figure 2- 13: Initial test hookup

2. Confirm all four channels are within limits for channel delay:

2- 34

a. Set up the generator: Set the generator frequency to 250 MHz and the

amplitude at six to eight divisions for CH 1.

TDS5000B Series Specifications and Performance Verification

Performance Tests

Hint: As you adjust the generator amplitude, push PUSH TO SET 50% often to speed up the updating of the waveform amplitude on screen.

b. Set the horizontal SCALE to 200 ps.

c. Save a CH 2 waveform:

H Press the CH 2 Vertical button.

H From the toolbar, click Save to open the Save As dialog box.

H In the Save What field, click Waveform. The Save as Type is

T ektronix Waveform Data (*.wfm).

H In the Source drop-down list box, select CH 2.

H In the Save in: Oscilloscope Memory field, select Ref 2; then click

the Save button.

d. Save CH 3 waveform:

H Press the CH 2 Vertical button to turn CH 2 off; then press the CH 3

Vertical button to turn CH 3 on.

H Move the coupler or cable from CH 2 to CH 3, so that CH 1 and

CH 3 are driven.

H From the toolbar, click Save to open the Save As dialog box.

H In the Save What field, click Waveform. The Save as Type is

T ektronix Waveform Data (*.wfm).

H In the Source drop-down list box, select CH 3.

H In the Save in: Oscilloscope Memory field, select Ref 3; then click

the Save button.

e. Display all test signals:

H Press the CH 3 Vertical button to remove CH 3 from the display.

H To display the live waveform, move the coupler or cable from CH 3

to CH 4, so CH 1 and CH 4 are driven. Press the Vertical CH 4 button to activate the display. See Figure 2--14 on page 2--36.

H To display reference waveforms, select Ref 3 from the Source

drop-down list box; then click the Ref 3 Display Off button to toggle it to On and display the reference.

Hint: To control reference waveforms, use the Reference Waveform Controls menu on the right side of the screen.

TDS5000B Series Specifications and Performance Verification

2- 35

Performance Tests

H Select Ref 2 from the Source drop-down list box; then click the

Display Off button to toggle it to On. You may notice their overlapping waveform handle icons. See Figure 2--14 on page 2--36.

H Click the Close button.

f. Measure the test signal:

H Locate the time reference points for these waveforms by first

identifying the point where the rising edge of the left-most waveform crosses the center horizontal graticule line, then note the corresponding time reference point for the right-most waveform. See Figure 2--14.

H Press CURSORS and select the V Bars Cursors Type; then click the

Close button.

H Align one V bar cursor to the time reference point of the left-most

waveform edge and the other cursor to the time reference point of the right-most waveform edge by rotating the multipurpose knobs (if necessary, press the FINE buttons). See Figure 2--14.

H Read the measurement results at the ∆: cursor readout on the screen.

Display the waveforms.

Locate the time reference

points for these waveforms.

Align each cursor to the time

reference points.

Read results.

2- 36

Figure 2- 14: Measurement of channel delay

TDS5000B Series Specifications and Performance Verification

Performance Tests

g. Check against limits: CHECK that the cursor readout is ≤100 ps.

h. Enter the time in the test record.

3. Disconnect the hookup: Disconnect the coupler or cables from the input

connectors of the channels.

Check Channel Isolation

(Crosstalk)

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

Leveled

sine wave

generator

One leveled sine-wave generator (Item 13)

One 50 Ω, precision coaxial cable (Item 4)

TDS5000B Series oscilloscope

Output

50 Ω precision coaxial cable

Figure 2- 15: Initial test hookup

1. Install the test hookup and preset the instrument controls:

a. Hook up the test-signal source: Connect, through a 50 Ω precision

coaxial cable, the output of the generator to CH 1. See Figure 2--15.

b. Initialize the oscilloscope: Press the DEFAULT SETUP button.

c. Modify the initialized control settings:

H Turn on all vertical channels (press the Vertical button of any off

channels: CH 1, CH 2, and, if equipped, CH 3, and CH 4).

H From the toolbar, click the V ert button. Set the termination of each

channel to 50 Ω by selecting each channel tab and clicking its Termination 50 Ω button.

H SettheVerticalSCALEofCH1,CH2,CH3,andCH4to100 mV.

H Set the Trigger SOURCE to CH 1.

H Set the Horizontal SCALE to 20 ns (25 ns for TDS5054BE).

TDS5000B Series Specifications and Performance Verification

2- 37

Performance Tests

H From the toolbar, click the Horiz button. In the Horizontal menu,

open the Acquisition tab and set the instrument to E.T. mode.

H Click the Close button.

2. Check channel isolation against limits:

a. Display the test signal: Set the generator frequency to 100 MHz and

adjust the output level for an 8-division display.

b. Check — Amplitude of each trace other than CH 1 is 0.08 division or

less (discount trace width). Enter the amplitude in the test record.

c. Move the signal to the CH 2 input connector, and then change the

Trigger SOURCE to CH 2.

d. Check — Amplitude of each trace other than CH 2 is 0.08 division or

less (discount trace width). Enter the amplitude in the test record.

e. Move the signal to the CH 3 input connector, and then change the

Trigger SOURCE to CH 3 (TDS5034B, TDS5054B, TDS5054BE, or TDS5104B). If you are checking a TDS5032B or TDS5052B, proceed to step i below.

f. Check — Amplitude of each trace other than CH 3 is 0.08 division or

less (discount trace width). Enter the amplitude in the test record.

g. Move the signal to the CH 4 input connector, and then change the

Trigger SOURCE to CH 4. (TDS5034B, TDS5054B, TDS5054BE, or TDS5104B)

h. Check — Amplitude of each trace other than CH 4 is 0.08 division or

less (discount trace width). Enter the amplitude in the test record.

i. Move the signal to the CH 1 input connector, and then change the

Trigger SOURCE to CH 1.

j. Set the generator output frequency to 350 MHz for the TDS5032B and

TDS5034B, 500 MHz for the for the TDS5052B, TDS5054B, and TDS5054BE, or 1 GHz for the TDS5104B. Adjust the generator output level for an 8-division display.

k. Check — Amplitude of each trace other than CH 1 is 0.16 division or

less (discount trace width). Enter the amplitude in the test record.

l. Move the signal to the CH 2 input connector, and then change the

Trigger SOURCE to CH 2.

m. Check — Amplitude of each trace other than CH 2 is 0.16 division or

less (discount trace width). Enter the amplitude in the test record.

2- 38

TDS5000B Series Specifications and Performance Verification

3. Disconnect the hookup: Disconnect the cable from the generator output at

Time Base System Checks

Performance Tests

n. Move the signal to the CH 3 input connector, and then change the

Trigger SOURCE to CH 3 (TDS5034B, TDS5054B, TDS5034BE, or TDS5104B).

o. Check — Amplitude of each trace other than CH 3 is 0.16 division or

less (discount trace width). Enter the amplitude in the test record.

p. Move the signal to the CH 4 input connector, and then change the

Trigger SOURCE to CH 4 (TDS5034B, TDS5054B, TDS5054BE, or TDS5104B).

q. Check — Amplitude of each trace other than CH 4 is 0.16 division or

less (discount trace width). Enter the amplitude in the test record.

the input connector of the channel.

Check Long-Term Sample

Rate and Delay Time

Accuracy

The following procedures verify those characteristics that relate to the time base system and are listed as checked under Warranted Characteristics in the Specifications section.

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

Time Mark or

Sine Wave

Generator

One time-mark generator (Item 12), or Sine wave generator (Item 13)

One 50 Ω, precision coaxial cable (Item 4)

TDS5000B Series oscilloscope

Output

50 Ω coaxial cable

Figure 2- 16: Initial test hookup

1. Install the test hookup and preset the instrument controls:

TDS5000B Series Specifications and Performance Verification

2- 39

Performance Tests

a. Hook up the test-signal source: Connect, through a 50 Ω precision

coaxial cable, the output of the generator to CH 1. See Figure 2--16.

H If using a time-mark generator, set the output for 10 ms markers.

H If using a sine wave generator, set the output for 1.2 V and 500 kHz.

b. Initialize the oscilloscope: Press the DEFAULT SETUP button.

c. Modify the initialized front-panel control settings:

H Set the Vertical SCALE to 200 mV (or 500 mV with the optional

Tektronix TG501A Time Mark Generator).

H Set the Horizontal SCALE to 80ns(100 ns for TDS5054BE).

H From the toolbar, click the V ert button; then click the Termination

50 Ω button.

H Press PUSH TO SET 50%.

H Click the Close button.

H Use the Vertical POSITION knob to center the test signal on the

screen.

H Press the Trigger MODE button to toggle it to NORMAL.

2. Confirm that the time base is within limits for accuracies:

a. Measure the test signal:

H If using a time-mark generator, align the trigger T to the center

vertical graticule line by adjusting the Horizontal POSITION. See Figure 2--17 on page 2--41.

H If using a sine wave generator, align the rising edge of the sine wave

on the center graticule crosshairs by adjusting the Horizontal POSITION.

H From the toolbar, click the Horiz button, and select the HORIZON-

TAL tab.

H Press the Horizontal DELAY Mode button to toggle it on. See

Figure 2--17 on page 2--41.

H Set the delay time to 10 ms. (Do this by clicking Horiz Delay and

on the keypad press 10, then m followed by ENTER.)

2- 40

b. Check long-term sample rate and delay time accuracies against limits:

TDS5000B Series Specifications and Performance Verification

Performance Tests

H CHECK that the rising edge of the marker (or sine wave) crosses

the center horizontal graticule line at a point within ±1.5 divisions of the center graticule. See Figure 2--17 on page 2--41.

H Enter the number of divisions in the test record.

Align the trigger T

to the center

graticule line.

Check long-term

sample rates and

delay time accuracies

against limits.

Set horizontal mode.

Set horizontal scale

and delayed time.

Figure 2- 17: Measurement of accuracy - long-term and delay time

3. Disconnect the hookup: Disconnect the cable from the generator output at

the input connector of CH 1.

Check Delta Time

Measurement Accuracy

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

One 50 Ω, precision coaxial cable (Item 4)

One Connector, BNC “T”, male BNC-to-dual female BNC (Item 6)

One Pulse Generator, Wavetek 9500 or equivalent (Item 18)

Two 50 Ω, coaxial cable, male-to-male SMA connectors (Item 19)

One SMA female to BNC male connector (Item 23)

One BNC elbow connector (Item 24)

One SMA “T”, male to two SMA female connectors (Item 22)

Two SMA termination connectors, short circuit (Item 26)

One 2X attenuator, 50 Ω, female BNC-to- male BNC (Item 28)

TDS5000B Series Specifications and Performance Verification

2- 41

Performance Tests

This procedure checks the sample rate portion of the Delta Time Measurement Accuracy as listed in the Specifications section. The previous procedure, Check Long-Term Sample Rate and Delay Time Accuracy, on page 2--39, verified the “PPM” portion of the delta time specification.

1. Install the test hookup and preset the instrument controls:

a. Initialize the oscilloscope: Press the DEFAULT SE TUP button.

b. Hook up the pulse generator as shown in Figure 2--18.

TDS5000B Series oscilloscope

Pulse

generator

SMA male

Output

BNC 90° female

to male adapter

50 Ω cable

2X attenuator

BNC T

connector

20I 50 Ω cable

SMA T connector

20I 50 Ω cable

BNC to SMA

adapter

to male

SMA male

to male

SMA short

2- 42

Figure 2- 18: Delta time accuracy t est hookup

H Set the pulse generator output for a positive-going pulse with a

280 ps -- 800 ps rise-time, as shown in Table 2--4 on page 2--44, and

for the fastest possible rep rate (at least 1 kHz).

H Set the pulse generator output for about 500 mV. (This amplitude

can be adjusted later to get a 5-division pulse on the screen.)

c. Modify the initialized front-panel control settings:

H From the toolbar, click the V ert button. Set the termination of the

channel to 50 Ω by selecting the channel tab and clicking the Termination 50 Ω button.

H Press AUTOSET. You may see both positive and negative pulses.

Adjust the Trigger LEVEL knob so that the trigger level is about 50% of the rising edge of the positive pulse.

TDS5000B Series Specifications and Performance Verification

Performance Tests

H If you are testing a TDS5054BE instrument, set the Bandwidth to

150 MHz on all channels. (All other models are tested at full bandwidth.)

H From the toolbar, click the Horiz button, and select the Acquisition

tab. Under Sampling Mode, press the RT (Real Time Only) button.

H Set the horizontal SCALE to 10 ns/division. The pulse width should

be approximately 6 ns. For the TDS5054BE, set the horizontal scale to 50 ns/division, and press the ZOOM button.

H Adjust the pulse amplitude and the vertical scale and position of the

instrument as necessary to obtain about 5 divisions of positive pulse amplitude. Ensure that the positive pulse amplitude is greater than 200 mV.

d. Set up for statistics measurements:

H Readjust the Trigger LEVEL knob so that the trigger level is about

50% of the rising edge of the positive pulse. Note the voltage of the trigger level—this voltage will be used in the following steps.

H Press RUN/STOP button to freeze the display .

H Click MEAS, and then select the Time tab to bring up the Time

Measurements menu.

H Click the Positive Width button.

H Click Setup Statistics. Click the Measurement Statistics All button,

andthenclickReset to reset the statistics.

H Click Weight n=. On the keypad press 1000 and ENTER; then click

Setup.

H Click Setup Ref Levs.

H Click Units Absolute.

H Set Mid Ref to the voltage of the trigger level noted previously in

this step. (This level is about 50% of the rising edge of the positive pulse.)

H Click Setup, and then click Close.

H Press the RUN/STOP button to start the acquisitions.

H Wait approximately 30 seconds.

H Press the RUN/STOP button to freeze the display .

H Record all statistics values.

TDS5000B Series Specifications and Performance Verification

2- 43

Performance Tests

H Calculate the difference of the Maximum (M) minus the mean ().

H Calculate the difference of the mean () minus the Minimum (m).

H Both differences must be less than or equal to the Delta-time

accuracy limit shown in Table 2--4 for your oscilloscope.

H Enter the pass/fail result for delta time in the test record.

Table 2- 4: Delta time measurement

Delta time accuracy

Instrument Model Pulse rise time range

TDS5104B, TDS5054B, TDS5034B, TDS5052B, TDS5032B

280 ps -- 800 ps ≤0.060 ns

limit

TDS5054BE 1.4 ns -- 4 ns (The internal

150 MHz bandwidth filter will slow pulse rising edges to this range.)

≤0.300 ns

e. Repeat for all other channels:

H Note the vertical scale setting of the channel just confirmed.

H Press the Vertical channel button for the channel just confirmed to

remove the channel from display.

H Click MEAS,andthenClear to remove the measurement.

H Press the front-panel button that corresponds to the channel that you

are to confirm.

H Set vertical SCALE to the setting noted in step e, first bullet.

H Press the Trigger Source button to toggle the source to the channel

selected.

H Move the test hookup to the channel that you selected.

H From the toolbar, click the V ert button. Set the termination of the

channel to 50 Ω by selecting the channel tab and clicking the Termination 50 Ω button. (If you are testing a TDS5054BE model, make sure the 150 MHz bandwidth limit has been turned on. All other models are tested at full bandwidth.)

2- 44

H Press the RUN/STOP button to start the display.

H Repeat step d.

2. Disconnect all test equipment from the oscilloscope.

TDS5000B Series Specifications and Performance Verification

Trigger System Checks

Performance Tests

The following procedures check those characteristics that relate to the trigger system and are listed as checked in the Specifications section.

Check Time Accuracy for

Pulse, Glitch, Timeout,

and Width Triggering

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

One sine wave generator (Item 13)

One 10X attenuator (Item 1)

One 50 Ω, precision coaxial cable (Item 4)

1. Install the test hookup and preset the instrument controls:

a. Initialize the instrument: Press the DEFAULT SETUP button.

b. Modify the default setup:

H Set the horizontal SCALE to 10 ns.

H From the toolbar, click the V ert button; then click the Termination

50 Ω button.

c. Hook up the test-signal source: Connect the output of the sine wave

generator (Item 13) to CH 1 as shown in Figure 2--18.

Use a 50 Ω precision coaxial cable, followed by a 10X attenuator. The 10X attenuator is optional if the SG503 is used.

Sine wave generator

Output

50 Ω coaxial cable

Figure 2- 18: Initial test hookup

2. Confirm that the trigger system is within the time-accuracy limits for

pulse-glitch or pulse-width triggering (time range ≤500 ns):

TDS5000B Series Specifications and Performance Verification

TDS5000B Series oscilloscope

10X Attenuator

2- 45

Performance Tests

a. Display the test signal: Set the output of the sine wave generator for a

100 MHz, five-division sine wave on the screen; then press PUSH TO

SET 50%.

b. Set the trigger mode: Press the Trigger MODE button to toggle it to

NORMAL.

c. Set upper and lower limits that ensure triggering: See Figure 2--19 on

page 2--47.

H Press the front-panel ADVANCED button, and select the AEvent

tab; then select width triggering by clicking the Width button.

H Click the Trig When button, and select In side limits.

H Click Upper Limit, and use the keyboard to set the upper limit to

10 ns: press 10, then n,andENTER.

H Click Lower Limit, and use the keypad to set the lower limit to

2ns.

d. Change limits until triggering stops:

H Press PUSH TO SET 50%.

H While implementing the following substeps, monitor the display (it

will stop acquiring) and the front-panel light TRIG’D (it will extinguish) to determine when triggering is lost. Click Close.

H Click Lower Limit.

H Use the multipurpose knob to increase the Lower Limit readout until

triggering is lost.

H CHECK that the Lower Limit readout, after the oscilloscope loses

triggering, is within 3.5 ns to 6.5 ns, inclusive.

H Enter the time in the test record.

H Use the keypad to return the Lower Limit to 2nsand reestablish

triggering.

H Click Upper Limit; then use the multipurpose knob to slowly

decrease the Upper Limit readout until triggering is lost.

H CHECK that the Upper Limit readout, after the oscilloscope loses

triggering, is within 3.5 ns to 6.5 ns, inclusive.

2- 46

H Enter the time in the test record.

TDS5000B Series Specifications and Performance Verification

Performance Tests

Figure 2- 19: Measurement of time accuracy for pulse and glitch triggering

Set upper and lower limits that ensure triggering. Then change limits until triggering stops.

3. Confirm that the trigger system is within the time-accuracy limits for

pulse-glitch or pulse-width triggering (time range >520 ns):

a. Set the upper and lower limits that ensure triggering at 250 kHz:

H Click Upper Limit. Use the keyboard to set the upper limit to 4 s.

H Click Lower Limit. Use the keypad to set the lower limit to 500 ns.

b. Display the test signal:

H Set the Horizontal SCALE to 4 s (5 s for TDS5054BE).

H Set the output of the sine wave generator for a 250 kHz,

five-division sine wave on the screen. Set the Vertical SCALE to 20 mV (the waveform will overdrive the display).

H Press PUSH TO SET LEVEL 50%.

c. Check against limits: Do the following subparts in the order listed.

H Use the multipurpose knob to increase the Lower Limit readout until

triggering is lost.

H CHECK that the Lower Limit readout, after the oscilloscope stops

triggering, is within 1.9 sto2.1s, inclusive.

H Enter the time in the test record.

H Use the keypad to return the Lower Limit to 500 ns and re-establish

triggering.

TDS5000B Series Specifications and Performance Verification

2- 47

Performance Tests

H Click Upper Limit; then use the multipurpose knob to slowly

decrease the Upper Limit readout until triggering stops.

H CHECK that the Upper Limit readout, after the oscilloscope loses

triggering, is within 1.9 sto2.1s, inclusive.

H Enter the time in the test record.

4. Disconnect the hookup: Disconnect the cable from the generator output at

the input connector of CH 1.

Check Sensitivity, Edge

Trigger, DC Coupled

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

One sine wave generator (Item 13)

One precision 50 Ω coaxial cable (Item 4)

One 50 Ω termination (Item 4)

One 10X attenuator (Item 1)

One 5X attenuator (Item 2)

1. Install the test hookup and preset the instrument controls:

a. Initialize the oscilloscope: Press the DEFAULT SE TUP button.

b. Modify the initialized front-panel control settings:

H Set the Horizontal SCALE to 20 ns (25 ns for TDS5054BE).

H Press the Trigger MODE button to toggle it to Normal.

H From the toolbar, click Horiz, and select the Acquisition tab.

H Click Average, and set the number of averages to 16.

c. Hook up the test-signal source:

2- 48

H Connect one end of a precision 50 Ω coaxial cable to the signal

output of the generator. Connect the other end of the coaxial cable to CH 1 through a 50 Ω termination. See Figure 2--20.

TDS5000B Series Specifications and Performance Verification

Performance Tests

TDS5000B Series oscilloscope

Sine wave

generator

50 Ω Termination

Precision 50 Ω coaxial cable

Figure 2- 20: Initial test hookup

2. Confirm the trigger system is within sensitivity limits (50 MHz):

a. Display the test signal:

H Set the generator frequency to 50 MHz.

H From the toolbar, click MEAS.

H Click Setup Ref Levs;thenclicktheMin-Max button.

H Click the Setup button and select the Ampl tab; then click the

Amplitude button.

H Click Close.

H Press PUSH TO SET 50%.

H Set the test signal amplitude for about three and a half divisions on

the screen. Fine-adjust the generator output until the CH 1 Amplitude readout indicates that the amplitude is 350 mV. The readout may fluctuate around 350 mV.

H Disconnect the 50 Ω termination (with the 50 Ω precision coaxial

cable attached) from CH 1, and reconnect it to CH 1 through a 10X attenuator.

b. Check the Main trigger system for stable triggering at limits:

H Read the following definition: A stable trigger is one that is

consistent, that is, one that results in a uniform, regular display triggered on the selected slope (positive or negative). This display should not have its trigger point alternating between opposite slopes, nor should it roll across the screen. At horizontal scale settings of 2 ms/division and faster, TRIG’D will remain constantly lit. It will flash for slower settings.

TDS5000B Series Specifications and Performance Verification

2- 49

Performance Tests

H Press the Trigger Slope button to select the positive slope.

H Adjust the Trigger LEVEL knob to produce a stable trigger. CHECK

that the trigger is stable for the test waveform on the positive slope.

H Press the Trigger Slope button to select the negative slope. Adjust

the Trigger LEVEL knob so that there is a stable trigger. CHECK that the trigger is stable for the test waveform on the negative slope.

H Enter the pass/fail result for trigger in the test record.

H Leave the trigger system triggered on the positive slope of the

waveform before continuing to the next step.

Check if stable trigger.

Figure 2- 21: Measurement of trigger sensitivity showing 50 MHz results

c. Check Delayed trigger system for stable triggering at limits: Do the

following subparts in the order listed.

H From the toolbar click Trig, select the AEventtab, and set the

Source to Line.

H Select the A-->B Seq tab, and then click the A then B Trig After

Time button.

H Select the BEventtab,andthenclicktheSet 50% button.

CHECK that a stable trigger is obtained for the test waveform for both the positive and negative slopes of the waveform. Use the TRIGGER LEVEL knob to stabilize the Main trigger. Click BTrig Level, and use the keypad or the multipurpose knob/FINE button to

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TDS5000B Series Specifications and Performance Verification

stabilize the Delayed trigger. Click one of the Slope buttons to switch between trigger slopes. See Figure 2--21 on page 2--50.

H Enter the pass/fail result for delayed trigger in the test record.

H Leave the Delayed trigger system triggered on the positive slope of

the waveform before continuing to the next step. Also, return to the main trigger: select the A-->B Seq tab and click the A-->B Sequence AOnlybutton.

H Select the AEventtab; then press Close.

3. Confirm the AUX Trigger input:

a. Display the test signal:

H Remove the 10X attenuator; then reconnect the 50 Ω termination

and precision 50 Ω cable to CH 1.

H Press the Trigger SOURCE button to select CH 1.

Performance Tests

H Set the test signal amplitude for approximately 4 divisions on the

screen.

H Fine-adjust the generator output until the CH 1 Amplitude readout

indicates that the amplitude is 400 mV.

b. Check the AUX trigger source for stable triggering at 50 MHz: Do the

following in the order listed.

H Move the 50 Ω termination and precision 50 Ω cable from CH 1 to

AUX IN.

H Press the Trigger SOURCE button to set the source to EXT.

H Adjust the Trigger LEVEL knob in the positive direction.

H CHECK for a stable trigger. When a stable trigger is obtained, the

TRIG’D indicator is lighted.

NOTE. You will not see the signal on the display.

H Press the Trigger SLOPE button to toggle it to NEG.

H Adjust the Trigger LEVEL knob in the negative direction.

H CHECK for a stable trigger. When a stable trigger is obtained, the

TRIG’D indicator is lighted.

H Enter the pass/fail results in the test record.

TDS5000B Series Specifications and Performance Verification

2- 51

Performance Tests

H Set the trigger system to trigger on the positive slope of the

waveform before proceeding to the next check.

H Press the Trigger SOURCE button to set the trigger source to CH 1.

H Click Vert in the toolbar. Click Termination 50 Ω. Click Close.

H Disconnect the hookup installed in step 1.

4. Confirm that the trigger system is within sensitivity limits (full bandwidth):

a. Hook up the test-signal source: Connect the signal output of a high-fre-

quency sine wave generator to CH 1 through a precision 50 Ω coaxial cable. To test some TDS models, a high frequency (>1 GHz) generator is required; see footnote 1 in Table 2--1 on page 2--19.

b. Set the Horizontal Scale: Set the Horizontal SCALE to 400 ps (500 ps

for TDS5054BE).

c. Display the test signal:

H Set the generator frequency to full bandwidth as follows:

TDS5032B, TDS5034B 350 MHz TDS5052B, TDS5054B, TDS5054BE 500 MHz TDS5104B 1 GHz

Note: For the TDS5054BE, set the instrument to E.T. mode.

H Set the test signal amplitude for approximately five divisions

on-screen; then fine-adjust the generator output until the CH 1 Amplitude readout indicates the amplitude is 500 mV. The readout may fluctuate around 500 mV.

H Disconnect the leveling head at CH 1 and reconnect it to CH 1

through a 5X attenuator. Check that a stable trigger is obtained.

d. Repeat step 2, substeps b and c only, for the full bandwidth selected.

H Press the Trigger SOURCE button to toggle it to CH 1.

e. Display the test signal:

H Set the generator frequency to 100 MHz.

H Set the Horizontal SCALE to 10 ns.

H Remove the 5X attenuator and reconnect the cable to CH 1.

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H Set the generator amplitude on the screen for 7.5 divisions.

H Fine-adjust the generator output until the CH 1 Amplitude readout

indicates the amplitude is 750 mV.

TDS5000B Series Specifications and Performance Verification

Performance Tests

f. Repeat step 1, substep c and step 3, substep b only, to check the full

bandwidth of the Aux Trigger source. Set the frequency to 100 MHz.

NOTE. You just checked the trigger sensitivity. If desired, you can repeat steps 1 through 4d for the other channels (CH 2, and, if equipped, CH 3 and CH 4).

5. Disconnect the hookup: Disconnect the cables from AUX IN and from the

channel last tested.

TDS5000B Series Specifications and Performance Verification

2- 53

Performance Tests

Output Signal Checks

The following procedures verify characteristics of the output signals that are listed as checked under Warranted Characteristics in the Specifications section. The oscilloscope outputs these signals at its front and rear panels.

Check Outputs:

CH 3 Signal Out

(TDS5034B, TDS5054B,

TDS5054BE TDS5104B)

and Aux Trigger Out

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

Two precision 50 Ω coaxial cables (Item 4)

One calibration generator (Item 11)

Also, the oscilloscope must have passed Check DC Voltage Measurement Accuracy on page 2--24.

1. Install the test hookup and preset the instrument controls:

Calibration

generator

To A UX OUT

(located on the back

of the instrument)

50 Ω coaxial cables

TDS5000B Series oscilloscope

Figure 2- 22: Initial test hookup

2- 54

a. Hook up test-signal source 1:

H Connect the standard amplitude output of a calibration generator

through a 50 Ω precision coaxial cable to CH 3. See Figure 2--22.

H Set the calibration generator to output a 0.500 V square wave.

b. Hook up test-signal source 2: Connect the Aux Out at the rear panel to

CH 2 through a 50 Ω precision cable.

c. Initialize the oscilloscope: Press the DEFAULT SETUP button.

d. Modify the initialized front-panel control settings:

H Press the Vertical CH 1 button to toggle it off.

H Press the Vertical CH 3 button to display that channel.

TDS5000B Series Specifications and Performance Verification

H Push Trigger Source to toggle the source to CH 3.

H Set the Horizontal SCALE to 200 s.

H If necessary, adjust the calibration generator output for an amplitude

of 5 divisions. For oscilloscopes with 50 Ω inputs, you may need to double the output of the generator.

H From the toolbar bar, click Horiz, and select the Acquisition tab.

H Click Average, and set the number of averages to 64.

H Click the Close button.

2. Confirm AUX OUT is within limits for logic levels:

a. Display the test signal:

H Press the Vertical CH 3 buttontoturnoffCH3.

H Press the Vertical CH 2 button to display that channel.

Performance Tests

H Set the CH 2 Vertical SCALE to 1V.

H Use the Vertical POSITION knob to center the display on-screen.

b. Measure logic levels:

H From the toolbar, click MEAS, and select the Ampl tab.

H Click the High and Low buttons.

H Click the Close button.

c. Check AUX OUT output against limits:

H CHECK that the CH 2 High readout is ≥2.5 volts and that the CH 2

Low readout is ≤0.7 volts. See Figure 2--23.

H Enter the high and low voltages in the test record.

H From the toolbar, click the V ert button. Click the Termination 50 Ω

button.

H Click the Close button.

CHECK that the CH 2 High readout is ≥1.0 volt and that the CH 2

Low readout ≤0.25 volts.

H Enter the high and low voltages in the test record.

TDS5000B Series Specifications and Performance Verification

2- 55

Performance Tests

Check output

Figure 2- 23: Measurement of main trigger out limits

3. Confirm SIGNAL OUT is within limits for gain:

a. Measure gain:

H Move the precision 50 Ω cable from the AUX OUT BNC to the

SIGNAL OUT BNC.

H Set CH 2 Vertical SCALE to 100 mV.

H Press PUSH TO SET 50%.

H From the toolbar, click MEAS, and select the Ampl tab.

H Click the Pk-Pk button.

H Click Close.

b. Check against limits:

H From the toolbar, click the V ert button, then click the Termination

1MΩ button.

H Click Close.

H CHECK that the readout CH2 Pk-Pk is between 200 mV and

300 mV, inclusive.

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H Enter the voltage in the test record.

H From the toolbar, click the V ert button; then click the Termination

50 Ω button.

H Click Close.

TDS5000B Series Specifications and Performance Verification

Performance Tests

H CHECK that the readout CH 2 Pk-Pk is between 100 mV and

150 mV, inclusive.

H Enter the voltage in the test record.

4. Disconnect the hookup: Disconnect the cables from the channel inputs and

the rear panel outputs.

Check Probe

Compensation Output

Equipment required

Prerequisites See page 2--17. Also, the oscilloscope must have passed Check

One 10X oscilloscope probe, such as Tektronix P5050

Long-Term Sample Rate and Delay Time Accuracy on page 2--39.

1. Install the test hookup and preset the instrument controls:

a. Hook up test-signal: See Figure 2--24.

H Connect the probe to CH 1.

H Connect the probe leads to the PROBE COMP output.

TDS5000B Series oscilloscope

Passive probe from PROBE COMP output to CH 1 input

Figure 2- 24: Initial test hookup

b. Initialize the oscilloscope: Press the DEFAULT SETUP button.

c. Modify the initialized front-panel control settings:

H Set the Vertical SCALE to 200 mV.

H Set the Horizontal SCALE to 200 s.

H Press PUSH TO SET 50%.

H Use the Vertical POSITION knob to center the display on the

screen.

TDS5000B Series Specifications and Performance Verification

2- 57

Performance Tests

H From the toolbar bar, click Horiz and select the Acquisition tab.

H Click Average and set the number of averages to 128.

2. Confirm that the Probe Compensator signal is within limits for frequency:

a. Measure the frequency of the probe compensation signal:

H From the toolbar, click MEAS and select the Time tab.

H Click the Freq button.

b. Check against limits:

H CHECK that the CH 1 Freq readout is within 950 Hz to 1.050 kHz,

inclusive. See Figure 2--25.

H Enter the frequency in the test record.

H Click Clear to remove the measurement.

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Figure 2- 25: Measurement of probe compensator frequency

c. Save the probe compensation signal in reference memory:

H From the toolbar, click Save.

H In the Save What field, click Waveform.

H In the Source drop-down list box, select CH 1.

H In the Save in: Oscilloscope Memory field, select Ref 1.

TDS5000B Series Specifications and Performance Verification

Performance Tests

H Click the Save button.

H Disconnect the adapter from CH 1 and the probe compensation

connector.

H To view the stored waveform on screen, verify that the display On

button (in the control window) is toggled to On.

d. Hook up the DC standard source:

H Set the output of a DC calibration generator to off or 0 volts.

H Connect the output of the DC calibration generator, through a

dual-banana connector, followed by a 50 Ω precision coaxial cable, to one side of a BNC T connector. See Figure 2--26.

H Connect the Sense output of the generator, through a second

dual-banana connector, followed by a 50 Ω precision coaxial cable, to the other side of the BNC T connector. Connect the BNC T connector to CH 1. See Figure 2--26.

DC calibrator

Dual banana to

BNC adapters

50 Ω coaxial cables

Figure 2- 26: Subsequent test hookup

e. Measure amplitude of the probe compensation signal:

H From the toolbar bar, click Horiz, and select the Acquisition tab.

H Click Average and set the number of averages to 16 using the

keypad or the multipurpose knob.

TDS5000B Series oscilloscope

BNC T

connector

H Adjust the output of the DC calibration generator until it precisely

overlaps the top (upper) level of the stored probe compensation signal. (This value will be near 1000 mV.)

H Record the setting of the DC generator.

TDS5000B Series Specifications and Performance Verification

2- 59

Performance Tests

H Adjust the output of the DC calibration generator until it precisely

overlaps the base (lower) level of the stored probe compensation signal. (This value will be near zero volts.)

H Record the setting of the DC generator.

f. Press Close to remove the menus from the display. See Figure 2--27.

Figure 2- 27: Measurement of probe compensator amplitude

g. Check against limits:

H Subtract the value just obtained (base level) from that obtained

previously (top level).

H CHECK that the difference obtained is within 990 mV to 1010 mV,

inclusive.

H Enter the voltage difference in test record.

3. Disconnect the hookup: Disconnect the cable from CH 1.

This completes the performance verification of the oscilloscope.

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TDS5000B Series Specifications and Performance Verification

Sine Wave Generator Leveling Procedure

Some procedures in this manual require a leveled sine wave generator to produce the necessary test signals. If you do not have a leveled sine wave generator, use one of the following procedures to level the output amplitude of your sine wave generator.

Performance Tests

Method A

If you have a power divider, use this setup to monitor the generator output simultaneously with the level meter and the oscilloscope.

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

Sine wave generator (Item 13)

Level meter and power sensor (Item 14)

Power divider (Item 15)

Two male N to female BNC adapters (Item 20)

One precision coaxial cable (Item 4)

1. Install the test hookup: Connect the equipment as shown in Figure 2--28.

TDS5000B Series oscilloscope

Sine wave

generator

Level meter

Input

Output

Power divider

Power sensor

Figure 2- 28: Sine wave generator leveling equipment setup (Method A)

TDS5000B Series Specifications and Performance Verification

Attenuators (if necessary)

2- 61

Performance Tests

2. Set the Generator:

H Set the sine wave generator to a reference frequency of 10 MHz.

H Adjust the sine wave generator amplitude to the required number of

divisions as measured by the oscilloscope.

3. Record the reference level: Note the reading on the level meter.

4. Set the generator to the new frequency and reference level:

H Change the sine wave generator to the desired new frequency.

H Input the correction factor and/or the new frequency into the level meter.

H Adjust the sine wave generator amplitude until the level meter again

reads the value noted in step 3. The signal amplitude is now correctly set for the new frequency for your specific test procedure.

Proceed with the test instructions that require a leveled sine wave generator at the frequency you set in step 4.

Method B

Use this setup if you do not have a power divider.

Equipment required

Prerequisites Read Prerequisites on page 2--17 and footnote warnings on page 2--19.

Sine wave generator (Item 13)

Level meter and power sensor (Item 14)

Two male N to female BNC adapters (Item 20)

Two precision coaxial cables (Item 4)

1. Install the test hookup: Connect the equipment as shown in Figure 2--29

(start with the sine wave generator connected to the oscilloscope).

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TDS5000B Series Specifications and Performance Verification

Performance Tests

Sine wave

generator

Level meter

Input

Output

Power sensor

Connect the sine wave

generator to the

oscilloscope and the

power sensor as

directed in the text.

TDS5000B Series oscilloscope

Figure 2- 29: Sine wave generator leveling equipment setup (Method B)

2. Set the Generator:

H Set the sine wave generator to a reference frequency of 10 MHz.

H Adjust the sine wave generator amplitude to the required number of

divisions as measured by the oscilloscope.

3. Record the reference level:

H Disconnect the sine wave generator from the oscilloscope.

H Connect the sine wave generator to the power sensor.

H Note the level meter reading.

4. Set the generator to the new frequency and reference level:

H Change the sine wave generator to the desired new frequency.

H Input the correction factor and/or the new frequency into the level meter.

H Adjust the sine wave generator amplitude until the level meter again

reads the value noted in step 3. The signal amplitude is now correctly set for the new frequency for your specific test procedure.

H Disconnect the sine wave generator from the power sensor.

Connect the sine wave generator to the oscilloscope and proceed with the test instructions that require a leveled sine wave generator at the frequency you set in step 4.

TDS5000B Series Specifications and Performance Verification

2- 63

Performance Tests

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TDS5000B Series Specifications and Performance Verification

Tektronix SC6070 User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Table of Contents

List of Figures

List of Tables

General Safety Summary

Specifications

Product and Feature Description

Specification Tables

Performance Verification

Conventions

Brief Procedures

Self Tests

Functional Tests

Performance Tests

Prerequisites

Equipment Required

TDS5000B Series Test Record

Signal Acquisition System Checks

Time Base System Checks

Trigger System Checks

Output Signal Checks

Sine Wave Generator Leveling Procedure