Instructions
PPMS200
Fine Pitch Probing System
(PPM201B, 201C, 203B, & 203C)
070-9092-01
Copyright E T ektronix, Inc. 1994. All rights reserved. T ektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes
that in all previously published material. Specifications and price change privileges reserved.
Printed in the U.S.A.
T ektronix, Inc., P.O. Box 1000, Wilsonville, OR 97070–1000
TEKTRONIX and TEK are registered trademarks of T ektronix, Inc.
WARRANTY
T ektronix warrants that this product will be free from defects in materials and workmanship for a period of one (1) year
from the date of shipment. If any such product proves defective during this warranty period, T ektronix, at its option, either
will repair the defective product without charge for parts and labor, or will provide a replacement in exchange for the
defective product.
In order to obtain service under this warranty, Customer must notify Tektronix of the defect before the expiration of the
warranty period and make suitable arrangements for the performance of service. Customer shall be responsible for
packaging and shipping the defective product to the service center designated by T ektronix, with shipping charges prepaid.
T ektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which the
T ektronix service center is located. Customer shall be responsible for paying all shipping charges, duties, taxes, and any
other charges for products returned to any other locations.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate
maintenance and care. T ektronix shall not be obligated to furnish service under this warranty a) to repair damage resulting
from attempts by personnel other than T ektronix representatives to install, repair or service the product; b) to repair
damage resulting from improper use or connection to incompatible equipment; or c) to service a product that has been
modified or integrated with other products when the effect of such modification or integration increases the time or
difficulty of servicing the product.
THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THIS PRODUCT IN LIEU OF ANY
OTHER WARRANTIES, EXPRESSED OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY
IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE.
TEKTRONIX’ RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND
EXCLUSIVE REMEDY PROVIDED TO THE CUST OMER FOR BREACH OF THIS WARRANTY. TEKTRONIX
AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT , SPECIAL, INCIDENTAL, OR
CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS
ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.
Table of Contents
General Safety Summary iii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Getting Started 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Description 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Assembly 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating Basics 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Microscope Assembly 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Circuit Board Holder 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulators 8. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Attaching Probes to the Manipulator 9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulator Operation 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maintenance 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Cleaning 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lubrication 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Microscope Repair 20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifications 21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Replaceable Parts 23. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Parts Ordering Information 23. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using the Replaceable Parts List 24. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PPMS200 Probing System Instructions
i
Contents
List of Figures
Figure 1: PPMS200 Fine Pitch Probing System 1. . . . . . . . . . . . . . . . . .
Figure 2: Microscope Assembly 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3: Microscope Assembly 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 4: Microscope Features and Controls 5. . . . . . . . . . . . . . . . . . . .
Figure 5: Circuit Board Holder 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 6: Fine Pitch XYZ Manipulator 8. . . . . . . . . . . . . . . . . . . . . . . . .
Figure 7: Attaching the Probe Adapter to the Articulating Arm 10. . . .
Figure 8: Attaching the Probe in the Adapter 10. . . . . . . . . . . . . . . . . . .
Figure 9: Attaching an Adjustable Ground Pin Assembly to the
Articulating Arm 11. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 10: Securing SMD Probe in Ground Pin Assembly 12. . . . . . . . .
Figure 11: Securing General-Purpose Probe in the Ground Pin
Assembly 13. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 12: Securing FET Probe in the Ground Pin Assembly 14. . . . . .
Figure 13: Manipulator Operation 16. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 14: Focus Block Lubrication 19. . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 15: Typical Maximum Arm Reach 22. . . . . . . . . . . . . . . . . . . . . .
Figure 16: PPMS200 Microscope and Circuit Board Holder 25. . . . . . .
Figure 17: Articulating Arm Assemblies 26. . . . . . . . . . . . . . . . . . . . . . . .
Figure 18: Articulating Arm Replacement Parts 27. . . . . . . . . . . . . . . . .
Figure 19: Probe Adapters 28. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 20: Adjustable Ground Pin Assembly 29. . . . . . . . . . . . . . . . . . . .
Figure 21: Adjustable Ground Pin Assembly 30. . . . . . . . . . . . . . . . . . . .
List of Tables
ii
Table 1: Probe Adapters 9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 2: Microscope Replaceable Parts 20. . . . . . . . . . . . . . . . . . . . . . . .
Table 3: Manipulator Characteristics 21. . . . . . . . . . . . . . . . . . . . . . . . . .
Table 4: Circuit Card Holder Characteristics 21. . . . . . . . . . . . . . . . . . .
Table 5: Microscope Characteristics 21. . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 6: Transportation and Packaging 22. . . . . . . . . . . . . . . . . . . . . . . .
PPMS200 Probing System Instructions
General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it.
Injury Precautions
Do Not Operate in
Wet/Damp Conditions
Do Not Operate in
Explosive Atmosphere
To avoid electric shock, do not operate this product in wet or damp conditions.
To avoid injury or fire hazard, do not operate this product in an explosive
atmosphere.
Product Damage Precautions
Use Proper Power Source
Do not operate this product from a power source that applies more than the
voltage specified.
Safety Terms and Symbols
Terms in This Manual
These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
PPMS200 Probing System Instructions
iii
General Safety Summary
iv
PPMS200 Probing System Instructions
Getting Started
Product Description
This manual contains installation, operation, and replaceable parts information
for the PPMS200 Probing Test Station, as well as the PPM201B, PPM201C,
PPM203B, and PPM203C articulating arms.
This section contains the product description and assembly instructions.
The PPMS200 Probing Test Station provides users with a stable environment
that enables them to perform a broad spectrum of probing tasks. The PPMS200
shown in Figure 1 includes the following components for fine pitch probing:
H Circuit Board Holder
H Articulating Arm with 3 Axis Control (Two)
H Stereo Microscope with Boom Stand and Ring Lamp
Figure 1: PPMS200 Fine Pitch Probing System
PPMS200 Probing System Instructions
Circuit Board
Holder
Microscope
Articulating Arm with three
axis control and base
1
Getting Started
Assembly
The following items are not shown in Figure 1, but are also included with the
PPMS200:
H Probe Adapters
H Adjustable Ground Pin Assemblies for General Purpose and SMD probes
The PPMS200 microscope and E-arm must be assembled for operation. Refer to
Figure 2 while performing the following steps:
10X Eyepiece
E-Arm Extension Holder
Microscope Pod
Height Limit
Collar
Vertical Column
Figure 2: Microscope Assembly
E-Arm
Ring Lamp
Base Plate
Coupler or Objective
1. Securely attach the vertical column to the base plate.
2. Raise the E-arm extension holder up the vertical column until it is about six
inches from the top. Loosen the knob closest to the column to slide the
holder, and tighten the knob when the holder is in place.
2
PPMS200 Probing System Instructions
Getting Started
3. Slide the height limit collar up against the E-arm extension holder, and
tighten the locking screw. (The collar prevents accidentally lowering the
microscope too far and may be adjusted as necessary.)
4. Slide the E-arm extension into the holder (about half way) and tighten the
holder knob.
5. Secure the microscope pod into the E-arm.
a. Rotate the two clips located on either side of the microscope away from
the microscope.
b. Slide the microscope into the E-arm assembly.
c. Rotate the clips into the assembly to lock the microscope into place.
6. Attach the objective lens to the microscope.
7. Attach the ring lamp to the bottom of the pod.
a. Fit the ring lamp on the bottom of the microscope pod.
b. Screw the coupler onto the objective lense to hold the ring lamp
in place.
8. Connect the ring lamp cable to the mating connector on the ring lamp power
supply. You may have to rotate the ring lamp assembly so that the cable
reaches the rear of the bench.
9. Attach the10X eyepieces to the microscope.
PPMS200 Probing System Instructions
3
Operating Basics
Microscope Assembly
This section describes the function and operation of each of the components
supplied with the PPMS200.
Figure 3 illustrates the microscope assembly components.
E–Arm Height
Lock Knob
Height Limit Collar
E–Arm Assembly
E–Arm Reach
Lock Knob
Focus
Control
Focus Block
Assembly
Microscope
Ring Lamp
Ring Lamp Power Supply
Figure 3: Microscope Assembly
E-Arm Assembly
The E-arm assembly permits the microscope to be positioned over the device
under test. The assembly is mounted to a high-mass base for support.
4
PPMS200 Probing System Instructions
Operating Basics
E–Arm Reach Lock Knob
Focus Block Assembly
Microscope
The E-arm reach lock knob permits the arm to extend in and out in order to place
the microscope over the circuit.
CAUTION. To prevent damage or injury, do not extend the E-arm so far out that
the assembly tips forward.
The focus block assembly supports the microscope and provides focus control.
Rotate the focus control knob to focus on the device under test. The control
raises and lowers the microscope pod assembly. Make sure that the height limit
collar is set so that the microscope cannot be lowered into the circuit.
The microscope is a binocular microscope with variable magnification. Refer to
Figure 4 as the microscope components are discussed.
Zoom Control
Eyepieces
Diopter Adjust
Focus Control
Figure 4: Microscope Features and Controls
X10 Eyepieces. The eyepieces may be moved apart or together to match the
distance between your eyes. Adjust the distance so that you see a single image.
PPMS200 Probing System Instructions
Ring Lamp
1/3X Lense and Coupling Ring
(Not Shown)
5
Operating Basics
Zoom Control. The zoom control provides for variable magnification between
0.8X and 4X. Start with a high magnification of the device under test and focus
the microscope; then, as you lower the magnification, you will notice that the
device will remain in focus through the full magnification range.
Diopter Adjust. The diopter adjust permits users with corrective lenses to remove
their glasses when using the microscope. First focus while looking through the
nonadjustable eyepiece; next, view through the adjustable eyepiece and rotate the
diopter adjust collar until the image is in focus.
Objective Lens (Not shown). The objective lens partially determines the degree of
magnification that is provided by the microscope. The lens provided is a 1/3X
objective. Increased magnification is possible if the objective lens is removed;
however, the range of magnification may not be suitable for circuit board
probing.
Ring Lamp
Ring Lamp Power Supply
E-Arm Height Limit Collar
E-Arm Height Lock Knob
The ring lamp is a long-life fluorescent lamp that provides 360° of illumination
around the object being viewed. The lamp and reflector are replaced as a single
unit.
The ring lamp power supply provides the high-voltage, low-current power that
the ring lamp requires. The power supply is connected to the ring lamp with a
special connector.
The limit collar prevents the E-arm from lowering the microscope too far. The
limit collar should be carefully set so that the E-arm cannot fall too far if it is
dropped while being adjusted.
The E-arm height lock knob is loosened in order to raise, lower, or rotate the
E–arm.
CAUTION. To prevent damage to the microscope or circuit under test, hold the
E-arm securely when loosening the height lock knob. The E-arm will drop to the
height limit collar unless it is supported. Make sure that the height lock knob is
securely tightened once the arm is in position.
6
PPMS200 Probing System Instructions
Circuit Board Holder
Operating Basics
The circuit board holder holds boards up to 16 by 20 inches by using an
adjustable rail system. The board holder may be used lying down or standing
upright. See Figure 5.
Attach the circuit board by either slipping it into the main rail slots or by
attaching it to the small insulator-adapters that are provided. Gently slide the
rails together to hold the board in place and tighten the adjusting knobs.
After the board and microscope are in position, the manipulator arm is moved to
the point to be probed.
Figure 5: Circuit Board Holder
PPMS200 Probing System Instructions
7
Operating Basics
Manipulators
The PPMS200 comes with two 3-axis manipulators for fine pitched circuit board
probing. Each of the manipulators is equipped with an articulating arm for probe
positioning and a high mass base for stability. See Figure 6.
Manipulators are also available with clamp bases and single axis controls. Refer
to Figure 17 on page 26 for illustrations and model numbers.
Figure 6: Fine Pitch XYZ Manipulator
8
PPMS200 Probing System Instructions
Attaching Probes to the Manipulator
The PPMS200 comes with adapters to attach different styles of probes onto the
articulating arms. Refer to Table 1 and the probe section of your Tektronix
catalog for a complete description of probes and styles.
T able 1: Probe Adapters
5 mm Adapter. Use this adapter for holding Tektronix 5 mm (miniature style) probes. The
P6204 is a typical 5 mm probe.
4 mm Adapter. Use this adapter for holding Tektronix probes with 4 mm heads. The P6207
and P6217 are typical 4 mm probes.
Operating Basics
3.5 mm Adapter. Use this adapter for holding Tektronix 3.5 mm (compact style) probes. The
P6139A is a typical 3.5 mm probe.
2.5 mm Adapter. Use this adapter for holding Tektronix 2.5 mm (subminiature style) probes.
The P6231 is a typical 2.5 mm probe.
SMD Adapter. Use this adapter for holding Tektronix SMD probes. The P6563A is a typical
SMD probe.
P6245 Adapter. Use this adapter for holding the Tektronix P6245 probe.
Adjustable Ground Pin Assembly for General-Purpose Probes. Use this assembly for
holding general-purpose probes. Select the larger or smaller ferrule depending on whether you
are adapting a probe with a 3.5 or 2.5 mm diameter.
Adjustable Ground Pin Assembly for SMD Probes. Use this assembly for holding SMD
probes.
PPMS200 Probing System Instructions
9
Operating Basics
Attach the probe adapter to the articulating arm as shown in Figure 7. The
adapter can be rotated to a position that is convenient to the user.
Figure 7: Attaching the Probe Adapter to the Articulating Arm
To fit a probe into an adapter, slide the probe through the hole from the back.
After the probe is in position, gently tighten the clamp screw to hold the probe in
place. See Figure 8.
Clamp Screw
Figure 8: Attaching the Probe in the Adapter
10
PPMS200 Probing System Instructions
Operating Basics
Attach an adjustable ground pin assembly to the arm as shown in Figure 9.
5/64 inch hex
Figure 9: Attaching an Adjustable Ground Pin Assembly to the Articulating Arm
PPMS200 Probing System Instructions
11
Operating Basics
Use the following procedure to fit a probe into the adjustable ground pin
assembly for SMD probes:
1. Slide the probe through the hole from the back.
2. Set the probe tip slightly behind the spring-loaded ground pin so that the
ground pin will make contact and compress before the probe tip makes
contact.
3. After the probe is in position, gently tighten the set screw to hold the probe
in place. See Figure 10.
Tighten Set
Screw
Figure 10: Securing SMD Probe in Ground Pin Assembly
12
PPMS200 Probing System Instructions
Operating Basics
Use the following procedure to fit a 3.5 mm or 2.5 mm general-purpose probe
into the adjustable ground pin assembly shown in Figure 11:
1. Loosen the four screws with a 1/8 inch hex wrench.
2. If necessary, place the appropriate size ferrule (3.5 mm or 2.5 mm) around
the probe shaft and put the probe in the assembly.
3. Set the probe tip slightly behind the spring-loaded ground pin so that the
ground pin will make contact and compress before the probe tip makes
contact.
4. When the probe is in position, tighten the four screws.
1/8 inch hex
Figure 11: Securing General-Purpose Probe in the Ground Pin Assembly
PPMS200 Probing System Instructions
13
Operating Basics
For probes similar to the P6207 FET Probe, install the probe and ground spring
as shown in Figure 12. Use the longer screws supplied with the assembly.
Before tightening the screws, pull the probe into the assembly to create a slight
tension on the spring. This tension ensures that there is good electrical contact
between the spring and the assembly.
Figure 12: Securing FET Probe in the Ground Pin Assembly
14
PPMS200 Probing System Instructions
Manipulator Operation
Operating Basics
The procedure to use for operating the manipulator depends on whether you are
probing a single point, or you are probing between ground and another point
with an adjustable ground pin assembly.
Probing a Single Point
Use the following procedure to probe a single point:
1. Secure the probe in the appropriate probe adapter and attach the adapter to
the end of the manipulator arm.
2. Adjust the coarse position of the manipulator by moving the entire assembly
close to the device under test. If possible, try to keep a shallow angle in the
articulating arm.
3. Gently articulate the arm so that the probe tip is close to the device under test
without actually touching it.
4. Using the stereo microscope, fully magnify and focus on the device under
test. You will find it easier to start probing at a lower magnification value
and increase the magnification as the probe moves closer to the contact
point.
5. Adjust the fine position of the manipulator by rotating the knob on each axis
until the probe tip just makes contact with the circuit. The articulating arm
will move slowly as each knob is rotated. See Figure 13 for the relationship
between knob rotation and axis travel.
CAUTION. Adjust the manipulator so that the probe tip just touches the device
under test. Attempting continued travel against the circuit may break the probe
tip or damage the circuit.
PPMS200 Probing System Instructions
15
Operating Basics
Probing Between a Single
Point and Ground
Figure 13: Manipulator Operation
Use the following procedure to probe between a single point and a nearby
ground:
1. Secure the probe in the appropriate ground pin assembly and attach the
assembly to the end of the manipulator arm. (As explained earlier, make sure
the probe tip is slightly behind the spring-loaded ground pin so that the
ground pin will make contact and compress before the probe tip makes
contact.)
2. Carefully thread the cable end of the adjustment control onto the assembly.
3. Affix the housing of the control to a stable work surface with the attachment
strips provided.
4. Adjust the coarse position of the manipulator by moving the entire assembly
close to the device under test. If possible, try to keep a shallow angle in the
articulating arm.
5. Gently articulate the arm so that the probe tips are close to the device under
test without actually touching it.
16
PPMS200 Probing System Instructions
Operating Basics
6. Using the stereo microscope, fully magnify and focus on the device under
test. You will find it easier to start probing at a lower magnification value
and then increasing the magnification as the probe tips move closer to the
contact points.
7. Set the distance between the probe tip and ground pin to the desired distance
by turning the adjustment on the control cable. Alternate between adjusting
the manipulator and adjusting the control until the ground pin makes contact.
NOTE. To keep the adjustment of the ground assembly from changing, avoid
disturbing the cable of the control as you probe the circuit.
8. Adjust the fine position of the manipulator by rotating the knob on each axis
until the ground pin compresses and the probe tip just makes contact with
the circuit. The articulating arm will move slowly as each knob is rotated.
See Figure 13 for the relationship between knob rotation and axis travel.
CAUTION. Adjust the manipulator so that the probe tip just touches the device
under test. Attempting continued travel against the circuit may break the probe
tip or damage the circuit.
PPMS200 Probing System Instructions
17
Maintenance
Cleaning
The PPMS200 requires very little maintenance beyond routine cleaning and
lubrication.
The microscope assembly should be covered when not in use to prevent dust
from damaging the eyepieces.
CAUTION. To prevent damage to component finishes, do not clean using
chemicals containing benzine, benzene, toluene, xylene, acetone, or similar
solvents. Light detergents or isopropyl alcohol are recommended.
Circuit Board Holder
Accessories
Microscope
The circuit board holder should be kept clean using isopropyl alcohol and a clean
soft cloth. Wipe the holder with a dampened cloth and allow it to air dry.
The accessories are intended for “hands–on” use and will become soiled. We
recommend that the accessories be cleaned once a week or as necessary. Wipe
the accessory with a clean soft cloth dampened with isopropyl alcohol, and allow
the accessory to air dry.
Cover the microscope when it is not in use. The eyepieces can be cleaned using
lens cleaner and tissues available from a photography supply store. When
cleaning the lenses, follow these steps:
1. Blow off dust and grit with clean air. A soft brush may be used if com-
pressed air is not available.
2. Moisten a lens cleaning tissue with lens cleaning fluid.
CAUTION. Do not apply lens cleaning fluid directly to the lens. The fluid will run
into the lens assembly and could damage internal components.
3. Wipe the lens gently with the dampened tissue.
18
4. Dry the lens with compressed air or by gently buffing with a dry tissue.
PPMS200 Probing System Instructions
Lubrication
Maintenance
Manipulators
Microscope Focus Block
Do not apply lubricant to the manipulator lead screws. The lead nuts are
self–lubricating, and foreign lubricants will collect dust and grit.
The microscope focus block should be lubricated twice a year or as necessary.
Raise the microscope focus block to the highest position by rotating the focus
control knob. Place 3 to 4 drops of high pressure lubricant on the bottom of
the ratchet. See Figure 14 for the location of the lubrication point.
Raise and lower the microscope several times using the focus control to work the
lubricant onto the gear surfaces.
Lubricate Here
Figure 14: Focus Block Lubrication
PPMS200 Probing System Instructions
19
Maintenance
Microscope Repair
CAUTION. To prevent microscope damage, do not attempt to disassemble the
microscope for any reason. The microscope has been factory aligned, cleaned
and sealed.
If you have any problems with you microscope during the warranty period,
please contact your local Tektronix representative for assistance.
For additional assistance or accessories, please contact the microscope
manufacturer directly:
Leica Inc.
111 Deer Lake Road
Deerfield IL 60015
(800) 248-0123
(708) 405-0123
Fax (708) 405-0147
Table 2 lists manufacturer descriptions and part numbers for your convenience:
T able 2: Microscope Replaceable Parts
Description Leica Part Number
StereoZoom 5 microscope 31-27-40
10X eyepieces (pair) 31-15-71-02
0.3X supplementary lense 31-27-41
Fluorescent ring illuminator (110V) 31-36-15
Replacement illuminator lamp
Converter ring 31-36-06
Focus block assembly 31-26-59
Boom assembly 31-27-14
1
General Electric part number 74BWW.
1
31-31-30
20
PPMS200 Probing System Instructions
Specifications
Unless noted as typical, the specifications listed in tables 3 through 6 are
warranted to the customer.
T able 3: Manipulator Characteristics
Travel in provided axes (minimum) 1.0 inches (2.54cm)
Axis control Adjusted at 10 turns per inch
Probe holders Accepts Tektronix SMD, 2.5 mm, 3.5 mm,
4 mm, 5 mm, and P6245 style probes
Attachment method High mass base or clamp as provided
Maximum clamping thickness 1.75 inches (4.45 cm)
Maximum Arm Reach (typical) See Figure 15
T able 4: Circuit Card Holder Characteristics
Maximum card dimensions (typical) 12 by 18 inches
(30.5 by 45.7 cm)
Maximum card thickness (typical) 0.085 inches (2.16 mm)
Material (typical) Aluminum
Surface (typical) Black matte
T able 5: Microscope Characteristics
Type Binocular
Magnification range 0.8X to 4X
Eyepieces 10X
Objective 1/3X
Illuminator 120 VAC fluorescent ring, UL/CSA certified
PPMS200 Probing System Instructions
21
Specifications
T able 6: Transportation and Packaging
Packaged product transportation performance The packaged product qualifies under the
distribution cycle 3, assurance level II, for
packaged products 100–150 pounds
Tektronix design standard 062–2858–00,
Rev .B, section 17
Transportation package recyclability This product transportation package meets the
requirements for recyclability
Tektronix design standard 063–1290–00
+14 inches
Radius = 14 inches
Theta = 180 degrees
Datum
Figure 15: Typical Maximum Arm Reach
Datum
–5 inches
14 inch radius
22
PPMS200 Probing System Instructions
Replaceable Parts
This section contains a list of the replaceable modules for the PPMS200. Use
this list to identify and order replacement parts.
Parts Ordering Information
Replacement parts are available through your local Tektronix field office or
representative.
Changes to Tektronix products are sometimes made to accommodate improved
components as they become available and to give you the benefit of the latest
improvements. Therefore, when ordering parts, it is important to include the
following information in your order:
H Part number
H Product type or model number
H Product serial number
H Product modification number, if applicable
If you order a part that has been replaced with a different or improved part, your
local Tektronix field office or representative will contact you concerning any
change in part number.
Change information, if any, is located at the rear of this manual.
PPMS200 Probing System Instructions
23
Replaceable Parts
Using the Replaceable Parts List
This section contains a list of the mechanical and/or electrical components that
are replaceable for the PPMS200. Use this list to identify and order replacement
parts. The following table describes each column in the parts list.
Parts List Column Descriptions
Column Column Name Description
1 Figure & Index Number Items in this section are referenced by figure and index numbers to the exploded view
illustrations.
2 Tektronix Part Number Use this part number when ordering replacement parts from Tektronix.
3 and 4 Serial Number Column three indicates the serial number at which the part was first effective. Column four
indicates the serial number at which the part was discontinued. No entries indicates the part is
good for all serial numbers.
5 Qty This indicates the quantity of parts used.
6 Name & Description An item name is separated from the description by a colon (:). Because of space limitations, an
item name may sometimes appear as incomplete. Use the U.S. Federal Catalog handbook
H6-1 for further item name identification.
7 Mfr. Code This indicates the code of the actual manufacturer of the part.
8 Mfr. Part Number This indicates the actual manufacturer’s or vendor’s part number.
Abbreviations
Mfr. Code to Manufacturer
Cross Index
Mfr.
Code
80009
Manufacturer Address City, State, Zip Code
TEKTRONIX INC 14150 SW KARL BRAUN DR
Abbreviations conform to American National Standard ANSI Y1.1–1972.
The table titled Manufacturers Cross Index shows codes, names, and addresses
of manufacturers or vendors of components listed in the parts list.
CROSS INDEX – MFR. CODE NUMBER TO MANUFACTURER
BEAVERT ON OR 97077–0001
PO BOX 500
24
PPMS200 Probing System Instructions
Replaceable Parts
1
2
3
Figure 16: PPMS200 Microscope and Circuit Board Holder
%
16–1
–2 119–4845–00 1 CKT BD HLDR:CIRCUIT BOARD HOLDER,BENCHT OP 80009 119484500
–3 366–0762–00 4 KNOB:CLAMPING KNOB,SET OF 2;1.125 DIA
#!%
!#
119–4839–00 1 MICROSCOPE ASSY:BENCH TOP MICROSCOPE SYSTEM 80009 119483900
!
#$ "#
#&
"! #
X 0.750 H X 0.50 HUB DIA
!
80009 366076200
PPMS200 Probing System Instructions
! !#
25
Replaceable Parts
PPM203C PPM203B
Figure 17: Articulating Arm Assemblies
26
PPM201C
PPM201B
PPMS200 Probing System Instructions
Replaceable Parts
1
2
2
3
2
5
4
Figure 18: Articulating Arm Replacement Parts
%
18–1
–2 366–0761–00 3 KNOB:MANIPULATOR KNOB,SET OF 3,0.625 DIA X 0.750
–3 119–4840–00 1 MANIPULATOR:MANIPULATOR,XY COARSE 80009 119484000
–4 119–4837–00 1 BASE,HI–MASS:BASE,HI–MASS 80009 119483700
–5 119–4838–00 1 CHASSIS:CHASSIS CLAMP 80009 119483800
#!%
!#
119–4836–00 1 ARM:ARTICULATING ARM,W/1 AXIS MANIPULATOR 80009 119483600
!
#$ "#
#&
"! #
H X 0.437ID,24 PITCH ST KNURL
!
80009 366076100
! !#
PPMS200 Probing System Instructions
27
Replaceable Parts
3
5
4
2
1
SMD 2.5mm 3.5mm P6245 5mm 4mm
Figure 19: Probe Adapters
%
19– 020–2104–00
#!%
!#
020–2105–00
!
#$ "#
#&
"! #
STANDARD ACCESSORIES
1
ACCESSORY KIT:SET OF 6 RECEPTACLES,R–SS50–CR
& SERIES SS–50B90 POGO PIN OR EQUIVALENT
1
ACCESSORY KIT 2 LARGE CABLE CLIPS & 2 SMALL
CABLE CLIPS
!
80009
80009
6
! !#
020210400
020210500
070–9092–00
–1 407–4365–00 1 BRACKET,PROBE:ADAPTER BRACKET,SMD PROBE,BLK
–2 407–4366–00 1 BRACKET,PROBE:SUBMINIATURE PROBE BRACKET
–3 407–4367–00 1 BRACKET,PROBE:COMPACT PROBE BRACKET
–4 407–4368–00 1 BRACKET,PROBE:P6245 PROBE BRACKET
–5 407–4369–00 1 BRACKET,PROBE:MINIATURE PROBE BRACKET
–6 407–4370–00 1 BRACKET,PROBE:ACTIVE PROBE BRACKET
1
MANUAL,TECH:INSTRUCTIONS,PPMS200,DP
ANODIZED ALUM,0.105
ADAPTER,2.5MM,BLK ANODIZED ALUM
ADAPTER,3.5MM,BLK ANODIZED ALUM
ADAPTER,0.245 X 0.475,BLK ANODIZED ALUM
ADAPTER,5MM,BLK ANODIZED ALUM
ADAPTER,4MM,BLK ANODIZED ALUM
80009
80009 407436500
80009 407436600
80009 407436700
80009 407436800
80009 407436900
80009 407437000
070909200
28
PPMS200 Probing System Instructions
Replaceable Parts
1
1
2
Figure 20: Adjustable Ground Pin Assembly
Fig. &
Index
Number
20– 119–4841–00 1 GND PIN:ADJUST ABLE GND PIN ASSY,SMALL PROBE 80009 119484100
–1 020–2114–00 1 COMPONENT KIT:REPLACEMENT PARTS FOR PROBE
–2 174–3473–00 1 CA ASSY,SP:SHLD CMPST ,GRD PROBE;SDI,PROBE ASSY
Tektronix Part
Number
Serial No.
Effective
Serial No.
Discont’d
Qty Name & Description
OPTIONAL ACCESSORIES
GROUND,ARM,SPRING AND SCREW
W/ADJUSTING BLOCK,CAP & SCREW FOR PROBE GND
Mfr.
Code
80009 020211400
80009 174347300
Mfr. Part Number
PPMS200 Probing System Instructions
29
Replaceable Parts
1
1
2
3
Figure 21: Adjustable Ground Pin Assembly
Fig. &
Index
Number
21– 119–4842–00 1 GND PIN:ADJUST ABLE GND PIN ASSY,LARGE PROBE 80009 119484200
–1 020–2114–00 1 COMPONENT KIT:REPLACEMENT PARTS FOR PROBE
Tektronix Part
Number
30
Serial No.
Effective
Serial No.
Discont’d
Qty Name & Description
OPTIONAL ACCESORIES
GROUND,ARM,SPRING AND SCREW
Mfr.
Code
80009 020211400
Mfr. Part Number
PPMS200 Probing System Instructions
Fig. &
Index
Number
–2 020–2113–00 1 COMPONENT KIT:PROBE ADAPTER,TUBE,SET OF TWO
–3 174–3473–00 1 CA ASSY,SP:SHLD CMPST ,GRD PROBE;SDI,PROBE ASSY
Tektronix Part
Number
Serial No.
Effective
Serial No.
Discont’d
Name & DescriptionQty
EACH 3.5MM & 2.5MM
W/ADJUSTING BLOCK,CAP & SCREW FOR PROBE GND
Replaceable Parts
Mfr.
Code
80009 020211300
80009 174347300
Mfr. Part Number
PPMS200 Probing System Instructions
31
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