High power density 600V half-bridge driver with two enhancement mode GaN
HEMT
Features
•600 V system-in-package integrating half-bridge gate driver and high-voltage
GaN power transistors:
–QFN 9 x 9 x 1 mm package
–R
–I
•Reverse current capability
•Zero reverse recovery loss
•UVLO protection on low-side and high-side
•Internal bootstrap diode
•Interlocking function
•Dedicated pin for shut down functionality
•Accurate internal timing match
•3.3 V to 15 V compatible inputs with hysteresis and pull-down
•Over temperature protection
•Bill of material reduction
•Very compact and simplified layout
•Flexible, easy and fast design.
DS(ON)
DS(MAX)
= 225 mΩ
= 6.5 A
Product status link
MASTERGAN4
Product label
Applications
Switch-mode power supplies
Chargers and adapters
High-voltage PFC, DC-DC and DC-AC Converters
Description
The MASTERGAN4 is an advanced power system-in-package integrating a
gate driver and two enhancement mode GaN power transistors in half bridge
configuration. The integrated power GaNs have 650 V drain-source blocking voltage
and R
easily supplied by the integrated bootstrap diode.
The MASTERGAN4 features UVLO protection on both the lower and upper
driving sections, preventing the power switches from operating in low efficiency
or dangerous conditions, and the interlocking function avoids cross-conduction
conditions.
The extended range of the input pins allows easy interfacing with microcontrollers,
DSP units or Hall effect sensors.
The MASTERGAN4 operates in the industrial temperature range, -40°C to 125°C.
The device is available in a compact 9x9 mm QFN package.
of 225 mΩ, while the high side of the embedded gate driver can be
DS(ON)
DS13686 - Rev 1 - April 2021
For further information contact your local STMicroelectronics sales office.
www.st.com
1Block diagram
Driver
Driver
Logic,
interlocking,
overtemp
Level Shifter
Level Shifter
VCC UVLO
UVLO
Vbo
PGNDPVCC
OUTbBOOT
GL
GH
VCC
HIN
LIN
SD/OD
GND
OUT
VS
SENSE
HON
HOFF
LON
LOFF
R
BLEED
RGOFF
H
RGON
H
RGON
L
RGOFF
L
MASTERGAN4
Block diagram
Figure 1. Block diagram
DS13686 - Rev 1
page 2/27
2Pin descriptions and connection diagram
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
24
23
22
21
20
19
18
17
16
31
30
29
28
27
26
25
GND
SENSE
OUT
EP1
EP2
EP3
SENSE
OUT
OUT
OUT
SENSE
SENSE
SENSE
SENSE
SENSE
VS
VS
VS
VS
VS
GH
OUTb
BOOT
PGND
GL
PVCC
N.C.
VCC
GND
LIN
HIN
SD/OD
N.C.
N.C.
N.C.
Figure 2. Pin connections (top view)
MASTERGAN4
Pin descriptions and connection diagram
2.1Pin list
Table 1. Pin descriptions
Pin NumberPin NameTypeFunction
15, 16, 17, 18, 19VSPower SupplyHigh voltage supply (high-side GaN Drain)
12, 13, 14, EP3OUTPower OutputHalf-bridge output
4, 5, 6, 7, 8, 9, 10, 11, EP2SENSEPower SupplyHalf-bridge sense (low-side GaN Source)
22BOOTPower SupplyGate driver high-side supply voltage
21OUTbPower Supply
27VCCPower SupplyLogic supply voltage
1PVCCPower SupplyGate driver low-side supply voltage
28, EP1GNDPower SupplyGate driver ground
3PGNDPower Supply
26HINLogic InputHigh-Side driver logic input
24LINLogic InputLow-Side driver logic input
25SD/ODLogic Input-output Driver Shut-Down input and Fault Open-Drain
2GLOutputLow-Side GaN gate.
20GHOutputHigh-Side GaN gate.
23, 29, 30, 31N.C.Not ConnectedLeave floating
Gate driver high-side supply voltage, used only for Bootstrap
capacitor connection. Internally connected to OUT.
Gate driver low-side buffer ground. Internally connected to
SENSE.
DS13686 - Rev 1
page 3/27
3Electrical Data
3.1Absolute maximum ratings
Each voltage referred to GND unless otherwise specified
SymbolParameterTest ConditionValueUnit
V
DS
VCCLogic supply voltage--0.3 to 11V
PVCC-PGND
VCC-PGND Logic supply vs Low-side driver ground--0.3 to 18.3V
PVCCLow-side driver supply vs logic ground--0.3 to 18.3V
PGNDLow-side driver ground vs logic ground--7.3 to 11.3V
V
BO
BOOTBootstrap voltage--0.3 to 620V
CGL, CGH
RGL, RGH
I
D
SR
V
T
T
1. PGND internally connected to SENSE.
2. OUTb internally connected to OUT
3. CGx < 0.08/(Pvcc^2*Fsw)-(330*10-12)
4. TCB is temperature of case exposed pad
5. Range estimated by characterization, not tested in production
6. Value specified by design factor, pulse duration limited to 50 µs and junction temperature
GaN Drain-to-Source Voltage
Low-side driver supply voltage
BOOT to OUTb voltage
(2)
Maximum external capacitance between GL and PGND and
between GH and OUTb
Minimum external pull down resistance between GL and
PGND and GH and OUTb
Drain current
Half-bridge outputs slew rate (10% - 90%)-100V/ns
out
Logic inputs voltage range--0.3 to 21V
i
Junction temperature--40 to 150°C
J
Storage temperature--40 to 150°C
s
Table 2. Absolute maximum ratings
TJ = 25 °C
(1)
FSW = 500 kHz
DC @ TCB = 25 °C
DC @ TCB = 100 °C
Peak @ TCB = 25 °C
MASTERGAN4
Electrical Data
620V
--0.3 to 7V
--0.3 to 7V
(3)
-6.8kΩ
(4) (5)
(4) (5)
(4) (5) (6)
3.9nF
6.5A
4.6A
12A
DS13686 - Rev 1
page 4/27
3.2Recommended operating conditions
Table 3. Recommended operating conditions
Each voltage referred to GND unless otherwise specified
SymbolParameterNoteMin Max Unit
VSHigh voltage bus-0520V
VCCSupply voltage-4.75 9.5V
PVCC-PGND
PVCC to PGND Low side supply
PVCCLow-side driver supply-38.5V
VCC-PVCCVCC to PVCC pin voltage--33V
PGND
Low-side driver ground
(1)
DTSuggested minimum dead time-5-ns
T
IN_MIN
V
BO
Minimum duration of input pulse to obtain undistorted output pulse
BOOT to OUTb pin voltage
BOOTBOOT to GND voltage-
V
T
J
Logic inputs voltage range-020V
i
Junction temperature--40125°C
1. PGND internally connected to SENSE
2. See Section 6.1 Logic inputs for more detail
3. OUTb internally connected to OUT
4. 5 V is recommended during High Side turn-on
(1)
(3)
MASTERGAN4
Recommended operating conditions
-4.75 6.5V
Best performance56.5V
--22V
(2)
Best performance56.5V
-120-ns
-4.46.5V
(4)
0
530V
3.3
Thermal data
Table 4. Thermal data
SymbolParameterValueUnit
R
th(J-CB)_HS
R
th(J-A)
The junction to ambient thermal resistance is obtained simulating the device mounted on a 2s2p (4 layer) FR4
board as per JESD51-5,7 with 6 thermal vias for each exposed pad. Power dissipation is uniformly distributed
over the two GaN transistors.
Thermal resistance of each transistor’s junction to relevant exposed pad, typical2.8°C/W
Thermal resistance junction-to-ambient(1)17.8°C/W
DS13686 - Rev 1
page 5/27
4Electrical characteristics
4.1Driver
Table 5. Driver electrical characteristics
VCC = PVCC = 6 V, SENSE = GND, TJ = 25 °C, unless otherwise specified
Each voltage referred to GND unless otherwise specified
Symbol-ParameterTest conditionMin Typ Max Unit
VCC
VCC
VCC
I
QVCCU
I
I
thON
thOFF
hys
VCC vs. GND
QVCC
SVCC
VCC UV turn ON threshold
VCC UV turn OFF threshold
VCC UV hysteresis
VCC undervoltage quiescent
supply current
VCC quiescent supply current
VCC switching supply current
Logic section supply
(1)
(1)
(1)
VCC = PVCC = 3.8 V-320 410μA
SD/OD = LIN = 5 V;
HIN = 0 V;
BOOT = 7 V
SD/OD = 5 V; VBO = 6.5 V;
VS = 0 V; FSW = 500 kHz
MASTERGAN4
Electrical characteristics
-4.24.5 4.75V
-3.94.24.5V
-0.20.3 0.45V
-680 900μA
-0.8-mA
I
QPVCC
I
SPVCC
R
BLEED
RON
ROFF
V
BOthON
V
BOthOFF
V
BOhys
I
QBOU
I
QBO
I
SBO
I
R
DBoot
RON
ROFF
Low-side driver section supply
PVCC quiescent supply currentSD/OD = LIN = 5 V-150-μA
PVCC vs. PGND
PVCC switching supply current
VS = 0 V
FSW = 500 kHz
-1.0-mA
GL vs. PGNDLow side gate bleederPVCC = PGND75100 125kΩ
L
L
-
-
Low side turn on resistance
Low side turn off resistance
(2)
(2)
I(GL) = 1 mA (source)-77-Ω
I(GL) = 1 mA (sink)-2-Ω
High-side floating section supply
VBO UV turn ON threshold
VBO UV turn OFF threshold
VBO UV hysteresis
BOOT vs. OUTb
VBO undervoltage quiescent
supply current
(3)
VBO quiescent supply current
BOOTBOOT switching supply current
BOOT vs. SGND High voltage leakage currentBOOT = OUT = 600 V--11μA
LK
VCC vs. BOOT
Bootstrap diode on-resistance
(3)
(3)
(3)
VBO = 3.4 V
VBO = 6 V; LIN = GND;
(3)
SD/OD = HIN = 5 V;
VBO =6 V; SD/OD = 5 V;
VS = 0 V; FSW = 500 kHz
SD/OD = LIN = 5 V;
(4)
HIN = GND = PGND
-3.64.04.4V
-3.43.74.0V
-0.10.30.5V
-140 200μA
-217-μA
-1.9-mA
-140 175Ω
VCC – BOOT = 0.5 V
H
H
-
-
High side turn on resistance
High side turn off resistance
(2)
I(GH) = 1 mA (source)-77-Ω
(2)
I(GH) = 1 mA (sink)-2-Ω
DS13686 - Rev 1
page 6/27
MASTERGAN4
Driver
Symbol-ParameterTest conditionMin Typ Max Unit
Logic inputs
V
R
PD_IN
I
I
R
PD_SD
V
R
ON_OD
V
V
ihys
I
INh
I
INl
SDh
SDl
TSD
il
ih
TJ = 25 °C
LIN, HIN, SD/OD
Low level logic threshold voltage
Full Temperature range
TJ = 25 °C
High level logic threshold voltage
Full Temperature range
(5)
(5)
Logic input threshold hysteresis0.7 0.96 1.2V
Logic ‘1’ input bias currentLIN, HIN = 5 V233355μA
2. Range estimated by characterization, not tested in production
2.2 A
GS
-0.5-µA
(1)
(2)
T
25°C
J =
125°C
(2)
T
J =
-1.7-V
-40-µA
-225300
mΩ
-495-
DS13686 - Rev 1
page 8/27
5Device characterization values
The information in Table 7 and Table 8 represent typical values based on characterization and simulation results
and are not tested in production.
Table 7. GaN power transistor characterization values (each transistor)
SymbolParameterTest conditionMinTypMaxUnit
Q
Total gate charge
G
Q
E
C
C
C
I
1. C
2. C
Q
Output charge
OSS
Output Capacitance stored energy-1.7-µJ
OSS
Output capacitance-14.2-pF
OSS
Effective output capacitance energy related
O(ER)
Effective output capacitance time related
O(TR)
Reverse recovery charge--0-nC
RR
Reverse recovery current--0-A
RRM
is the fixed capacitance that would give the same stored energy as C
O(ER)
V
DS
is the fixed capacitance that would give the same charging time as C
O(TR)
V
DS
(2)
MASTERGAN4
Device characterization values
V
6 V, TJ = 25 °C
GS =
V
0 to 400 V
DS =
VGS = 0 V, VDS = 400 V
(1)
VGS = 0 V, VDS = 0 to 400 V
while VDS is rising from 0 V to the stated
OSS
while VDS is rising from 0 V to the stated
OSS
-1.5-nC
-14-nC
-21-pF
-34-pF
Symbol
t
(on)
t
C(on)
t
(off)
t
C(off)
1. t
2. tC
t
SD
E
E
(on)
Table 8. Inductive load switching characteristics
ParameterTest conditionMinTypMaxUnit
(1)
Turn-on time
(2)
Crossover time (on)-25-ns
(2)
Turn-off time-70-ns
(1)
Crossover time (off)-10-ns
Shutdown to high/low-side propagation delay-70-ns
Turn-on switching losses-10-µJ
on
Turn-off switching losses-2.5-µJ
off
and t
(on)
include the propagation delay time of the internal driver and GaN Turn on time
(off)
and tC
are the switching times of GaN transistor itself under the internally given gate driving conditions
(off)
VS = 400 V,
VGS = 6 V,
ID = 3.2 A
See Figure 3
-70-ns
DS13686 - Rev 1
page 9/27
Figure 3. Switching time definition
I
D
I
D
V
DS
V
DS
V
IN
V
IN
t
(ON)
t
(OFF)
t
C(ON)
t
C(OFF)
10%I
D
10%V
DS
10%I
D
10%V
DS
(a) turn-on
(b) turn-off
VDS (V)
I
D
(A)
VGS=6V
TJ=25°C
VGS=5V
0
12345
0
2
4
6
8
10
12
14
16
18
20
VGS=4V
VDS (V)
I
D
(A)
VGS=6V
TJ=125°C
VGS=5V
0
12345
0
1
2
3
4
5
6
7
8
9
10
VGS=4V
MASTERGAN4
Device characterization values
DS13686 - Rev 1
Figure 4. Typ ID vs VDS at TJ=25°C
Figure 5. Typ ID vs VDS at TJ=125°C
page 10/27
0
2
1018 20
0.22
0.24
0.26
0.28
0.30
0.32
0.34
0.36
0.38
TJ=25°C
ID (A)
R
DS(on)
(Ω)
4V
5V
6V
16
14124
86
0
1
5910
0.45
0.48
0.51
0.54
0.57
0.60
0.63
0.66
0.69
TJ=125°C
ID (A)
R
DS(on)
(Ω)
4V
5V
6V
8
762
43
VDS (V)
I
D
(A)
VGS=6V
TJ=25°C
0
12345
0
2
4
6
8
10
12
14
16
18
20
TJ=50°C
TJ=75°C
TJ=100°C
TJ=125°C
Normalized R
DS(on)
(1 at 25°C)
0
1.0
0.5
1.5
2.0
2.5
3.0
Temperature (°C)
-50
-10
30
70
110
150
MASTERGAN4
Device characterization values
Figure 6. Typ R
Figure 8. Typ I
vs ID at TJ=25°C
DS(ON)
D(ON)
vs V
DS
Figure 7. Typ R
Figure 9. Typ R
DS(ON)
DS(ON)_x
vs ID at TJ=125°C
vs TJ, normalized at 25°C
DS13686 - Rev 1
page 11/27
VSD (V)
I
S
(A)
VGS=6V
TJ=25°C
VGS=0V
0
12345678910
0
4
8
12
16
20
24
28
32
36
40
VSD (V)
I
S
(A)
VGS=6V
TJ=125°C
VGS=0V
0
12345678910
0
2
4
6
8
10
12
14
16
18
20
1
10
100
1000
0.01
0.1
1
10
DC
50 μs
0.2 μs
Id (A)
Vds (V)
00.5
1
1.5
2
2.5
QG (nC)
V
GS
(V)
0
2
1
3
4
5
6
400 V
100 V
7
MASTERGAN4
Device characterization values
Figure 10. Typ ISD vs VSD, at TJ=25°C
Figure 12. Safe Operating Area at TJ=25°C
Figure 11. Typ ISD vs VSD, at TJ=125°C
Figure 13. Typ Gate Charge at TJ=25°C
DS13686 - Rev 1
page 12/27
0
25
50
75
100
125
TCB (°C)
0
150
10
20
30
40
50
60
70
P
DISS
(W)
R
DBoot
(ohm)
0
100
50
150
200
250
300
Temperature (°C)
-50
-10
30
70
110
150
MASTERGAN4
Device characterization values
Figure 14. Derating Curve
Figure 15. Typ R
Dboot
vs T
J
DS13686 - Rev 1
page 13/27
6Functional description
6.1Logic inputs
The MASTERGAN4 features a half-bridge gate driver with three logic inputs to control the internal high-side and
low-side GaN transistors.
The devices are controlled through following logic inputs:
•SD/OD: Shut-down input, active low;
•LIN: low-side driver inputs, active high;
•HIN: high-side driver inputs, active high.
Table 9. Inputs truth table (applicable when device is not in UVLO)
Input pinsGaN transistors status
SD/ODLINHINLSHS
L
HLLOFFOFF
HLHOFFON
HHLONOFF
1. X: Don’t care
2. Interlocking
H
(1)
X
(2)
H
MASTERGAN4
Functional description
(1)
X
(2)
H
OFFOFF
OFFOFF
6.2
The logic inputs have internal pull-down resistors. The purpose of these resistors is to set a proper logic level in
case, for example, there is an interruption in the logic lines or the controller outputs are in tri-state conditions.
If logic inputs are left floating, the gate driver outputs are set to low level and the corresponding GaN transistors
are turned off.
The minimum duration of the on time of the pulses applied to LIN is T
either extended to T
or blanked, if shorter than 30ns (typ). Minimum duration of the off time of the pulses
IN_MIN
= 120ns; shorter pulses could be
IN_MIN
applied to LIN is 60ns or could be blanked if they are shorter.
The minimum duration of the off time of the pulses applied to HIN is T
either extended to T
or blanked, if shorter than 30ns (typ). Minimum duration of the on time of the pulses
IN_MIN
= 120ns; shorter pulses shall be
IN_MIN
applied to HIN is 60ns or could be blanked if they are shorter.
Interlocking feature interrupts running T
to avoid unexpected cross-conduction.
IN_MIN
Matched, short propagation delay between low side and high side are there.
Bootstrap structure
Bootstrap circuitry is typically used to supply the high-voltage section. MASTERGAN4 integrates this structure by
means of a patented integrated high-voltage DMOS to reduce the external components.
The Boostrap integrated circuit is connected to VCC pin and is driven synchronously with the low-side driver.
The use of an external bootstrap diode in parallel to the integrated structure is possible, especially when the
operating frequency is generally higher than 500kHz.
DS13686 - Rev 1
page 14/27
6.3VCC supply pins and UVLO function
VCC = PVCC
VCC
thON
VCC
thOFF
UVLO VCC
0V
0V
VCC rise
LIN
GL-PGND
0V
PVCC
The VCC pin supplies current to the logic circuit, level-shifters in the low-side section and the integrated bootstrap
diode.
The PVCC pin supplies low-side output buffer. During outputs commutations the average current used to provide
gate charge to the high-side and low-side GaN transistors flow through this pin.
The PVCC pin can be connected either to the same supply voltage of the VCC pin or to a separated voltage
source. In case the same voltage source is used, it is suggested to connect VCC and PVCC pins by means of
a small decoupling resistance. The use of dedicated bypass ceramic capacitors located as close as possible to
each supply pin is highly recommended.
The MASTERGAN4 VCC supply voltage is continuously monitored by under-voltage lockout (UVLO) circuitry that
turns the high-side and low-side GaN transistors off when the supply voltage goes below the V
The UVLO circuitry turns on the GaN, accordingly to LIN and HIN status, approximately 20µs (typ) after the
supply voltage goes above the V
voltage. A V
CCthON
Figure 16. VCC UVLO and Low Side
MASTERGAN4
VCC supply pins and UVLO function
CC_thOFF
hysteresis is provided for noise rejection purposes.
CChys
threshold.
DS13686 - Rev 1
page 15/27
6.4VBO UVLO protection
VCC
VCCthON
VCCthOFF
HIN
UVLO VBO
0V
0V
VBOrise
(GH-OUTB)
VBO
0V
V
BOthON
VBOthOFF
0V
VBO
Dedicated under-voltage protection is available on the bootstrap section between BOOT and OUTb supply pins.
In order to avoid intermittent operation, a hysteresis set the turn-off threshold with respect to the turn-on threshold.
When the VBO voltage falls below the V
Approximately 5µs (typ) after the VBO voltage reaches the V
operation and the output remains off until the next input pin transition that requests the high-side to turn on.
BOthOFF
Figure 17. VBO UVLO and High Side
threshold, the high-side GaN transistor is switched off.
threshold, the device returns to normal
BOthON
MASTERGAN4
VBO UVLO protection
DS13686 - Rev 1
page 16/27
6.5Thermal shutdown
THERMAL SHUTDOWN CIRCUIT
GH/GL
OD gate
(internal)
Fast shut down
the driver outputs are switched off
disable time
SD/OD
T
TSDTHYSTTSD -
VihV
0 V
TSDVOD
TJ
t1t
2
VPU
SD/OD
FROM / TO
CONTROLLER
C
OD
THERMAL
SHUTDOWN
LOGIC
R
ON_ODRPD_SD
R
OD_ext
2
1
immediately after overtemperature
The integrated gate driver has a thermal shutdown protection.
When junction temperature reaches the T
leaving the half-bridge in 3-state and signaling the state forcing
junction temperature is below T
GaN are driven again according to inputs when
The thermal smart shutdown system gives the possibility to increase the time constant of the external RC network
(that determines the disable time after the overtemperature event) up to very large values without delaying the
protection.
temperature threshold, the device turns off both GaN transistors
Typical application diagram – Active clamp flyback
DS13686 - Rev 1
page 18/27
8Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
8.1QFN 9 x 9 x 1 mm, 31 leads, pitch 0.6 mm package information
Table 10. QFN 9 x 9 x 1 mm package dimensions
MASTERGAN4
Package information
Symbol
A
A3-0.10-
b0.250.300.35
D8.969.009.04
E8.969.009.04
D13.303.403.50
E12.062.162.26
D21.761.861.96
E23.103.203.30
D31.701.801.90
E33.103.203.30
e-0.60-
K-0.24-
L0.350.450.55
N31
aaa0.10
bbb0.10
ccc0.10
ddd0.05
eee0.08
Min.Typ.Max.
0.900.951.00
Dimensions (mm)
Note:•Dimensioning and tolerances conform to ASME Y14.5-2009
•All dimensions are in millimeters
•N total number of terminals
•Dimensions do not include mold protrusion, not to exceed 0.15 mm
•Package outline exclusive of metal burr dimensions
DS13686 - Rev 1
page 19/27
Figure 21. QFN 9 x 9 x 1 mm package dimensions
TOP VIEW
SIDE
VIEW
BOTTOM VIEW
MASTERGAN4
QFN 9 x 9 x 1 mm, 31 leads, pitch 0.6 mm package information
DS13686 - Rev 1
page 20/27
9Suggested footprint
TOP VIEW
Dimensions in mm
The MASTERGAN4 footprint for the PCB layout is usually defined based on several design factors as assembly
plant technology capabilities and board component density. For easy device usage and evaluation, ST provides
the following footprint design, which is suitable for the largest variety of PCBs.
The following footprint indicates the copper area which should be free from the solder mask,
while the copper area shall extend beyond the indicated areas especially for EP2 and EP3. To aid thermal
dissipation, it is recommended to add thermal vias under these EPADs to transfer and dissipate device heat to the
other PCB copper layers. A PCB layout example is available with the MASTERGAN4 evaluation board.
Figure 22. Suggested footprint (top view drawing)
MASTERGAN4
Suggested footprint
DS13686 - Rev 1
page 21/27
10Ordering information
Order codePackagePackage MarkingPackaging
MASTERGAN4QFN 9 x 9 x 1 mmMASTERGAN4Tray
MASTERGAN4TRQFN 9 x 9 x 1 mmMASTERGAN4Tape and Reel
Table 9. Inputs truth table (applicable when device is not in UVLO)....................................... 14
Table 10. QFN 9 x 9 x 1 mm package dimensions ................................................... 19
Table 11. Order codes ...................................................................... 22
Table 12. Document revision history .............................................................23
DS13686 - Rev 1
page 26/27
MASTERGAN4
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