ST MICROELECTRONICS MASTERGAN3 Datasheet

MASTERGAN3
Datasheet
High power density 600 V Half bridge driver with two enhancement mode
GaNHEMT

Features

600 V system-in-package integrating half-bridge gate driver and high-voltage power GaN transistors in asymmetrical configuration:
QFN 9 x 9 x 1 mm package
R
I
Reverse current capability
Zero reverse recovery loss
UVLO protection on low-side and high-side
Internal bootstrap diode
Interlocking function
Dedicated pin for shutdown functionality
Accurate internal timing match
3.3 V to 15 V compatible inputs with hysteresis and pull-down
Overtemperature protection
Bill of material reduction
Very compact and simplified layout
Flexible, easy and fast design.
= 225 mΩ (LS) + 450 mΩ (HS)
DS(ON)
= 6.5 A (LS) + 4 A (HS)
Product status link
MASTERGAN3
Product label

Application

Switch-mode power supplies
Chargers and adapters
High-voltage PFC, and DC-DC converters

Description

The MASTERGAN3 is an advanced power system-in-package integrating a gate driver and two enhancement mode GaN transistors in asymmetrical halfbridge configuration.
The integrated power GaNs have 650 V drainsource blocking voltage and R of 225 mΩ and 450 mΩ for Low side and High side respectively, while the high
side of the embedded gate driver can be easily supplied by the integrated bootstrap diode, while the high side of the embedded gate driver can be easily supplied by the integrated bootstrap diode.
The MASTERGAN3 features UVLO protection on both the lower and upper driving sections, preventing the power switches from operating in low efficiency or dangerous conditions, and the interlocking function avoids cross-conduction conditions.
The input pins extended range allows easy interfacing with microcontrollers, DSP units or Hall effect sensors.
The MASTERGAN3 operates in the industrial temperature range, -40°C to 125°C.
The device is available in a compact 9x9 mm QFN package.
DS(ON)
DS13724 - Rev 1 - May 2021 For further information contact your local STMicroelectronics sales office.
www.st.com

1 Block diagram

Driver
Driver
Logic,
interlocking,
overtemp
Level Shifter
Level Shifter
VCC UVLO
UVLO
Vbo
PGNDPVCC
OUTbBOOT
GL
GH
VCC
HIN
LIN
SD/OD
GND
OUT
VS
SENSE
HON
HOFF
LON
LOFF
R
BLEED
RGOFF
H
RGON
H
RGON
L
RGOFF
L
MASTERGAN3
Block diagram
Figure 1. MASTERGAN3 block diagram
DS13724 - Rev 1
page 2/30

2 Pin description and connection diagram

1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
24
23
22
21
20
19
18
17
16
31
30
29
28
27
26
25
GND
SENSE
OUT
EP1
EP2
EP3
SENSE
SENSE
SENSE
OUT
OUT
OUT
SENSE
SENSE
SENSE
SENSE
SENSE
VS
VS
VS
VS
VS
GH
OUTb
BOOT
PGND
GL
PVCC
N.C.
VCC
GND
LIN
HIN
SD/OD
N.C.
N.C.
N.C.
Figure 2. Pin connection (top view)
MASTERGAN3
Pin description and connection diagram

2.1 Pin list

Table 1. Pin description
Pin Number Pin Name Type Function
15, 16, 17, 18, 19 VS Power Supply High voltage supply (high-side GaN Drain)
12, 13, 14, EP3 OUT Power Output Half-bridge output
4, 5, 6, 7, 8, 9, 10, 11, EP2 SENSE Power Supply Half-bridge sense (low-side GaN Source)
22 BOOT Power Supply Gate driver high-side supply voltage
21 OUTb Power Supply
27 VCC Power Supply Logic supply voltage
1 PVCC Power Supply Gate driver low-side supply voltage
28, EP1 GND Power Supply Gate driver ground
3 PGND Power Supply
26 HIN Logic Input High-Side driver logic input
24 LIN Logic Input Low-Side driver logic input
25 SD/OD Logic Input-Output Driver Shutdown input and Fault Open-Drain
2 GL Output Low-Side GaN gate
20 GH Output High-Side GaN gate
23, 29, 30, 31 N.C. Not Connected Leave floating
Gate driver high-side reference voltage, used only for Bootstrap capacitor connection. Internally connected to OUT.
Gate driver low-side buffer ground. Internally connected to SENSE
DS13724 - Rev 1
page 3/30

3 Electrical Data

3.1 Absolute maximum ratings

Each voltage referred to GND unless otherwise specified
Symbol Parameter Test Condition Value Unit
V
DS
VCC Logic supply voltage -0.3 to 11 V
PVCC-PGND
VCC-PGND Logic supply vs. Low-side driver ground -0.3 to 18.3 V
PVCC Low-side driver supply vs. logic ground -0.3 to 18.3 V
PGND Low-side driver ground vs. logic ground -7.3 to 11.3 V
V
BO
BOOT Bootstrap voltage -0.3 to 620 V
CGL, CGH
RGL, RGH
I
D
I
D
SR
V
T
T
1. PGND internally connected to SENSE
2. OUTb internally connected to OUT
3.
CGx < 0.08/(Pvcc^2*Fsw)-(330*10
4. TCB is temperature of case exposed pad.
5. Range estimated by characterization, not tested in production.
6. Value specified by design factor, pulse duration limited to 50 µs and junction temperature.
GaN Drain-to-Source Voltage
Low-side driver supply voltage
BOOT to OUTb voltage
(2)
Maximum external capacitance between GL and PGND and between GH and OUTb
Minimum external pull-down resistance between GL and PGND and GH and OUTb
Drain current (Low side GaN transistor)
Drain current (High side GaN transistor)
Half-bridge outputs slew rate (10% - 90%) 100 V/ns
out
Logic inputs voltage range -0.3 to 21 V
i
Junction temperature -40 to 150 °C
J
Storage temperature -40 to 150 °C
s
-12
)
Table 2. Absolute maximum ratings
(1)
DC @ TCB = 25°C
DC @ TCB = 100°C
Peak @ TCB = 25°C
DC @ TCB = 25°C
DC @ TCB = 100°C
Peak @ TCB = 25°C
TJ = 25 °C
Fsw = 500 kHz
MASTERGAN3
Electrical Data
620 V
-0.3 to 7 V
-0.3 to 7 V
(3)
(4) (5)
(4) (5)
(4) (5) (6)
(4) (5)
(4) (5)
(4) (5) (6)
3.9 nF
6.8 kΩ
6.5 A
4.4 A
12 A
4 A
2.6 A
7 A
DS13724 - Rev 1
page 4/30

3.2 Recommended operating conditions

Table 3. Recommended operating conditions
Each voltage referred to GND unless otherwise specified
Symbol Parameter Note Min Max Unit
VS High voltage bus 0 520 V
VCC Supply voltage 4.75 9.5 V
PVCC-PGND
PVCC Low-side driver supply voltage 3 8.5 V
VCC-PVCC VCC to PVCC pin voltage -3 3 V
PGND
DT Suggested minimum deadtime 5 ns
T
IN_MIN
V
BO
BOOT BOOT to GND voltage
V
T
J
1. PGND internally connected to SENSE
2. OUTb internally connected to OUT
3. 5 V is recommended during high-hide turn-on
PVCC to PGND low side supply voltage
Low-side driver ground
(1)
Minimum duration of input pulse to obtain undistorted output pulse 120 ns
BOOT to OUTb pin voltage
Logic inputs voltage range 0 20 V
i
(2)
Junction temperature -40 125 °C
MASTERGAN3
Recommended operating conditions
(1)
Best performance 5 6.5 V
Best performance 5 6.5 V
4.75 6.5 V
-2 2 V
4.4 6.5 V
(3)
530 V
0
3.3

Thermal data

Table 4. Thermal data
Symbol Parameter Value Unit
R
th(J-CB)_LS
R
th(J-CB)_HS
R
th(J-A)
1. The junction to ambient thermal resistance is obtained simulating the device mounted on a 2s2p (4 layer) FR4 board as JESD51-5,7 with 6 thermal vias for each exposed pad. Power dissipation uniformly distributed over the two GaN transistors.
Thermal resistance Low side junction to SENSE exposed pad, typical 2.8 °C/W
Thermal resistance High side junction to OUT exposed pad, typical 4.7 °C/W
Thermal resistance junction-to-ambient
(1)
18.8 °C/W
DS13724 - Rev 1
page 5/30

4 Electrical characteristics

4.1 Driver

Table 5. Driver electrical characteristics
VCC = PVCC = 6 V; SENSE = GND; TJ = 25°C, unless otherwise specified (each voltage referred to GND unless otherwise specified)
Symbol Parameter Test condition Min Typ Max Unit
VCC
VCC
VCC
I
QVCCU
I
I
thON
thOFF
hys
VCC vs. GND
QVCC
SVCC
VCC UV turn ON threshold
VCC UV turn OFF threshold
VCC UV hysteresis
VCC undervoltage quiescent supply current VCC = PVCC = 3.8 V 320 410 μA
VCC quiescent supply current
VCC switching supply current
Logic section supply
(1)
(1)
(1)
SD/OD = LIN = 5 V; HIN = 0 V; BOOT = 7 V
SD/OD = 5 V; VBO = 6.5 V;
VS = 0 V; FSW = 500 kHz
MASTERGAN3
Electrical characteristics
4.2 4.5 4.75 V
3.9 4.2 4.5 V
0.2 0.3 0.45 V
680 900 μA
0.8 mA
I
QPVCC
I
SPVCC
R
BLEED
RON
ROFF
V
BOthON
V
BOthOFF
V
BOhys
I
QBOU
I
QBO
I
SBO
I
LK
R
DBoot
RON
Low-side driver section supply
PVCC quiescent supply current SD/OD = LIN = 5 V 150 μA
PVCC vs. PGND
PVCC switching supply current
VS = 0 V
FSW = 500 kHz
1 mA
GL vs. PGND Low side gate bleeder PVCC = PGND 75 100 125 kΩ
L
L
Low side turn on resistance
Low side turn off resistance
(2)
(2)
I(GL) = 1 mA (source) 77
I(GL) = 1 mA (sink) 2
High-side floating section supply
(3)
(3)
(3)
VBO = 3.4 V
(3)
VBO = 6 V; LIN = GND;
SD/OD = HIN = 5 V;
3.6 4.0 4.4 V
3.4 3.7 4.0 V
0.1 0.3 0.5 V
140 200 μA
180 μA
BOOT vs. OUTb
VBO UV turn ON threshold
VBO UV turn OFF threshold
VBO UV hysteresis
VBO undervoltage quiescent supply
(3)
current
VBO quiescent supply current
VBO = 6 V;
BOOT BOOT switching supply current
SD/OD = 5 V;
1.1 mA
VS = 0 V; FSW = 500 kHz
BOOT vs. SGND High voltage leakage current BOOT = OUT = 600 V 11 μA
SD/OD = LIN = 5 V;
VCC vs. BOOT
Bootstrap diode on resistance
(4)
HIN = GND = PGND
140 175 Ω
VCC – BOOT = 0.5 V
H
High side turn on resistance
(2)
I(GH) = 1 mA (source) 77
DS13724 - Rev 1
page 6/30
MASTERGAN3
Symbol Parameter Test condition Min Typ Max Unit
ROFF
V
V
V
ihys
I
INh
I
R
PD_IN
I
SDh
I
SDl
R
PD_SD
V
TSD
R
ON_OD
I
OL_OD
T
d,GL
T
d,GH
H
il
ih
INl
LIN, HIN, SD/OD
LIN, HIN
SD/OD Logic “1” input bias current SD/OD = 5 V 11 15 20 μA
SD/OD Logic “0” input bias current SD/OD = 0 V 1 μA
SD/OD Pull-down resistor
SD/OD Thermal shutdown unlatch threshold
SD/OD Open drain ON resistance
SD/OD Open Drain low level sink current
LIN, GL Prop. delay from LIN to GL
HIN, GH Prop. delay from HIN to GH
High side turn off resistance
Low level logic threshold
High level logic threshold
Logic input threshold hysteresis 0.7 0.96 1.2 V
Logic ‘1’ input bias current LIN, HIN = 5 V 23 33 55 μA
Logic ‘0’ input bias current LIN, HIN = GND 1 μA
Input pull-down resistor LIN, HIN = 5 V 90 150 220
Overtemperature protection
T
TSD
T
HYS
Shutdown temperature
Temperature hysteresis
1. VCC UVLO is referred to VCC - GND
2. Turn on and turn off total resistances include the values of the gate resistors and the driver Rdson
3. VBO = V
4. R
BD(on)
R
BD(on)
Where: Ia is BOOT pin current when V
- V
BOOT
OUT
is tested in the following way:
= [(VCC - V
BOOTa
) - (VCC - V
BOOTb
BOOT
)] / [Ia - Ib]
= V
5. Range estimated by characterization, not tested in production.
6. Tested at wafer level.
(2)
Logic inputs
; Ib is BOOT pin current when V
BOOTa
I(GH) = 1 mA (sink) 2
TJ = 25°C
Full Temperature range
TJ = 25°C
Full Temperature range
SD/OD = 5 V
OpenDrain OFF
TJ = 25°C
(6)
TJ = 25°C;
I
OD
= 400 mV
(6)
TJ = 25°C;
VOD = 400 mV
(6)
(6)
(5)
(5)
(6)
BOOT
= V
1.1 1.31 1.45
(5)
0.8
2 2.17 2.5
(5)
250 330 450
0.5 0.75 1 V
8 10 18 Ω
22 40 50 mA
175 °C
BOOTb
2.7
46 ns
46 ns
20 °C
Driver
V
V
DS13724 - Rev 1
page 7/30

4.2 GaN power transistor

Table 6. GaN power transistor electrical characteristics
V
= 6 V; TJ = 25°C, unless otherwise specified
GS
Symbol Parameter Test condition Min Typ Max Unit
V
(BR)DS
Drain-source blocking voltage
GaN on/off states
Low side I
High side I
VGS = 0 V
< 13.3 µA
DSS
< 6.6 µA
DSS
MASTERGAN3
GaN power transistor
(1)
(1)
650 V
I
I
R
DS(on)_LS
R
DS(on)_HS
DSS_LS
DSS_HS
V
GS(th)
I
GS_LS
I
GS_HS
Zero gate voltage drain current - low side
Zero gate voltage drain current - high side
Gate threshold voltage
Gate to source current - Low side
Gate to source current - High side
Static drain-source on-resistance - Low side
Static drain-source on-resistance - High side
1. Tested at wafer level.
2. Value estimated by characterization, not tested in production.
VDS = 600 V
VGS = 0 V
VDS = 600 V
VGS = 0 V
VDS = V
GS
Low side, ID = 2.5 mA
High side, ID = 1.7 mA
VDS = 0 V
VDS = 0 V
(2)
(2)
TJ = 25°C
ID = 2.2 A
TJ = 125°C
TJ = 25°C
ID = 1.2 A
TJ = 125°C
0.5 µA
0.3 µA
(1)
(1)
1.7 V
40 µA
20 µA
225 300
(2)
495
450 600
(2)
1012
DS13724 - Rev 1
page 8/30

5 Device characterization values

The information in Table 7 and Table 8 represents typical values based on characterization and simulation results and are not subject to the production test.
Table 7. GaN power transistor characterization values
Symbol Parameter Test condition Min Typ Max Unit
Q
Total gate charge
G
Device characterization values
VGS = 6 V, TJ = 25°C
VDS = 0 to 400 V - Low side
VGS = 6 V, TJ = 25°C
VDS = 0 to 400 V - High side
MASTERGAN3
1.5 nC
0.8 nC
Q
E
C
C
O(ER)
C
Q
I
RRM
1. C
2. C
Symbol
t
t
C(on)
t(off)
t
C(off)
Output charge - Low side
OSS
Output charge - High side 7 nC
Output capacitance stored energy - Low side 1.7 µJ
OSS
Output capacitance stored energy - High side 0.9 µJ
VGS = 0 V,
VDS = 400 V
Output capacitance - Low side 14.2 pF
OSS
Output capacitance - High side 7 pF
Effective output capacitance energy related - Low side
Effective output capacitance energy related - High side
Effective output capacitance time related - Low side
O(TR)
Effective output capacitance time related - High side
Reverse recovery charge 0 nC
RR
(1)
(1)
(2)
(2)
V
= 0 V,
GS
VDS = 0 to 400 V
Reverse recovery current 0 A
is the fixed capacitance that would give the same stored energy as C
O(ER)
V
DS
is the fixed capacitance that would give the same charging time as C
O(TR)
V
DS
while VDS is rising from 0 V to the stated
OSS
while VDS is rising from 0 V to the stated
OSS
Table 8. Inductive load switching characteristics
Parameter Test condition Min Typ Max Unit
(on)
t
E
Turn-on time - Low side
(1)
Turn-on time - High side 70 ns
Crossover time (on) - Low side 15 ns
(2)
Crossover time (on) - High side 25 ns
Turn-off time - Low side 70 ns
(1)
Turn-off time - High side 70 ns
Crossover time (off) - Low side 15 ns
(2)
Crossover time (off) - High side 10 ns
Shutdown to high/low-side propagation delay 70 ns
SD
VS = 400 V,
VGS = 6 V,
I
=2.2 A,
D_LS
I
=1.2 A
D_HS
See Figure 3
Turn-on switching losses - Low side 10 µJ
on
Turn-on switching losses - High side 4.5 µJ
70 ns
14 nC
21 pF
11 pF
34 pF
17 pF
DS13724 - Rev 1
page 9/30
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