High power density 600 V Half bridge driver with two enhancement mode
GaNHEMT
Features
•600 V system-in-package integrating half-bridge gate driver and high-voltage
power GaN transistors in asymmetrical configuration:
–QFN 9 x 9 x 1 mm package
–R
–I
DS(MAX)
•Reverse current capability
•Zero reverse recovery loss
•UVLO protection on low-side and high-side
•Internal bootstrap diode
•Interlocking function
•Dedicated pin for shutdown functionality
•Accurate internal timing match
•3.3 V to 15 V compatible inputs with hysteresis and pull-down
•Overtemperature protection
•Bill of material reduction
•Very compact and simplified layout
•Flexible, easy and fast design.
= 225 mΩ (LS) + 450 mΩ (HS)
DS(ON)
= 6.5 A (LS) + 4 A (HS)
Product status link
MASTERGAN3
Product label
Application
•Switch-mode power supplies
•Chargers and adapters
•High-voltage PFC, and DC-DC converters
Description
The MASTERGAN3 is an advanced power system-in-package integrating a gate
driver and two enhancement mode GaN transistors in asymmetrical half‑bridge
configuration.
The integrated power GaNs have 650 V drain‑source blocking voltage and R
of 225 mΩ and 450 mΩ for Low side and High side respectively, while the high
side of the embedded gate driver can be easily supplied by the integrated bootstrap
diode, while the high side of the embedded gate driver can be easily supplied by the
integrated bootstrap diode.
The MASTERGAN3 features UVLO protection on both the lower and upper
driving sections, preventing the power switches from operating in low efficiency
or dangerous conditions, and the interlocking function avoids cross-conduction
conditions.
The input pins extended range allows easy interfacing with microcontrollers, DSP
units or Hall effect sensors.
The MASTERGAN3 operates in the industrial temperature range, -40°C to 125°C.
The device is available in a compact 9x9 mm QFN package.
DS(ON)
DS13724 - Rev 1 - May 2021
For further information contact your local STMicroelectronics sales office.
www.st.com
1Block diagram
Driver
Driver
Logic,
interlocking,
overtemp
Level Shifter
Level Shifter
VCC UVLO
UVLO
Vbo
PGNDPVCC
OUTbBOOT
GL
GH
VCC
HIN
LIN
SD/OD
GND
OUT
VS
SENSE
HON
HOFF
LON
LOFF
R
BLEED
RGOFF
H
RGON
H
RGON
L
RGOFF
L
MASTERGAN3
Block diagram
Figure 1. MASTERGAN3 block diagram
DS13724 - Rev 1
page 2/30
2Pin description and connection diagram
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
24
23
22
21
20
19
18
17
16
31
30
29
28
27
26
25
GND
SENSE
OUT
EP1
EP2
EP3
SENSE
SENSE
SENSE
OUT
OUT
OUT
SENSE
SENSE
SENSE
SENSE
SENSE
VS
VS
VS
VS
VS
GH
OUTb
BOOT
PGND
GL
PVCC
N.C.
VCC
GND
LIN
HIN
SD/OD
N.C.
N.C.
N.C.
Figure 2. Pin connection (top view)
MASTERGAN3
Pin description and connection diagram
2.1Pin list
Table 1. Pin description
Pin NumberPin NameTypeFunction
15, 16, 17, 18, 19VSPower SupplyHigh voltage supply (high-side GaN Drain)
12, 13, 14, EP3OUTPower OutputHalf-bridge output
4, 5, 6, 7, 8, 9, 10, 11, EP2SENSEPower SupplyHalf-bridge sense (low-side GaN Source)
22BOOTPower SupplyGate driver high-side supply voltage
21OUTbPower Supply
27VCCPower SupplyLogic supply voltage
1PVCCPower SupplyGate driver low-side supply voltage
28, EP1GNDPower SupplyGate driver ground
3PGNDPower Supply
26HINLogic InputHigh-Side driver logic input
24LINLogic InputLow-Side driver logic input
25SD/ODLogic Input-Output Driver Shutdown input and Fault Open-Drain
2GLOutputLow-Side GaN gate
20GHOutputHigh-Side GaN gate
23, 29, 30, 31N.C.Not ConnectedLeave floating
Gate driver high-side reference voltage, used only for Bootstrap
capacitor connection. Internally connected to OUT.
Gate driver low-side buffer ground. Internally connected to
SENSE
DS13724 - Rev 1
page 3/30
3Electrical Data
3.1Absolute maximum ratings
Each voltage referred to GND unless otherwise specified
SymbolParameterTest ConditionValueUnit
V
DS
VCCLogic supply voltage-0.3 to 11V
PVCC-PGND
VCC-PGND Logic supply vs. Low-side driver ground-0.3 to 18.3V
PVCCLow-side driver supply vs. logic ground-0.3 to 18.3V
PGNDLow-side driver ground vs. logic ground-7.3 to 11.3V
V
BO
BOOTBootstrap voltage-0.3 to 620V
CGL, CGH
RGL, RGH
I
D
I
D
SR
V
T
T
1. PGND internally connected to SENSE
2. OUTb internally connected to OUT
3.
CGx < 0.08/(Pvcc^2*Fsw)-(330*10
4. TCB is temperature of case exposed pad.
5. Range estimated by characterization, not tested in production.
6. Value specified by design factor, pulse duration limited to 50 µs and junction temperature.
GaN Drain-to-Source Voltage
Low-side driver supply voltage
BOOT to OUTb voltage
(2)
Maximum external capacitance between GL and PGND and
between GH and OUTb
Minimum external pull-down resistance between GL and
PGND and GH and OUTb
Drain current (Low side GaN transistor)
Drain current (High side GaN transistor)
Half-bridge outputs slew rate (10% - 90%)100V/ns
out
Logic inputs voltage range-0.3 to 21V
i
Junction temperature-40 to 150°C
J
Storage temperature-40 to 150°C
s
-12
)
Table 2. Absolute maximum ratings
(1)
DC @ TCB = 25°C
DC @ TCB = 100°C
Peak @ TCB = 25°C
DC @ TCB = 25°C
DC @ TCB = 100°C
Peak @ TCB = 25°C
TJ = 25 °C
Fsw = 500 kHz
MASTERGAN3
Electrical Data
620V
-0.3 to 7V
-0.3 to 7V
(3)
(4) (5)
(4) (5)
(4) (5) (6)
(4) (5)
(4) (5)
(4) (5) (6)
3.9nF
6.8kΩ
6.5A
4.4A
12A
4A
2.6A
7A
DS13724 - Rev 1
page 4/30
3.2Recommended operating conditions
Table 3. Recommended operating conditions
Each voltage referred to GND unless otherwise specified
SymbolParameterNoteMin Max Unit
VSHigh voltage bus0520V
VCCSupply voltage4.759.5V
PVCC-PGND
PVCCLow-side driver supply voltage38.5V
VCC-PVCCVCC to PVCC pin voltage-33V
PGND
DTSuggested minimum deadtime5ns
T
IN_MIN
V
BO
BOOTBOOT to GND voltage
V
T
J
1. PGND internally connected to SENSE
2. OUTb internally connected to OUT
3. 5 V is recommended during high-hide turn-on
PVCC to PGND low side supply voltage
Low-side driver ground
(1)
Minimum duration of input pulse to obtain undistorted output pulse120ns
BOOT to OUTb pin voltage
Logic inputs voltage range020V
i
(2)
Junction temperature-40125°C
MASTERGAN3
Recommended operating conditions
(1)
Best performance56.5V
Best performance56.5V
4.756.5V
-22V
4.46.5V
(3)
530V
0
3.3
Thermal data
Table 4. Thermal data
SymbolParameterValueUnit
R
th(J-CB)_LS
R
th(J-CB)_HS
R
th(J-A)
1. The junction to ambient thermal resistance is obtained simulating the device mounted on a 2s2p (4 layer) FR4 board as
JESD51-5,7 with 6 thermal vias for each exposed pad. Power dissipation uniformly distributed over the two GaN transistors.
Thermal resistance Low side junction to SENSE exposed pad, typical2.8°C/W
Thermal resistance High side junction to OUT exposed pad, typical4.7°C/W
Thermal resistance junction-to-ambient
(1)
18.8°C/W
DS13724 - Rev 1
page 5/30
4Electrical characteristics
4.1Driver
Table 5. Driver electrical characteristics
VCC = PVCC = 6 V; SENSE = GND; TJ = 25°C, unless otherwise specified (each voltage referred to GND unless otherwise
specified)
Logic ‘1’ input bias currentLIN, HIN = 5 V233355μA
Logic ‘0’ input bias currentLIN, HIN = GND1μA
Input pull-down resistorLIN, HIN = 5 V90150 220kΩ
Overtemperature protection
T
TSD
T
HYS
Shutdown temperature
Temperature hysteresis
1. VCC UVLO is referred to VCC - GND
2. Turn on and turn off total resistances include the values of the gate resistors and the driver Rdson
3. VBO = V
4. R
BD(on)
R
BD(on)
Where: Ia is BOOT pin current when V
- V
BOOT
OUT
is tested in the following way:
= [(VCC - V
BOOTa
) - (VCC - V
BOOTb
BOOT
)] / [Ia - Ib]
= V
5. Range estimated by characterization, not tested in production.
6. Tested at wafer level.
(2)
Logic inputs
; Ib is BOOT pin current when V
BOOTa
I(GH) = 1 mA (sink)2Ω
TJ = 25°C
Full Temperature range
TJ = 25°C
Full Temperature range
SD/OD = 5 V
OpenDrain OFF
TJ = 25°C
(6)
TJ = 25°C;
I
OD
= 400 mV
(6)
TJ = 25°C;
VOD = 400 mV
(6)
(6)
(5)
(5)
(6)
BOOT
= V
1.1 1.31 1.45
(5)
0.8
22.17 2.5
(5)
250 330 450kΩ
0.5 0.751V
81018Ω
224050mA
175°C
BOOTb
2.7
46ns
46ns
20°C
Driver
V
V
DS13724 - Rev 1
page 7/30
4.2GaN power transistor
Table 6. GaN power transistor electrical characteristics
V
= 6 V; TJ = 25°C, unless otherwise specified
GS
SymbolParameterTest conditionMinTypMax Unit
V
(BR)DS
Drain-source blocking voltage
GaN on/off states
Low side I
High side I
VGS = 0 V
< 13.3 µA
DSS
< 6.6 µA
DSS
MASTERGAN3
GaN power transistor
(1)
(1)
650V
I
I
R
DS(on)_LS
R
DS(on)_HS
DSS_LS
DSS_HS
V
GS(th)
I
GS_LS
I
GS_HS
Zero gate voltage drain current - low side
Zero gate voltage drain current - high side
Gate threshold voltage
Gate to source current - Low side
Gate to source current - High side
Static drain-source on-resistance - Low side
Static drain-source on-resistance - High side
1. Tested at wafer level.
2. Value estimated by characterization, not tested in production.
VDS = 600 V
VGS = 0 V
VDS = 600 V
VGS = 0 V
VDS = V
GS
Low side, ID = 2.5 mA
High side, ID = 1.7 mA
VDS = 0 V
VDS = 0 V
(2)
(2)
TJ = 25°C
ID = 2.2 A
TJ = 125°C
TJ = 25°C
ID = 1.2 A
TJ = 125°C
0.5µA
0.3µA
(1)
(1)
1.7V
40µA
20µA
225300
(2)
495
mΩ
450600
(2)
1012
mΩ
DS13724 - Rev 1
page 8/30
5Device characterization values
The information in Table 7 and Table 8 represents typical values based on characterization and simulation results
and are not subject to the production test.
Table 7. GaN power transistor characterization values
SymbolParameterTest conditionMin Typ Max Unit
Q
Total gate charge
G
Device characterization values
VGS = 6 V, TJ = 25°C
VDS = 0 to 400 V - Low side
VGS = 6 V, TJ = 25°C
VDS = 0 to 400 V - High side
MASTERGAN3
1.5nC
0.8nC
Q
E
C
C
O(ER)
C
Q
I
RRM
1. C
2. C
Symbol
t
t
C(on)
t(off)
t
C(off)
Output charge - Low side
OSS
Output charge - High side7nC
Output capacitance stored energy - Low side1.7µJ
OSS
Output capacitance stored energy - High side0.9µJ
VGS = 0 V,
VDS = 400 V
Output capacitance - Low side14.2pF
OSS
Output capacitance - High side7pF
Effective output capacitance energy related - Low side
Effective output capacitance energy related - High side
Effective output capacitance time related - Low side
O(TR)
Effective output capacitance time related - High side
Reverse recovery charge0nC
RR
(1)
(1)
(2)
(2)
V
= 0 V,
GS
VDS = 0 to 400 V
Reverse recovery current0A
is the fixed capacitance that would give the same stored energy as C
O(ER)
V
DS
is the fixed capacitance that would give the same charging time as C
O(TR)
V
DS
while VDS is rising from 0 V to the stated
OSS
while VDS is rising from 0 V to the stated
OSS
Table 8. Inductive load switching characteristics
ParameterTest conditionMinTypMaxUnit
(on)
t
E
Turn-on time - Low side
(1)
Turn-on time - High side70ns
Crossover time (on) - Low side15ns
(2)
Crossover time (on) - High side25ns
Turn-off time - Low side70ns
(1)
Turn-off time - High side70ns
Crossover time (off) - Low side15ns
(2)
Crossover time (off) - High side10ns
Shutdown to high/low-side propagation delay70ns
SD
VS = 400 V,
VGS = 6 V,
I
=2.2 A,
D_LS
I
=1.2 A
D_HS
See Figure 3
Turn-on switching losses - Low side10µJ
on
Turn-on switching losses - High side4.5µJ
70ns
14nC
21pF
11pF
34pF
17pF
DS13724 - Rev 1
page 9/30
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