High power density 600V Half bridge driver with two enhancement mode GaN
HEMT
Features
•600 V system-in-package integrating half-bridge gate driver and high-voltage
power GaN transistors:
–QFN 9 x 9 x 1 mm package
–R
–I
DS(MAX)
•Reverse current capability
•Zero reverse recovery loss
•UVLO protection on low-side and high-side
•Internal bootstrap diode
•Interlocking function
•Dedicated pin for shutdown functionality
•Accurate internal timing match
•3.3 V to 15 V compatible inputs with hysteresis and pull-down
•Overtemperature protection
•Bill of material reduction
•Very compact and simplified layout
•Flexible, easy and fast design.
DS(ON)
= 150 mΩ
= 10 A
Product status link
MASTERGAN1
Product label
Application
•Switch-mode power supplies
•Chargers and adapters
•High-voltage PFC, DC-DC and DC-AC Converters
•UPS Systems
•Solar Power
Description
The MASTERGAN1 is an advanced power system-in-package integrating a gate
driver and two enhancement mode GaN transistors in half‑bridge configuration.
The integrated power GaNs have R
breakdown voltage, while the high side of the embedded gate driver can be easily
supplied by the integrated bootstrap diode.
The MASTERGAN1 features UVLO protection on both the lower and upper driving
sections, preventing the power switches from operating in low efficiency or
dangerous conditions, and the interlocking function avoids cross-conduction
conditions.
The input pins extended range allows easy interfacing with microcontrollers, DSP
units or Hall effect sensors.
The MASTERGAN1 operates in the industrial temperature range, -40°C to 125°C.
The device is available in a compact 9x9 mm QFN package.
of 150 mΩ and 650 V drain‑source
DS(ON)
DS13417 - Rev 3 - October 2020
For further information contact your local STMicroelectronics sales office.
www.st.com
1Block diagram
Driver
Driver
Logic,
interlocking,
overtemp
Level Shifter
Level Shifter
VCC UVLO
UVLO
Vbo
PGNDPVCC
OUTbBOOT
GL
GH
VCC
HIN
LIN
SD/OD
GND
OUT
VS
SENSE
HON
HOFF
LON
LOFF
R
BLEED
RGOFF
H
RGON
H
RGON
L
RGOFF
L
MASTERGAN1
Block diagram
Figure 1. Block diagram
DS13417 - Rev 3
page 2/27
2Pin description and connection diagram
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
24
23
22
21
20
19
18
17
16
31
30
29
28
27
26
25
GND
SENSE
OUT
EP1
EP2
EP3
SENSE
SENSE
SENSE
OUT
OUT
OUT
SENSE
SENSE
SENSE
SENSE
SENSE
VS
VS
VS
VS
VS
GH
OUTb
BOOT
PGND
GL
PVCC
N.C.
VCC
GND
LIN
HIN
SD/OD
N.C.
N.C.
N.C.
Figure 2. Pin connection (top view)
MASTERGAN1
Pin description and connection diagram
2.1Pin list
Table 1. Pin description
Pin NumberPin NameTypeFunction
15, 16, 17, 18, 19VSPower SupplyHigh voltage supply (high-side GaN Drain)
12, 13, 14, EP3OUTPower OutputHalf-bridge output
4, 5, 6, 7, 8, 9, 10,
11, EP2
22BOOTPower SupplyGate driver high-side supply voltage
21OUTbPower Supply
27VCCPower SupplyLogic supply voltage
SENSEPower SupplyHalf-bridge sense (low-side GaN Source)
Gate driver high-side reference voltage, used only for Bootstrap
capacitor connection. Internally connected to OUT.
DS13417 - Rev 3
page 3/27
Pin NumberPin NameTypeFunction
1PVCCPower SupplyGate driver low-side supply voltage
28, EP1GNDPower SupplyLogic ground
3PGNDPower Supply
26HINLogic InputHigh-Side driver logic input
24LINLogic InputLow-Side driver logic input
25SD/ODLogic Input-OutputDriver Shutdown input and Over-Temperature
2GLOutputLow-Side GaN gate.
20GHOutputHigh-Side GaN gate.
23, 29, 30, 31N.C.Not ConnectedLeave floating
Gate driver low-side driver reference. Internally connected to
SENSE.
MASTERGAN1
Pin list
DS13417 - Rev 3
page 4/27
3Electrical Data
3.1Absolute maximum ratings
Table 2. Absolute maximum ratings (each voltage referred to GND unless otherwise specified)
SymbolParameterTest ConditionValueUnit
V
DS
VCCLogic supply voltage-0.3 to 11V
PVCC-PGND
VCC-PGNDLogic supply vs. Low-side driver ground-0.3 to 18.3V
PVCCLow-side driver supply vs. logic ground-0.3 to 18.3V
PGNDLow-side driver ground vs. logic ground-7.3 to 11.3V
V
BO
BOOTBootstrap voltage-0.3 to 620V
CGL, CGH
RGL, RGH
I
D
S
Rout
V
i
T
J
T
s
1. PGND internally connected to SENSE.
2. OUTb internally connected to OUT.
3.
CGx < 0.08/(Pvcc^2*Fsw)-(330*10
4. TCB is temperature of case exposed pad.
5. Range estimated by characterization, not tested in production.
6. Value specified by design factor, pulse duration limited to 50 µs and junction temperature.
GaN Drain-to-Source Voltage
Low-side driver supply voltage
BOOT to OUTb voltage
Maximum external capacitance between GL and
PGND and between GH and OUTb
Minimum external pull-down resistance between
GL and PGND and GH and OUTb
Drain current (per GaN transistor)
Half-bridge outputs slew rate (10% - 90%)100V/ns
Logic inputs voltage range-0.3 to 21V
Junction temperature-40 to 150°C
Storage temperature-40 to 150°C
-12
).
MASTERGAN1
Electrical Data
TJ = 25 °C
(1)
(2)
Fsw = 2 MHz
DC @ TCB = 25°C
DC @ TCB = 100°C
Peak @ TCB = 25°C
(3)
(4), (5)
(4)
(5)
),
(4), (5), (6)
620V
-0.3 to 7V
-0.3 to 7V
680pF
6.8kΩ
9.7A
6.4A
17A
DS13417 - Rev 3
page 5/27
3.2Recommended operating conditions
Table 3. Recommended operating conditions (Each voltage referred to GND unless otherwise specified)
SymbolParameterNoteMinMaxUnit
VSHigh voltage bus0520V
VCCSupply voltage4.759.5V
PVCC-PGND
PVCC to PGND low side supply
PVCCLow-side driver supply38.5V
VCC-PVCCVCC to PVCC pin voltage-33V
PGND
Low-side driver ground
(1)
DTSuggested minimum deadtime5ns
T
IN_MIN
V
BO
Minimum duration of input pulse to obtain undistorted
output pulse
BOOT to OUTb pin voltage
BOOTBOOT to GND voltage
V
i
T
J
Logic inputs voltage range020V
Junction temperature-40125°C
1. PGND internally connected to SENSE.
2. OUTb internally connected to OUT.
3. 5 V is recommended during high-hide turn-on.
(1)
(2)
MASTERGAN1
Recommended operating conditions
4.756.5V
Best performance56.5V
-22V
120ns
4.46.5V
Best performance56.5V
(3)
0
530V
3.3
Thermal data
Table 4. Thermal data
SymbolParameterValueUnit
R
th(J-CB)
R
th(J-A)
1. The junction to ambient thermal resistance is obtained simulating the device mounted on a 2s2p (4 layer) FR4 board as
JESD51-5,7 with 6 thermal vias for each exposed pad. Power dissipation uniformly distributed over the two GaN transistors.
Thermal resistance junction to each GaN transistor exposed pad, typical1.9°C/W