The M48T08/18/08Y TIMEKEEPER® RAM is an
8K x 8 non-volatile static RAM and real time clock
which is pin and functional compatible with the
DS1643. The monolithic chip is available in two
special packages to provide a highly integrated
battery backed-up memory and real time clock solution.
The M48T08/18/08Y is a non-volatile pin and function equivalent to any JEDEC standard 8K x 8
SRAM. It also easily fits into many ROM, EPROM,
and EEPROM sockets, providing the non-volatility
of PROMs without any requirement for special
WRITE timing or limitations on the number of
WRITEs that can be performed.
The 28-pin, 600mil DIP CAPHAT™ houses the
M48T08/18/08Y silicon with a quartz crystal and a
long- life lithium button cell in a single package.
The 28-pin, 330mil SOIC provides sockets with
gold plated contacts at bot h ends for direct connection to a separate SNAPHAT
taining the battery and crystal. The unique design
allows the SNAPHAT battery package to be
mounted on top of the SOIC package after the
completion of the surface mount process. Insertion of the SNAPHAT housing after reflow prevents potential battery and c rystal dam age due to
the high temperatures required for device surfacemounting. The SNAPHAT housing is keyed to prevent reverse insertion.
The SOIC and battery/crystal packages are
shipped separately in plastic anti-static tubes or in
Tape & Reel form. For t he 28 lead SOIC, the ba ttery/crystal package (e.g., SNAPHAT) part number is “M4T28-BR12SH” or “M4T32-BR12SH”
(see Table 17., page 25).
Figure 3. Logic DiagramTable 1. Signal Names
A0-A12Address Inputs
DQ0-DQ7Data Inputs / Outputs
INT
E1
Power Fail Interrupt (Open Drain)
Chip Enable 1
A0-A12
13
V
CC
8
DQ0-DQ7
®
housing con-
W
E1INT
E2
G
M48T08
M48T08Y
M48T18
V
SS
AI01020
E2Chip Enable 2
G
W
V
V
CC
SS
Output Enable
WRITE Enable
Supply Voltage
Ground
4/27
Page 5
M48T08, M48T08Y, M48T18
Figure 4. DIP C on ne ctionsFigure 5. SOI C Co nn e ct io ns
1
INTV
2
A12
3
A7
4
A6
5
A5
A4
6
A3
7
M48T08
8
A2
A1
A0
DQ0
M48T18
9
10
11
12
DQ2
13
14
SS
Figure 6. Block Diagram
28
27
26
25
24
23
22
21
20
19
18
17
16
15
AI01182
CC
W
E2
A8
A9
A11
G
A10
E1
DQ7
DQ6
DQ5DQ1
DQ4
DQ3V
INTV
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
1
2
3
4
5
6
7
8
9
10
11
M48T08Y
12
DQ2
SS
13
14
AI01021B
28
27
26
25
24
23
22
21
20
19
18
17
16
15
CC
W
E2
A8
A9
A11
G
A10
E1
DQ7
DQ6
DQ5DQ1
DQ4
DQ3V
32,768 Hz
CRYSTAL
LITHIUM
CELL
OSCILLATOR AND
CLOCK CHAIN
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
CC
INTV
POWER
V
PFD
8 x 8 BiPORT
SRAM ARRAY
8184 x 8
SRAM ARRAY
V
SS
A0-A12
DQ0-DQ7
E1
E2
W
G
AI01333
5/27
Page 6
M48T08, M48T08Y, M48T18
OPERATION MODES
As Figure 6., page 5 shows, the static memory array and the quartz-controlled clock oscillator of the
M48T08/18/08Y are integrated on one silicon chip.
The two circuits are interconnected at the upper
eight memory locations to provide user accessible
BYTEWIDE™ clock information in t he bytes with
addresses 1FF8h-1FFFh.
The clock locations contain the year, month, date,
day, hour, minute, and second in 24 hour BCD format. Corrections for 28, 29 (leap yea r - valid until
2100), 30, and 31 day months are made automatically. Byte 1FF8h is the clock control register. This
byte controls user access t o the clock inform ation
and also stores the clock calibration setting.
The eight clock bytes are not the actual clock
counters themselves; they are memory locations
consisting of BiPORT™ READ/WRITE memory
Table 2. Operating Modes
Mode
Deselect
DeselectX
WRITE
READ
READ
Deselect
Deselect
Note: X = VIH or VIL; VSO = Batte ry Back-up Switchover Vo l tage.
cells. The M48T08/18/08Y includes a clock control
circuit which updates the clock bytes with current
information once per second. The information can
be accessed by the user in the same manner as
any other location in the static memory array.
The M48T08/18/08Y also has its own Power-fail
Detect circuit. The control circuitry constantly monitors the single 5V supply for an out of tolerance
condition. When V
is out of tolerance, the circuit
CC
write protects the SRAM, providing a high degree
of data security in the midst of unpredictable system operation brought on by low V
. As VCC falls
CC
below the Battery Back-up Switchover Voltage
), the control circuitry connects the battery
(V
SO
which maintains data and clock operation until valid power returns.
XXHigh ZStandby
X
V
IL
V
IH
V
IL
V
IH
V
IH
D
IN
D
OUT
High ZActive
Active
Active
6/27
Page 7
READ Mode
M48T08, M48T08Y, M48T18
The M48T08/18/08Y i s in the RE AD Mode whenever W
(WRITE Enable) is high, E1 (Chip Enable
1) is low, and E2 (Chip Enable 2 ) is hi gh. The device architecture allows ripple-through access of
data from eight of 65,536 locations in the static
storage array. Thus, the unique address specified
by the 13 address inputs defines which one of the
8,192 bytes of data is to be accessed. Valid data
will be available at the Data I/O pins within address
access time (t
signal is stable, providing that the E1
) after the last address input
AVQV
, E2, and G
access times are a lso satisfied. I f the E1, E 2 and
access times are not met, valid data will be
G
Figure 7. READ Mode AC Waveforms
A0-A12
tAVQVtAXQX
tE1LQV
E1
tE1LQX
tE2HQV
available after the latter of the Chip Enable Access
times ( t
time ( t
E1LQV
GLQV
or t
).
) or Output Enable Access
E2HQV
The state of the eight t hree-state Da ta I/O si gnals
is controlled by E1
tivated before t
an indeterminate state until t
inputs are changed while E1
, E2 and G. If the outputs are ac-
, the data lines will be driven to
AVQV
. If the address
AVQV
, E2 and G remain active, output data will remain valid for Output Data
Hold time (t
) but will go indeterminate until the
AXQX
next address access.
tAVAV
VALID
tE1HQZ
tE2LQZ
E2
G
DQ0-DQ7
Note: W RITE Enable (W) = High.
tE2HQX
tGLQX
tGLQV
tGHQZ
VALID
AI00962
7/27
Page 8
M48T08, M48T08Y, M48T18
Table 3. READ Mode AC Characteristics
M48T08/M48T18/T08Y
Symbol
t
AVAV
t
AVQV
t
E1LQV
t
E2HQV
t
GLQV
t
E1LQX
t
E2HQX
t
GLQX
t
E1HQZ
t
E2LQZ
t
GHQZ
t
AXQX
Note: 1. Valid for Ambient Op erating Temp erature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
READ Cycle Time100150ns
Address Valid to Output Valid100150ns
Chip Enable 1 Low to Output Valid100150ns
Chip Enable 2 High to Output Valid100150ns
Output Enable Low to Output Valid5075ns
Chip Enable 1 Low to Output Transition1010ns
Chip Enable 2 High to Output Transition1010ns
Output Enable Low to Output Transition55ns
Chip Enable 1 High to Output Hi-Z5075ns
Chip Enable 2 Low to Output Hi-Z5075ns
Output Enable High to Output Hi-Z4060ns
Address Transition to Output Transition55ns
Parameter
(1)
MinMaxMinMax
Unit–100/–10 (T08Y)–150/–15 (T08Y)
8/27
Page 9
WRITE Mode
M48T08, M48T08Y, M48T18
The M48T08/18/08Y is in the WRITE Mode whenever W
, E1, and E2 are active. The start of a
WRITE is referenced from the latter occurring falling edge of W
or E1, or the rising edge of E2. A
WRITE is terminated by the earlier rising edge of
or E1, or the falling edge of E 2. The addr ess es
W
must be held valid throughout the cycle. E1
must return high or E2 low for a minimum of t
or t
from Chip Enabl e or t
E2LAX
from WRITE
WHAX
or W
E1HAX
Enable prior to the initiation of another READ or
WRITE Cycle. Data-in must be valid t
the end of WRITE and remain valid for t
terward. G
cles to avoid bus contention; however, if the output
bus has been activated by a low on E1
a high on E2, a low o n W
t
WLQZ
Figure 8. WRITE Enable Controlled, WRITE AC Waveform
tAVAV
A0-A12
tAVE1L
E1
tAVE2H
E2
tAVWL
W
tWLQZ
VALID
tAVWH
tWLWH
DVWH
should be kept high during WRITE Cy-
will disable the o utputs
after W falls.
tWHAX
tWHQX
tWHDX
prior to
af-
WHDX
and G and
DQ0-DQ7
tDVWH
DATA INPUT
AI00963
9/27
Page 10
M48T08, M48T08Y, M48T18
Figure 9. Chip Enable Controlled, WRITE AC Waveforms
tAVAV
A0-A12
E1
E2
W
DQ0-DQ7
VALID
tAVE1H
tAVE1L
tAVE2HtE2HE2L
tAVWL
tE1LE1H
tAVE2L
tDVE1H
tDVE2L
tE1HAX
tE2LAX
tE1HDX
tE2LDX
DATA INPUT
AI00964B
10/27
Page 11
M48T08, M48T08Y, M48T18
Table 4. WRITE Mode AC Characteristics
M48T08/M48T18/T08Y
Symbol
t
AVAV
t
AVWL
t
AVE1L
t
AVE2H
t
WLWH
t
E1LE1H
t
E2HE2L
t
WHAX
t
E1HAX
t
E2LAX
t
DVWH
t
DVE1H
t
DVE2L
t
WHDX
t
E1HDX
t
E2LDX
t
WLQZ
t
AVWH
t
AVE1H
t
AVE2L
t
WHQX
Note: 1. Valid for Ambient Op erating Temp erature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
WRITE Cycle Time100150ns
Address Valid to WRITE Enable Low00ns
Address Valid to Chip Enable 1 Low00ns
Address Valid to Chip Enable 2 High00ns
WRITE Enable Pulse Width80100ns
Chip Enable 1 Low to Chip Enable 1 High80130ns
Chip Enable 2 High to Chip Enable 2 Low80130ns
WRITE Enable High to Address Transition1010ns
Chip Enable 1 High to Address Transition1010ns
Chip Enable 2 Low to Address Transition1010ns
Input Valid to WRITE Enable High5070ns
Input Valid to Chip Enable 1 High5070ns
Input Valid to Chip Enable 2 Low5070ns
WRITE Enable High to Input Transition55ns
Chip Enable 1 High to Input Transition55ns
Chip Enable 2 Low to Input Transition55ns
WRITE Enable Low to Output Hi-Z5070ns
Address Valid to WRITE Enable High80130ns
Address Valid to Chip Enable 1 High80130ns
Address Valid to Chip Enable 2 Low80130ns
WRITE Enable High to Output Transition1010ns
Parameter
(1)
MinMaxMinMax
Unit–100/–10 (T08Y)–150/–15 (T08Y)
11/27
Page 12
M48T08, M48T08Y, M48T18
Data Retention Mode
With valid V
applied, the M48T08/ 18/08Y oper-
CC
ates as a convention al B YTEWIDE™ static RAM.
Should the supply voltage decay, the RAM will automatically power-fail deselect, write protecting itself when V
falls within the V
CC
PFD
(max), V
PFD
(min) window. All outputs become high impedance, and all inputs are treated as “Don't care.”
Note: A power failure during a WRITE cycle may
corrupt data at the currently a ddressed location,
but does not jeopardize the rest of the RAM's content. At voltages below V
(min), the user can be
PFD
assured the memory will be i n a write protected
state, provided the V
fall time is not less than tF.
CC
The M48T08/18/08Y may respond to transient
noise spikes on V
that reach into the des elect
CC
window during the time the device is sampling
. Therefore, decoupling of the power supply
V
CC
lines is recommended.
When V
drops below VSO, the control circuit
CC
switches power to the internal battery which preserves data and powers the clock. The internal
button cell will maintain data in the M48T08/18/
08Y for an accumulated period of at least 10 years
when V
is less than VSO.
CC
Note: Requires use of M4T32-BR12SH
SNAPHAT
As system power returns and V
V
SO
supply is switched to external V
Write protection continues until V
(min) plus t
low as V
®
top when using the SOH28 package.
rises above
CC
, the battery is disconnected and the power
.
CC
reaches V
(min). E1 should be kept high or E2
rec
rises past V
CC
PFD
CC
(min) to prevent inad-
PFD
vertent WRITE cyc les prior to system st abilization.
Normal RAM operation can resume t
exceeds V
PFD
(max).
after V
rec
CC
For more information on Battery Storage Life refer
to the Application Note AN1012.
Power-fail Interrupt Pin
The M48T08/18/08Y cont inuously monitors V
When V
falls to the power-fail detect trip point,
CC
CC
an interrupt is immediately generated. An internal
clock provides a delay of bet ween 1 0µs and 40µs
before automatically deselecting the M 48T08/18/
08Y. The INT
pin is an open drain output and requires an external pull up resistor, even if the interrupt output function is not being used.
.
12/27
Page 13
CLOCK OPERATIONS
M48T08, M48T08Y, M48T18
Reading the Clock
Updates to the TIMEKEEPER
®
registers should
be halted before clock data is read to prevent
reading data in transition. The BiPORT ™ TIMEKEEPER cel ls in the R AM a r ra y are only data registers and not the actual clock counters, so
updating the registers can be halted without disturbing the clock itself.
Updating is halted when a '1' is written to the
READ Bit, the seventh bit in the control register.
As long as a '1' remains in that po sition, updating
is halted. After a halt is issued, the registers reflect
the count; that is, the day, date, and the time that
were current at the moment the halt command was
issued.
All of the TIMEKEEPER registers are updated si-
Setting the C l ock
The eighth bit of the control register is the WRITE
Bit. Setting the WRITE Bit to a '1,' like the REA D
Bit, halts updates to the TIMEKEEPER registers.
The user can then load them with the correct day,
date, and time data in 24 hour BCD format (on Ta-
ble 5.). Resetting the WRITE Bit to a '0' then trans-
fers the values of all time registers (1FF9h-1FFFh)
to the actual TIMEKEEPER counters and allows
normal operation to resume. The FT Bit and the
bits marked as '0' in Table 5. must be written to '0'
to allow for normal TIMEKEEPER and RAM operation.
See the Application Note AN923, “TIMEKEEPER
Rolling Into the 21st Century” for information on
Century Rollover.
multaneously. A halt will not interrupt an update in
progress. Updating is within a second after the bit
is reset to a '0.'
Table 5. Register Map
Address
Data
D7D6D5D4D3D2D1D0
1FFFh10 Years YearYear00-99
1FFEh00010 MMonthMonth01-12
1FFDh0010 DateDateDate01-31
FT = FREQUENCY TEST Bit (Set to '0' for normal clock operation)
R = READ Bit
W = WRITE B i t
ST = STOP Bit
0 = Must be set to '0'
13/27
Page 14
M48T08, M48T08Y, M48T18
Stopping and Starting the Oscillator
The oscillator may be stopped at any time. If the
device is going to spend a significant amount of
time on the shelf, the oscillator can be turned off to
minimize current drain on the battery. The STOP
Bit (ST) is the MSB of the seconds register. Setting
it to a '1' stops the oscillator. The M48T08/ 18/08Y
(in the PCDIP28 package) is shipped from STMicroelectronics with the STOP Bit set to a '1.' When
reset to a '0,' the M48T08/18/08Y oscillator starts
within one second.
Note: To guarant ee oscillat or start-up after initia l
power-up, first write the STOP Bit (ST) to '1,' then
rese t to '0.'
Calibrating the Clock
The M48T08/18/08Y is driven by a quartz-controlled oscillator with a nominal frequency of
32,768 Hz. A typical M48T08/18/08Y is accurate
within 1 minute per month at 25°C without calibration. The devices are tested not to exceed ± 35
ppm (parts per million) oscillator frequency error at
25°C, which equates to about ±1. 53 minutes per
month. With the calibration bits properly set, the
accuracy of each M48T08/18/08Y improves to
better than +1/–2 ppm at 25°C.
The oscillation rate of any crystal changes with
temperature. Figure 10., page 15 shows the frequency error that can be expected at various temperatures. Most clock chips compensate for
crystal frequency and temperat ure shift error with
cumbersome “trim” capacitors. The M48T08/18/
08Y design, however, employs periodic counter
correction. The calibration circuit adds or subtracts
counts from the oscillator divider circuit at the divide by 256 stage, as shown in Figure
11., page 15. The number of times pulses are
blanked (subtracted, negat ive calibration) or split
(added, positive calibration) depends upon the
value loaded into the five-bit Calibration Byte
found in the Control Register. Adding counts
speeds the clock up, subtracting counts slows the
clock down.
The Calibration Byte occupies the five lower order
bits in the Control register. This byte can be set to
represent any value be tween 0 and 31 in binary
form. The sixth bit is the Sign Bit; '1' indicates positive calibration, '0' indicates negative calibration.
Calibration occurs within a 64 minute cycle. The
first 62 minutes i n the cycle may, on ce per minute,
have one second either shortened by 128 or
lengthened by 256 os cillato r cycles. If a binary '1'
is loaded into the register, only the first 2 minutes
in the 64 minute cycle will be modified; if a binary
6 is loaded, the first 12 will be affected, and so on.
Therefore, each calibration step has t he effect of
adding 512 or subtracting 256 oscillator cycles for
every 125,829,120 actual oscillator cycles; that is
+4.068 or –2.034 ppm of adjustment per calibration step in the calibrat ion registe r. Assum ing that
the oscillator is in fact running at exactly 32,768Hz,
each of the 31 increments in the Calibration Byte
would represent +10.7 or –5.35 seconds per
month which corresponds to a total range of +5.5
or –2.75 minutes per month.
Two methods are available for ascertaining how
much calibration a given M48T08/18/08Y may require. The first involves simply setting the clock,
letting it run for a month and comparing it to a
known accurate reference (like WWV broadcasts).
While that may seem crude, it allows the designer
to give the end user the ability to calibrate his clock
as his environment may require, even after the final product is packaged in a non-user serviceable
enclosure. All the des igner has to d o is provide a
simple utility that accesses the Calibration Byte.
The second approach is better suited t o a manufacturing environment, and involves the use of
standard test equipment. When the Frequency
Test (FT) Bit, the seventh-most significant bit in
the Day R egis ter, is s et to a ' 1,' a nd the o scilla tor
is running at 32,768 Hz, the LSB (DQ0) of the Seconds Register will toggle at 512 Hz. Any deviation
from 512 Hz indicates th e degree and direction of
oscillator frequency shift at the test temperature.
For example, a reading of 512.01024 Hz would indicate a +20 ppm oscillator frequency error, requiring a –10 (WR001010) to be loaded into the
Calibration Byte for correction.
Note: Setting or changing the Calibration Byte
does not affect the Frequency Test output frequency. The device must be selected and addresses must be stable at Address 1FF9h when
reading the 512 Hz on DQ0.
The LSB of the Seconds Register is m onitored by
holding the M48T08/18/08Y in an extended READ
of the Seconds Register, but without having the
READ Bit set. The FT Bit MUST be reset to '0' for
normal clock operations to resume.
For more information on calibration, see the Application Note AN934, “TIMEKEEPER
®
Calibratio n.”
14/27
Page 15
Figure 10. Crystal Accuracy Across Temp eratur e
ppm
20
0
-20
-40
M48T08, M48T08Y, M48T18
-60
-80
-100
0510152025303540455055606570
Figure 11. Cl ock Ca l ib rat i on
NORMAL
POSITIVE
CALIBRATION
NEGATIVE
CALIBRATION
∆F
= -0.038(T - T
F
ppm
T0 = 25 °C
)2 ± 10%
0
2
C
°C
AI02124
AI00594B
15/27
Page 16
M48T08, M48T08Y, M48T18
VCC Noise And Negative Going Transients
I
transients, including those produced by output
CC
switching, can produce voltage fluctuations, resulting in spikes on the V
bus. These transients
CC
can be reduced if capacitors are used to store energy which stabilizes the V
bus. The energy
CC
stored in the bypass capacitors will be released as
low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1µF (as shown in Figure
12.) is recommended in order to provide the need-
ed filtering.
In addition to transients that are caused by normal
SRAM operation, power cycling can generate negative voltage spikes on V
below V
by as much as one volt. These negative
SS
that drive it to values
CC
spikes can cause data corruption in the SRAM
while in battery backup mode. To protect from
these voltage spikes, it is recommended to connect a schottky diode from V
connected to V
, anode to VSS). Schottky diode
CC
to VSS (cathode
CC
1N5817 is recommended for through hole and
MBRS120T3 is recommended for surface mount.
Figure 12. Supply Voltage Protection
V
CC
V
CC
0.1µFDEVICE
V
SS
AI02169
16/27
Page 17
MAXIMUM RA T ING
M48T08, M48T08Y, M48T18
Stressing the device above the rating listed in the
“Absolute Maximum Ratings” table may cause
permanent damage to the device. These are
stress ratings only and operation of the device at
these or any other conditions above those indicat-
not implied. Exposure to Absol ute Max imum Ra ting conditions for extended periods may affect device reliability. Refer also to the
STMicroelectronics SURE Program and other relevant quality documents.
ed in the Operating sections of this specification is
Table 6. Absolute Maximum Ratings
SymbolParameterValueUnit
T
A
T
STG
(1,2,3)
T
SLD
V
IO
V
CC
I
O
P
D
Note: 1. For DIP package: Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for longer
than 30 seconds).
2. For S O package, standard (SnPb) lead finish: Reflow at peak t em perature of 2 25°C (total thermal budget not to excee d 180°C for
between 90 to 15 0 s e c o nds).
3. For S O package , Lead-free (Pb-free) lead finish: Reflow at peak tempera ture of 260°C (total therm al budget n ot to exceed 245°C
for greater than 30 seconds).
CAUTION: Negative undershoots bel ow –0.3V are not allowed on any pin whi l e i n t he Battery B ack-up mode.
CAUTION: Do NOT wave solder SOIC to avoid damaging SNAPHAT sockets.
Ambient Operating Temperature0 to 70°C
Storage Te mperat ure (VCC Off, Oscillator Off)
–40 to 85°C
Lead Solder Temperature for 10 seconds260°C
Input or Output Voltages–0.3 to 7V
Supply Voltage–0.3 to 7V
Output Current20mA
Power Dissipation1W
17/27
Page 18
M48T08, M48T08Y, M48T18
DC AND AC PARAMETERS
This section summarizes the operating and measurement conditions, as well as the DC and AC
characteristics of the device. The parameters in
the following DC and AC Characteristic tables are
ment Conditions listed in t he relevant tables. Designers should check that the operating conditions
in their projects match the measurement conditions when using the quoted parameters.
derived from tests performed under the Meas ure-
Table 7. Operating and AC Measurement Conditions
ParameterM48T08M48T18/T08YUnit
Supply Voltage (V
Ambient Operating Temperature (T
Load Capacitance (C
CC
)
)
A
)
L
4.75 to 5.54.5 to 5.5V
0 to 700 to 70°C
100100pF
Input Rise and Fall Times≤ 5≤ 5ns
Input Pulse Voltages0 to 30 to 3V
Input and Output Timing Ref. Voltages1.51.5V
Note: O utput Hi-Z is def i ned as the poin t where data is no l onger driven.
Figure 13. AC Te sting Lo a d Circui t
5V
1.8kΩ
DEVICE
UNDER
TEST
1kΩ
CL includes JIG capacitance
OUT
CL = 100pF
AI01019
Table 8. Capacitance
Symbol
C
IN
C
IO
Note: 1. Effec tive capacitance measured with powe r supply at 5V; sampled only, not 100% tested.
2. At 25°C, f = 1MHz.
3. Outputs deselect ed.
Input Capacitance10pF
(3)
Input / Output Capacitance10pF
Parameter
(1,2)
MinMaxUnit
18/27
Page 19
Table 9. DC Characteristics
SymbolParameter
I
I
CC1
I
CC2
LO
I
I
CC
Input Leakage Current
LI
(2)
Output Leakage Current
Supply CurrentOutputs open80mA
(3)
Supply Current (Standby) TTL
(3)
Supply Current (Standby) CMOS
Test Condition
0V ≤ V
0V ≤ V
E1
E1
≤ V
IN
≤ V
OUT
= V
E2 = V
IH,
= VCC – 0.2V,
E2 = VSS + 0.2V
CC
CC
(1)
M48T08, M48T08Y, M48T18
M48T08/M48T18/T08Y
MinMax
±1µA
±1µA
IL
3mA
3mA
Unit
V
V
V
V
OH
Note: 1. Valid for Ambient Op erating Temp erature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. Outputs deselect ed.
3. Measured with Cont rol Bits se t as fol low s: R = '1'; W, ST, FT = '0.'
4. The I NT
Input Low Voltage–0.30.8V
IL
Input High Voltage2.2
IH
I
Output Low Voltage
OL
Output Low Voltage (INT
Output High Voltage
pin is Open Drain.
(4)
)
= 2.1mA
OL
IOL = 0.5mA
I
= –1mA
OH
2.4V
V
+ 0.3
CC
0.4V
0.4V
V
19/27
Page 20
M48T08, M48T08Y, M48T18
Figure 14. Power Down/Up Mode AC Waveforms
V
CC
V
(max)
PFD
V
(min)
PFD
VSO
tF
tPDtRB
INT
INPUTS
OUTPUTS
Note: Inp uts m ay or may not be rec og niz ed at thi s time . Cauti on sho uld be t aken t o keep E 1 high or E2 lo w as VCC rises past V
Some systems may perform inadvertent WRITE cycles after V
Even though a power on reset is being applied to the processor, a reset condition may not occur until after the system clock is running.
VALIDVALID
(PER CONTROL INPUT)
tFB
tPFX
tDR
rises above V
CC
DON'T CARE
HIGH-Z
(min) bu t before norm al sy st em operations begin.
PFD
tR
tPFH
NOTE
(PER CONTROL INPUT)
trec
RECOGNIZEDRECOGNIZED
AI00566
Table 10. Power Down/Up AC Characteristics
Symbol
t
PD
(2)
t
F
(3)
t
FB
t
R
t
RB
t
rec
t
PFX
t
PFH
Note: 1. Valid for Ambient Op erating Temp erature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. V
es V
3. V
E1 or W at VIH or E2 at VIL before Power Down
V
(max) to V
PFD
V
(min) to VSS VCC Fall Time
PFD
V
(min) to V
PFD
VSS to V
PFD
E1 or W at VIH or E2 at V
INT Low to Auto Deselect1040µs
V
(max) to INT High
PFD
(max) to V
PFD
(min).
PFD
(min) to VSS fall time of less than tFB may cause corruption of RA M data.
PFD
(min) fall time of less than tF may result in deselection/write protection not occurring until 200µs after VCC pass-
PFD
Parameter
(min) VCC Fall Time
PFD
(max) VCC Rise Time
PFD
(min) VCC Rise Time
(1)
before Power Up
IL
MinMaxUnit
0µs
300µs
10µs
0µs
1µs
1ms
120µs
PFD
(min).
Table 11. Power Down/Up Trip Points DC Characteristics
Symbol
V
PFD
V
SO
t
DR
Note: 1. All voltages referenced to VSS.
2. Val i d for Ambient Op erating Temp erature: T
3. At 55°C, V
Power-fail Deselect Voltag e
Battery Back-up Switchover Voltage3.0V
Expected Data Retention Time
= 0V; tDR = 8.5 years (typ) at 70°C. Requires use of M4T32-BR12SH SNAPHAT® top when using the SOH28 package.
CC
20/27
Parameter
(1,2)
M48T084.54.64.75V
M48T18/T08Y4.24.34.5V
= 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
blank = Tubes (Not for New Design - Use E)
E = ECOPACK Package, Tubes
F = ECOPACK Package, Tape & Reel
TR = Tape & Reel (Not for New Design - Use F)
For PCDIP28:
blank = ECOPACK Package, Tubes
Note: 1. The M48 T 08/18 part is off ered with the PC DIP28 (e.g., CAPHAT™) package only.
2. The S OIC package (SOH28) re qui res the SNAP HAT
“M4TXX-BR12S H” in pl as ti c tu be o r “M4 TXX- BR1 2S HTR” i n Ta pe & Reel form (s ee Table 17.). The M48T08Y part is offered in the
SOH28 (SNA PHAT) package only.
Caution: Do not place the SNAPHAT battery package “M4TXX-BR12SH” in conductive foam as it will drain the lithium button-cell battery.
®
battery/crystal package which i s ordered separately u nder the part number
For other options, or for more information on any aspect of this device, please contact the ST Sales Office
nearest you.
01-Aug-013.1Reference to App. Note corrected in “Calibrating the Clock” section
21-Dec-013.2Changes to text in document to reflect addition of M48T08Y option
06-Mar-023.3Fix Ordering Information table and add to footnote (Table 16)
20-May-023.4Modify reflow time and temperature footnotes (Table 6)
29-Aug-023.5
28-Mar-034.0v2.2 template applied; updated test conditions (Table 10)
10-Dec-035.0Reformatted
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