RAM is a 2Kb x 8
non-volatile sta tic RAM and real time clock which
is pin and f unctional compatible with the DS1642.
A special 24-pin, 600mil DIP CAP HAT™ package
houses the M48T02/12 silicon with a quartz cryst al
and a long life lithium button cell to form a highly
integrated battery back ed-up m emory an d real
time clock solution.
The M48T02/12 button cell has sufficient capacity
and storage life to maintain data and clock func-
tionality for an accum ulat ed time period of at least
10 years in the absence of power over the operating temperature range.
The M48T02/12 is a non-volatile pin and function
equivalent to any JEDEC standard 2Kb x 8 SRAM.
It also easily fits into many ROM, EPROM, and
EEPROM sockets, providing the non-volatility of
PROMs without any requirement for special
WRITE timing or limitations on the number of
WRITEs that can be performed.
Figure 2. Logic DiagramTable 1. Signal Names
A0-A10Address Inputs
DQ0-DQ7Data Inputs / Outputs
E
G
W
V
V
CC
SS
Chip Enable
Output Enable
WRITE Enable
Supply Voltage
Ground
A0-A10
W
V
CC
11
M48T02
M48T12
E
G
8
DQ0-DQ7
V
SS
Figure 3. DIP Connections
AI01027
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ2
SS
1
2
3
4
5
6
7
8
9
10
11
12
M48T02
M48T12
24
23
22
21
20
19
18
17
16
15
14
13
AI01028
V
CC
A8
A9
W
G
A10
E
DQ7
DQ6
DQ5DQ1
DQ4
DQ3V
3/19
M48T02, M48T12
Figure 4. Block Diagram
OSCILLATOR AND
CLOCK CHAIN
32,768 Hz
CRYSTAL
POWER
LITHIUM
CELL
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
V
CC
MAXIMUM RATING
Stressingthedeviceabovetheratinglistedinthe
“Absolute Maximum Ratings” table may c ause
permanent damage to the dev ice. These are
stress ratings only and operation of the device at
these or any other conditions a bove those indicated in the Ope ratin g sections of this specification is
8 x 8 BiPORT
SRAM ARRAY
A0-A10
DQ0-DQ7
E
W
G
AI01329
V
PFD
BOK
2040 x 8
SRAM ARRAY
V
SS
not implied. Expos ure to Absolute Max imum Rating c ondit ions for extended periods may affect devicereliability.Referalsotothe
STMicroelectronics SURE Program and other relevant quality documents.
Table 2. Absolute Maximum Ratings
SymbolParameterValueUnit
T
A
T
STG
(2)
T
SLD
V
IO
V
CC
I
O
P
D
Note: 1. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for longer than 30 seconds).
CAUTION: Negative undershoots below –0.3V are not allowed on any pin while in the Battery Back-up mode.
4/19
Ambient Operating Temperature0 to 70°C
Storage Temperature (VCCOff, Oscillator Off)
–40 to 85°C
Lead Solder Temperature for 10 seconds260°C
Input or Output Voltages–0.3 to 7V
Supply Voltage–0.3 to 7V
Output Current20mA
Power Dissipation1W
DC AND AC PARAMETERS
This s ec t ion summarizes the operating and measurement conditions, as well as the DC and AC
characteristics of the device. The parameters in
the following DC and AC Charact eristic tables are
derived from tests performed under the Measure-
Table 3. Operating and AC Measu rement Conditions
ParameterM48T02M48T12Unit
M48T02, M48T12
ment Conditions listed in the relevant tables. Designers should check that the operating conditions
in their projects match the measure ment conditions when using t he quoted parameters.
Supply Voltage (V
Ambient Operating Temperature (T
Load Capacitance (C
CC
)
)
A
)
L
4.75 to 5.54.5 to 5.5V
0 to 700 to 70°C
100100pF
Input Rise and Fall Times≤ 5≤ 5ns
Input Pulse Voltages0 to 30 to 3V
Input and Output Timing Ref. Voltages1.51.5V
Note: Output Hi-Z is defined as the point where data is no longer driven.
Figure 5. AC Testing Load Circuit
5V
1.8kΩ
DEVICE
UNDER
TEST
1kΩ
OUT
CL = 100pF
CL includes JIG capacitance
AI01019
Table 4. Capacitance
Symbol
C
IN
C
IO
Note: 1. Effective capacitance measured with power supply at 5V. Sampled only, not 100% tested.
2. At 25°C, f = 1MHz.
3. Outputs deselected.
Input Capacitance10pF
(3)
Input / Output Capacitance10pF
Parameter
(1,2)
MinMaxUnit
5/19
M48T02, M48T12
Table 5. DC C haracteristics
SymbolParameter
Test Condition
(1)
MinMaxUnit
I
LI
I
LO
I
CC
I
CC1
I
CC2
V
IL
V
V
OL
V
OH
Note: 1. Valid forAmbientOperating Temperature:TA=0to70°C;VCC= 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. Outputs deselected.
3. Measured with Control Bits set as follows: R = '1'; W, ST, FT = '0.'
4. Negativespikes of–1V allowed forup to 10ns onceper Cycle.
Input Leakage Current
(2)
Output Leakage Current
Supply CurrentOutputs open80mA
(3)
Supply Current (Standby) TTL
(3)
Supply Current (Standby) CMOS
(4)
Input Low Voltage–0.30.8V
Input High Voltage2.2
IH
Output Low Voltage
Output High Voltage
0V ≤ V
0V ≤ V
E
≤ V
IN
≤ V
OUT
E
=V
IH
=VCC– 0.2V
I
= 2.1mA
OL
I
= –1mA
OH
CC
CC
±1µA
±1µA
3mA
3mA
V
+ 0.3
CC
0.4V
2.4V
OPERATION MODES
As Figure 4, page 4 shows, the static memory array and the quartz controlled clock oscillator of the
M48T02/12 are integrated on one silicon chip. The
two circuits are interconnected at the upper eight
memory locations to p rovide user accessible
BYTEWIDE™ clock information in the bytes with
addresses 7F8h-7FFh. The clock locations contain the year, month, date, day, hour, mi nute, and
second in 24 hour BCD format. Corrections f or 28,
29 (leap year - valid until 2100), 30, and 31 day
months are mad e automatically.
Byte 7F8h is the clock control register. This byte
controls user access to the clock information and
also stores the clock calibration setting.
The eight clock bytes are not the actual clock
counters themselves; they are m emory locat ions
consisting of BiPORT™ READ/WRITE memory
cells. The M48T02/12 includes a clock control circuit which updates t he clock bytes w ith c urrent information once per second. The information can
be accessed by the user in the same manner as
any other location in the static memory array .
The M48T02 /12 also has its o wn Power-fail Det ect
circuit. The control circuitry constantly monitors
the single 5V s upply for an out of tolerance condition. When V
is out of tolerance, the circuit write
CC
protects the SRAM, providing a high degree of
data security in the midst of unpredictable system
operation brought on by low V
.AsVCCfalls be-
CC
low approx im at ely 3V, the control circuitry connects the battery which maintains data and clock
operation until valid power returns.
V
Table 6. Operating Modes
Mode
Deselect
WRITE
READ
READ
Deselect
V
Deselect
Note: X = VIHor VIL;VSO= Battery Back-up Switchover Voltage.
1. See Table 10, page 11 for details.
6/19
V
CC
4.75 to 5.5V
or
4.5 to 5.5V
to V
SO
PFD
≤ V
SO
(min)
(1)
(1)
EGWDQ0-DQ7Power
V
IH
V
IL
V
IL
V
IL
V
XXXHigh ZCMOS Standby
XXXHigh ZBattery Back-up Mode
XXHigh ZStandby
X
V
IL
IH
V
IL
V
IH
V
IH
D
IN
D
OUT
Active
Active
High ZActive
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