dV/dtCritical rate of rise of reverse voltage10000V/µs
dPtot
* : thermal runaway condition for a diode on its own heatsink
------------- --
dTj
1
--------------- ----------->
Rth j a
–()
August 2004
REV. 6
1/7
STPS1L30
Table 4: Thermal Resistance
SymbolParameterValueUnit
R
th(j-l)
Junction to lead
Table 5: Static Electrical Characteristics
SymbolParameterTests conditionsMin.TypMax.Unit
T
= 25°C
IR *
V
Reverse leakage current
*
Forward voltage drop
F
Pulse test:* tp = 380 µs, δ < 2%
To evaluate the conduction losses use the following equation: P = 0.225 x I
j
T
= 100°C
j
= 25°C
T
j
= 125°C
T
j
= 25°C
T
j
= 125°C
T
j
V
R
I
F
I
F
= V
= 1A
= 2A
SMA30
SMB25
RRM
+ 0.075 I
F(AV)
F2(RMS)
°C/W
200
615
0.395
0.260.3
0.445
0.3250.375
µA
mA
V
Figure 1: Average forward power dissipation
versus average forward current
P(W)
F(AV)
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
0.00.20.40.60.81.01.2
δ = 0.05
δ = 0.1
I(A)
F(AV)
δ = 0.2
δ = 0.5
δ
δ = 1
=tp/T
T
tp
Figure 3: Normalized avalanche power
derating versus pulse duration
P(t)
ARM p
P(1µs)
ARM
1
0.1
0.01
t (µs)
0.001
0.10.011
p
101001000
Figure 2: Average forward current versus
ambient temperature (δ = 0.5)
I(A)
F(AV)
1.2
R=R
1.0
0.8
0.6
0.4
0.2
0.0
T
tp
=tp/T
δ
0255075100125150
R =120°C/W
T(°C)
amb
th(j-a)
R =100°C/W
th(j-a) th(j-I)
th(j-a)
Figure 4: Normalized avalanche power
derating versus junction temperature
P(t)
ARM p
P(25°C)
ARM
1.2
1
0.8
0.6
0.4
0.2
0
255075100125150
T (°C)
j
2/7
STPS1L30
Figure 5: Non repetitive surge peak forward
current versus overload duration (maximum
values) (SMA)
I (A)
M
10
8
T =25°C
6
4
2
0
1E-3
I
M
t
δ
=0.5
1E-21E-1
t(s)
a
T =50°C
a
T =100°C
a
1E+0
Figure 7: Relative variation of thermal
impedance junction to ambient versus pulse
duration (epoxy printed circuit board,
e(Cu)=35µm, recommended pad layout) (SMA)
Z/R
th(j-c) th(j-c)
1.0
Figure 6: Non repetitive surge peak forward
current versus overload duration (maximum
values) (SMB)
I (A)
M
10
8
T =25°C
6
4
IM
2
0
1E-3
δ=0.5
t
1E-21E-11E+0
t(s)
a
T =50°C
a
T =100°C
a
Figure 8: Relative variation of thermal
impedance junction to ambient versus pulse
duration (epoxy printed circuit board,
e(Cu)=35µm, recommended pad layout) (SMB)
Z/R
th(j-c) th(j-c)
1.0
0.8
0.6
δ = 0.5
0.4
δ
=tp/T
T
tp
δ = 0.2
0.2
δ = 0.1
Single pulse
0.0
1E-21E-11E+01E+11E+25E+2
t (s)
p
Figure 9: Reverse leakage current versus
reverse voltage applied (typical values)
I (mA)
R
1E+2
1E+1
1E+0
1E-1
1E-2
1E-3
051015202530
T =150°C
j
T =125°C
j
T =100°C
j
T =25°C
j
V (V)
R
0.8
0.6
= 0.5
δ
0.4
δ
=tp/T
T
tp
= 0.2
δ
0.2
= 0.1
δ
Single pulse
0.0
1E-21E-11E+01E+11E+25E+2
t (s)
p
Figure 10: Junction capacitance versus
reverse voltage applied (typical values)
C(pF)
500
100
V (V)
10
125102030
R
F=1MHz
T =25°C
j
3/7
STPS1L30
Figure 11: Forward voltage drop versus
forward current (typical values, high level)
I (A)
FM
10.00
T =100°C
j
T =150°C
j
1.00
0.10
0.00.10.20.30.40.50.60.7
V (V)
FM
T =25°C
j
Figure 13: Thermal resistance junction to
ambient versus copper surface under each
lead (Epoxy printed circuit board FR4, copper
thickness: 35µm) (SMA)
R(°C/W)
th(j-a)
140
120
100
80
60
40
20
0
012345
S(Cu)(cm²)
Figure 12: Forward voltage drop versus
forward current (maximum values, low level)
Figure 14: Thermal resistance junction to
ambient versus copper surface under each
lead (Epoxy printed circuit board FR4, copper
thickness: 35µm) (SMB)
SMA package dimensions update. Reference A1 max.
changed from 2.70mm (0.106inc.) to 2.03mm (0.080).
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