Sony CXK5V81000ATM-85LLX, CXK5V81000ATM-10LLX Datasheet

CXK5V81000ATM-85LLX/10LLX
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131072-word × 8-bit High Speed CMOS Static RAM
Description
The CXK5V81000ATM is a high speed CMOS
static RAM organized as 131072-words by 8-bits.
A polysilicon TFT cell technology realized extremely low stand-by current and higher data retention stability.
Operating on a single 3.3V supply, and special feature are low power consumption, high speed.
The CXK5V81000ATM is a suitable RAM for portable equipment with battery back up.
Features
Extended operating temperature range:
–25 to +85°C
Fast access time:
(Access time)
-85LLX 85ns (Max.)
-10LLX 100ns (Max.)
Low standby current: 28µA (Max.)
Low data retention current: 24µA (Max.)
Single 3.3V supply: 3.3V ± 0.3V
Low voltage data retention: 2.0V (Min.)
Package
8mm × 20mm 32 pin TSOP package
Function
131072-word x 8-bit static RAM
Block Diagram
A10 A11
A9
A8 A13 A15 A16 A14 A12
A7
A6
A5
A4
A3
A2
A1
A0
OE
WE
CE1 CE2
Buffer
Buffer
Buffer
32 pin TSOP (Plastic)
Row
Decoder
Memory
Matrix
1024 × 512
I/O Gate
Column
Decoder
I/O Buffer
I/O1
VCC
GND
I/O8
Structure
Silicon gate CMOS IC
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
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E95715-ST
CXK5V81000ATM
Pin Configuration (Top View)
A11
A13
WE
CE2
A15
Vcc
NC A16 A14 A12
1 2
A9
3
A8
4 5 6 7 8
9 10 11
12 13
A7
14
A6 A5
15 16
A4
CXK5V81000ATM
32
OE
31
A10
30
CE1
29
I/O8
28
I/O7
27
I/O6
26
I/O5 I/O4
25
GND
24
I/O3
23
I/O2
22
I/O1
21
A0
20 19
A1
18
A2 A3
17
Absolute Maximum Ratings (Ta = 25°C, GND = 0V)
Item Symbol Rating Unit Supply voltage Input voltage Input and output voltage
VCC VIN VI/O
–0.5 to +4.6 –0.5to VCC + 0.5 –0.5to VCC + 0.5
V V V
Pin Description
Symbol Description A0 to A16 I/O1 to I/O8 CE1, CE2 WE OE VCC GND NC
Address input Data input output Chip enable 1, 2 input Write enable input Output enable input Power supply Ground No connection
Allowable power dissipation Operating temperature Storage temperature Soldering temperature · time
PD Topr Tstg Tsolder
0.7
–25 to +85
–55 to +150
235 · 10
W °C °C
°C · s
VIN, VI/O = –3.0V Min. for pulse width less than 50ns.
Truth Table
CE1 CE2 OE WE
H
×
×
×
×
L
×
×
L
H
H
H
L
H
L
H
L
H
×
L
Mode I/O pin VCC Current
Not selected Not selected Output disable Read Write
High Z High Z High Z Data out Data in
ISB1, ISB2 ISB1, ISB2 ICC1, ICC2, ICC3 ICC1, ICC2, ICC3 ICC1, ICC2, ICC3
×: “H” or “L”
DC Recommended Operating Conditions (Ta = –25 to +85°C, GND = 0V)
Item Symbol Min. Typ. Max. Unit Supply voltage Input high voltage Input low voltage
VCC VIH VIL
3.0
2.2
–0.3
VIL = –3.0V Min. for pulse width less than 50ns.
– 2 –
3.3 — —
3.6
VCC + 0.3
0.6
V V V
Electrical Characteristics
CXK5V81000ATM
• DC Characteristics
Item Symbol Min.
Input leakage current
Output leakage current
Operating power supply current
Average operating current
Standby current
Output high voltage
ILI
ILO
ICC1
ICC2
ICC3
ISB1
ISB2 VOH
(VCC = 3.3V ± 0.3V, GND = 0V, Ta = –25 to +85°C)
VIN = GND to VCC CE1 = VIH or CE2 = VIL or
OE = VIH or WE = VIL VI/O = GND to VCC
CE1 = VIL, CE2 = VIH VIN = VIH or VIL IOUT = 0mA
Min. cycle duty = 100% IOUT = 0mA
Cycle time 1µs duty = 100% IOUT = 0mA CE1 0.2V CE2 Vcc – 0.2V VIL 0.2V VIH Vcc – 0.2V
CE2 0.2V
CE1 Vcc – 0.2V
or
{
CE2 Vcc – 0.2V
CE1 = VIH or CE2 = VIL
IOH = –2.0mA
85LLX 10LLX
–25 to +85°C –25 to +70°C +25°C
Typ.
–1
–1
— —
—510
— — — —
2.4
1
30 25
— —
0.48
0.12 —
Max. UnitTest conditions
+1
+1
3
40 35
28 14 —
1.4 —
µA
µA
mA
mA
mA
µA
mA
V
Output low voltage
VCC = 3.3V, Ta = 25°C
VOL
IOL = 2.0mA
0.4
V
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