SGS Thomson Microelectronics VND810SP, VND810SP13TR Datasheet

®
July 2002 1/18
VND810SP
DOUBLE CHANNEL HIGH SIDE DRIVER
1
CMOS COMPATIBLE INPUTS
OPEN DRAIN STATUS OUTPUTS
OFF STATE OPEN LOAD DETECTION
SHORTED LOAD PROTECTION
UNDERVOLTAGE AND OVERVOLTAGE
SHUTDOWN
PROTECTION AGAINST LOSS OF GROUND
VERY LOW STAND-BY CURRENT
REVERSE BATTERY PROTECTIO N (**)
DESCRIPTION
The VND810 SP is a monolithic de vice made by using STMicroelectronics VIPower M0-3 Technology, intende d for d riving any k ind of l oad with one side connected to ground. Active VCC pin voltag e clamp protects th e dev ice against low energy spikes (see ISO7637 transient compatibility table). Active current limitation
combined with thermal sh utdown and automatic restart protects the device against overloa d. The device detects open load condition both in on and off state. Output shorted to VCC is detected in the off state. Dev ice auto mati cally tur ns off in c ase of ground pin disconnection.
TYPE R
DS(on)
I
OUT
V
CC
VND810 SP 160 m(*) 3.5 A (*) 36 V
1
10
PowerSO-10
ORDER CODES
PACKAGE TU B E T&R
PowerSO-10VND810SP VND810SP13TR
(*) Per each channel
BLOCK DIAGRAM
(**) See appl ic ation schema tic at page 8
OVERTEMP. 1
V
cc
GND
INPUT1
OUTPUT1
OVERVOLTAGE
LOGIC
DRIVER 1
STATUS1
V
cc
CLAMP
UNDERVOLTAGE
CLAMP 1
OPENLOAD ON 1
CURRENT LIMITER 1
OPENLOAD OFF 1
OUTPUT2
DRIVER 2
CLAMP 2
OPENLOAD ON 2
OPENLOAD OFF 2
OVERTEMP. 2
INPUT2
STATUS2
CURRENT LIMITER 2
2/18
VND810SP
ABSOLUTE MAXIMUM RATI NG
CONNECTION DIAGRAM (TOP VIEW)
Symbol Parameter Value Unit
V
CC
DC Supply Voltage 41 V
- V
CC
Reverse DC Supply Voltage - 0.3 V
- I
GND
DC Reverse Ground Pin Current - 200 mA
I
OUT
DC Output Current Internally Limited A
- I
OUT
Reverse DC Output Current - 6 A
I
IN
DC Input Curr ent +/- 10 mA
I
stat
DC Status Cur rent +/- 10 mA
V
ESD
Electros tatic Discharge (Human Body Model: R=1.5KΩ; C=100pF)
- INPUT
- STATUS
- OUTPU T
- V
CC
4000 4000 5000 5000
V V V V
E
MAX
Maximum Switching Energy (L=1.4mH; R
L
=0; V
bat
=13.5V; T
jstart
=150ºC; IL=5A)
24 mJ
P
tot
Powe r Dissipation TC=25°C 52 W
T
j
Junction Operating Temperature Internally Limited °C
T
c
Case Operating Temperature - 40 to 150 °C
T
stg
Storage Temperature - 55 to 150 °C
1
CURRENT AND VOLTAGE CO NVENTIONS
1
2
3
4
5
6 7 8 9
10
11
OUTPUT 1 OUTPUT 1 N.C. OUTPUT 2 OUTPUT 2
GROUND INPUT 1 STATUS 1 STATUS 2 INPUT 2
V
CC
I
S
I
GND
OUTPUT 2
V
CC
GND
STATUS 2
INPUT 2
I
OUT2
I
IN2
I
STAT2
V
STAT2
V
IN2
V
CC
V
OUT2
OUTPUT 1
I
OUT1
V
OUT1
INPUT 1
I
IN1
STATUS 1
I
STAT1
V
IN1
V
STAT1
3/18
VND810SP
THERMAL DATA
(*) When mounted on a standard single-sided FR-4 board with 0.5cm2 of Cu (at least 35µm thick). Horizontal mounting and no artificial air
flow.
ELECTRICAL CHARACTERISTICS (8V<VCC<36V; -40°C< Tj < 150°C, unless otherwise specified)
(Per each channel) POWER OUTPUTS
(**) Per device
SWITCHING (VCC=13V)
LOGIC INPUT
Symbol Parameter Value Unit
R
thj-case
Thermal R esistance Junction- case 2.4 °C/W
R
thj-amb
Thermal Resistance Junction-ambient 52.4 (*) °C/W
Symbol Parameter Test Conditions Min Typ Max Unit
V
CC
(**) Operating Supply Voltage 5.5 13 36 V
V
USD
(**) Undervoltage Shut-down 3 4 5.5 V
V
OV
(**) Ove rvoltage Shu t-down 36 V
R
ON
On State Resistance
I
OUT
=1A; Tj=25°C
I
OUT
=1A; VCC>8V
160 320
m m
I
S
(**) Supply Current
Off State; V
CC
=13V; VIN=V
OUT
=0V
Off State; V
CC
=13V; VIN=V
OUT
=0V;
Tj=25°C
On State; V
CC
=13V; VIN=5V; I
OUT
=0A
12
12
5
40
25
7
µA
µA
mA
I
L(off1)
Off State Output Current VIN=V
OUT
=0V 0 50 µA
I
L(off2)
Off State Output Current VIN=0V; V
OUT
=3.5V -75 0 µA
I
L(off3)
Off State Output Current VIN=V
OUT
=0V; Vcc=13V; Tj =125°C 5 µA
I
L(off4)
Off State Output Current VIN=V
OUT
=0V; Vcc=13V; Tj =25°C 3 µA
Symbol Parame ter Test Condit ions Min Typ Max Unit
t
d(on)
Turn-on Delay Time
RL=13from VIN rising edge to V
OUT
=1.3V
30 µs
t
d(off )
Turn-off Delay Time
RL=13from VIN falling edge to V
OUT
=11.7V
30 µs
dV
OUT
/
dt
(on)
Turn-on Voltage Slope
RL=13from V
OUT
=1.3V to
V
OUT
=10.4V
See
relative
diagram
V/µs
dV
OUT
/
dt
(off)
Turn-off Voltage Slop e
RL=13from V
OUT
=11.7V to
V
OUT
=1.3V
See
relative
diagram
V/µs
Symbol Param eter Test Conditions Min Typ Max Unit
V
IL
Input Low Level 1.25 V
I
IL
Low Level Input Current VIN = 1.25V 1 µA
V
IH
Input High Level 3.25 V
I
IH
High Level Input Current VIN = 3.25V 10 µA
V
hyst
Input Hyst eresis Voltage 0.5 V
V
ICL
Input Clamp Voltage
I
IN
= 1mA
I
IN
= -1mA
66.8
-0.7
8V
V
1
4/18
VND810SP
ELECTRICAL CHARACTERISTICS (continued)
STATUS PIN
PROTECTIONS
OPENLOAD DETECTION
Symbol Parameter Test Conditions Min Typ Max Unit
V
STAT
Status Low Output Voltage I
STAT
= 1.6 mA 0.5 V
I
LSTAT
Status Leakage Current Normal Operation; V
STAT
= 5V 10 µA
C
STAT
Status Pin Input Capacitance
Normal Operation; V
STAT
= 5V 100 pF
V
SCL
Status Clamp Voltage
I
STAT
= 1mA
I
STAT
= - 1mA
66.8
-0.7
8V
V
Symbol Parame ter Test Condit ions Min Typ Max Unit
T
TSD
Shut-down Temperature 150 175 200 °C
T
R
Reset Temp erature 135 °C
T
hyst
Ther ma l Hy steresi s 7 15 °C
t
sdl
Status Delay in Overload Conditions
Tj>T
TSD
20 µs
I
lim
Current limitation
5.5V<V
CC
<36V
3.5 5 7.5
7.5
A A
V
demag
Turn-off Output Clamp Voltage
I
OUT
=1A; L= 6m H VCC-41 VCC-48 VCC-55 V
Symbol Param eter Test Conditions Min Typ Max Unit
I
OL
Openload ON State Detectio n Threshold
V
IN
=5V 20 40 80 mA
t
DOL(on)
Openload ON State Detection Delay
I
OUT
=0A 200 µs
V
OL
Openload OFF State Voltage Detection Threshold
VIN=0V 1.5 2.5 3.5 V
t
DOL(off)
Openload Detection Delay at Turn Off
1000 µs
2
1
V
INn
V
STAT n
t
DOL(off)
OPEN LOAD STATUS TIMING (with external pull-up)
V
INn
V
STAT n
OVER TEMP STATUS TIMING
t
SDL
t
SDL
I
OUT
< I
OL
V
OUT
> V
OL
t
DOL(on)
Tj > T
TSD
5/18
VND810SP
1
t
t
V
OUTn
V
INn
80%
10%
dV
OUT
/dt
(on)
t
d(off)
90%
dV
OUT
/dt
(off)
t
d(on)
Switching time Waveforms
TRUTH TABLE
CONDITIONS INPUT OUTPUT STATUS
Normal Operation
L H
L
H
H H
Current Limitation
L H H
L X X
H
(T
j
< T
TSD
) H
(T
j
> T
TSD
) L
Overtemperature
L H
L
L
H
L
Undervoltage
L H
L
L
X X
Overvoltage
L H
L
L
H H
Output Voltage > V
OL
L H
H H
L
H
Output Current < I
OL
L H
L H
H
L
6/18
VND810SP
1
1
ELECTRICAL TRANS IENT REQUIREMENTS ON VCC PIN
ISO T/R 7637/1
Test Pulse
TEST LEVELS
I II III IV Delays and
Impedance
1 -25 V -50 V -75 V -100 V 2 ms 10
2 +25 V +50 V +75 V +100 V 0.2 ms 10 3a -25 V -50 V -100 V -150 V 0.1 µs 50 3b +25 V +50 V +75 V +100 V 0.1 µs 50
4 -4 V -5 V -6 V -7 V 100 ms, 0.01
5 +26.5 V +46.5 V +66.5 V +86.5 V 400 ms, 2
ISO T/R 7637/1
Test Pulse
TEST LEVELS RESULTS
IIIIIIIV
1CCCC
2CCCC 3aCCCC 3bCCCC
4CCCC
5CEEE
CLASS CONTENTS
C All functions of the device are perform e d as designe d after expos ure to distu rb ance. E One or more functions of the device is not performed as designed after exp osure and cannot be
returned to proper operation without rep lacing the device.
Loading...
+ 12 hidden pages