The M36W416TG is a low voltage Multiple Memory Product which combines two me mory devices;
a 16 Mbit boot block F lash memory and a 4 Mbit
SRAM. Recommended operating conditions do
not allow both the F lash memory and the S RAM
memory to be active at the same time.
The memory is offered in a Stacked LFBGA66
(12x8mm, 8 x 8 active ball, 0.8 mm pitch) package
and is supplied with all the bits erased (set to ‘1’).
Table 1. Signal Names
A0-A17Flash and SRAM Address Inputs
A18-A19Address Inputs for Flash Chip only
DQ0-DQ15Data Input/Output
V
DDF
V
DDQF
Flash Power Supply
Flash Power Supply for I/O Buffers
Figure 2. Logic Diagram
V
DDQF
V
M36W416TG
M36W416BG
A0-A19
E
G
W
RP
WP
E1
E2
G
W
UB
LB
V
DDF
20
F
F
F
F
F
S
S
S
S
S
S
PPF
V
DDS
16
DQ0-DQ15
V
V
V
V
PPF
SSF
DDS
SSS
Flash Optional Supply V oltage for Fast
Program & Erase
Figure 3. LFBGA Connections (Top view through package)
#4#387
NCNC
M36W416TG, M36W416BG
AI90254
NC
NCNCGF
654321#2#1
DDQF
V
SSF
V
A12
A13A11NCNCNC
A15A14
DQ7
DQ14
WS
DQ15A9A16
A8A10
DQ5
DQ4
DQ6DQ13NCWF
DDF
V
DDS
V
E2SDQ12V
RPF
SSS
DQ3DQ2
DQ10
DQ11A19WPF
PPF
V
DQ1DQ0
DQ8DQ9GSLBS
UBS
E1SA1
A2A3A6A7A18
A17
SSF
EFA0A4NCNC
A5
NCV
A
B
C
D
E
F
G
H
7/62
M36W416TG, M36W416BG
SIGNAL DESCRIPTION
See Figure 2 Logic Diagram and Table 1, Sign al
Names, for a brief overview of the signals connected to this de vice.
Address Inputs (A0-A17). Addresses A0-A17
are common inputs for the Flash an d the SRAM
components. The Address Inputs select the cells
in the memory array to access during Bu s Read
operations. During Bus Write operations they control the commands sent to the Command Interface
of the internal state machine. The Flash memory is
accessed through the Chip Enable (
Enable (W
) signals, while the SRAM i s acce sse d
F
through two Chip Enable ( ES
(W
) signals.
S
Address Inputs (A18-A19). Addresses A18-A19
are inputs for the Flash component only. The
Flash memory is acc essed through the Chip E n-
E
able (
) and Write Enable (WF) signals
F
Data Inputs/Outputs (DQ0-DQ15). The Data I/
O output the d ata stored at the selected addres s
during a Bus Read operation or in put a c om m and
or the data to be programmed durin g a Write Bus
operation.
E
Flash Chip Enable (
). The Chip Enable input
F
activates the Flash memory control logic, input
buffers, decoders and sense amplifiers. When
Chip Enable is at V
and Reset is at VIH the device
IL
is in active mode. When Chip Enable is at V
memory is deselected, the outputs are high impedance and the power consumption is reduced to the
standby level.
Flash Output Enable (G
). The Output Enable
F
controls the data outputs during the Bus Read operation of the Flash memory.
W
Flash Write Enable (
). The Write Enable con-
F
trols the Bus Write operation of the Flash m emory’s Command Interface. The data and address
inputs are latched on the rising e dge of Chip Enable,
E
, or Write Enable, WF, whichever occurs
F
first .
Flash Write Protect (WP
). Write Protect is an
F
input that gives an additional hardware protection
for each block. When Write Protect is at V
Lock-Down is enabled and the protection status of
the block cannot be changed. When Write Protect
is at V
, the Lock-Down is disabled and the block
IH
can be locked or unlocked. (refer to T able 6, Read
Protection Register and Protection Register Lock).
Flash Reset (RP
). The Reset input provides a
F
hardware reset of the Flash memory. When Reset
is at V
, the memory is in reset mode: the outputs
IL
are high impedance and the current c onsumption
is minimized. After Reset all blocks are in the
Locked state. When Reset is at V
in normal operation. Exiting reset mode the device
enters read array mode, but a negative t ransition
E
) and Write
F
) and Write Enable
the
IH
, the
IL
, the device is
IH
of Chip Enable or a change of the address is required to ensure valid data outputs.
SRAM Chip Enable (E1
, E2S). The Chip En-
S
able inputs activate the SRAM memory control
logic, input buffers and decoders. E1
E2
at VIL deselects the memory and reduces the
S
power consumption to the standby level. E1
can also be used to control writing to the
E2
S
SRAM memory array, while W
is not allowed to set
E2
at VIL at the same time.
S
SRAM Write Enable (W
E
at VIL and, E1S at VIL or
F
S
rema in s at V
S
). The Write Enable in-
at VIH or
S
S
IL.
or
It
put controls writing to the SRA M memory array.
is active low .
W
S
SRAM Output E nable (G
). The Output Enable
S
gates the outputs through the data buffers during
a read operation of the SRAM m emory. G
is ac-
S
tive low.
SRAM Upper Byte Enable (UB
). The Upper
S
Byte Enable enables the upper bytes for SRAM
(DQ8-DQ15). UB
SRAM Lower Byte Enable (LB
is acti v e low.
S
). The Lower
S
Byte Enable enables the lower bytes for SRAM
(DQ0-DQ7). LB
and V
V
DDF
is active low.
S
Supply Voltages. V
DDS
DDF
provides the power supply to the internal core of the
Flash Memory device. It is the main power s upply
for all operations (Read, Program and Erase).
and V
V
DDQF
provides the power supply for the Flash
V
DDQF
memory I/O pins and V
Supply Voltage (2.7V to 3.3V).
DDS
provides the power
DDS
supply for t he SRAM control pins. This a llows all
Outputs to be powered independently of the Flash
core power supply, V
V
DDS.
V
Program Supp ly Vol tage. V
PPF
DDF
. V
can be tied to
DDQF
PPF
is both a
control input and a power suppl y pin for t he F lash
memory. The two functions are selected by the
voltage range applied to the pin. The Supply Voltage V
and the Program Supply Vol tage V
DDF
PPF
can be applied in any order.
If V
V
age lower than V
against program or erase, while V
is kept in a low voltage range (0V t o 3.6V)
PPF
is seen as a control input. In this case a volt-
PPF
gives an absolute protection
PPLK
PPF
> V
PP1
enables these functions (see Table 6, DC Characteristics for the relevant values). V
is only
PPF
sampled at the beginning of a program or erase; a
change in its value after the operation has started
does not have any effect and program or erase operations continue.
If V
power supply pin. In this condition V
is in the range 11.4V to 12.6V it acts as a
PPF
PPF
must be
stable until the Program/Erase algorithm i s completed (see Table 19 and 20).
8/62
M36W416TG, M36W416BG
V
SSF
and V
Ground. V
SSS
SSF
and V
SSS
are the
ground reference for all voltage measurements in
the Flash and SRAM chips, respectively.
Note: Each device in a system should have V
DF
, V
DDQF
and V
decoupled with a 0.1µF ca-
PPF
D-
FUNCTIONAL DESCRIPTION
The Flash and SRAM components have separate
power supplies and grounds and are distinguished
E
by three chip enable inputs:
ory and E1
and E2S for the SRAM.
S
for the Flash mem-
F
Recommended operating conditions do not allow
both the Flash and the SRAM to be in active mode
at the same time. The most common example is
Figure 4. Func ti onal Block Di a gram
V
DDF
E
F
G
F
W
F
RP
WP
F
F
Flash Memory
16 Mbit (x16)
pacitor close to the pin. See Figure 9, AC
Measurement Load Circuit. The PCB trace
widths should be sufficient to carry the required V
program and erase currents.
PPF
simultaneous read operations on the Flash and
the SRAM which would resul t in a data bus contention. Therefore it is recommended to put the
SRAM in the h igh impedance state whe n reading
the Flash and vice versa (see Table 2 Main Operation Modes for details).
V
DDQF
V
PPF
A18-A19
A0-A17
E1
E2
G
W
UB
LB
V
V
DDS
S
S
S
S
S
S
SRAM
4 Mbit (x16)
V
SSS
SSF
DQ0-DQ15
AI07941
9/62
M36W416TG, M36W416BG
Table 2. Main Operation Modes
Operation
Mode
Read
Write
Block
Locking
Standby
Flash Memory
ResetXXX
Output
Disable
E
FGFWF
V
ILVILVIHVIH
V
ILVIHVILVIH
V
XX
IL
V
XX
IH
V
ILVIHVIHVIH
Flash must be disabled
Read
Flash must be disabled
Flash must be disabled
Flash must be disabled
Write
Flash must be disabled
Flash must be disabled
Standby/
Power
SRAM
Down
Data
Retention
Any Flash mode is allowable
Any Flash mode is allowable
Any Flash mode is allowable
Output
Disable
Any Flash mode is allowable
Any Flash mode is allowable
Note: X = Don’t care = VIL or VIH, V
RPFWP
V
IH
V
IH
V
IL
= 12V ± 5%.
PPFH
V
F
PPF
E1SE2SGSWSUBSLB
DQ7-DQ0 DQ15-DQ8
S
XDon’t careSRAM must be disabledData Output
V
or
X
V
DDF
V
PPFH
Don’t careSRAM must be disabledX
IL
SRAM must be disabledData Input
XDon’t careAny SRAM mode is allowedHi-Z
XDon’t careAny SRAM mode is allowedHi-Z
XDon’t careAny SRAM mode is allowedHi-Z
V
ILVIHVILVIHVIL
V
ILVIHVILVIHVIHVIL
V
ILVIHVILVIHVIL
V
ILVIH
V
ILVIH
V
ILVIH
V
IHVIL
XVILV
XVILV
XVILV
XXXXHi-Z
XXXX
V
IHVIL
XXXXHi-Z
XXXX
V
ILVIHVIHVIHVIL
V
ILVIHVIHVIHVIHVIL
V
ILVIHVIHVIHVIL
IL
IHVIL
IL
V
IHVIH
V
IHVIH
V
Data out Word Read
IL
Data outHi-Z
V
V
Hi-ZData out
IH
Data in Word Write
IL
Data inHi-Z
V
V
V
Hi-ZData in
IH
IL
IH
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
10/62
MAXIMUM RATIN G
Stressing the device above the rating l isted in the
Absolute Maximum Ratings table m ay cause permanent damage to the device. These are stress
ratings only and operation of the device at t hese or
any other conditions ab ove those i ndicated in t he
Operating sections of this specificat ion is not im-
Table 3. Absolute Maximum Ratings
SymbolParameter
T
A
T
BIAS
T
STG
V
IO
V
, V
DDF
DDQF
V
PPF
V
DDS
Note: 1. Depends on range.
Ambient Operating Temperature
Temperature Under Bias–40125°C
Storage Temperature–55150°C
Input or Output Voltage–0.5
Flash Supply Voltage–0.53.8V
Program Voltage–0.613V
SRAM Supply Voltage–0.53.8V
(1)
M36W416TG, M36W416BG
plied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics
SURE Program and other relevant quality documents.
Value
MinMax
–4085°C
V
+0.3
DDQF
Unit
V
11/62
M36W416TG, M36W416BG
DC AND AC PARAMETERS
This section summarizes the operat ing and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are derived from tests performed under the Measure-
Table 4. Operating and AC Measurement Conditions
ment Conditions summarized in Table 4,
Operating and AC Measurem ent Conditions. Designers should check that the operating conditions
in their circuit match the measurement conditions
when relying on the quoted parameters.
PART NUMBERING
Table 8. Ordering Information Scheme
Example:M36W416 TG 70 ZA 6T
Device Type
M36 = MMP (Flash + SRAM)
Operating Voltage
W = V
SRAM Chip Size & Organization
4 = 4 Mbit (256Kb x 16 bit)
Flash Chip Size & Organization
16 = 16 Mbit (x16), Boot Block
Array Matrix
T = Top Boot
B = Bottom Boot
SRAM Component
G = 4Mb, 0.16µm, 70ns, 3V
= 2.7V to 3.3V, V
DDF
DDS
= V
= 2.7V to 3.3V
DDQF
Speed
70 = 70ns
85 = 85ns
Package
ZA = LFBGA66: 12x8mm, 0.8mm pitch
Temperature Range
1 = 0 to 70°C
6 = –40 to 85°C
Option
T = Tape & Reel packing
Devices are shipped from the factory with the memory content bits erased to ’1’.
Table 9. Daisy Chain Ordering Scheme
Example:M36W416TG-ZA T
Device Type
M36W416TG
Daisy Chain
-ZA = LFBGA66: 12x8mm, 0.8mm pitch
Option
T = Tape & Reel Packing
For a list of available options (Speed, Package, etc.) or for further information on any aspect of this device,
please contact the STMicroelectronics Sales Office nearest to you.
18/62
FLASH DEVICE
The M36W416TG contains one 16 Mbit Flash
memory. This section describes how to use the
FLASH SUMMARY DESCRIPTION
The Flash Memory is a 16 Mb it (1 Mb it x 16) nonvolatile device that can be erased electrically at
the block level and prog rammed in-system on a
Word-by-Word basis. These operations can be
performed using a single low voltage (2.7 to 3.6V)
supply. V
1.65V. An optional 12V V
vided to speed up customer programming.
The device features an asymmetrical blocked architecture with an array of 39 blocks: 8 Parameter
Blocks of 4 KWords and 31 Main Blocks of 32
KWords. The M36W416TG has the Parameter
Blocks at the top of the memory address space
while the M36W416BG locates the Parameter
Blocks starting from the bottom. The memory
maps are shown in Figure 10, Block Addresses.
The Flash Memory features an instant, individual
block locking scheme that allows any block to be
locked or unlocked with no latency, enabling instant code and data protection. All blocks have
three levels of protection. They can be locked and
locked-down individually preventing any accidental programming or erasure. There is an additional
hardware protection against program and erase.
When V
against program or erase. All blocks are locked at
Power Up.
is used to drive the I/O pin down to
DDQF
PPF
≤ V
PPLK
power supply is pro-
PPF
all blocks are protected
M36W416TG, M36W416BG
Flash device and all signals refer to the Flash device .
Each block can be erased separately. Erase can
be suspended in order to perform either read or
program in any other block and then resumed.
Program can be suspended to read data in any
other block and then resumed. Each block can be
programmed and erased over 100,000 cycles.
The device includes a 128 b it Protection Register
and a Security Block to increase the protection of
a system design. The Protection Register is divided into two 64 bit segments, the first one contains
a unique device number written by ST, while the
second one is one-time-programmable by the user. The user programmable segm ent can be permanently protected. The Security Block,
parameter block 0, can be permanentl y protected
by the user. Figure 11, shows the Flash Security
Block Memory Map.
Program and Erase command s are written to the
Command Interface of the memory. An on-chip
Program/Erase Controller takes care of the timings necessary for program and erase operations.
The end of a program or erase operation can be
detected and any error conditions identified. The
command set required to control the memory is
consistent with JEDEC standards.
19/62
Loading...
+ 43 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.