SGS Thomson Microelectronics M27W101 Datasheet

M27W101

1 Mbit (128Kb x8) Low Voltage UV EPROM and OTP EPROM

■ 2.7V to 3.6V LOW VOLTAGE in READ

OPERATION

■ ACCESS TIME:

–70nsatVCC= 3.0V to 3.6V –80nsatVCC= 2.7V to 3.6V

■ PIN COMPATIBLE with M27C1001

■ LOW POWER CONSUMPTION:

– Active Current 15mA at 5MHz – Standby Current 15µA

■ PROGRAMMING TIME 100µs/byte

■ HIGH RELIABILITY CMOS TECHNOLOGY

– 2,000V ESD Protection – 200mA Latchup Protection Immunity

■ ELECTRONIC SIGNATURE

– Manufacturer Code: 20h – Device Code: 05h

DESCRIPTION

The M27W101 is a low voltage 1 Mbit EPROM offered intwo range UV (ultra violet erase) and OTP (one timeprogrammable).Itisideallysuitedfor microprocessor systems requiring large data or program storage and is organized as 131,072 by 8 bits.

The M27W101 operates in the read mode with a supply voltage aslow as 2.7V at –40to 85 °Ctemperature range.

The decrease in operating power allows either a reduction of the size of the battery or an increase in the time between battery recharges.

The FDIP32W (window ceramic frit-seal package) has a transparent lid which allows the user to expose the chipto ultraviolet lightto erase the bit pattern. A new pattern can then be written to the device by following the programming procedure.

For application where the content is programmed only one time and erasure is not required, the M27W101 is offered in PDIP32, PLCC32 and TSOP32 (8 x 20 mm) packages.

32

1

FDIP32W (F) PDIP32 (B)

PLCC32 (K) TSOP32 (N)

Figure 1. Logic Diagram

V

17

A0-A16

P

E

G

32

V

CC

M27W101

V

SS

1

8 x 20 mm

PP

8

Q0-Q7

AI01587

1/15April 2000

M27W101

Figure 2A. DIP Connections

V

1

PP

2

A15

3

A12

4

A7

5

A6

6

A5

7

A4

8 A3 A2 A1 A0

Q0

Q2 SS

M27W101

9

10

11

12

13

14

15

16

32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17

AI02674

V

CC

PA16 NC A14 A13 A8 A9 A11 G A10 E Q7 Q6 Q5Q1 Q4 Q3V

Figure 2B. LCC Connections

A16

A7 A6 A5 A4 A3 A2 A1 A0

Q0

A12

9

Q1

VPPV

A15

1

32

M27W101

17

Q2

Q3

SS

V

Q4

CC

P

Q5

NC

25

Q6

A14 A13 A8 A9 A11 G A10 E Q7

AI01588

Figure 2C. TSOP Connections

A11 G

A9

A8 A13 A14

NC

V

CC

V

PP

A16 A15 A12

A7

A6

A5

A4 A3

1

P

M27W101

8

(Normal)

9

16 17

32

25 24

AI01589

A10 E Q7 Q6 Q5 Q4 Q3 V

SS

Q2 Q1 Q0 A0 A1 A2

Table 1. Signal Names

A0-A16 Address Inputs

Q0-Q7 Data Outputs

E Chip Enable

G Output Enable

P Program

V

PP

V

CC

V

SS

NC Not Connected Internally

Program Supply

Supply Voltage

Ground

2/15

M27W101

Table 2. Absolute Maximum Ratings

(1)

Symbol Parameter Value Unit

T

A

T

BIAS

T

STG

(2)

V

IO

V

CC

(2)

V

A9

V

PP

Note: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings” may

cause permanent damage to the device. These are stress ratings only and operation of the device at theseor any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affectdevice reliability. Referalso to theSTMicroelectronics SUREProgram andother relevant quality documents.

2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC voltage on Output is V

3. Depends on range.

Ambient Operating Temperature Temperature Under Bias –50 to 125 °C Storage Temperature –65 to 150 °C

Input or Output Voltage (except A9) –2 to 7 V Supply Voltage –2 to 7 V A9 Voltage –2 to 13.5 V Program Supply Voltage –2 to 14 V

+0.5V with possible overshoot to VCC+2V for a period less than 20ns.

CC

(3)

–40 to 85 °C

Table 3. Operating Modes

Mode E G P A9

Read Output Disable V Program Verify V Program Inhibit Standby Electronic Signature

Note: X = VIHor VIL,VID= 12V ± 0.5V.

V

IL

V

IL

V

IH

V

IH

V

IL

V

IL

V

IH

V

IH

V

IL

X

XX XXV

VILPulse

V

IH

X XVPPData Out

XX

XXX

V

IL

V

IH

V

ID

V

PP

V

or V

CC

SS

or V

CC

SS

V

PP

V

PP

V

or V

CC

SS

V

CC

Q7-Q0

Data Out

Hi-Z

Data In

Hi-Z Hi-Z

Codes

Table 4. Electronic Signature

Identifier A0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Hex Data

Manufacturer’s Code Device Code

V

IL

V

IH

00100000 20h 00000101 05h

3/15

M27W101

Table 5. AC Measurement Conditions

High Speed Standard

Input Rise and Fall Times ≤ 10ns ≤ 20ns Input Pulse Voltages 0 to 3V 0.4V to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V

Figure 3. AC Testing Input Output Waveform

High Speed

3V

1.5V

0V

Standard

2.4V

0.4V

Table 6. Capacitance

Symbol Parameter Test Condition Min Max Unit

C

IN

C

OUT

Note: 1. Sampled only, not 100% tested.

Input Capacitance Output Capacitance

(1)

(TA=25°C, f = 1 MHz)

2.0V

0.8V

AI01822

Figure 4. AC Testing Load Circuit

1.3V

1N914

3.3kΩ

DEVICE UNDER

TEST

C

L

CL= 30pFfor High Speed CL= 100pF for Standard CLincludes JIG capacitance

V

IN

OUT

=0V

6pF

12 pF

OUT

AI01823B

DEVICE OPERATION

The operating modes of theM27W101arelisted in the Operating Modes table. A single power supply is required in the read mode. All inputs are TTL levels except for VPPand 12V on A9 for Electronic Signature.

Read Mode

The M27W101 has two control functions, both of which must be logically active in order to obtain data at the outputs. Chip Enable (E) is the power control and should be used for device selection. Output Enable(G)is the output control and should be used to gate data to the output pins, independent of device selection. Assuming that the addresses are stable, the address access time

4/15

(t

) is equal to the delay from E to output

AVQV

(t

). Data is available attheoutputaftera delay

ELQV

of t

from the falling edge of G, assuming that

GLQV

E has been low and the addresses havebeen stable for at least t

AVQV-tGLQV

.

Standby Mode

The M27W101 has a standby mode which reduces the supply current from 15mA to 15µA with low voltage operation VCC≤ 3.6V, see Read Mode DC Characteristics table for details. The M27W101 is placed in the standby mode by applying a CMOS high signal to the E input. When in the standby mode, the outputs are in a high impedance state, independent of the G input.

M27W101

Table 7. Read Mode DC Characteristics

(1)

(TA= –40 to 85°C; VCC= 2.7V to 3.6V; VPP=VCC)

Symbol Parameter Test Condition Min Max Unit

I

CC

I

CC1

I

CC2

I V

V

IH

V

Note: 1. VCCmust be applied simultaneously with or before VPPand removed simultaneously or after VPP.

Input Leakage Current

LI

Output Leakage Current

LO

Supply Current

Supply Current (Standby) TTL

Supply Current (Standby) CMOS

Program Current

PP

Input Low Voltage –0.6

IL

(2)

Input High Voltage Output Low Voltage

OL

Output High Voltage TTL

OH

2. Maximum DC voltage on Output is V

CC

+0.5V.

I

OUT

0V ≤ V

E=V

E>V

I

OH

≤ V

IN

CC

≤ V

OUT

IL

= 0mA, f = 5MHz,

V

CC

E=V

CC

V

CC

V

PP=VCC

I

= 2.1mA

OL

= –400µA

CC

,G=VIL,

≤ 3.6V

IH

– 0.2V,

≤ 3.6V

±10 µA ±10 µA

15 mA

1mA

15 µA

10 µA

0.2 V

CC

0.7 V

CCVCC

2.4 V

+ 0.5

0.4 V

V V

Two Line Output Control

Because EPROMs are usually used in larger memory arrays, this product features a 2 line control function which accommodates the use of multiple memory connection.

The two line control function allows: a. the lowest possible memory power dissipation, b. complete assurance that output bus contention

will not occur.

For the most efficient use of these two control lines, Eshould be decoded and used as the primary device selecting function, while G should be made a common connection to all devices in the array and connected to the READ line from the system controlbus. This ensures that all deselected memory devices are in their low power standby mode and that the output pins are only active when data is required from a particular memory device.

System Considerations

The power switching characteristics of Advanced CMOS EPROMs require careful decoupling of the devices. The supply current, ICC, has three segments that are of interest to the system designer: the standby current level, the active current level, and transient current peaks that are produced by the falling and rising edges of E. The magnitude of the transient current peaks is dependent on the capacitive and inductive loading of the device at the output. The associatedtransientvoltagepeaks can be suppressed by complying with the two line outputcontrolandbyproperlyselected decoupling capacitors.It is recommended that a 0.1µFceramic capacitor be used on every device between V

CC

and VSS. This should be a high frequency capacitor of low inherent inductance and should be placed as close to the device as possible. In addition, a 4.7µF bulk electrolytic capacitor should be used between VCCand VSSfor every eight devices. The bulk capacitor should be located near the power supply connection point. The purposeofthe bulk capacitor is to overcome the voltage drop caused by the inductive effects of PCB traces.

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