SGS Thomson Microelectronics HCF4042B Datasheet
.CLOCKPOLARITY CONTROL
.Q ANDQ OUTPUTS
.COMMON CLOCK
.LOW POWER TTL COMPATIBLE
.STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
.QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
.5V, 10V, AND 15V PARAMETRIC RATINGS
.INPUT CURRENT OF 100nAAT 18V AND 25°C
FOR HCC DEVICE
.100% TESTEDFOR QUIESCENTCURRENT
.MEETSALLREQUIREMENTSOFJEDECTEN-
TATIVESTANDARDN°13A,”STANDARDSPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIESCMOS DEVICES”
HCC/HCF4042B
QUAD CLOCKED ”D” LATCH
EY
(PlasticPackage)
M1
(MicroPackage)
ORDER CODES :
HCC4042BF HCF4042BM1
HCF4042BEY HCF4042BC1
(Ceramic Package)
(Plastic Chip Carrier)
F
C1
DESCRIPTI ON
TheHCC4042B (extended temperature range) and
HCF4042B (intermediate temperature range) are
monolithic integrated circuit, available in 16-lead
dual in-line plastic or ceramic package and plastic
micro package.
The HCC/HCF4042B types contain four latch cir-
cuits, each strobed by a common clock. Complementary buffered outputs are available from
eachcircuit. Theimpedanceofthen-andp-channel
outputdevicesis balanced and all outputsare electricallyidentical.
Information presentat the data inputis transferred
to outputs Q and Q during the CLOCK level which
is programmed by the POLARITY input. For POLARITY= 0thetransferoccursduring the 0 CLOCK
levelandfor POLARITY= 1 thetransfer occurs during the 1 CLOCK level. The outputs follow the data
input providing the CLOCK and POLARITY levels
defined above arepresent. When aCLOCK transitionoccurs (positive forPOLARITY=0andnegative
for POLARITY = 1) the information present at the
inputduring the CLOCKtransition is retainedat the
outputs until an opposite CLOCK transition occurs.
PIN CONNECTIONS
June1989
1/13
HCC/HCF4042B
FUN CTIONAL DIAG R A M
ABSOLUTE MAXIMUM RATIN G S
Symbol Parameter Value Unit
V
* Supply Voltage :HC C Types
DD
HCF Types
V
Input Voltage – 0.5 to VDD+ 0.5 V
i
I
DC Input Current (any one input) ± 10 mA
I
P
Total Power Dissipation (per package)
tot
– 0.5 to + 20
– 0.5 to + 18
200
V
V
mW
Dissipation per Output Transistor
for T
T
T
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to VSSpin voltage.
Operating Temperature : HCC Types
op
Storage Temperature – 65 to + 150 °C
stg
= Full Package-temperature Range
op
HCF Types
100
– 55 to + 125
–40to+85
mW
°C
°C
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
V
T
Supply Voltage:HCC Types
DD
HCF Types
V
Input Voltage 0 to V
I
Operating Temperature : HC C Types
op
HCF Types
3to18
3to15
DD
–55to+125
–40to+85
V
V
V
°C
°C
2/13
LOGI C BL OCK DI A GRA M AND TR UTH TAB LE
HCC/HCF4042B
Clock Polari ty Q
00D
__
__ 0 Latch
/
11D
__
__ 1 Latch
\
STATIC ELECTRICAL CHARACTERISTICS (over recommended operatingconditions)
Test Conditions Valu e
Symbol Parameter
Quiescent
I
L
Current
HCC
Types
HCF
Types
V
OH
Output High
Voltage
V
OL
Output Low
Voltage
V
IH
Input High
Voltage
*T
=–55°CforHCC device : – 40°CforHCF device.
Low
*T
= + 125°CforHCC device : + 85°CforHCF device.
High
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD= 5V, 2V min. with VDD= 10V, 2.5V min. with VDD= 15V.
V
V
O
|IO|V
I
(V) (V) (µA) (V)
T
DD
* 25°CT
Low
Min. M ax. Min. Typ. Max. Min. Max.
High
*
0/ 5 5 1 0.02 1 30
0/10 10 2 0.02 2 60
0/15 15 4 0.02 4 120
0/20 20 20 0.04 20 600
0/5 5 4 0.02 4 30
0/10 10 8 0.02 8 60
0/15 15 16 0.02 16 120
0/ 5 < 1 5 4.95 4.95 4.95
0/10 < 1 10 9.95 9.95 9.95
0/15 < 1 15 14.95 14.95 14.95
5/0 < 1 5 0.05 0.05 0.05
10/0 < 1 10 0.05 0.05 0.05
15/0 < 1 15 0.05 0.05 0.05
0.5/4.5 < 1 5 3.5 3.5 3.5
1/9 < 1 10 7 7 7
1.5/13.5 < 1 15 11 11 11
Unit
µA
V
V
V
3/13
HCC/HCF4042B
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions Valu e
Symbol Parameter
V
IL
Input Low
Voltage
V
V
O
|IO|V
I
(V) (V) (µA) (V)
T
DD
* 25°CT
Low
Min. M ax. Min. Typ. Max. Min. Max.
4.5/0.5 < 1 5 1.5 1.5 1.5
9/1 < 1 10 3 3 3
High
13.5/1.5 < 1 15 4 4 4
I
OH
Output
Drive
Current
HCC
Types
0/ 5 2.5 5 – 2 – 1.6 – 3.2 – 1.15
0/ 5 4.6 5 – 0.64 – 0.51 – 1 – 0.36
0/10 9.5 10 – 1.6 – 1.3 – 2.6 – 0.9
0/15 13.5 15 – 4.2 – 3.4 – 6.8 – 2.4
0/ 5 2.5 5 – 1.53 – 1.36 – 3.2 – 1.1
HCF
Types
0/ 5 4.6 5 – 0.52 – 0.44 – 1 – 0.36
0/10 9.5 10 – 1.3 – 1.1 – 2.6 – 0.9
0/15 13.5 15 – 3.6 – 3.0 – 6.8 – 2.4
I
OL
Output
Sink
Current
HCC
Types
0/ 5 0.4 5 0.64 0.51 1 0.36
0/10 0.5 10 1.6 1.3 2.6 0.9
0/15 1.5 15 4.2 3.4 6.8 2.4
0/ 5 0.4 5 0.52 0.44 1 0.36
HCF
Types
0/10 0.5 10 1.3 1.1 2.6 0.9
0/15 1.5 15 3.6 3.0 6.8 2.4
I
IH,IIL
*T
Low
*T
High
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD= 5V, 2V min. with VDD= 10V, 2.5V min. with VDD=15V.
Input
leakage
Curent
Input Capacitance Any Input 5 7.5 pF
C
I
=–55°CforHCC device : – 40°C for HCF device.
= + 125°CforHCC device : + 85°CforHCF device.
HCC
Types
HCF
Types
0/18
0/15
Any Input
18
± 0.1
±10
15 ± 0.3 ±10
-5
± 0.1 ± 1
-5
± 0.3 ± 1
Unit
*
mA
mA
V
µA
DYNAMIC ELECTRICAL CHARACTERISTICS (T
=25°C, CL= 50pF, RL= 200kΩ,
amb
typical temperature coefficient for all VDDvalues is 0.3%/°C, all input rise and fall times = 20ns)
Symbol Parameter
t
PLH,tPHL
Propagation Delay
Time
4/13
Data in to Q 5 110 220
Data in to Q 5 150 300
Clock to Q 5 225 450
Clock to Q 5 250 500
Test Conditions Value
V
( V) Min. Typ. Max.
DD
10 55 110
15 40 80
10 75 150
15 50 100
10 100 200
15 80 160
10 115 230
15 90 180
Unit
ns
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