New products (2005.01~) are show n in blue.
Environmentally friendly tantalum chip capacitors w ith lead-f ree terminal/Conform to RoHS
SCL Series
Page 5
RELIABILITY TEST CONDITION
NOITEMSTEST CONDITIONPERFORMANCE
RATED D C VOLTAGE
1
-55℃ ~ +85℃
2.5∼35V
2
3
4
CAPACITANCE
TANGENT OF LOSS
ANGLE
LEAKAGE CURRENT
MEASURING FREQUENCY : 120±12Hz
MEASURING VOLTAGE : 0. 5Vrms + 0.5∼2V DC
MEASURING CIRCUITS : EQUIVALENT SERIES
CIRCUIT
MEASUREMENT SHALL BE MADE UNDER THE
SAMECONDITIONSASTHOSEGIVENFORTHE
MEASUREMENT OF CAPACITANCE.
THE RATED DC VOLTAGE SHALL BE APPLIED
TO TERMINALS ACROSS THE TEST CAPACITOR
Cx, BY THE METHOD AS SHOWN BELOW. THE
LEAKAGE CURRENT SHALL THEN BE
MEASURED AFTER CHARGE FOR 5 MIN.
MEASURING CIRCUITS
S2
R
S
A
+
C
-
x
+
S
1
V
-
CAPACITANCE RANGE
0.1∼330
TOLERANCE ON CAP.
±
0.01CV or 0.5
WHICHEVER IS GREATER
㎌
10%,±20%
㎂
SCL Series
WHERE
RS: STANDARD RESISTOR(PROTECTIVE R :1KΩ)
: DC VOLTMETER OR ELECTRONIC
V
VOLTMETER
S1 : DC POWER SUPPLY SWITCH
S2 : PROTECTIVE SWITCH FOR A AMMETER
: TEST CAPACITOR
C
X
: DC AM-METER FOR LEAKAGE CURRENT
A
AC VOLTAGE(0.5Vrms OR LESS) OF A
FREQUENCY SPECIFIED ON NEXT PAGE SHALL
BE APPLIED AND THE VOLTAGE DROP
ACROSS CAPACITOR TERMINALS SHALL BE
MEASURED
THE IMPEDANCE SHALL BE CALCULATED BY
5
IMPEDENCE
THE FOLLOWI NG EQUATION.
WHERE
Impedance Z
E : VOLTAGE DROP ACROSS THE CAPACITOR
TERMINALS
I : CURRENT FLOWING THROUGH THE
CAPACITOR(FREQUENCY : 100±10kHz)
E
=
I
Page 6
NOITEMSTEST CONDITIONPERFORMANCE
THE CAPACITOR SHALL BE SUBJECTED IN TURN TO PROCEDURES SPECIFIED
BELOW
TEMPERATURE
6
STABILITY
CHANGE IN
STEPTEMP.DURATION
125±2
22HOURS.
-55
℃
0
℃
-3
+3
0
+3
℃
25 MIN .
℃
℃
0
325±2
42HOURS.
+85
52HOURS.
+125
THE CAPACITOR SHALL BE SUBJECTED TO THE SURGE
VOLTAGE AS SPECIFIED ON NEXT PAGE IN A CYCLE OF 6
0.5 MIN. WHICH CONSISTS OF 30±5 SEC. FOLLOWED BY A
DISCHARGE PERIOD OF APPROX. 5 MIN 30 SEC. AT A
TEMPERATURE OF +85℃FOR 1,000 CYCLES.
AND THE CAPACITOR SHALL BE STORED UNDER
STANDARD ATMOSPHERIC CONDITIONS TO OBTAI N
THERMAL EQUILIBRIUM AFTER MEASUREMN\ENT.
MEASURING CIRCUIT
CAPACITANCE
(ΔC)
WITHIN
SPECIFIED
TOLERANCE
-10TO0%OF
INITIAL VALUE
0 TO +10% OF
INITIAL VALUE
0 TO +12% OF
INITIAL VALUE
TANGENT OF
LOSS ANGLE
(D.F.)
TABLE 1 ON
PAGE 13
TABLE 1 ON
PAGE 13
TABLE 1 ON
PAGE 13
TABLE 1 ON
PAGE 13
LEAKAGE
CURRENT
WIT HIN
ORIGINAL
LIMIT
N/A
WIT H IN 10X
ORIGINAL
LIMIT
WITHIN 12.5X
ORIGINAL
LIMIT
SCL Series
±
SURGE TEST
7
+
V
R1
S
+
-
WHERE
R1 : PROTECTIVE SERIES RESISTOR ( 3 3Ω)
R2 : DISCHARGE RESISTOR( 3 3Ω)
Cx : TEST CAPACITOR
V:DCVOLTAGE
S:SWITCH
RATED VOLTAGE 2.5V 4V 6.3V 10V 16V 20V 25 V 35 V
SURGE VOLTAGE 3.1V 5V8V13V 20 V 26V 32V 45V
R2
Cx
-
Page 7
NOITEMSTEST CONDITIONPERFORMANCE
WHEN OPERATING AT HIGH TEMPERATURE RANGE FROM 85℃to 125℃,THE
OPERATION SHALL BE CARRIED OUT AT A DERATED VOLTAGE OR LESS
DERATING VOLTAGE Vt AT ANY TEMPERATURE BETWEEN 85℃AND 125
SHALL BE CALCULATED BY THE FOLLOWING EQUATION
℃
8
9
DERATING
VOLTAGE
ELECTRODE
(TERMINAL
STRENGTH)
VOLTAGE
DERATING %
100
80
60
40
20
0
-550 2085125
OPERATING TEMPERATURE
Vr Vd
Vr
=−
WHERE Vt : DERATED VOLTAGE AT ANY TEMP. BETWEEN 85℃to 125
Vr : RATED VOLTAGE
Vd : DERATED VOLTAGE AT 125
APPLY PRESSURE IN THE DIRECTION OF THE
ARROW AT A RATE OF ABOUT 0.5MM/SEC. UNTIL IT
REACHES A BENT WIDTH OF 3MM AND HOLD FOR 30
SEC. THE TEST BOARD SHALL BE
OTHER PROCEDURES REFER TO
−
T
−4085()
Pressure rod
10
20
℃
IEC 40(S) 541
IEC 40(S) 541
Board
.FOR
.
THERE SHALL BE NO
EVIDENCE OF
MECHANICAL DAMAGE.
ELECTRICAL
CHARACTERISTICS
SHALL SATISFY THE
INITIAL REQUIREMENT.
IF THERE ARE
ELECTRODES ON BOTH
SURFACES, IT SHALL
SATISFY THE ABOVE
REQUIREMENT ON
WHICHEVER SURFACE
IT MAY BE FIXATED ON.
℃
SCL Series
45±245
±
2
Page 8
NOITEMSTEST CONDITIONPERFORMANCE
10
ADHESION
(ELECTRODE
PEELING
STRENGTH)
A STATI C LAOD OF 19.6N USING A R0.5 SCRATCH
TOLL SHALL BE APPLIED ON THE CORE OF THE
COMPONENT AND IN THE DIRECTION OF THE ARROW
AND HOLD FOR 5 SEC. THE TEST BOARD SHALL BE
IEC 40(S)541
BE G-10 or FR-4 (ANSI GRADE)
. HOWEVER THE BASE MATERIAL SHALL
Board
Scratch tool
R0.5
THERE SHALL BE NO
EVIDENCE OF
MECHANICAL DAMAGE.
ELECTRICAL
CHARACTERISTICS
SHALL SATISFY THE
INITIAL REQUIREMENT.
IF THERE ARE
ELECTRODES ON BOTH
SURFACES, IT SHALL
SATISFY THE ABOVE
REQUIREMENT ON
WHICHEVER SURFACE
IT MAY BE FIXATED ON.
11
CORE BODY
STRENGTH
Chip
Chip
A ROD OF 9.8N USING A R0.5 PRESSURE ROD SHALL
BE APPLIED TH THE CENTER IN THE DIRECTION OF
THE ARROW AND HOLD FOR 10 SEC
Pressure
R0.5
Chip
W
0.5L
L
L>W
SCL Series
THERE SHALL BE NO
EVIDENCE OF
MECHANICAL DAMAGE.
ELECTRICAL
CHARACTERISTICS
SHALL SATISFY THE
INITIAL REQUIREMENT.
Page 9
NOITEMSTEST CONDITIONPERFORMANCE
℃
MORE THAN 95% OF THE
TERMINAL SURFACE MUST BE
SOLDERED NEWLY.
CHANGE IN CAPACITANCE :
±5% OF INITIAL VALUE
TANGENT OF LOSS ANGLE :
LEAKAGE CURRENT :
APPEARANCE :
THERE SHALL BE NO EVIDENCE
OF MECHANICAL DAMAGE. .
Change in capacitance:
±10% of initial value
Tangent of loss angle:
Leakage Current :
SOLDERABILITY
12
13
[Pb-free]
RESISTANCE
TO SOLDERING
HEAT
SOLDER TEMPERATURE : 245±5
DIP TIME : 3±0.5 SEC.
SOLDER : Sn-3Ag-0.5Cu
FLUX : ROSIN(KSM2951)+Solvent(ISA)
(ROSIN 25WT%)
PREHEAT : 100∼110℃FOR 30 SEC.
TEMPERATURE : 260±5
DIP TIME : 10 ±1 SEC
ALL SAMPLES SHALL BE DIPPED IN SOLDER
BATH. MEASUREMENT SHALL BE MADE AT
ROOM TEMPERATURE AFTER 1~2 HOURS OF
COOLING TIME.
CONVECTION REFLOW
PREHEAT : 150∼190℃FOR 130 SEC.
PEAK TEMPERATURE : 260±5℃FOR 10 SEC.
METHOD : SAMPLES SHALL BE PASSED
REFLOW 3 TIMES.
MEASUREMENT SHALL BE MADE AT ROOM
TEMPERATU RE AFTER 3∼4HOURSOF
COOLING TIME.
℃
SCL Series
14
15
RESISTANCE
TO
CLEAN TEST
VIBRATIONFREQUENCY : 10 to 55 to 10Hz (in 1 min.) MAX
IMMERSION CLEANING
THE CAPACITOR SHALL BE CLEANED AT
ROOM TEMPERATURE FOR 60sec. USING
ISOPROPYL ALCOHOL
AMPLITUDE : 1.5 mm.
DIRECTION OF VIBRATION : IN DIRECTION OF
X,Y AND Z AXES
TIME : 2 HOURS EACH DIRECTION AND 6
HOURS IN TOTAL
DURING THE LAST 30 min. OF VIBRATION IN
EACH DIRECTION, THE CAPACITANCE SHALL
BE MEASURED 3 TO 5 TIMES.
FOR OTHER PROCEDURES REFER TO IEC
Pub. 68-2-6.
MOUNTING METHOD
SOLDER
ALUMINA
BOARD
THERE SHALL BE NO EVIDENCE
OF MECHANICAL DAMAGE. AND
MARKING SHALL BE LEGIBLE.
ELECTRICAL CHARACTERISTICS
SHALL SATISFY THE INITIAL
REQUIREMENT.
CHANGE IN CAPACITANCE :
WIT H IN : ± 5% OF THE INITI AL
VALUE
TANGENT OF LOSS ANGLE :
LEAKAGE CURRENT :
APPEARANCE :
THERE SHALL BE NO EVIDENCE
OF MECHANICAL DAMAGE. .
Page 10
NOITEMSTEST CONDITIONPERFORMANCE
16
17
18
MOISTURE
RESISTANCE
LOAD LIFE
STORAGE AT
TEMPERATURE
LOW
THE CAPACITOR SHALL BE STORED AT A
±2℃
TEMPERATURE OF 40
HUMIDITY OF 90% TO 95% FOR 500
ELECTRICAL MEASUREMENTS SHALL BE MADE
AFTER BEING BOARD AT ROOM TEMPERATURE
∼
FOR 1
REFER TO IEC Pub. 68-2-2.
TEMPERATURE
THE CAPACITOR SHALL BE PLACED IN A
CIRCULATING AIR OVEN AT AN AMBIENT.
ELECTRICAL MEASUREMENTS SHALL BE MADE
AFTER BEING STORED AT ROOM TEMPERATURE
FOR 1~2 HOURS.
THE CAPACITOR SHALL BE STORED AT A
TEMPERATURE OF -55±2℃FOR 240±8HOURS
WIT HOUT LOAD.
ELECTRICAL MEASUREMENTS SHALL BE MADE
AFTER BEING STORED AT ROOM TEMPERATURE
FOR 1~2 HOURS
2 HOURS. FOR OTHER PROCEDURES
℃
85
125
℃
RATED VOLTAGE2,000 HOURS
AND RELATIVE
±
8HOURS.
VOLTAGETIME
DERATED
VOLTAGE
2,000 HOURS
CHANGE IN CAPACITANCE :
WIT HIN :±10% OF THE
INITIAL VALUE
TANGENT OF LOSS ANGLE :
LEAKAGE CURRENT :
CHANGE IN CAPACITANCE :
WIT HIN :±10% OF THE
INITIAL VALUE
TANGENT OF LOSS ANGLE :
LEAKAGE CURRENT :
SCL Series
ELECTRICAL
CHARACTERISTICS SHALL
SATISFY THE INITIAL
REQUIREMENT.
Thermal Shock
19
STEPTEMPERATURETIME
0
1-55
225±5
3125
425±5
THE CAPACITOR SHALL BE SUBJECTED TO EACH
SPECIFIED TEMPERATURE FOR EACH SPECIFIED
TIME IN THE TABLE ABOVE
THESE 4 STEP CONSTITUTES ONE CYCLES SHALL
BE PERFORMED CONTINUOUSLY
℃
-3
℃
0
℃
-3
℃
30±3MIN
15±2MIN
30±3MIN
15±2MIN
CHANGE IN CAPACITANCE :
WIT HIN :±10% OF THE
INITIAL VALUE
TANGENT OF LOSS ANGLE :
LEAKAGE CURRENT :
Page 11
PACKAGING
y
(
)
y
(
)
● MARKING
▶ SCASE
▶ T CASE
A106
Capacitance Code
DC Working Voltage
(G:4V J:6.3VA:10VC:16V D:20V)
Polarit
White
▶ V,W CASE
10
35V
10
20V
㎌
Capacitance
DC Working Voltage
Polarit
Polarity
Capacitance
DC Working Voltage
in
White
(White)
㎌
in
SCL Series
Page 12
▶ RCASE
y
JA
Capacitance Code
DC Working Voltage
(G:4V J:6.3VA:10VC:16V D:20V)
Polarit
Capacitance Range1 DIGIT2 DIGIT
(White)
<1.0
㎌≤
1.0
≥10㎌
【
Code Reference
㎌
0.22gjjjajcj
0.33
0.47gsjsascsds
0.68gwjwawcwdw
1.0GaJaAaCa
1.5
2.2GjJjAjCj
㎌
Cap.< 10
】
V
A Small LetterA Small Letter
㎌
46.3101620
A Capital LetterA Small Letter
A Capital LetterA Capital Letter
SCL Series
3.3GnJnAn
4.7GsJsAsCs
6.8GwJw
10GAJAAA
15
22GJJJ
Page 13
● EMBOSSED PLASTIC TAPE
The tantalum chip capacitors shall be packaged
in tape and reel form for effective use.
- Tape : Semitransparent embossed plastic
- C over tape : Attached with press, polyester
- The tension of removing the cover tape,
F=10∼70g
D
1
A
B
D
2
P1±0.1
(±0.00
4)
P
Case
Code
W±0.3
(±0.01
2)
F±0.1
(±0.00
4)
t
K
E±0.1
(±0.00
4)
±0.1
P
O
(±0.00
4)
Right hand
Orientation available
Embossed
P
1
0
P2±0.1
(±0.00
4)
P
2
D1+0.1
(+0.004)D
E
Min.t
2
Embossed
Carrie r
F
W
SCL Series
A±0.2
(±0.00
B±0.2
(±0.00
8)
K±0.2
(±0.00
8)
8)
J*
R*
W
ø0. 6
(0.024)
8
(0.315)
3.5
(0.138)
S
1.75
(0.069)
4
(0.157)
2
(0.079)4(0.157)
ø1. 5
(0.059)
ø1. 0
(0.039)
T
V
12
(0.472)
5.5
(0.217)
8
(0.315)
ø1. 5
(0.059)
0.25
(0.0098)
0.2
(0.008)
0.3
(0.012)
0.98
(0.039)
1.4
(0.055)
1.9
(0.075)
3.3
(0.130)
3.7
(0.146)
4.8
(0.189)
1.80
(0.071)
2.3
(0.091)
3.5
(0.138)
3.8
(0.150)
6.4
(0.252)
7.7
(0.303)
1.0
(0.039)
1.1
(0.043)
1.3
(0.051)
1.3
(0.051)
1.6
(0.063)
1.9
(0.075)
Cover Tape
F
15
˚
Removal speed
50mm/sec
Page 14
● REEL DIMENSION
Tape
Width
8mm
12mm
8mm
12mm
A±2
(±0.07 9)
ø178
(7)
ø330
(13)
Case Size
reference
J
R
S, T
NMin.
ø70
(2.756)
ø60
(2.362)
ø80
(3.150)
C±0.5
(±0.020)
ø13
(0.512)
ø13
(0.512)
D±0.5
(±0.020)
ø21
(0.827)2(0.079)
ø21
(0.827)2(0.079)
180mm (7") reel330mm(13") reel
4,000pcs-
3,000pcs-
2,000pcs8,000pcs
B±051
(±0.020)
10
(0.394)
14
(0.551)
10
(0.394)
14
(0.551)
t+0. 5
(±0.02 0)
2
(0.079)
2
(0.079)
R
SCL Series
0.99
(0.039)
0.99
(0.039)
V, W
500pcs2,500pcs
Page 15
APPLICATION MANUAL
g
The operational attentions to the use of the tantalum capacitors are as follows:
- Electrical
- Environmental
- Conditions for mounting on equipment and circuit boards
- Mechanical vibration, shock
If the tantalum capacitors are used without satisfying any one of these conditions, the probability of
short-circuiting, leakage current, ignition or other problems to occur increases. To avoid such
problems, observe the following precautions when using the tantalum capacitors.
● OPERATING VOLTAGE
▶ The voltage derating factor should be as great as possible. Under normal conditions, the operating
voltage should be reduced to 50% or less of the rating. It is recommended that the operating
voltage be 30% or less of the rating, particularly when the tantalum capacitors are used in a lowimpedance circuit (see Figs. 1, 2, and 3).
▶ For circuits in which a switching, charging, discharging, or other momentary current flows, it is
recommended that the operating voltage be 30% or less of the rating, with a resistor connected in
series to limit the current to 300 mA or less.
SCL Series
▶ When the tantalum capacitors are to be used at an ambient temperature of higher than 85℃, the
recommended operating range shown in Fig. 3 should not be exceeded.
Power supply filter
Power
supply
~
circuit
Fig. 1
+
100
80
60
40
20
+
-
0
-55
-40-20020406085100125
Power supply bypass
+
+
IC
-
Fig. 2
OPERATING TEMPERATURE
Fi
.3
Page 16
● RIPPLE
The maximum permissible ripple voltage and current are related to the ratings case size.
Please consult us detail in formations.
▶ Ripple Current
The maximum permissible ripple current,
P
MAX
I
=
MAX
ESR(f)
where:
I
MAX : Maximum permissible capacitor ripple current (Arms).
PMAX : Maximum permissible capacitor power loss (W).
Varies with the ambient temperature and case size.
Calculated according to Table
ESR(f): Capacitor equivalent series resistance (Ω).
Since the ESR(f) value varies with the ripple frequency, however, the following correction must be
made in accordance with the operating frequency (see Fig. 4).
IMAX, is calculated as follows :
SCL Series
(f) =
ESR
K : Coefficient for the operating frequency (Fig. 4).
ESR
where:
ESR(120) : Equivalent series resistance at 120 Hz (Ω).
Table.1 Maximum permissible power loss values
temperature (℃)
K·ESR
(120) = Tan
Xc : Capacitive reactance at 120 Hz (Ω).
C : Electrostatic capacitance at 120 Hz (μF).
f : Operating frequency (Hz).
Ambient
(120)
δ
δ·
Xc =
Tan
2πfC
JPSTUV
250.0150 .0150.0300.0300.0300.050
(P
MAX) by case size
P
(W)
MAX
550.0100 .0100.0190.0190.0190.032
850.0050 .0050.0100.0100.0100.018
Page 17
)
Table.2 Hz VS K
FrequencyK
10
1201.0
4000.8
1k0.6 5
10k0.5 0
20k0.4 5
40k0.4 3
100k0.4 0
1M0.35
1.0
0.1
0.0 1
1001K10K10 0K1M
FREQUENCY(Hz)
Fig.4 Correction Coefficient(K
▶ Ripple Voltage
If an excessive ripple voltage is applied to the tantalum capacitors, their internal temperature
rises due to Joule heat, resulting in the detriment of their reliability.
SCL Series
▷ The tantalum capacitors must be used in such a conditions that the sum of the Working Voltage
and ripple voltage peak values does not exceed the rated voltage (Fig. 5)
▷ Ensure that an reverse voltage due to superimposed voltages is not applied to the capacitors.
▷ The maximum permissible ripple voltage varies with the rated voltage. Ensure that ripple voltage does
not exceed the values shown in Figs 6 and 7. If, however, the capacitors are used at a high
temperature, the maximum permissible ripple voltage must be calculated as follows:
Vrms(at 55℃) = 0.7 x Vrms(at 25℃)
Vrms(at 85℃) = 0.5 x Vrms(at 25℃)
Vrms(at 125℃) = 0.3 x Vrms(at 25℃)
Page 18
(
)
100
100
50V
35V
10
100
100
25V
20V
16V
10V
6.3/7 V
4V
2.5 V
100
1
10100
Frequency(Hz)
Fig.6 Maximum per missible ripple voltage
(P,A,B)
10
100
100
50V
35V
25V
20V
16V
10V
6.3/ 7 V
4V
2.5 V
100
1
Frequency(Hz)
Fig.7 Maximum permissible ripple voltage
C,D
● REVERSE VOLTAGE
Solid tantalum capacitors are polarized device and may be permanently damaged or destroyed, if
connected with the wrong polarity.
10100
SCL Series
▷ The tantalum capacitors must not be operated and changed in reverse mode. And also the
capacitors must not be used in an only AC circuit.
▷ The tantalum capacitor dielectric has a rectifying characteristics. Therefore, when a reverse
voltage is applied to it, a large current flows even at a low reverse voltage.As a result,it may
spontaneously generate heat and lead to shorting.
▷ Make sure that the polarity and voltage is correct when applying a multi-meter or similar testing
instrument to the capacitors because a reverse voltage or overvoltage can be accidentally
applied.
▷ When using the capacitors in a circuit in which a reverse voltage is applied, consult your local
SAMSUNG ELECTRO-MECHANICS agent. If the application of an reverse voltage is
unavoidable, it must not exceed the following values.
At 20°C: 10% of the rated voltage of 1 V, whichever smaller.
At 85°C: 5% of the rated voltage or 0.5 V, whichever smaller.
Page 19
● RELIABILITY OF TANTALUM CAPACITORS
▶ General
The failure rate of the tantalum capacitor varies with the digression ratio, ambient temperature, circuit
resistance, circuit application, etc.
Therefore, when proper selections are made so as to afford additional margins, higher reliability can
be derived from the tantalum capacitors. Some examples of actual failure rates are presented below
for your reference.
▶ Failure Rate Calculation Formula
The tantalum capacitors are designed to work at their basic failure
rates shown in Table 3 that prevail when the rated voltage is applied for 1000 hours at 85℃.
Table 3 Basic failure rate
TYPEClassificationBasic failure rate
SCE,SVELow ESR type
SC M,SVMUltra-Miniaturization Type(060 3)
SC LLow -profile Ty pe
SCS,SVSSmall Type
SC N,SVNS tanda rd type
PC *Conductive Polym er Type
▷ Failure rate calculation formula
λ
use =λ85 x K
V
xK
R
λuse : Estimated capacitor failure rate under the operating conditions.
λ85 : Basic failure rate (Table 3)
K
V : Failure rate correction coefficient by the ambient temperature and derating factor.
K
R : Failure rate correction coefficient by the circuit resistance,
which is the series-connected resistance divided by the voltage applied to the capacitor.
This resistance is connected in series when the power supply side is viewed from the capacitor side.
SCL Series
1%/10 00h
K
(derating factor)=operating voltage/rated voltage
Page 20
● RELIABILITY PREDICTION
Solid tantalum capacitors exhibit no degration failure mode during shelf storage and show a constantly
decreasing failure rate(i.e. , absence of wearout mechanism) during life tests. this failure rate is
dependent upon three important application conditions:DCvoltage, temperature, and circuit impedance.
Estimates of these respective effects are provided by the reliability nomograph.(Figure 8.)
The nomograph relates failure rate to voltage and temperature while the table relates failure rate to
impedance. These estimates apply to steady-state DC condition, and they assume usage within all
other rated conditions.
Standard conditions, which produce a unity failure rate factor, are rated voltage, +85℃, and 0.1 ohmper-volt impedance.
While voltage and temperature are straight-forward, there is sometimes difficulty in determining
impedance. What is required is the circuit impedance seen by the capacitor. If several capacitors are
connected in parallel, the impedance seen by each is lowered by the source of energy stored in the
other capacitors. Energy is similarly stored in series inductors.
Voltage "de-rating" is a common and useful approach to improved reliability. It can be persued too far,
however , when it leads to installation of higher voltage capacitors of much larger size.
It is possible to lose more via higher
inherent failure rate than is gained by
voltage derating. SAMSUNG typically
recommends 50% derating, especially in
low impedance circuits.
Failure rate is conventionally expressed in
units of percent per thousand hours. As a
sample calculation, suppose a particular
batch of capacitors has a failure rate of 0.5%
/ Khr under standard conditions.
What would be the predicted failure rate at
0.7times rated voltage, 60℃ and 0.6Ω/V?
The nomgraph gives a factor of 7 × 10
-2
and
the table gives a factor of 0.4.
The failure rate estimate is then :
0.5 × 7 × 10
= 1.4 × 10-2 or 0.014%/Khr
-2 × 0.4
120
110
100
90
Connect the temperature
and applied voltage ratio
80
of interest with a straight
edge. The multiplier of
failur e r ate is given at the
70
iner section of this
line with the model scale.
60
Given T1&v1 Read Failure
Rate Multiplier F1
Giv en T , & F2
50
Read Reguired Voltage V2
Giv en F 3 & V3
Read Allowable Temp T3
40
30
2
10
1
10
0
10
-1
10
-2
10
-3
10
-4
10
-5
10
SCL Series
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
20
TFV
Fig.8 Reliability Nomograph
Page 21
Table 4 Circuit Impedance Reliability Factors
Circuit Impedance
(ohms/volt)
0.11.0
0.20.8
0.40.6
0.60.4
0.80.3
1.00.2
2.00.1
3orgreater0.07
● MOUNTING PRECAUTIONS
▶ Limit Pressure on Capacitor Installation with Mounter
A capacitor that has been damaged should be discarded to avoid later problems resulting from
mechanical stress.
Pressure must not exceed 4.9 N with a tool end diameter of 1.5mm when applied to the
capacitors using an absorber, centering tweezers, or the like. An excessively low absorber setting
Failure Rate Impedance
(multiplying factor)
SCL Series
position would result in not only the application of undue force to the capacitors but capacitor and
other component scattering,circuit board wiring breakage, and / or cracking as well, particularly
when the capacitors are mounted together with other chips having a height of 1 mm or less.
▶ Flux
▷ Select a flux that contains a minimum of chlorine and amine.
▷ After flux use, the chlorine and amine in the flux remain and must therefore be removed.