Free Delay Time Setting
CMOS Voltage Detector IC Series
BD52Exxx series BD53Exxx series
●General Description
Rohm's BD52Exxx and BD53Exxx series are highly
accurate, low current consumption Voltage Detector
ICs with a capacitor controlled time delay. The line up
includes BD52Exxx devices with N-channel open drain
output and BD53Exxx devices with CMOS output. The
devices are available for specific detection voltages
ranging from 2.3V to 6.0V in increments of 0.1V.
●Features
Delay Time Controlled by external Capacitor
Two output types (N-channel open drain and CMOS
output)
Ultra-low current consumption
Very small, lightweight and thin package
Package SSOP5 is similar to SOT-23-5(JEDEC)
●Absolute maximum ratings
Parameter Symbol Limits Unit
Power Supply Voltage VDD-GND -0.3 to +10 V
Output Voltage
Nch Open Drain Output
CMOS Output GND-0.3 to VDD+0.3
V
OUT
Output Current Io 80 mA
Power
Dissipation
SSOP5
*1*2
Pd 540 mW
Operating Temperature Topr -40 to +105 °C
Ambient Storage Temperature Tstg -55 to +125 °C
*1 Reduced by 5.4mW/°C when used over 25°C.
*2 When mounted on ROHM standard circuit board (70mm×70mm×1.6mm, glass epoxy board).
●Electrical characteristics (Unless Otherwise Specified Ta=-40 to 105°C)
Parameter Symbol
VDD=HL, RL=470kΩ
Condition
*1
Ta=+25°C2.475 2.5 2.525
VDET=2.5V
Ta=-40°C to 85°C
Ta=85°C to 105°C
Ta=+25°C2.970 3.0 3.030
VDET=3.0V
Ta=-40°C to 85°C
Ta=85°C to 105°C
Detection Voltage V
DET
VDET=3.3V
Ta=+25°C3.267 3.3 3.333
Ta=-40°C to 85°C
Ta=85°C to 105°C
Ta=+25°C4.158 4.2 4.242
VDET=4.2V
Ta=-40°C to 85°C
Ta=85°C to 105°C
Ta=+25°C4.752 4.8 4.848
VDET=4.8V
Ta=-40°C to 85°C
Ta=85°C to 105°C
V
=2.3-3.1V - 0.80 2.40
DET
V
=3.2-4.2V - 0.85 2.55
Circuit Current when ON IDD1 VDD=VDET-0.2V
Circuit Current when OFF IDD2 VDD=VDET+2.0V
Operating Voltage Range VOPL
‘Low’ Output Voltage (Nch) VOL
‘High’ Output Voltage (Pch) VOH
VOL≤0.4V, Ta=25 to 105°C, RL=470kΩ0.95 - VOL≤0.4V, Ta=-40 to 25°C, RL=470kΩ1.20 - VDD=1.5V,I
VDD=2.4V,I
VDD=4.8V,I
VDD=8.0V,I
SINK
=0.4mA, VDET=2.3-6.0V - - 0.5
SINK
=2.0mA, VDET=2.7-6.0V - - 0.5
SOURCE
SOURCE
SOURCE
DET
V
=4.3-5.2V - 0.90 2.70
DET
V
=5.3-6.0V - 0.95 2.85
DET
V
=2.3-3.1V - 0.75 2.25
DET
V
=3.2-4.2V - 0.80 2.40
DET
V
=4.3-5.2V - 0.85 2.55
DET
V
=5.3-6.0V - 0.90 2.70
DET
=0.7mA, VDET(2.3V to 4.2V)
=0.9mA, VDET(4.3V to 5.2V)
=1.1mA, VDET(5.3V to 6.0V)
VDET (T):Standard Detection Voltage (2.3Vto 6.0V,0.1Vstep)
RL:Pull-up resistor to be connected between VOUT and power supply.
Design Guarantee. (Outgoing inspection is not done on all products.)
*1 Guarantee is Ta=25°C.
●Electrical characteristics (Unless Otherwise Specified Ta=-40 to 105°C) - continued
Parameter Symbol
Leak Current when OFF I
VDD=VDS=10V
leak
VDD=VDET×1.1, VDET=2.3-2.6V, RL=470kΩ
VDD=VDET×1.1, VDET=2.7-4.2V, RL=470kΩ
Condition
*1
- - 0.1 µA
×0.30
×0.30
CT pin Threshold Voltage VCTH
VDD=VDET×1.1, VDET=4.3-5.2V, RL=470kΩ
VDD=VDET×1.1, VDET=5.3-6.0V, RL=470kΩ
Output Delay Resistance RCTVDD=VDET×1.1 VCT=0.5V
CT pin Output Current ICT
Detection Voltage
Temperature coefficient
VDET/∆T Ta=-40°C to 105°C - ±100 ±360 ppm/°C
VCT=0.1V VDD=0.95V
VCT=0.5V VDD=1.5V 150 240 -
Hysteresis Voltage ∆ VDET VDD=LHL, RL=470kΩ
×0.35
×0.40
*1
5.5 9 12.5 MΩ
*1
15 40 -
VDET
×0.03
VDET (T):Standard Detection Voltage (2.3Vto 6.0V,0.1Vstep)
RL:Pull-up resistor to be connected between VOUT and power supply.
Design Guarantee. (Outgoing inspection is not done on all products.)
*1 Guarantee is Ta=25°C.
For both the open drain type (Figure.15) and the CMOS output type (Figure.16), the detection and release voltages are
used as threshold voltages. When the voltage applied to the VDD pins reaches the applicable threshold voltage, the V
terminal voltage switches from either “High” to “Low” or from “Low” to “High”. Please refer to the Timing Waveform and
Electrical Characteristics for information on hysteresis. Because the BD52Exxx series uses an open drain output type, it is
necessary to connect a pull up resistor to VDD or another power supply if needed [The output “High” voltage (V
OUT
case becomes VDD or the voltage of the other power supply].
: CT pin Threshold Voltage(Please refer to Electrical Characteristics.)
CTH
ln : Natural Logarithm
Reference Data of Falling Time (t
Examples of Falling Time (t
Part Number t
) Output
PHL
) Output
PHL
[µs] -40°C t
PHL
[µs] ,+25°C t
PHL
[µs],+105°C
PHL
BD52E27G 30.8 30 28.8
BD53E27G 26.8 26 24.8
*This data is for reference only.
The figures will vary with the application, so please confirm actual operating conditions before use.
Timing Waveforms
Example: the following shows the relationship between the input voltage VDD, the CT Terminal Voltage VCT and the output
voltageVOUT when the input power supply voltage VDD is made to sweep up and sweep down (The circuits are those in
Figure.15 and 16).
V
DD
V
DET
+ΔV
DET
V
DET
V
OPL
⑤
0V
CT
1/2 V
DD
When the power supply is turned on, the output is unstable
from after over the operating limit voltage (VOPL) until tPHL.
Therefore it is possible that the reset signal is not outputted when
the rise time of VDD is faster than tPHL.
When VDD is greater than VOPL but less than the reset release
voltage (VDET+VDET), the CT terminal (VCT) and output (VOUT)
voltages will switch to L.
If VDD exceeds the reset release voltage (VDET+VDET), then
VOUT switches from L to H (with a delay due to the CT terminal).
If VDD drops below the detection voltage (VDET) when the
power supply is powered down or when there is a power supply
V
OUT
t
PHL
t
PLH
t
PHL
t
PLH
fluctuation, VOUT switches to L (with a delay of tPHL).
The potential difference between the detection voltage and the
release voltage is known as the hysteresis width (VDET). The
system is designed such that the output does not toggle with
①
②
Figure.17 Timing Waveform
power supply fluctuations within this hysteresis width, preventing
malfunctions due to noise.
1) Examples of a common power supply detection reset circuit
V
DD1
V
DD2
Application examples of BD52Exxx series (Open Drain
output type) and BD53Exxx series (CMOS output type)
are shown below.
BD52Exxx
C
T
C
L
(Noise-filtering
Capacitor)
Micro
controller
GND
CASE1: Power supply of the microcontroller (V
differs from the power supply of the reset detection
(V
).
DD1
Use an open drain output type (BD52Exxx) with a load
resistance R
attached as shown Figure.18.
L
Figure.18 Open Drain Output Type
CASE2: Power supply of the microcontroller (V
DD1
same as the power supply of the reset detection (V
V
DD1
Use a CMOS output type (BD53Exxx) device or open
drain output type (BD52Exxx) device with a pull up
GND
BD53Exxx
C
T
C
L
(Noise-filtering
Capacitor)
Micro
controller
When a capacitance CL for noise filtering is connected to
the V
pin (the reset signal input terminal of the
OUT
microcontroller), please take into account the waveform
of the rise and fall of the output voltage (V
Please refer to Operational Notes for recommendations
on resistor and capacitor values.
resistor attached between the output and V
Figure.19 CMOS Output Type
OUT
DD1
.
).
2) The following is an example of a circuit application in which an OR connection between two types of detection voltage
resets the microcontroller.
VDD1VDD3
VDD2
RL
BD52Exxx
NO.1
BD52Exxx
NO.2
RST
CT
CT
microcontroller
Fig.20
GND
To reset the microcontroller when many independent power supplies are used in the system, OR connect an open drain
output type (BD52Exxx series) to the microcontroller’s input with pull-up resistor to the supply voltage of the microcontroller
) as shown in Fig. 20. By pulling-up to V
(V
DD3
, output “High” voltage of micro-controller power supply is possible.
3) Examples of the power supply with resistor dividers
In applications wherein the power supply voltage of an IC comes from a resistor divider circuit, an in-rush current will flow
into the circuit when the output level switches from “High” to “Low” or vice versa. In-rush current is a sudden surge of
current that flows from the power supply (VDD) to ground (GND) as the output logic changes its state. This current flow
may cause malfunction in the systems operation such as output oscillations, etc.
Figure.21
IDD
I1
CIN
VDD
BD52Exxx
BD53Exxx
VOUT
Through
Current
CL
GND
0
VDET
When an in-rush current (I1) flows into the circuit (Refer to Fig. 21) at the time when output switches from “Low” to “High”,
a voltage drop of I1×R2 (input resistor) will occur in the circuit causing the VDD supply voltage to decrease. When the VDD
voltage drops below the detection voltage, the output will switch from “High” to “Low”. While the output voltage is at “Low”
condition, in-rush current will stop flowing and the voltage drop will be reduced. As a result, the output voltage will switches
again from “Low” to “High” which causes an in-rush current and a voltage drop. This operation repeats and will result to
oscillation.
V D D - ID D P eak C urrent T a=25°C
10
B D 52Exxx
1
B D 53Exxx
0.1
ID D -peak[m A ]
0.01
0.001
345678910
V D D[V ]
Figure.22 IDD Peak Current vs. Power Supply Voltage
This data is for reference only.
*
The figures will vary with the application, so please confirm actual operating conditions before use.
1) Absolute maximum ratings
Operating the IC over the absolute maximum ratings may damage the IC. The damage can either be a short circuit
between pins or an open circuit between pins. Therefore, it is important to consider circuit protection measures, such
as adding a fuse, in case the IC is operated over the absolute maximum ratings.
2) Ground Voltage
The voltage of the ground pin must be the lowest voltage of all pins of the IC at all operating conditions. Ensure that no
pins are at a voltage below the ground pin at any time, even during transient condition.
3) Recommended operating conditions
These conditions represent a range within which the expected characteristics of the IC can be approximately obtained.
The electrical characteristics are guaranteed under the conditions of each parameter.
4) Bypass Capacitor for Noise Rejection
To help reject noise, put a 1µF capacitor between V
Be careful when using extremely big capacitor as transient response will be affected.
5) Short between pins and mounting errors
Be careful when mounting the IC on printed circuit boards. The IC may be damaged if it is mounted in a wrong
orientation or if pins are shorted together. Short circuit may be caused by conductive particles caught between the pins.
6) Operation under strong electromagnetic field
Operating the IC in the presence of a strong electromagnetic field may cause the IC to malfunction.
7) The VDD line impedance might cause oscillation because of the detection current.
8) A VDD to GND capacitor (as close connection as possible) should be used in high VDD line impedance condition.
9) Lower than the mininum input voltage puts the VOUT in high impedance state, and it must be VDD in pull up (VDD)
condition.
10) External parameters
The recommended value of RL Resistor is 50k to 1M. The recommended value of CT Capacitor is over 100pF to
0.1µF. There are many factors (board layout, etc) that can affect characteristics. Please verify and confirm using
practical applications.
11) Power on reset operation
Please note that the power on reset output varies with the VDD rise time. Please verify the behavior in the actual
operation.
12) Testing on application boards
When testing the IC on an application board, connecting a capacitor directly to a low-impedance output pin may subject
the IC to stress. Always discharge capacitors completely after each process or step. The IC’s power supply should
always be turned off completely before connecting or removing it from the test setup during the inspection process. To
prevent damage from static discharge, ground the IC during assembly and use similar precautions during transport and
storage.
13) Rush current
When power is first supplied to the IC, rush current may flow instantaneously. It is possible that the charge current to
the parasitic capacitance of internal photo diode or the internal logic may be unstable. Therefore, give special
consideration to power coupling capacitance, power wiring, width of GND wiring, and routing of connections.
pin discharge
14) C
T
Due to the capabilities of the CT pin discharge transistor, the CT pin may not completely discharge when a short input
pulse is applied, and in this case the delay time may not be controlled. Please verify the actual operation.
DD pin and GND and 1000pF capacitor between VOUT pin and GND.
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OA equipment, telecommunication equipment, home electronic appliances, amusement equipment, etc.). If you
intend to use our Products in devices requiring extremely high reliability (such as medical equipment
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damages, expenses or losses incurred by you or third parties arising from the use of any ROHM’s Products for Specific
Applications.
(Note1) Medical Equipment Classification of the Specific Applications
JAPAN USA EU CHINA
CLASSⅢ
CLASSⅣ CLASSⅢ
CLASSⅢ
CLASSⅡb
CLASSⅢ
(Note 1)
, transport
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H
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ambient temperature.
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Precaution for Mounting / Circuit board design
1. When a highly active halogenous (chlorine, bromine, etc.) flux is used, the residue of flux may negatively affect product
performance and reliability.
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ROHM representative in advance.
For details, please refer to ROHM Mounting specification
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