Rainbow Electronics W29EE512 User Manual

W29EE512
64K × 8 CMOS FLASH MEMORY
GENERAL DESCRIPTION
The W29EE512 is a 512K bit, 5-volt only CMOS flash memory organized as 64K × 8 bits. The device can be programmed and erased in-system with a standard 5V power supply. A 12-volt VPP is not required. The unique cell architecture of the W29EE512 results in fast program/erase operations with extremely low current consumption (compared to other comparable 5-volt flash memory products). The device can also be programmed and erased using standard EPROM programmers.
FEATURES
Single 5-volt program and erase operations
Fast page-write operations
128 bytes per page
− Page program cycle: 10 mS (max.)
− Effective byte-program cycle time: 39 µS
− Optional software-protected data write
Fast chip-erase operation: 50 mS
Read access time: 70/90/120 nS
Typical page program/erase cycles: 1K/10K
Ten-year data retention
Software and hardware data protection
Low power consumption
Active current: 50 mA (max.)
Standby current: 100 µA (max.)
Automatic program timing with internal VPP
generation
End of program detection
Toggle bit
Data polling
Latched address and data
TTL compatible I/O
JEDEC standard byte-wide pinouts
Available packages: 32-pin PLCC, TSOP and VSOP
Publication Release Date: April 2000
- 1 - Revision A6
W29EE512
E
1
2
3
678
DQ1
DQ2
V
NC
A13
CC
1
3
456
DQ1
DQ2
VWENC
CC
CE
OE
WE
PIN CONFIGURATIONS
A
V
/
A
1
C
W
1
N C
32-pin PLCC
G
D
N
Q
D
3
32-pin TSOP
32-pin VSOP
N
C
C
3031321234
1817161514
2019
D
D
D
Q
Q
Q
4
5
6
2NC
5
5
A7
6
A6
7
A5
8
A4
9
A3
10
A2
11
A1
12
A0
13
DQ0
D
D
Q
Q
1
2
A11
A9 A8
5
A14
WE
9
NC
10
NC
11
A15
12
A12
13
A7
14
A6
15
A5
16
A4
A11
2
A9
A8 A13 A14
8 9
NC
10
NC
11
A15
12
A12
13
A7
14
A6
15
A5
A4
16
BLOCK DIAGRAM
V
DD
V
SS
29
A14
28
A13
27
A8
26
A9
25
A11
24
OE
23
A10
22
CE
21
DQ7
CE OE
WE
A0
. .
CONTROL
DECODER
OUTPUT BUFFER
CORE
ARRAY
A15
32
OE A10
31 30
CE DQ7
29
DQ6
28
DQ5
27
DQ4
26
DQ3
25
GND
24 23 22
DQ0
21 20
A0 A1
19
A2
18
A3
17
32
OE A10
31 30
CE
29
DQ7 DQ6
28
DQ5
27 26
DQ4
25
DQ3 GND
24 23 22 21
DQ0
20
A0
19
A1
18
A2
17
A3
PIN DESCRIPTION
SYMBOL PIN NAME
A0A15
DQ0DQ7
CC
V
GND Ground
Address Inputs Data Inputs/Outputs Chip Enable Output Enable Write Enable Power Supply
NC No Connection
DQ0
. .
DQ7
- 2 -
W29EE512
FUNCTIONAL DESCRIPTION
Read Mode
The read operation of the W29EE512 is controlled by CE and OE, both of which have to be low for the host to obtain data from the outputs. CE is used for device selection. When CE is high, the chip is de-selected and only standby power will be consumed. OE is the output control and is used to gate data from the output pins. The data bus is in high impedance state when either CE or OE is high.
Refer to the timing waveforms for further details.
Page Write Mode
The W29EE512 is programmed on a page basis. Every page contains 128 bytes of data. If a byte of data within a page is to be changed, data for the entire page must be loaded into the device. Any byte that is not loaded will be erased to "FFh" during programming of the page.
The write operation is initiated by forcing CE and WE low and OE high. The write procedure consists of two steps. Step 1 is the byte-load cycle, in which the host writes to the page buffer of the device. Step 2 is an internal programming cycle, during which the data in the page buffers are simultaneously written into the memory array for non-volatile storage.
During the byte-load cycle, the addresses are latched by the falling edge of either CE or WE, whichever occurs last. The data are latched by the rising edge of either CE or WE, whichever occurs
first. If the host loads a second byte into the page buffer within a byte-load cycle time (T
µ
S, after the initial byte-load cycle, the W29EE512 will stay in the page load cycle. Additional bytes can then be loaded consecutively. The page load cycle will be terminated and the internal programming cycle will start if no additional byte is loaded into the page buffer A7 to A15 specify the page address. All bytes that are loaded into the page buffer must have the same page address. A0 to A6 specify the byte address within the page. The bytes may be loaded in any order; sequential loading is not required.
In the internal programming cycle, all data in the page buffers, i.e., 128 bytes of data, are written simultaneously into the memory array. Before the completion of the internal programming cycle, the host is free to perform other tasks such as fetching data from other locations in the system to prepare to write the next page.
BLC
) of 200
Software-protected Data Write
The device provides a JEDEC-approved optional software-protected data write. Once this scheme is enabled, any write operation requires a series of three-byte program commands (with specific data to a specific address) to be performed before the data load operation. The three-byte load command sequence begins the page load cycle, without which the write operation will not be activated. This write scheme provides optimal protection against inadvertent write cycles, such as cycles triggered by noise during system power-up and power-down.
The W29EE512 is shipped with the software data protection enabled. To enable the software data protection scheme, perform the three-byte command cycle at the beginning of a page load cycle. The device will then enter the software data protection mode, and any subsequent write operation must be preceded by the three-byte program command cycle. Once enabled, the software data protection will remain enabled unless the disable commands are issued. A power transition will not reset the software data protection feature. To reset the device to unprotected mode, a six-byte command sequence is required.
Publication Release Date: April 2000
- 3 - Revision A6
W29EE512
Hardware Data Protection
The integrity of the data stored in the W29EE512 is also hardware protected in the following ways: (1) Noise/Glitch Protection: A WE pulse of less than 15 nS in duration will not initiate a write cycle.
CC
(2) V
2.5V. (3) Write Inhibit Mode: Forcing OE low, CE high, or WE high will inhibit the write operation. This
prevents inadvertent writes during power-up or power-down periods.
Data Polling (DQ7)-Write Status Detection
The W29EE512 includes a data polling feature to indicate the end of a programming cycle. When the W29EE512 is in the internal programming cycle, any attempt to read DQ7 of the last byte loaded during the page/byte-load cycle will receive the complement of the true data. Once the programming cycle is completed. DQ7 will show the true data.
Toggle Bit (DQ6)-Write Status Detection
In addition to data polling, the W29EE512 provides another method for determining the end of a program cycle. During the internal programming cycle, any consecutive attempts to read DQ6 will produce alternating 0's and 1's. When the programming cycle is completed, this toggling between 0's and 1's will stop. The device is then ready for the next operation.
Power Up/Down Detection: The programming operation is inhibited when VCC is less than
5-Volt-only Software Chip Erase
The chip-erase mode can be initiated by a six-byte command sequence. After the command loading cycles, the device enters the internal chip erase mode, which is automatically timed and will be completed in 50 mS. The host system is not required to provide any control or timing during this operation.
Product Identification
The product ID operation outputs the manufacturer code and device code. Programming equipment automatically matches the device with its proper erase and programming algorithms.
The manufacturer and device codes can be accessed by software or hardware operation. In the software access mode, a six-byte command sequence can be used to access the product ID. A read from address 0000H outputs the manufacturer code (DAh). A read from address 0001H outputs the device code (C8h). The product ID operation can be terminated by a three-byte command sequence.
In the hardware access mode, access to the product ID is activated by forcing CE and OE low, WE high, and raising A9 to 12 volts.
- 4 -
TABLE OF OPERATING MODES
CE OE WE
Operating Mode Selection
(Operating Range = 0 to 70° C (Ambient Temperature), VCC = 5V ±10%, VSS = 0V, VHH = 12V)
MODE PINS
W29EE512
ADDRESS DQ.
IL
IL
IH
Read V Write V Standby V
IL
IH
Write Inhibit X V
V
IH
V
X X X High Z
IL
X X V
IH
Output Disable X V 5-Volt Software Chip Erase V Product ID V
V
IL IL
IL
IH
V
IL
V
IL
V
V
V
V
IN
A
IL
IN
V
A
Dout Din
X X High Z/D
IH
X High Z/D
X X High Z
IL
V
IH
IH
IN
A A0 = VIL; A
HH
A9 = V A0 = VIH; A
HH
A9 = V
1
A15 = VIL;
1
A15 = VIL;
IN
D Manufacturer Code
DA (Hex) Device Code
C8 (Hex)
OUT OUT
Publication Release Date: April 2000
- 5 - Revision A6
W29EE512
Software Data Protection
Command Codes for Software Data Protection
BYTE SEQUENCE TO ENABLE PROTECTION TO DISABLE PROTECTION
0 Write 5555H AAH 5555H AAH 1 Write 2AAAH 55H 2AAAH 55H 2 Write 5555H A0H 5555H 80H 3 Write - - 5555H AAH 4 Write - - 2AAAH 55H 5 Write - - 5555H 20H
Software Data Protection Acquisition Flow
ADDRESS DATA ADDRESS DATA
Software Data Protection Enable Flow
Disable Flow
(Optional page-load
Notes for software program code: Data Format: DQ7−DQ0 (Hex)
Address Format: A14−A0 (Hex)
operation)
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data A0
to
address 5555
Sequentially load
up to 128 bytes
of page data
Pause 10 mS
Exit
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 20
to
address 5555
Pause 10 mS
Exit
- 6 -
Command Codes for Software Chip Erase
BYTE SEQUENCE ADDRESS DATA
0 Write 5555H AAH 1 Write 2AAAH 55H 2 Write 5555H 80H 3 Write 5555H AAH 4 Write 2AAAH 55H 5 Write 5555H 10H
Software Chip Erase Acquisition Flow
Load data AA
address 5555
Load data 55
address 2AAA
W29EE512
to
to
Notes for software chip erase: Data Format: DQ7−DQ0 (Hex) Address Format: A14−A0 (Hex)
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 10
to
address 5555
Pause 50 mS
Exit
Publication Release Date: April 2000
- 7 - Revision A6
W29EE512
Command Codes for Product Identification
BYTE
SEQUENCE
0 Write 5555H AAH 5555H AAH 5555H AAH 1 Write 2AAAH 55H 2AAAH 55H 2AAAH 55H 2 Write 5555H 90H 5555H 80H 5555H F0H 3 Write - - 5555H AAH - ­4 Write - - 2AAAH 55H - ­5 Write - - 5555H 60H - -
Software Product Identification Acquisition Flow
ALTERNATE SOFTWARE (5) PRODUCT IDENTIFICATION
ADDRESS DATA ADDRESS DATA ADDRESS DATA
Product Identification Entry (1)
ENTRY
Pause 10 µS Pause 10 µS Pause 10 µS
Product Identification Mode (2,3)
Load data AA
to
address 5555
SOFTWARE PRODUCT
IDENTIFICATION ENTRY
Product Identification Exit (1)
SOFTWARE PRODUCT
IDENTIFICATION EXIT
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 60
to
address 5555
Pause 10 S
µ
Read address = 0
data = DA
Read address = 1
data = C8
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data FO
to
address 5555
Pause 10 S
Normal Mode
µ
(4)
Notes for software product identification: (1) Data format: DQ7−DQ0 (Hex); address format: A14−A0 (Hex). (2) A1−A16 = VIL; manufacture code is read for A0 = VIL; device code is read for A0 = VIH. (3) The device does not remain in identification mode if power down. (4) The device returns to standard operation mode. (5) This product supports both the JEDEC standard 3 byte command code sequence and original 6 byte command code sequence. For new designs, Winbond recommends that the 3 byte command code sequence be used.
- 8 -
DC CHARACTERISTICS
CE
CE
CE
Output High Voltage
Absolute Maximum Ratings
PARAMETER RATING UNIT
Power Supply Voltage to V Operating Temperature 0 to +70 Storage Temperature -65 to +150 D.C. Voltage on Any Pin to Ground Potential except A9 -0.5 to V Transient Voltage (¡Õ20 nS ) on Any Pin to Ground Potential
ss
Potential -0.5 to +7.0 V
CC
-1.0 to V
CC
W29EE512
°C °C
+1.0 V +1.0 V
Voltage on A9 and OE Pin to Ground Potential
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the device.
Operating Characteristics
(VCC = 5.0V ±10%, VSS = 0V, TA = 0 to 70° C)
Power Supply
Current
Standby Vcc
Current (TTL Input)
Standby Vcc
Current (CMOS
Input)
Input Leakage
Current
Output Leakage
Current
Input Low Voltage V
Input High Voltage V
Output Low Voltage V
Output High Voltage V
CMOS
PARAMETER SYM.
CC
I
ISB1
ISB2
LI
I
LO
I
IL
IH
OL OH1 OH2
V
-0.5 to 12.5 V
TEST CONDITIONS LIMITS UNIT
MIN. TYP. MAX.
= OE = VIL, WE = VIH, all I/Os open
- - 50 mA
Address inputs = VIL/VIH, at f = 5 MHz
= VIH, all I/Os open
IH
Other inputs = VIL/V
CC
= V
-0.3V, all I/Os open
Other inputs = V
IN
V
= GND to V
IN
V
= GND to V
OL
I
= 2.1 mA - - 0.45 V
OH
I
= -0.4 mA 2.4 - - V
IOH = -100 µA; VCC = 4.5V
CC
-0.3V/GND
CC
CC
- - - 0.8 V
- 2.0 - - V
- 2 3 mA
- 20 100
- - 10
- - 10
4.2 - - V
µ
A
µ
A
µ
A
Publication Release Date: April 2000
- 9 - Revision A6
W29EE512
Power-up Timing
PARAMETER SYMBOL TYPICAL UNIT
Power-up to Read Operation TPU.READ 100 Power-up to Write Operation TPU.WRITE 5 mS
CAPACITANCE
(VCC = 5.0V, TA = 25° C, f = 1 MHz)
PARAMETER SYMBOL CONDITIONS MAX. UNIT
I/O
I/O Pin Capacitance C Input Capacitance C
IN
AC CHARACTERISTICS
AC Test Conditions
PARAMETER CONDITIONS
Input Pulse Levels 0V to 3V Input Rise/Fall Time Input/Output Timing Level 1.5V/1.5V Output Load 1 TTL Gate and CL = 100 pF/30 pF
I/O
V
= 0V 12 pF
VIN = 0V 6 pF
<
5 nS
µ
S
AC Test Load and Waveform
D
OUT
(For 90 nS/120 nS)
100 pF 30 pF
(For 70 nS)
Input
3V
0V
- 10 -
1.5V
Test Point
+5V
Output
1.5V
1.8
Kohm
1.3
Kohm
Test Point
Read Cycle Timing Parameters
CE
OE
WE
WE
OE
OE
CE
WE
WE
(VCC = 5.0V ±10%, VCC = 5.0 ±5% for 70 nS, VSS = 0V, TA = 0 to 70° C)
PARAMETER SYM. W29EE512-70 W29EE512-90 W29EE512-12 UNIT
W29EE512
Read Cycle Time T Chip Enable Access Time T Address Access Time T Output Enable Access Time T
CHZ
High to High-Z Output
High to High-Z Output
T
T
OHZ
Output Hold from Address Change T
MIN. MAX. MIN. MAX. MIN. MAX.
RC
70 - 90 - 120 - nS
CE
- 70 - 90 - 120 nS
AA
- 70 - 90 - 120 nS
OE
- 35 - 40 - 50 nS
- 25 - 25 - 30 nS
- 25 - 25 - 30 nS
OH
0 - 0 - 0 - nS
Byte/Page-write Cycle Timing Parameters
PARAMETER SYMBOL MIN. TYP. MAX. UNIT
WC
T
T T T
T
T
T
AS AH CS
CH
OES
OEH
CP
WP
WPH
DS DH
BLC
- - 10 mS
0 - - nS
50 - - nS
0 - - nS 0 - - nS 0 - - nS
0 - - nS 90 - - nS 90 - - nS
100 - - nS
35 - - nS
0 - - nS
- - 200
µ
S
Write Cycle (Erase and Program) T Address Setup Time T Address Hold Time T
and CE Setup Time
and CE Hold Time High Setup Time High Hold Time
Pulse Width
Pulse Width
High Width
Data Setup Time T Data Hold Time T Byte Load Cycle Time T
Notes: All AC timing signals observe the following guidelines for determining setup and hold times:
(1) High level signal's reference level is VIH.
(2) Low level signal's reference level is VIL.
Publication Release Date: April 2000
- 11 - Revision A6
W29EE512
DATA
OE
OE
OE
OE
OE
Polling Characteristics
(1)
PARAMETER SYMBOL MIN. TYP. MAX. UNIT
T T
DH OEH
OE WR
Data Hold Time T
Hold Time
(2)
to Output Delay
Write Recovery Time T
Notes: (1) These parameters are characterized and not 100% tested. (2) See TOE spec in A.C. Read Cycle Timing Parameters.
Toggle Bit Characteristics
(1)
PARAMETER SYMBOL MIN. TYP. MAX. UNIT
Data Hold Time T
Hold Time
(2)
to Output Delay High Pulse
Write Recovery Time T
Notes: (1) These parameters are characterized and not 100% tested.
(2) See TOE spec in A.C. Read Cycle Timing Parameters
DH OEH
T
OE
T
OEHP
T
WR
.
10 - - nS 10 - - nS
- - - nS
0 - - nS
10 - - nS 10 - - nS
- - - nS
150 - - nS
0 - - nS
- 12 -
TIMING WAVEFORMS
WE
OEH
Read Cycle Timing Diagram
Address A15-0
CE
OE
V
WE
DQ7-0
IH
High-Z
W29EE512
T
RC
T
CE
T
OE
T
OHZ
T
OH
Data Valid
TAA
Data Valid
T
CHZ
High-Z
Controlled Write Cycle Timing Diagram
T
AS
Address A15-0
CE
OE
WE
DQ7-0
T
CS
T
OES
T
T
AH
T
CH
T
T
T
WP
T
DS
Data Valid
WPH
T
DH
WC
Internal write starts
Publication Release Date: April 2000
- 13 - Revision A6
Timing Waveforms, continued
CE
Controlled Write Cycle Timing Diagram
AS
T
Address A15-0
CE
T
OES
OE
WE
DQ7-0
High Z
W29EE512
T
T
AH
T
T
CP
Data Valid
T
DS
CPH
T
OEH
T
DH
Internal write starts
WC
Page Write Cycle Timing Diagram
Address A15-0
DQ7-0
CE
OE
WE
WP
T
T
WPH
Byte 0 Byte 1
- 14 -
BLC
T
Byte 2
Byte N-1
WC
T
Byte N
Internal write starts
Timing Waveforms, continued
DATA
Polling Timing Diagram
Address A15-0
WE
CE
OE
DQ7
W29EE512
TOEH
T
DH
T
OE
HIGH-Z
T
WR
Toggle Bit Timing Diagram
WE
CE
OE
DQ6
OEH
T
DH
T
OE
T
HIGH-Z
TWR
Publication Release Date: April 2000
- 15 - Revision A6
Timing Waveforms, continued
Page Write Timing Diagram Software Data Protection Mode
Byte/page load cycle starts
Address A15-0
Three-byte sequence for
software data protection mode
5555
2AAA
5555
W29EE512
T
WC
DQ7-0
CE
OE WE
AA 55 A0
T
T
WP
SW0
BLC
T
WPH
SW1
SW2
Word 0
Reset Software Data Protection Timing Diagram
Six-byte sequence for resetting
software data protection mode
Address A15-0
DQ7-0
5555 2AAA
AA
5555
55 80 AA
5555 2AAA 5555
Word N-1
55
Word N (last word)
20
Internal write starts
WC
T
CE
OE
WE
T
WP
SW0
T
BLC
WPH
T
SW1
SW2
- 16 -
SW3
SW4
SW5
Internal programming starts
Timing Waveforms, continued
5-Volt-only Software Chip Erase Timing Diagram
W29EE512
Address A15-0
DQ7-0
CE
OE
WE
5555 2AAA 5555
55 80
AA
T
WP
SW0
T
BLC
T
WPH
SW2
SW1
Six-byte code for 5V-only
software chip erase
2AAA
5555
AA
SW3 SW4 SW5
T
WC
5555
55
10
Internal programming starts
Publication Release Date: April 2000
- 17 - Revision A6
ORDERING INFORMATION
ACCESS
S)
W29EE512
PART NO.
TIME
(n
W29EE512P-70 70 50 100 32-pin PLCC 1K W29EE512P-90 90 50 100 32-pin PLCC 1K W29EE512P-12 120 50 100 32-pin PLCC 1K W29EE512T-70 70 50 100 Type one TSOP 1K W29EE512T-90 90 50 100 Type one TSOP 1K W29EE512T-12 120 50 100 Type one TSOP 1K W29EE512Q-70 70 50 100 Type one VSOP 1K W29EE512Q-90 90 50 100 Type one VSOP 1K W29EE512P-70B 70 50 100 32-pin PLCC 10K W29EE512P-90B 90 50 100 32-pin PLCC 10K W29EE512P-12B 120 50 100 32-pin PLCC 10K W29EE512T-70B 70 50 100 Type one TSOP 10K W29EE512T-90B 90 50 100 Type one TSOP 10K W29EE512T-12B 120 50 100 Type one TSOP 10K W29EE512Q-70B 70 50 100 Type one VSOP 10K W29EE512Q-90B 90 50 100 Type one VSOP 10K
POWER SUPPLY
CURRENT MAX.
(mA)
STANDBY VCC
CURRENT MAX.
(µA)
PACKAGE CYCLE
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications where personal injury might occur as a consequence of product failure.
- 18 -
PACKAGE DIMENSIONS
32-pin PLCC
H
E
E
1
324
30
5
13
14 20
L
e
θ
Seating Plane
b
1b
EG
W29EE512
0.140
0.1150.105 0.110
0.0320.026
0.022
0.014
0.553
0.453
0.530
0.430
0.595
0.495
0.095
0.004
°
10
Dimension In mm
0.50
2.802.67 2.93
0.66 0.81
0.71
0.41
0.46
0.20
0.25
13.89
13.97
11.35
11.43
1.12 1.420.044 0.056
1.27
12.95
12.45
9.91
10.41
14.86
14.99
12.32
12.45
1.91 2.29
°
0
14.05
11.51
13.46
10.92
15.11
12.57
3.56
0.56
0.35
2.41
0.10
°
10
Dimension In Inches
Symbol
29
D
D
H D
21
G
c
Min. Nom. Max. Max.Nom.Min.
A
0.020
A
1
A
2
b
1
0.016
b
0.008
c
0.547
D
0.447
E
e
0.490
GD
0.390
G
E
0.585
D
H
0.485
HE
0.075
L
y
°
0
θ
0.028
0.018
0.010
0.550
0.450
0.050
0.510
0.410
0.590
0.490
0.090
Notes:
2A
A
1
A
y
1. Dimensions D & E do not include interlead flash.
2. Dimension b does not include dambar protrusion/intrusion.
3. Controlling dimension: Inches.
4. General appearance spec. should be based on fina visual inspection sepc.
32-pin TSOP
H
D
D
c
M
e
E
0.10(0.004)
b
A
A
θ
L
L
1
2
A
1
Y
- 19 - Revision A6
Symbol
A A A
b
c D E
H e
L L
Y
θ
1
2
D
1
Dimension In Inches
Min. Nom.
__
__
__
0.002
0.037
0.039
0.007 0.008
0.005 0.006
0.720 0.724
0.311 0.315
0.780 0.787
__
0.020
0.016 0.020
__
0.031
0.000 0.004 1
3
Dimension In mm
0.20 0.23
0.15 0.17
18.40 18.50
8.00 8.10
20.00 20.20
0.50
0.50 0.60
0.80
1
Max.
__
1.20
__
0.15
1.051.00
__
__
____
0.10 5
3
Min. Nom.
Max.
__
0.047
0.006
0.05
0.95
0.041
0.17
0.009
0.12
0.007
18.30
0.728
7.90
0.319
19.80
0.795
__
__
0.40
0.024
__
__
0.00
5
Note: Controlling dimension: Millimeters
Publication Release Date: April 2000
Package Dimensions, continued
32-pin VSOP
M
e
0.10(0.004)
b
θ
L
W29EE512
H
D
D
A
A
1
E
Y
Dimension In Inches
Symbol
Min. Nom.
__
A
0.002
A
1
b
0.006 0.008
D
0.484 0.488
0.311 0.315
E
0.543 0.551
H
D
__
e
0.020 0.024
L
0.004 0.008
Y
0 5
θ
Note: Controlling dimension: Millimeters
__ __
0.020
__
Max.
0.047
0.006
0.010
0.492
0.319
0.559
__
0.028
Dimension In mm
Min. Nom.
__
__
__
0.05
0.15
0.20 0.25
12.30
12.40 12.50
7.90
8.00 8.10
13.80
14.00
__
0.50
0.50
0.60 0.70
____
0.10
__
0
Max.
1.20
0.15
14.20
__
0.20 5
- 20 -
VERSION HISTORY
VERSION DATE PAGE DESCRIPTION
A5 Mar. 1998 6 Add. pause 10 mS
7 Add. pause 50 mS
8 1, 2, 18, 19 Eliminate 600 mil DIP, 450 mil SOP packages
A6 Apr. 2000 1, 2, 18, 20 Add 32-pin VSOP package
3, 11
Correct the time from 10 mS to 10 µS
Change Byte Load Cycle Time from 150 µS to 200 µS
W29EE512
Headquarters
No. 4, Creation Rd. III, Science-Based Industrial Park, Hsinchu, Taiwan TEL: 886-3-5770066 FAX: 886-3-5796096 http://www.winbond.com.tw/ Voice & Fax-on-demand: 886-2-27197006
Taipei Office
11F, No. 115, Sec. 3, Min-Sheng East Rd., Taipei, Taiwan TEL: 886-2-27190505 FAX: 886-2-27197502
Note: All data and specifications are subject to change without notice.
Winbond Electronics (H.K.) Ltd.
Rm. 803, World Trade Square, Tower II, 123 Hoi Bun Rd., Kwun Tong, Kowloon, Hong Kong TEL: 852-27513100 FAX: 852-27552064
Winbond Electronics North America Corp. Winbond Memory Lab. Winbond Microelectronics Corp. Winbond Systems Lab.
2727 N. First Street, San Jose, CA 95134, U.S.A. TEL: 408-9436666
FAX: 408-5441798
Publication Release Date: April 2000
- 21 - Revision A6
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