– 3.0 to 3.6V Operating Range
– 64 Macrocells
– 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell
– 44, 68, 84, 100 Pins
–15nsMaximumPin-to-pinDelay
– Registered Operation up to 77 MHz
– Enhanced Routing Resources
• In-System Programmability (ISP) via JTAG
• Flexible Logic Macrocell
– D/T/Latch Configurable Flip-flops
– Global and Individual Register Control Signals
– Global and Individual Output Enable
– Programmable Out put Slew Rate
– Programmable Out put Open-collector Option
– Maximum Logic Utilization by Burying a Register with a COM Output
• Advanced Power Management Features
– Automatic 5 µA Standby for “L” Version
– Pin-control led 100 µA Standby Mode (Typical)
– Programmable Pin-keeper Circuits on Inputs and I/Os
– Reduced-power Feature per Macrocell
• Avai lable in Commercial and Industrial Temperature Ranges
• Avai lable in 44-, 68-, and 84-lead PLCC; 44- and 100-lead TQFP; and 100-lead PQFP
• Advanced EE Technology
– 100% Tested
– Completely Reprogrammable
– 10,000 Program/Erase Cycles
– 20 Year Data Retention
– 2000V ESD Protection
– 200 mA Latch-up Immunity
• JTAG Boundary-scan Testing to IEEE Std. 1149.1-1990 and 1149.1a-1993 Supported
DescriptionThe ATF1504ASV(L) is a high-p erformance, high-density complex programmable logic
device (CPLD ) that u tilizesAtmel’sproven electr ically-erasable memory technology.
With 64 logic macrocells and up to 68 inputs, it easily integrateslogicfromseveral TTL,
SSI, MSI, LSI and classic PLDs. The ATF1504ASV(L)’s enhanced routing s w it c h matricesincrease usab le ga te count and the odds of su ccessful pin-lockeddesi gn
modifications.
The ATF1504ASV(L) has up to 68 bi-directional I /O pins and four dedicated input pins,
depending on the type of device package selected. Each dedicatedpincanalsoserve
as a global control signal, register clock, regis terreset or output enable. Each of these
control signals can be selectedforuse individually within each macrocell.
Each of the 64 macrocells generates a buriedfeedback that goestothe global bus.
Each input and I/Opinalsofeeds into the global bus. The switch ma trix in each logic
block thenselects 40 individual si gnals from the global bus. Each macrocell also generatesafoldbacklogicterm that goestoareg ional bus. Cascade logic between
macrocells in the ATF1504ASV(L) allows fast, efficient generation of comp lex logic functions. The ATF 1504ASV(L) contains four such logic chains, each capable of creating
sum term l ogic with a fan-in of up to 40 product term s.
The ATF1504ASV(L)macrocell, shownin Figure1,isflexibleenough to s upport highlycomplex logic functions operat ing at high speed. The macrocell consi sts of five sections:
product terms and product term select multiplexer, OR/XOR/CASCADE logic, a flip-flop,
output select and enable, an d logic array inputs.
4
ATF1504ASV(L)
1409H–PLD–09/02
Page 5
Block Diagram
ATF1504ASV(L)
Product Terms and Select
Mux
1409H–PLD–09/02
Unused product terms are automatically disabledbythe co m p i l ertodecrease power
consum ptio n. Asecurity fuse,whenprogrammed , pr otects the contents of the
ATF1504ASV(L). Two bytes(16bits)ofUserSignature are accessible to the userfor
purposes such as storing project name, part number, revision or date. The User Signature is accessible regardless of the state of the security fuse.
The ATF 1504ASV( L)device is an in-system programmable (ISP)device. It usesthe
industry-st andard 4-pin JTAG interface (IEE E St d. 1149.1), and is fully-compliant with
JTAG’s Boundary-scan Description Language (BSDL). ISP allows the device to be programmed without removing it from the printed c ircuit board. I n addition to simplifying the
manufacturing flow, ISP also allows design modifications to be made in t he field via
software.
Each ATF1504ASV(L)macrocell has five product terms. Each product term receivesas
its inputs all signals from both the global bus and regional bus .
The product term select multiplexer(PTMUX) allocatesthe five product term s a s
neededtothe macrocell logic gates a nd control signal s . ThePTMUX programming is
determinedbythe design compiler, which selects the optimum macrocell configuration.
5
Page 6
OR/XOR/CASCADE LogicThe ATF1504ASV(L)’s logic structure is designedtoefficiently support all types of logic.
Within a single macrocell, all the product terms can be routedtothe OR gate,creating a
5-input AND/OR sum term. With the addition of t he CASIN from neigh boring macrocells,
this can beexpandedtoasmanyas40 product terms with little additio nal delay.
The macrocell’sXOR gate allows efficient im plementation of compare and arithmetic
functions. One input to the XOR comesfromthe OR sum term. The otherXOR input can
be a product term or a fixed high- or low-level. For co mbi natorial outputs, the fixedlevel
input allows polarity selection. For registered functions, the fixedlevels allow DeMorgan
minimization of product terms. The XOR gate is also usedtoemulate T- an d JK-type
flip-flops.
Flip-flopThe ATF1504ASV(L)’s flip-flop has very flexible data and control functions. The data
input can come from eitherthe XOR gate,fromaseparat e product term o r directly from
the I/Opin. Selecting the sepa rate product term allows creation of a buriedregistered
feedback within a combinatorial output macrocell. (This feature is automatically implementedbythe fitter software). In ad dition to D,T,JKandSR operation, the flip-flop can
also be configured as a flow-through latch. In this mode, data passes through whenthe
clock is high and is latchedwhenthe clock is low.
The clock itself can eitherbe one of the Global C LK Signal (GCK[0 : 2]) or an individual
product term. The flip-flop changesstate on the clock’s rising edge. Whenthe GCK signal is usedasthe clock, one of the macrocell product terms c an be selectedasaclock
enable. Whenthe clock enable function is active and theenable signal (produc t term) is
low, all clock edgesare ignored. The flip-flop’s asynchronous resetsignal(AR)canbe
eitherthe G lobal Clear (GCLEAR), a product term, or always off. AR canalsobe a logic
OR of GCLEAR with a product term. The asy nc hronous preset(AP)canbe aproduct
term or always off.
Extra FeedbackThe ATF1504ASV(L)macrocell output can be selectedasregistered or combina to rial.
Theextra buriedfeedback si gnal can beeither combinatorial o r a registered signa l
regardl ess of wh etherthe output is combinatorial or registered. (This enhan cement
function is automatically implementedbythe fittersoftware.)Feedback o f a b uried
combinatorial output allows the creation of a second latch within a macrocell.
I/O ControlThe output enable multiplexer(MOE)controlsthe output enable sig nal. Each I/Ocanbe
individually configured as an input, output or for bi-directional operation. The output
enable for each macrocell can be selectedfromthe true or compliment of the tw o output
enable pins, a subsetofthe I/O pins, or a subsetofthe I/Omacrocells. This selection is
automatically done by the fitter software whenthe I/Oisconfigured as an input, all mac-
rocell resourcesare still available, including t he buriedfeedback, expander and cascade
logic.
Global Bus/Switch MatrixThe global bus contains a ll input and I/O pin signals as well as the buriedfeedback sig-
nal from all 64 macrocells. The switch matrix in eac h logic block receivesasitsinputsall
signals from the global bus. Un der software control, up to 40 of these signals can be
selected as inputs t o the logic block.
Foldback BusEach macrocell also generates a foldback product term. This signal goestothe regional
bus and is available to four macrocells. The foldback is an inverse polarity of one of the
macrocell’sproductterms. The four foldback terms in each r egion allow generation of
high fan-in sum terms (up to nine product terms) with little additional delay.
6
ATF1504ASV(L)
1409H–PLD–09/02
Page 7
Figure 1. ATF1504ASV(L)Macrocell
ATF1504ASV(L)
Programmable Pin-keeper Option for Inputs and I/Os
The ATF1504ASV( L)offers the option of programming all input and I/Opinssothatpinkeepercircuitscanbe utilized.
Whenanypinisdrivenhighorlowandthen subsequently left floating, it will stay at that previous high- or low-level. This cir-
cuitry prevents unusedinputandI/Olines from floating to intermedi atevoltage levels, which causesunneces sary p ow er
consumption and system noise. The keepercircuitseliminate the needforexternal pull-up resistors and eliminate their DC
power consumption.
1409H–PLD–09/02
7
Page 8
Input Diagram
I/O Diagram
Speed/Power
Management
8
ATF1504ASV(L)
The ATF1504ASV(L) has several built-in speed and power management feat ur es. The
ATF1504ASV(L) co ntai ns circuitry that autom aticall y puts the device into a low power
standby mode when no lo gic transitions are oc curring. This not only reducespower consumption during inactive periods, but also provides proportional powersavi ngs for most
applications running at systemspeeds below 5 MHz. This feature may be selectedasa
device option.
To furtherreduc e power, eac h ATF1504ASV(L)macrocell has a reduced-powerbitfea-
ture. Thi s feature allows individual macrocells to be configured for maximum power
savings. This feature may be selectedasadesign option.
All ATF1504ASV(L)alsohave an optional power-down mode. In this mode,current
drops to below 5 mA. Whenthe power-dow n option is selected, either PD1 or PD2 pins
(or both) can be usedtopower down the part. The power-down option is selectedinthe
design source file. When enabled, the device goes into pow er down when either PD1 or
PD2 is high. In the pow er-down mode, all internal logic signals are latched and held, as
are any enabled outputs.
All pin transitions are ignored until thePDpin is brought low. Whenthe power-down fea-
ture is enabled, thePD1or PD2 pin c annot be used as a logic in put or output.However,
the pin’smacrocel l ma y still b e usedtogenerate buried foldback and cascade logic
signals.
1409H–PLD–09/02
Page 9
ATF1504ASV(L)
All power-down AC c haracteristic parameters are computedfromexternal inpu t or I/O
pins, with reduced-powerbitturnedon. For macrocells in reduced-powermode
(reduced-powerbitturned on), t he reduced-power adder, t
parameters, which include the data paths t
LAD,tLAC,tIC,tACL,tACH
The ATF1504ASV(L)macrocell also has an option whereby the powercanbe reduced
on a permacrocell basis. By enabling this power-down option, macrocells that are not
used in an application can be turned down, thereby reducing the overall power consumption of the device.
Each output also has individual slewrate co ntrol. This may be usedtoreduce s yst em
noise by slowing down outputs that do not needtooperate at maximum speed. Outputs
default to slow switching, and may be specified as f as t switching in the design file.
,mustbe addedtothe AC
RPA
and t
SEXP
.
Design So ft ware
Support
ATF1504ASV(L)designs are s upportedbyseveral industry standard third party tools.
Automatedfitters allow logic s yn thesi s usi n g a variety of high-leveldescription languages and formats.
Power-up ResetThe ATF1504ASV is designed with a power-up reset, a feature critical for state machine
initialization. At a point delayedslightlyfromV
tialized, and the state of each output will depend on the polarity of its buffer.However,
due to the asynchronous nature of resetanduncertainty of how V
system, the following conditions are required:
1. The V
rise must be monotonic,
CC
2. Afterreset occurs, all input and feedback setup timesmustbe metbefore dr iving
the clock pin high, and,
3. The c lock must remain stable during T
D
The ATF1504ASV has two options for the hysteresis about the resetlevel, V
and Large. To ensure a robust operating environment in applications where the device
is operatednear 3.0V, Atmelrecommends that during the fitting process users configure
the device with thePower-up Resethysteresis settoLarge. For conversions, A tmelPOF2JED users should i nc lude the flag “-power_reset” on the command line after “filename.POF”. To allow the registers to be properly reinitializedwiththeLarge hysteresis
option selected, the following condition is added:
4. If V
falls below 2.0V, it must shut off completely before the device is turnedon
CC
again.
.
crossing V
CC
,allregisters will be ini-
RST
actually risesinthe
CC
RST
,Small
WhentheLarge hysteresisoptionisactive,I
is reducedbyseveral hundredmicro-
CC
amps as well.
Security Fuse UsageAsingle fuse is providedtoprevent unau thorized copying of the ATF1504ASV(L)fuse
patterns. Onc e programmed, fuseverify is inhibited.However, the16-bit User Signature
remains accessible.
1409H–PLD–09/02
9
Page 10
ProgrammingATF1504ASV(L)devicesare in-system programma ble (ISP)devices utilizing the4-pin
JTAG protocol. This capability eliminates package handling normally required for programming and facilitates rapid d esign itera tio ns and field changes.
AtmelprovidesISP hardwa re and software to allow programming of the
ATF1504ASV(L) via thePC. ISP is performedbyusingeither a download cable,acom-
parable board testerorasimple microprocessor interface.
To facilitate ISP programming by the AutomatedTest Equipment (ATE) vendors. Serial
Vector Format (SVF) filescanbe createdbyAtmelprovidedsoftware utilities.
ATF1504ASV(L)devicescanalsobe programmed using standard third-party program-
mers. With thir d-party programmerthe JTAG ISP port can be disabledthereby allowing
four additional I/Opinstobe used for logic.
Contact you r local AtmelrepresentativesorAtmel PLD applications for details.
ISP Programming
Protection
The ATF1504ASV(L) has a special feature that lock s the device and prevents the inputs
and I/O fro m driving if the prog ram ming p rocess is interru pted for any reason. The
inputs and I/Odefault to high-Z state during s uc h a condition. I n addition the pin keeper
option preservesthe formerstate during device prog ramming, if this circuit were previ-
ously programmedonthe device. This prevents disturbing the operation of other circuits
in the systemwhile the ATF1504ASV(L)isbeing programmed via ISP.
All ATF1504ASV(L)devicesare initially shipp edintheerasedstate thereby making
themready to use for ISP.
Note:Formore information refertothe“Designing for In-System Programmability with Atmel
CPLDs” application note.
10
ATF1504ASV(L)
1409H–PLD–09/02
Page 11
ATF1504ASV(L)
DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Ambient))0
V
(3.3V) Power Supply3.0V-3.6V3.0V-3.6V
CC
DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
I
IH
I
OZ
I
CC1
I
CC2
I
CC3
V
IL
V
IH
V
OL
V
OH
Notes: 1. Not more than one output at a time should be shor ted.Duration of short circuit test should not exceed30 sec.
Input or I/O Low
LeakageCurrent
V
IN=VCC
Input or I/O High
LeakageCurrent
Tri-State Output
Off-State Current
V
or GND-4040µA
O=VCC
Com.60mA
Power Supply Current,
Standby
Power Supply Current,
Power-down Mode
Reduced-powerMode
(2)
Supply Current, Standby
VCC=Max
= 0,V
V
IN
VCC=Max
= 0,V
V
IN
VCC=Max
= 0,V
V
IN
Std Mode
CC
“L” Mode
“PD” Mode0.15mA
CC
Std Power
CC
Ind.75mA
Com.5µA
Ind.5µA
Com40ma
Ind55
Input Low Voltage-0.30.8V
Input High Voltage1.7V
Output Low Voltage (TTL)
Output Low Voltage (CMOS)
Output High Voltage
-3.3V (TTL)
Output High Voltage
-3.3V (CMOS)
V
V
V
VCC=Min,IOL= 0.1 mA
VIN=VIHor V
V
V
V
or V
IN=VIH
CCIO
IN=VIH
CCIO
IN=VIH
CCIO
IL
=Min,IOL=8mA
or V
IL
IL
=Min,IOH=-2.0 mA
or V
IL
=Min,IOH=-0.1 mA
Com.0.45V
Ind.0.45
Com.0.2V
Ind.0.2V
V
2. Whenmicrocell reduced-powerfeature is enabled.
°C-70°C-40°C-85°C
-2-10µA
210
+ 0.3V
CCIO
2.4V
- 0.2V
CCIO
Pin Capacitance
TypMaxUnitsConditions
C
IN
C
I/O
8pFV
8pFV
Note:Typicalvalues for nominal supply voltage. This parameter is only sampled and is not 100%tested.
The OGI pin (high-voltage pin during programming)has a maximum capacitance of 12 pF.
1409H–PLD–09/02
= 0V; f = 1.0 MHz
IN
= 0V;f=1.0 MHz
OUT
11
Page 12
Absolute Maximum Ratings*
Temperature UnderBias.................................. -40°Cto+85°C
Respect to Ground .........................................-2.0Vto+7.0V
Voltage on Input Pins
with Re spect to Ground
During Programming.....................................-2.0Vto+14.0V
ProgrammingVoltage with
Respect to Ground .......................................-2.0Vto+14.0V
Timing Model
Internal Output
Enable Delay
t
IOE
Global Control
Input
Delay
t
IN
Switch
Matrix
t
UIM
Delay
t
GLOB
Logic Array
Delay
t
LAD
Register Control
Delay
t
LAC
t
IC
t
EN
FoldbackTerm
Delay
t
SEXP
(1)
(1)
(1)
Cascade Logic
*NOTICE:Stressesbeyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functionaloperation of the device at these or any
other conditions beyond those indicatedinthe
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extendedperiods may affect
device reliability.
Note:1.Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulsesofless than 20 ns. Max-
imum output pin voltage is V
+ 0.75V DC,
CC
which may overshoot to 7.0V for pulsesofless
than 20 ns.
Register
Delay
t
PEXP
Fast Input
Delay
t
FIN
Delay
t
SU
t
H
t
PRE
t
CLR
t
RD
t
COMB
t
FSU
t
FH
Output
Delay
t
OD1
t
OD2
t
OD3
t
XZ
t
ZX1
t
ZX2
t
ZX3
I/O
Delay
t
IO
12
ATF1504ASV(L)
1409H–PLD–09/02
Page 13
AC Characteristics
ATF1504ASV(L)
-15-20
SymbolParameter
t
PD1
t
PD2
t
SU
t
H
t
FSU
t
FH
t
COP
t
CH
t
CL
t
ASU
t
AH
t
ACOP
t
ACH
t
ACL
t
CNT
f
CNT
t
ACNT
f
ACNT
f
MAX
t
IN
t
IO
t
FIN
t
SEXP
t
PEXP
t
LAD
t
LAC
t
IOE
t
OD1
t
OD2
t
OD3
t
ZX1
Input or Feedback to Non-Registered Output31520ns
I/O Input or Feedback to Non-RegisteredFeedback31216ns
Global Clock Setup Time1113.5ns
Global Clock Hold Time00ns
Global Clock Setup Time of Fast Input33ns
Global Clock Hold Time of FastInput1.02MHz
Global Clock to Output Delay912ns
Global Clock High Time56ns
Global Clock Low Time56ns
Array Clock Setup Time57ns
Array Clock Hold Ti me44ns
Array Clock Output Delay1518.5ns
Array Clock High Time68ns
Array Clock Low Time68ns
Minimum Clock Global Period1317ns
Maximum Internal Global Clock Frequency76.966MHz
Minimum Array Clock Period1317ns
Maximum Internal Array Clock Frequency76.958.8MHz
Maximum Clock Frequency10083.3MHz
Input Pad and Buffer Delay22.5ns
I/O Input Pad and Buffer Delay22.5ns
Fast Input Delay22ns
FoldbackTerm Delay810ns
CascadeLogic Delay11ns
Logic Array Delay68ns
Logic Control Delay3.54. 5ns
Internal Output EnableDelay33ns
Output Buffer and Pad Delay
(Slow slewrate = OFF; V
Output Buffer and Pad Delay
(Slow slewrate = OFF; V
Output Buffer and Pad Delay
(Slow slewrate =ON;V
Output Buffer EnableDelay
(Slow slewrate = OFF; V
=5V;CL=35pF)
CCIO
=3.3V; CL=35pF)
CCIO
=5Vor3.3V; CL=35pF)
CCIO
=5.0V; CL=35pF)
CCIO
UnitsMinMaxMinMax
34ns
34ns
56ns
79ns
1409H–PLD–09/02
13
Page 14
AC Characteristics (Continued)
SymbolParameter
-15-20
UnitsMinMaxMinMax
t
ZX2
t
ZX3
t
XZ
t
SU
t
H
t
FSU
t
FH
t
RD
t
COMB
t
IC
t
EN
t
GLOB
t
PRE
t
CLR
t
UIM
t
RPA
Output Buffer EnableDelay
(Slow slewrate = OFF; V
=3.3V; CL=35pF)
CCIO
Output Buffer EnableDelay
(Slow slewrate =ON;V
=5.0V/3.3V; CL=35pF)
CCIO
Output Buffer DisableDelay (CL=5pF)67ns
RegisterSetup Time56ns
Register Hold Time45ns
RegisterSetup Time of Fast I nput22ns
Register Hold Time of Fast Input22ns
Register Delay22.5ns
Combinatorial Delay23ns
Array Clock Delay67ns
Register Enable Time67ns
Global Control Delay23ns
Register PresetTime45ns
RegisterClear Time45nsSwitch Mat r ix Delay22.5ns
Reduced-powerAdder
(2)
Notes: 1. See ordering information for valid part numbers.
2. The t
parametermustbe addedtothe t
RPA
LAD,tLAC,tTIC,tACL
powermode.
3. See ordering information for valid part numbers.
,andt
79ns
1011ns
1013ns
parameters for macrocells running in the reduced-
SEXP
Input Test Waveforms and Measurement Levels
tR,tF= 1.5nstypical
Output AC T est Loads
3.0V
R1 = 703Ω
OUTPUT
PIN
CL=35pFR2 = 8060Ω
14
ATF1504ASV(L)
1409H–PLD–09/02
Page 15
ATF1504ASV(L)
Power-down ModeThe ATF1504ASV(L)includes an optional pin-controlledpower-down feature. Whenthis
mode is enabled, thePDpin acts as the power-down pin. WhenthePDpin is high, the
device supply c urrent is reducedtoless than 3 mA.During p ow er down, all output data
and internal logic statesare latchedinternally and held. Therefore,allregistered and
combinatorial output data rema in valid. Any outputs that were in a High-Z state at the
onset will remain at High-Z.During power down , all input signals except the power-down
pin are blocked. Input a nd I/O hold latchesremain active to ensure that pins do not float
to indeterminate levels, furtherreducing systempower. The power-down mode feature
is enabledinthe logic design file or as a fittedortranslateds/woption.Designs using
the power-down pin may not u se thePDpin as a logic array inp ut.However, all other PD
pin macrocell resourcesmaystillbe used, including the buriedfeedback and foldback
product term array inp uts.
Power Down AC Characteristics
SymbolParameter
t
IVDH
t
GVDH
t
CVDH
t
DHIX
t
DHGX
t
DHCX
t
DLIV
t
DLGV
t
DLCV
t
DLOV
Notes: 1. For slow slew outputs, add t
Valid I, I/ObeforePDHigh1520ns
Valid OE
Valid Clock
(2)
beforePDHigh1520ns
(2)
beforePDHigh1520ns
I, I/O Don’tCare after PD High2530ns
(2)
OE
Don’tCare after PD High2530ns
(2)
Clock
Don’tCare after PD High2530ns
PD Low to Valid I, I/O11µs
PD Low to Valid OE (Pin or Term)11µs
PD Low to Valid Clock (Pin or Term)11µs
PD Low to Valid Output11µs
.
SSO
2. Pin or product term.
3. Includest
for reduced-powerbitenabled.
RPA
(1)(2)
-15-20
UnitsMinMaxMinMax
1409H–PLD–09/02
15
Page 16
JTAG-BST/ISP
Overview
The JTAG boundary-scan testing is controlledbythe Test Access Port (TAP)controller
in the ATF1504ASV(L). The boundary-s c an technique involvesthe inclusion of a shiftregisterstage (contained in a boundary - scan cell) adjacent to each component so that
signals at component boundariescanbe controlled and observed using scan testing
principles. Each input pin and I/O pin has its own boundary-sc an cell (BSC) in o rderto
support boundary-scan testing. The ATF1504ASV(L)doesnotcurrently include aTest
Reset(TRST) input pin because the TAP controller is automati cally resetatpower-up.
The five JTA G modes supportedinclude:SAMPLE/PRELOAD, EXTEST, BYPASS,
IDCODEandHIGHZ. The ATF1504ASV(L)’sISP can be fully describedusingJTAG’s
BSDL as descr ib ed in IEEE Standard 1149 . 1b. This allows ATF1504 ASV(L)programming to be descr i bed and i mplemented using any one of the third-party development
tools supporting this standard.
The ATF1504ASV(L) has the option of using four JTA G-s ta ndard I/O pins for boundaryscan testing (BST) and in-system programming (ISP) purposes. The ATF1504ASV(L)is
programmable through the four JTAG pins using the IEEE standa rd JTAG programming
protocol established by IEEE Standard 1149.1 using 5V TTL-level programming s ignals
from the IS P interface for in-system programming. The JT AG feature is a programmabl e
option. If JTAG (BST or ISP)isnotneeded, thenthe four JTAG control pins are available as I/Opins.
JTAG Boundary-scan
Cell (BSC) Testing
BSC Configuration
for Input and I/O Pins
(Except JTAG TAP
Pins)
The ATF1504AS V(L)containsupto68I/O pins and four in put pins, dependingonthe
device type an d package type selected. Each input pin and I/O pin has its own boundary-scan cell (BSC) in order to support boundary-scan testing as describedindetail by
IEEE Standard 1149.1. A typical BSC consists of three capture registers or scan registers and up to two update registers. There are two types of BSCs, one for input o r I/O
pin, and on e for the macrocells. The BSCs in the device are chainedtogether through
the capture registers. Input to the capture register chain is fedinfromthe TDI pin while
the output is directedtothe TDOpin. C apture registers are used to capture active
devicedata signals, to shift data in and out of the device and to load data into the update
registers. Cont rol signals are generatedinternally by the JTAG TAP con troller. The BSC
configuration for the input and I/O pins and macrocells are shown below.
16
Note:The ATF1504ASV(L) has pull-up option on TMS and TDIpins. This feature is selectedas
There is very little risk in using “C” devices for industrial applications because the VCCconditions for 3.3V products are the
same for commercial and industrial (there is only 15°Cdifference at the high end of the temperature range). To use com-
mercial product for industrial temperature ranges, de-rate I
22
ATF1504ASV(L)
by 15%.
CC
1409H–PLD–09/02
Page 23
Packaging Information
44A – TQFP
PIN 1
ATF1504ASV(L)
B
PIN 1 IDENTIFIER
e
E1E
D1
D
C
0˚~7˚
A1
L
Notes:1. This package conforms to JEDEC reference MS-026, Variation ACB.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.10 mm maximum.
A2A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A––1.20
A10.05–0.15
A2 0.951.001.05
D11.7512.0012.25
D19.9010.0010.10Note 2
E11.7512.0012.25
E19.9010.0010.10Note 2
B 0.30–0.45
C0.09–0.20
L0.45– 0.75
e0.80 TYP
NOM
MAX
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
1409H–PLD–09/02
TITLE
44A, 44-lead, 10 x 10 mm Body Size, 1.0 mm Body Thickness,
0.8 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
10/5/2001
DRAWING NO.
44A
REV.
B
23
Page 24
44J–PLCC
1.14(0.045) X 45°
B
e
0.51(0.020)MAX
45° MAX (3X)
Notes:1. This package conforms to JEDEC reference MS-018, Variation AC.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Notes:1. This package conforms to JEDEC reference MS-018, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Notes:1. This package conforms to JEDEC reference MS-018, Variation AF.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Dimensions in Millimeters and (Inches)*
*Controlling dimensions: millimeters
JEDEC STANDARD MS-022, GC-1
ATF1504ASV(L)
PIN1ID
0.65 (0.0256) BSC
0.40 (0.016)
0.22 (0.009)
0.23 (0.009)
0º~7º
0.11 (0.004)
PIN 1
17.45 (0.687)
16.95 (0.667)
14.12 (0.556)
13.90 (0.547)
1.03 (0.041)
0.73 (0.029)
20.10 (0.791)
19.90 (0.783)
23.45 (0.923)
22.95 (0.904)
3.40 (0.134) MAX
0.50 (0.020)
0.25 (0.010)
R
1409H–PLD–09/02
2325 Orchard Parkway
San Jose, CA 95131
TITLE
100Q1, 100-lead, 14 x 20 mm Body, 3.2 mm Footprint, 0.65 mm Pitch,
Plastic Quad Flat Package (PQFP)
04/11/2001
DRAWING NO.
100Q1
REV.
A
27
Page 28
100A – TQFP
PIN 1
B
PIN 1 IDENTIFIER
e
E1E
D1
D
C
0˚~7˚
A1
L
Notes:1. This package conforms to JEDEC reference MS-026, Variation AED.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.08 mm maximum.
A2A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A––1.20
A10.05–0.15
A2 0.951.001.05
D15.7516.0016.25
D113.9014.0014.10Note 2
E15.7516.0016.25
E113.9014.0014.10Note 2
B 0.17–0.27
C0.09–0.20
L0.45– 0.75
e0.50 TYP
NOM
MAX
NOTE
28
2325 Orchard Parkway
R
San Jose, CA 95131
100A, 100-lead, 14 x 14 mm Body Size, 1.0 mm Body Thickness,
0.5 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
Atmel C orpo rat io n makesnowarrantyforthe use of its products, other than tho seexpressly containedinthe C om p any’s standard wa rr an t y
which is detailedinAtmel’sTerms and Condi t io ns l oc atedonthe Co mpany’swebsite. The Company assu m esnoresponsibility for any erro rs
which may appear in this docum ent, reservesthe r igh t to c ha nge devicesorspecifications detai ledherein at any time without notice, and does
not make any co mmitm ent to update the information containedherein. No licensestopatents or otherintellectual property of Atmelare gr anted
by the Company in co nnectionwiththe sale of Atmelproducts,exp r essly or by implication. Atmel’sproductsare not authori zedforuse as cr itical
components in life support devices o r systems.
ATMEL®is the regi steredtrademark of Atmel.
Otherterms and product namesmaybe the trademarks of others.
Printedonrecycledpaper.
1409H–PLD–09/02xM
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