– 64 Macrocells
– 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell
– 44, 68, 84, 100 Pins
– 7.5 ns Maximum Pin-to-pin Delay
– Registered Operation up to 125 MHz
– Enhanced Routing Resources
• In-System Programmability (ISP) via JTAG
• Flexible Logic Macrocell
– D/T/Latch Configurable Flip-flops
– Global and Individual Register Control Signals
– Global and Individual Output Enable
– Programmable Output Slew Rate
– Programmable Output Open Collector Option
– Maximum Logic Utilization by Burying a Register with a COM Output
• Advanced Power Management Features
– Automatic µA Standby for “L” Version
– Pin-controlled 1 mA Standby Mode
– Programmable Pin-keeper Circuits on Inputs and I/Os
– Reduced-power Feature per Macrocell
• Available in Commercial and Industrial Temperature Ranges
• Available in 44-, 68-, and 84-lead PLCC; 44- and 100-lead TQFP; and 100-lead PQFP
DescriptionThe ATF1504AS is a high-performance, high-density complex programmable logic
device (CPLD) that utilizes Atmel’s proven electrically-erasable memory technology.
With 64 logic macrocells and up to 68 inputs, it easily integrates logic from several TTL,
SSI, MSI, LSI and classic PLDs. The ATF1504AS’s enhanced routing switch matrices
increase usable gate count and the odds of successful pin-locked design modifications.
The ATF1504AS has up to 68 bi-directional I/O pins and four dedicated input pins,
depending on the type of device package selected. Each dedicated pin can also serve
as a global control signal, register clock, register reset or output enable. Each of these
control signals can be selected for use individually within each macrocell.
Each of the 64 macrocells generates a buried feedback that goes to the global bus.
Each input and I/O pin also feeds into the global bus. The switch matrix in each logic
block then selects 40 individual signals from the global bus. Each macrocell also generates a foldback logic term that goes to a regional bus. Cascade logic between
macrocells in the ATF1504AS allows fast, efficient generation of complex logic functions. The ATF1504AS contains four such logic chains, each capable of creating sum
term logic with a fan-in of up to 40 product terms.
The ATF1504AS macrocell, shown in Figure 1, is flexible enough to support highly-complex logic functions operating at high speed. The macrocell consists of five sections:
product terms and product term select multiplexer, OR/XOR/CASCADE logic, a flip-flop,
output select and enable, and logic array inputs.
4
ATF1504AS(L)
0950N–PLD–07/02
Block Diagram
ATF1504AS(L)
I/O (MC64)/GCLK3
Unused product terms are automatically disabled by the compiler to decrease power
consumption. A security fuse, when programmed, protects the contents of the
ATF1504AS. Two bytes (16 bits) of User Signature are accessible to the user for purposes such as storing project name, part number, revision or date. The User Signature
is accessible regardless of the state of the security fuse.
The ATF1504AS device is an in-system programmable (ISP) device. It uses the industry-standard 4-pin JTAG interface (IEEE Std. 1149.1), and is fully-compliant with JTAG’s
Boundary-scan Description Language (BSDL). ISP allows the device to be programmed
without removing it from the printed circuit board. In addition to simplifying the manufacturing flow, ISP also allows design modifications to be made in the field via software.
0950N–PLD–07/02
5
Product Terms and Select
Mux
OR/XOR/CASCADE LogicThe ATF1504AS’s logic structure is designed to efficiently support all types of logic.
Flip-flopThe ATF1504AS’s flip-flop has very flexible data and control functions. The data input
Each ATF1504AS macrocell has five product terms. Each product term receives as its
possible inputs all signals from both the global bus and regional bus.
The product term select multiplexer (PTMUX) allocates the five product terms as
needed to the macrocell logic gates and control signals. The PTMUX programming is
determined by the design compiler, which selects the optimum macrocell configuration.
Within a single macrocell, all the product terms can be routed to the OR gate, creating a
5-input AND/OR sum term. With the addition of the CASIN from neighboring macrocells,
this can be expanded to as many as 40 product terms with a little small additional delay.
The macrocell’s XOR gate allows efficient implementation of compare and arithmetic
functions. One input to the XOR comes from the OR sum term. The other XOR input can
be a product term or a fixed high- or low-level. For combinatorial outputs, the fixed level
input allows polarity selection. For registered functions, the fixed levels allow DeMorgan
minimization of product terms. The XOR gate is also used to emulate T- and JK-type
flip-flops.
can come from either the XOR gate, from a separate product term or directly from the
I/O pin. Selecting the separate product term allows creation of a buried registered feedback within a combinatorial output macrocell. (This feature is automatically implemented
by the fitter software). In addition to D, T, JK and SR operation, the flip-flop can also be
configured as a flow-through latch. In this mode, data passes through when the clock is
high and is latched when the clock is low.
The clock itself can be either one of the Global CLK Signals (GCK[0 : 2]) or an individual
product term. The flip-flop changes state on the clock’s rising edge. When the GCK signal is used as the clock, one of the macrocell product terms can be selected as a clock
enable. When the clock enable function is active and the enable signal (product term) is
low, all clock edges are ignored. The flip-flop’s asynchronous reset signal (AR) can be
either the Global Clear (GCLEAR), a product term, or always off. AR can also be a logic
OR of GCLEAR with a product term. The asynchronous preset (AP) can be a product
term or always off.
Output Select and EnableThe ATF1504AS macrocell output can be selected as registered or combinatorial. The
buried feedback signal can be either combinatorial or registered signal regardless of
whether the output is combinatorial or registered.
The output enable multiplexer (MOE) controls the output enable signals. Any buffer can
be permanently enabled for simple output operation. Buffers can also be permanently
disabled to allow use of the pin as an input. In this configuration all the macrocell
resources are still available, including the buried feedback, expander and CASCADE
logic. The output enable for each macrocell can be selected as either of the two dedicated OE input pins as an I/O pin configured as an input, or as an individual product
term.
Global Bus/Switch MatrixThe global bus contains all input and I/O pin signals as well as the buried feedback sig-
nal from all 64 macrocells. The switch matrix in each logic block receives as its possible
inputs all signals from the global bus. Under software control, up to 40 of these signals
can be selected as inputs to the logic block.
6
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
Foldback BusEach macrocell also generates a foldback product term. This signal goes to the regional
bus and is available to four macrocells. The foldback is an inverse polarity of one of the
macrocell’s product terms. The sixteen foldback terms in each region allow generation
of high fan-in sum terms (up to sixteen product terms) with a nominal additional delay.
Figure 1. ATF1504AS Macrocell
0950N–PLD–07/02
7
Programmable Pinkeeper Option for
Inputs and I/Os
Input Diagram
The ATF1504AS offers the option of programming all input and I/O pins so that pinkeeper circuits can be utilized. When any pin is driven high or low and then subsequently left floating, it will stay at that previous high- or low-level. This circuitry prevents
unused input and I/O lines from floating to intermediate voltage levels, which causes
unnecessary power consumption and system noise. The keeper circuits eliminate the
need for external pull-up resistors and eliminate their DC power consumption.
Speed/Power
Management
I/O Diagram
The ATF1504AS has several built-in speed and power management features. The
ATF1504AS contains circuitry that automatically puts the device into a low-power
standby mode when no logic transitions are occurring. This not only reduces power consumption during inactive periods, but also provides proportional power savings for most
applications running at system speeds below 5 MHz. This feature may be selected as a
device option.
To further reduce power, each ATF1504AS macrocell has a Reduced Power bit feature.
This feature allows individual macrocells to be configured for maximum power savings.
This feature may be selected as a design option.
All ATF1504AS also have an optional power-down mode. In this mode, current drops to
below 10 mA. When the power-down option is selected, either PD1 or PD2 pins (or
both) can be used to power-down the part. The power-down option is selected in the
design source file. When enabled, the device goes into power-down when either PD1 or
PD2 is high. In the power-down mode, all internal logic signals are latched and held, as
are any enabled outputs.
8
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
All pin transitions are ignored until the PD pin is brought low. When the power-down feature is enabled, the PD1 or PD2 pin cannot be used as a logic input or output. However,
the pin’s macrocell may still be used to generate buried foldback and cascade logic
signals.
All power-down AC characteristic parameters are computed from external input or I/O
pins, with Reduced Power Bit turned on. For macrocells in reduced-power mode
(reduced-power bit turned on), the reduced-power adder, tRPA, must be added to the
AC parameters, which include the data paths t
LAD,tLAC,tIC,tACL,tACH
The ATF1504AS macrocell also has an option whereby the power can be reduced on a
per macrocell basis. By enabling this power-down option, macrocells that are not used
in an application can be turned-down, thereby reducing the overall power consumption
of the device.
Each output also has individual slew rate control. This may be used to reduce system
noise by slowing down outputs that do not need to operate at maximum speed. Outputs
default to slow switching, and may be specified as fast switching in the design file.
and t
SEXP
.
Design Software
Support
ATF1504AS designs are supported by several industry-standard third-party tools. Automated fitters allow logic synthesis using a variety of high level description languages
and formats.
Power-up ResetThe ATF1504AS is designed with a power-up reset, a feature critical for state machine
initialization. At a point delayed slightly from V
tialized, and the state of each output will depend on the polarity of its buffer. However,
due to the asynchronous nature of reset and uncertainty of how V
system, the following conditions are required:
1. The V
rise must be monotonic,
CC
2. After reset occurs, all input and feedback setup times must be met before driving
the clock pin high, and,
3. The clock must remain stable during T
D
The ATF1504AS has two options for the hysteresis about the reset level, V
and Large. During the fitting process users may configure the device with the Power-up
Reset hysteresis set to Large or Small. Atmel POF2JED users may select the Large
option by including the flag “-power_reset” on the command line after “filename.POF”.
To allow the registers to be properly reinitialized with the Large hysteresis option
selected, the following condition is added:
4. If V
falls below 2.0V, it must shut off completely before the device is turned on
CC
again.
When the Large hysteresis option is active, I
amps as well.
crossing V
CC
, all registers will be ini-
RST
actually rises in the
CC
.
is reduced by several hundred micro-
CC
RST
,Small
Security Fuse UsageA single fuse is provided to prevent unauthorized copying of the ATF1504AS fuse pat-
terns. Once programmed, fuse verify is inhibited. However, the 16-bit User Signature
remains accessible.
0950N–PLD–07/02
9
ProgrammingATF1504AS devices are in-system programmable (ISP) devices utilizing the 4-pin JTAG
protocol. This capability eliminates package handling normally required for programming
and facilitates rapid design iterations and field changes.
Atmel provides ISP hardware and software to allow programming of the ATF1504AS via
the PC. ISP is performed by using either a download cable or a comparable board tester
or a simple microprocessor interface.
To facilitate ISP programming by the Automated Test Equipment (ATE) vendors. Serial
Vector Format (SVF) files can be created by Atmel provided software utilities.
ATF1504AS devices can also be programmed using standard third-party programmers.
With third-party programmer, the JTAG ISP port can be disabled thereby allowing
four additional I/O pins to be used for logic.
Contact your local Atmel representatives or Atmel PLD applications for details.
ISP Programming
Protection
The ATF1504AS has a special feature that locks the device and prevents the inputs and
I/O from driving if the programming process is interrupted for any reason. The inputs
and I/O default to high-Z state during such a condition. In addition the pin-keeper option
preserves the former state during device programming, if this circuit were previously
programmed on the device. This prevents disturbing the operation of other circuits in the
system while the ATF1504AS is being programmed via ISP.
All ATF1504AS devices are initially shipped in the erased state thereby making them
ready to use for ISP.
Note:For more information refer to the “Designing for In-System Programmability with Atmel
CPLDs” application note.
10
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Ambient)0°C-70°C-40°C-85°C
V
or V
CCINT
V
(3.3V) Power Supply3.0V - 3.6V3.0V - 3.6V
CCIO
DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
I
IH
I
OZ
I
CC1
I
CC2
(2)
I
CC3
V
CCIO
V
CCIO
V
IL
V
IH
V
OL
V
OH
Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
2. When macrocell reduced-power feature is enabled.
(5V) Power Supply5V ±5%5V ± 10%
CCIO
Input or I/O Low
Leakage Current
Input or I/O High
Leakage Current
Tri-state Output
Off-state Current
Power Supply Current,
Standby
Power Supply Current,
Power-down Mode
Current in Reduced-power
Mode
Supply Voltage5.0V Device Output
V
IN=VCC
V
O=VCC
VCC=Max
V
=0,V
IN
VCC=Max
V
=0,V
IN
VCC=Max
V
=0,VCC
IN
-2-10µA
210
or GND-4040µA
Std Mode
CC
“L” Mode
“PD” Mode110mA
CC
Std Power
Com.105mA
Ind.130mA
Com.10µA
Ind.10µA
Com85ma
Ind105
Com.4.755.25V
Ind.4.55.5V
Supply Voltage3.3V Device Output3.03.6V
Input Low Voltage-0.30.8V
Input High Voltage2.0V
Output Low Voltage (TTL)
Output Low Voltage (CMOS)
Output High Voltage (TTL)
V
IN=VIH
V
CCIO
V
IN=VIH
or V
IL
=MIN,IOL=12mA
or V
IL
VCC=MIN,IOL=0.1mA
V
IN=VIH
V
CCIO
or V
IL
=MIN,IOH=-4.0mA
Com.0.45V
Ind.
Com..2V
Ind..2V
2.4V
+0.3V
CCIO
Pin Capacitance
TypMaxUnitsConditions
C
IN
C
I/O
Note:Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
The OGI pin (high-voltage pin during programming) has a maximum capacitance of 12 pF.
0950N–PLD–07/02
810 pFV
810 pFV
IN
OUT
=0V;f=1.0MHz
=0V;f=1.0MHz
11
Absolute Maximum Ratings*
Temperature Under Bias .................................. -40°Cto+85°C
Storage Temperature ..................................... -65°Cto+150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on Input Pins
with Respect to Ground
During Programming.....................................-2.0V to +14.0V
Programming Voltage with
Respect to Ground .......................................-2.0V to +14.0V
AC Characteristics
-7-10-15-20-25
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
(1)
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
(1)
reliability.
Note:1.Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns. Max-
(1)
imum output pin voltage is V
which may overshoot to 7.0V for pulses of less
+ 0.75V DC,
CC
than 20 ns.
SymbolParameter
t
PD1
t
PD2
t
SU
t
H
t
FSU
t
FH
t
COP
t
CH
t
CL
t
ASU
t
AH
t
ACOP
t
ACH
t
ACL
t
CNT
f
CNT
Input or Feedback to
Non-registered Output
I/O Input or Feedback to
Non-registered Feedback
Global Clock Setup Time67111620ns
Global Clock Hold Time00000ns
Global Clock Setup Time of
Fast Input
Global Clock Hold Time of
Fast Input
Global Clock to Output Delay4.5581013ns
Global Clock High Time34567ns
Global Clock Low Time34567ns
Array Clock Setup Time33445ns
Array Clock Hold Time23456ns
Array Clock Output Delay7.510152025ns
Array Clock High Time346810ns
Array Clock Low Time346810ns
Minimum Clock Global Period810131722ns
Maximum Internal Global
Clock Frequency
UnitsMinMaxMinMaxMinMaxMinMaxMinMax
7.5103152025ns
793121625ns
33335ns
0.50.51.01.52ns
12510076.96650MHz
12
t
ACNT
f
ACNT
Minimum Array Clock Period810131722ns
Maximum Internal Array
Clock Frequency
12510076.96650MHz
ATF1504AS(L)
0950N–PLD–07/02
AC Characteristics (Continued)
ATF1504AS(L)
-7-10-15-20-25
SymbolParameter
f
MAX
t
IN
t
IO
t
FIN
t
SEXP
t
PEXP
t
LAD
t
LAC
t
IOE
Maximum Clock Frequency166.712510083.360MHz
Input Pad and Buffer Delay0.50.5222ns
I/O Input Pad and Buffer Delay0.50.5222ns
Fast Input Delay11222ns
Foldback Term Delay4581012ns
Cascade Logic Delay0.80.8111.2ns
Logic Array Delay35678ns
Logic Control Delay35678ns
Internal Output Enable Delay22334ns
Output Buffer and Pad Delay
t
OD1
(Slow slew rate = OFF;
V
=5V;CL=35pF)
CCIO
Output Buffer and Pad Delay
t
OD2
(Slow slew rate = OFF;
V
=3.3V;CL=35pF)
CCIO
Output Buffer and Pad Delay
t
OD3
(Slow slew rate = ON;
V
=5Vor3.3V;CL=35pF)
CCIO
Note:See ordering information for valid part numbers.
UnitsMinMaxMinMaxMinMaxMinMaxMinMax
21.54 5 6ns
2.52.0567ns
55.58 1010ns
Timing Model
0950N–PLD–07/02
13
AC Characteristics (Continued)
-7-10-15-20-25
SymbolParameter
Output Buffer Enable Delay
t
ZX1
(Slow slew rate = OFF;
V
=5.0V;CL=35pF)
CCIO
Output Buffer Enable Delay
t
ZX2
(Slow slew rate = OFF;
V
=3.3V;CL=35pF)
CCIO
Output Buffer Enable Delay
t
ZX3
t
XZ
t
SU
t
H
t
FSU
t
FH
t
RD
t
COMB
t
IC
t
EN
t
GLOB
t
PRE
t
CLR
t
UIM
t
RPA
(Slow slew rate = ON;
V
=5.0V/3.3V;CL=35pF)
CCIO
Output Buffer Disable Delay
(C
=5pF)
L
RegisterSetupTime33456 ns
RegisterHoldTime23456 ns
Register Setup Time of Fast Input33223 ns
Register Hold Time of Fast Input0.50.5222.5ns
RegisterDelay12122ns
CombinatorialDelay12122ns
ArrayClockDelay35678ns
RegisterEnableTime35678ns
Global Control Delay11111ns
RegisterPresetTime23456ns
RegisterClearTime23456ns
SwitchMatrixDelay11222ns
Reduced-power Adder
(2)
Notes: 1. See ordering information for valid part numbers.
2. The t
parameter must be added to the t
RPA
LAD,tLAC,tTIC,tACL
power mode.
UnitsMinMaxMinMaxMinMaxMinMaxMinMax
4.05.07910ns
4.55.57910ns
99101112ns
45678ns
1011131415ns
,andt
parameters for macrocells running in the reduced-
SEXP
Input Test Waveforms and Measurement Levels
tR,tF= 1.5 ns typical
14
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
Output AC Test Loads
Note:*Numbers in parenthesis refer to 3.0V operating conditions (preliminary).
Power-down ModeThe ATF1504AS includes an optional pin-controlled power-down feature. When this
mode is enabled, the PD pin acts as the power-down pin. When the PD pin is high, the
device supply current is reduced to less than 10 mA. During power-down, all output data
and internal logic states are latched internally and held. Therefore, all registered and
combinatorial output data remain valid. Any outputs that were in a high-Z state at the
onset will remain at high-Z. During power-down, all input signals except the power-down
pin are blocked. Input and I/O hold latches remain active to ensure that pins do not float
to indeterminate levels, further reducing system power. The power-down mode feature
is enabled in the logic design file or as a fitted or translated s/w option. Designs using
the power-down pin may not use the PD pin as a logic array input. However, all other PD
pin macrocell resources may still be used, including the buried feedback and foldback
product term array inputs.
Power Down AC Characteristics
SymbolParameter
t
IVDH
t
GVDH
t
CVDH
t
DHIX
t
DHGX
t
DHCX
t
DLIV
t
DLGV
t
DLCV
t
DLOV
Notes: 1. For slow slew outputs, add t
ValidI,I/ObeforePDHigh7 10152025 ns
Valid OE
Valid Clock
(2)
beforePDHigh 7 10152025 ns
(2)
beforePDHigh7 10152025 ns
I, I/O Don’t Care after PD High1215253035ns
(2)
OE
Don’t Care after PD High1215253035ns
(2)
Clock
Don’t Care after PD High1215253035ns
PD Low to Valid I, I/O11111µs
PD Low to Valid OE (Pin or Term)11111µs
PD Low to Valid Clock (Pin or Term)11111µs
PD Low to Valid Output11111µs
.
SSO
2. Pin or product term.
3. Includes t
due to reduced power bit enabled.
RPA
(1)(2)
-7-10-15-20-25
UnitsMinMaxMinMaxMinMaxMinMaxMinMax
0950N–PLD–07/02
15
JTAG-BST/ISP
Overview
The JTAG boundary-scan testing is controlled by the Test Access Port (TAP) controller
in the ATF1504AS. The boundary-scan technique involves the inclusion of a shift-register stage (contained in a boundary-scan cell) adjacent to each component so that
signals at component boundaries can be controlled and observed using scan testing
principles. Each input pin and I/O pin has its own boundary-scan cell (BSC) in order to
support boundary scan testing. The ATF1504AS does not currently include a Test Reset
(TRST) input pin because the TAP controller is automatically reset at power-up. The five
JTAG modes supported include: SAMPLE/PRELOAD, EXTEST, BYPASS, IDCODE
and HIGHZ. The ATF1504AS’s ISP can be fully described using JTAG’sBSDLas
described in IEEE Standard 1149.1b. This allows ATF1504AS programming to be
described and implemented using any one of the third-party development tools supporting this standard.
The ATF1504AS has the option of using four JTAG-standard I/O pins for boundary-scan
testing (BST) and in-system programming (ISP) purposes. The ATF1504AS is programmable through the four JTAG pins using the IEEE standard JTAG programming protocol
established by IEEE Standard 1149.1 using 5V TTL-level programming signals from the
ISP interface for in-system programming. The JTAG feature is a programmable option.
If JTAG (BST or ISP) is not needed, then the four JTAG control pins are available as I/O
pins.
JTAG Boundary-scan
Cell (BSC) Testing
The ATF1504AS contains up to 68 I/O pins and four input pins, depending on the device
type and package type selected. Each input pin and I/O pin has its own boundary-scan
cell (BSC) in order to support boundary-scan testing as described in detail by IEEE
Standard 1149.1. A typical BSC consists of three capture registers or scan registers and
up to two update registers. There are two types of BSCs, one for input or I/O pin, and
one for the macrocells. The BSCs in the device are chained together through the capture registers. Input to the capture register chain is fed in from the TDI pin while the
output is directed to the TDO pin. Capture registers are used to capture active device
data signals, to shift data in and out of the device and to load data into the update registers. Control signals are generated internally by the JTAG TAP controller. The BSC
configuration for the input and I/O pins and macrocells are shown below.
BSC Configuration for Input and I/O Pins (Except JTAG TAP Pins)
Note:The ATF1504AS has pull-up option on TMS and TDI pins. This feature is selected as a design option.
16
ATF1504AS(L)
0950N–PLD–07/02
BSC Configuration for Macrocell
ATF1504AS(L)
Pin BSC
TDO
OEJ
OUTJ
Pin
TDO
0
1
0
1
DQ
DQ
0
1
TDI
Shift
DQ
DQ
Capture
Clock
DQ
DR
0
1
0
1
Pin
0950N–PLD–07/02
TDI
Shift
Capture
DR
Macrocell BSC
Update
DR
Mode
Clock
17
PCI ComplianceThe ATF1504AS also supports the growing need in the industry to support the new
Peripheral Component Interconnect (PCI) interface standard in PCI-based designs and
specifications. The PCI interface calls for high current drivers, which are much larger
than the traditional TTL drivers. In general, PLDs and FPGAs parallel outputs to support
the high current load required by the PCI interface. The ATF1504AS allows this without
contributing to system noise while delivering low output-to-output skew. Having a programmable high drive option is also possible without increasing output delay or pin
capacitance. The PCI electrical characteristics appear on the next page.
PCI Voltage-to-current Curves for +5V Signaling in Pull-up Mode
point
Pull Up
-44
Current (mA)
Test Point
-178
VCC
2.4
1.4
Voltage
DC
drive point
AC drive
-2
PCI Voltage-to-current Curves for +5V Signaling in Pull-down Mode
VCC
Voltage
2.2
Pull Down
AC drive
point
18
ATF1504AS(L)
0.55
DC
drive point
3,6
95
Test Point
Current (mA)
380
0950N–PLD–07/02
ATF1504AS(L)
PCI DC Characteristics
SymbolParameterConditionsMinMaxUnits
V
V
V
I
IH
I
IL
V
V
C
C
C
L
CC
IH
IL
OH
OL
IN
CLK
IDSEL
PIN
Supply Voltage4.755.25V
Input High Voltage2.0VCC+0.5V
Input Low Voltage-0.50.8V
Input High Leakage CurrentVIN=2.7V70µA
Input Low Leakage CurrentVIN= 0.5V-70µA
Output High VoltageI
Output Low VoltageI
=-2mA2.4V
OUT
= 3 mA, 6 mA0.55V
OUT
Input Pin Capacitance10pF
CLK Pin Capacitance12pF
IDSEL Pin Capacitance8pF
Pin Inductance20nH
Note:Leakage current is with pin-keeper off.
PCI AC Characteristics
SymbolParameterConditionsMinMaxUnits
≤ 1.4-44mA
OUT
< 2.4-44+(V
OUT
OUT<VCC
- 1.4)/0.024mA
OUT
Equation AmA
= 3.1V-142µA
>2.2V95mA
>0V
OUT
> 0Equation BmA
OUT
/0.023mA
OUT
=0.71206mA
+ 2.45) for VCC>V
OUT
)for0V<V
OUT
OUT
< 0.71V.
OUT
>3.1V.
Switching
I
OH(AC)
Current High
(Test High)
Switching
I
OL(AC)
Current Low
(Test Point)
I
CL
SLEW
SLEW
Low Clamp Current-5 < VIN≤ -1-25+(VIN+ 1)/0.015mA
Output Rise Slew Rate0.4V to 2.4V load0.53V/ns
R
Output Fall Slew Rate2.4V to 0.4V load0.53V/ns
F
Notes: 1. Equation A: I
2. Equation B: I
=11.9(V
OH
= 78.5 * V
OL
- 5.25) * (V
OUT
*(4.4-V
OUT
0<V
1.4 < V
3.1 < V
V
OUT
V
OUT
2.2 > V
0.1 > V
V
OUT
0950N–PLD–07/02
19
ATF1504AS Dedicated Pinouts
44-lead
Dedicated Pin
INPUT/OE2/GCLK2402229290
INPUT/GCLR391119189
INPUT/OE1 384468849088
INPUT/GCLK1374367838987
I/O/GCLK3354165818785
I/O/PD (1,2)5, 1911, 2517, 3720, 4614, 4412, 42
I/O/TDI(JTAG)1 712146 4
I/O/TMS (JTAG)71319231715
I/O/TCK(JTAG)263250626462
I/O/TDO(JTAG)323857717573
GND4, 16, 24, 3610, 22, 30, 42
V
CCINT
V
CCIO
N/C––––
TQFP
9, 17, 29, 413, 15, 23, 353, 353, 4341, 9339, 91
––
44-lead
J-lead
68-lead
J-lead
6, 16, 26, 34,
38, 48, 58, 66
11, 21, 31, 43,
53, 63
84-lead
J-lead
7, 19, 32, 42,
47, 59, 72, 82
13, 26, 38, 53,
66, 78
100-lead
PQFP
13, 28, 40, 45,
61, 76, 88, 97
5, 20, 36, 53,
68, 84
1, 2, 7, 9,
24, 26, 29, 30,
51, 52, 55, 57,
72, 74, 79, 80
100-lead
TQFP
11, 26, 38, 43,
59, 74, 86, 95
3, 18, 34, 51,
66, 82
1, 2, 5, 7, 22,
24, 27, 28, 49,
50, 53, 55, 70,
72, 77, 78
#ofSignalPins363652686868
# User I/O Pins323248646464
OE (1, 2)Global OE Pins
GCLRGlobal Clear Pin
GCLK (1, 2, 3)Global Clock Pins
PD (1, 2)Power down pins
TDI, TMS, TCK, TDOJTAG pins used for boundary-scan testing or in-system programming
GNDGround Pins
V
V
CCINT
CCIO
VCC pins for the device (+5V - Internal)
VCC pins for output drivers (for I/O pins) (+5V or 3.3V - I/Os)
To use commercial product for Industrial temperature ranges, down-grade one speed grade from the “I” to the “C” device
(7 ns “C” =10ns“I”) and de-rate power by 30%.
To use commercial product for Industrial temperature ranges, down-grade one speed grade from the “I” to the “C” device
(7 ns “C” =10ns“I”) and de-rate power by 30%.
26
ATF1504AS(L)
0950N–PLD–07/02
Packaging Information
44A – TQFP
PIN 1
ATF1504AS(L)
B
PIN 1 IDENTIFIER
e
E1E
D1
D
C
0˚~7˚
A1
L
Notes:1. This package conforms to JEDEC reference MS-026, Variation ACB.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.10 mm maximum.
A2A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A––1.20
A10.05–0.15
A2 0.951.001.05
D11.7512.0012.25
D19.9010.0010.10Note 2
E11.7512.0012.25
E19.9010.0010.10Note 2
B 0.30–0.45
C0.09–0.20
L0.45– 0.75
e0.80 TYP
NOM
MAX
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
0950N–PLD–07/02
TITLE
44A, 44-lead, 10 x 10 mm Body Size, 1.0 mm Body Thickness,
0.8 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
10/5/2001
DRAWING NO.
44A
REV.
B
27
44J – PLCC
1.14(0.045) X 45˚
B
e
0.51(0.020)MAX
45˚ MAX (3X)
Notes:1. This package conforms to JEDEC reference MS-018, Variation AC.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Notes:1. This package conforms to JEDEC reference MS-018, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Notes:1. This package conforms to JEDEC reference MS-018, Variation AF.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
Dimensions in Millimeters and (Inches)*
*Controlling dimensions: millimeters
JEDEC STANDARD MS-022, GC-1
ATF1504AS(L)
PIN 1 ID
0.65 (0.0256) BSC
0.40 (0.016)
0.22 (0.009)
0.23 (0.009)
0º~7º
0.11 (0.004)
PIN 1
17.45 (0.687)
16.95 (0.667)
14.12 (0.556)
13.90 (0.547)
1.03 (0.041)
0.73 (0.029)
20.10 (0.791)
19.90 (0.783)
23.45 (0.923)
22.95 (0.904)
3.40 (0.134) MAX
0.50 (0.020)
0.25 (0.010)
2325 Orchard Parkway
R
San Jose, CA 95131
0950N–PLD–07/02
TITLE
100Q1, 100-lead, 14 x 20 mm Body, 3.2 mm Footprint, 0.65 mm Pitch,
Plastic Quad Flat Package (PQFP)
04/11/2001
DRAWING NO.
100Q1
REV.
A
31
100A – TQFP
PIN 1
B
PIN 1 IDENTIFIER
e
E1E
D1
D
C
0˚~7˚
A1
L
Notes:1. This package conforms to JEDEC reference MS-026, Variation AED.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.08 mm maximum.
A2A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A––1.20
A10.05–0.15
A2 0.951.001.05
D15.7516.0016.25
D113.9014.0014.10Note 2
E15.7516.0016.25
E113.9014.0014.10Note 2
B 0.17–0.27
C0.09–0.20
L0.45– 0.75
e0.50 TYP
NOM
MAX
NOTE
32
2325 Orchard Parkway
TITLE
R
San Jose, CA 95131
ATF1504AS(L)
100A, 100-lead, 14 x 14 mm Body Size, 1.0 mm Body Thickness,
0.5 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
10/5/2001
DRAWING NO.
100A
0950N–PLD–07/02
REV.
C
Atmel HeadquartersAtmel Operations
Corporate Headquarters
2325 Orchard Parkway
San Jose, CA 95131
TEL 1(408) 441-0311
FAX 1(408) 487-2600
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FAX (81) 3-3523-7581
Memory
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TEL 1(408) 441-0311
FAX 1(408) 436-4314
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Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty
whichisdetailedinAtmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any errors
which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does
not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted
by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use as critical
components in life support devices or systems.
AT ME L®is the registered trademark of Atmel.
Other terms and product names may be the trademarks of others.
Printed on recycled paper.
0950N–PLD–07/02xM
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