Rainbow Electronics ATF1504ASL User Manual

Features

High-density, High-performance, Electrically-erasable Complex Programmable
Logic Device
– 64 Macrocells – 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell – 44, 68, 84, 100 Pins – 7.5 ns Maximum Pin-to-pin Delay – Registered Operation up to 125 MHz – Enhanced Routing Resources
In-System Programmability (ISP) via JTAG
Flexible Logic Macrocell
– D/T/Latch Configurable Flip-flops – Global and Individual Register Control Signals – Global and Individual Output Enable – Programmable Output Slew Rate – Programmable Output Open Collector Option – Maximum Logic Utilization by Burying a Register with a COM Output
Advanced Power Management Features
– Automatic µA Standby for “L” Version – Pin-controlled 1 mA Standby Mode – Programmable Pin-keeper Circuits on Inputs and I/Os – Reduced-power Feature per Macrocell
Available in Commercial and Industrial Temperature Ranges
Available in 44-, 68-, and 84-lead PLCC; 44- and 100-lead TQFP; and 100-lead PQFP
Advanced EE Technology
– 100% Tested – Completely Reprogrammable – 10,000 Program/Erase Cycles – 20-year Data Retention – 2000V ESD Protection – 200 mA Latch-up Immunity
JTAG Boundary-scan Testing to IEEE Std. 1149.1-1990 and 1149.1a-1993 Supported
PCI-compliant
3.3V or 5.0V I/O Pins
Security Fuse Feature
High­performance Complex Programmable Logic Device
ATF1504AS ATF1504ASL

Enhanced Features

Improved Connectivity (Additional Feedback Routing, Alternate Input Routing)
Output Enable Product Terms
Transparent – Latch Mode
Combinatorial Output with Registered Feedback within Any Macrocell
Three Global Clock Pins
ITD (Input Transition Detection) Circuits on Global Clocks, Inputs and I/O
Fast Registered Input from Product Term
Programmable “Pin-keeper” Option
V
Power-up Reset Option
CC
Pull-up Option on JTAG Pins TMS and TDI
Advanced Power Management Features
– Edge-controlled Power-down “L” – Individual Macrocell Power Option – Disable ITD on Global Clocks, Inputs and I/O
Rev. 0950N–PLD–07/02
1
I/O/TDI
GND
PD1/I/O
TMS/I/O
VCC
44-lead TQFP
Top V i ew
I/O
I/O
I/O
VCC
GCLK2/OE2/I
GCLR/I
I/OE1
GCLK1/I
GND
GCLK3/I/O
I/O
4443424140393837363534
33
1 2
I/O
3
I/O
4 5 6
I/O
7 8
I/O
9 10
I/O
11
I/O
1213141516171819202122
I/O
I/O
I/O
I/O
I/O
I/O
GND
VCC
I/O
PD2/I/O
I/O
32
I/O/TDO
31
I/O
30
I/O
29
VCC
28
I/O
27
I/O
26
I/O/TCK
25
I/O
24
GND
23
I/O
I/O
TDI/I/O
I/O I/O
GND
PD1/I/O
I/O
I/O/TMS
I/O
VCC
I/O I/O
44-lead PLCC
Top V i ew
I/O
I/O
I/O
VCC
GCLK2/OE2/I
GCLR/I
OE1/I
GCLK1/I
65432
7 8 9 10 11 12 13 14 15 16 17
1819202122232425262728
I/O
I/O
1
4443424140
I/O
I/O
I/O
VCC
GND
PD2/I/O
GND
GCLK3/I/O
I/O
I/O
I/O
39
I/O
38
I/O/TDO
37
I/O
36
I/O
35
VCC
34
I/O
33
I/O
32
I/O/TCK
31
I/O
30
GND
29
I/O
I/O
VCCIO
I/O/TD1
GND
I/O/PD1
I/O/TMS
VCCIO
GND
68-lead PLCC
Top V i ew
I/O
I/O
I/O
GND
I/O
I/O
VCCINT
GCLK2/OE2/I
GCLR/I
OE1/I
987654321
10
I/O
11 12 13
I/O
14
I/O
15
I/O
16 17 18
I/O
19 20
I/O
21 22
I/O
23
I/O
24
I/O
25
I/O
26
2728293031323334353637383940414243
I/O
I/O
I/O
I/O
I/O
VCCIO
I/O
GND
VCCINT
68676665646362
I/O
GCLK1/I
GND
GND
I/O/PD2
GCLK3/I/O
I/O
VCCIO
I/O
I/O
I/O
I/O
I/O
I/O
61
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44
VCCIO
I/O I/O GND I/O/TDO I/O I/O I/O VCCIO I/O I/O I/O/TCK I/O GND I/O I/O I/O I/O
VCCIO I/O/TDI
GND
I/O/PD1
I/O/TMS
VCCIO
GND
84-lead PLCC
Top V i ew
I/O
I/O
I/O
I/O
GND
I/O
I/O
I/O
VCCINT
GCLK2/OE2/I
I/GCLR
I/OE1
GCLK1/I
GND
987654321
11
10
12
I/O
13 14 15
I/O
16
I/O
17
I/O
18
I/O
19 20 21
I/O
22
I/O
23 24
I/O
25
I/O
26 27
I/O
28
I/O
29
I/O
30
I/O
31
I/O
32
333435363738394041424344454647484950515253
I/O
I/O
I/O
I/O
I/O
I/O
I/O
VCCIO
848382818079787776
I/O
I/O
I/O
GND
VCCINT
I/O/PD2
GCLK3/I/O
I/O
I/O
I/O
I/O
GND
VCCIO
1/O
I/O
I/O
I/O
I/O
I/O
75
74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54
VCCIO
I/O I/O GND I/O/TDO I/O I/O I/O I/O VCCIO I/O I/O I/O I/O/TCK I/O I/O GND I/O I/O I/O I/O I/O
2
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
VCCIO I/O/TDI
GND
I/O/PD1
I/O/TMS
VCCIO
GND
100-lead PQFP
Top V i ew
I/O
I/O
I/O
I/O
I/O
GND
I/O
I/O
I/O
VCCINT
INPUT/OE2/GCLK2
INPUT/GCLR
INPUT/OE1
INPUT/GCLK1
GND
I/O/GCLK3
I/O
I/O
VCCIO
I/O
I/O
I/O
99989796959493929190898887868584838281
100
1
NC
2
NC
3
I/O
4
I/O
5 6 7
NC
8
I/O
9
NC
10
I/O
11
I/O
12
I/O
13 14 15
I/O
16
I/O
17 18
I/O
19
I/O
20 21
I/O
22
I/O
23
I/O
24
NC
25
I/O
26
NC
27
I/O
28 29
NC
30
NC
31323334353637383940414243444546474849
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
VCCIO
GND
VCCINT
GND
I/O/PD2
I/O
80
NC
79
NC
78
I/O
77
I/O
76
GND
75
I/O/TDO
74
NC
73
I/O
72
NC
71
I/O
70
I/O
69
I/O
68
VCCIO
67
I/O
66
I/O
65
I/O
64
I/O/TCK
63
I/O
62
I/O
61
GND
60
I/O
59
I/O
58
I/O
57
NC
56
I/O
55
NC
54
I/O
53
VCCIO
52
NC
51
NC
50
I/O
I/O
I/O
VCCIO I/O/TDI
GND
I/O/PD1
I/O/TMS
VCCIO
NC
1
NC
2 3 4
NC
5
I/O
6
NC
7
I/O
8
I/O
9
I/O
10 11 12
I/O
13
I/O
14 15
I/O
16
I/O
17 18
I/O
19
I/O
20
I/O
21
NC
22
I/O
23
NC
24
I/O
25
I/O
9998979695949392919089888786858483828180797877
100
26272829303132333435363738394041424344454647484950
NC
NC
GND
100-lead TQFP
I/O
I/O
GND
I/O
I/O
I/O
I/O
I/O
I/O
I/O
Top V i ew
I/O
VCCINT
INPUT/OE2/GCLK2
INPUT/GCLR
I/O
I/O
I/O
VCCIO
INPUT/OE1
INPUT/GCLK1
GND
I/O
GND
VCCINT
I/O/GCLK3
I/O
I/O
I/O
GND
I/O/PD2
VCCIO
I/O
I/O
I/O
I/O
I/O
I/ONCNC
I/O
I/O
I/O
76
I/O
75
GND
74
I/O/TDO
73
NC
72
I/O
71
NC
70
I/O
69
I/O
68
I/O
67
VCCIO
66
I/O
65
I/O
64
I/O
63
I/O/TCK
62
I/O
61
I/O
60
GND
59
I/O
58
I/O
57
I/O
56
NC
55
I/O
54
NC
53
I/O
52
VCCIO
51
NC
NC
0950N–PLD–07/02
3

Description The ATF1504AS is a high-performance, high-density complex programmable logic

device (CPLD) that utilizes Atmels proven electrically-erasable memory technology. With 64 logic macrocells and up to 68 inputs, it easily integrates logic from several TTL, SSI, MSI, LSI and classic PLDs. The ATF1504AS’s enhanced routing switch matrices increase usable gate count and the odds of successful pin-locked design modifications.
The ATF1504AS has up to 68 bi-directional I/O pins and four dedicated input pins, depending on the type of device package selected. Each dedicated pin can also serve as a global control signal, register clock, register reset or output enable. Each of these control signals can be selected for use individually within each macrocell.
Each of the 64 macrocells generates a buried feedback that goes to the global bus. Each input and I/O pin also feeds into the global bus. The switch matrix in each logic block then selects 40 individual signals from the global bus. Each macrocell also gener­ates a foldback logic term that goes to a regional bus. Cascade logic between macrocells in the ATF1504AS allows fast, efficient generation of complex logic func­tions. The ATF1504AS contains four such logic chains, each capable of creating sum term logic with a fan-in of up to 40 product terms.
The ATF1504AS macrocell, shown in Figure 1, is flexible enough to support highly-com­plex logic functions operating at high speed. The macrocell consists of five sections: product terms and product term select multiplexer, OR/XOR/CASCADE logic, a flip-flop, output select and enable, and logic array inputs.
4
ATF1504AS(L)
0950N–PLD–07/02

Block Diagram

ATF1504AS(L)
I/O (MC64)/GCLK3
Unused product terms are automatically disabled by the compiler to decrease power consumption. A security fuse, when programmed, protects the contents of the ATF1504AS. Two bytes (16 bits) of User Signature are accessible to the user for pur­poses such as storing project name, part number, revision or date. The User Signature is accessible regardless of the state of the security fuse.
The ATF1504AS device is an in-system programmable (ISP) device. It uses the indus­try-standard 4-pin JTAG interface (IEEE Std. 1149.1), and is fully-compliant with JTAG’s Boundary-scan Description Language (BSDL). ISP allows the device to be programmed without removing it from the printed circuit board. In addition to simplifying the manufac­turing flow, ISP also allows design modifications to be made in the field via software.
0950N–PLD–07/02
5

Product Terms and Select Mux

OR/XOR/CASCADE Logic The ATF1504ASs logic structure is designed to efficiently support all types of logic.

Flip-flop The ATF1504ASs flip-flop has very flexible data and control functions. The data input

Each ATF1504AS macrocell has five product terms. Each product term receives as its possible inputs all signals from both the global bus and regional bus.
The product term select multiplexer (PTMUX) allocates the five product terms as needed to the macrocell logic gates and control signals. The PTMUX programming is determined by the design compiler, which selects the optimum macrocell configuration.
Within a single macrocell, all the product terms can be routed to the OR gate, creating a 5-input AND/OR sum term. With the addition of the CASIN from neighboring macrocells, this can be expanded to as many as 40 product terms with a little small additional delay.
The macrocells XOR gate allows efficient implementation of compare and arithmetic functions. One input to the XOR comes from the OR sum term. The other XOR input can be a product term or a fixed high- or low-level. For combinatorial outputs, the fixed level input allows polarity selection. For registered functions, the fixed levels allow DeMorgan minimization of product terms. The XOR gate is also used to emulate T- and JK-type flip-flops.
can come from either the XOR gate, from a separate product term or directly from the I/O pin. Selecting the separate product term allows creation of a buried registered feed­back within a combinatorial output macrocell. (This feature is automatically implemented by the fitter software). In addition to D, T, JK and SR operation, the flip-flop can also be configured as a flow-through latch. In this mode, data passes through when the clock is high and is latched when the clock is low.
The clock itself can be either one of the Global CLK Signals (GCK[0 : 2]) or an individual product term. The flip-flop changes state on the clocks rising edge. When the GCK sig­nal is used as the clock, one of the macrocell product terms can be selected as a clock enable. When the clock enable function is active and the enable signal (product term) is low, all clock edges are ignored. The flip-flops asynchronous reset signal (AR) can be either the Global Clear (GCLEAR), a product term, or always off. AR can also be a logic OR of GCLEAR with a product term. The asynchronous preset (AP) can be a product term or always off.

Output Select and Enable The ATF1504AS macrocell output can be selected as registered or combinatorial. The

buried feedback signal can be either combinatorial or registered signal regardless of whether the output is combinatorial or registered.
The output enable multiplexer (MOE) controls the output enable signals. Any buffer can be permanently enabled for simple output operation. Buffers can also be permanently disabled to allow use of the pin as an input. In this configuration all the macrocell resources are still available, including the buried feedback, expander and CASCADE logic. The output enable for each macrocell can be selected as either of the two dedi­cated OE input pins as an I/O pin configured as an input, or as an individual product term.

Global Bus/Switch Matrix The global bus contains all input and I/O pin signals as well as the buried feedback sig-

nal from all 64 macrocells. The switch matrix in each logic block receives as its possible inputs all signals from the global bus. Under software control, up to 40 of these signals can be selected as inputs to the logic block.
6
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)

Foldback Bus Each macrocell also generates a foldback product term. This signal goes to the regional

bus and is available to four macrocells. The foldback is an inverse polarity of one of the macrocells product terms. The sixteen foldback terms in each region allow generation of high fan-in sum terms (up to sixteen product terms) with a nominal additional delay.
Figure 1. ATF1504AS Macrocell
0950N–PLD–07/02
7
Programmable Pin­keeper Option for Inputs and I/Os

Input Diagram

The ATF1504AS offers the option of programming all input and I/O pins so that pin­keeper circuits can be utilized. When any pin is driven high or low and then subse­quently left floating, it will stay at that previous high- or low-level. This circuitry prevents unused input and I/O lines from floating to intermediate voltage levels, which causes unnecessary power consumption and system noise. The keeper circuits eliminate the need for external pull-up resistors and eliminate their DC power consumption.

Speed/Power Management

I/O Diagram

The ATF1504AS has several built-in speed and power management features. The ATF1504AS contains circuitry that automatically puts the device into a low-power standby mode when no logic transitions are occurring. This not only reduces power con­sumption during inactive periods, but also provides proportional power savings for most applications running at system speeds below 5 MHz. This feature may be selected as a device option.
To further reduce power, each ATF1504AS macrocell has a Reduced Power bit feature. This feature allows individual macrocells to be configured for maximum power savings. This feature may be selected as a design option.
All ATF1504AS also have an optional power-down mode. In this mode, current drops to below 10 mA. When the power-down option is selected, either PD1 or PD2 pins (or both) can be used to power-down the part. The power-down option is selected in the design source file. When enabled, the device goes into power-down when either PD1 or PD2 is high. In the power-down mode, all internal logic signals are latched and held, as are any enabled outputs.
8
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
All pin transitions are ignored until the PD pin is brought low. When the power-down fea­ture is enabled, the PD1 or PD2 pin cannot be used as a logic input or output. However, the pins macrocell may still be used to generate buried foldback and cascade logic signals.
All power-down AC characteristic parameters are computed from external input or I/O pins, with Reduced Power Bit turned on. For macrocells in reduced-power mode (reduced-power bit turned on), the reduced-power adder, tRPA, must be added to the AC parameters, which include the data paths t
LAD,tLAC,tIC,tACL,tACH
The ATF1504AS macrocell also has an option whereby the power can be reduced on a per macrocell basis. By enabling this power-down option, macrocells that are not used in an application can be turned-down, thereby reducing the overall power consumption of the device.
Each output also has individual slew rate control. This may be used to reduce system noise by slowing down outputs that do not need to operate at maximum speed. Outputs default to slow switching, and may be specified as fast switching in the design file.
and t
SEXP
.

Design Software Support

ATF1504AS designs are supported by several industry-standard third-party tools. Auto­mated fitters allow logic synthesis using a variety of high level description languages and formats.

Power-up Reset The ATF1504AS is designed with a power-up reset, a feature critical for state machine

initialization. At a point delayed slightly from V tialized, and the state of each output will depend on the polarity of its buffer. However, due to the asynchronous nature of reset and uncertainty of how V system, the following conditions are required:
1. The V
rise must be monotonic,
CC
2. After reset occurs, all input and feedback setup times must be met before driving the clock pin high, and,
3. The clock must remain stable during T
D
The ATF1504AS has two options for the hysteresis about the reset level, V and Large. During the fitting process users may configure the device with the Power-up Reset hysteresis set to Large or Small. Atmel POF2JED users may select the Large option by including the flag -power_reseton the command line after filename.POF”. To allow the registers to be properly reinitialized with the Large hysteresis option selected, the following condition is added:
4. If V
falls below 2.0V, it must shut off completely before the device is turned on
CC
again.
When the Large hysteresis option is active, I amps as well.
crossing V
CC
, all registers will be ini-
RST
actually rises in the
CC
.
is reduced by several hundred micro-
CC
RST
,Small

Security Fuse Usage A single fuse is provided to prevent unauthorized copying of the ATF1504AS fuse pat-

terns. Once programmed, fuse verify is inhibited. However, the 16-bit User Signature remains accessible.
0950N–PLD–07/02
9

Programming ATF1504AS devices are in-system programmable (ISP) devices utilizing the 4-pin JTAG

protocol. This capability eliminates package handling normally required for programming and facilitates rapid design iterations and field changes.
Atmel provides ISP hardware and software to allow programming of the ATF1504AS via the PC. ISP is performed by using either a download cable or a comparable board tester or a simple microprocessor interface.
To facilitate ISP programming by the Automated Test Equipment (ATE) vendors. Serial Vector Format (SVF) files can be created by Atmel provided software utilities.
ATF1504AS devices can also be programmed using standard third-party programmers. With third-party programmer, the JTAG ISP port can be disabled thereby allowing four additional I/O pins to be used for logic.
Contact your local Atmel representatives or Atmel PLD applications for details.

ISP Programming Protection

The ATF1504AS has a special feature that locks the device and prevents the inputs and I/O from driving if the programming process is interrupted for any reason. The inputs and I/O default to high-Z state during such a condition. In addition the pin-keeper option preserves the former state during device programming, if this circuit were previously programmed on the device. This prevents disturbing the operation of other circuits in the system while the ATF1504AS is being programmed via ISP.
All ATF1504AS devices are initially shipped in the erased state thereby making them ready to use for ISP.
Note: For more information refer to the Designing for In-System Programmability with Atmel
CPLDsapplication note.
10
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)

DC and AC Operating Conditions

Commercial Industrial
Operating Temperature (Ambient) 0°C-70°C-40°C-85°C
V
or V
CCINT
V
(3.3V) Power Supply 3.0V - 3.6V 3.0V - 3.6V
CCIO

DC Characteristics

Symbol Parameter Condition Min Typ Max Units
I
IL
I
IH
I
OZ
I
CC1
I
CC2
(2)
I
CC3
V
CCIO
V
CCIO
V
IL
V
IH
V
OL
V
OH
Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
2. When macrocell reduced-power feature is enabled.
(5V) Power Supply 5V ±5% 5V ± 10%
CCIO
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Tri-state Output Off-state Current
Power Supply Current, Standby
Power Supply Current, Power-down Mode
Current in Reduced-power Mode
Supply Voltage 5.0V Device Output
V
IN=VCC
V
O=VCC
VCC=Max V
=0,V
IN
VCC=Max V
=0,V
IN
VCC=Max V
=0,VCC
IN
-2 -10 µA
210
or GND -40 40 µA
Std Mode
CC
L” Mode
PDMode 1 10 mA
CC
Std Power
Com. 105 mA
Ind. 130 mA
Com. 10 µA
Ind. 10 µA
Com 85 ma
Ind 105
Com. 4.75 5.25 V
Ind. 4.5 5.5 V
Supply Voltage 3.3V Device Output 3.0 3.6 V
Input Low Voltage -0.3 0.8 V
Input High Voltage 2.0 V
Output Low Voltage (TTL)
Output Low Voltage (CMOS)
Output High Voltage (TTL)
V
IN=VIH
V
CCIO
V
IN=VIH
or V
IL
=MIN,IOL=12mA
or V
IL
VCC=MIN,IOL=0.1mA
V
IN=VIH
V
CCIO
or V
IL
=MIN,IOH=-4.0mA
Com. 0.45 V
Ind.
Com. .2 V
Ind. .2 V
2.4 V
+0.3 V
CCIO

Pin Capacitance

Typ Max Units Conditions
C
IN
C
I/O
Note: Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
The OGI pin (high-voltage pin during programming) has a maximum capacitance of 12 pF.
0950N–PLD–07/02
810 pF V
810 pF V
IN
OUT
=0V;f=1.0MHz
=0V;f=1.0MHz
11
Absolute Maximum Ratings*
Temperature Under Bias .................................. -40°Cto+85°C
Storage Temperature ..................................... -65°Cto+150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on Input Pins with Respect to Ground
During Programming.....................................-2.0V to +14.0V
Programming Voltage with
Respect to Ground .......................................-2.0V to +14.0V

AC Characteristics

-7 -10 -15 -20 -25
*NOTICE: Stresses beyond those listed under Absolute
Maximum Ratingsmay cause permanent dam­age to the device. This is a stress rating only and functional operation of the device at these or any
(1)
other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device
(1)
reliability.
Note: 1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns. Max-
(1)
imum output pin voltage is V which may overshoot to 7.0V for pulses of less
+ 0.75V DC,
CC
than 20 ns.
Symbol Parameter
t
PD1
t
PD2
t
SU
t
H
t
FSU
t
FH
t
COP
t
CH
t
CL
t
ASU
t
AH
t
ACOP
t
ACH
t
ACL
t
CNT
f
CNT
Input or Feedback to Non-registered Output
I/O Input or Feedback to Non-registered Feedback
Global Clock Setup Time 6 7 11 16 20 ns
Global Clock Hold Time 0 0 0 0 0 ns
Global Clock Setup Time of Fast Input
Global Clock Hold Time of Fast Input
Global Clock to Output Delay 4.5 5 8 10 13 ns
Global Clock High Time 3 4 5 6 7 ns
Global Clock Low Time 3 4 5 6 7 ns
Array Clock Setup Time 3 3 4 4 5 ns
Array Clock Hold Time 2 3 4 5 6 ns
Array Clock Output Delay 7.5 10 15 20 25 ns
Array Clock High Time 3 4 6 8 10 ns
Array Clock Low Time 3 4 6 8 10 ns
Minimum Clock Global Period 8 10 13 17 22 ns
Maximum Internal Global Clock Frequency
UnitsMin Max Min Max Min Max Min Max Min Max
7.5 10 3 15 20 25 ns
793121625ns
33335ns
0.5 0.5 1.0 1.5 2 ns
125 100 76.9 66 50 MHz
12
t
ACNT
f
ACNT
Minimum Array Clock Period 8 10 13 17 22 ns
Maximum Internal Array Clock Frequency
125 100 76.9 66 50 MHz
ATF1504AS(L)
0950N–PLD–07/02
AC Characteristics (Continued)
ATF1504AS(L)
-7 -10 -15 -20 -25
Symbol Parameter
f
MAX
t
IN
t
IO
t
FIN
t
SEXP
t
PEXP
t
LAD
t
LAC
t
IOE
Maximum Clock Frequency 166.7 125 100 83.3 60 MHz
Input Pad and Buffer Delay 0.5 0.5 2 2 2 ns
I/O Input Pad and Buffer Delay 0.5 0.5 2 2 2 ns
Fast Input Delay 1 1 2 2 2 ns
Foldback Term Delay 4 5 8 10 12 ns
Cascade Logic Delay 0.8 0.8 1 1 1.2 ns
Logic Array Delay 3 5 6 7 8 ns
Logic Control Delay 3 5 6 7 8 ns
Internal Output Enable Delay 2 2 3 3 4 ns
Output Buffer and Pad Delay
t
OD1
(Slow slew rate = OFF; V
=5V;CL=35pF)
CCIO
Output Buffer and Pad Delay
t
OD2
(Slow slew rate = OFF; V
=3.3V;CL=35pF)
CCIO
Output Buffer and Pad Delay
t
OD3
(Slow slew rate = ON; V
=5Vor3.3V;CL=35pF)
CCIO
Note: See ordering information for valid part numbers.
UnitsMin Max Min Max Min Max Min Max Min Max
21.54 5 6ns
2.5 2.0 5 6 7 ns
55.58 1010ns

Timing Model

0950N–PLD–07/02
13
AC Characteristics (Continued)
-7 -10 -15 -20 -25
Symbol Parameter
Output Buffer Enable Delay
t
ZX1
(Slow slew rate = OFF; V
=5.0V;CL=35pF)
CCIO
Output Buffer Enable Delay
t
ZX2
(Slow slew rate = OFF; V
=3.3V;CL=35pF)
CCIO
Output Buffer Enable Delay
t
ZX3
t
XZ
t
SU
t
H
t
FSU
t
FH
t
RD
t
COMB
t
IC
t
EN
t
GLOB
t
PRE
t
CLR
t
UIM
t
RPA
(Slow slew rate = ON; V
=5.0V/3.3V;CL=35pF)
CCIO
Output Buffer Disable Delay (C
=5pF)
L
RegisterSetupTime 33456 ns
RegisterHoldTime 23456 ns
Register Setup Time of Fast Input 33223 ns
Register Hold Time of Fast Input 0.5 0.5 2 2 2.5 ns
RegisterDelay 12122ns
CombinatorialDelay 12122ns
ArrayClockDelay 35678ns
RegisterEnableTime 35678ns
Global Control Delay 11111ns
RegisterPresetTime 23456ns
RegisterClearTime 23456ns
SwitchMatrixDelay 11222ns
Reduced-power Adder
(2)
Notes: 1. See ordering information for valid part numbers.
2. The t
parameter must be added to the t
RPA
LAD,tLAC,tTIC,tACL
power mode.
UnitsMin Max Min Max Min Max Min Max Min Max
4.0 5.0 7 9 10 ns
4.5 5.5 7 9 10 ns
9 9 10 11 12 ns
45678ns
10 11 13 14 15 ns
,andt
parameters for macrocells running in the reduced-
SEXP

Input Test Waveforms and Measurement Levels

tR,tF= 1.5 ns typical
14
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)

Output AC Test Loads

Note: *Numbers in parenthesis refer to 3.0V operating conditions (preliminary).

Power-down Mode The ATF1504AS includes an optional pin-controlled power-down feature. When this

mode is enabled, the PD pin acts as the power-down pin. When the PD pin is high, the device supply current is reduced to less than 10 mA. During power-down, all output data and internal logic states are latched internally and held. Therefore, all registered and combinatorial output data remain valid. Any outputs that were in a high-Z state at the onset will remain at high-Z. During power-down, all input signals except the power-down pin are blocked. Input and I/O hold latches remain active to ensure that pins do not float to indeterminate levels, further reducing system power. The power-down mode feature is enabled in the logic design file or as a fitted or translated s/w option. Designs using the power-down pin may not use the PD pin as a logic array input. However, all other PD pin macrocell resources may still be used, including the buried feedback and foldback product term array inputs.
Power Down AC Characteristics
Symbol Parameter
t
IVDH
t
GVDH
t
CVDH
t
DHIX
t
DHGX
t
DHCX
t
DLIV
t
DLGV
t
DLCV
t
DLOV
Notes: 1. For slow slew outputs, add t
ValidI,I/ObeforePDHigh 7 10152025 ns
Valid OE
Valid Clock
(2)
beforePDHigh 7 10152025 ns
(2)
beforePDHigh7 10152025 ns
I, I/O Dont Care after PD High 12 15 25 30 35 ns
(2)
OE
Dont Care after PD High 12 15 25 30 35 ns
(2)
Clock
Don’t Care after PD High 12 15 25 30 35 ns
PD Low to Valid I, I/O 1 1 1 1 1 µs
PD Low to Valid OE (Pin or Term) 1 1 1 1 1 µs
PD Low to Valid Clock (Pin or Term) 1 1 1 1 1 µs
PD Low to Valid Output 1 1 1 1 1 µs
.
SSO
2. Pin or product term.
3. Includes t
due to reduced power bit enabled.
RPA
(1)(2)
-7 -10 -15 -20 -25
UnitsMin Max Min Max Min Max Min Max Min Max
0950N–PLD–07/02
15

JTAG-BST/ISP Overview

The JTAG boundary-scan testing is controlled by the Test Access Port (TAP) controller in the ATF1504AS. The boundary-scan technique involves the inclusion of a shift-regis­ter stage (contained in a boundary-scan cell) adjacent to each component so that signals at component boundaries can be controlled and observed using scan testing principles. Each input pin and I/O pin has its own boundary-scan cell (BSC) in order to support boundary scan testing. The ATF1504AS does not currently include a Test Reset (TRST) input pin because the TAP controller is automatically reset at power-up. The five JTAG modes supported include: SAMPLE/PRELOAD, EXTEST, BYPASS, IDCODE and HIGHZ. The ATF1504ASs ISP can be fully described using JTAG’sBSDLas described in IEEE Standard 1149.1b. This allows ATF1504AS programming to be described and implemented using any one of the third-party development tools support­ing this standard.
The ATF1504AS has the option of using four JTAG-standard I/O pins for boundary-scan testing (BST) and in-system programming (ISP) purposes. The ATF1504AS is program­mable through the four JTAG pins using the IEEE standard JTAG programming protocol established by IEEE Standard 1149.1 using 5V TTL-level programming signals from the ISP interface for in-system programming. The JTAG feature is a programmable option. If JTAG (BST or ISP) is not needed, then the four JTAG control pins are available as I/O pins.

JTAG Boundary-scan Cell (BSC) Testing

The ATF1504AS contains up to 68 I/O pins and four input pins, depending on the device type and package type selected. Each input pin and I/O pin has its own boundary-scan cell (BSC) in order to support boundary-scan testing as described in detail by IEEE Standard 1149.1. A typical BSC consists of three capture registers or scan registers and up to two update registers. There are two types of BSCs, one for input or I/O pin, and one for the macrocells. The BSCs in the device are chained together through the cap­ture registers. Input to the capture register chain is fed in from the TDI pin while the output is directed to the TDO pin. Capture registers are used to capture active device data signals, to shift data in and out of the device and to load data into the update regis­ters. Control signals are generated internally by the JTAG TAP controller. The BSC configuration for the input and I/O pins and macrocells are shown below.

BSC Configuration for Input and I/O Pins (Except JTAG TAP Pins)

Note: The ATF1504AS has pull-up option on TMS and TDI pins. This feature is selected as a design option.
16
ATF1504AS(L)
0950N–PLD–07/02

BSC Configuration for Macrocell

ATF1504AS(L)
Pin BSC
TDO
OEJ
OUTJ
Pin
TDO
0
1
0
1
DQ
DQ
0 1
TDI
Shift
DQ
DQ
Capture
Clock
DQ
DR
0
1
0
1
Pin
0950N–PLD–07/02
TDI
Shift
Capture
DR
Macrocell BSC
Update
DR
Mode
Clock
17

PCI Compliance The ATF1504AS also supports the growing need in the industry to support the new

Peripheral Component Interconnect (PCI) interface standard in PCI-based designs and specifications. The PCI interface calls for high current drivers, which are much larger than the traditional TTL drivers. In general, PLDs and FPGAs parallel outputs to support the high current load required by the PCI interface. The ATF1504AS allows this without contributing to system noise while delivering low output-to-output skew. Having a pro­grammable high drive option is also possible without increasing output delay or pin capacitance. The PCI electrical characteristics appear on the next page.

PCI Voltage-to-current Curves for +5V Signaling in Pull-up Mode

point
Pull Up
-44
Current (mA)
Test Point
-178
VCC
2.4
1.4
Voltage
DC drive point
AC drive
-2

PCI Voltage-to-current Curves for +5V Signaling in Pull-down Mode

VCC
Voltage
2.2
Pull Down
AC drive
point
18
ATF1504AS(L)
0.55
DC drive point
3,6
95
Test Point
Current (mA)
380
0950N–PLD–07/02
ATF1504AS(L)

PCI DC Characteristics

Symbol Parameter Conditions Min Max Units
V
V
V
I
IH
I
IL
V
V
C
C
C
L
CC
IH
IL
OH
OL
IN
CLK
IDSEL
PIN
Supply Voltage 4.75 5.25 V
Input High Voltage 2.0 VCC+0.5 V
Input Low Voltage -0.5 0.8 V
Input High Leakage Current VIN=2.7V 70 µA
Input Low Leakage Current VIN= 0.5V -70 µA
Output High Voltage I
Output Low Voltage I
=-2mA 2.4 V
OUT
= 3 mA, 6 mA 0.55 V
OUT
Input Pin Capacitance 10 pF
CLK Pin Capacitance 12 pF
IDSEL Pin Capacitance 8pF
Pin Inductance 20 nH
Note: Leakage current is with pin-keeper off.

PCI AC Characteristics

Symbol Parameter Conditions Min Max Units
1.4 -44 mA
OUT
< 2.4 -44+(V
OUT
OUT<VCC
- 1.4)/0.024 mA
OUT
Equation A mA
= 3.1V -142 µA
>2.2V 95 mA
>0 V
OUT
> 0 Equation B mA
OUT
/0.023 mA
OUT
=0.71 206 mA
+ 2.45) for VCC>V
OUT
)for0V<V
OUT
OUT
< 0.71V.
OUT
>3.1V.
Switching
I
OH(AC)
Current High (Test High)
Switching
I
OL(AC)
Current Low (Test Point)
I
CL
SLEW
SLEW
Low Clamp Current -5 < VIN≤ -1 -25+(VIN+ 1)/0.015 mA
Output Rise Slew Rate 0.4V to 2.4V load 0.5 3 V/ns
R
Output Fall Slew Rate 2.4V to 0.4V load 0.5 3 V/ns
F
Notes: 1. Equation A: I
2. Equation B: I
=11.9(V
OH
= 78.5 * V
OL
- 5.25) * (V
OUT
*(4.4-V
OUT
0<V
1.4 < V
3.1 < V
V
OUT
V
OUT
2.2 > V
0.1 > V
V
OUT
0950N–PLD–07/02
19
ATF1504AS Dedicated Pinouts
44-lead
Dedicated Pin
INPUT/OE2/GCLK2 40 2 2 2 92 90
INPUT/GCLR 39 1 1 1 91 89
INPUT/OE1 384468849088
INPUT/GCLK1374367838987
I/O/GCLK3 354165818785
I/O/PD (1,2) 5, 19 11, 25 17, 37 20, 46 14, 44 12, 42
I/O/TDI(JTAG)1 712146 4
I/O/TMS (JTAG) 7 13 19 23 17 15
I/O/TCK(JTAG)263250626462
I/O/TDO(JTAG)323857717573
GND 4, 16, 24, 36 10, 22, 30, 42
V
CCINT
V
CCIO
N/C ––––
TQFP
9, 17, 29, 41 3, 15, 23, 35 3, 35 3, 43 41, 93 39, 91
––
44-lead
J-lead
68-lead
J-lead
6, 16, 26, 34,
38, 48, 58, 66
11, 21, 31, 43,
53, 63
84-lead
J-lead
7, 19, 32, 42,
47, 59, 72, 82
13, 26, 38, 53,
66, 78
100-lead
PQFP
13, 28, 40, 45,
61, 76, 88, 97
5, 20, 36, 53,
68, 84
1, 2, 7, 9, 24, 26, 29, 30, 51, 52, 55, 57,
72, 74, 79, 80
100-lead
TQFP
11, 26, 38, 43,
59, 74, 86, 95
3, 18, 34, 51,
66, 82
1, 2, 5, 7, 22, 24, 27, 28, 49, 50, 53, 55, 70,
72, 77, 78
#ofSignalPins363652686868
# User I/O Pins 32 32 48 64 64 64
OE (1, 2) Global OE Pins
GCLR Global Clear Pin
GCLK (1, 2, 3) Global Clock Pins
PD (1, 2) Power down pins
TDI, TMS, TCK, TDO JTAG pins used for boundary-scan testing or in-system programming
GND Ground Pins
V
V
CCINT
CCIO
VCC pins for the device (+5V - Internal)
VCC pins for output drivers (for I/O pins) (+5V or 3.3V - I/Os)
20
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS(L)
ATF1504AS I/O Pinouts
44-
lead
MC PLC
1 A 12 6 18 22 16 14 33 C 24 18 36 44 42 40
2A –––21 15 13 34 C –––45 43 41
3
4 A 9 3 15 18 12 10 36 C 26 20 39 48 46 44
5 A 8 2 14 17 11 9 37 C 27 21 40 49 47 45
6A ––13 16 10 8 38 C ––41 50 48 46
7A –––15 8 6 39 C –––51 49 47
8/
TDI
9A ––10 12 4 100 41 C 29 23 44 54 54 52
10 A –––11 3 99 42 C –––55 56 54
11 A 6 44 9 10 100 98 43 C ––45 56 58 56
12 A ––8 9 99 97 44 C ––46 57 59 57
13 A ––7 8 98 96 45 C ––47 58 60 58
14 A 5 43 5 6 96 94 46 C 31 25 49 60 62 60
15 A –––5959347C –––61 63 61
16 A 4 42 4 4 94 92
17 B 21 15 33 41 39 37 49 D 33 27 51 63 65 63
18 B –––40 38 36 50 D –––64 66 64
19 B 20 14 32 39 37 35 51 D 34 28 52 65 67 65
20 B 19 13 30 37 35 33 52 D 36 30 54 67 69 67
21 B 18 12 29 36 34 32 53 D 37 31 55 68 70 68
22 B ––28 35 33 31 54 D ––56 69 71 69
23 B –––34 32 30 55 D –––70 73 71
24 B 17 11 27 33 31 29
25 B 16 10 25 31 27 25 57 D 39 33 59 73 77 75
26 B –––30 25 23 58 D –––74 78 76
27 B ––24 29 23 21 59 D ––60 75 81 79
28 B ––23 28 22 20 60 D ––61 76 82 80
29 B ––22 27 21 19 61 D ––62 77 83 81
30 B 14 8 20 25 19 17 62 D 40 34 64 79 85 83
31 B –––24 18 16 63 D –––80 86 84
32/
TMS
PLCC
A/
PD1
A 7 1 12 14 6 4 40 C 28 22 42 52 50 48
B 13 7 19 23 17 15 64
44-
lead
TQFP
11 5 17 20 14 12 35
68-
lead
PLCC
84-
lead
PLCC
100-
lead
PQFP
100-
lead
TQFP MC PLC
48/
TCK
56/
TDO
44-
lead
PLCC
C/
PD2
C322650626462
D383257717573
D/
GCLK3
25 19 37 46 44 42
41 35 65 81 87 85
44-
lead
TQFP
68-
lead
PLCC
84-
lead
PLCC
100-
lead
PQFP
100-
lead
TQFP
0950N–PLD–07/02
21
SUPPLY CURRENT VS. SUPPLY VOLTAGE
)
(T
=25°C, F = 0 )
125
100
75
(mA)
CC
I
50
25
0
4.50 4.75 5.00 5 .25 5.50
A
STANDARD
REDUCED POWER MODE
(V)
V
CC
SUPPLY CURRENT VS. SUPPLY VOLTAGE
PIN-CONTROLLED POWER-DOWN MODE
(T
=25°C, F = 0)
1100
1000
(µA)
900
CC
I
800
700
4.50 4.75 5.00 5.2 5 5.50
A
STANDARD POWER
REDUCED POWER MODE
V
(V)
CC
SUPPLY CURRENT VS. SUPPLY VOLTAGE
LOW-POWER ("L") VERSION
=25°C, F = 0)
(T
A
30
20
(µA)
CC
I
10
0
4.50 4 .75 5.00 5.25 5.50
V
(V)
CC
SUPPLY CURRENT VS. FREQUENCY
STANDARD POWER (T
200.0
150.0
(mA)
100.0
CC
I
50.0
0.0
STANDARD POWER
0.00 20.00 40.00 60.00 80.0 0 100 .00
FREQUENCY(MHz)
=25°C)
A
REDUCED POWER MODE
SUPPLY CURRENT VS. FREQUENCY
LOW-POWER ("L") VERSION
125.0
LOW POWER (T
100.0
75.0
(mA)
CC
I
50.0
25.0
0.0
0.00 5.0 0 10.00 15.00 20.00 25.0 0
STANDARD POWER
FREQUE NCY (MHz)
=25°C)
A
REDUCED POWER MODE
OUTPUT SOURCE CURRENT VS. OUTPUT VOLTAGE
(V
=5V,TA=25°C)
0.0
-10.0
-20.0
-30.0
-40.0
-50.0
IOH (mA)
-60.0
-70.0
-80.0
-90.0
-100.0
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00 4.50 5.00
CC
OUTPUT VOLTA GE (V)
OUTPUT SOURCE CURRENT VS. SUPPLY VOLTAGE
0.0
-10.0
-20.0
-30.0
IOH (mA)
-40.0
-50.0
-60.0
4.50 4.75 5.00 5.25 5.50
22
ATF1504AS(L)
(VOH = 2.4V, T
SUPPLY VOLTAGE(V)
=25°C)
A
-10
-20
-30
-40
INPUTCURRENT (mA
-50
-60
INPUT CLAMP CURRENT VS. INPUT VOLTAGE
=5V,TA=25°C)
(V
0
-1.00 -0.80 -0.60 -0.40 -0.20 0.00
CC
INPU T VOLT AGE (V)
0950N–PLD–07/02
ATF1504AS(L)
OUTPUT SINK CURRENT VS. SUPPLY VOLTAGE
43
42
41
40
39
38
IOL (mA)
37
36
35
34
4.50 4.75 5 .00 5.25 5.50
(VOL = 0.5V, T
SUPPLY VOLTA GE (V)
=25°C)
A
NORMALIZED TPD
1.20
VS. SUPPLY VOLTAGE (T
1.10
1.00
NORMALIZED TPD
0.90
0.80
4.5 4.8 5.0 5.3 5.5
SUPPLY VOLTAGE (V)
=25°C)
A
NORMALIZED TPD
VS. TEMPERATURE (V
1.2
1.1
1.0
NORMALIZED TPD
0.9
0.8
-40.0 0.0 25.0 75 .0
TEMPERATURE (C)
NORMALIZED TCO
1.2
1.1
1.0
NORMALIZED TPD
0.9
VS. SUPPLY VOLTAGE (T
=5.0V)
CC
=25°C)
A
INPUT CURRENT VS. INPUT VOLTAGE
(V
=5V,TA=25°C)
40
30
A)
µ
µ
20
µ
µ
10
0
-10
INPUT CURRENT (
-20
-30
0.0 0 .5 1.0 1.5 2.0 2.5 3.0 3.5 4 .0 4.5 5.0
CC
INPU T VOLTAGE (V)
OUTPUT SINK CURRENT VS. OUTPUT VOLTAGE
(V
=5V,TA=25°C)
140.0
120.0
100.0
80.0
60.0
IOL (mA)
40.0
20.0
0.0
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00 4.50 5.00
CC
OUTPUTVOLTAGE (V)
0.8
4.5 4.8 5.0 5.3 5.5
SUPPLY VOLTAGE (V)
NORMALIZED TSU
1.2
1.1
1.0
NORMALIZED TSU
0.9
0.8
VS. SUPPLY VOLTAGE (T
4.5 4.8 5 .0 5 .3 5.5
SUPPLY VOLTAGE (V)
=25°C)
A
0950N–PLD–07/02
23
NORMALIZED TCO
1.2
1.1
1.0
NORMALIZED TCO
0.9
0.8
-40.0 0.0 25.0 75.0
VS.TEMPERATURE (V
TEMPERATURE (C)
CC
=5.0V)
NORMAL IZED TS U
1.2
VS. TEMPERATURE (V
1.1
1.0
NORMALIZ ED TSU
0.9
0.8
-40.0 0.0 25.0 75.0
TEMPERATURE(C)
CC
=5.0V)
24
ATF1504AS(L)
0950N–PLD–07/02
ATF1504AS Ordering Information
t
PD
(ns)
7.5 4.5 166.7 ATF1504AS-7 AC44
10 5 125 ATF1504AS-10 AC44
10 5 125 ATF1504AS-10 AI44
15 8 100 ATF1504AS-15 AC44
15 8 100 ATF1504AS-15 AI44
t
CO1
(ns)
f
MAX
(MHz) Ordering Code Package Operation Range
ATF1504AS-7 JC44 ATF1504AS-7 JC68 ATF1504AS-7 JC84 ATF1504AS-7 QC100 ATF1504AS-7 AC100
ATF1504AS-10 JC44 ATF1504AS-10 JC68 ATF1504AS-10 JC84 ATF1504AS-10 QC100 ATF1504AS-10 AC100
ATF1504AS-10 JI44 ATF1504AS-10 JI68 ATF1504AS-10 JI84 ATF1504AS-10 QI100 ATF1504AS-10 AI100
ATF1504AS-15 JC44 ATF1504AS-15 JC68 ATF1504AS-15 JC84 ATF1504AS-15 QC100 ATF1500AS-15 AC100
ATF1504AS-15 JI44 ATF1504AS-15 JI68 ATF1504AS-15 JI84 ATF1504AS-15 QI100 ATF1504AS-15 AI100
44A 44J 68J 84J 100Q1 100A
44A 44J 68J 84J 100Q1 100A
44A 44J 68J 84J 100Q1 100A
44A 44J 68J 84J 100Q1 100A
44A 44J 68J 84J 100Q1 100A
ATF1504AS(L)
Commercial
(0°Cto70°C)
Commercial
(0°Cto70°C)
Industrial
(-40°Cto+85°C)
Commercial
(0°Cto70°C)
Industrial
(-40°Cto+85°C)

Using “C” Product for Industrial

To use commercial product for Industrial temperature ranges, down-grade one speed grade from the “I” to the “C” device (7 ns “C” =10ns“I”) and de-rate power by 30%.
25
0950N–PLD–07/02
ATF1504ASL Ordering Information
t
PD
(ns)
20 12 83.3 ATF1504ASL-20 AC44
25 15 70 ATF1504ASL-25 AI44
t
CO1
(ns)
f
MAX
(MHz) Ordering Code Package Operation Range
ATF1504ASL-20 JC44 ATF1504ASL-20 JC68 ATF1504ASL-20 JC84 ATF1504ASL-20 QC100 ATF1504ASL-20 AC100
ATF1504ASL-25 JI84 ATF1504ASL-25 JI68 ATF1504ASL-25 JI84 ATF1504ASL-25 QI100 ATF1504ASL-25 AI100
44A 44J 68J 84J 100Q1 100A
44A 44J 68J 84J 100Q1 100A
Commercial
(0°Cto70°C)
Industrial
(-40°Cto+85°C)

Using “C” Product for Industrial

To use commercial product for Industrial temperature ranges, down-grade one speed grade from the “I” to the “C” device (7 ns “C” =10ns“I”) and de-rate power by 30%.
26
ATF1504AS(L)
0950N–PLD–07/02

Packaging Information

44A – TQFP

PIN 1
ATF1504AS(L)
B
PIN 1 IDENTIFIER
e
E1 E
D1
D
C
0˚~7˚
A1
L
Notes: 1. This package conforms to JEDEC reference MS-026, Variation ACB.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.10 mm maximum.
A2 A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A 1.20
A1 0.05 0.15
A2 0.95 1.00 1.05
D 11.75 12.00 12.25
D1 9.90 10.00 10.10 Note 2
E 11.75 12.00 12.25
E1 9.90 10.00 10.10 Note 2
B 0.30 0.45
C 0.09 0.20
L 0.45 0.75
e 0.80 TYP
NOM
MAX
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
0950N–PLD–07/02
TITLE
44A, 44-lead, 10 x 10 mm Body Size, 1.0 mm Body Thickness,
0.8 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
10/5/2001
DRAWING NO.
44A
REV.
B
27

44J – PLCC

1.14(0.045) X 45˚
B
e
0.51(0.020)MAX
45˚ MAX (3X)
Notes: 1. This package conforms to JEDEC reference MS-018, Variation AC.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1 and E1 include mold mismatch and are measured at the extreme material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
PIN NO. 1
IDENTIFIER
D1
D
1.14(0.045) X 45˚
E1 E
0.318(0.0125)
0.191(0.0075)
NOM
D2/E2
MAX
B1
A2
A1
A
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 4.191 4.572
A1 2.286 3.048
A2 0.508 ––
D 17.399 17.653
D1 16.510 16.662 Note 2
E 17.399 17.653
E1 16.510 16.662 Note 2
D2/E2 14.986 16.002
B 0.660 0.813
B1 0.330 0.533
e 1.270 TYP
MIN
NOTE
28
2325 Orchard Parkway
TITLE
R
San Jose, CA 95131
ATF1504AS(L)
44J, 44-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
44J
0950N–PLD–07/02
10/04/01
REV.
B

68J – PLCC

ATF1504AS(L)
1.14(0.045) X 45˚
B
e
0.51(0.020)MAX
45˚ MAX (3X)
Notes: 1. This package conforms to JEDEC reference MS-018, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1 and E1 include mold mismatch and are measured at the extreme material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
PIN NO. 1
IDENTIFIER
D1
D
1.14(0.045) X 45˚
E1 E
0.318(0.0125)
0.191(0.0075)
NOM
D2/E2
MAX
B1
A2
A1
A
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 4.191 4.572
A1 2.286 3.048
A2 0.508 ––
D 25.019 25.273
D1 24.130 24.333 Note 2
E 25.019 25.273
E1 24.130 24.333 Note 2
D2/E2 22.606 23.622
B 0.660 0.813
B1 0.330 0.533
e 1.270 TYP
MIN
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
0950N–PLD–07/02
TITLE
68J, 68-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
68J
10/04/01
REV.
B
29

84J – PLCC

1.14(0.045) X 45˚
B
e
0.51(0.020)MAX
45˚ MAX (3X)
Notes: 1. This package conforms to JEDEC reference MS-018, Variation AF.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1 and E1 include mold mismatch and are measured at the extreme material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
PIN NO. 1
IDENTIFIER
D1
D
1.14(0.045) X 45˚
E1 E
0.318(0.0125)
0.191(0.0075)
NOM
D2/E2
MAX
B1
A2
A1
A
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 4.191 4.572
A1 2.286 3.048
A2 0.508 ––
D 30.099 30.353
D1 29.210 29.413 Note 2
E 30.099 30.353
E1 29.210 29.413 Note 2
D2/E2 27.686 28.702
B 0.660 0.813
B1 0.330 0.533
e 1.270 TYP
MIN
NOTE
30
2325 Orchard Parkway
TITLE
R
San Jose, CA 95131
ATF1504AS(L)
84J, 84-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
84J
0950N–PLD–07/02
10/04/01
REV.
B

100Q1 – PQFP

Dimensions in Millimeters and (Inches)* *Controlling dimensions: millimeters JEDEC STANDARD MS-022, GC-1
ATF1504AS(L)
PIN 1 ID
0.65 (0.0256) BSC
0.40 (0.016)
0.22 (0.009)
0.23 (0.009)
0º~7º
0.11 (0.004)
PIN 1
17.45 (0.687)
16.95 (0.667)
14.12 (0.556)
13.90 (0.547)
1.03 (0.041)
0.73 (0.029)
20.10 (0.791)
19.90 (0.783)
23.45 (0.923)
22.95 (0.904)
3.40 (0.134) MAX
0.50 (0.020)
0.25 (0.010)
2325 Orchard Parkway
R
San Jose, CA 95131
0950N–PLD–07/02
TITLE
100Q1, 100-lead, 14 x 20 mm Body, 3.2 mm Footprint, 0.65 mm Pitch,
Plastic Quad Flat Package (PQFP)
04/11/2001
DRAWING NO.
100Q1
REV.
A
31

100A – TQFP

PIN 1
B
PIN 1 IDENTIFIER
e
E1 E
D1
D
C
0˚~7˚
A1
L
Notes: 1. This package conforms to JEDEC reference MS-026, Variation AED.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable protrusion is 0.25 mm per side. Dimensions D1 and E1 are maximum plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.08 mm maximum.
A2 A
SYMBOL
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A ––1.20
A1 0.05 0.15
A2 0.95 1.00 1.05
D 15.75 16.00 16.25
D1 13.90 14.00 14.10 Note 2
E 15.75 16.00 16.25
E1 13.90 14.00 14.10 Note 2
B 0.17 0.27
C 0.09 0.20
L 0.45 0.75
e 0.50 TYP
NOM
MAX
NOTE
32
2325 Orchard Parkway
TITLE
R
San Jose, CA 95131
ATF1504AS(L)
100A, 100-lead, 14 x 14 mm Body Size, 1.0 mm Body Thickness,
0.5 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
10/5/2001
DRAWING NO.
100A
0950N–PLD–07/02
REV.
C
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Web Site
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© Atmel Corporation 2002.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty whichisdetailedinAtmel’s Terms and Conditions located on the Companys web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmels products are not authorized for use as critical components in life support devices or systems.
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Printed on recycled paper.
0950N–PLD–07/02 xM
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