– One 16K Byte Boot Block with Programming Lockout
– Two 8K Byte Parameter Blocks
– Two Main Memory Blocks (96K, 128K Bytes)
• Fast Erase Cycle Time - 10 seconds
• Byte-by-byte Programming - 10 µs/Byte Typical
• Hardware Data Protection
• DAT A Polling for End of Program Detection
• Low Power Dissipation
– 50 mA Active Current
– 100 µA CMOS Standby Current
• Typical 10,000 Write Cycles
Description
The AT49F002(N)(T) is a 5-volt only in-system reprogrammable Flash memory. Its 2
megabits of memory is orga nized as 262,144 words by 8 bits. Manufactured with
Atmel’s advanced nonvolatile CMOS technology, the device offers access times to 55
ns with power dissipation of just 275 mW over the commercial temperature range.
When the device is dese lecte d, the CMO S stan dby cu rrent
is less than 100 µA. For the AT49F002N(T) pin 1 for the
DIP and PLCC packages and pin 9 for the TSOP package
are don’t connect pins.
To allow for simple in-system reprogrammability, the
AT49F002(N)(T) does not require high input voltages for
programming. Five-volt-only commands determine the read
and programming operation o f the device. Readin g data
out of the device is similar to reading from an EPROM; it
has standard CE
, OE, and WE inputs to avoid bu s conten tion. Reprogramming the AT49F002(N)(T) is performed by
erasing a block of data and then programming on a byte by
byte basis. The byte pr ogram ming time is a fast 50 µs. The
end of a program cycle can be optionally detected by the
polling feature. Once the end of a byte program
DATA
cycle has been detected, a new access for a read or program can begin. The typical nu mber of pr ogram a nd erase
cycles is in excess of 10,000 cycles.
Block Diagram
VCC
GND
OE
WE
CE
RESET
ADDRESS
INPUTS
CONTROL
LOGIC
Y DECODER
X DECODER
The device is erased by executing the er ase command
sequence; the device internally controls the erase operations. There are two 8K byte para meter bloc k sectio ns and
two main memory blocks.
The device has the capability to protect the data in the boot
block; this feature is enabled by a command sequence.
The 16K-byte boot block section includes a reprogramming
lock out feature to prov ide data in tegr i ty. The boot sector is
designed to contai n user secur e code, and when the feature is enabled, the boot sector is protected from being
reprogrammed.
In the AT49F002(N)(T), once the boot block programming
lockout feature is enabled, the contents of the boot block
are permanent and cannot be changed. In the
AT49F002(T), once the boot block programm ing lockout
feature is enabled, the contents of the boot block cannot be
changed with input voltage levels of 5.5 volts or less.
AT49F002(N)
DATA INPUTS/OUTPUTS
I/O7 - I/O0
8
INPUT/OUTPUT
BUFFERS
PROGRAM
DATA LATCHES
Y-GATING
MAIN MEMORY
BLOCK 2
(128K BYTES)
MAIN MEMORY
BLOCK 1
(96K BYTES)
PARAMETER
BLOCK 2
(8K BYTES)
PARAMETER
BLOCK 1
(8K BYTES)
BOOT BLOCK
(16K BYTES)
3FFFF
20000
1FFFF
08000
07FFF
06000
05FFF
04000
03FFF
00000
AT49F002(N)T
DATA INPUTS/OUTPUTS
I/O7 - I/O0
8
INPUT/OUTPUT
BUFFERS
PROGRAM
DATA LATCHES
Y-GATING
BOOT BLOCK
(16K BYTES)
PARAMETER
BLOCK 1
(8K BYTES)
PARAMETER
BLOCK 2
(8K BYTES)
MAIN MEMORY
BLOCK 1
(96K BYTES)
MAIN MEMORY
BLOCK 2
(128K BYTES)
3FFFF
3C000
3BFFF
3A000
39FFF
38000
37FFF
20000
1FFFF
00000
2
AT49F002(N)(T)
Device Operation
READ: The AT49F002(N)(T) is accessed like an EPROM.
When CE
at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high
impedance state whenever CE
control gives designers flexibility in preventing bus contention.
COMMAND SEQUENCES: When th e device is first p owered on it will be reset to the read or standby mode
depending upon the state of the control line inputs. In order
to perform other device functions, a series of command
sequences are entered into the device. The command
sequences are shown in the Command Definitions table.
The command sequences are written by applying a low
pulse on the WE
tively) and OE
edge of CE
latched by the first rising edge of CE
microprocessor write timings are used. The address locations used in the command sequences are not affected by
entering the command sequences.
RESET: A RESET
tem application s. When RE SET
device is in its standa rd oper at ing mod e. A low l evel on th e
RESET
the outputs of the device in a high impedance state. If the
RESET
or erase operation, the operation may not be successfully
completed and the op eratio n will have to be repeate d after
a high level is applied to the RESET
is reasserted on the RESET
read or standby mode, depending upon the state of the
control inputs. By ap plyi ng a 12 V
RESET
even if the boot block loc kout feature has be en enabled
(see Boot Bloc k Prog ramming Locko ut Over ride s ection) .
The RESET feature is not available for the AT49F002N(T).
ERASURE: Before a byte can be repr ogramme d, the main
memory block or parameter block which contains the byte
must be erased. The erased state of the memor y bits is a
logical “1”. The entire devic e can be eras ed at one tim e by
using a 6-byte soft ware code. T he software chip erase
code consists of 6-byte load commands to specific address
locations with a specific data pattern (please refer to the
Chip Erase Cycle Waveforms).
After the software c hi p e ra se has been initiate d, the d evi ce
will internally time the er ase operation so that no e xternal
clocks are required. The maximum time needed to erase
the whole chip is t
been enabled, the data in the boot sector will not be
erased.
and OE are low and WE is high, the data stored
or OE is high. This dual-line
or CE input with CE or WE low (respec-
high. The address is latched on the falling
or WE, whichever occurs last. The data is
or WE. Standard
input pin is provi ded to eas e some s ys-
is at a logic high level, the
input halts the prese nt device oper ation and puts
pin makes a high to low transition during a program
pin. When a high level
pin, the device returns to the
± 0.5V input signa l to th e
pin, the boot block array can be reprogrammed
. If the boot block lockout feature has
EC
AT49F002(N)(T)
CHIP ERASE: If the boot block lockout has been enabled,
the Chip Erase function will erase Parameter Block 1,
Parameter Block 2, M ain Me mory B lock 1, a nd Mai n Memory Block 2 but not the boot block. If the Boot Block Lockout
has not been enabled, the Chip Erase function will erase
the entire chip. After the full chip erase the device will
return back to read mode. Any c omm and dur ing chip er as e
will be ignored.
SECTOR ERASE: As an alternative to a full chip erase, the
device is organized into sectors that can be individually
erased. There are two 8K-byte parameter block sections
and two main memory blocks. The 8K-byte parameter
block sections can be independently erased and reprogrammed. The two main memory sections are designed to
be used as alternative memory sectors. That is, whenever
one of the blocks has bee n er as ed and repr og ramme d, the
other block should be erased and r eprogrammed be fore
the first block i s ag ain e ra se d. The Se ctor Erase comman d
is a six bus cycle operation. The sector address is latched
on the falling WE
input command is latched at the ri sing edge of WE
sector erase starts after the rising edge of WE
cycle. The erase op eration is in ternally contr olled; it will
automatically time to completion.
BYTE PROGRAMMING: Once the memory array is
erased, the device is programmed (to a logical “0”) on a
byte-by-byte bas is. Please not e that a data “0” cannot b e
programmed ba ck to a “1”; only erase operations can convert “0”s to “1”s. Programming is ac complished via the
internal device command register and is a 4 bus cycle
operation (please refer to the Command Definitions table).
The device will automatic al ly generate the required interna l
program pulses.
The program cyc le has addres ses latched on the falling
edge of WE
latched on the rising edge of WE
first. Programming is completed after the specified t
time. The DATA
the end of a program cycle.
BOOT BLOCK PROGRAMMING LOCKOUT: The device
has one designated block that has a programming lockout
feature. This feature prevents programming of data in th e
designated block once the feature has been enabled. The
size of the block is 16K bytes. This block, referred to as the
boot block, can contain secure code that is used to bring up
the system. Enablin g the l ockou t featur e wil l allow the boot
code to stay in the device while data in the rest of the
device is updated. This feature does not have to be activated; the boot block’s usage as a write protec ted reg io n is
optional to the user. The address range of the boot block is
00000 to 03FFF for the AT49F002(N) while the address
edge of the sixth cycle while the 30H data
. The
of the sixth
or CE, whichever occurs last, and the data
or CE, whichever occurs
cycle
polling feature may also be used to indicate
BP
3
range of the boot block is 3C000 to 3F FFF for the
AT49F002(N)T.
Once the feature is enabled, the data in th e boot blo ck ca n
no longer be erased or prog ramme d with inpu t vol tage le vels of 5.5V or less. Data in the ma in memory blo ck ca n still
be changed through the regular programming method. To
activate the lockout feature, a seri es of six progr am commands to specific addresses with specific data must be
performed. Please refer to the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION: A software
method is available to determine if programming of the boot
block section is locked out. When the device is in the software product i dentifica tion mode (see Sof tware Pr oduct
Identification Entry and Exit sections) a read from address
location 00002H will s how if progr ammin g the boot bl ock is
locked out for the AT49F002(N), and a read from address
location 3C002H will show if programming the boot block is
locked out for AT49F002(N)T. If the data on I/O0 is low, the
boot block can be program med; if the da ta on I/O0 i s high,
the program loc kout feature has been activa ted and the
block cannot be programm ed. The softw are product id entification exit code should be used to return to standard
operation.
BOOT BLOCK PROGRAMMING LOCKOUT OVERRIDE:
The user can override th e boot block programm ing lock out
by taking the RESET
tected boot block data can be altered through a chip erase,
sector erase or word programming. When the RESET
brought back to TTL levels the boot block programming
lockout feature is again a ctive. Thi s feat ure is n ot ava ilabl e
on the AT49F002N(T).
pin to 12 volts. By doing th is, pro-
pin is
PRODUCT IDENTIFICATION: The product identification
mode identifies the device and manufacturer as Atmel. It
may be accessed by hardware or software operation. The
hardware operation mode can be used by an external programmer to identify the correct programming algorithm for
the Atmel product.
For details, see Oper ating Mo des (for hardw are ope ratio n)
or Software Product Identification. The manufacturer and
device code is the same for both modes.
DATA POLLING: The AT49F002(N)(T) features DATA
ing to indicate the end of a program cycle. During a program cycle an attempted read of the last byte loaded will
result in the complement of the loaded data on I/O7. Once
the program cycle has been completed, true data is valid
on all outputs and the next cy cle may begin. DATA
may begin at any time during the program cycle.
TOGGLE BIT: In addition to DATA
AT49F002(N)(T) provides another method for determining
the end of a program or erase cycle. During a program or
erase operation, success ive atte mpt s to read data fr om the
device will result in I/O6 toggling between one and zero.
Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Exami ning the to ggle bit
may begin at any time during a program cycle.
HARDWARE DATA PROTECTION: Hardware features
protect against inadvertent programs to the
AT49F002(N)(T) in the following ways: (a) V
is below 3.8V (typical), the program function is inhib-
V
CC
ited. (b) Program inhi bit: holding a ny one of OE
high or WE high inhibits program cyc les. (c) Noise filter :
pulses of less than 15 ns (typical) on the WE
will not initiate a program cycle.
polling the
CC
or CE inputs
poll-
polling
sense: if
low, CE
4
AT49F002(N)(T)
AT49F002(N)(T)
Cycle
(1)
OUT
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
IN
6th Bus
Cycle
(4)
Command Definition (in Hex)
1st Bus
Command
Sequence
Read1AddrD
Chip Erase65555AA2AAA555555805555AA2AAA55555510
Sector Erase65555AA2AAA555555805555AA2AAA55SA
Byte Program45555AA2AAA555555A0AddrD
Boot Block Lockout
Product ID Entry35555AA2AAA55555590
Product ID Exit
Product ID Exit
Notes: 1. The DATA FORMAT in each bus cycle is as follows: I/O7 - I/O0 (Hex)
(3)
(3)
2. The 16K byte boot sector has the address range 00000H to 03FFFH for the AT49F002(N) and 3C000H to 3FFFFH for the
AT49F002(N)T
3. Either one of the Product ID Exit commands can be used.
4. SA = sector addresses:
For the AT49F002(N):
SA = 00000 to 03FFF for BOOT BLOCK
Nothing will happen and the device goes back to the read mode in 100 ns
SA = 04000 to 05FFF for PARAMETER BLOCK 1
SA = 06000 to 07FFF for PARAMETER BLOCK 2
SA = 08000 to 1FFFF for MAIN MEMORY ARRAY BLOCK 1
This command will erase - PB1, PB2 and MMB1
SA = 20000 to 3FFFF for MAIN MEMORY ARRAY BLOCK 2
Bus
Cycles
(2)
65555AA2AAA555555805555AA2AAA55555540
35555AA2AAA555555F0
1XXXXF0
AddrDataAddrDataAddrDataAddrDataAddrDataAddrData
30
For the AT49F002(N)T:
SA = 3C000 to 3FFFF for BOOT BLOCK
Nothing will happen and the device goes back to the read mode in 100 ns
SA = 3A000 to 3BFFF for PARAMETER BLOCK 1
SA = 38000 to 39FFF for PARAMETER BLOCK 2
SA = 20000 to 37FFF for MAIN MEMORY ARRAY BLOCK 1
This command will erase - PB1, PB2 and MMB1
SA = 00000 to IFFFF for MAIN MEMORY ARRAY BLOCK 2
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature.....................................-65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to V
Voltage on OE
with Respect to Ground...................................-0.6V to +13.5V
+ 0.6V
CC
*NOTICE:Stresses beyo nd thos e lis ted under “Absolute Maxi-
mum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating cond itions for extended
periods may affect device reliability.