Q-Tech QT816 User Manual



DETAIL PRODUCT

SPECIFICATION CONTROL DRAWING

Revision Record

Revision DCO Description

– Initial release 5/28/08
A Updated part numbers LV RS CA 1/9/09
B Edited part numbers LV RS CA 6/21/09
C Edited Environmental Conditions, added temperature range options. LV RS CA 12/2/10

Changed par. 3.1.1 split supply and load variation from frequency

D

E 2224

stability vs. temperature characteristics; changed phase noise note;
split current for lower supply voltage. (ECO 10552)

Section 3.1.1 Electrical Characteristics:
Parameter: Freq. stability vs. ±5 % Input Voltage Variation, Max;
Value: WAS: ±1.2 for Vss= 5 and 3.3V ±0.3 for Vss= 5 and 3.3V
IS: ±1.2 for Vss= 5 and 3.3V ±0.3 for Vss= 12

Eng. Approval

Initials and Date

LV BR CA 7/24/12

LV JL 10/2/13 CP 10/2/13 10/2/13

QA Approval

Initials and Date

Release

Date

UNLESS OTHERWISE SPECIFIED

Dimensions are in Inches

Decimal Fraction Angular

.xxx ± .005

.xx ± .02

.x ± .1

Tolerances

x° ± 2°

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Initial Release

Prepared Date

Luis Vargas 5/28/08

Checked Date

Craig Albright 2/10/09

Engineering Approval Date

Ron Stephens 2/10/09

Quality Assurance Approval Date

Craig Albright 2/10/09

Released Date

Alfred Min 2/10/09

F1195-2RA

ATIONTOAFOREIGN

10150 West Jefferson Blvd.

Culver City, CA 90232-3510 USA

LOW PROFILE 24 PIN FLAT PACK HYBRID

CRYSTAL OSCILLATOR, TCXO, CLASS S,

STANDARD DESIGN FOR SINE WAVE

UP TO 350MHz

DRAWING NO. REVISION

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

SCALE SIZE CAGE CODE PAGE

NONE A 51774

E

1 of 10

1.0 SCOPE

This specification establishes the detail requirements for low profile hybrid, hermetically sealed,
HCMOS output temperature compensated crystal oscillators (TCXO)

MIL-PRF-55310).

2.0 APPLICABLE DOCUMENTS

Type 3, Class 2 (Reference

The following documents of the latest issue form a part of this drawing to the extent specified herein.

2.1

Specifications and Standards

SPECIFICATIONS

MILITARY

MIL-S-19500 Semiconductor Devices, General Specification For

MIL-PRF-55310 Crystal Oscillators, General Specification For

MIL-PRF-38535 Integrated Circuits, (Microcircuits) Manufacturing, General Specification For

MIL-PRF-38534 Hybrid Microcircuits, General Specification For

STANDARDS

MILITARY

MIL-STD-202 Test Methods for Electronic and Electrical Component Parts

MIL-STD-883 Test Methods and Procedures for Microelectronics

MIL-STD-1686 Electrostatic Discharge Control Program for Protection of Electrical and

Electronics Parts, Assemblies and Equipment.

2.2 Conflicting Requirements

In the event of conflict between requirements of this specification and other requirements of the

applicable detail drawing, the precedence in which requirements shall govern, in descending order, is
as follows:

a) Applicable Customer purchase order.
b) Applicable detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.

2.3 Customer Purchase Order Special Requirements

Additional special requirements shall be specified in the applicable Customer purchase order when

additional requirements or modifications specified herein are needed for compliance to special program

or product line requirements.

3.0 PERFORMANCE REQUIREMENTS

3.1 General Definition

The TCXO is a high reliability signal generator that provides a sine-wave output. The TCXO has been

designed to operate in a spaceflight environment with an expected lifetime in excess of 15 years.
Lifetime is defined as the sum of operational and storage environments.

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 2 of 10

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3.1.1 Electrical Characteristics

PARAMETER SYMBOL CONDITIONS VALUE UNIT

Frequency Nom.

Supply voltage, Nom.

Input Current, max.

Freq. stability vs.
Operating Temperature

f/fc (Ta)

fo

Vs

Is

-

Vs±5%

Vs, nom. / Ta=+25C

Contact factory for other
options available

See part number
generation table

See part number
generation table

30 for Vs=

12 and 15V

See part number
generation table

55 for Vs= 5

and 3.3V

MHz

V

mA

ppm

Electrical Frequency
Adjustment Min.
(when specified)

Freq. stability vs. ±5 %
Input Voltage Variation,
Max

Freq. stability vs. ±5 %
Load Variation, Max

Aging Max

Freq. stability vs. Vacuum
Short term stability
RF Output

Output level Min.

Harmonics Max. -20 -20 dBc
Sub-harmonics Max. N/A -20 dBc
Phase noise @ freq. offset

(Output Frequency up

to 75 MHz)

See notes: A,B,C and D

below

Spurious

A:

For Frequencies between 75.1 MHz and 150 MHz phase noise degrades between 6 dbc/Hz to 10 dbc/Hz

B:

For Frequencies between 150.1 MHz and 210 MHz phase noise degrades between 10 dbc/Hz to 12

f/fo

(Vcc)

f/fc (Vs) ±5 % Vs,, Ta=+25C

f/fc

(Load)

f/fo

f/fo

f/fc(t) t=1sec. (Allan Deviation) 0.001

£ (f)
£ (f)
£ (f)
£ (f)
£ (f)

±5 PPM Two options:

1) via an external select-at-

test resistor connected
from Pin 1 to Ground

2) Via External tuning voltage
±1.2 for

Vss= 5 and

3.3V

Vs, nom. / Ta=+25C ±0.3

over 10 year (first year ≤ 1
ppm)

Met by design, not tested

Contact factory for other
options available

Sine Class S, 100 krads (Si)
total dose Min

f=10Hz
f=100Hz
f=1kHz
f=10kHz
f=100kHz

Under static conditions. Met by
design, not tested.

30 to 75

3rd

-70 -70 dBc

±5.0

See part number
generation table

±0.3 for
Vss= 12

±5.0

0.2

75.1 to 350

rd

X

3

See part number
generation table

-80

-110

-135

-155

-155

ppm

ppm

ppm

ppm
ppm
MHz

dBm

dBc/H

z

dBc/H

z

dBc/H

z

dBc/H

z

dBc/H

z

dbc/Hz

C:

For Frequencies between 210.5 MHz and 225 MHz phase noise degrades 13 dbc/Hz

D:

For Frequencies between 225.5 MHz and 300 MHz phase noise degrades 15 dbc/Hz

3.2 Absolute Maximum Rating

Supply Voltage 0 to +16.5 VDC
DC Input Current 55 mA maximum

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

Note 1
Note 1

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 3 of 10

REV.

E

Storage Temperature range -62°C to +125°C
Lead Temperature (Soldering, 10 seconds) 300°C

Notes: 1 – without irreversible damages

3.2.1 Physical Characteristics

Note 1
Note 1

3.2.1.1 Dimensions

- The TCXO outline dimensions and terminal connections shall be as shown in Figure 1

herein.

3.2.1.2 Weight

3.2.1.3 Materials

3.3 Design and Construction

- The TCXO shall weigh less than or equal to 25 grams.

- The TCXO package body and lead finish shall be gold in accordance with MIL-PRF-38534.

The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the
oscillators shall meet the design and construction requirements of MIL-PRF-55310, except element
evaluation shall be as specified in 3.3.1.

SCREENING FLOW CHART

(Screening is performed on a 100% basis)

Operation

Non-Destruct Wire Bond Pull 100%, MIL-STD-883, Method 2023 (2.4 grams)
Internal Visual MIL-STD-883, methods 2017 & 2032 condition K (class S). During the time

interval between final internal visual inspection and preparation for sealing,
hybrid crystal oscillators shall be stored in a dry, controlled environment as

defined in MIL-STD-883, method 2017 or in a vacuum bake oven.
Stabilization Bake 48 hrs minimum @ +150°C MIL-STD-883, Method 1008 TC B
Thermal Shock MI-STD 883, Method 1011, TC A
Temperature Cycling MI-STD 883, Method 1010, TC B
Constant Acceleration MIL-STD-883, Method 2001, TC A (5000 gs, Y1 Axis only)
PIND MIL-STD-883, Method 2020, TC B
Electrical Test Frequency, Output levels, Input Current@ +25°C
Burn-In (Powered with load) +125°C for 240 hours
Seal Test (fine & gross) 100% Method 1014, (TC A1 for fine leak and TC C for gross leak)
Electrical Test

Radiographic MIL-STD-883, Method 2012 class S
External visual MIL-STD-883 Method 2009

Frequency, Output levels, Input Current

@ +25°C & Temp Extremes listed on the Electrical Specification

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 4 of 10

REV.

E

PARAMETER SYMB

OL

Input Current, max. Is

Group A Inspection

(Testing is performed on a 100% basis)

CONDITIONS VALUE UNIT

Vs, nom. / Ta=+25C

30 for
Vss= 12
and 15V

55 for

Vss= 5

and 3.3V

mA

Freq. stability vs. Operating
Temperature

Electrical Frequency
Adjustment Min.
(when specified)

Output level Min.

Harmonics/Harmonicas, Max.

Phase noise @ freq. offset

(Output Frequency up to

75 MHz)

See note A below

External Visual

A:

For Frequencies between 75.1 MHz and 150 MHz phase noise degrades between 6 dbc/Hz to 10 dbc/Hz

B:

For Frequencies between 150.1 MHz and 210 MHz phase noise degrades between 10 dbc/Hz to 12

f/fc

(Ta)

f/fo

(Vcc)

£ (f)
£ (f)
£ (f)
£ (f)
£ (f)

Vs, nominal and over the operating
temperature range indicated under part
number definition

± Vs, nom. / Ta=+25C as indicated
under part number definition

Sine Class S, 100 krads (Si) total dose
Min

± Vs, nom. / Ta=+25C -30 dBc

± Vs, nom. / Ta=+25C

f=10Hz
f=100Hz
f=1kHz
f=10kHz
f=100kHz

MIL-STD-883, Method 2009

indicated under

part number

definition

indicated under

part number

definition

indicated under

part number

definition

-80

-110

-135

-155

-155

ppm

ppm

dBm

dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz

dbc/Hz

C:

For Frequencies between 210.5 MHz and 225 MHz phase noise degrades 13 dbc/Hz

D:

For Frequencies between 225.5 MHz and 300 MHz phase noise degrades 15 dbc/Hz

Group B Inspection

Testing shall be performed after completion of Frequency Aging and before parts are

shipped

SUB-

GROUP

1 Frequency Aging

TEST DESCRIPTION CONDITION QTY

MIL-PRF-55310

Para 3.6.34.2

100%

2

3 Electrical 1/ (Go/NoGo) 100%

Hermetic Seal 1/

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 5 of 10

100%

REV.

E

NOTE: Samples from Subgroup 1 may be divided and used for Subgroups 3 and 4
Inspections.

SUB-

GROUP

Group C Electrical Inspections are performed on a 100% basis

TEST

DESCRIPTION

Group C Inspection1

CONDITION QTY

1

3

Vibration

(random)

Shock

Electrical Test

Hermetic Seal

Electrical Test

Temperature

Cycling

Electrical Test

Ambient Pressure

(Non-Operating

Electrical Test

Storage

Temperature

Hermetic Seal

Electrical Test Frequency, Output levels, Input Current @ +25°C & Temp

Resistance to

Soldering Heat

Hermetic Seal

Moisture

Resistance

Terminal

Strength (Lead

Integrity)

MI-STD 202 Method 214/ T.C. I-K (46Grms) for 3 minutes
in each plane.

MI-STD 202 Method 213 T.C. F
(1500g, 0.5ms half-sine pulse) 3 blows each direction of
three axes (18 shocks total)

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification.

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification.

MI-STD 883, Method 1010, TC B 100 cycles.

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification

2 MI-STD 202 Method 105 T.C. C

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification

Low Temp.of - 55 (+0, -5) °C
HighTemp.of +150 (+5,-0) °C

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

Extremes listed on the Electrical Specification

MI-STD 202 Method 210 T.C. B

Fine Leak – MIL-STD-883,Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

MI-STD 202 Method 106

MI-STD 202 Method 211 T.C. B

4 parts

(0 failures)

1 parts

(0 failures)

4

Visual Inspection

Hermetic Seal

Resistance To

Solvents

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

Fine Leak – MIL-STD-883,Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

MI-STD 202 Method 215

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 6 of 10

1 parts

(0 failures)

REV.

E

3.3.1 All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF­38534, Class K, with the following exceptions:

Active elements

a) Visual inspection of silicon on sapphire microcircuits.

Semicircular crack(s) or multiple adjacent
cracks, not in the active area, starting and terminating at the edge of the die are acceptable.
Attached (chip in place) sapphire is nonconductive material and shall not be considered as foreign
material and will be considered as nonconductive material for all inspection criteria.

b) Subgroup 4, Scanning Electron Microscope (SEM) inspection.

The manufacturer may allow the die
distributor, at his option, to select two (2) dice from a waffle pack (containing a maximum quantity
of 100 die), visually inspect for the worst case metallization of the 2 dice, and take SEM
photographs of the worst case.

c) Subgroup

purchase order.

5 radiation tests. Subgroup 5 radiation tests are not required unless otherwise specified in the detail

3.3.2 Processes - Processes used for manufacturing the TCXO are selected on the basis of their ability to
meet the quality requirements for space High Reliability manufacturing. Travelers or Process Cards are
used in the manufacturing and testing of all of the TCXO Series, and might be available for customer
review. Copies of these Travelers can be provided with the TCXOs at time of shipment if so specified
on the purchase order

.

3.3.3 Interchangeability - Each TCXO shall be interchangeable without using a special selection process.

3.3.4 Product Marking - Each unit shall be permanently marked with the manufacturer's name or symbol,
part number, lot date code number, and serial number. The unit shall be marked with the outline of
an equilateral triangle near pin 1 to show that it contains devices which are sensitive to electrostatic
discharge.

3.4 Parts Program

Devices delivered to this specification represent the standardized Parts, Materials and Processes (PMP)
Program developed, implemented and certified for advanced applications and extended environments.

3.4.1 Quartz Crystal Resonator

- The crystal resonator used shall be constructed using a 4-point mount

premium synthetic swept Quartz and procured to Q-TECH SCD. (For the Engineering models, non-

swept quartz may be used).

3.4.2 Active devices

– Radiation testing is not performed at the oscillator level, but these TCXOs have been
acceptable for use in environments up to 100K rads by analysis of the components used. ONLY Bipolar
semiconductors are employed in the design. This device is specified to be radiation tolerant to:

100 kRad(Si) total ionizing dose(TID)

3.4.3 Prohibited Materials

: Materials containing more than 97% tin and materials containing measurable
amounts (by common nondestructive test methods) of selenium, cadmium, or mercury shall not be
used as plating, coating or base materials in the construction of parts or components. Zinc is only
acceptable as an alloying element and alloys containing zinc must be covered by suitable protective
plating (e.g. nickel plating). Inert oxides of the above materials are allowed.

3.5 Traceability Requirements

Material, element and process traceability requirements shall be as specified by MIL-PRF-38534 for
Class K hybrids.

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 7 of 10

REV.

E

3.6 Data

3.6.1. Design Documentation

- When required by the purchase order, design, topography, process and flow
charts for all assembly/inspection and test operation for devices to be supplied under this specification
on the initial procurement shall be established and shall be available in-plant for review by the
procuring activity upon request. This design documentation shall be sufficient to depict the physical
and electrical construction of the devices supplied under the specification and shall be traceable to the
specific parts, drawings or part type numbers to which it applies, and to the production lot(s) and
inspection lot codes under which devices are manufactured and tested so that revisions can be
identified.

3.6.2. Technical Data Package

- When required by the purchase order, the following design documentation
and information is deliverable 30 days prior to the start of production. The Technical Data Package shall
consist of the following:

a) Assembly drawing(s).

b) All electrical schematics and drawings

not considered proprietary

.

c) The assembly and screening travelers to be used on-line to manufacture the devices supplied to

this specification.

d) Parts and materials list.

e) Element evaluation data confirming compliance with MIL-PRF-38534, Class K, and

Prohibited Materials paragraph 3.4.

3

3.7 Test Report

A test report is supplied with each shipment of oscillators and includes the following information, as a

minimum:
a) A Certificate of Conformance to all specifications and purchase order requirements. As a minimum,

the Certificate of Conformance shall include the following information:

Purchase order number.

Applicable part number.

Manufacturers lot number.

Lot date code.

b) Parts and materials traceability information.
c) Certificate of crystal sweeping.
d) Manufacturing lot traveler.
e) Screening attributes and variables data as applicable.
f) Quality conformance inspection attributes and variables data as applicable.
g) Radiographic inspection negatives.

3.8 Engineering Models

Engineering Models are fit, form, and function representative of Flight Models and of commercial
construction using commercial parts of same generic type as Flight Models. Completed oscillators are
not screened.

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 8 of 10

REV.

E

NOTES:
This oscillator is offered to meet the specifications above and is not guaranteed to meet any other

requirements.

▀ PART NUMBER GENERATION

SERIES

QT81: 24 Pin

Flat Pack

Output type and supply

voltage

4: SINE WAVE 0dBm …..5V N: 0…+50………

5: SINE WAVE +7dBm ….12V P: 0…+70…………
6: SINE WAVE 7dBm …..15V Q: 0…+70………

R: 0…+70………

U: -20…+70……

V: -20…+70……

W:-20…+70……

X: -40…+85……

Y: -40…+85……

Z: -40…+85……

A: 0…..+50……

G: 0….+70……
H:-30…+70……
K:-30…+70……
(See note 1 below)

TEMPERATURE

RANGE (C)

1. Variations from standard specification are available, please contact factory.

EXAMPLE:
QT815URM-100.000000 would be a Flight Model

version HF TCXO, 24 pin SMD flat pack, sine-wave 12 volts, stability ±1

ppm over -20…+70°C, @ 100 MHz with external tuning via external resistor.

QT815URE-100.000000

stability ±1 ppm over -20…+70°C, @ 100 MHz with external tuning via external resistor.

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

would be a Engineering Model version HF TCXO, 24 pin SMD flat pack, sine-wave 12 volts,

SIZE

A

Stability

Over

Temperature

1 ppm

1 ppm

2 ppm

5 ppm

1 ppm

2 ppm

5 ppm

4 ppm

5 ppm
10 ppm

 0.5ppm

 0.5ppm

2 ppm

4 ppm

CAGE NO.

51774

External Tuning Level

X: No tuning

R: External resistor M: Flight Model

V: External voltage

E: Eng. Model 10……..350

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 9 of 10

FREQUENCY

(MHz)

REV.

E

FIGURE 1 INTERFACE CONTROL DRAWING

24 pin Flat-Pack

ESD SYMBOL FOR PIN NO. 1

Q-TECH
PART NUMBER
FREQUENCY

D/C

S/N

USA

24X .072 ± .007

22X .100 TYP.

NON-ACCUMULATIVE

.975 MAX.

12

.210 MAX.

24X .010 ± .002

2X .500 MIN.

13

1.275 MAX.

1

24X .015 ±.003

PIN NO. DESIGNATION

1

2 - 11 NC

12 Ground/Case
13 RF Output

14 - 23 NC

24 Supply Voltage

External Frequency Adjustment

(when specified)

2X 1.100

24

2X .085 REF.

NOTES:

 Dimensions are in inches.
 Lead numbers are for reference only and

are not marked on the unit.

 A triangle symbol is marked on the corner of

the package to indicate Pin 1

 All pins with NC function may not be

connected as external tie or connections
(Pins may be connected internally).

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT814, QT815 and QT816

Sine-Wave 24 Flat Pack

Page 10 of 10

REV.

E