Q-Tech QT812 User Manual

REVISIONS

REVISION DESCRIPTION APPROVED DATE

A Updated part numbers Luis Vargas 1/9/09

B

C

Edited Part Numbers Luis Vargas 6/21/2009
Edited Luis Vargas 12/2/2010
Changed par. 3.1.1 split supply and load variation from frequency

D

stability Vs. temperature characteristics, phase noise limits @10Hz
and 100 Hz) Add par. 3.4.2 Logic microcircuits and Radiation
(ECO#

10550)

C. Albright 4/26/12

CONSULT FACTORY FOR CURRENT REVISION

SPECIFICATION CONTROL DRAWING

UNLESS OTHERWISE

PREPARED BY:

SPECIFIED, DIMENSIONS

ARE IN INCHES.

TOLERANCES:

Luis Vargas

CHECKED BY:

3 PLACE DECIMAL = .005

2 PLACE DECIMAL = .02

1 PLACE DECIMAL = .1

B. Remtulla

FRACTIONS = ± 1/16

ANGLES = 2 DEGREES

RELEASED BY:

APPROVED BY:

P. Steinblums 4/26/12

C. Albright

DATE

4/25/12

LOW PROFILE 24 PIN Flat-Pack HYBRID CRYSTAL

DATE

4/26/12

DATE

4/26/12

SCALE

NONE

Q-TECH CORPORATION

10150 W. JEFFERSON BLVD.

CULVER CITY, CA 90232-3510

OSCILLATOR, TCXO, CLASS S,

Standard Design For HCMOS up to 90MHz

DRAWING NO.:

QT811 and QT812

Square-Wave

SIZE

A

CAGE CODE

51774

SHEET 1 of 10

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

REVISION

D

1.0 SCOPE

24 PIN Flat-Pack

This specification establishes the detail requirements for low profile hybrid, hermetically sealed,
HCMOS output temperature compensated crystal oscillators (TCXO) for use in space flight missions

2.0 APPLICABLE DOCUMENTS

The following documents of the latest issue form a part of this drawing to the extent specified herein.

2.1 Specifications and Standards

MIL-S-19500 Semiconductor Devices, General Specification For

MIL-PRF-55310 Crystal Oscillators, General Specification For

MIL-PRF-38535 Integrated Circuits, (Microcircuits) Manufacturing, General Specification For

MIL-PRF-38534 Hybrid Microcircuits, General Specification For

MIL-STD-202 Test Methods for Electronic and Electrical Component Parts

MIL-STD-883 Test Methods and Procedures for Microelectronics

MIL-STD-1686 Electrostatic Discharge Control Program for Protection of Electrical and Electronics Parts,

Assemblies and Equipment.

SPECIFICATIONS

MILITARY

STANDARDS

MILITARY

2.2 Conflicting Requirements

In the event of conflict between requirements of this specification and other requirements of the

applicable detail drawing, the precedence in which requirements shall govern, in descending order, is
as follows:

a) Applicable Customer purchase order.
b) Applicable detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.

2.3 Customer Purchase Order Special Requirements

Additional special requirements shall be specified in the applicable Customer purchase order when

additional requirements or modifications specified herein are needed for compliance to special

program or product line requirements.

3.0 PERFORMANCE REQUIREMENTS

3.1 General Definition

The TCXO is a high reliability signal generator that provides a square-wave output. The TCXO has

been designed to operate in a spaceflight environment with an expected lifetime in excess of 15 years.
Lifetime is defined as the sum of operational and storage environments.

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 2 of 10

REV.

D

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

24 PIN Flat-Pack

3.1.1 Electrical Characteristics

PARAMETER SYMBOL CONDITIONS VALUE UNIT

Frequency Nom. fo - 3. to 90 MHz
Supply voltage, Nom. Vs Vs±5%

Input Current, max. Is
Freq. stability vs. Operating

temperature
Electrical Frequency
Adjustment Min.
(when specified)

Freq. stability vs. ±5 %
Input Voltage Variation

Freq. stability vs. ±5 %
Load Variation

Aging Max
Freq. stability vs. Vacuum
Short term stability
RF Output

Output VOH / VOL load=15pF, Vcc=nom.

Δf/fc (Ta)

Δf/fo

(ΔVcc)

Δf/fc (Vs) Ta=+25°C

Δf/fc

(Load)

Δf/fo
Δf/fo

Δf/fc(Δt) Δt=1sec. (Allan Deviation)

Vs, nom. / Ta=+25°C

Contact factory for other options
available

±5 PPM Two options:

1) via an external select-at-test

2) Via External tuning voltage

Vs, nom. / Ta=+25°C 0.3 ppm

over 10 year (first year ≤ 1 ppm) ±5.0 ppm
Met by design, not tested

Contact factory for other options
available

resistor connected from Pin 1
to Ground

See part number
generation table

50 mA

See part number
generation table

±5.0 ppm

±1.2 ppm

±0.2

0.001 ppm

30 to 70

3rd

0.9•Vcc / 0.1•Vcc

70.1 to
90

rd

3

X

V

ppm

ppm

MHz

V

Duty cycle DC

Rise- / fall time tr / tf 20%~80% Vout, 80%~20% Vout .5…7 (see note A) nSec
Load 15 pF
Phase noise @ freq. offset

A:

Supply Current, rise & fall time are frequency dependent

£ (Δf)
£ (Δf)
£ (Δf)
£ (Δf)
£ (Δf)

load=15pF/ @50%Vcc, Ta=+25°C

Δf=10Hz
Δf=100Hz
Δf=1kHz
Δf=10kHz
Δf=100kHz

See part number
generation table

-70

-100

-130

-140

-140

70.1 to 90
MHZ

Contact

factory for

other

options

available

%

dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz

3.2 Absolute Maximum Rating

Supply Voltage 0 to +6.0 VDC
DC Input Current 50 mA maximum

Storage Temperature range -55°C to +125°C

Lead Temperature (Soldering, 10 seconds) 300°C

CHARACTERISTICS MAXIMUM RATINGS REMARKS

Note 1
Note 1

Note 1

Note 1

Notes: 1 – Without irreversible damages

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Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 3 of 10

REV.

D

3.2.1 Physical Characteristics

24 PIN Flat-Pack

3.2.1.1 Dimensions

- The TCXO outline dimensions and terminal connections shall be as shown in Figure 1

herein.

3.2.1.2 Weight

3.2.1.3 Materials

- The TCXO shall weigh less than or equal to 15 grams.

- The TCXO package body and lead finish shall be gold in accordance with MIL-PRF-38534.

3.3 Design and Construction

The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the
oscillators shall meet the design and construction requirements of MIL-PRF-55310, except element
evaluation shall be as specified in 3.3.1

SCREENING FLOW CHART

Operation

Non-Destruct Wire Bond Pull 100%, MIL-STD-883, Method 2023 (2.4 grams)
Internal Visual MIL-STD-883, methods 2017 & 2032 condition K (class S). During the

time interval between final internal visual inspection and preparation for
sealing, hybrid crystal oscillators shall be stored in a dry, controlled
environment as defined in MIL-STD-883, method 2017 or in a vacuum

bake oven.
Stabilization Bake 48 hrs minimum @ +150°C MIL-STD-883, Method 1008 TC B
Thermal Shock MI-STD 883, Method 1011, TC A
Temperature Cycling MI-STD 883, Method 1010, TC B
Constant Acceleration MIL-STD-883, Method 2001, TC A (5000 gs, Y1 Axis only)
PIND MIL-STD-883, Method 2020, TC B
Electrical Test Frequency, Output levels, Input Current@ +25°C
Burn-In (Powered with load) +125°C for 240 hours
Seal Test (fine & gross) 100% Method 1014, (TC A1 for fine leak and TC C for gross leak)
Electrical Test

Radiographic MIL-STD-883, Method 2012 class S
External visual MIL-STD-883 Method 2009

Frequency, Output levels, Input Current

@ +25°C & Temp Extremes listed on the Electrical Specification

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Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 4 of 10

REV.

D

24 PIN Flat-Pack

Group A Inspection

PARAMETER SYMBOL CONDITIONS VALUE UNIT

Input Current, max. Is
Freq. stability vs.

temperature

Δf/fc (Ta)

Vs, nom. / Ta=+25°C

Vs, nominal and over the temperature
range indicated under part number
definition

50 mA

indicated under

part number

definition

ppm

Electrical Frequency
Adjustment Min.
(when specified)

Output VOH /

Duty cycle DC

Rise- / fall time tr / tf 20%~80% Vout, 80%~20% Vout .5…7 (see note A) nSec

External Visual MIL-STD-883, Method 2009

Supply Current, rise & fall time are frequency dependent

A:

Δf/fo

(ΔVcc)

VOL

± Vs, nom. / Ta=+25°C as indicated
under part number definition

load=15pF, Vcc=nom.

load=15pF/ @50%Vcc, Ta=+25°C

indicated under

part number

definition

0.9•Vcc / 0.1•Vcc

indicated under

part number

definition

ppm

V

%

Group B Inspection

SUB-

GROUP

1 Frequency Aging

2

TEST DESCRIPTION CONDITION QTY

Hermetic Seal 1/

MIL-PRF-55310

Para 3.6.34.2

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

100%

100%

1/ Testing shall be performed after completion of Frequency Aging and before parts are shipped.

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3 Electrical 1/ (Go/NoGo) 100%

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 5 of 10

REV.

D

24 PIN Flat-Pack

Group C Inspection

SUB-

GROUP

1

3

TEST

DESCRIPTION

Vibration (random)

Shock

Electrical Test

Hermetic Seal

Electrical Test

Temperature

Cycling

Electrical Test

Ambient Pressure

(Non-Operating

Electrical Test

Storage

Temperature

Hermetic Seal

Electrical Test Frequency, Output levels, Input Current @ +25°C & Temp

Resistance to

Soldering Heat

Hermetic Seal

Moisture

Resistance

Terminal Strength

(Lead Integrity)

MI-STD 202 Method 214/ T.C. I-K (46Grms) for 3 minutes in
each plane.

MI-STD 202 Method 213 T.C. F
(1500g, 0.5ms half-sine pulse) 3 blows each direction of three
axes (18 shocks total)

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification.

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification.

MI-STD 883, Method 1010, TC B 100 cycles.

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification

2 MI-STD 202 Method 105 T.C. C

Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical
Specification

Low Temp.of - 55 (+0, -5) °C
HighTemp.of +150 (+5,-0) °C

Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

Extremes listed on the Electrical Specification

MI-STD 202 Method 210 T.C. B

Fine Leak – MIL-STD-883, Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

MI-STD 202 Method 106

MI-STD 202 Method 211 T.C. B

CONDITION QTY

4 parts

(0 failures)

1 parts

(0 failures)

NOTE: Samples from Subgroup 1 may be divided and used for Subgroups 2, 3, and 4 Inspections.

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

Visual Inspection

4

Hermetic Seal

Resistance To

Solvents

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

Fine Leak – MIL-STD-883,Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C

MI-STD 202 Method 215

QT811 and QT812 Square-Wave

SIZE

A

CAGE NO.

51774

24 pin DDIP

Sheet 6 of 10

1 parts

(0 failures)

REV.

D

24 PIN Flat-Pack

3.3.1 All piece parts shall be derived from lots that meet the element evaluation requirements of MIL­PRF-38534, Class K, with the following exceptins:

Active elements

a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple

adjacent cracks, not in the active area, starting and terminating at the edge of the die
are acceptable. Attached (chip in place) sapphire is nonconductive material and shall
not be considered as foreign material and will be considered as nonconductive material
for all inspection criteria.

b) Subgroup 4, Scanning Electron Microscope (SEM) inspection. The manufacturer may

allow the die distributor, at his option, to select two (2) dice from a waffle pack
(containing a maximum quantity of 100 die), visually inspect for the worst case
metallization of the 2 dice, and take SEM photographs of the worst case.

c) Subgroup 5 radiation tests. Subgroup 5 radiation tests are not required unless

otherwise specified in the detail purchase order.

3.3.2 Processes

- Processes used for manufacturing the TCXO are selected on the basis of their ability to

meet the quality requirements for space High Reliability manufacturing. Travelers or Process Cards
are used in the manufacturing and testing of all of the TCXO Series, and might be available for
customer review. Copies of these Travelers can be provided with the TCXOs at time of shipment if
so specified on the purchase order.

3.3.3 Interchangeability

3.3.4 Product Marking

- Each TCXO shall be interchangeable without using a special selection process.

- Each unit shall be permanently marked with the manufacturer's name or symbol,
part number, lot date code number, and serial number. The unit shall be marked with the outline of
an equilateral triangle near pin 1 to show that it contains devices which are sensitive to electrostatic
discharge.

3.4 Parts Program

Devices delivered to this specification represent the standardized Parts, Materials and Processes (PMP)

Program developed, implemented and certified for advanced applications and extended environments.

3.4.1 Quartz Crystal Resonator

- The crystal resonator used shall be constructed using premium synthetic
swept Quartz and procured to Q-TECH SCD. For the Engineering models, non-swept quartz may be
used.

3.4.2 Active devices

– The microcircuit in this part shall use CMOS technology and shall be from a wafer

proven to be radiation tolerant to 100kRad(Si) total ionizing dose.

3.4.2.1CMOS microcircuit usage – For output frequencies below 14MHz, the output microcircuit shall
be Harris SOS ACS74HMSR, Silicon on Sapphire CMOS technology. This microcircuit is specified to be
Single Event Latchup and Upset free for LET up to 100MeV-cm2/mg. For frequencies greater than or
equal to 14MHz, the CMOS microcircuit shall be 54AC00, see DSCC SMD 5962-87549. This
microcircuit is specified to be Single Event Latchup and Upset free for LET up to 93MeV-cm2/mg. For
output frequencies from 14MHz to 70MHz (3.3Vdc) or 14MHz to 100MHz (5Vdc), the manufacturer
shall be ST Microelectronics; for frequencies higher than 70MHz (3.3Vdc) or higher than 100MHz
(5.5Vdc), the manufacturer shall be National Semiconductor Corporation.

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 7 of 10

REV.

D

3.5 Traceability Requirements

24 PIN Flat-Pack

Material, element and process traceability requirements shall be as specified by MIL-PRF-38534 for
Class K hybrids.

3.6 Data

3.6.1. Design Documentation

- When required by the purchase order, design, topography, process and
flow charts for all assembly/inspection and test operation for devices to be supplied under this
specification on the initial procurement shall be established and shall be available in-plant for
review by the procuring activity upon request. This design documentation shall be sufficient to
depict the physical and electrical construction of the devices supplied under the specification and
shall be traceable to the specific parts, drawings or part type numbers to which it applies, and to
the production lot(s) and inspection lot codes under which devices are manufactured and tested so
that revisions can be identified.

3.6.2. Technical Data Package.

documentation and information is deliverable 30 days prior to the start of production. The
Technical Data Package shall consist of the following:

a) Assembly drawing(s).
b) All electrical schematics and drawings not considered proprietary.
c) The assembly and screening travelers to be used on-line to manufacture the devices

supplied to this specification.

d) Parts and materials list.

3.7 Test Report

When required by the purchase order, the following design

A test report is supplied with each shipment of oscillators and includes the following information, as

a minimum:

a) A Certificate of Conformance to all specifications and purchase order requirements. As a

minimum, the Certificate of Conformance shall include the following information:

Purchase order number

Applicable part number

Manufacturer’s lot number

Lot date code

b) Parts and materials traceability information.
c) Certificate of crystal sweeping.
d) Manufacturing lot traveler.
e) Screening attributes and variables data as applicable.
f) Quality conformance inspection attributes and variables data as applicable.
g) Radiographic inspection negatives.

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 8 of 10

REV.

D

3.8 Engineering Models

24 PIN Flat-Pack

Engineering Models are fit, form, and function representative of Flight Models and of commercial

construction using commercial parts of same generic type as Flight Models. Completed oscillators are
not screened.

NOTES:
This oscillator is offered to meet the specifications above and is not guaranteed to meet any

other requirements.

▀ PART NUMBER GENERATION

Output type

SERIES

QT81:
24 Pin

Flat­Pack

EXAMPLE:

QT812AURM-50.000000 would be a Flight Mode

symmetry, stability ±1 ppm over -20…+70°C, @ 50 MHz with external tuning via external resistor

QT812AURE-50.000000 would be an Engineering Model

40/60 symmetry, stability ±1 ppm over -20…+70°C, @ 50 MHz with external tuning via external resistor

and supply

voltage

1: HCMOS, 5.0V

2: HCMOS, 3.3V

Q: 0…+70………

R: 0…+70………

U: -20…+70……

V: -20…+70……

W:-20…+70……

X: -40…+85……

Y: -40…+85……

Z: -40…+85……

A: 0…..+50……

G: 0….+70……
H:-30…+70……
K:-30…+70……

1. Variations from standard specification are available, please contact factory.

2. 45/55 Symmetry Contact factory for options available.

SYMMETRY

A:40%…60% N: 0…+50………

T:(See note 2) P: 0…+70…………

TEMPERATURE

RANGE (°C)

(See note 1 below)

l version HF TCXO, 24 pin SMD Falt-Pack, HCMOS 3.3 volts, 40/60

Stability

Over

Temperature

±1 ppm

±1 ppm

±2 ppm

±5 ppm

±1 ppm

±2 ppm

±5 ppm

±4 ppm

±5 ppm
±10 ppm

± 0.5ppm

± 0.5ppm

±2 ppm

±4 ppm

External

Tuning

X: No tuning (± 1
ppm accuracy at
25°C)

R: External resistor M: Flight Model

V: External voltage

Level

E: Eng. Model

FREQUENCY

(MHz)

3.000…90.000

(See note 1)

version HF TCXO, 24 pin SMD Falt-Pack, HCMOS 3.3 volts,

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Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 9 of 10

REV.

D

24 PIN Flat-Pack

 RECOMMENDED ELECTRICAL TEST DIAGRAM

FIGURE 1 INTERFACE CONTROL DRAWING

24 Pin Flat-pack

PIN NO. DESIGNATION

1

2 - 11 NC

12 Ground/Case
13 RF Output

14 -23 NC

24 Supply Voltage

NOTES:

• Dimensions are in inches.

• Lead numbers are for reference only and

are not marked on the unit.

• A triangle symbol is marked on the corner

of the package to indicate Pin 1

• All pins with NC function may not be

connected as external tie or connections
(Pins may be connected internally).

External Frequency Adjustment

(when specified)

ITAR-CONTROLLED Q-TECH PROPRIETARY DO NOT COPY OR DISTRIBUTE WITHOUT Q-TECH APPROVAL

Q-TECH Corporation

10150 W. Jefferson Blvd.
Culver City, CA 90232

SIZE

A

CAGE NO.

51774

QT811 and QT812 Square-Wave

24 pin DDIP

Sheet 10 of 10

REV.

D