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DISCRETE SEMICONDUCTORS
DATA SH EET
ook, halfpage
M3D186
ED1502
NPN general purpose transistor
Product specification
Supersedes data of 1997 May 01
1999 Apr 27
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Philips Semiconductors Product specification
NPN general purpose transistor ED1502
FEATURES
• Low current (max. 25 mA)
• Low voltage (max. 20 V)
• High gain.
PINNING
PIN DESCRIPTION
1 emitter
2 base
3 collector
APPLICATIONS
• General purpose switching and amplification.
handbook, halfpage
DESCRIPTION
NPN transistor in a plastic TO-92; SOT54 package.
1
2
3
2
MAM182
Fig.1 Simplified outline (TO-92; SOT54)
and symbol.
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CBO
V
CEO
V
EBO
I
C
I
CM
I
BM
P
tot
T
stg
T
j
T
amb
collector-base voltage open emitter − 40 V
collector-emitter voltage open base − 20 V
emitter-base voltage open collector − 4V
collector current (DC) − 25 mA
peak collector current − 25 mA
peak base current − 25 mA
total power dissipation T
≤ 25 °C; note 1 − 500 mW
amb
storage temperature −65 +150 °C
junction temperature − 150 °C
operating ambient temperature −65 +150 °C
3
1
Note
1. Refer to TO-92; SOT54 standard mounting conditions.
1999 Apr 27 2
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Philips Semiconductors Product specification
NPN general purpose transistor ED1502
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-a
Note
1. Refer to TO-92; SOT54 standard mounting conditions.
CHARACTERISTICS
=25°C unless otherwise specified.
T
amb
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
CBO
I
EBO
h
FE
V
BE
C
re
f
T
thermal resistance from junction to ambient note 1 250 K/W
collector cut-off current IE= 0; VCB=40V −−10 µA
I
= 0; VCB= 20 V; Tj= 150 °C −−5µA
E
emitter cut-off current IC= 0; VEB=4V −−10 µA
DC current gain IC= 7 mA; VCE=10V
ED1502B 48 − 75
ED1502C 66 − 100
ED1502D 84 − 127
ED1502E 105 − 210
base-emitter voltage IC= 7 mA; VCE= 10 V; note 1 −−925 mV
feedback capacitance IC=ic= 0; VCB= 10 V; f = 1 MHz − 0.5 − pF
transition frequency IC= 10 mA; VCE= 5 V; f = 100 MHz 361 − 825 MHz
Note
1. Pulse test: t
≤ 300 µs; δ≤0.02.
p
1999 Apr 27 3