Philips buk9508-55_2 Datasheet

Page 1
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55 Logic level FET

GENERAL DESCRIPTION QUICK REFERENCE DATA

N-channel enhancement mode logic SYMBOL PARAMETER MAX. UNIT level field-effectpowertransistorina plastic envelope using ’trench’V technology.Thedevicefeatures very I low on-state resistance and has P integral zener diodes giving ESD T protectionupto 2kV. Itis intended for R
DS
D
tot j
DS(ON)
use in automotive and general resistance VGS = 5 V purpose switching applications.

PINNING - TO220AB PIN CONFIGURATION SYMBOL

PIN DESCRIPTION
tab
d
1 gate 2 drain 3 source
tab drain
123
g
s

LIMITING VALUES

Limiting values in accordance with the Absolute Maximum System (IEC 134)

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

V V ±V I
D
I
D
I
DM
P T
DS DGR
tot
stg
GS
, T
j
Drain-source voltage - - 55 V Drain-gate voltage RGS = 20 kΩ -55V Gate-source voltage - - 10 V Drain current (DC) Tmb = 25 ˚C - 75 A Drain current (DC) Tmb = 100 ˚C - 65 A Drain current (pulse peak value) Tmb = 25 ˚C - 240 A Total power dissipation Tmb = 25 ˚C - 187 W Storage & operating temperature - - 55 175 ˚C

ESD LIMITING VALUE

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
C
Electrostatic discharge capacitor Human body model - 2 kV voltage (100 pF, 1.5 kΩ)

THERMAL RESISTANCES

SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
th j-mb
R
th j-a
February 1997 1 Rev 1.000
Thermal resistance junction to - - 0.8 K/W mounting base Thermal resistance junction to in free air 60 - K/W ambient
Page 2
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55
Logic level FET

STATIC CHARACTERISTICS

Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
I
DSS
I
GSS
±V R
DS(ON)
(BR)GSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 55 - - V voltage Tj = -55˚C 50 - - V Gate threshold voltage VDS = VGS; ID = 1 mA 1.0 1.5 2.0 V
Tj = 175˚C 0.5 - - V
Tj = -55˚C - - 2.3 V
Zero gate voltage drain current VDS = 55 V; VGS = 0 V; - 0.05 10 µA
Tj = 175˚C - - 500 uA
Gate source leakage current VGS = ±5 V; VDS = 0 V - 0.02 1 µA
Tj = 175˚C - - 10 µA Gate-source breakdown IG = ±1 mA; 10 - - V voltage Drain-source on-state VGS = 5 V; ID = 25 A - 6.5 8 mΩ resistance Tj = 175˚C - - 17 mΩ

DYNAMIC CHARACTERISTICS

Tmb = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
g C
C C
t t t t
L
fs
iss oss rss
d on r d off f
d
Forward transconductance VDS = 25 V; ID = 25 A 40 90 - S Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 5200 6900 pF
Output capacitance - 840 1000 pF Feedback capacitance - 350 480 pF
Turn-on delay time VDD = 30 V; ID = 25 A; - 45 60 ns Turn-on rise time VGS = 5 V; RG = 10 Ω - 120 170 ns Turn-off delay time - 225 300 ns Turn-off fall time - 100 135 ns
Internal drain inductance Measured from contact screw on - 3.5 - nH
tab to centre of die
L
d
Internal drain inductance Measured from drain lead 6 mm - 4.5 - nH
from package to centre of die
L
s
Internal source inductance Measured from source lead 6 mm - 7.5 - nH
from package to source bond pad

REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS

Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
I
DRM
V
t
rr
Q
SD
rr
Continuous reverse drain - - 75 A current Pulsed reverse drain current - - 240 A Diode forward voltage IF = 25 A; VGS = 0 V - 0.85 1.2 V
IF = 75 A; VGS = 0 V - 1.0 - V
Reverse recovery time IF = 75 A; -dIF/dt = 100 A/µs; - 65 - ns Reverse recovery charge VGS = -10 V; VR = 30 V - 0.18 - µC
February 1997 2 Rev 1.000
Page 3
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55
Logic level FET

AVALANCHE LIMITING VALUE

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
Drain-source non-repetitive ID = 75 A; VDD ≤ 25 V; - - 500 mJ unclamped inductive turn-off VGS = 5 V; RGS = 50 Ω; Tmb = 25 ˚C energy
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Tmb / C
= f(Tmb)
D 25 ˚C
Normalised Current Derating
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
1000
ID / A
RDS(ON) = VDS/ID
100
10
1
1
DC
10
VDS / V
BUKX508-55
tp = 10 us 100 us
1 ms 10 ms
100 ms
100
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
Zth / (K/W)
1E+00
0.5
1E-01
1E-02
1E-03
0.2
0.1
0.05
t
p
t / s
P
D
0.02
0
1E-07 1E-05 1E-03 1E-01 1E+01
t
p
D =
T
t
T
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
p
February 1997 3 Rev 1.000
Page 4
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55 Logic level FET
100
10
3.4
ID/A
80
60
40
20
0
4.0
0246810
VDS/V
VGS/V =
3.2
3.0
2.8
2.6
2.4
2.2
Fig.5. Typical output characteristics, Tj = 25 ˚C
RDS(ON) / mOhm
15
10
5
ID = f(VDS); parameter V
VGS / V =
3 3.2 3.4
GS
BUK9508-55
3.6
4 5
10
120
gfs/S
110 100
90 80 70 60 50 40 30 20 10
0
0 20406080100
.
Fig.8. Typical transconductance, Tj = 25 ˚C
ID/A
.
gfs = f(ID); conditions: VDS = 25 V
2.5
1.5
a
2
1
BUK959-60
Rds(on) normlised to 25degC
0
0 20 40 60 80 100 120
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
DS(ON)
100
ID/A
80
60
40
20
0
01234
ID / A
= f(ID); parameter V
Tj/C = 175 25
VGS/V
.
GS
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
j
0.5
-100 -50 0 50 100 150 200 Tmb / degC
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
VGS(TO) / V
2.5 max.
2
typ.
1.5
min.
1
0.5
0
-100 -50 0 50 100 150 200
= f(Tj); ID = 25 A; VGS = 5 V
BUK959-60
Tj / C
Fig.10. Gate threshold voltage.
V
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
GS
February 1997 4 Rev 1.000
Page 5
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55 Logic level FET
1E-01
1E-02
1E-03
1E-04
1E-05
1E-05
0 0.5 1 1.5 2 2.5 3
2% typ
Sub-Threshold Conduction
98%
Fig.11. Sub-threshold drain current.
ID = f(V
12
10
8
6
Thousands (pF)
4
2
0
0.01 0.1 1 10 100
Fig.12. Typical capacitances, C
; conditions: Tj = 25 ˚C; VDS = V
GS)
VDS/V
, C
iss
oss
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
, C
GS
rss
Ciss
Coss Crss
.
100
IF/A
80
60
40
20
0
0 0.2 0.4 0.6 0.8 1 1.2
Tj/C = 175 25
VSDS/V
Fig.14. Typical reverse diode current.
IF = f(V
120 110 100
90 80 70 60 50 40 30 20 10
0
); conditions: V
SDS
WDSS%
20 40 60 80 100 120 140 160 180
= 0 V; parameter T
GS
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb); conditions: ID = 75 A
DSS
j
6
VGS/V
5
4
3
2
1
0
0 102030405060708090
VDS = 14V
VDS = 44V
QG/nC
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 50 A; parameter V
GS
DS
L
VDS
VGS
0
RGS
T.U.T.
Fig.16. Avalanche energy test circuit.
W
= 0.5 ⋅LI
DSS
2
D
⋅BV
DSS
/(BV
R 01
shunt
DSS−VDD
VDD
+
-
-ID/100
)
February 1997 5 Rev 1.000
Page 6
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55 Logic level FET
VDD
+
RD
VDS
VGS
0
RG
T.U.T.
Fig.17. Switching test circuit.
-
February 1997 6 Rev 1.000
Page 7
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55
Logic level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 2 g
10,3 max
1,3
3,7
4,5 max
3,0 max
not tinned
1,3
max
(2x)
123
2,54 2,54
2,8
3,0
13,5
min
0,9 max (3x)
5,9
min
15,8
max
0,6
2,4
Fig.18. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
February 1997 7 Rev 1.000
Page 8
Philips Semiconductors Product specification
TrenchMOS transistor BUK9508-55
Logic level FET

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
February 1997 8 Rev 1.000
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