Philips buk7619-100b Datasheet

Page 1
N-channel TrenchMOS standard level FET
Rev. 01 — 10 October 2007 Product data sheet
1. Product profile

1.1 General description

N-channel enhancement mode power Field-Effect Transistor (FET) in a plastic package using NXP High Performance Automotive (HPA) TrenchMOS technology.

1.2 Features

n TrenchMOS technology n Q101 compliant n 175 °C rated n Standard level compatible

1.3 Applications

n Automotive systems n General purpose power switching n Motors, lamps and solenoids n 12 V, 24 V and 42 V loads.

1.4 Quick reference data

n E
DS(AL)S
n ID≤ 64 A n P
≤ 222 mJ n R
=17mΩ (typ)
DSon
≤ 200 W
tot

2. Pinning information

Table 1. Pinning
Pin Description Simplified outline Symbol
1 gate (G) 2 drain (D) 3 source (S) mb mounting base; connected to drain (D)
SOT404 (D2PAK)
mb
2
13
G
mbb076
D
S
Page 2
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET

3. Ordering information

Table 2. Ordering information
Type number Package
Name Description Version
BUK7619-100B D2PAK plastic single-ended surface-mounted package (D2PAK); 3-leads (one
SOT404
lead cropped)

4. Limiting values

Table 3. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DS
V
DGR
V
GS
I
D
I
DM
P
tot
T
stg
T
j
Source-drain diode
I
DR
I
DRM
Avalanche ruggedness
E
DS(AL)S
E
DS(AL)R
drain-source voltage - 100 V drain-gate voltage (DC) RGS=20kΩ - 100 V gate-source voltage - ±20 V drain current Tsp=25°C; VGS= 10 V; see Figure 2 and 3 -64A
= 100 °C; VGS= 10 V; see Figure 2 -45A
T
sp
peak drain current Tmb=25°C; pulsed; tp≤ 10 µs; see Figure 3 - 256 A total power dissipation Tmb=25°C; see Figure 1 - 200 W storage temperature −55 +175 °C junction temperature −55 +175 °C
reverse drain current Tmb=25°C - 64 A peak reverse drain current Tmb=25°C; pulsed; tp≤ 10 µs - 256 A
non-repetitive drain-source avalanche energy
repetitive drain-source avalanche
unclamped inductive load; ID=64A; V
≤ 100 V; RGS=50Ω; VGS= 10 V; starting
DS
at T
=25°C
j
- 222 mJ
[1]
-- mJ
energy
[1] Conditions:
a) Maximum value not quoted. Repetitive rating defined inFigure 16. b) Single-pulse avalanche rating limited by T c) Repetitive avalanche rating limited by an average junction temperature of 170 °C. d) Refer to application note
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 2 of 12
AN10273
for further information.
j(max)
of 175 °C.
Page 3
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET
120
P
der
(%)
80
40
0
0 20015050 100
P
der
----------------------- -
P
tot 25°C()
P
tot
100 %×=
03na19
Tmb (°C)
Fig 1. Normalized total power dissipation as a
function of mounting base temperature
3
10
(A)
10
I
D
2
Limit R
DSon
= V
/ I
DS
D
80 I
D
(A)
60
40
20
0
0 50 100 150 200
003aab142
(°C)
T
mb
VGS≥ 10 V
Fig 2. Continuous drain current as a function of
mounting base temperature
003aab143
tp = 10 µs
100 µs
10
DC
1
-1
10
1 10 10
1 ms 10 ms
100 ms
2
VDS (V)
Tmb=25°C; IDM is single pulse.
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage
10
3
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 3 of 12
Page 4
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET

5. Thermal characteristics

Table 4. Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
R
th(j-mb)
R
th(j-a)
thermal resistance from junction to mounting base
thermal resistance from junction to ambient
mounted on a printed-circuit board; minimum footprint
- - 0.74 K/W
- 50 - K/W
003aab144
δ =
t
p
T
t
(s)
p
Z
th (j-mb )
(K/W)
1
10
10
10
-1
-2
-3
10
δ = 0.5
0.2
0.1
0.05
0.02
single shot
-6
P
-5
10
-4
10
-3
10
-2
10
-1
10
Fig 4. Transient thermal impedance from junction to mounting base as a function of pulse duration
t
p
T
t
1
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 4 of 12
Page 5
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET

6. Characteristics

Table 5. Characteristics
Tj=25°C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Static characteristics
V
(BR)DSS
V
GS(th)
I
DSS
I
GSS
R
DSon
Dynamic characteristics
Q
G(tot)
Q
GS
Q
GD
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Source-drain diode
V
SD
t
rr
Q
r
drain-source breakdown voltage ID= 250 µA; VGS=0V
=25°C 100 - - V
T
j
= −55 °C 89--V
T
j
gate-source threshold voltage ID= 1 mA; VDS=VGS; see Figure 9 and10
=25°C 234V
T
j
= 175 °C 1--V
T
j
= −55 °C - - 4.4 V
T
j
drain leakage current VDS= 100 V; VGS=0V
=25°C - 0.02 1 µA
T
j
= 175 °C - - 500 µA
T
j
gate leakage current VGS= ±20 V; VDS= 0 V - 2 100 nA drain-source on-state resistance VGS= 10 V; ID= 25 A; see Figure 7 and 8
=25°C - 17 19 mΩ
T
j
= 175 °C --49mΩ
T
j
total gate charge ID= 25 A; VDD=80V; VGS=10V;
see
gate-source charge - 11 - nC
Figure 14
-53-nC
gate-drain charge - 27 - nC input capacitance VGS=0V; VDS= 25 V; f = 1 MHz;
see
output capacitance - 340 480 pF
Figure 12
- 2555 3400 pF
reverse transfer capacitance - 84 115 pF turn-on delay time VDS=30V; RL= 1.2 Ω;
V
=10V;RG=10Ω
rise time -45-ns
GS
-19-ns
turn-off delay time - 85 - ns fall time -34-ns
source-drain voltage IS= 25 A; VGS= 0 V; see Figure 15 - 0.85 1.2 V reverse recovery time IS= 20 A; dIS/dt = −100 A/µs;
V
=0V;VR=30V
recovered charge - 130 - nC
GS
- 116 - ns
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 5 of 12
Page 6
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET
200
I
D
(A)
150
100
50
0
0246810
10
003aac043
VGS (V) = 20V
15
8
7
6
5.5
5
4.5
V
(V)
DS
Tj=25°CT
Fig 5. Output characteristics: drain current as a
function of drain-source voltage; typical values
003aac045
10 20
R
DSon
(mΩ)
50
40
30
20
65.5 6.5 8
VGS (V) = 5
30
R
DSon
(mΩ)
25
20
15
10
0 5 10 15 20
=25°C; ID=10A
j
003aac044
(V)
V
GS
Fig 6. Drain-source on-state resistance as a function
of gate-source voltage; typical values
2.8
a
2.1
1.4
03ng41
10
0
0 40 80 120 160 200
(A)
I
D
Tj=25°C
Fig 7. Drain-source on-state resistance as a function
of drain current; typical values
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
0.7
0
-60 0 60 120 180
R
DSon
=
a
----------------------------- -
R
DSon 25°C()
T
(°C)
j
Fig 8. Normalized drain-source on-state resistance
factor as a function of junction temperature
Product data sheet Rev. 01 — 10 October 2007 6 of 12
Page 7
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET
5
V
GS(th)
(V)
4
3
2
1
0
−60 180120060
ID= 1 mA; VDS=V
GS
max
typ
min
03aa32
Tj (°C)
Fig 9. Gate-source threshold voltage as a function of
junction temperature
003aac039
g
(S)
80
fs
60
−1
10
I
D
(A)
−2
10
−3
10
−4
10
−5
10
−6
10
0642
Tj=25°C; VDS=V
min typ max
GS
03aa35
VGS (V)
Fig 10. Sub-threshold drain current as a function of
gate-source voltage
003aac038
C
(pF)
4000
3000
C
iss
40
20
0
0204060
(A)
I
D
Tj=25°C; VDS=25V VGS= 0 V; f = 1 MHz
Fig 11. Forward transconductance as a function of
drain current; typical values
2000
C
1000
0
-1
10
1 10 10
oss
C
rss
VDS (V)
2
Fig 12. Input, output and reverse transfer capacitances
as a function of drain-source voltage; typical values
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 7 of 12
Page 8
NXP Semiconductors
BUK7619-100B
N-channel TrenchMOS standard level FET
100
I
D
(A)
80
60
40
20
0
0246
Tj = 175 °C
003aac040
Tj = 25 °C
(V)
V
GS
VDS = 25 V Tj=25°C; ID=25A
Fig 13. Transfer characteristics: drain current as a
function of gate-source voltage; typical values
003aac042
(A)
100
I
S
75
V
DS
Q
003aac041
(V) = 80
(nC)
G
10
V
GS
(V)
8
6
4
2
0
0204060
VDS (V) = 14
Fig 14. Gate-source voltage as a function of gate
charge; typical values
10
I
(A)
2
(1)
AL
003aab145
50
25
0
0.0 0.5 1.0 1.5
Tj = 175 °C
Tj = 25 °C
(V)
V
SD
VGS= 0 V See Table note1 of Table3 Limiting values.
Fig 15. Source (diode forward) current as a function of
source-drain (diode forward) voltage; typical values
10
1
-3
10
-2
10
(2)
(3)
-1
10
1 10
t
(ms)
AL
(1) Single-pulse; Tj=25°C. (2) Single-pulse; Tj= 125 °C. (3) Repetitive.
Fig 16. Single-pulse and repetitive avalanche rating;
avalanche current as a function of avalanche time
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 8 of 12
Page 9
NXP Semiconductors

7. Package outline

BUK7619-100B
N-channel TrenchMOS standard level FET
Plastic single-ended surface-mounted package (D2PAK); 3 leads (one lead cropped)
E
D
1
D
H
D
mounting
base
2
L
13
SOT404
A
A
1
p
e e
DIMENSIONS (mm are the original dimensions)
0.64
0.46
D
max.
11
UNIT
mm
A
4.50
4.10
OUTLINE VERSION
SOT404
A
1.40
1.27
b
1
0.85
0.60
IEC JEDEC JEITA
Fig 17. Package outline SOT404 (D2PAK)
D
1
1.60
10.30
1.20
9.70
REFERENCES
b
0 2.5 5 mm
scale
E
eLpH
2.90
2.54
2.10
D
15.80
14.80
Qc
2.60
2.20
c
Q
EUROPEAN
PROJECTION
ISSUE DATE
05-02-11 06-03-16
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 9 of 12
Page 10
NXP Semiconductors

8. Soldering

2.25
2.15
1.50
BUK7619-100B
N-channel TrenchMOS standard level FET
10.85
10.60
10.50
7.50
7.40
1.70
8.15
7.95
8.35
4.85
1.50
4.60
0.30
3.00
solder lands
solder resist
occupied area
solder paste
5.08
1.20
1.30
1.55
8.275
5.40
8.075
0.20
msd057
Fig 18. Reflow soldering footprint for SOT404

9. Revision history

Table 6. Revision history
Document ID Release date Data sheet status Change notice Supersedes
BUK7619-100B_1 20071010 Product data sheet - -
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 10 of 12
Page 11
NXP Semiconductors

10. Legal information

10.1 Data sheet status

BUK7619-100B
N-channel TrenchMOS standard level FET
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document mayhave changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL
[1][2]
Product status
10.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall haveno liability for the consequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. Ashort data sheet is intended for quick reference only and should not be relied upon tocontain detailedand full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

10.3 Disclaimers

General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or warranties, expressedor implied,as to theaccuracy or completenessof such information and shall have no liability for the consequences of use of such information.
Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces allinformation suppliedprior to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of a NXP Semiconductorsproduct can reasonably be expected to
[3]
http://www.nxp.com.
Definition
result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134)may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at
http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyanceor implication of any license under any copyrights, patents or other industrial or intellectual property rights.

10.4 Trademarks

Notice: All referencedbrands, product names, service names and trademarks are the property of their respective owners.
TrenchMOS —is a trademark of NXP B.V.

11. Contact information

For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: [email protected]
BUK7619-100B_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 10 October 2007 11 of 12
Page 12
NXP Semiconductors

12. Contents

1 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 General description. . . . . . . . . . . . . . . . . . . . . . 1
1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.4 Quick reference data. . . . . . . . . . . . . . . . . . . . . 1
2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 1
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 2
4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
5 Thermal characteristics. . . . . . . . . . . . . . . . . . . 4
6 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5
7 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
8 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
9 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 10
10 Legal information. . . . . . . . . . . . . . . . . . . . . . . 11
10.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11
10.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
10.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 11
10.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 11
11 Contact information. . . . . . . . . . . . . . . . . . . . . 11
12 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
BUK7619-100B
N-channel TrenchMOS standard level FET
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Date of release: 10 October 2007
Document identifier: BUK7619-100B_1
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