Philips buk7518-55_2 Datasheet

Page 1
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55 Standard level FET

GENERAL DESCRIPTION QUICK REFERENCE DATA

N-channel enhancement mode SYMBOL PARAMETER MAX. UNIT standard level field-effect power transistor in a plastic envelope using V ’trench’ technology. The device I featuresverylowon-state resistance P and has integral zener diodes giving T ESD protection up to 2kV. It is R
DS
D
tot j
DS(ON)
intended for use in automotive and resistance VGS = 10 V general purpose switching applications.

PINNING - TO220AB PIN CONFIGURATION SYMBOL

PIN DESCRIPTION
tab
d
1 gate 2 drain 3 source
tab drain
123
g
s

LIMITING VALUES

Limiting values in accordance with the Absolute Maximum System (IEC 134)

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

V V ±V I
D
I
D
I
DM
P T
DS DGR
tot
stg
GS
, T
j
Drain-source voltage - - 55 V Drain-gate voltage RGS = 20 kΩ -55V Gate-source voltage - - 16 V Drain current (DC) Tmb = 25 ˚C - 57 A Drain current (DC) Tmb = 100 ˚C - 40 A Drain current (pulse peak value) Tmb = 25 ˚C - 228 A Total power dissipation Tmb = 25 ˚C - 125 W Storage & operating temperature - - 55 175 ˚C

ESD LIMITING VALUE

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
C
Electrostatic discharge capacitor Human body model - 2 kV voltage, all pins (100 pF, 1.5 kΩ)

THERMAL RESISTANCES

SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
th j-mb
R
th j-a
January 1997 1 Rev 1.000
Thermal resistance junction to - - 1.2 K/W mounting base Thermal resistance junction to in free air 60 - K/W ambient
Page 2
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55
Standard level FET

STATIC CHARACTERISTICS

Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
I
DSS
I
GSS
±V R
DS(ON)
(BR)GSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 55 - - V voltage Tj = -55˚C 50 - - V Gate threshold voltage VDS = VGS; ID = 1 mA 2.0 3.0 4.0 V
Tj = 175˚C 1.0 - - V
Tj = -55˚C - - 4.4 V
Zero gate voltage drain current VDS = 55 V; VGS = 0 V; - 0.05 10 µA
Tj = 175˚C - - 500 µA
Gate source leakage current VGS = ±10 V; VDS = 0 V - 0.02 1 µA
Tj = 175˚C - - 20 µA Gate-source breakdown IG = ±1 mA; 16 - - V voltage Drain-source on-state VGS = 10 V; ID = 25 A - 15 18 mΩ resistance Tj = 175˚C - - 38 mΩ

DYNAMIC CHARACTERISTICS

Tmb = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
g C
C C
t t t t
L
fs
iss oss rss
d on r d off f
d
Forward transconductance VDS = 25 V; ID = 25 A 6 30 - S Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 1500 2000 pF
Output capacitance - 370 470 pF Feedback capacitance - 170 250 pF
Turn-on delay time VDD = 30 V; ID = 25 A; - 15 22 ns Turn-on rise time VGS = 10 V; RG = 10 Ω - 3060ns Turn-off delay time Resistive load - 35 50 ns Turn-off fall time - 25 38 ns
Internal drain inductance Measured from contact screw on - 3.5 - nH
tab to centre of die
L
d
Internal drain inductance Measured from drain lead 6 mm - 4.5 - nH
from package to centre of die
L
s
Internal source inductance Measured from source lead 6 mm - 7.5 - nH
from package to source bond pad

REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS

Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
I
DRM
V
t
rr
Q
SD
rr
Continuous reverse drain - - 57 A current Pulsed reverse drain current - - 200 A Diode forward voltage IF = 25 A; VGS = 0 V - 0.95 1.2 V
IF = 50 A; VGS = 0 V - 1.0 - V
Reverse recovery time IF = 50 A; -dIF/dt = 100 A/µs; - 48 - ns Reverse recovery charge VGS = -10 V; VR = 30 V - 0.1 - µC
January 1997 2 Rev 1.000
Page 3
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55
Standard level FET

AVALANCHE LIMITING VALUE

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
Drain-source non-repetitive ID = 50 A; VDD ≤ 25 V; - - 125 mJ unclamped inductive turn-off VGS = 10 V; RGS = 50 Ω; Tmb = 25 ˚C energy
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Tmb / C
= f(Tmb)
D 25 ˚C
Normalised Current Derating
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
100
SOAX518
tp = 1 us
10 us 100 us
1 ms 10 ms
100 ms
1000
ID / A
RDS(ON) = VDS/ID
100
10
1
110
DC
VDS / V
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
Zth j-mb / (K/W)
10
D =
1
0.5
0.2
0.1
0.1
0.05
0.02
0.01
0.001
0
1E-07 1E-05 1E-03 1E-01 1E+01
t / s
P
D
BUKx55-lv
p
p
t
t
D =
T
t
T
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
p
January 1997 3 Rev 1.000
Page 4
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55 Standard level FET
100
16
ID/A
10
80
60
40
20
0
0246810
Fig.5. Typical output characteristics, Tj = 25 ˚C
RDS(ON)/mOhm
30
25
20
VGS/V =
8
7.5
VSD/V
VGS/V =
ID = f(VDS); parameter V
6
6.5 7
7
6.5
6
5.5
5
4.5 4
.
GS
8
9 10
35
gfs/S
30
25
20
15
10
5
0
0 20406080100
Fig.8. Typical transconductance, Tj = 25 ˚C
ID/A
.
gfs = f(ID); conditions: VDS = 25 V
2.5
1.5
a
2
BUK959-60
Rds(on) normlised to 25degC
15
10
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100
ID/A
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
= f(ID); parameter V
DS(ON)
100
ID/A
80
60
40
20
0
012345678910
Tj/C = 175 25
VGS/V
GS
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
1
0.5
-100 -50 0 50 100 150 200
.
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
VGS(TO) / V
5
max.
4
typ.
3
min.
2
1
0
-100 -50 0 50 100 150 200
Tmb / degC
= f(Tj); ID = 25 A; VGS = 5 V
BUK759-60
Tj / C
Fig.10. Gate threshold voltage.
V
j
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
GS
January 1997 4 Rev 1.000
Page 5
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55 Standard level FET
1E-01
1E-02
1E-03
1E-04
1E-05
1E-06
012345
2%
Sub-Threshold Conduction
typ
98%
Fig.11. Sub-threshold drain current.
ID = f(V
3
2.5
2
1.5
Thousands pF
1
5
0
0.01 0.1 1 10 100
Fig.12. Typical capacitances, C
; conditions: Tj = 25 ˚C; VDS = V
GS)
VDS/V
, C
iss
oss
, C
GS
rss
.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
100
IF/A
80
60
40
20
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
Tj/C = 175 25
VSDS/V
Fig.14. Typical reverse diode current.
IF = f(V
120 110 100
90 80 70 60 50 40 30 20 10
0
); conditions: V
SDS
WDSS%
20 40 60 80 100 120 140 160 180
= 0 V; parameter T
GS
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb); conditions: ID = 75 A
DSS
j
12
VGS/V
10
VDS = 14V
8
VDS = 44V
6
4
2
0
0 10203040
QG/nC
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 50 A; parameter V
GS
DS
L
VDS
VGS
0
RGS
T.U.T.
Fig.16. Avalanche energy test circuit.
W
= 0.5 ⋅ LI
DSS
2
D
⋅BV
DSS
/(BV
R 01
shunt
DSS−VDD
VDD
+
-
-ID/100
)
January 1997 5 Rev 1.000
Page 6
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55 Standard level FET
VDD
+
RD
VDS
VGS
0
RG
T.U.T.
Fig.17. Switching test circuit.
-
January 1997 6 Rev 1.000
Page 7
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55
Standard level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 2 g
10,3 max
1,3
3,7
4,5 max
3,0 max
not tinned
1,3
max
(2x)
123
2,54 2,54
2,8
3,0
13,5
min
0,9 max (3x)
5,9
min
15,8
max
0,6
2,4
Fig.18. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
January 1997 7 Rev 1.000
Page 8
Philips Semiconductors Product specification
TrenchMOS transistor BUK7518-55
Standard level FET

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
January 1997 8 Rev 1.000
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