Philips bss83_n Datasheet

Page 1
BSS83
MOSFET N-channel enhancement switching transistor
Rev. 03 — 21 November 2007 Product data sheet
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depending on the version)
- © Koninklijke Philips Electronics N.V. (year). All rights reserved ­is replaced with:
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NXP Semiconductors
Page 2
NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
2 of 9
MOSFET N-channel enhancement switching transistor BSS83

DESCRIPTION

Symmetrical insulated-gate silicon MOS field-effect transistor of the N-channel enhancement mode type. The transistor is sealed in a SOT143 envelope and features a low ON resistance and low capacitances. The transistor is protected against excessive input voltages by integrated back-to-back diodes between gate and substrate.

APPLICATIONS

• analog and/or digital switch
• switch driver

PINNING

1 = substrate (b) 2 = source 3 = drain 4 = gate
Note
1. Drain and source are interchangeable.
Marking code:
BSS83 = % M9
handbook, halfpage
34
g
21
Top view
MAM389
Fig.1 Simplified outline and symbol.
d b s

QUICK REFERENCE DATA

Drain-source voltage V Source-drain voltage V Drain-substrate voltage V Source-substrate voltage V Drain current (DC) I Total power dissipation up to T
=25°CP
amb
DS SD DB SB
D
tot
max. 10 V max. 10 V max. 15 V max. 15 V max. 50 mA max. 230 mW
Gate-source threshold voltage
VDS=VGS;VSB=0; I
=1µA < 2.0 V
D
V
GS(th)
> 0.1 V
Drain-source ON-resistance
VGS= 10 V; VSB= 0; ID= 0.1 mA R
DSon
< 45 Ω
Feed-back capacitance
VGS=VBS= −15 V; V
= 10 V; f = 1 MHz C
DS
rss
typ. 0.6 pF
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NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
3 of 9
MOSFET N-channel enhancement switching transistor BSS83

RATINGS

Limiting values in accordance with the Absolute Maximum System (IEC 134)
Drain-source voltage V Source-drain voltage V Drain-substrate voltage V Source-substrate voltage V Drain current (DC) I Total power dissipation up to T
amb
=25°C
(1)
Storage temperature range T Junction temperature T

THERMAL RESISTANCE

From junction to ambient in free air
(1)
DS SD DB SB
D
P
tot stg j
R
th j-a
max. 10 V max. 10 V max. 15 V max. 15 V max. 50 mA max. 230 mW
−65 to + 150 °C
max. 125 °C
= 430 K/W
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NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
4 of 9
MOSFET N-channel enhancement switching transistor BSS83

CHARACTERISTICS

T
=25°C unless otherwise specified
amb
Drain-source breakdown voltage
V
GS=VBS
Source-drain breakdown voltage
VGD=VBD= −5 V; ID= 10 nA V
Drain-substrate breakdown voltage
VGB= 0; ID= 10 nA; open source V
Source-substrate breakdown voltage
VGB= 0; ID= 10 nA; open drain V
Drain-source leakage current
V
GS=VBS
Source-drain leakage current
V
GD=VBD
Forward transconductance at f = 1 kHz
V
DS
Gate-source threshold voltage
V
DS=VGS
Drain-source ON-resistance
I
= 0,1 mA;
D
V
GS
V
GS
V
GS
Gate-substrate zener voltages
V
DB=VSB
V
DB=VSB
Capacitances at f = 1 MHz
VGS=VBS= −15 V; VDS= 10 V Feed-back capacitance C Input capacitance C Output capacitance C
Switching times (see Fig.2)
VDD= 10 V; Vi=5 V t
= −5 V; ID= 10 nA V
= −2 V; VDS= 6,6 V I
= −2 V; VSD= 6,6 V I
= 10 V; VSB= 0; ID= 20 mA
; VSB= 0; ID= 1 µA
= 5 V; VSB=0 R = 10 V; VSB=0 R = 3,2 V; VSB= 6,8 V (see Fig.4)
=0;−IG=10µAV =0;+IG=10µAV
(BR)DSX
(BR)SDX
(BR)DBO
(BR)SBO
DSoff
SDoff
g
fs
V
GS(th)
DSon DSon
R
DSon
Z(1) Z(2)
rss iss oss
on
t
off
> 10 V
> 10 V
> 15 V
> 15 V
< 10 nA
< 10 nA
> 10 mS
typ. 15 mS
> 0,1 V < 2,0 V
< 70 Ω < 45 Ω typ. 80 Ω < 120 Ω
> 12,5 V > 12,5 V
typ. 0,6 pF typ. 1,5 pF typ. 1,0 pF
typ. 1,0 ns typ. 5,0 ns
Note
1. Device mounted on a ceramic substrate of 8 mm × 10 mm × 0,7 mm.
Page 5
NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
5 of 9
MOSFET N-channel enhancement switching transistor BSS83
Pulse generator:
R
=50Ω
i
t
<0,5 ns
r
t
< 1,0 ns
f
t
=20ns
p
δ<0,01
DD
V
i
I
D
(mA)
50 Ω
50 Ω
60
40
V
handbook, halfpage
630 Ω
T.U.T
VGS = 4.5 V
handbook, full pagewidth
0.1 µF V
o
MBK297
INPUT
OUTPUT
10%
90%
t
r
90%
t
on
10%
Fig.2 Switching times test circuit and input and output waveforms.
MDA250
4 V
3.5 V
1.2
handbook, halfpage
I
VGS = 10 V
D
(mA)
0.8
5 V 4 V
90%
t
f
3.2 V
10%
t
off
90%
10%
MBK296
MDA251
3 V
20
0
04 12
Tj=25°C.
8
VDS (V)
Fig.3 VSB= 0; typical values.
3 V
2.5 V
2 V
0.4
0
0 40 120
80
Tj=25°C.
Fig.4 VSB= 6,8 V; typical values.
V
DSon
2 V
(mV)
Page 6
NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
6 of 9
MOSFET N-channel enhancement switching transistor BSS83
50
handbook, halfpage
I
D
(mA)
40
30
20
10
0
012 4
Tj=25°C.
Fig.5 VDS= 10 V; VBS= 0; typical values.
3
VGS (V)
MDA252
12
handbook, halfpage
I
D
(mA)
8
4
0
0
Tj=25°C.
VSB = 0 V
1
4 V 12 V
2
Fig.6 VDS=VGS=V
3
GS(th)
8 V
V
GSth
.
MDA253
(V)
4
1.2
handbook, halfpage
I
D
(mA)
0.8
0.4
0
0
Tj=25°C.
VGS =
5 V 4 V 3 V 2 V
10 V
20 40 60 80
V
DSon
(mV)
Fig.7 VSB= 0; typical values.
MDA254
100
Page 7
NXP Semiconductors Product specification
Rev. 03 - 21 November 2007
7 of 9
MOSFET N-channel enhancement switching transistor BSS83

PACKAGE OUTLINE

Plastic surface mounted package; 4 leads SOT143B
D
y
e
b
p
B
w M
E
v M
A
B
H
E
A
X
34
Q
A
A
1
21
b
1
e
1
detail X
L
c
p
DIMENSIONS (mm are the original dimensions)
UNIT
mm
OUTLINE VERSION
SOT143B
1.1
0.9
0 1 2 mm
scale
A
1
A
max
0.1
b
c
D
b
0.48
0.38
1
p
0.88
0.15
0.78
0.09
IEC JEDEC EIAJ
E
3.0
1.4
2.8
1.2
REFERENCES
1.9
e
1.7
H
L
E
1
2.5
2.1
0.45
0.15
p
0.55
0.45
EUROPEAN
PROJECTION
e
ywvQ
0.1 0.10.2
ISSUE DATE
97-02-28
Page 8
NXP Semiconductors
Rev. 03 - 21 November 2007
8 of 9

Legal information

Data sheet status

BSS83
MOSFET N-channel enhancement switching transistor
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may havechangedsincethisdocumentwaspublishedandmay differ in case of multiple devices.Thelatestproductstatus
information is available on the Internet at URL
[1][2]
Product status
Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability fortheconsequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) andtitle. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

Disclaimers

General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or warranties, expressed orimplied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
[3]
http://www.nxp.com.
Definition
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values arestress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published
http://www.nxp.com/profile/terms, including those pertaining to warranty,
at intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
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Contact information

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Page 9
NXP Semiconductors
BSS83
MOSFET N-channel enhancement switching transistor

Revision history

Revision history
Document ID Release date Data sheet status Change notice Supersedes
BSS83_N_3 20071121 Product data sheet - BSS83_CNV_2 Modifications: BSS83_CNV_2 19910401 Product specification - -
• Page 2; column 2; Marking code; row 1 changed
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Date of release: 21 November 2007
Document identifier: BSS83_N_3
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