Product specification
Supersedes data of 2002 Aug 06
2003 Aug 29
Page 2
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
FEATURES
• High power gain
• Easy power control
• Excellent ruggedness
• Source on mounting base eliminates DC isolators,
reducing common mode inductance.
APPLICATIONS
• L-band radar applications in the 1200 to 1400 MHz
frequency range.
DESCRIPTION
Silicon N-channel enhancement mode lateral D-MOS
transistor encapsulated in a 2-lead flange package
(SOT502A) with a ceramic cap. The common source is
connected to the flange.
QUICK REFERENCE DATA
RF performance at Th=25°C in a common source test circuit.
MODE OF
OPERATION
Pulsed class-AB;
t
= 1 ms; δ = 10%
p
f
(MHz)
V
(V)
DS
1200 to 140036150250>12>42<0.6<100<100
I
DQ
(mA)
PINNING - SOT502A
PINDESCRIPTION
1drain
2gate
3source, connected to flange
handbook, halfpage
Top view
1
2
Fig.1 Simplified outline.
P
(W)
L
G
(dB)
p
η
(%)
D
droop
pulse
(dB)
3
MBK394
t
r
(ns)
t
f
(ns)
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
DS
V
GS
P
tot
T
stg
T
j
drain-source voltage−75V
gate-source voltage−±22V
total power dissipationTh≤ 70 °C; tp= 1 ms; δ = 10%−400W
storage temperature−65150°C
junction temperature−200°C
CAUTION
This product is supplied in anti-static packing to prevent damage caused by electrostatic discharge during transport
and handling. For further information, refer to Philips specs.: SNW-EQ-608, SNW-FQ-302A and SNW-FQ-302B.
2003 Aug 292
Page 3
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
THERMAL CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSVALUEUNIT
Z
th j-h
Z
th j-h
Notes
1. Thermal resistance is determined under RF operating conditions; tp= 100 µs, δ = 10%.
2. Thermal resistance is determined under RF operating conditions; tp= 1 ms, δ = 10%.
CHARACTERISTICS
Tj=25°C unless otherwise specified.
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
V
(BR)DSS
V
GSth
I
DSS
I
DSX
I
GSS
g
fs
R
DSon
thermal impedance from junction to heatsinkTh=25°C, note 10.17K/W
thermal impedance from junction to heatsinkTh=25°C, note 20.32K/W
RF performance in a common source class-AB circuit. T
MODE OF
OPERATION
Pulsed class-AB;
= 1 ms; δ = 10%
t
p
f
(MHz)
V
(V)
DS
1200 to 140036150250>12>42<0.6<100<100
I
DQ
(mA)
=25°C; Z
h
P
(W)
L
= 0.25 K/W, unless otherwise specified.
th mb-h
G
(dB)
p
η
(%)
pulse
D
droop
(dB)
t
r
(ns)
t
f
(ns)
Ruggedness in class-AB operation
The BLL1214-250 iscapable of withstanding a load mismatch corresponding to VSWR=3:1through all phases under
the following conditions: V
= 36 V; frequency from 1200 MHz to 1400 MHz at rated load power.
DS
Typical impedance
FREQUENCY
(GHZ)
Z
(Ω)
S
Z
L
(Ω)
1.201.3 − j 2.81.1 − j 0.9
1.251.9 − j 2.91.0 − j 0.5
1.304.6 − j 2.90.8 − j 0.2
1.355.7 − j 0.30.7 − j 0.3
1.402.7 − j 1.80.6 − j 0.4
2003 Aug 293
Page 4
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
300
handbook, halfpage
P
L
(W)
200
100
0
048
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 1 ms; δ = 10%.
(3)
(2)
(1)
12
P
i
Fig.2Load power as function of input power;
typical values.
MLD858
(W)
12
P
MLD859
16
(W)
i
300
handbook, halfpage
P
L
(W)
200
100
16
0
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 100 µs; δ = 10%.
(3)
(2)
(1)
048
Fig.3Load power as function of input power;
typical values.
16
handbook, halfpage
G
p
(dB)
12
8
4
0
0100
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 1 ms; δ = 10%.
(3)
(1)
(2)
200
PL (W)
Fig.4Power gain as function of load power;
typical values.
MLD860
300
16
handbook, halfpage
G
p
(dB)
12
8
4
0
0100
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 100 µs; δ = 10%.
(3)
(1)
(2)
200
PL (W)
Fig.5Power gain as function of load power;
typical values.
MLD861
300
2003 Aug 294
Page 5
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
60
handbook, halfpage
η
D
(%)
40
20
0
0
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 1 ms; δ = 10%.
100300200
(1)
(2)
(3)
PL (W)
Fig.6Efficiency as function of load power;
typical values.
MLD862
60
handbook, halfpage
η
D
(%)
40
20
0
0
(1) f = 1.2 GHz.(2) f = 1.3 GHz.(3) f = 1.4 GHz.
tp= 100 µs; δ = 10%.
(1)
(2)
(3)
100300200
PL (W)
Fig.7Efficiency as function of load power;
typical values.
MLD863
15
handbook, halfpage
G
p
(dB)
14
13
12
11
10
1.151.25
tp= 1 ms; δ = 10%.
η
D
G
p
1.351.45
MLD864
f (GHz)
Fig.8Powergainanddrainefficiency as functions
of frequency; typical values.
60
50
40
30
20
10
η
(%)
MLD865
15
handbook, halfpage
D
G
p
(dB)
14
13
12
11
10
1.151.25
tp= 100 µs; δ = 10%.
G
p
η
D
1.351.45
f (GHz)
60
50
40
30
20
10
η
(%)
D
Fig.9Powergainanddrainefficiency as functions
of frequency; typical values.
2003 Aug 295
Page 6
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
handbook, full pagewidth
40 40
60
C8
C4 & C6
C7
C3 & C5
C1
Dimensions in mm.
Hatched area indicates standard tuning.
The components are situated on one side of the copper-clad Rodgers Duroid 6010 printed-circuit board (ε
The other side is unetched and serves as a ground plane.
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
mm
inches
A
4.72
3.43
0.186
0.135
OUTLINE
VERSION
SOT502A
12.83
12.57
0.505
0.495
c
Db
20.02
19.61
0.788
0.772
19.96
19.66
0.786
0.774
0.15
0.08
0.006
0.003
IEC JEDEC JEITA
D
1
EE
9.53
9.50
9.25
9.30
0.375
0.374
0.364
0.366
REFERENCES
1
1.14
0.89
0.045
0.035
F
H
19.94
18.92
0.785
0.745
2003 Aug 298
L
5.33
4.32
0.210
0.170
p
3.38
3.12
0.133
0.123
Q
1.70
1.45
0.067
0.057
qw
U
1
34.16
33.91
1.345
1.335
EUROPEAN
PROJECTION
w
U
9.91
9.65
0.390
0.380
2
0.250.5127.94
0.010.021.100
2
1
ISSUE DATE
99-12-28
03-01-10
Page 9
Philips SemiconductorsProduct specification
L-band radar LDMOS transistorBLL1214-250
DATA SHEET STATUS
LEVEL
DATA SHEET
STATUS
(1)
PRODUCT
STATUS
(2)(3)
DEFINITION
IObjective dataDevelopmentThis data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
IIPreliminary data QualificationThis data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
IIIProduct dataProductionThis data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Relevant changes will
be communicated via a Customer Product/Process Change Notification
(CPCN).
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
DEFINITIONS
DISCLAIMERS
Short-form specification The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Limiting values definition Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
attheseoratanyotherconditionsabovethosegiveninthe
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Application information Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
norepresentationorwarrantythatsuchapplicationswill be
suitable for the specified use without further testing or
modification.
Life support applications These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductorscustomersusingorsellingtheseproducts
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Right to make changes Philips Semiconductors
reserves the right to make changes in the products including circuits, standard cells, and/or software described or contained herein in order to improve design
and/or performance. When the product is in full production
(status ‘Production’), relevant changes will be
communicated via a Customer Product/Process Change
Notification (CPCN). Philips Semiconductors assumes no
responsibility or liability for the use of any of these
products, conveys no licence or title under any patent,
copyright, or mask work right to these products, and
makes no representations or warranties that these
products are free from patent, copyright, or mask work
right infringement, unless otherwise specified.
2003 Aug 299
Page 10
Philips Semiconductors – a w orldwide compan y
Contact information
For additional information please visit http://www.semiconductors.philips.com.Fax: +31 40 27 24825
For sales offices addresses send e-mail to: [email protected].
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Printed in The Netherlands613524/03/pp10 Date of release: 2003 Aug 29Document order number: 9397 750 11576
SCA75
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