Philips blf4g20ls-130 Datasheet

Page 1
BLF4G20LS-130
UHF power LDMOS transistor
Rev. 01 — 1 June 2007 Product data sheet
1. Product profile

1.1 General description

130 W LDMOS power transistor for base station applications at frequencies from 1800 MHz to 2000 MHz.
Table 1. Typical performance
T
= 25°C; IDq = 900 mA; unless otherwise specified; in a class-AB production test circuit.
case
Mode of operation f V
(MHz) (V) (W) (W) (dB) (%) (dBc) (dBc) (%) (dBc)
CW 1930 to 1990 28 130 - 14.5 50 - - - ­GSM EDGE 1930 to 1990 28 - 60 14.8 36 −62 2-tone 1930 to 1990 28 - 65 14.6 38.5 - - - −30
DS
P
L
P
L(AV)Gp
η
ACPR
D
[1]
400
ACPR
[1]
−73
600
EVM
rms
2.1 -
IMD3
[1] ACPR
CAUTION
and ACPR
400
at 30 kHz resolution bandwidth.
600
This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken during transport and handling.
n Typical GSMEDGE performance at frequencies of 1990 MHz, a supply voltageof 28 V
and an IDq of 900 mA:
u Average output power = 60 W u Power gain = 14.8 dB u Efficiency = 36 % u ACPR u ACPR
u EVM n Easy power control n Excellent ruggedness n High efficiency n Excellent thermal stability n Designed for broadband operation (1800 MHz to 2000 MHz) n Internally matched for ease of use
400 600
= 2.1 %
rms
= −62 dBc = −73 dBc
Page 2
NXP Semiconductors

1.3 Applications

n RF power amplifiers for GSM, GSM EDGE and CDMA base stations and multi carrier
applications in the 1800 MHz to 2000 MHz frequency range.

2. Pinning information

Table 2. Pinning
Pin Description Simplified outline Symbol
1 drain 2 gate 3 source
[1] Connected to flange

3. Ordering information

BLF4G20LS-130
UHF power LDMOS transistor
1
[1]
3
2
2
sym112
1
3
Table 3. Ordering information
Type number Package
BLF4G20LS-130 - earless flanged LDMOST ceramic package; 2 leads SOT502B

4. Limiting values

Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DS
V
GS
I
D
T
stg
T
j
Name Description Version
drain-source voltage - 65 V gate-source voltage −0.5 +15 V drain current - 15 A storage temperature −65 +150 °C junction temperature - 200 °C
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 2 of 11
Page 3
NXP Semiconductors

5. Thermal characteristics

Table 5. Thermal characteristics
Symbol Parameter Conditions Typ Max Unit
R
th(j-case)
thermal resistance from junction to case

6. Characteristics

Table 6. Characteristics
Tj = 25°C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
V
(BR)DSS
V
GS(th)
V
GSq
I
DSS
I
DSX
I
GSS
g
fs
R
DS(on)
C
rs
drain-source breakdown voltage
gate-source threshold voltage VDS= 10 V; ID= 230 mA 2.5 2.9 3.5 V gate-source quiescent voltage VDS= 28 V; ID= 900 mA 2.65 3.15 3.65 V drain leakage current VGS=0V; VDS=28V - - 5 µA drain cut-off current VGS=V
gate leakage current VGS= 15 V; VDS= 0 V - - 420 nA forward transconductance VDS=10V; ID= 7.5 A - 11 - S drain-source on-state
resistance feedback capacitance VGS=0V; VDS=28V;
BLF4G20LS-130
UHF power LDMOS transistor
T
=80°C;
case
=50W
P
L
VGS=0V; ID= 2.1 mA 65 - - V
+6 V;
DS
= 7.5 A
D
GS(th)
=10V
GS(th)
+ 6 V;
V
VGS=V I
f= 1MHz
0.49 0.58 K/W
35 42 - A
- 0.065 - Ω
-3-pF

7. Application information

Table 7. Application information
Mode of operation: 2-tone (200 kHz tone spacing); f1= 1930 MHz; f2= 1990 MHz; VDS=28V; I
= 900 mA; T
Dq
Symbol Parameter Conditions Min Typ Max Unit
G RL
η
p
in
D
power gain P input return loss P drain efficiency P
IMD3 third order intermodulation
distortion IMD5 fifth order intermodulation distortion P IMD7 seventh order intermodulation
distortion

7.1 Ruggedness in class-AB operation

The BLF4G20LS-130 is capable of withstanding a load mismatch corresponding to VSWR = 10 : 1 through all phases under the following conditions: VDS=28V; IDq= 900 mA; PL = 130 W (CW); f = 1990 MHz.
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 3 of 11
=25°C; unless otherwise specified.
case
L(PEP) L(PEP) L(PEP)
P
L(PEP)
L(PEP)
P
L(PEP)
= 130 W 13 14.6 - dB = 130 W - −10 −7dB = 130 W 34.5 38.5 - % = 130 W - −30 −27 dBc
= 130 W - −39.5 −35.5 dBc = 130 W - −58.5 −54 dBc
Page 4
NXP Semiconductors

7.2 One-tone CW

BLF4G20LS-130
UHF power LDMOS transistor
16
G
p
(dB)
14
12
10
0 16012040 80
VDS = 28 V; IDq = 900 mA; T
G
p
η
D
= 25 °C; f = 1990 MHz.
case
001aag526
PL (W)
60
η
D
(%)
40
20
0
Fig 1. One-tone CW power gain and drain efficiency as functions of load power;
typical values
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 4 of 11
Page 5
NXP Semiconductors

7.3 Two-tone CW

BLF4G20LS-130
UHF power LDMOS transistor
16
G
p
(dB)
15
14
13
12
11
0 1008040 6020
VDS = 28 V; IDq = 900 mA; T
001aag527
G
p
η
D
PL (W)
= 25 °C;
case
50
η
D
(%)
40
30
20
10
0
f = 1990 MHz.
Fig 2. Two-tone CW power gain and drain efficiency
as functions of load power; typical values
0
IMD3 (dBc)
−20
(1) (2)
−40
P
= 25 °C;
001aag528
IMD3
IMD5
IMD7
(W)
L(AV)
0
IMD
(dBc)
−20
−40
−60
−80
0 1008040 6020
VDS = 28 V; IDq = 900 mA; T
case
f = 1990 MHz.
Fig 3. Intermodulation distortion as a function of
average load power; typical values
001aag529
(3) (4)
P
(W)
L(AV)
VDS = 28 V; T
= 25 °C; f = 1990 MHz.
case
−60
−80
0 1008040 6020
(1) IDq = 800 mA. (2) IDq = 900 mA. (3) IDq = 1000 mA. (4) IDq = 1100 mA.
Fig 4. Third order intermodulation distortion as function of average load power; typical values
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 5 of 11
Page 6
NXP Semiconductors

7.4 GSM EDGE

BLF4G20LS-130
UHF power LDMOS transistor
16
G
p
(dB)
15
14
13
12
11
0 1008040 6020
VDS = 28 V; IDq = 900 mA; T
001aag530
G
p
η
D
PL (W)
= 25 °C;
case
50
η
D
(%)
40
30
20
10
0
f = 1990 MHz.
Fig 5. GSM EDGE power gain and drain efficiency as
functions of load power; typical values
16
EVM
(%)
12
001aag532
EVM
M
−50
ACPR
(dBc)
−60
−70
−80
0 1008040 6020
VDS = 28 V; IDq = 900 mA; T
ACPR
ACPR
400
600
case
001aag531
PL (W)
= 25 °C;
f = 1990 MHz.
Fig 6. GSM EDGE ACPR at 400 kHz and at 600 kHz as
functions of load power; typical values
−54
ACPR
(dBc)
−58
001aag533
5
EVM (%)
4
−62
8
−66
EVM
4
0
0 1008040 6020
VDS= 28 V; IDq= 850 mA; T
case
=25°C;
f = 960 MHz.
Fig 7. GSM EDGE rms EVM and peak EVM as
functions of load power; typical values
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
rms
PL (W)
−70
−74
0604020
VDS=28V; IDq= 850 mA; T f = 960 MHz.
Fig 8. GSM EDGE ACPR and rms EVM as functions of
drain efficiency; typical values
ACPR
EVM
rms
400
case
ηD (%)
=25°C;
3
2
1
0
Product data sheet Rev. 01 — 1 June 2007 6 of 11
Page 7
NXP Semiconductors

8. Test information

BLF4G20LS-130
UHF power LDMOS transistor
C10
VDD
C2
C7
R1
C3
W1
C9
C1
C4
BLF4G20LS-130
Striplines are on a double copper-clad Taconic RF35 Printed-Circuit Board (PCB) (εr = 3.5); thickness = 0.76 mm. See Table 8 for list of components.
input - PCS rev. 1
C5
BLF4G20LS-130
output - PCS rev. 1
Fig 9. Component layout for 1930 MHz to 1990 MHz production test circuit
Table 8. List of components (see Figure 9)
Component Description Value Dimensions Remarks
C1, C3, C5, C7 chip capacitor 11 pF
[1]
C2, C9 tantalum capacitor 10 µF C4 chip capacitor 0.8 pF C6 chip capacitor 0.1 pF C8 American Technical Ceramics
1 µF 1812X7R105KL2AB
[1] [1]
(ATC) chip capacitor C10 Philips electrolytic capacitor 220 µF; 35 V R1 Philips chip resistor 5.1Ω 0603 W1 hand made wire 5 mm
C6
001aag534
[1] American Technical Ceramics type 100B or capacitor of same quality.
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 7 of 11
Page 8
NXP Semiconductors
BLF4G20LS-130
UHF power LDMOS transistor

9. Package outline

Earless flanged LDMOST ceramic package; 2 leads SOT502B
D
A
F
3
D
1
U
1
L
H
U
2
1
D
c
E
1
E
2
b
w
M M
D
2
0 5 10 mm
scale
Q
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
mm
inches
A
4.72
3.43
0.186
0.135
OUTLINE VERSION
SOT502B
12.83
12.57
0.505
0.495
c
0.15
0.08
0.006
0.003
IEC JEDEC JEITA
Db
20.02
19.61
0.788
0.772
D
1
19.96
19.66
0.786
0.774
EE
9.53
9.50
9.25
9.30
0.375
0.374
0.364
0.366
REFERENCES
H
F
1
19.94
1.14
18.92
0.89
0.785
0.045
0.745
0.035
L
5.33
4.32
0.210
0.170
Q
1.70
1.45
0.067
0.057
U
1
20.70
20.45
0.815
0.805
U
9.91
9.65
0.390
0.380
2
w
2
0.25
0.010
EUROPEAN
PROJECTION
ISSUE DATE
03-01-10 07-05-09
Fig 10. Package outline SOT502B
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 8 of 11
Page 9
NXP Semiconductors

10. Abbreviations

Table 9. Abbreviations
Acronym Description
ACPR Adjacent Channel Power Ratio CDMA Code Division Multiple Access CW Continuous Wave EDGE Enhanced Data rates for GSM Evolution EVM Error Vector Magnitude GSM Global System for Mobile communications LDMOS Laterally Diffused Metal Oxide Semiconductor LDMOST Laterally Diffused Metal-Oxide Semiconductor Transistor RF Radio Frequency RMS Root Mean Square VSWR Voltage Standing Wave Ratio
BLF4G20LS-130
UHF power LDMOS transistor

11. Revision history

Table 10. Revision history
Document ID Release date Data sheet status Change notice Supersedes
BLF4G20LS-130_1 20070601 Product data sheet - -
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 9 of 11
Page 10
NXP Semiconductors

12. Legal information

12.1 Data sheet status

BLF4G20LS-130
UHF power LDMOS transistor
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product statusof device(s) describedin this document may have changedsince this document was published and may differ incase of multipledevices. The latestproduct status
information is available on the Internet at URL
[1][2]
Product status
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information includedhereinand shall have noliability for the consequencesof use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with thesameproduct type number(s) and title.A short data sheet is intended for quickreference only and should not be relied upon to contain detailedand full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

12.3 Disclaimers

General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors doesnotgive any representations or warranties, expressedor implied, as to the accuracy or completenessofsuch information and shall have no liability for the consequences of use of such information.
Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedesandreplacesall information supplied prior to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
[3]
http://www.nxp.com.
Definition
malfunction ofaNXP Semiconductors product canreasonably be expectedto result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in the Absolute MaximumRatingsSystemof IEC 60134) may cause permanent damage to thedevice. Limiting values are stressratingsonly and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at
http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.

12.4 Trademarks

Notice: Allreferenced brands, productnames,service names and trademarks are the property of their respective owners.

13. Contact information

For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: [email protected]
BLF4G20LS-130_1 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 01 — 1 June 2007 10 of 11
Page 11
NXP Semiconductors

14. Contents

1 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 General description. . . . . . . . . . . . . . . . . . . . . . 1
1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 2
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 2
4 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
5 Thermal characteristics. . . . . . . . . . . . . . . . . . . 3
6 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 3
7 Application information. . . . . . . . . . . . . . . . . . . 3
7.1 Ruggedness in class-AB operation. . . . . . . . . . 3
7.2 One-tone CW . . . . . . . . . . . . . . . . . . . . . . . . . . 4
7.3 Two-tone CW . . . . . . . . . . . . . . . . . . . . . . . . . . 5
7.4 GSM EDGE . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
8 Test information. . . . . . . . . . . . . . . . . . . . . . . . . 7
9 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 8
10 Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . . 9
11 Revision history. . . . . . . . . . . . . . . . . . . . . . . . . 9
12 Legal information. . . . . . . . . . . . . . . . . . . . . . . 10
12.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 10
12.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
12.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 10
12.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 10
13 Contact information. . . . . . . . . . . . . . . . . . . . . 10
14 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
BLF4G20LS-130
UHF power LDMOS transistor
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Document identifier: BLF4G20LS-130_1
Date of release: 1 June 2007
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