130 W LDMOS power transistor for base station applications at frequencies from
1800 MHz to 2000 MHz.
Table 1.Typical performance
T
= 25°C; IDq = 900 mA; unless otherwise specified; in a class-AB production test circuit.
case
Mode of operationfV
(MHz)(V)(W)(W)(dB)(%)(dBc)(dBc)(%)(dBc)
CW1930 to 199028130-14.550---GSM EDGE1930 to 199028-6014.836−62
2-tone1930 to 199028-6514.638.5 ---−30
DS
P
L
P
L(AV)Gp
η
ACPR
D
[1]
400
ACPR
[1]
−73
600
EVM
rms
2.1-
IMD3
[1] ACPR
CAUTION
and ACPR
400
at 30 kHz resolution bandwidth.
600
This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken
during transport and handling.
1.2 Features
n Typical GSMEDGE performance at frequencies of 1990 MHz, a supply voltageof 28 V
and an IDq of 900 mA:
u Average output power = 60 W
u Power gain = 14.8 dB
u Efficiency = 36 %
u ACPR
u ACPR
u EVM
n Easy power control
n Excellent ruggedness
n High efficiency
n Excellent thermal stability
n Designed for broadband operation (1800 MHz to 2000 MHz)
n Internally matched for ease of use
400
600
= 2.1 %
rms
= −62 dBc
= −73 dBc
Page 2
NXP Semiconductors
1.3 Applications
n RF power amplifiers for GSM, GSM EDGE and CDMA base stations and multi carrier
applications in the 1800 MHz to 2000 MHz frequency range.
Mode of operation: 2-tone (200 kHz tone spacing); f1= 1930 MHz; f2= 1990 MHz; VDS=28V;
I
= 900 mA; T
Dq
SymbolParameterConditionsMinTypMaxUnit
G
RL
η
p
in
D
power gainP
input return lossP
drain efficiencyP
IMD3third order intermodulation
distortion
IMD5fifth order intermodulation distortion P
IMD7seventh order intermodulation
distortion
7.1 Ruggedness in class-AB operation
The BLF4G20LS-130 is capable of withstanding a load mismatch corresponding to
VSWR = 10 : 1 through all phases under the following conditions: VDS=28V;
IDq= 900 mA; PL = 130 W (CW); f = 1990 MHz.
ACPRAdjacent Channel Power Ratio
CDMACode Division Multiple Access
CWContinuous Wave
EDGEEnhanced Data rates for GSM Evolution
EVMError Vector Magnitude
GSMGlobal System for Mobile communications
LDMOSLaterally Diffused Metal Oxide Semiconductor
LDMOSTLaterally Diffused Metal-Oxide Semiconductor Transistor
RFRadio Frequency
RMSRoot Mean Square
VSWRVoltage Standing Wave Ratio
Objective [short] data sheetDevelopmentThis document contains data from the objective specification for product development.
Preliminary [short] data sheet QualificationThis document contains data from the preliminary specification.
Product [short] data sheetProductionThis document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product statusof device(s) describedin this document may have changedsince this document was published and may differ incase of multipledevices. The latestproduct status
information is available on the Internet at URL
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Product status
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space or life support equipment, nor in applications where failure or
[3]
http://www.nxp.com.
Definition
malfunction ofaNXP Semiconductors product canreasonably be expectedto
result in personal injury, death or severe property or environmental damage.
NXP Semiconductors accepts no liability for inclusion and/or use of NXP
Semiconductors products in such equipment or applications and therefore
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Applications — Applications that are described herein for any of these
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representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute MaximumRatingsSystemof IEC 60134) may cause permanent
damage to thedevice. Limiting values are stressratingsonly and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
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