Philips BLF202 Datasheet

DISCRETE SEMICONDUCTORS
DATA SH EET
M3D175
BLF202
HF/VHF power MOS transistor
Product specification 1999 Oct 20
Philips Semiconductors Product specification
FEATURES
High power gain
Easy power control
Gold metallization
Good thermal stability
Withstands full load mismatch.
APPLICATIONS
Communications transmitters inthe HF/VHF range with a nominal supply voltage of 12.5 V.
DESCRIPTION
Silicon N-channel enhancement mode vertical D-MOS transistor in an 8-lead SOT409A SMD package with a ceramic cap.
PINNING - SOT409A
PIN DESCRIPTION
1, 8 source 2, 3 gate 4, 5 source 6, 7 drain
handbook, halfpage
Fig.1 Simplified outline.
85
14
Top view
MBK150
QUICK REFERENCE DATA
RF performance at Tmb=25°C in a common source test circuit.
MODE OF OPERATION
f
(MHz)
V
(V)
DS
P
(W)
L
G
(dB)
p
η
D
(%)
CW, class-B 175 12.5 2 >10 >50
CAUTION
This product is supplied in anti-static packing to prevent damage caused by electrostatic discharge during transport and handling. For further information, refer to Philips specs.: SNW-EQ-608, SNW-FQ-302A, and SNW-FQ-302B.
1999 Oct 20 2
Philips Semiconductors Product specification
LIMITING VALUES
In accordance with the Absolute Maximum System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
V
GS
I
D
P
tot
T
stg
T
j
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-mb
drain-source voltage 40 V gate-source voltage 20 V DC drain current 1A total power dissipation Tmb≤ 85 °C 5.7 W storage temperature 65 150 °C junction temperature 200 °C
thermal resistance from junction to
Tmb≤ 85 °C, P
= 5.7 W 20.5 K/W
tot
mounting base
10
handbook, halfpage
I
D
(A)
1
(1)
1
10
2
10
110
(1) Current is this area may be limited by R (2) Tmb=85°C.
Fig.2 DC SOAR.
MCD789
(2)
V
(V)
DS
.
DS(on)
2
10
1999 Oct 20 3
Philips Semiconductors Product specification
CHARACTERISTICS
Tj=25°C unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(th)
I
DSS
I
GSS
I
DSX
R
DSon
g
fs
C
is
C
os
C
rs
drain-source breakdown voltage ID= 3 mA; VGS=0 40 −− V gate-source threshold voltage ID= 3 mA; VDS=10V 2 4.5 V drain-source leakage current VGS= 0; VDS= 12.5 V −−10 µA gate-source leakage current VGS= ±20 V; VDS=0 −−1 µA on-state drain current VGS= 15 V; VDS=10V 1.3 A drain-source on-state resistance ID= 0.3 A; VGS=15V 3.5 4 forward transconductance ID= 0.3 A; VDS= 10 V 80 135 mS input capacitance VGS= 0; VDS= 12.5 V; f = 1 MHz 5.3 pF output capacitance VGS= 0; VDS= 12.5 V; f = 1 MHz 7.8 pF feedback capacitance VGS= 0; VDS= 12.5 V; f = 1 MHz 1.8 pF
15
handbook, halfpage
T.C.
(mV/K)
10
5
0
5 11010
VDS=10V.
2103
ID (mA)
Fig.3 Temperature coefficient of gate-source
voltageasafunctionofdrain current; typical values.
MGP111
1600
handbook, halfpage
I
D
(mA)
1200
800
400
0
0
VDS= 10 V; Tj=25°C.
420
81216
MGP112
VGS (V)
Fig.4 Drain current as a function of gate-source
voltage; typical values.
1999 Oct 20 4
Philips Semiconductors Product specification
handbook, halfpage
5
R
DSon
()
4
3
2
1
0
0 40 80 160
VGS= 15 V; ID= 0.3 A.
120
Fig.5 Drain-source on-state resistance as a
function of junction temperature; typical values.
MGP113
Tj (°C)
12
MGP114
VDS (V)
30
handbook, halfpage
C
(pF)
20
10
0
048 16
VGS= 0; f = 1 MHz.
C
os
C
is
Fig.6 Input and output capacitance as functions
of drain-source voltage; typical values.
handbook, halfpage
5
C
rs
(pF)
4
3
2
1
0
048 16
VGS= 0; f = 1 MHz.
12
VDS (V)
Fig.7 Feedback capacitance as a function of
drain-source voltage; typical values.
MGP115
1999 Oct 20 5
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