Philips blf177_n Datasheet

Page 1
BLF177
HF/VHF power MOS transistor
Rev. 06 — 24 January 2007 Product data sheet
IMPORTANT NOTICE
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depending on the version)
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NXP Semiconductors
Page 2
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
2 of 19
HF/VHF power MOS transistor BLF177

FEATURES

• High power gain
• Low intermodulation distortion
• Easy power control
• Good thermal stability
• Withstands full load mismatch.

APPLICATIONS

• Designed for industrial and military applications in the HF/VHF frequency range.

DESCRIPTION

Silicon N-channel enhancement mode vertical D-MOS transistor encapsulated in a 4-lead, SOT121B flanged package, witha ceramic cap. All leads are isolated from the flange.
Amarkingcode,showinggate-source voltage (VGS) information is provided for matched pair applications. Refer to the handbook 'General' section for further information.

PIN CONFIGURATION

ndbook, halfpage
43
d
g
MBB072
21
MLA876
s
Fig.1 Simplified outline (SOT121B) and symbol.
CAUTION
This product is supplied in anti-static packing to prevent damage caused by electrostaticdischargeduringtransportandhandling. For further information, refer to Philips specs.: SNW-EQ-608, SNW-FQ-302A, and SNW-FQ-302B.

PINNING

WARNING
Product and environmental safety - toxic materials
PIN DESCRIPTION
This product contains beryllium oxide. The product is entirely safe provided
1 drain 2 source 3 gate 4 source
that the BeO disc is not damaged. All persons who handle, use or dispose of this product should be aware of its nature and of the necessary safety precautions. After use, dispose of as chemical or special waste according to the regulations applying at the location of the user. It must never be thrown out with the general or domestic waste.

QUICK REFERENCE DATA

RF performance at Th=25°C in a common source test circuit.
MODE OF
OPERATION
f
(MHz)
V
(V)
DS
P
(W)
L
G
(dB)
p
η
D
(%)
d
3
(dB)
d
5
(dB)
SSB class-AB 28 50 150 (PEP) >20 >35 <−30 <−30 CW class-B 108 50 150 typ. 19 typ. 70 −−
Page 3
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
3 of 19
HF/VHF power MOS transistor BLF177

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
V
GS
I
D
P
tot
T
stg
T
j

THERMAL CHARACTERISTICS

SYMBOL PARAMETER VALUE UNIT
R
th j-mb
R
th mb-h
drain-source voltage − 125 V gate-source voltage −±20 V drain current (DC) − 16 A total power dissipation Tmb≤ 25 °C − 220 W storage temperature −65 +150 °C junction temperature − 200 °C
thermal resistance from junction to mounting base max. 0.8 K/W thermal resistance from mounting base to heatsink max. 0.2 K/W
2
10
handbook, halfpage
I
D
(A)
10
(1) (2)
1
−1
10
110
(1) Current in this area may be limited by R (2) Tmb=25°C.
Fig.2 DC SOAR.
MRA906
2
10
VDS (V)
.
DSon
3
10
300
handbook, halfpage
P
tot
(W)
200
100
0
0
(1) Short-time operation during mismatch. (2) Continuous operation.
50
(1)
(2)
100 150
MGP089
Th (°C)
Fig.3 Power derating curves.
Page 4
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
4 of 19
HF/VHF power MOS transistor BLF177

CHARACTERISTICS

Tj=25°C unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
I
DSS
I
GSS
V
GSth
∆V
GS
g
fs
R
DSon
I
DSX
C
is
C
os
C
rs
drain-source breakdown voltage ID= 100 mA; VGS= 0 125 −−V drain-source leakage current VGS= 0; VDS=50V −−2.5 mA gate-source leakage current VGS= ±20 V; VDS=0 −−1 µA gate-source threshold voltage ID= 50 mA; VDS=10V 2 − 4.5 V gate-source voltage difference of
ID= 50 mA; VDS=10V −−100 mV
matched pairs forward transconductance ID= 5 A; VDS= 10 V 4.5 6.2 − S drain-source on-state resistance ID= 5 A; VGS=10V − 0.2 0.3 Ω on-state drain current VGS= 10 V; VDS=10V − 25 − A input capacitance VGS= 0; VDS=50V; f=1MHz − 480 − pF output capacitance VGS= 0; VDS=50V; f=1MHz − 190 − pF feedback capacitance VGS= 0; VDS=50V; f=1MHz − 14 − pF

VGS group indication

GROUP
A 2.0 2.1 O 3.3 3.4 B 2.1 2.2 P 3.4 3.5 C 2.2 2.3 Q 3.5 3.6 D 2.3 2.4 R 3.6 3.7 E 2.4 2.5 S 3.7 3.8 F 2.5 2.6 T 3.8 3.9 G 2.6 2.7 U 3.9 4.0 H 2.7 2.8 V 4.0 4.1
J 2.8 2.9 W 4.1 4.2 K 2.9 3.0 X 4.2 4.3 L 3.0 3.1 Y 4.3 4.4
M 3.1 3.2 Z 4.4 4.5 N 3.2 3.3
LIMITS
(V)
GROUP
LIMITS
(V)
MIN. MAX. MIN. MAX.
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
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HF/VHF power MOS transistor BLF177
handbook, halfpage
0
T.C.
(mV/K)
−1
−2
−3
−4
−5
−2
VDS= 10 V; valid for Th=25to70°C.
−1
10
11010
ID (A)
Fig.4 Temperature coefficient of gate-source
voltageasafunctionofdraincurrent;typical values.
MGP090
30
handbook, halfpage
I
D
(A)
20
10
0
0
VDS=10V.
51015
MGP091
V
(V)
GS
Fig.5 Drain current as a function of gate-source
voltage; typical values.
400
handbook, halfpage
R
DSon
(mΩ)
300
200
100
0
ID= 5 A; VGS=10V.
50 100 150
Tj (°C)
Fig.6 Drain-source on-state resistance as a
function of junction temperature; typical values.
MGP092
C
is
C
os
MBK408
VDS (V)
1200
handbook, halfpage
C
(pF)
800
400
0
0
VGS= 0; f = 1 MHz.
20 40
Fig.7 Input and output capacitance as functions
of drain-source voltage; typical values.
60
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
6 of 19
HF/VHF power MOS transistor BLF177
300
handbook, halfpage
C
rs
(pF)
200
100
0
0
10 5020 30 40
VGS= 0; f = 1 MHz.
V
Fig.8 Feedback capacitance as a function of
drain-source voltage; typical values.
MGP093
DS
(V)

APPLICATION INFORMATION FOR CLASS-AB OPERATION

RF performance in SSB operation in a common source class-AB test circuit (see Fig.13). Th=25°C; R
MODE OF
OPERATION
SSB, class-AB 28 50 0.7 20 to 150
= 0.2 K/W; ZL= 6.25 + j0 Ω; f1= 28.000 MHz; f2= 28.001 MHz unless otherwise specified.
th mb-h
f
(MHz)
V
(V)
DS
I
DQ
(A)
P
L
(W)
(PEP)
G
p
(dB)
>20
typ. 35
η
D
(%)
>35
typ. 40
(note 1)
typ. −35
d
3
(dB)
<−30
d
5
(dB)
(note 1)
<−30
typ. −38
Note
1. Maximum values at drive levels within the specified PEP values for either amplified tone. For the peak envelope power the values should be decreased by 6 dB.

Ruggedness in class-AB operation

The BLF177 is capable of withstanding a load mismatch corresponding to VSWR = 50 through all phases under the following conditions: f = 28 MHz; V
= 50 V at rated output power.
DS
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
7 of 19
HF/VHF power MOS transistor BLF177
30
handbook, halfpage
G
p
(dB)
20
10
0
0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A; RGS=5Ω; f1= 28.000 MHz; f2= 28.001 MHz.
100 200
PL (W) PEP
MGP096
Fig.9 Power gain as a function of load power;
typical values.
60
handbook, halfpage
η
D
(%)
40
20
0
0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A; RGS=5Ω; f1= 28.000 MHz; f2= 28.001 MHz.
100 200
PL (W) PEP
MGP094
Fig.10 Two tone efficiency as a function of load
power; typical values.
−20
handbook, halfpage
d
3
(dB)
−30
−40
−50
−60
0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A; RGS=5Ω; f1= 28.000 MHz; f2= 28.001 MHz.
100 200
PL (W) PEP
MGP097
Fig.11 Third order intermodulation distortion as a
function of load power; typical values.
−20
handbook, halfpage
d
5
(dB)
−30
−40
−50
−60
0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A; RGS=5Ω; f1= 28.000 MHz; f2= 28.001 MHz.
100 200
PL (W) PEP
MGP098
Fig.12 Fifth order intermodulation distortion as a
function of load power; typical values.
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
8 of 19
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
input 50 Ω
C1
C2
C3
C4
D.U.T.
L1
R3
R4
+V
G
L2
R2R1
C5
L3
L4
C6
L5
C9
C10
R5
C8
C7
C12
L6
C11
C14
C15
C13
output
50 Ω
+V
D
MGP095
Fig.13 Test circuit for class-AB operation.
Page 9
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
9 of 19
HF/VHF power MOS transistor BLF177
List of components class-AB test circuit (see Fig.13)
COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO.
C1, C4, C13, C14 film dielectric trimmer 7 to 100 pF 2222 809 07015 C2 multilayer ceramic chip capacitor
(note 1)
C3, C11 multilayer ceramic chip capacitor
(note 1) C5, C6 multilayer ceramic chip capacitor 100 nF 2222 852 47104 C7 multilayer ceramic chip capacitor 3 × 100 nF 2222 852 47104 C8 electrolytic capacitor 2.2 µF, 63 V C9, C10 multilayer ceramic chip capacitor
(note 1) C12 multilayer ceramic chip capacitor
(note 1) C15 multilayer ceramic chip capacitor
(note 1) L1 5 turns enamelled 0.7 mm copper
wire
L2, L3 stripline (note 2) 41.1 Ω length 13 × 6mm L4 7 turns enamelled 1.5 mm copper
wire
L5 grade 3B Ferroxcube wideband HF
choke L6 5 turns enamelled 2 mm copper wire 170 nH length 11.5 mm;
R1, R2 metal film resistor 10 Ω, 1 W R2 metal film resistor 10 kΩ, 0.4 W R3 metal film resistor 1 MΩ, 0.4 W R5 metal film resistor 10 kΩ, 1 W
56 pF
62 pF
20 pF
100 pF
150 pF
133 nH length 4.5 mm; int.
dia. 6 mm; leads 2 × 5mm
236 nH length 12.5 mm;
int. dia. 8 mm; leads 2 × 5mm
4312 020 36642
int. dia. 8 mm; leads 2 × 5mm
Notes
1. American Technical Ceramics (ATC) capacitor, type 100B or other capacitor of the same quality.
2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric (εr= 2.2), thickness 1.6 mm (Rogers 5880).
Page 10
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
10 of 19
HF/VHF power MOS transistor BLF177
10
handbook, halfpage
Z
i
(Ω)
r
5
0
−5 0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A;
= 150 W (PEP); RGS= 6.25 Ω; RL= 6.25 Ω.
P
L
i
x
i
10 20 30
MGP099
f (MHz)
Fig.14 Input impedance as a function of frequency
(series components); typical values.
30
handbook, halfpage
G
p
(dB)
20
10
0
0
Class-AB operation; VDS= 50 V; IDQ= 0.7 A;
= 150 W (PEP); RGS= 6.25 Ω; RL= 6.25 Ω.
P
L
10 20 30
f (MHz)
Fig.15 Power gain as a function of frequency;
typical values.
MGP100

APPLICATION INFORMATION FOR CLASS-B OPERATION

RF performance in CW operation in a common source class-B test circuit (see Fig.19). Th=25°C; R
MODE OF
OPERATION
= 0.2 K/W; RGS= 15.8 Ω unless otherwise specified.
th mb-h
f
(MHz)
V
(V)
DS
I
DQ
(A)
P
(W)
L
G
p
(dB)
η
(%)
CW, class-B 108 50 0.1 150 typ. 19 typ. 70
D
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
11 of 19
HF/VHF power MOS transistor BLF177
30
handbook, halfpage
G
p
(dB)
20
10
0
0 100 200
Class-B operation; VDS= 50 V; IDQ= 100 mA;
= 15.8 Ω; f = 108 MHz.
R
GS
PL (W)
Fig.16 Power gain as a function of load power;
typical values.
MGP101
100
handbook, halfpage
η
D
(%)
50
0
0
Class-B operation; VDS= 50 V; IDQ= 100 mA;
= 15.8 Ω; f = 108 MHz.
R
GS
100 200
MGP102
PL (W)
Fig.17 Two tone efficiency as a function of load
power; typical values.
3
MGP103
PIN (W)
200
handbook, halfpage
P
L
(W)
100
0
012 4
Class-B operation; VDS= 50 V; IDQ= 100 mA;
= 15.8 Ω; f = 108 MHz.
R
GS
Fig.18 Load power as a function of input power;
typical values.
Page 12
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
12 of 19
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
input 50 Ω
C1
C3
C2
C17
D.U.T.
C4
C5
L2
C6
C7
R3
C8
R4
L1
BLF177
L3
R2R1
R5
L4
L5
C9
C11
L6
C19
L7
C10
R6
MGP104
C13
C14
C12
+V
C15
C16
C18
output
50 Ω
L8
D
Fig.19 Test circuit for class-B operation at 108 MHz.
Page 13
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
13 of 19
HF/VHF power MOS transistor BLF177
List of components class-B test circuit (see Fig.19)
COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO.
C1, C2, C16, C18 film dielectric trimmer 2.5 to 20 pF 2222 809 07004 C3 multilayer ceramic chip capacitor
(note 1)
C4, C5 multilayer ceramic chip capacitor
(note 1)
C6, C7, C9, C10 multilayer ceramic chip capacitor
(note 1) C8 multilayer ceramic chip capacitor 100 nF 2222 852 47104 C11 multilayer ceramic chip capacitor 10 nF 2222 852 47103 C12 multilayer ceramic chip capacitor 3 × 100 nF 2222 852 47104 C13, C14 multilayer ceramic chip capacitor
(note 1) C15 multilayer ceramic chip capacitor
(note 1) C17 multilayer ceramic chip capacitor
(note 1) C19 electrolytic capacitor 4.4 µF, 63 V 2222 030 28478 L1 3 turns enamelled 0.8 mm copper
wire
L2 stripline (note 2) 64.7 Ω 31 × 3mm L3, L4 stripline (note 2) 41.1 Ω 10 × 6mm L5 6 turns enamelled 1.6 mm copper
wire
L6 grade 3B Ferroxcube wideband HF
choke L7 1 turn enamelled 1.6 mm copper
wire L8 2 turns enamelled 1.6 mm copper
wire
R1, R2 metal film resistor 31.6 Ω, 1 W R3 metal film resistor 1 kΩ, 0.4 W R4 cermet potentiometer 5 kΩ R5 metal film resistor 44.2 kΩ, 0.4 W R6 metal film resistor 10 Ω, 1W
20 pF
62 pF
1nF
36 pF
12 pF
5.6 pF
22 nH length 5.5 mm;
int. dia. 3 mm; leads 2 × 5mm
122 nH length 13.8 mm;
int. dia. 6 mm; leads 2 × 5mm
4312 020 36642
16.5 nH int. dia. 9 mm; leads 2 × 5mm
34.4 nH length 3.9 mm; int. dia. 6 mm; leads 2 × 5mm
Notes
1. American Technical Ceramics (ATC) capacitor, type 100B or other capacitor of the same quality.
2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric (εr= 2.2), thickness 1.6 mm (Rogers 5880).
Page 14
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
14 of 19
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
strap strap
C3
C1 C2
174
rivet
strap
R4
R5
L6
R3
C8
C6 C7
C4
L1
C5
R1 R2
L2
L3
C9
R6
C11
C10
L5
C13
L7
L4
C14
+V
C12
C19
D
C15
L8
C16 C18
70
C17
Dimensions in mm. The circuit and components are situated on one side of the PTFE fibre-glass board, the other side being fully metallized to serve as a ground.
Earth connections are made by means of hollow rivets, whilst under the source leads and at the input and output copper straps are used for a direct contact between upper and lower sheets.
MGP105
Fig.20 Component layout for 108 MHz class-B test circuit.
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NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
15 of 19
HF/VHF power MOS transistor BLF177
r
i
x
i
f (MHz)
MGP107
handbook, halfpage
4
Z
i
(Ω)
2
0
−2
−4
−6
0 200
Class-B operation; VDS=50V;IDQ= 0.1 A;
= 150 W; RGS=15Ω.
P
L
100
Fig.21 Input impedance as a function of frequency
(series components); typical values.
10
handbook, halfpage
Z
L
(Ω)
8
R
L
6
X
4
2
0
0 200
Class-B operation; VDS=50V;IDQ= 0.1 A;
= 150 W; RGS=15Ω.
P
L
L
100
MGP108
f (MHz)
Fig.22 Load impedance as a function of frequency
(series components); typical values.
handbook, halfpage
Fig.23 Definition of transistor impedance.
30
handbook, halfpage
G
p
(dB)
20
10
Z
i
Z
MBA379
L
0
0 200
Class-B operation; VDS=50V;IDQ= 0.1 A;
= 150 W; RGS=15Ω.
P
L
100
MGP109
f (MHz)
Fig.24 Power gain as a function of frequency;
typical values.
Page 16
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
16 of 19
HF/VHF power MOS transistor BLF177
BLF177 scattering parameters
VDS= 50 V; ID= 100 mA; note 1.
f (MHz)
s
11
s
21
s
12
s
22
|s11| ∠Φ |s21| ∠Φ |s12| ∠Φ |s22| ∠Φ
5 0.86 −110.20 36.90 114.20 0.02 25.20 0.64 −84.90 10 0.83 −139.40 20.39 93.30 0.02 5.10 0.55 −112.00 20 0.85 −155.70 9.82 72.60 0.02 −13.40 0.60 −129.30 30 0.88 −161.50 5.96 59.30 0.02 −24.70 0.69 −138.00 40 0.90 −164.90 3.98 49.30 0.02 −31.70 0.76 −144.30 50 0.92 −167.10 2.83 41.90 0.01 −35.80 0.82 −149.30 60 0.94 −169.00 2.11 36.00 0.01 −36.80 0.86 −153.50 70 0.96 −170.70 1.63 31.20 0.01 −33.70 0.89 −157.00 80 0.96 −172.20 1.29 27.40 0.00 −23.00 0.91 −159.90 90 0.97 −173.40 1.04 24.20 0.00 3.30 0.92 −162.40
100 0.97 −174.30 0.86 21.70 0.00 42.50 0.94 −164.50 125 0.99 −176.50 0.57 16.40 0.01 81.60 0.95 −168.80 150 0.99 −178.10 0.40 13.40 0.01 88.70 0.97 −171.90 175 0.99 −179.80 0.30 11.60 0.02 90.70 0.98 −174.50 200 1.00 179.20 0.23 11.00 0.02 90.80 0.98 −176.70 250 1.00 177.00 0.15 11.70 0.03 90.50 0.99 179.80 300 1.00 175.10 0.11 16.70 0.03 89.60 0.99 176.90
350 0.99 173.30 0.08 24.10 0.04 88.30 0.99 174.30
400 1.00 171.80 0.07 33.10 0.05 88.00 0.99 171.90 450 0.99 170.10 0.07 42.70 0.05 87.80 0.99 169.60 500 0.99 168.50 0.07 51.90 0.06 86.50 0.99 167.40 600 0.99 165.40 0.07 64.20 0.07 84.90 0.99 163.10 700 0.99 162.30 0.09 70.60 0.09 83.10 0.98 158.90 800 0.99 158.90 0.10 73.80 0.10 82.20 0.98 154.80 900 0.99 155.30 0.12 74.90 0.12 80.70 0.97 150.60
1000 0.98 151.80 0.14 76.40 0.14 79.80 0.97 146.20
Note
1. For more extensive s-parameters see internet website: http://www.semiconductors.philips.com.markets/communications/wirelesscommunicationms/broadcast
Page 17
NXP Semiconductors Product specification
Rev. 06 - 24 January 2007
17 of 19
HF/VHF power MOS transistor BLF177

PACKAGE OUTLINE

Flanged ceramic package; 2 mounting holes; 4 leads SOT121B
D
A
F
D
1
q
U
1
C
B
H
b
43
α
p
12
H
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
mm
inches
A
7.27
6.17
0.286
0.243
5.82
5.56
0.229
0.219
c
0.16
0.10
0.006
0.004
Db
12.86
12.59
0.506
0.496
D
12.83
12.57
0.505
0.495
F
1
2.67
28.45
2.41
25.52
1.120
0.105
1.005
0.095
pH
3.30
3.05
0.130
0.120
Q
4.45
3.91
0.175
0.154
q
18.42
0.725
U
1
24.90
24.63
0.98
0.97
w
2
A
2
w
M M M
1
0.255
0.245
M M
C
AB
0 5 10 mm
U
U
3
2
12.32
6.48
12.06
6.22
0.485
0.475
U
scale
w1w
0.25
0.01
3
0.51
0.02
c
Q
αU
2
45°
SOT121B 99-03-29
OUTLINE VERSION
REFERENCES
IEC JEDEC EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
Page 18
NXP Semiconductors
Rev. 06 - 24 January 2007
18 of 19
Legal information

Data sheet status

BLF177
HF/VHF power MOS transistor
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The productstatus of device(s)described in this documentmay have changed since this document was published and may differin case of multiple devices. The latest product status
information is available on the Internet at URL
[1][2]
Product status
Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included hereinand shall have noliability for the consequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with the sameproduct type number(s) and title.A short datasheet is intended for quickreference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

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Definition
malfunction ofa NXP Semiconductors product can reasonablybe expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings SystemofIEC 60134) may cause permanent damage to the device.Limiting values are stress ratingsonly and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
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Page 19
NXP Semiconductors
Rev. 06 - 24 January 2007
19 of 19
BLF177
HF/VHF power MOS transistor
Revision history
Revision history
Document ID Release date Data sheet status Change notice Supersedes
BLF177_N_6 20070124 Product data sheet - BLF177_5 Modifications:
BLF177_5 (9397 750 14416)
BLF177_4 (9397 750 11579)
BLF177_3 (9397 750 04059)
BLF177_CNV_2 (9397 750 xxxxx)
• correction made to figure title of Fig.13
• correction made to note 2 on page 9
• correction made to note 2 on page 13
• correction made to figure note of Fig.20
20041217 Product specification - BLF177_4
20030721 Product specification - BLF177_3
19980702 Product specification - BLF177_CNV_2
19971216 Product specification - -
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Date of release: 24 January 2007
Document identifier: BLF177_N_6
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