Philips BLF0810-90, BLF0810S-90 Technical data

BLF0810-90

DISCRETE SEMICONDUCTORS

DATA SHEET

M3D379

M3D461

BLF0810-90; BLF0810S-90

Base station LDMOS transistors

Preliminary specification

 

2002 Mar 18

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Philips Semiconductors

Preliminary specification

 

 

Base station LDMOS transistors

BLF0810-90; BLF0810S-90

 

 

FEATURES

High power gain

Easy power control

Excellent ruggedness

Source on underside eliminates DC isolators, reducing common mode inductance

Designed for broadband operation (750 MHz to 1 GHz).

APPLICATIONS

Common source class-AB operation in CDMA applications in the 750 to 960 MHz frequency range.

DESCRIPTION

Silicon N-channel enhancement mode lateral D-MOS transistors encapsulated in a 2-lead flange package (BLF0810-90) with a ceramic cap or in a 2-lead earless package (BLF0810S-90). The common source is connected to the flange.

Typical CDMA IS95 performance at standard settings at a supply voltage of 27 V and IDQ = 500 mA

PL = 18 W GP = 16 dB η = 26 %

ACPR <−45 dBc at 750 kHz and BW = 30 kHz ACPR <−63 dBc at 1.98 MHz and BW = 30 kHz

PINNING - SOT502A

PIN

DESCRIPTION

 

 

1

drain

 

 

2

gate

 

 

3

source; connected to flange

 

 

PINNING - SOT502B

PIN

DESCRIPTION

 

 

1

drain

 

 

2

gate

 

 

3

source; connected to flange

 

 

handbook, halfpage

1

 

 

 

 

 

 

 

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3

 

 

2

3

 

 

 

 

 

 

2

 

 

 

 

 

 

 

 

 

 

 

Top view

 

MBK394

 

 

 

 

Top view

MBL105

 

Fig.1 Simplified outline SOT502A (BLF0810-90)

 

 

 

Fig.2 Simplified outline SOT502B (BLF0810S-90)

 

 

 

 

 

 

 

 

 

 

 

QUICK REFERENCE DATA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2-tone performance at Th = 25 °C in a common source test circuit.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE OF OPERATION

 

f

 

VDS

 

 

PL PEP

Gp

ηD

d3

 

(MHz)

 

(V)

 

 

(W)

(dB)

(%)

(dBc)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Class-AB

 

881.4 - 881.6

 

27

 

 

60

typ. 16.5

typ. 35

typ. −30

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE OF OPERATION

 

f

 

VDS

 

 

PL avg

Gp

ηD

ACPR

 

(MHz)

 

(V)

 

 

(W)

(dB)

(%)

(dB)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CDMA(1)

 

881.5

 

27

 

 

18

typ. 16

typ. 26

typ. −46 (2)

 

 

 

typ. −63 (3)

 

 

 

 

 

 

 

 

 

 

Note

 

 

 

 

 

 

 

 

 

 

1.IS95 CDMA (pilot, Paging, Sync, and Trafic Codes 8 trough 13)

2.ACPR 750 kHz at BW = 30 kHz

3.ACPR 1.98 MHz at BW = 30 kHz.

2002 Mar 18

2

Philips Semiconductors

 

 

Preliminary specification

 

 

 

 

 

 

 

Base station LDMOS transistors

BLF0810-90; BLF0810S-90

 

 

 

 

 

 

 

 

LIMITING VALUES

 

 

 

 

 

In accordance with the Absolute Maximum Rating System (IEC 60134).

 

 

 

 

 

 

 

 

 

 

 

 

SYMBOL

PARAMETER

 

CONDITIONS

MIN.

 

MAX.

UNIT

 

 

 

 

 

 

 

 

VDS

drain-source voltage

 

 

 

75

V

VGS

gate-source voltage

 

 

 

±15

V

Tstg

storage temperature

 

 

−65

 

150

°C

Tj

junction temperature

 

 

 

200

°C

THERMAL CHARACTERISTICS

 

 

 

 

 

 

 

 

 

 

 

 

SYMBOL

PARAMETER

CONDITIONS

 

 

VALUE

UNIT

 

 

 

 

 

 

Rth j-c

thermal resistance from junction to case

Th = 25 °C, PL = 18 W avg, note 1

 

<0.75

K/W

Note

1. Thermal resistance is determined under RF operating conditions.

CHARACTERISTICS

Tj = 25 °C unless otherwise specified.

SYMBOL

PARAMETER

CONDITIONS

MIN.

TYP.

MAX.

UNIT

 

 

 

 

 

 

 

V(BR)DSS

drain-source breakdown voltage

VGS = 0; ID = 3 mA

75

V

VGSth

gate-source threshold voltage

VDS = 10 V; ID = 300 mA

4

5

V

IDSS

drain-source leakage current

VGS = 0; VDS = 36 V

1

µA

IDSX

on-state drain current

VGS = VGS(th) + 9 V; VDS = 10 V

28

A

IGSS

gate leakage current

VGS = ±20 V; VDS = 0

1

µA

gfs

forward transconductance

VDS = 10 V; ID = 10 A

4.8

S

RDSon

drain-source on-state resistance

VGS = 9 V; ID = 10 A

120

mΩ

2002 Mar 18

3

Philips BLF0810-90, BLF0810S-90 Technical data

Philips Semiconductors

 

 

 

 

 

 

Preliminary specification

 

 

 

 

 

 

 

 

 

Base station LDMOS transistors

 

BLF0810-90; BLF0810S-90

 

 

 

 

 

 

 

 

 

APPLICATION INFORMATION

 

 

 

 

 

 

 

RF performance in a common source-AB circuit; Th = 25 °C.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE OF OPERATION

f

VDS

 

IDQ

PL PEP

Gp

ηD

d3

(MHz)

(V)

 

(mA)

(W)

(dB)

(%)

(dBc)

 

 

 

 

 

 

 

 

 

 

 

Class-AB

881.4 - 881.6

27

 

500

60

>16

>35

<−30

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE OF OPERATION

f

VDS

 

IDQ

PL avg

Gp

ηD

ACPR

(MHz)

(V)

 

(mA)

(W)

(dB)

(%)

(dB)

 

 

 

 

 

 

 

 

 

 

 

CDMA(1)

881.5

27

 

500

>16

>15

>26

<−46 (2)

 

<−63 (3)

 

 

 

 

 

 

 

 

Note

 

 

 

 

 

 

 

 

1.IS95 CDMA (pilot, Paging, Sync, and Trafic Codes 8 trough 13)

2.ACPR 750 kHz at BW = 30 kHz

3.ACPR 1.98 MHz at BW = 30 kHz.

Ruggedness in class-AB operation

The BLF0810-90 and BLF0810S-90 are capable of withstanding a load mismatch corresponding to VSWR = 10 : 1 through all phases at VDS = 27 V; PL = 60 W (PEP).

20

 

 

 

 

50

GP

 

GP

 

 

ηD

(dB)

 

 

 

(%)

16

 

 

 

 

40

12

 

 

 

 

30

 

 

ηD

 

 

 

8

 

 

 

 

20

4

 

 

 

 

10

0

 

 

 

 

0

0

20

40

60

80

100

 

 

 

 

PL (PEP) (W)

VDS = 27 V; IDQ = 500 mA; f1 = 881.4 MHz; f2 = 881.6 MHz.

Fig.3 Power gain and efficiency as functions of peak envelope load power, typical values.

0

 

 

 

 

 

d3

 

 

 

 

 

(dBc)

 

 

 

 

 

-20

 

 

 

 

 

 

 

IDQ=400mA

 

 

 

-40

 

 

 

 

 

 

 

 

450mA

 

 

 

 

 

500mA

 

 

-60

 

600mA

 

 

 

 

 

 

 

-80

 

 

 

 

 

0

20

40

60

80

100

 

 

 

 

PL (PEP) (W)

 

VDS = 27 V; f1 = 881.4 MHz; f2 = 881.6 MHz.

Fig.4 Intermodulation distortion as a function of peak envelope load power, typical values.

2002 Mar 18

4

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