Philips bfs17w Datasheet

Page 1
DATA SH EET
DISCRETE SEMICONDUCTORS
BFS17W
NPN 1 GHz wideband transistor
Product specification Supersedes data of November 1992
1995 Sep 04
Page 2
NXP Semiconductors Product specification
Fig.1 SOT323
handbook, 2 columns
3
12
MBC870
Top view
Marking code: E1
NPN 1 GHz wideband transistor BFS17W

APPLICATIONS

Primarily intended as a mixer, oscillator and IF amplifier in UHF and VHF tuners.

PINNING

PIN DESCRIPTION
1base 2emitter

DESCRIPTION

3 collector
Silicon NPN transistor in a plastic SOT323 (S-mini) package. The BFS17W uses the same crystal as the SOT23 version, BFS17.

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V V I P h f C C T
CBO CEO
C
tot
FE
T
c re
j
collector-base voltage 25 V collector-emitter voltage 15 V DC collector current 50 mA total power dissipation up to Ts=118C; note 1 300 mW DC current gain IC=2mA; VCE=1V 25 90 transition frequency IC=25mA; VCE=5V 1.6 GHz collector capacitance IE=0; VCB=10V; f=1MHz 0.8 1.5 pF feedback capacitance IC=1mA; VCE=5V; f=1MHz 0.75 pF junction temperature 175 C
Note
1. T

LIMITING VALUES

In accordance with the Absolu te Maximum Rating System (IEC 134).
Note
1. T
is the temperature at the soldering point of the collector pin.
s
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CBO
V
CEO
V
EBO
I
C
P
tot
T
stg
T
j
is the temperature at the soldering point of the collector pin.
s
collector-base voltage open emitter 25 V collector-emitter voltage open base 15 V emitter-base voltage open collector 2.5 V collector current (DC) 50 mA total power dissipation Ts=118C; note 1 300 mW storage temperature 65 +150 C junction temperature 175 C
Page 3
NXP Semiconductors Product specification
Fig.2 Power derating curve.
handbook, halfpage
0 50 100 200
200
0
MLB587
150
T ( C)
o
s
P
tot
(mW)
300
400
100
Fig.3 DC current gain as a function of collector
current; typical values.
VCE=1V.
handbook, halfpage
60
20
40
MBG237
0
110
h
FE
IC (mA)
10
−1
10
2
NPN 1 GHz wideband transistor BFS17W
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-s
Note
1. T
s

CHARACTERISTICS

=25C (unless otherwise specified).
T
j
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
CBO
h
FE
f
T
C
c
C
e
C
re
F noise figure I
thermal resistance from junction to soldering point up to Ts=118C; note 1 190 K/W
is the temperature at the soldering point of the collector pin.
collector cut-off current IE=0; VCB=10V 10 nA DC current gain IC=2mA; VCE=1V 25 90 transition frequency IC=25mA; VCE=5V;
1.6 GHz
f=500MHz
collector capacitance IE=ie=0; VCB=10V;
0.8 1.5 pF
f=1MHz
emitter capacitance IC=ic=0; VEB=0.5V;
2 pF
f=1MHz
feedback capacitance IB=ib=0; VCE=5V;
f=1MHz; T
=2mA; VCE=5V;
C
f=500MHz;
amb
=25C
=
S
opt
0.75 pF
4.5 dB
Page 4
NXP Semiconductors Product specification
Fig.4 Feedback capacitance as a function of
collector-base voltage; typical values.
IB=ib=0; f=1MHz.
handbook, halfpage
0
2
0
10
MBG238
24
1.5
1
0.5
68
C
re
(pF)
VCB (V)
Fig.5 Transition frequency as a function
of collector current; typical values.
T
amb
=25C; f = 500 MHz.
handbook, halfpage
2
1.5
1
MBG239
2.5
10
1
5 V
VCE = 10 V
f
T
(GHz)
IC (mA)
10
2
Fig.6 Minimum noise figure as function of
frequency; typical values.
VCE=10V.
handbook, halfpage
MBG240
F
(dB)
f (MHz)
20
15
10
5
0
10
3
10
2
10−310−210
−1
101
NPN 1 GHz wideband transistor BFS17W
Page 5
NXP Semiconductors Product specification
UNIT
A
1
max
b
p
cD
E
e1H
E
L
p
Qwv
REFERENCES
OUTLINE VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
mm
0.1
1.1
0.8
0.4
0.3
0.25
0.10
2.2
1.8
1.35
1.15
0.65
e
1.3
2.2
2.0
0.23
0.13
0.20.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT323 SC-70
w M
b
p
D
e
1
e
A
B
A
1
L
p
Q
detail X
c
H
E
E
v M
A
AB
y
0 1 2 mm
scale
A
X
12
3
Plastic surface-mounted package; 3 leads SOT323
04-11-04 06-03-16
NPN 1 GHz wideband transistor BFS17W

PACKAGE OUTLINE

Page 6
NXP Semiconductors Product specification
NPN 1 GHz wideband transistor BFS17W

DATA SHEET STATUS

DOCUMENT
STATUS
Objective data sheet Development This document contains data from the objective specification for product
Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) desc ribed in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
DEFINITIONS Product specification The information and data
provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet.
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(1)
PRODUCT STATUS
(2)
DEFINITION
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Page 7
NXP Semiconductors Product specification
NPN 1 GHz wideband transistor BFS17W
NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applicat ions and products using NXP Semiconductors products in or de r to avoid a default of the applications and the prod ucts or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect.
Limiting values Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Rec ommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device.
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Printed in The Netherlands R77/02/pp8 Date of release: 1995 Sep 04
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