Philips bfg25aw_x Datasheet

Page 1
DATA SH EET
BFG25AW; BFG25AW/X
NPN 5 GHz wideband transistors
Product specification Supersedes data of August 1995
1998 Sep 23
Page 2
NXP Semiconductors Product specification
Fig.1 SOT343N.
Top view
MBK523
21
34
NPN 5 GHz wideband transistors

FEATURES

Low current consumption
(100 Ato1mA)
Low noise figureGold metallization ensures
excellent reliability.

APPLICATIONS

Wideband applications in UHF low power amplifiers, such as pocket telephones and paging systems.

DESCRIPTION

NPN silicon planar epitaxial transistor in a 4-pin dual-emitter SOT343N plastic package.

PINNING

PIN DESCRIPTION
BFG25AW
1 collector 2base 3emitter 4emitter
BFG25AW/X
1 collector 2emitter 3base 4emitter
BFG25AW;
BFG25AW/X

MARKING

TYPE NUMBER CODE
BFG25AW N6 BFG25AW/X V1

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V V I P h C f G
CBO CEO
C
tot FE
re
T
UM
collector-base voltage open emitter 8V collector-emitter voltage open base 5V collector current (DC) 6.5 mA total power dissipation Ts 85 C 500 mW DC current gain IC= 0.5 mA; VCE=1V 50 80 200 feedback capacitance IC=0; VCE=1V; f=1MHz 0.2 0.3 pF transition frequency IC=1mA; VCE= 1 V; f =500 MHz; T maximum unilateral
IC= 0.5 mA; VCE=1V; f=1GHz; T
=25C3.5 5 GHz
amb
=25C 16 dB
amb
power gain
F noise figure
; IC=1mA; VCE=1V; f=1GHz 2 dB
sopt

LIMITING VALUES

In accordance with the Absolu te Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V V V I P T T
CBO CEO EBO
C
tot stg j
collector-base voltage open emitter 8V collector-emitter voltage open base 5V emitter-base voltage open collector 2V collector current (DC) 6.5 mA total power dissipation Ts 85 C; see Fig.2; note 1 500 mW storage temperature 65 +150 C junction temperature 175 C
Note
1. T
is the temperature at the soldering point of the collector pin.
s
1998 Sep 23 2
Page 3
NXP Semiconductors Product specification
G
UM
10
S
21
2
1S
11
2
–1S
22
2
–
----------------------------------------------------------
dB.log=
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X

THERMAL CHARACTERISTICS

SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-s
Note
1. T
s

CHARACTERISTICS

=25C unless otherwise specified.
T
j
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)CBO
V
(BR)CEO
V
(BR)EBO
I
CBO
h
FE
C
re
f
T
G
UM
F noise figure
thermal resistance from jun ction to soldering point Ts 85 C; note 1 180 K/W
is the temperature at the soldering point of the collector pin.
collector-base breakdown volt a ge IC=100A; IE=0 8V collector-emitter breakdown voltage IC=1mA; IB=0 5V emitter-base breakdown voltage IE=100A; IC=0 2V collector leakage current open emitter; VCB=5V; IE=0 50 nA DC current gain IC=0.5mA; VCE= 1 V 50 80 200 feedback capacitance IC=0; VCE=1V; f=1MHz 0.2 0.3 pF transition frequency IC=1mA; VCE= 1 V; f = 1 GHz;
=25C
T
amb
maximum unilateral power gain; note 1
IC=0.5mA; VCE=1V; f=1GHz; T
=0.5mA; VCE=1V;
I
C
f=2GHz; T
; IC= 0.5 mA; VCE=1V;
sopt
amb
amb
=25C
=25C
3.5 5 GHz
16 dB
8 dB
1.9 dB
f=1GHz
sopt
; IC=1mA; VCE=1V;
2dB
f=1GHz
Note
1. G
is the maximum unilateral power gain, assuming S12 is zero.
UM
1998 Sep 23 3
Page 4
NXP Semiconductors Product specification
Fig.2 Power derating curve.
handbook, halfpage
0 50 100 200
400
0
MBG248
150
T ( C)
o
s
P
tot
(mW)
600
200
VCE=1V.
Fig.3 DC current gain as a function of collector
current; typical values.
handbook, halfpage
10
0
MCD138
110
1
10
2
10
3
40
100
h
FE
I (mA)
C
20
80
60
IC=0; f=1MHz.
Fig.4 Feedback capacitance as a function of
collector-base voltage; typical values.
handbook, halfpage
MLB971
0246
0.3
0
0.2
V (V)
CE
C
re
(pF)
0.1
Fig.5 Transition freque ncy as a function of
collector current; typical values.
f=500MHz; VCE=1V; T
amb
=25C.
handbook, halfpage
0
23
14
6
2
0
4
MLB972
(GHz)
T
f
I (mA)
C
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 4
Page 5
NXP Semiconductors Product specification
f=500MHz; VCE=1V.
Fig.6 Gain as a function of collector current;
typical values.
handbook, halfpage
0
30
20
10
0
1
2
MLB973
3
gain (dB)
I (mA)
C
G
UM
MSG
f=1GHz; VCE=1V.
Fig.7 Gain as a function of collector current;
typical values.
handbook, halfpage
0
30
20
10
0
1
2
MLB974
3
gain (dB)
I (mA)
C
MSG
G
UM
IC= 0.5 mA; VCE=1V.
Fig.8 Gain as a function of frequency;
typical values.
handbook, halfpage
50
0
10
MLB975
10
2
10
3
10
4
10
20
30
40
gain (dB)
f (MHz)
G
UM
MSG
Fig.9 Gain as a function of freq uency;
typical values.
IC=1mA; VCE=1V.
handbook, halfpage
50
0
10
MLB976
10
2
10
3
10
4
10
20
30
40
gain (dB)
f (MHz)
G
UM
MSG
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 5
Page 6
NXP Semiconductors Product specification
Fig.10 Minimum noise figure as a function
of collector current; typical values.
VCE=1V.
handbook, halfpage
4
2
1
0
3
MCD145
10
−1
110
F
(dB)
IC (mA)
f = 2 GHz
1 GHz
500 MHz
Fig.11 Minimum noise figure as a function of
frequency; typical values.
VCE=1V.
handbook, halfpage
4
2
1
0
3
MCD146
10
2
10
4
10
3
F
(dB)
f (MHz)
IC = 2 mA
1 mA
0.5 mA
Fig.12 Common emitter noise figure circles; typical values.
f=500MHz; VCE=1V; IC=1mA; Zo=50
handbook, full pagewidth
MLB977
00
o
0.2
0.6
0.4
0.8
1.0
1.0
45
o
90
o
135
o
180
o
45
o
90
o
135
o
2
1
0.5
0.2
0
0.2
0.5
1
2
5
0.2 0.5 1 2 5
5
F = 5 dB
F = 4 dB
F = 3 dB
F = 1.9 dB
min
opt
Γ
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 6
Page 7
NXP Semiconductors Product specification
Fig.13 Common emitter noise figure circles; typical values.
f=1GHz; VCE=1V; IC=1mA; Zo=50
handbook, full pagewidth
MLB978
00
o
0.2
0.6
0.4
0.8
1.0
1.0
45
o
90
o
135
o
180
o
45
o
90
o
135
o
2
1
0.5
0.2
0
0.2
0.5
1
2
5
0.2 0.5 1 2 5
F = 5 dB
F = 4 dB
F = 3 dB
opt
Γ
F = 2.0 dB
min
5
stability
circle
f=2GHz; VCE=1V; IC=1mA; Zo=50
Fig.14 Common emitter noise figure circles; typical values.
handbook, full pagewidth
MLB979
00
o
0.2
0.6
0.4
0.8
1.0
1.0
45
o
90
o
135
o
180
o
45
o
90
o
135
o
1
0.5
0
0.2
0.5
1
2
5
0.2 0.5 2
F = 5 dB
F = 4 dB
F = 3 dB
opt
Γ
F = 2.4 dB
min
0.2
1 5
5
2
stability
circle
unstable
region
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 7
Page 8
NXP Semiconductors Product specification
VCE=1V; IC=1mA; Zo=50.
Fig.15 Common emitter input reflection coefficient (S11); typical values.
handbook, full pagewidth
MLB980
00
o
0.2
0.6
0.4
0.8
1.0
1.0
45
o
90
o
135
o
180
o
45
o
90
o
135
o
1
0.5
0
0.2
0.5
1
2
5
0.2 0.5 2 40 MHz
3 GHz
0.2
1 5
5
2
VCE=1V; IC=1mA.
Fig.16 Common emitter forward transmission coefficient (S21); typical values.
handbook, full pagewidth
MLB981
0
o
90
o
135
o
180
o
90
o
5 4 3 2 1
45
o
135
o
45
o
40 MHz
3 GHz
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 8
Page 9
NXP Semiconductors Product specification
VCE=1V; IC=1mA.
Fig.17 Common emitter reverse transmission coefficient (S12); typical values.
handbook, full pagewidth
MLB982
0
o
90
o
135
o
180
o
90
o
0.5 0.4 0.3 0.2 0.1
45
o
135
o
45
o
40 MHz
3 GHz
Fig.18 Common emitter output reflection coefficient (S22); typical values.
VCE=1V; IC=1mA; Zo=50
handbook, full pagewidth
MLB983
00
o
0.2
0.6
0.4
0.8
1.0
1.0
45
o
90
o
135
o
180
o
45
o
90
o
135
o
1
0.5
0
0.2
0.5
1
2
0.2 0.5 2
40 MHz
3 GHz
0.2
1 5
5
2
5
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
1998 Sep 23 9
Page 10
NXP Semiconductors Product specification
QLB= 50; QLE= 50; QL
B,E
(f) = QL
B,E
(f/fc);
f
c
= scaling frequency = 1 GHz.
Fig.19 Package equivalent circuit SOT343N.
handbook, halfpage
MBC964
B
E
CB' C'
E'
L
B
L
E
L3
L1 L2
C
cb
C
be ce
C
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X

SPICE parameters for the BFG25W crystal

SEQUENCE No. PARAMETER VALUE UN IT
1 IS 13.77 aA 2 BF 85.65 3 NF 0.980 4 VAF 50.80 V 5 IKF 10.00 A 6 ISE 2.199 fA 7 NE 1.857 8 BR 16.97 9 NR 0.986 10 VAR 2.491 V 11 IKR 188.0 mA 12 ISC 205.1 aA 13 NC 1.107 14 RB 80.00 15 IRB 1.000 A 16 RBM 80.00 17 RE 7.911 18 RC 5.300 19 20 21
(1) (1) (1)
XTB 0.000 EG 1.110 eV
XTI 3.000 22 CJE 223.0 fF 23 VJE 669.7 mV 24 MJE 0.060 25 TF 5.112 ps 26 XTF 7.909 27 VTF 1.338 V 28 ITF 5.662 mA 29 PTF 15.37 deg 30 CJC 229.0 fF 31 VJC 394.7 mV 32 MJC 0.043 33 XCJC 0.050 34 TR 13.26 ns 35
(1)
CJS 0.000 F
SEQUENCE No. PARAMETER VALUE UNIT
(1)
36 37
(1)
VJS 750.0 mV MJS 0.000
38 FC 0.988
Note
1. These parameters have not been extr a cted, the default values are shown.
List of components (see Fig.19)
DESIGNATION VALUE UNIT
C
be
C
cb
C
ce
70 fF 50 fF
115 fF L1 0.34 nH L2 0.10 nH L3 0.25 nH L
B
L
E
0.40 nH
0.40 nH
1998 Sep 23 10
Page 11
NXP Semiconductors Product specification
UNIT
A
1
max
b
p
cD
E
b
1
H
E
L
p
Qwv
REFERENCES
OUTLINE VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC EIAJ
mm
0.1
1.1
0.8
0.4
0.3
0.25
0.10
0.7
0.5
2.2
1.8
1.35
1.15
e
2.2
2.0
1.3
e
1
0.2y0.10.21.15
DIMENSIONS (mm are the original dimensions)
0.45
0.15
0.23
0.13
SOT343N
D
e
1
A
A
1
L
p
Q
detail X
c
H
E
E
v M
A
AB
0 1 2 mm
scale
A
X
12
34
Plastic surface-mounted package; 4 leads SOT343N
e
w M
B
97-05-21 06-03-16
b
p
y
b
1
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X

PACKAGE OUTLINES

1998 Sep 23 11
Page 12
NXP Semiconductors Product specification
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X

DATA SHEET STATUS

DOCUMENT
STATUS
Objective data sheet Development This document contains data from the objective specificat ion for product
Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) desc ribed in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
DEFINITIONS Product specification The information and data
provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet.
DISCLAIMERS Limited warranty and liability Information in this
document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors.
(1)
PRODUCT
STATUS
(2)
DEFINITION
development.
Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication he reof.
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Applications Applications that ar e described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the ris ks associated with their applications and products.
1998 Sep 23 12
Page 13
NXP Semiconductors Product specification
NPN 5 GHz wideband transistors BFG25AW; BFG25A W/X
NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applicat ions and products using NXP Semiconductors products in or de r to avoid a default of the applications and the prod ucts or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect.
Limiting values Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Rec ommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device.
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1998 Sep 23 13
Page 14
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Printed in The Netherlands R77/03/pp14 Date of release: 1998Sep 23
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