Philips bf909_r Datasheet

Page 1
BF909; BF909R
N-channel dual gate MOS-FETs
Rev. 02 — 19 November 2007 Product data sheet
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depending on the version)
- © Koninklijke Philips Electronics N.V. (year). All rights reserved ­is replaced with:
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NXP Semiconductors
Page 2
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
2 of 12
N-channel dual gate MOS-FETs BF909; BF909R

FEATURES

• Specially designed for use at 5 V supply voltage
• High forward transfer admittance
• Short channel transistor with high forward transfer
admittance to input capacitance ratio
• Low noise gain controlled amplifier up to 1 GHz
• Superior cross-modulation performance during AGC.

APPLICATIONS

• VHF and UHF applications with 3 to 7 V supply voltage such as television tuners and professional communications equipment.

DESCRIPTION

Enhancement type field-effect transistor in a plastic microminiature SOT143 or SOT143R package. The
handbook, halfpage
43
d
transistor consists of an amplifier MOS-FET with source and substrate interconnected and an internal bias circuit to ensure good cross-modulation performance during AGC.
CAUTION
The device is supplied in an antistatic package. The gate-source input must be protected against static discharge during transport or handling.

PINNING

PIN SYMBOL DESCRIPTION
1 s, b source 2 d drain 3g 4g
handbook, halfpage
34
gate 2
2
gate 1
1
d
g
2
g
1
21
Top view
BF909 marking code: %M3.
MAM124
Fig.1 Simplified outline (SOT143) and symbol.
s,b
12
Top view
BF909R marking code: %M4.
MAM125 - 1
Fig.2 Simplified outline (SOT143R) and symbol.
g
2
g
1

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
DS
I
D
P
tot
T
j
y
forward transfer admittance 36 43 50 mS
fs
C
ig1-s
C
rs
drain-source voltage −−7V drain current −−40 mA total power dissipation −−200 mW operating junction temperature −−150 °C
input capacitance at gate 1 − 3.6 4.3 pF reverse transfer capacitance f = 1 MHz − 35 50 fF
F noise figure f = 800 MHz − 2 2.8 dB
s,b
Page 3
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
3 of 12
N-channel dual gate MOS-FETs BF909; BF909R

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
I
D
I
G1
I
G2
P
tot
T
stg
T
j
Note
1. Device mounted on a printed-circuit board.
drain-source voltage − 7V drain current − 40 mA gate 1 current −±10 mA gate 2 current −±10 mA total power dissipation see Fig.3
BF909 up to T BF909R up to T
=50°C; note 1 − 200 mW
amb
=40°C; note 1 − 200 mW
amb
storage temperature −65 +150 °C operating junction temperature − 150 °C
250
handbook, halfpage
P
tot
(mW)
200
150
100
50
0
0 50 100 200
BF909R BF909
150
T ( C)
Fig.3 Power derating curves.
amb
MLB935
o
Page 4
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
4 of 12
N-channel dual gate MOS-FETs BF909; BF909R

THERMAL CHARACTERISTICS

SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-a
R
th j-s
Notes
1. Device mounted on a printed-circuit board.
is the temperature at the soldering point of the source lead.
2. T
s

STATIC CHARACTERISTICS

Tj=25°C; unless otherwise specified.
thermal resistance from junction to ambient note 1
BF909 500 K/W BF909R 550 K/W
thermal resistance from junction to soldering point note 2
BF909 T BF909R T
=92°C 290 K/W
s
=78°C 360 K/W
s
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
(BR)G1-SS
V
(BR)G2-SS
V
(F)S-G1
V
(F)S-G2
V
G1-S(th)
gate 1-source breakdown voltage V gate 2-source breakdown voltage V forward source-gate 1 voltage V forward source-gate 2 voltage V gate 1-source threshold voltage V
G2-S=VDS G1-S=VDS G2-S=VDS G1-S=VDS G2-S
= 0; I
G1-S
= 0; I
G2-S
= 0; I
S-G1
= 0; I
S-G2
=4V; VDS=5V;
= 10 mA 6 15 V = 10 mA 6 15 V = 10 mA 0.5 1.5 V = 10 mA 0.5 1.5 V
0.3 1 V
ID=20µA
V
G2-S(th)
I
DSX
gate 2-source threshold voltage V drain-source current V
G1-S=VDS G2-S
=5V; ID=20µA 0.3 1.2 V
=4V; VDS=5V;
12 20 mA
RG1= 120 kΩ; note 1
I
G1-SS
I
G2-SS
gate 1 cut-off current V gate 2 cut-off current V
G1-S G2-S
=5V; V =5V; V
G2-S=VDS G1-S=VDS
=0 − 50 nA =0 − 50 nA
Note
1. R
connects gate 1 to VGG= 5 V; see Fig.18.
G1

DYNAMIC CHARACTERISTICS

Common source; T
=25°C; VDS= 5 V; V
amb
= 4 V; ID= 15 mA; unless otherwise specified.
G2-S
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
forward transfer admittance pulsed; Tj=25°C 364350mS
y
fs
C
ig1-s
C
ig2-s
C
os
C
rs
F noise figure f = 800 MHz; G
input capacitance at gate 1 f = 1 MHz − 3.6 4.3 pF input capacitance at gate 2 f = 1 MHz − 2.3 3 pF drain-source capacitance f = 1 MHz − 2.3 3 pF reverse transfer capacitance f = 1 MHz − 35 50 fF
S=GSopt
; BS=B
− 2 2.8 dB
Sopt
Page 5
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
5 of 12
N-channel dual gate MOS-FETs BF909; BF909R
110
handbook, halfpage
V
unw
(dBµV)
100
90
80
0
10 50
VDS= 5V; VGG= 5 V; fw= 50 MHz. f
= 60 MHz; T
unw
=25°C; RG1= 120 kΩ.
amb
20 30 40
gain reduction (dB)
MLB936
Fig.4 Unwanted voltage for 1% cross-modulation
as a function of gain reduction; typical values; see Fig.18.
30
handbook, halfpage
V = 4 V
I
D
G2 S
3 V 2.5 V
(mA)
20
10
0
0
0.4 2.0
VDS=5V. Tj=25°C.
0.8 1.2 1.6
Fig.5 Transfer characteristics; typical values.
MLB937
2 V
1.5 V
1 V
V (V)
G1 S
30
handbook, halfpage
I
D
(mA)
20
10
0
0
VDS=5V. V
=4V.
G2-S
Tj=25°C.
210
V = 1.4 V
G1 S
1.3 V
1.2 V
1.1 V
1.0 V
0.9 V
468
Fig.6 Output characteristics; typical values.
MLB938
V (V)
DS
200
handbook, halfpage
I
G1
(µA)
150
100
50
0
VDS=5V. Tj=25°C.
0123
V = 4 V
G2 S
3.5 V
3 V
2.5 V
2 V
V (V)
Fig.7 Gate 1 current as a function of gate 1
voltage; typical values.
MLB939
G1 S
Page 6
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
6 of 12
N-channel dual gate MOS-FETs BF909; BF909R
60
handbook, halfpage
y
fs
(mS)
40
20
0
0
VDS=5V. Tj=25°C.
10 20 30
Fig.8 Forward transfer admittance as a
function of drain current; typical values.
MLB940
V = 4 V
G2 S
3.5 V 3 V
2.5 V
2 V
I (mA)
D
25
handbook, halfpage
I
D
(mA)
20
15
10
5
0
0204060
VDS= 5 V; V Tj=25°C.
G2-S
=4V.
MLB941
I (µA)
G1
Fig.9 Drain current as a function of gate 1 current;
typical values.
16
handbook, halfpage
I
D
(mA)
12
8
4
0
0246
VDS= 5 V; V RG1= 120 kΩ (connected to VGG); Tj=25°C.
G2-S
=4V.
Fig.10 Drain current as a function of gate 1
supply voltage (= VGG); typical values; see Fig.18.
MLB942
V (V)
GG
30
handbook, halfpage
I
D
(mA)
20
10
0
0
V
=4V.
G2-S
RG1 connected to VGG; Tj=25°C.
R = 47 kΩ
G1
24 8
68 kΩ
V = V (V)
GG DS
Fig.11 Drain current as a function of gate 1
(= VGG) and drain supply voltage; typical values; see Fig.18.
MLB943
82 kΩ
100 kΩ 120 kΩ
150 kΩ 180 kΩ 220 kΩ
6
Page 7
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
7 of 12
N-channel dual gate MOS-FETs BF909; BF909R
V = 5 V
GG
4.5 V 4 V
3.5 V 3 V
V (V)
G2 S
MLB944
20
handbook, halfpage
I
D
(mA)
16
12
8
4
0
0246
VDS= 5 V; Tj=25°C. RG1= 120 kΩ (connected to VGG).
Fig.12 Drain current as a function of gate 2 voltage;
typical values; see Fig.18.
40
handbook, halfpage
I
G1
(µA)
30
20
10
0
0246
VDS= 5 V; Tj=25°C. RG1= 120 kΩ (connected to VGG).
V = 5 V
Fig.13 Gate 1 current as a function of gate 2
voltage; typical values; see Fig.18.
MLB945
GG
4.5 V 4 V
3.5 V 3 V
V (V)
G2 S
f (MHz)
MLB946
10
2
10
handbook, halfpage
y
is
(mS)
10
1
1
10
10
VDS= 5 V; VG2=4V. ID= 15 mA; T
amb
=25°C.
b
is
g
is
2
10
Fig.14 Input admittance as a function of frequency;
typical values.
f (MHz)
MLB947
3
10
ϕ
rs
(deg)
2
10
10
1
3
10
3
10
y
rs
(µS)
ϕ
2
10
10
3
1
10
VDS= 5 V; VG2=4V. ID= 15 mA; T
amb
=25°C.
rs
y
rs
2
10
Fig.15 Reverse transfer admittance and phase as
a function of frequency; typical values.
Page 8
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
8 of 12
N-channel dual gate MOS-FETs BF909; BF909R
2
10
y
fs
(mS)
10
1
10
VDS= 5 V; VG2=4V. ID= 15 mA; T
amb
=25°C.
y
fs
ϕ
fs
2
10
f (MHz)
MLB948
3
10
Fig.16 Forward transfer admittance and phase as
a function of frequency; typical values.
10
ϕ
(deg)
10
1
f (MHz)
MLB949
3
10
2
fs
10
handbook, halfpage
y
os
(mS)
1
1
10
2
10
10
VDS= 5 V; VG2=4V. ID= 15 mA; T
amb
=25°C.
b
os
g
os
2
10
Fig.17 Output admittance as a function of
frequency; typical values.
R
GEN
50 Ω
V
V
AGC
R1
10 kΩ
C2
4.7 nF
R2
50 Ω
I
V
GG
C1
4.7 nF
DUT
R
G1
R3
10 Ω
C5
2.2 pF
≈
V
DS
C3 12 pF
L1
350 nH
C4
4.7 nF
R 50 Ω
MLD151
L
Fig.18 Cross-modulation test set-up.
Page 9
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
9 of 12
N-channel dual gate MOS-FETs BF909; BF909R
Table 1 Scattering parameters: T
s
f
(MHz)
MAGNITUDE
(ratio)
11
ANGLE
(deg)
=25°C; VDS= 5 V; V
amb
s
21
MAGNITUDE
(ratio)
G2-S
ANGLE
(deg)
= 4 V; ID=15mA
s
12
MAGNITUDE
(ratio)
ANGLE
(deg)
s
MAGNITUDE
(ratio)
22
ANGLE
(deg)
50 0.985 −6.4 4.064 172.3 0.001 86.9 0.985 −3.2 100 0.978 −12.6 3.997 164.9 0.002 82.7 0.982 −6.4 200 0.957 −25.0 3.886 150.8 0.005 74.3 0.973 −12.6 300 0.931 −36.5 3.682 137.3 0.006 68.9 0.960 −18.6 400 0.899 −47.6 3.484 123.8 0.007 59.6 0.947 −24.2 500 0.868 −57.4 3.260 111.7 0.007 57.9 0.936 −29.6 600 0.848 −66.6 3.053 101.0 0.006 58.5 0.927 −34.8 700 0.816 −74.6 2.829 90.3 0.005 65.5 0.919 −39.8 800 0.792 −82.2 2.652 79.9 0.005 83.3 0.913 −44.6 900 0.772 −89.3 2.470 69.5 0.005 114.9 0.910 −49.5 1000 0.754 −95.6 2.328 59.5 0.006 138.7 0.909 −54.6
Table 2 Noise data: T
f
(MHz)
=25°C; VDS= 5 V; V
amb
F
min
(dB)
= 4 V; ID=15mA
G2-S
(ratio) (deg)
Γ
opt
r
n
800 2.00 0.603 67.71 0.581
Page 10
NXP Semiconductors Product specification
Rev. 02 - 19 November 2007
10 of 12
N-channel dual gate MOS-FETs BF909; BF909R

PACKAGE OUTLINES

handbook, full pagewidth
Dimensions in mm.
10
max
3.0
0.150
1.1 30
max
0.090
0.1
max
max
o
o
10
0.88
0.75
0.60
o
max
2.8
1.9
43
1
2
0
0.1
TOP VIEW
0.48
1.7
0
0.1
B
A
1.4
1.2
M0.1 AB
2.5
max
0.2
MBC845
M
AB
Fig.19 SOT143.
handbook, full pagewidth
Dimensions in mm.
0.40
0.25
10
max
3.0
0.150
0.090
30
max
o
0.1
max
10
max
o
0.48
0.38
o
1.1
max
2.8
1.9
34
2
1
0.88
0.78
1.7
M0.1 B
TOP VIEW
B
A
1.4
1.2
MBC844
2.5
max
0.2
A
M
Fig.20 SOT143R.
Page 11
NXP Semiconductors
Rev. 02 - 19 November 2007
11 of 12

Legal information

Data sheet status

BF909; BF909R
N-channel dual gate MOS-FETs
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this documentwaspublishedandmaydifferincase of multiple devices. The latest product status
information is available on the Internet at URL
[1][2]
Product status
Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall haveno liability for the consequencesof use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

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reliable. However, NXP Semiconductors does not give anyrepresentations or warranties, expressed or implied, as to the accuracyor completeness of such information and shall have no liability for the consequences of use of such information.
Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
[3]
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Definition
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
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Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may causepermanent damage to the device.Limiting values are stress ratingsonly and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
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Contact information

For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: [email protected]
Page 12
NXP Semiconductors
BF909; BF909R
N-channel dual gate MOS-FETs

Revision history

Revision history
Document ID Release date Data sheet status Change notice Supersedes
BF909_N_2 20071119 Product data sheet - BF909_1 Modifications: BF909_1 19950425 Product specification - -
• Fig.1 and 2 on page 2; Figure note changed
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Date of release: 19 November 2007
Document identifier: BF909_N_2
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