Philips bf908-r_n Datasheet

Page 1
BF908; BF908R
Dual-gate MOS-FETs
Rev. 03 — 14 November 2007 Product data sheet
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depending on the version)
- © Koninklijke Philips Electronics N.V. (year). All rights reserved ­is replaced with:
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NXP Semiconductors
Page 2
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
2 of 9
Dual-gate MOS-FETs BF908; BF908R

FEATURES

• High forward transfer admittance
• Short channel transistor with high forward transfer
admittance to input capacitance ratio
• Low noise gain controlled amplifier up to 1 GHz.

APPLICATIONS

• VHF and UHF applications with 12 V supply voltage, such as television tuners and professional communications equipment.

DESCRIPTION

Depletion type field-effect transistor in a plastic microminiature SOT143 or SOT143R package. The transistors are protected against excessive input voltage surges by integrated back-to-back diodes between gates and source.
CAUTION
The device is supplied in an antistatic package. The gate-source input must be protected against static discharge during transport or handling.
handbook, halfpage
43
Top view
BF908 marking code: %M1.
Fig.1 Simplified outline (SOT143) and
handbook, halfpage
34
21
symbol; BF908.
MAM039
g g
d
g
2
g
1
s,b
d
2
1

PINNING

PIN SYMBOL DESCRIPTION
1 s, b source 2 d drain 3g 4g
2 1
gate 2 gate 1
Top view
BF908R marking code: %M2.
Fig.2 Simplified outline (SOT143R) and
12
symbol; BF908R.
MAM040
s,b

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
DS
I
D
P
tot
T
j
forward transfer admittance 36 43 50 mS
y
fs
C
ig1-s
C
rs
drain-source voltage −−12 V drain current −−40 mA total power dissipation −−200 mW operating junction temperature −−150 °C
input capacitance at gate 1 2.4 3.1 4 pF reverse transfer capacitance f = 1 MHz 20 30 45 pF
F noise figure f = 800 MHz − 1.5 2.5 dB
Page 3
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
3 of 9
Dual-gate MOS-FETs BF908; BF908R

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
I
D
±I
G1
±I
G2
P
tot
T
stg
T
j
Note
1. Device mounted on a printed-circuit board.
drain-source voltage − 12 V drain current − 40 mA gate 1 current − 10 mA gate 2 current − 10 mA total power dissipation see Fig.3; note 1
BF908 up to T BF908R up to T
=50°C − 200 mW
amb
=40°C − 200 mW
amb
storage temperature −65 +150 °C operating junction temperature − 150 °C
250
handbook, halfpage
P
tot
(mW)
200
150
100
50
0
0 50 100 150 200
BF908
BF908R
T
Fig.3 Power derating curves.
amb
MRC275
o
( C)
Page 4
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
4 of 9
Dual-gate MOS-FETs BF908; BF908R

THERMAL CHARACTERISTICS

SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-a
Note
1. Device mounted on a printed-circuit board.

STATIC CHARACTERISTICS

=25°C; unless otherwise specified.
T
j
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
±V
(BR)G1-SS
±V
(BR)G2-SS
−V
(P)G1-S
−V
(P)G2-S
I
DSS
±I
G1-SS
±I
G2-SS
thermal resistance from junction to ambient note 1
BF908 500 K/W BF908R 550 K/W
gate 1-source breakdown voltage V gate 2-source breakdown voltage V gate 1-source cut-off voltage V gate 2-source cut-off voltage V drain-source current V gate 1 cut-off current V gate 2 cut-off current V
G2-S=VDS G1-S=VDS G2-S G1-S G2-S G2-S=VDS G1-S=VDS
= 0; I = 0; I
=10mA 8 − 20 V
G1-S
=10mA 8 − 20 V
G2-S
=4V; VDS=8V; ID=20µA −−2V =4V; VDS=8V; ID=20µA −−1.5 V =4V; VDS=8V; V
= 0; V
G1-S
= 0; V
G2-S
=03 1527mA
G1-S
=5V −−50 nA =5V −−50 nA

DYNAMIC CHARACTERISTICS

Common source; T
=25°C; VDS=8V; V
amb
=4V; ID= 15 mA; unless otherwise specified.
G2-S
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
y
forward transfer admittance pulsed; Tj=25°C; f = 1 MHz 36 43 50 mS
fs
C
ig1-s
C
ig2-s
C
os
C
rs
F noise figure f = 200 MHz; G
input capacitance at gate 1 f = 1 MHz 2.4 3.1 4 pF input capacitance at gate 2 f = 1 MHz 1.2 1.8 2.5 pF output capacitance f = 1 MHz 1.2 1.7 2.2 pF reverse transfer capacitance f = 1 MHz 20 30 45 fF
f = 800 MHz; G
= 2 mS; BS=B
S S=GSopt
; BS=B
Sopt Sopt
− 0.6 1.2 dB
− 1.5 2.5 dB
Page 5
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
5 of 9
Dual-gate MOS-FETs BF908; BF908R
40
handbook, halfpage
ID
(mA)
30
20
10
0
−0.6 −0.4 0 0.2−0.2 0.4
VDS= 8V; Tj=25°C.
V
V
G2-S
G1-S
Fig.4 Transfer characteristics; typical values.
MRC281
= 4 V
3 V
2 V
1.5 V 1 V
0.5 V
0 V
(V)
0.6
30
handbook, halfpage
ID
(mA)
20
10
0
048 16
V
= 4 V; Tj=25°C.
G2-S
V
G1-S
12
Fig.5 Output characteristics; typical values.
MRC282
= 0.3 V
0.2 V
0.1 V
0 V
−0.1 V
−0.2 V
−0.3 V
VDS (V)
50
Y
fs
(mS)
40
30
20
10
V
G2-S
0
0 5 10 15 20 25
VDS= 8 V; Tj=25°C.
0.5 V
= 0 V
MRC280
4 V
3 V 2 V
1.5 V
1 V
ID(mA)
Fig.6 Forward transfer admittance as a function
of drain current; typical values.
60
Y
fs
(mS)
40
20
0
VDS= 8 V; V
0 40 80 120 16040
= 4 V; ID=15mA.
G2-S
MRC276
o
Tj( C)
Fig.7 Forward transfer admittance as a function
of junction temperature; typical values.
Page 6
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
6 of 9
Dual-gate MOS-FETs BF908; BF908R
Table 1 Scattering parameters
f
(MHz)
V
DS
MAGNITUDE
=8V; V
s
11
ANGLE
(ratio)
=4V; ID= 10 mA; T
G2-S
MAGNITUDE
(deg)
amb
(ratio)
=25°C.
s
21
ANGLE
MAGNITUDE
(deg)
(ratio)
s
12
ANGLE
MAGNITUDE
(deg)
(ratio)
s
22
ANGLE
(deg)
50 0.998 −5.1 3.537 173.5 0.001 98.2 0.996 −2.4 100 0.994 −10.4 3.502 167.7 0.001 88.8 0.994 −4.9 200 0.979 −20.8 3.450 154.9 0.003 74.6 0.987 −9.5 300 0.962 −30.3 3.318 143.7 0.004 69.5 0.983 −13.9 400 0.939 −40.1 3.234 131.9 0.005 65.6 0.980 −18.5 500 0.914 −49.1 3.093 120.7 0.006 64.4 0.974 −22.8 600 0.892 −57.1 2.912 111.1 0.005 63.1 0.969 −27.0 700 0.865 −64.4 2.774 101.0 0.005 65.2 0.966 −31.2 800 0.837 −71.6 2.616 91.4 0.004 70.8 0.965 −35.4 900 0.811 −78.1 2.479 81.9 0.004 87.4 0.965 −39.4
1000 0.785 −84.5 3.329 72.5 0.003 108.0 0.966 −43.7
V
DS
=8V; V
=4V; ID= 15 mA; T
G2-S
amb
=25°C.
50 0.998 −5.3 3.983 173.4 0.001 95.5 0.994 −2.4 100 0.994 −10.9 3.943 167.5 0.001 93.6 0.991 −5.0 200 0.976 −21.6 3.878 154.7 0.003 74.3 0.984 −9.7 300 0.957 −31.7 3.722 143.3 0.004 70.0 0.979 −14.2 400 0.934 −41.7 3.614 131.6 0.005 63.5 0.975 −18.8 500 0.907 −51.1 3.446 120.4 0.006 62.2 0.969 −23.2 600 0.885 −59.1 3.240 110.9 0.005 59.6 0.964 −27.4 700 0.851 −66.8 3.072 100.9 0.005 64.8 0.961 −31.6 800 0.826 −73.9 2.891 91.3 0.004 67.8 0.959 −35.9 900 0.797 −80.7 2.733 81.9 0.004 85.0 0.958 −40.0
1000 0.773 −87.0 2.569 72.8 0.004 102.9 0.958 −44.2
Table 2 Noise data
(MHz)
=8V; V
V
DS
V
=8V; V
DS
Γ
f
=4V; ID= 10 mA; T
G2-S
F
min
(dB)
amb
(ratio) (deg)
=25°C.
opt
r
n
800 1.50 0.720 56.7 0.580
=4V; ID= 15 mA; T
G2-S
amb
=25°C.
800 1.50 0.700 59.2 0.520
Page 7
NXP Semiconductors Product specification
Rev. 03 - 14 November 2007
7 of 9
Dual-gate MOS-FETs BF908; BF908R

PACKAGE OUTLINES

handbook, full pagewidth
Dimensions in mm.
10
max
3.0
0.150
30
max
0.090
0.1
max
max
o
o
10
0.88
0.75
0.60
o
1.1
max
2.8
1.9
43
1
2
0
0.1
TOP VIEW
0.48
1.7
0
0.1
B
A
1.4
1.2
M0.1 AB
2.5
max
0.2
MBC845
M
AB
Fig.8 SOT143.
handbook, full pagewidth
Dimensions in mm.
0.40
0.25
10
max
3.0
0.150
0.090
30
max
o
0.1
max
10
max
o
0.48
0.38
o
1.1
max
2.8
1.9
34
2
1
0.88
0.78
1.7
M0.1 B
TOP VIEW
B
A
1.4
1.2
MBC844
2.5
max
0.2
A
M
Fig.9 SOT143R.
Page 8
NXP Semiconductors
Rev. 03 - 14 November 2007
8 of 9

Legal information

Data sheet status

BF908; BF908R
Dual-gate MOS-FETs
Document status
Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document waspublishedandmaydifferincaseof multiple devices.The latest product status
information is available on the Internet at URL
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Definition
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may causepermanent damage to the device.Limiting values are stress ratingsonly and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability.
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Contact information

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Page 9
NXP Semiconductors
BF908; BF908R
Dual-gate MOS-FETs

Revision history

Revision history
Document ID Release date Data sheet status Change notice Supersedes
BF908-R_N_3 20071114 Product data sheet - BF908-R_2 Modifications: BF908-R_2 19960730 Product specification - BF908R_1 BF908R_1 - - - -
• Fig. 1 and 2 on page 2; Figure note changed
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’.
© NXP B.V. 2007. All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected]
Date of release: 14 November 2007 Document identifier: BF908-R_N_3
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