Philips bf510_bf511_bf512_bf513 Datasheet

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DATA SH EET
DISCRETE SEMICONDUCTORS
BF510 to 513
N-channel silicon field-effect transistors
Product specification December 1997
Page 2
Fig.1 Simplified outline and symbol.
handbook, halfpage
12
g
d s
3
Top view
MAM385
N-channel silicon field-effect transistors BF510 to 513

DESCRIPTION

Asymmetrical N-channel planar epitaxial junction field-effect transistors in the miniature plastic envelope intended for applications up to the v.h.f. range in hybrid thick and thin-film circuits. Special features ar e the low feedback capacitance and the low noise figure. These features make the product very suitable for applications such as the r.f. stages in f.m. portables (BF510), car radios (BF511) and mains radios (BF512) or the mixer stage (BF513).

PINNING - SOT23

1=gate 2 = drain 3 = source

MARKING CODE

BF510 = S6p BF511 = S7p BF512 = S8p BF513 = S9p

QUICK REFERENCE DATA

Drain-source voltage V Drain current (DC or average) I
max. 20 V
DS
max. 30 mA
D
Total power dissipation
up to T
=40 CP
amb
max. 250 mW
tot
BF510 511 512 513
Drain current 0.7 2.5 6 10 mA
V
=10 V; VGS= 0 I
DS
3.0 7.0 12 18 mA
DSS
Transfer admittance (common source)
=10 V; VGS=0; f = 1 kHz yfs  2.5467mS
V
DS
Feedback capacitance
= 10 V; VGS=0 C
V
DS
V
= 10 V; ID=5 mA C
DS
typ. 0.3 0.3 pF
rs
typ. 0.3 0.3 pF
rs
Noise figure at optimum source admittance
=1 mS; BS= 3 mS; f = 100 MHz
G
S
=10 V; VGS=0 F typ. 1.5 1.5 dB
V
DS
=10 V; ID=5 mA F typ. 1.5 1.5 dB
V
DS
December 1997 2
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NXP Semiconductors Product specification
N-channel silicon field-effect transistors BF510 to 513

RATINGS

Limiting values in accordance with the Absolute Maximum Sys t em (IEC 134)
Drain-source voltage V Drain-gate voltage (open source) V Drain current (DC or average) I Gate current  I Total power dissipation up to T
=40 C (note 1) P
amb
Storage temperature range T Junction temperature T

THERMAL RESISTANCE

DS DGO
D
G tot stg j
max. 20 V max. 20 V max. 30 mA max. 10 mA max. 250 mW 65 to 150 C max. 150 C
From junction to ambient (note 1) R
Note
1. Mounted on a ceramic substrate of 8 mm 10 mm 0.7 mm.

STATIC CHARACTERISTICS

T
= 25 C
amb
BF510 511 512 513
Gate cut-off current
= 0.2 V; VDS=0 I
V
GS
GSS
10 10 10 10 nA
Gate-drain breakdown voltage
=0; ID=10 A V
I
S
(BR)GDO
20 20 20 20 V
Drain current
V
=10 V; VGS=0 I
DS
DSS
<
0.7
3.0
Gate-source cut-off voltage
=10A; VDS=10 V V
I
D
(P)GS
typ. 0.8 1.5 2.2 3 V
th j-a
2.5
7.0
= 430 K/W
6
12
1018mA
mA
December 1997 3
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NXP Semiconductors Product specification
Fig.2 VGS= 0 for BF510 and BF511;
I
D
= 5 mA for BF512 and BF513;
f = 1 MHz; T
amb
= 25 C.
handbook, halfpage
0
typ
20
1.5
0
0.5
1
C
rs
(pF)
VDS (V)
4 8 12 16
MDA275
Fig.3 VDS= 10 V; f = 1 kHz; T
amb
=25 C; typical
values.
handbook, halfpage
05
|y
fs
|
(mS)
ID (mA)
10 15
10
0
8
6
4
2
MDA276
BF511
BF510
BF512
BF513
N-channel silicon field-effect transistors BF510 to 513

DYNAMIC CHARACTERISTICS

Measuring conditions (common source): V
=10 V; VGS= 0; T
DS
=10 V; ID= 5 mA; T
V
DS
=25 C for BF510 and BF511
amb
=25 C for BF5 12 and BF513
amb
y-parameters (common source) BF510 511 512 513 Input capacitance at f = 1 MHz C Input conductance at f = 100 MHz g
Feedback capacitance at f = 1 MHz C
is
is
rs
Transfer admittance at f = 1 kHz  y
= 0 instead of ID=5 mA  yfs 6.0 7.0 mS
V
GS
Transfer admittance at f = 100 MHz  y Output capacitance at f = 1 MHz C Output conductance at f = 1 MHz g Output conductance at f = 100 MHz g
os os os
5555pF typ. 100906050S typ. 0.4 0.4 0.4 0.4 pF
0.5 0.5 0.5 0.5 pF
 2.5 4.0 4.0 3.5 mS
fs
 typ. 3.5 5.5 5.0 5.0 mS
fs
3333pF 60 80 100 120 S typ. 35 55 70 90 S
Noise figure at optimum source admittance
G
=1 mS; BS=3 mS;
S
f = 100 MHz F ty p. 1.5 1.5 1.5 1.5 dB
December 1997 4
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NXP Semiconductors Product specification
Fig.4 Power derating curve.
handbook, halfpage
0
T
amb
(°C)
P
tot
(mW)
300
200
100
0
40 200
80 120 160
MDA245
N-channel silicon field-effect transistors BF510 to 513
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NXP Semiconductors Product specification
UNIT
A
1
max.
b
p
cD
E
e
1
H
E
L
p
Qwv
REFERENCES
OUTLINE VERSION
EUROPEAN
PROJECTION
ISSUE DATE
04-11-04 06-03-16
IEC JEDEC JEITA
mm
0.1
0.48
0.38
0.15
0.09
3.0
2.8
1.4
1.2
0.95
e
1.9
2.5
2.1
0.55
0.45
0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
b
p
D
e
1
e
A
A
1
L
p
Q
detail X
H
E
E
w M
v M
A
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface-mounted package; 3 leads SOT23
N-channel silicon field-effect transistors BF510 to 513

PACKAGE OUTLINE

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NXP Semiconductors Product specification
N-channel silicon field-effect transistors BF510 to 513

DATA SHEET STATUS

DOCUMENT
STATUS
Objective data sheet Development This document contains data from the objective s pecification for product
Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Prod uc tio n This document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) desc ribed in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
DEFINITIONS Product specification The information and data
provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet.
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Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors.
(1)
PRODUCT STATUS
(2)
DEFINITION
development.
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Applications Applications that ar e described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
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NXP Semiconductors Product specification
N-channel silicon field-effect transistors BF510 to 513
NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applicat ions and products using NXP Semiconductors products in or de r to avoid a default of the applications and the prod ucts or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect.
Limiting values Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Rec ommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device.
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December 1997 8
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Printed in The Netherlands R77/02/pp9 Date of release: December 1997
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